Thickness measurement tool

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Description

FIG. 1 is a top, front, right perspective view of a thickness measurement tool showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view.

The broken lines in the drawings illustrate portions of the thickness measurement tool which form no part of the claimed design.

Claims

I claim the ornamental design for a thickness measurement tool, as shown and described.

Referenced Cited
U.S. Patent Documents
1760372 May 1930 Pehrsson
1890404 December 1932 Murdock
2492067 December 1949 Schildmeier
4136457 January 30, 1979 Langer
D253047 October 2, 1979 Morgan
4443945 April 24, 1984 Takemura
4547970 October 22, 1985 Brewster
D290236 June 9, 1987 Custine
D295266 April 19, 1988 Anderson
4918825 April 24, 1990 Lesh
D345702 April 5, 1994 Hilpmann
5324288 June 28, 1994 Billings
D611371 March 9, 2010 Ohtani
7918230 April 5, 2011 Whitman
8025199 September 27, 2011 Whitman
8282573 October 9, 2012 Shabaz
8317725 November 27, 2012 Quick
8343071 January 1, 2013 Shabaz
D694138 November 26, 2013 Soderholm
D739275 September 22, 2015 Tseng
D827461 September 4, 2018 Doeren
10247532 April 2, 2019 Park
20030037455 February 27, 2003 Terui
20070271807 November 29, 2007 Karwowski
20170106528 April 20, 2017 Smith
Foreign Patent Documents
306215759 December 2020 CN
Patent History
Patent number: D952487
Type: Grant
Filed: Apr 14, 2020
Date of Patent: May 24, 2022
Inventor: Ching-Lung Lin (Taichung)
Primary Examiner: L. A. Grabenstetter
Assistant Examiner: Antoinette Martine Suiter
Application Number: 29/731,306
Classifications