Ohmmeter

- Chauvin Arnoux
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Description

FIG. 1 is a front elevation view of the ohmmeter showing the new design.

FIG. 2 is a right side, elevation view of the ohmmeter shown in FIG. 1.

FIG. 3 is a bottom, plan view of the ohmmeter shown in FIG. 1.

FIG. 4 is a top, plan view of the ohmmeter shown in FIG. 1.

FIG. 5 is a left side, elevation view of the ohmmeter shown in FIG. 1.

FIG. 6 is a rear, elevation view of the ohmmeter shown in FIG. 1; and,

FIG. 7 is a perspective view of the ohmmeter shown in FIG. 1.

Broken lines shown in the drawings are for the purpose of illustrating environmental structure or to define boundaries and form no part of the claimed design.

Claims

The ornamental design for an ohmmeter, as shown and described.

Referenced Cited
U.S. Patent Documents
5084670 January 28, 1992 Melenotte
D369306 April 30, 1996 Fisher
D446463 August 14, 2001 Chang
D625635 October 19, 2010 Tian
D754554 April 26, 2016 Richer
9423462 August 23, 2016 Curtis
D780609 March 7, 2017 Richer
D811910 March 6, 2018 Richer
10056203 August 21, 2018 Tan
D839756 February 5, 2019 Pang
D861523 October 1, 2019 Chen
Patent History
Patent number: D890617
Type: Grant
Filed: Mar 12, 2019
Date of Patent: Jul 21, 2020
Assignees: Chauvin Arnoux (Paris), Shanghai Ipujiang Enerdis Instruments (Shanghai)
Inventor: Antoine Mimouni (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/683,293
Classifications