Abstract: A voltage sensing system and method for use with ungrounded power line sensors deployed on each phase of a power line. The voltage of each phase is measured using the sensors. This measurement is used unless there is a snow event. A collector is powered by a transformer connected to the power line being monitored and a voltage measurement circuit is configured to measure the collector supply voltage which is then used to obtain an alternate voltage measurement for each phase. When the sensor measured voltage for any phase deviates from the alternate voltage measurement by a pre-established value, a snow event has occurred and the alternate voltage measurement may then be used.

Abstract: A stress control apparatus for managing effects caused by electrical stress in a high voltage environment, and methods of manufacturing the apparatus. A dielectric tube with a central bore coated with a conductive material has an outer conductive coating on a lower section that is grounded. The central bore carries a high voltage potential from a current-carrying conductor. The grounded coating transitions to the exposed outer dielectric surface along a gradually tapered transition. A conductive insert connects to the central bore and forms an electric field in a space between the insert and the grounded coating. When coated with an epoxy and inserted into the central bore, the insert forms a small gap between an outer surface of the insert and part of the central bore, such that there is no zero potential difference in the gap. Any epoxy that oozes out during insertion will collect in the gap.

Abstract: The application relates to a method for determining beam parameters of a charge carrier beam, a measuring device, and a charge carrier beam device. The charge carrier beam (4) from a charge carrier beam device (1) is guided, by means of a beam deflection unit (3), over a slit aperture arrangement which is provided in an aperture device (7) and which has one or more slit apertures (8). Measurement plane coordinates of the beam components that penetrate the slit aperture arrangement are determined. On the basis of the measurement plane coordinates, the aperture device automatically moves in such a way that a measuring aperture (9) arranged in the aperture device moves over a predefined measurement reference point. The beam parameter is measured by the measuring aperture. In a measuring device (5) suitable for carrying out said method, the slit aperture arrangement has at least two non-parallel slit aperture sections (12, 13, 15, 16) which can be part of a single continuous slit aperture.

Abstract: A digital multimeter stores multiple sequential measurements of physical or electrical parameters. Each of the sequential measurements has a name including an automatically generated descriptor. The descriptor for each sequential measurement may indicate a relative position of the measurement within the sequence. For instance, the descriptor may indicate whether the measurement was obtained before or after other measurements in the sequence.

Abstract: A hot stick power analyzer includes a housing mounted on a pole and a channel for a power line. A ground line extends from the housing and there is a power line conductive contact. A voltage sensor includes voltage sensing circuitry connected to the power line conductive contact and the ground line. There is a high voltage capacitance between the ground line and the voltage sensing circuitry. A current sensor includes windings about and spaced from the power line. A processing subsystem is responsive to the voltage sensing circuitry and to the current sensor and is configured to compute power analysis metrics.

Abstract: Provided are a connection error detecting apparatus and method. The connection error detecting apparatus, which detects connection errors for each rating of a smart meter, comprises: a parameter calculating unit for calculating connection error detecting parameters including an actual three-phase voltage value, an actual three-phase current value, an effective amount of three-phase power, and an ineffective amount of three-phase power; and a connection error determining unit for setting connection error criteria for detecting connection errors for each rating of the smart meter, and detecting the connection errors for each rating by determining whether or not any one of the connection error detecting parameters satisfies the connection error criteria.

Abstract: There is here disclosed a method and apparatus for detecting the occurrence of arcing of a conductor by monitoring the current on an AC power line. The signal detected is split and directed along four separate paths to generate four signals having separate characteristics which represent the current in the line. Upon the detection of arcing, an output signal can be generated to activate a circuit interrupting mechanism, sound an audio alarm and/or alert a central monitoring station.

Abstract: A prober system comprises a chuck, sensor and processing circuit. The chuck is configured to horizontally move a semiconductor wafer having a plurality of dies to position a selected group of the dies for parallel testing and vertically move the wafer to press the selected group of dies in contact with probes of a tester probe card. The sensor is configured to measure the vertical movement of the chuck when the wafer is on the chuck. The processing circuit is configured to control the horizontal and vertical movement of the chuck to test different groups of the dies, determine a total number of touchdowns between the wafer and the probes based on the vertical movement of the chuck measured by the sensor and associate each of the touchdowns with a location of the wafer contacted by the probes during that touchdown. A corresponding test data analysis system is also provided.

Abstract: A radio frequency characteristics measurement jig device includes: a ground conductor part; a first coplanar line; a connection substrate; and a holding part. The first coplanar line includes a first dielectric layer, a first center conductive layer and first ground conductive layers. The connection substrate includes a second dielectric layer, a second center conductive layer, second ground conductive layers, and a third ground conductive layer. The holding part is configured to press the connection substrate to the first coplanar line and the signal terminal so as to allow electrical continuity between the first center conductive layer and the second center conductive layer on the first region, to allow electrical continuity between the first ground conductive layer and the second ground conductive layer, and to allow electrical continuity between the second center conductive layer on the second region and the signal terminal.

Abstract: A test method for an interposer is provided. The interposer includes a plurality of conductive lines therein and a plurality of connecting contacts thereon, wherein the connecting contacts are electrically connected to the conductive lines. The test method for an interposer provides a passive transponder device. The passive transponder device includes a first circuit including an open/short test circuit and at least a pair of connecting contacts. The test method for an interposer includes contacting the connecting contacts of the first circuit in the passive transponder device with the selected contacts on the interposer to form a checking area and conducting an open-circuit or short-circuit test for the interposer through the checking area.

Abstract: A fixture for probing circuit boards and microcircuits. A guide plate provides indexing for positioning a probe assembly in one or two dimensions. The guide plate has two opposed mounting sides connected by one or two indexing sides and is mounted to the test unit by screws. The indexing sides and, optionally, the mounting sides have column mounting holes and column markings. A bridge mounts to the indexing sides with its column pointer aligned with the desired column marking. The bridge has row mounting holes and row markings. The probe assembly mounts to the bridge with its row pointer aligned with the desired row marking. Optionally, the bridge is part of the probe assembly and without row indexing elements to be used in one dimension. The probe assembly has a terminator platform and connector plate with electrical cable assemblies extending therebetween.

Abstract: There is provided a wiring structure comprising a board, which includes a connection pattern, and a plurality of flexible printed circuit boards (FPCBs). Each of the flexible printed circuit boards includes test patterns connected to the connection pattern. The test patterns included in each of the FPCBs are connected to each other by the connection pattern.

Abstract: An apparatus includes a top plate and an extension card surrounding a space for a small electronic assembly. The extension card and small electronic assembly are mounted to the top plate. The apparatus includes a plurality of test probes extending through the top plate and moving relative to the top plate. A portion of the test probes are positioned to contact the extension card and a portion are positioned to contact the small electronic assembly when the test probes move with respect to the top plate. The apparatus includes a vacuum box in contact with the top plate and surrounding the extension card and small electronic assembly. The top plate moves relative to the test probes so the test probes contact the extension card and the small electronic assembly in response to a vacuum force evacuating an area under the top plate and within the vacuum box.

Abstract: A via chain testing structure includes: a substrate; a dielectric layer disposed on the substrate; a first via chain disposed on dielectric layer; a second via chain, being disposed on the dielectric on both sides of the first via chain and in thermal proximity with the first via chain; a first heating source disposed under the substrate, for providing thermal heat to the first via chain; and an electrical current source for heating the second via chain so the second via chain acts as a second heating source for the first via chain.

Abstract: A device for monitoring the latency of electronic circuits based on microtechnology and/or nanotechnology, said circuits to be tested being supplied with the aid of a voltage Vdd, having a low level and a high level, for the detection of delay faults of said circuits, comprises: at least one device of type I placed between the high level of the power supply voltage and the elements of the circuit to be tested, and/or at least one device of type II placed between the low level of the power supply voltage of the elements of the elements of said circuit to be tested, the device of type I and the device of type II comprising at least one low-latency electrical path, said low-latency path being connected in parallel with a high-latency electrical path, a test signal monitoring the opening of the low-latency paths while the high-latency electrical paths are open.

Abstract: An apparatus to test a semiconductive device includes a base plane that holds at least one heat-transfer fluid unit cell. The at least one heat-transfer fluid unit cell includes a fluid supply structure including a supply-orifice cross section as well as a fluid return structure including a return-orifice cross section. The supply-orifice cross section is greater than the return-orifice cross section. A die interface is also included to be a liquid-impermeable material.

Abstract: A semiconductor testing jig fixes a measurement target while it is held between a chuck stage and the measurement target. The semiconductor testing jig includes a base on which the measurement target is to be installed and which can be attached to the chuck stage. The base includes: a first main surface to become an installation surface for the measurement target; a second main surface opposite the first main surface and which is to contact the chuck stage; and a porous region containing a porous member. The porous region is provided selectively as seen in plan view, and penetrates through the base from the first main surface toward the second main surface.

Abstract: A test device is provided for testing a bottom chip of a package-on-package (PoP) stacked-chip. An upper surface of the bottom chip has a plurality of soldering points for electrically connecting a plurality of corresponding soldering points of a top chip of the PoP stacked-chip. The test device includes a test head and a plurality of test contacts. The test head has the top chip installed inside. The plurality of test contacts is installed on a lower surface of the test head and electrically connected to the plurality of corresponding soldering points of the top chip inside the test head. When the lower surface of the test head contacts the upper surface of the bottom chip, the plurality of test contacts is electrically connected to the plurality of soldering points for testing the bottom chip.

Abstract: A communication device is provided, which includes: a baseband chip; a target test chip integrated into the baseband chip; an upper-layer processing unit corresponding to the target test chip; and at least one data transport interface and at least one data processing unit corresponding to the at least one data transport interface. The communication device further includes: a first switch, adapted to connect the target test chip with the at least one data transport interface or the upper-layer processing unit; a second switch, adapted to connect the at least one data transport interface with its corresponding data processing unit or the target test chip; and a test control unit, configured to control the first switch and the second switch to connect the data transport interface with the target test chip, so as to enable the communication device to test the target test chip.

Abstract: Systems and methods for enabling scan testing of device-under-test (DUT) are disclosed. In an embodiment, a test system for scan testing the DUT, including P scan input ports and Q scan output ports, includes tester and adapter module. Tester operates at clock frequency F1 and includes M tester Input/Output (I/O) ports for providing M scan inputs and N tester I/O ports for receiving N scan outputs at F1. Adapter module is coupled to tester and configured to receive M scan inputs at F1 and, in response, provide P scan inputs at clock frequency F2 to P scan input ports, and to receive Q scan outputs at F2 from Q scan output ports and, in response, provide N scan outputs at F1 to N tester I/O ports, where ratio of M to P equals ratio of N to Q, and where each of M, N, P and Q are positive integers.

Abstract: IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

Abstract: Aspects of the invention relate to test generation techniques for test-per-clock. Test cubes may be generated by adding constraints to a conventional automatic test pattern generator. During a test cube merging process, a first test cube is merged with one or more test cubes that are compatible with the first test cube to generate a second test cube. The second test cube is shifted by one bit along a direction of scan chain shifting to generate a third test cube. The third test cube is then merged with one or more test cubes in the test cubes that are compatible with the third test cube to generate a fourth test cube. The shifting and merging operations may be repeated for a predetermined number of times.

Abstract: A Propagation Test instruction, a Decay Test instruction and a Cycle Test instruction provide testing of DC and AC interconnect circuits between circuits including JTAG boundary scan cells. A few additions to the Test Access Port circuitry, including gating producing a Capture Test Strobe (CTS) signal, and the boundary scan cells are required to implement the additional instructions. The instructions are extensions of the conventional JTAG operating structure.

Abstract: A system is provided for monitoring an energy-storing apparatus during a non-operating event of a mechanism that draws energy from the energy-storing apparatus, which includes a plurality of energy-storing cells. The system includes a plurality of sensing units, each of which is coupled to a subset of the plurality of cells and is configured to monitor conditions of the corresponding subset of cells during the non-operating event. The system further includes a wireless communication unit and a power source. The wireless communication unit is coupled to each of the sensing units and configured to communicate a signal indicative of one of the monitored conditions of the corresponding subset of cells to a computing device. The power source provides energy to the sensing units and the wireless communication unit during the non-operating event.

Abstract: A remaining life determining system for a stationary storage battery has a detecting unit configured to detect an evaluation value indicative of a deterioration level of the stationary storage battery, a first storage unit configured to store a usage history of the stationary storage battery, a second storage unit configured to store remaining life information associated with usage information of the stationary storage battery, a third storage unit configured to store remaining life basic information of the stationary storage battery, and a controller configured to estimate the remaining life of the stationary storage battery, from the usage history, the evaluation value, and the remaining life information.

Abstract: In one embodiment, a method implemented by a processor, comprising receiving voltage values corresponding to a battery system, receiving charge values corresponding to charge flowing through the battery system, and determining a state of charge based on specified anchoring points of a charge integration, the anchoring points based on the received voltage and time.

Abstract: An apparatus and method for measuring battery voltage includes a first capacitor configured to receive a charge from a battery. A first switch may be configured to selectively couple the first capacitor to the battery. A second capacitor may be coupled to a reference potential. A second switch may be configured to selectively couple the second capacitor to the first capacitor to transfer at least a portion of the charge on the first capacitor to the second capacitor.

Abstract: A method of warning a user when a reserve time of a battery plant in a system is substantially degraded is disclosed. The method includes determining a baseline capacity for the battery plant by estimating the reserve time of the battery plant while the battery plant is installed in the system, subsequently determining a present capacity of the battery plant by estimating the reserve time of the battery plant while the battery plant is installed in the system, comparing the present capacity with the baseline capacity, and generating a warning when the baseline capacity exceeds the present capacity by more than a defined amount. Example embodiments of systems and control circuits configured to perform the methods are also disclosed herein.

Abstract: A resistive electromagnet assembly comprises a pair of coils with a gap defined between the coils. The resistive electromagnet assembly is configured to generate a field having a magnetic flux density of at least about 4 Tesla and at a sweep rate to complete a hysteresis loop in less than about 1 minute. A support assembly is configured to support a sample of magnetic material within the gap. An optics module is configured to expose a test region of the magnetic material sample to an optical beam probe while the test region is subjected to the field and to receive a reflected beam from the test region. A processor is coupled to the optics module and configured to measure one or more properties of the magnetic material using the received reflected beam.

Abstract: A system for locating at least one surface feature, such as a cooling aperture, on a turbine component is provided. The system includes at least one feature marker configured for placement adjacent to the at least one surface feature. The system also includes at least one sensor configured for non-visual detection of the at least one feature marker. The system also includes a control device coupled to the at least one sensor for receiving signals from the at least one sensor, wherein the signals represent data indicative of one of a presence of the at least one feature marker and an absence of the at least one feature marker.

Abstract: A method of measuring flux density and run out to accommodate rotors of different diameters, evaluate intrinsic properties of magnet material and the magnetization process. Circular run out measurement capability is also used to evaluate bearing journal “ovality.” The method includes the use of a scan tool, or a DLA Rotor Flux Density Scan Fixture, which evaluates the electromagnetic field strength (gauss), combined with surface run out and presents the data in a scalable pictorial format. The scan tool includes a probe which measures a magnetic field strength and circular run out of the perimeter of the magnet. Simultaneously, a non-contact measurement sensor is used to measure the rotor surface for subtle variations. The resulting sine wave gauss data and the surface dimension data are manipulated into a scalable “radar” plot. The radar plot correlates magnetic pole field strength and surface circular run out variation to the index position.

Abstract: A measuring system having a first magnetic field sensor, a second magnetic field sensor, a third magnetic field sensor, an encoder, and an evaluation circuit to which the first magnetic field sensor, the second magnetic field sensor, and the third magnetic field sensor are connected. The evaluation circuit is configured to determine the position of the encoder based on a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor and a third measurement signal of the third magnetic field sensor.

Abstract: A magnetic sensor includes a channel layer, a magnetization free layer placed on a first section of the channel layer, and a magnetization-fixed layer placed on a second section of the channel layer. A thickness of the channel layer of the first section is different from a thickness of the channel layer of the second section and a resistance of an interface between the channel layer and the magnetization free layer is lower than a resistance of an interface between the channel layer and the magnetization-fixed layer.

Abstract: An interventional or a non-interventional instrument like a catheter, a surgical device, a biopsy needle, a pointer, a stent or another invasive or non-invasive device, like a position marker, or a surface or local coil like a head coil is disclosed, wherein these instruments are provided with an MR-safe RF transmission line or cable (2, 3) for connecting the instrument with related RF transmit/MR receive units or other signal processing units for operating the instrument during an MR imaging or MR examination of an examination object. Basically, MR safety is obtained or increased by means of a plurality of fuses (6) which are serially connected into the transmission line or cable (2, 3).

Abstract: A magnetic resonance imaging apparatus according to an embodiment includes an acquiring unit, a detecting unit, a deriving unit, and an imaging controller. The acquiring unit acquires three-dimensional image data including a target organ. The detecting unit detects an upper end position and a lower end position of the target organ in the three-dimensional image data. The deriving unit derives an imaging range of subsequent imaging performed after acquisition of the three-dimensional image data based on the upper end position and the lower end position of the target organ. The imaging controller controls performance of the subsequent imaging in accordance with the imaging range.

Abstract: A magnetic resonance imaging (MRI) method includes applying a radio-frequency (RF) pulse to a subject including different tissues all including a same type of atomic nuclei to rotate magnetization directions of the atomic nuclei of the different tissues; applying an RF pulse sequence to the subject based on the magnetization directions of the atomic nuclei of the different tissues; and obtaining magnetic resonance signals from the different tissues in response to the RF pulse sequence.

Abstract: Techniques include determining, non-invasively and without applying deformational stress, a nuclear magnetic resonance relaxation rate at a volume inside a subject. The method also includes determining a mechanical property of material at the volume inside the subject based on the nuclear magnetic resonance relaxation rate.

Abstract: An electromagnetic emission device for helmet position detection systems includes an electromagnetic emitter and control electronics, the emitter comprising three windings arranged perpendicularly, the processing electronics comprising three electronic chains each associated to a given winding and working simultaneously. Each electronic chain comprises closed-loop control means arranged such that the related signal generated comprises three analogue components: a first component, being the stimulus component, modulated at an “emission” frequency of the winding, each of the three emission frequencies being different from one winding to the next, and a second and a third component, referred to as correction components, modulated at an emission frequency of another winding, the phase and amplitude of which are calculated such as to compensate the parasitic signals received by said winding from the other two windings.

Abstract: A survey method giving improvements in weapons fire location systems is disclosed. In an urban system with a distributed array in the midst of many buildings that block signal paths or create echoes, methods are provided to measure signal propagation. A survey or tour of the covered region uses a moving signal source to probe propagation inside the region. Survey results may indicate where more or fewer sensors are needed. Survey results plus current measured noise gives prediction of instantaneous system sensitivity. In addition, multipath propagation may be used to determine a location even when only one or two sensors detect the signal. In such exemplary cases, triangulation may be replaced or augmented by pattern recognition. Further, signals of the survey need not be acoustic impulses such as gunfire, but may be RF signals, or coded continuous signals so that gunfire-like sounds would not disturb citizens in the area.

Abstract: A location and guidance system including a flying craft and a reception device. The flying craft includes a plurality of antennas distributed around its fuselage and emitting rearwards with rectilinear polarization, the emitted signals being specific to each antenna, the positions and the dimensions of the antennas being configured such that the body of the flying craft avoids by masking for at least one antenna the reflections of the signal emitted by this antenna off the ground or off lateral obstacles whatever the position of the flying craft. The reception device is placed substantially on a trajectory axis of the flying craft and configured to be oriented to sight the rear thereof and includes at least two single-pulse antennas operating in orthogonal planes determines a position of the flying craft by analyzing the emitted signals received by the antennas of the reception device.

Abstract: In a vehicle inclination detecting device, a receiving unit includes a switching unit for alternately switching between a received signal from a first receiving antenna and a received signal from a second receiving antenna to alternately output the received signals to an orthogonal detector. The orthogonal detector carries out orthogonal detection on each of the two received signals from the switching unit and an oscillating signal from an oscillator by using an identical line.

Abstract: A system for supporting and tracking at least one item includes a plurality of support structures adapted to support at least one item, at least one signal receiving arrangement associated with the plurality of support structures, at least one indicator arrangement associated with the plurality of support structures, and at least one controller in communication with the at least one signal receiving arrangement and the at least one indicator arrangement. The at least one signal receiving arrangement is configured to receive data from a transponder associated with the at least one item. The controller is programmed and/or configured to control the plurality of indicator arrangements based at least partially on at least a portion of the data received from the at least one signal receiving arrangement.

Abstract: A radar apparatus for a vehicle includes a radar unit provided at an inner side of a radiator grill for a vehicle, a multi-layer transmission cover which is fitted into the radar unit and on a front surface of which a plurality of transmission layers through which a radar beam radiated through the radar unit transmits are formed, and a mounting portion in which a connection body formed by connecting the multi-layer transmission cover to the radar unit is connected to a vehicle body.

Abstract: An integrated rainfall calculation method using X-band dual-polarimetric radar measurement data includes a precipitation classification step of classifying hydrometeors into four types of snow, rain/snow, rain and non-meteorological target through a fuzzy logic technique using a correlation coefficient (cross correlation coefficient, ?hv), features of a measured differential propagation phase (?dp(r)) or differential propagation phase (?dp) and a signal-to-noise ratio (SNR) as input variables (input feature vector); a specific differential phase calculation step of separately calculating a specific differential phase by applying a specific differential phase using a total difference of differential phase and signal-attenuation corrected reflectivity for the rain among the classified hydrometeors and applying a specific differential phase calculated using a filtering method for the other hydrometeors; and a rainfall calculation step of calculating rainfall by using a relation between the specific differential

Abstract: There is provided a radar apparatus configured to emit a transmission wave, to receive a reflected wave as a reception signal, and to derive target information including at least position information of a target from peak signals which are extracted by performing FFT processing for a beat signal that is generated from the reception signal. A determination unit is configured to determine whether a specific peak signal exists at a frequency that is distant from a frequency of the peak signal existing at a first frequency by a frequency of one selected peak signal selected from the plurality of peak signals. An exclusion unit is configured to exclude the target information corresponding to the selected peak signal from an output object of the radar apparatus when the specific peak signal exists.

Abstract: A method for ascertaining a misalignment of a radar sensor of a vehicle ascertains a misalignment angle of the misalignment using a weighted averaging of calculated differences between first and second angles of radar reflectors relative to various axes. Also described is a device for ascertaining this misalignment.

Abstract: The disclosure relates to a measurement device for optically measuring a distance to a target object, in particular a handheld measurement device. The disclosure relates to such a measurement device having a transmitting device for transmitting an optical measurement beam to a target object; a receiving device having a detection surface for detecting the optical measurement beam returning from the target object, wherein the detection surface has a plurality of pixels, and each pixel has at least one light-sensitive element; and a reference device having a detection surface for detecting a device-internal reference beam. According to the disclosure, the detection surface of the reference device has a plurality of pixels, wherein each pixel has at least one light-sensitive element.

Abstract: An image-sensing apparatus is provided. The image-sensing apparatus includes: an optical filter array including a two-band passing filter and an infrared filter; an RGB pixel array placed below the two-band passing filter; and a TOF pixel array adjacent to the RGB pixel array and placed below the two-band passing filter and the infrared filter, wherein a combination of the two-band passing filter and the infrared passing filter permits only the incident light in the infrared region to pass to the ToF pixel array.

Abstract: Systems and methods involve generating a baseband signal, up-converting the baseband signal to a radar signal frequency, filtering a lower sideband of the up-converted signal, and transmitting the filtered up-converted signal. Systems and methods also involve receiving a return signal, down-converting the return signal using a signal having a frequency offset from the up-converted signal, filtering the upper sideband of the down-converted return signal, and producing a baseband return signal.

Abstract: Methods and apparatus for performing adaptive motion compensation to remove translational movement between a sensor and a target using data from the sensor. After whitening, data can be processed to select a target and focus frequency components. Dynamic sliding window processing can be performed on processed time domain data to estimate an instantaneous range rate for the target.