Abstract: A lithographic apparatus includes an illumination system for conditioning a beam of radiation, and an article support for supporting a substantially flat article to be placed in a beam path of the beam of radiation. The article support includes a plurality of supporting protrusions that define a support zone for providing a substantially flat plane of support. The apparatus also includes a backfill gas feed for providing an improved thermal conduction between the article and the article support. The backfill gas feed includes a backfill gas discharge zone for feeding backfill gas to a backside of the article when supported by the article support. The backfill gas discharge zone substantially encloses the support zone.

Abstract: The present method and system features an active compliant pin chuck to hold a substrate, having opposed first and second surfaces, and compensates for non-planarity in one of the surfaces of the substrate. To that end, the support system includes a chuck having a plurality of piezo pins and reference pins, with the piezo pins being coupled to piezo actuators to undergo relative movement with respect to said reference pins. These and other embodiments are discussed more fully below.

Abstract: An exposure apparatus including a projecting optical system for projecting a pattern of the original onto a substrate, and an original stage being movable while carrying the original thereon. The original stage includes (i) a first holding portion for holding the original and having a first surface to be contacted to one surface of the original, the first holding portion being configured to position the original in a direction perpendicular to the surface, and (ii) a second holding portion for holding the original and having a second surface to be contacted to the surface, the second holding portion being elastically or resiliently deformable.

Abstract: A light wave distance measuring method, using a light wave distance measuring system with a focusing function, comprising a step of comparing a reference distance to an object to be measured obtained based on a position of a focusing lens with a measuring distance obtained by light wave distance measurement, and a step of defining the measuring distance approximately equal to the reference distance as a result of measurement.

Abstract: Systems, methods, and computer program products are provided for accurately measuring frequency-and/or-phase-related parameters of a sinusoidal signal that varies non-linearly in frequency or phase. A sinusoidal signal is sampled over a finite period of time at a plurality of sample points. The sampled signals are pre-processed, and a Fourier transform is performed on the pre-processed sampled signals. Phases of the pre-processed sampled signals are extracted from the Fourier transform, and a measurement indicative of frequency of the sinusoidal signal is determined from slope of the phases of the pre-processed sampled signals. Range to a target may be determined using the exemplary signal processing described above on laser radar interference signals.

Abstract: An apparatus includes a transmitter portion which transmits a defined beam of eyesafe laser energy, a receiver portion which receives reflected energy from the beam, and a further portion which analyzes information in the received energy so as to detect the presence of a moving projectile.

Abstract: A color switchable stress/fracture sensor in combination with a structure. The combination apparatus includes a structure requiring stress and/or fracture detection, and at least one elasto-mechanoluminescent material at least partially dispersed in and/or on the structure and/or in a coating on the structure. The combination apparatus further includes at least one fracto-mechanoluminescent material at least partially dispersed in and/or on the structure and/or in a coating on the structure, and at least one fiber optic cable positioned to receive and transmit sufficient light emitted from the elasto-mechanoluminescent material due to stress applied to the elasto-mechanoluminescent material and to receive and transmit sufficient light emitted from the fracto-mechanoluminescent material due to fracture of the fracto-mechanoluminescent material.

Abstract: An etching end point of a plasma etch is determined by defining an etch-stop condition. A layer formed on a substrate is etched using a plasma. A luminous intensity of the plasma is measured to determine a first luminous intensity. The luminous intensity is measured again after a predetermined time to determine a second luminous intensity. A determination is made whether a disturbance occurs. Compensation is applied to the measured luminous intensity if the disturbance occurs. A determination is made whether the measured luminous intensity or the compensated luminous intensity satisfies the etch stop condition.

Abstract: A system and method that redistributes light from a light source. The controller can redistribute light to make an irradiance profile of the light source more uniform or make the irradiance profile match a fluid flow profile. The irradiance profile may be controlled by modifying light leakage from a plurality of waveguides or changing the light-directing properties of reflectors and/or lenses.

Abstract: The disclosure generally relates to a method and apparatus for compact dispersive imaging spectrometer. More specifically, one embodiment of the disclosure relates to a portable system for obtaining a spatially accurate wavelength-resolved image of a sample having a first and a second spatial dimension. The portable system can include a photon emission source for sequentially illuminating a plurality of portions of said sample with a plurality of photons to produce photons scattered by the sample. The photon emission source can illuminate the sample along the first spatial dimension for each of plural predetermined positions of the second spatial dimension.

Abstract: Estimating one or more optical characteristics of a Device-Under-Test (DUT). The method, includes directing an optical wavefront, generated by a source, towards a test location and generating at least one ray from the wavefront at the test location. Then for each ray at two or more measurement planes, each measurement plane transverse to the direction of travel of the wavefront and beyond the test location relative to the source at different optical path distances, measuring respective points of intersection of the ray with the measurement planes with and without the DUT at the test location.

Abstract: An object pattern is imaged by an imaging system onto the image plane of the imaging system at a location where a reference pattern suited to the object pattern is situated in order to measure the imaging fidelity of an optical imaging system, for example, an eyeglass lens, a photographic lens, or a projection lens, for use in the visible spectral range. The resultant, two-dimensional, superposition pattern is detected in a spatially resolved manner in order to determine imaging parameters therefrom. The object pattern is generated with the aid of at least one electronically controllable pattern generator that serves as a self-luminous, electronically configurable, incoherent light source and may, for example, have a color monitor. The measuring system allows rapidly, flexibly, checking optical imaging systems with minimal time and effort spent on the mechanical setup required.

Abstract: A surface to be tested and an optical system for projecting an index to an apparent spherical center position of the surface to be tested are moved relative to each other and an eccentric quantity of the surface to be tested is calculated from an movement quantity. A focal distance of an optical system is changed according to an apparent radius of curvature of each surface to be tested, which is calculated in advance. A reflection image on a surface to be tested, which is to be measured, is determined from the apparent radius of curvature of each surface to be tested, which is calculated in advance. Thus, an eccentric quantity of the entire lens system is accurately measured.

Abstract: A device is presented for computing an optical center of a sensor array relative to a lens. The sensor array includes a plurality of sensor units, and each sensor unit has a position on the sensor array. The lens defines an optical axis. The device includes a configuration module and a processing circuit. The configuration module is provided for positioning the lens and the sensor array thereon. When test light is parallel to the optical axis and is incident to the lens, the sensor array receives the test light transmitted by the lens so that each sensor unit outputs a value. The processing circuit is linked to the sensor array for receiving values outputted from the sensor units and selecting positions of sensor units outputting a specific value among the values, for computing the optical center of the sensor array.

Abstract: The invention relates to a surveying system, comprising at least one total station unit (210, 220), and at least one target (201, 203), said targets having wireless communication means, each unit provided with a unique wireless communication address for wireless communication, the wireless communication to be used to activate a selected total station (210, 220) to identify and measure the location of a chosen target (201, 203) in relation to a relative reference system, each target having identification means to be used by the total station for identification of the chosen target, each total station having identifying means used for identification of the chosen target to be measured. The invention also relates to a target and a method for surveying using the total stations and the targets according to the system.

Abstract: Aligning and testing alignment of optical elements in a laser beam delivery system using non-visible radiation. An alignment mirror replaces a beam redirection mirror and includes a fluorescing substrate and a dielectric coating on an incident face of the fluorescing substrate that reflects a major part of an incident laser beam along a next leg of the beam path and transmits a part of the beam into the fluorescing substrate, which is transmissive to visible radiation and fluoresces when irradiated by the beam to emit a visible light image from a back face of the alignment mirror. An alignment target on the back face indicates a preferred point of incidence of the beam on the alignment mirror for a desired alignment of the at least one laser beam. A lens may be tested and the properties of the lens determined by use of a fluorescing target plate.

Abstract: A method of detecting mask defects in which a reference substrate is patterned by the mask immediately after manufacture of the mask is disclosed. The reference substrate is stored in clean conditions while IC manufacture takes place. When a mask defect is suspected, a resist coated substrate, the test substrate, is patterned by exposure of the mask. The patterns on the reference substrate and the test substrate are compared to determine if there is a mask defect. The location of the mask defect can be found by scanning smaller areas of the patterns.

Abstract: The invention concerns an apparatus and a method for inspection of a wafer. The apparatus encompasses at least one stroboscopic incident-light illumination device for emitting a pulsed illuminating light beam onto a surface of the wafer and for illuminating a region on the surface of the wafer; and having [sic] at least one image acquisition device for acquiring an image of the respectively illuminated region on the surface of the wafer. The apparatus is characterized, according to the present invention, in that by at least one photodetection device for sensing light of the respective illuminating light beam, and a control device for controlling an image acquisition operation on the basis of the light sensed by the photodetection device, are provided. Intensity fluctuations of the light flashes of the incident-light illumination device are compensated for either by normalizing image data of the illuminated region or by controlling the duration of the light flashes.

Abstract: Disclosed are process and apparatus for inspecting internal inclusions in internally transmissive substrates. The process involves applying a black coating to one major surface of the substrate, submerging the substrate in a refractive index-matching fluid, and scanning the substrate with a collimated light beam. The scattered light signals produced by the inclusions can be detected by the human eye or by using a light detector. By the use of index-matching fluid and the black coating, the signal-to-noise ratio of the process and apparatus are enhanced. A preferred black coating is one cured from an electron beam or photo polymerizable coating composition applied to the major surface. The process and apparatus are particularly suitable for inspecting internal inclusions in an internally transmissive substrate having considerable amount of surface defects or contoured surface that prevent it from inspection in a gas medium.

Abstract: The structure size of a structure (100) is measured by forming an auxiliary measured value (Dx?, Dy?). A calibration measured value (Px?, Py?) is determined on the basis of a calibration structure (110), which comprises at least two structure elements (140) at a distance from one another, including at least the measured value sum of the width (By?) of one of the two structure elements (140) and the distance (Ay?) between the two structure elements (140). The calibration measured value (Px?, Py?) and a predetermined calibration preset value (Px, Py), which relates to the calibration structure (110), result in the determination of a calibration factor (C, Cx, Cy). The auxiliary measured value (Dx?, Dy?) is corrected using the calibration factor (C, Cx, Cy) in order to form the structure size measured value (Dx,k; Dy,k).

Abstract: A multiple pass optical cell and method comprising providing a pair of opposed mirrors, one cylindrical and one spherical, introducing light into the cell via an entrance mechanism, and extracting light from the cell via an exit mechanism, wherein the entrance mechanism and exit mechanism are coextensive or non-coextensive.

Abstract: An optical flow cell is disclosed that includes a flow cell body having an inlet and an outlet with a flow opening therebetween to allow a fluid to pass therethrough. A light entry fixture and a light imaging fixture are transversely carried by the flow cell body to allow viewing of the flow opening, wherein the light entry fixture is positioned at one side of the body and the light imaging fixture is positioned at an opposite side of the body. The fixtures are made from at least some materials different than then flow cell body but having a thermal rate of expansion that matches a thermal rate of the body so as to maintain a predetermined size of the flow opening during temperature fluctuations.

Abstract: A method for measuring the presence or concentration of an analyte in a sample by spectrophotometry: providing an open top cuvette having a sample with an analyte to be measured; providing a light source and a detector for detecting emitted light; taking at least two measurements that includes: (i) directing at least two beams of light from the light source to different locations on the cuvette; (ii) passing the at least two beams through the cuvette at their respective locations and through the sample to be measured; and (iii) measuring at least two respective emitted light beams with the detector; and comparing the at least two emitted light beams to determine if: all the emitted light beams should be disregarded; one or more of the emitted light beams should be disregarded; or the sample absorbances should be averaged. In a preferred embodiment, the method includes taking at least three measurements.

Abstract: Wavelength-tunable radiation amplifying structures for Raman spectroscopy are disclosed that include resonant cavities having Raman signal-enhancing structures disposed therein. Systems that include the amplifying structures and methods of performing spectroscopic analysis using the structures and systems are also disclosed.

Abstract: Small, fast, and inexpensive in-line spectrophotometers can produce in-line spectrums of a substrate before or after printing on the substrate. In-line spectrums are generally far less complete than a reference spectrum produced with a large, slow, and expensive reference spectrophotometer. An in-line spectrum can be mapped to a reference spectrum using a variety of known algorithms. However, the mapping is erroneous when the media substrate type changes. Reference transform matrices and in-line transform matrices can correct the erroneous mapping.

Abstract: A particle imaging system and a method provided for analyzing particles in a fluid; the system comprising a means for capturing image data of the fluid within a sample cell, and a means for flow control, a valve and a pump, wherein the fluid within the sample cell is periodically stopped, or slowed down, for image capturing and moved rapidly between image capturing events. Advantageously, the present invention allows to increase exposure times, which is particularly significant for fluorescent imaging at low illumination levels.

Abstract: A polarization stabilizing device and method based on controlling the phase retardation of a pair of variable phase retarders with a controller such that the first of the variable retarders has its phase retardation switched between first and second values whenever the phase retardation of the second of the variable retarders reaches an upper or a lower limit. The upper and lower limits of the second retarder and the first and second values of the first retarder are chosen so that discontinuities in the power of the output optical signal are avoided when the first variable retarder is switched, thereby providing endless polarization stabilization using phase retarders that themselves have only limited retardation ranges.

Abstract: A method of optical characterization of a layer of material in which the spectrum of index n* (?) is characterized by a limited number of “nodes” that are points with coordinates (?i, ni, ki) or (?i, n*i), with ni=n(?i), ki=k(?i) and n*i=ni+jki, where j2=?1, and an interpolation law between the “nodes,” which can be, for example, linear, cubic, of “spline” type or polynomial (of any given degree). This interpolation law allows the calculation, from the “nodes,” of the refraction indexes and the extinction coefficients for the wavelengths located between the “nodes.

Abstract: A method of reducing the effect of systematic and/or random noise during determination of dependent variable values, (eg. pseudo “n” and “k” and/or ellipsometric PSI and DELTA or mathematical equivalent vs. wavelength or angle of incidence), involving selecting a mathematical function and an independent variable subset range combination so that a square error best fit with total summed square error over the independent variable subset range being minimized, zero or within an acceptable range near zero, are achieved.

Abstract: A surface inspection apparatus includes: a light source unit that emits a divergent light flux of predetermined linearly polarized light to be used to illuminate a test substrate; a first optical member that allows the divergent light flux of the predetermined linearly polarized light to enter therein with a predetermined angle of incidence and then guides a light flux to the test substrate; a second optical member that allows a light flux from the test substrate to enter therein, emits a convergent light flux thereof with a predetermined angle of emergence and forms an image at a specific surface; an extraction unit that extracts linearly polarized light in the convergent light flux from the second optical member, which is perpendicular to the predetermined linearly polarized light; a light-receiving unit that receives an image of the test substrate formed via the second optical member and the extraction unit; and at least one polarization correcting member disposed within a light path extending between the

Abstract: This invention concerns a device for ellipsometric two-dimensional display of a sample placed in an incident medium, observed between a convergent light cross-reflected analyser and polarizer, wherein the ellipsometric parameters of the ensemble formed by the sample and a substrate whereon it is placed, are processed. The substrate comprises a base and a stack of layers of base and its ellipsometric properties are known. The ellipsometric properties of the substrate are such that the variations of the ellipsometric parameters of the sample are displayed with a contrast greater than the contrast produced in the absence of such substrate. The invention also concerns a display method and an ellipsometric measurement method with spatial resolution.

Abstract: In an apparatus which determines characteristics of a thin film according to the present invention, a temporal change in a refractive index n and an extinction coefficient k of a thin film in a period from start of a change in the thin film as a processing target (e.g., melting) to end of the change (e.g., solidification) can be obtained with a high time resolution of pico-seconds. Based on this, it is possible to know a progress of a change in state of the thin film (e.g., crystallization) or a transition of growth of crystal grains in units of pico-seconds.

Abstract: A method and an apparatus for generating color reappearance peculiarity profile and a method and an apparatus for reappearing color using a plurality of color reappearance peculiarity profiles are provided. The method of generating the color reappearance peculiarity profile includes: outputting a color standard scale having a set color information value through a color reappearance device; measuring actual color information value of the outputted color standard scale; calculating a color information difference value between the set color information value and the measured actual color information value of the color standard scale; and generating the color reappearance peculiarity profile which instructs the color reappearance device to reappear an optimized color using the color information difference value. Thus, the color reappearance optimized for a color reappearance device such as a color printer, a color copying machine, a monitor, or a scanner is performed by generating optimized color profiles.

Abstract: Electro-optically inspecting a longitudinally moving rod of material (12). Guiding rod (12) along its longitudinal axis by rod guiding unit (14), along optical path (20) within transparent passageway (22). Optical path (20) and transparent passageway (22) coaxially extend along longitudinal axis of rod (12) and pass through an electro-optical transmission module (24). Focused beam (28) from illumination unit (26) is transmitted through first side (30) of transparent passageway (22) and incident upon rod (12) within transparent passageway (22). Illuminating volumetric segment (34) of rod (12) by incident beam (32), such that incident beam (32) is affected by and transmitted through volumetric segment (34) and transmitted through second side (36) of transparent passageway (22), for forming rod material transmitted beam (38).

Abstract: The present invention relates generally to an improved method and apparatus for measurement of properties of a sample as a function of temperature. The method and apparatus are based on formation of a stable temperature gradient through the holding fixture such as a cell or a plate containing the sample under study, measurement of the property of interest as a function of position, and relating the positions of the measurements to the temperature of the studied sample at that position. In the preferred application, thermal and thermodynamic properties of solutes are obtained. Provisions are described to combine optical interrogation with Raman spectroscopy. Alternate technique of interrogation is total internal fluorescence reflection. Chemical reaction rates as function of temperature can be advantageously studied including reactions catalyzed by enzymes.

Abstract: A fine structure body comprising first fine metal particles, which have head regions projected upwardly from a surface of a base body, is utilized. A substance capable of undergoing specific binding with a test body is fixed to the head regions of the first fine metal particles. Second fine metal particles, to which a substance capable of undergoing specific binding with the test body has been fixed, are dispersed in a sample liquid. The test body is detected from variation of a resonance wavelength of localized plasmon resonance, which variation occurs when the test body is adsorbed to the surface of the fine structure body by being sandwiched between the substance fixed to the first fine metal particle and the substance fixed to the second fine metal particle.

Abstract: A sensor apparatus comprising a photonic crystal structure optically coupled to a laser, the photonic crystal structure comprising a beam splitter, an interferometer having a reference arm and a sensor arm, a first output configured to be optically coupled to a bright port photodetector, and a second output configured to be optically coupled to a dark port photodetector.

Abstract: An apparatus, which includes a light source, a polarizing plate for converting the light beam to linearly polarized light, a half mirror for dividing the light beam into signal light and reference light and superimposing the signal light and the reference light on each other to produce interference light, a wavelength plate for converting the reference light to circularly polarized light, a frequency shifter for shifting a frequency of the reference light, a reference mirror which is moved by a piezoelectric element, a polarization beam splitter for extracting an S-polarized light component and a P-polarized light component from the interference light, CCDs for detecting the respective polarized light components and outputting detection signals, and portion for calculating a signal intensity of the interference light and a phase thereof based on the detection signals. An image of an object to be measured is formed based on a result obtained by calculation.

Abstract: An integrated optical sensor, using low coherence interferometry, is capable of determining analyte concentration in a material sample based on absorption, scattering and polarization. The sensor includes one or more light collectors, with each collector having a separation distance from the region where the sample is illuminated by the source. The light backscattered from the sample is combined with reference arm light at the same optical path length for each light collector. The intensity of interference may be correlated with the concentration of an analyte in the material, for example the glucose concentration in a turbid medium like skin. The sensor operation can be based on fiber optics technology, integrated optics, or a combination of these. The operation is such that the spectrally resolved scattering and absorption coefficients can be measured simultaneously. In addition, the operation of the sensor can be synchronized with other sensors, for example temperature, pressure, or heartrate.

Abstract: The present invention relates to a method for determining the depth of a buried structure in a semiconductor wafer. According to the invention, the layer behavior of the semiconductor wafer which is brought about by the buried structure when the semiconductor wafer is irradiated with electromagnetic radiation in the infrared range and arises as a result of the significantly longer wavelengths of the radiation used in comparison with the lateral dimensions of the buried structure is utilized to determine the depth of the buried structure by spectrometric and/or ellipsometric methods.

Abstract: A position sensor using a novel structured light generating scale or target member is provided. An imaging array is capable of measuring the relative translation and orientation of the structured light generating scale or target member in X, Y, Z, yaw, pitch, and roll (“6D”) simultaneously, and with high precision. The target member includes an array of lenses that provide an array of structured light patterns that diverge, converge, or both, to change the size of the corresponding structured light image as a function of the “Z” coordinate of the relative position, in various embodiments. The X-Y position of each individual structured light image on the imaging array varies with the relative X-Y position of the structured light generating target member, and the shape of structured light image changes as a function of the relative angular orientation.

Abstract: A measurement system processes data representing an images of an optical target, e.g. on a contact probe, to determine position of each of a number of points on a vehicle or other object. The system uses two reference frames and processes an image of the two frames, to define a three-dimensional (3D) coordinate system, for example, in relation to a designated first frame. The image processing determines the position of the other frame in that coordinate system. For any measurement in which the first reference frame is visible in an image with the probe, processing directly determines position of the point in the 3D coordinate system. For any measurement in which that reference frame is not sufficiently visible, but the second reference frame is sufficiently visible, the image processing determines position relative to the second reference frame and transforms that position into a measurement in the defined three-dimensional coordinate system.

Abstract: A beam catcher (1) for a light beam (2) pulsating in amplitude at a modulation frequency (f) with a photodetector (4) with a plurality of photosensors (6) which are offset in a spatially defined manner relative to a reference point (5), an evaluating circuit (7), and an output device (8). A phase shifter (10) that is sensitive to the modulation frequency (f) is arranged between at least two photosensors (6).

Abstract: A system for determining the amount of LC that is dropped on a display panel is presented. The system can adjust the amount of the LC to be dropped based on a real-time feedback on the amount of LC that is currently being dropped. The amount of LC that is being dropped is detected by utilizing a light source and a CCD camera. Because LC is not consumed wastefully and the detection interval is shortened with this system, the amount of LC that is dropped can be controlled more accurately and manufacturing cost is reduced.

Abstract: A method for measuring three-dimensional objects by single view backlit shadowgraphy. To measure at least one geometrical parameter of such an object, for example the thickness of a hollow sphere, translucent or transparent to visible light, optical characteristics of the object are determined, by which at least one optical model of the propagation of light through the object is established. This model includes an equation that relates the parameter to the result of an observation directly performed on an image of the object, the object being acquired by observing the object by single view backlit shadowgraphy. The image is acquired, the observation is performed, and the parameter is determined by the equation and the result of the observation.

Abstract: An automatic pre-printed sheets insertion system integratable into an otherwise conventional printer, without requiring any additional space, yet enabling the feeding of selected pre-printed sheets into the printer output path, bypassing the print engine and fuser, yet integrating collated with the output of regular sheets being regularly fed and printed within the printer. It includes a separate insert sheets feeding system and feeding path for feeding insert sheets from a bi-directional sheet feed tray which can be mounted in the same location as a normal sheet feed tray. The separate path can be through an existing inverter. The special tray can be a dual-mode tray and/or a repositionable tray for feeding blank or other normal sheets in one direction for printing and for feeding insert sheets in the opposite direction to be integrated into the printer output.

Abstract: To perform control so as to acquire a list of print style information stored in an output device, specify a particular piece of print style information in the acquired list, generate print data associated with the specified piece of print style information, and store the generated print data in the output device or output the generated print data from the output device.

Abstract: An output instruction including output conditions that differ by page is instructed by the output instruction unit, the instruction data is analyzed by a data analysis unit, instruction data including instructed output conditions that differ by page is stored, the image data is image-processed by an image processing unit in accordance with the instruction data stored in the data analysis unit, to thereby create an output image, the output conditions of the printing mechanism are switched by an output control unit in accordance with the instruction data, and the output image generated at the image processing unit is printed by a printing mechanism. It is determined whether or not there are contradictions in the instruction data of the image data, resetting is prompted with respect to contradictions, and an appearance when image recording is actually effected in accordance with the instruction data is displayed.

Abstract: An image-processing device creates a sequential print-processing schedule for inputted print jobs on the basis of supply conditions of required resources, such as printing media and the like, and of attribute information of the print jobs. Before execution of a print job, the image-processing device acquires attribute information for the leading job in a print-waiting queue, and determines whether or not resources requested for that print job are supplied. If not, execution of that printing job is inhibited, and the next print job in line is performed. Thus, productivity of the device can be improved. However, it is also determined whether or not the print job meets a predetermined condition. If so, other jobs are blocked from overtaking the inhibited job and being performed first. The inhibited job waits until resources are supplied, and thus re-prioritization of the print jobs against the will of a user is prevented.

Abstract: A printing process of print target data downloaded from a web server using a plug-in, which can be run from a browser for accessing data held in the web server, can be easily realized. In an information processing apparatus for downloading print target data from a web server unit and controlling a printing process of the downloaded print target data, both print target data prepared in the web server unit and printing setting information containing a print layout type of the print target data are downloaded. A plug-in capable of being run from a browser is employed to make a drawing of the downloaded print target data based on the print layout type in the printing setting information, and the drawing data is output to a printer driver adapted for a printer via a drawing section of the information processing apparatus for creation of print data to be printed by the printer.