Abstract: The present disclosure relates to a process for detecting and optionally quantifying an analyte in a sample in the presence of a soluble target of the analyte. The soluble target forms a complex with the analyte and thus may interfere in determining the total analyte concentration. The process of the present invention utilizes a unique modified citrate buffer for diluting the sample containing the analyte and the soluble target which in turn helps in dissociating the analyte-soluble target complex, thereby enabling the process of the disclosure to detect and optionally quantify measure the analyte accurately.

Abstract: It is an object of the present invention to provide a monoclonal antibody, which is suitable for the quantitative analysis of asparagine synthetase in a cell. The present invention provides a monoclonal antibody which specifically recognizes asparagine synthetase that is present in a cell.

Abstract: An analyte measurement system is provided having sensors with embossed test chamber channels. In one embodiment, the sensors are elongate test strips for in vitro testing, each test strip having a substrate, at least one electrode, an embossed channel in the electrode, and lidding tape covering at least a portion of the embossed channel. Methods of manufacture are also disclosed for filling the sensor channels with reagent, and for trimming the ends of the sensors to eliminate the need for a calibration code during use of the sensors with a meter.

Abstract: The present invention relates to a method for detecting cardiovascular oxidative stress in an individual, comprising detecting in a blood sample from the individual modification of a cysteine at position 45 of the ?1-subunit of the human erythrocyte ATP-dependent Na+K+ pump protein or of an equivalent cysteine in a homolog or variant thereof. The invention further relates to a kit for detecting cardiovascular oxidative stress in an individual, the kit comprising at least one agent for detecting the presence of a modification in a cysteine at position 45 of the ?1-subunit of the human erythrocyte ATP-dependent Na+K+ pump protein or of an equivalent cysteine in a homolog or variant thereof, wherein said modification is a result of oxidation.

Abstract: The present disclosure relates to the field of laboratory diagnostics. The present disclosure provides means and methods for differentiating between an acute circulatory event and an ischemic event, as the cause underlying an acute medical event of a patient.

Abstract: A method is described for treating a subject having acute heart failure (AHF) by measuring PERLECAN levels in the subject. The PERLECAN level in the subject is used to determine risk of mortality within one year for the subject. Treatment is selected on the basis of the outcome of the assay.

Abstract: The invention provides methods and kits for detecting conformationally altered proteins and prions in a sample. In one embodiment, the conformationally altered proteins and prions are associated with amyloidogenic diseases.

Abstract: This disclosure relates to determining the stress level experienced by fish over a long period of time, which can be used in assessing the welfare status of fish. More, in particular, this disclosure relates to the usage of scales as well as other calcified tissue such as otoliths, spines and soft fin ray sampled from fish to quantify glucocorticoid levels in the scales/matrix. The levels of the glucocorticoids, such as cortisol or corticosterone, build up over time in scales and reflect long-lasting and stressful conditions that the fish have undergone during their lives and that have affected their level of stress. Hence, in vitro methods are disclosed herein that quantify the level of chronic stress in fish using scales as a logistic feasible, and non-invasive matrix for accurate and precise quantification of stress hormones.

Abstract: The present invention relates generally to an assay device with improved tolerance to mishandling and/or use by the user. More particularly, the invention relates to an assay device with reduced susceptibility to flooding.

Abstract: Described herein are methods for determining the overall survival of maintenance hemodialysis patients. The methods include measuring low density lipoprotein (LDL) particle size and subfraction concentrations as prognostic tools for early mortality risk detection. For example, the presence of increased very small LDL concentration or decreased LDL particle size in blood-serum serves as a useful means for prognostic risk assessment and monitoring.

Abstract: An external standard solution for use in the analysis of amino acid in plasma, containing, (1) at least one amino acid selected from the following components A, at a concentration of 0.0007 M to 0.49 M, and (2) (i) at least one amino acid selected from the following components B, at a concentration of 0.2 to 0.9 times of the lowest-concentration amino acid among the amino acids selected from components A, (ii) at least one amino acid selected from the following components C, at a concentration of 0.1 to 0.4 times of the lowest-concentration amino acid among amino acids selected from the components A, or (iii) at least one amino acid selected from the following components D, at a concentration of 0.05 to 0.

Abstract: Processing containers include a first member having a substantially rigid body with a plurality of regions defining spaced apart workstations and a flexible barrier member sealably attached to the first member to define a closed chamber over the plurality of workstations. The flexible barrier is substantially impermeable and includes or is a manipulation tool that is sealably attached to the barrier. The manipulation tool has a first internal interface that resides in the closed chamber under the flexible barrier and a second external interface that resides outside the closed chamber. The processing containers are particularly suitable for automated processing of nucleic acids and other samples. The manipulation tool can cooperate with or include a pipette head. When the barrier is sealed, the barrier separates the contents of the container from a robotic arm or other manipulation device.

Abstract: An automatic biochemical analyzer is provided, the analyzer includes a reaction wheel that comprises an inner ring and outer ring, an interval of a photoelectric detection position of the inner ring and that of the outer ring is N cuvette positions along counterclockwise or clockwise direction, and an interval of a sample injecting position, a reagent injecting positions, a sample stirring position and a reagent stirring position of the inter ring and those of the outer ring respectively is M cuvette positions along the same direction, wherein M and N are integers and the difference between M and N is 0 or 1. The analyzer at the premise of ensuring the test flow, reducing wasting number of cuvettes, saving the cost of the whole analyzer, and the size of the reaction wheel will be as small as possible.

Abstract: This analysis apparatus includes a transporter transporting the specimens to the first measurement unit and the second measurement unit, and a control portion so controlling the transporter as to transport a first specimen container, stored in the rack, storing a first specimen to the first measurement unit and as to transport a second specimen container, stored in the rack along with the first specimen container, storing a second specimen to the second measurement unit.

Abstract: A laboratory automation system is described, comprising pairs of conveyor belts accommodating devices for conveying biological samples and actuated by a motorized traction device. Said motorized traction device includes a first and a second motor, each adapted to actuate both said pairs of belts a central control unit being adapted to control the simultaneous or alternating actuation of said motors.

Abstract: Methods reduce the likelihood of an MPERS device falsely reporting a high acceleration event as a fall impact. The device stores acceleration data acquired before the high acceleration and afterward. If a number of samples of magnitude values from accelerometer sensors in the device acquired during as interval before the high acceleration that approach 0G exceeds a predetermined number, the high acceleration is deemed from a non-fall. Acceleration sensors can also indicate an orientation change before/after the high acceleration, and a barometric pressure sensor can do the same, to further characterize an event as a non-fall. A method compares current event data to composite data sets that have been determined from a plurality of empirically derived data sets of fall and non-fall events. High correlations can indicate falls, or non-falls, respectively. Further statistical analysis of data acquired after an event reduces the likelihood of falsely indicating a fall.

Abstract: A MEMS device comprises a substrate, a proof mass spaced apart from a surface of the substrate, and an over-travel stop structure. The over-travel stop structure includes a lateral stop structure and a cap coupled to the lateral stop structure. The MEMS device is fabricated to include relatively small gap sections and relatively large gap regions separating the lateral stop structure from the proof mass. The larger gap regions are covered by the cap and the smaller gap sections are exposed from the gap. During fabrication, removal of particles from the smaller gap sections is facilitated by their exposure from the cap and removal of particles from the larger gap regions underlying the cap is facilitated by their larger size. The lateral stop structure may be cross-shaped to limit deflection of the proof mass along two in-plane axes. The cap limits deflection of the proof mass along an out-of-plane axis.

Abstract: A non-transitory computer readable medium stores a program causing a computer to execute a process. The process includes calculating a variance of acceleration in individual sections obtained by dividing, by a first predetermined time interval, acceleration information for multiple axis directions detected from a subject whose action is to be determined; extracting, as a first candidate region, a section with the largest variance of acceleration from among the sections; calculating a variance of acceleration in individual sections obtained by shifting the first candidate region forward and backward by a second predetermined time interval; selecting, as a second candidate region, a section with the largest variance of acceleration from among the first candidate region and the sections obtained by shifting the first candidate region forward and backward; calculating a feature value for the second candidate region; and determining the action of the subject based on the feature value.

Abstract: A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a. In an alternate embodiment, the lower section includes a leg extension 320 and a sliding contact land 360 which slides against an aperture in the housing. A spacer 342 provides space for decoupling components on the load board. The hinge may include a truncated cylinder 40b which is configured to permit remove of the upper pin without removal of the lower.

Abstract: An embodiment of a test apparatus for executing a test of a set of electronic devices having a plurality of electrically conductive terminals, the test apparatus including a plurality of electrically conductive test probes for exchanging electrical signals with the terminals, and coupling means for mechanically coupling the test probes with the electronic devices. In an embodiment, the coupling means includes insulating means for keeping each one of at least part of the test probes electrically insulated from at least one corresponding terminal during the execution of the test. Each test probe and the corresponding terminal form a capacitor for electro-magnetically coupling the test probe with the terminal.

Abstract: A positioner and a probe head of a probe card are provided. The positioner has a main opening, a first sub-opening, a second sub-opening, a third sub-opening, a fourth sub-opening, a first positioning portion, a second positioning portion, a first elastic portion and a second elastic portion. The first sub-opening, the second sub-opening, the third sub-opening, and the fourth sub-opening are sequentially arranged at the periphery of the main opening and are communicated to the main opening. A stiffness of the first positioning portion and a stiffness of the second positioning portion are higher than a stiffness of the first elastic portion and a stiffness of the second elastic portion.

Abstract: The present invention generally relates to nanoscale wires for use in sensors and other applications. In various embodiments, a probe comprising a nanotube (or other nanoscale wire) is provided that can be directly inserted into a cell to determine a property of the cell, e.g., an electrical property. In some cases, only the tip of the nanoscale wire is inserted into the cell; this tip may be very small relative to the cell, allowing for very precise study. In some aspects, the tip of the probe is held by a holding member positioned on a substrate, e.g., at an angle, which makes it easier for the probe to be inserted into the cell. The nanoscale wire may also be connected to electrodes and/or form part of a transistor, such that a property of the nanoscale wire, and thus of the cell, may be determined. Such probes may also be useful for studying other samples besides cells.

Abstract: A system including an automated test equipment (ATE) and an interface board. The interface board includes a temperature monitor that compares a sensor temperature to a predetermined temperature. The associated temperature sensor may be located near one or more selected components on the device under test or the interface board. If the sensor temperature exceeds the predetermined temperature the temperature monitor turns off one or more power supplies of the ATE.

Abstract: A probe device includes an electrode plate arranged above a mounting table for mounting thereon a semiconductor wafer and electrically connected to a tester, a connection conductor arranged at a side of the mounting table and electrically connected to a mounting table electrode formed on a mounting surface of the mounting table, and a cleaning mechanism including a polishing unit for polishing a contact portion of the connection conductor, a brush cleaning unit for performing a brush-cleaning of the contact portion, and a contact resistance measuring unit for measuring a contact resistance of the contact portion. The mounting table electrode is in contact with a backside electrode of a semiconductor device of the semiconductor wafer. When the connection conductor is connected to the electrode plate, a backside electrode formed on a backside of the semiconductor device and the tester are electrically connected to each other.

Abstract: Described is a current sensor comprising: a main resistive branch having a target device coupled to a load at a first node; a replica resistive branch having a replica device which is a replica of the target device, the replica device coupled to a current digital to analog converter (DAC) at a second node; and an analog to digital converter (ADC) coupled directly or indirectly to the first and second nodes, the ADC to generate an output coupled to the current DAC.

Abstract: A current sensor inspection system according to the present invention comprises a first wire, a second wire, a direct-current power supply device and an alternating-current power supply device. The first wire and the second wire are insulated from each other and pass through the plane surrounded by the core. The direct-current power supply device is capable of outputting a value of a direct current. The alternating-current power supply device is capable of outputting a value of an alternating current. Only the direct-current power supply device is connected to the first wire, and only the alternating-current power supply device is connected to the second wire.

Abstract: A current sensor includes an induction coil, a Hall sensor, and a calibration coil loaded by a generator continuously with a calibration current of defined frequency ?cal. A first evaluation circuit is loaded with the induction signal. A second evaluation circuit, whose input receives the Hall signal, includes a low-pass filter. A third evaluation circuit evaluates a part of the Hall signal that is attributed to the calibration current and uses it for defining a parameter of the second evaluation circuit. A fourth evaluation circuit generates an output signal that represents the current magnitude and is the sum of the output signal of the first evaluation circuit and the output signal of the second evaluation circuit minus the part of the output signal of the second evaluation circuit which is attributed to the calibration current.

Abstract: According to an embodiment, a status estimation apparatus includes detector, calculator, estimator and specifying unit. Detector detects a status change of any of electrical devices based on measurement data of a current flowing in a distribution line supplies power to the devices. Calculator calculates a current waveform change and a power change associated with the status change based on the measurement data. Estimator estimates a candidate originating from the status change based on the current waveform change. Specifying unit specifies a device caused the status change and a type of the status change based on the power change and an estimation result of the candidate.

Abstract: Current measurement apparatus comprises a measurement arrangement and a signal source. The measurement arrangement is configured to measure a current signal drawn by a load. The signal source is operative to apply a reference input signal to the measurement arrangement whereby an output signal from the measurement arrangement comprises a load output signal corresponding to the load drawn current signal and a reference output signal corresponding to the reference input signal.

Abstract: An optical receiver includes a light reception element for receiving an optical signal, a bias voltage supply/monitoring circuit for supplying a bias voltage to the light reception element and generating a monitoring voltage indicating magnitude of an output current of the light reception element, and a constant current source. The bias voltage supply/monitoring circuit is supplied with a remaining current obtained by subtracting the output current of the light reception element from an output current of the constant current source. The bias voltage supply/monitoring circuit converts the remaining current to the monitoring voltage.

Abstract: According to one aspect, embodiments of the invention provide a system monitor for a load center comprising a current sensor configured to be coupled to a circuit branch within the load center and to produce a measurement signal having a level related to a current level of the circuit branch, a sensor circuit coupled to the current sensor and removably coupled to a terminal, the sensor circuit configured to provide the measurement signal to the terminal, and a controller coupled to the terminal and configured to monitor signals at the terminal, wherein the controller is further configured to detect disconnection of the current sensor from the terminal based on a signal level at the terminal.

Abstract: Disclosed is a power inductor. The inductor comprises a magnetic core and multiple lines. The multiple lines have a first terminal and a second terminal, are parallel with each other, and wind the magnetic core to form a winding. The lines at the first terminal depart from the magnetic core at the same position, and the lines at the second terminal depart from the magnetic core at the same position. At least one line at the first terminal forms a first interface end, the other lines at the first terminal, which are not utilized to form the first interface end, form a second interface end, and the lines at the second terminal together form a third interface end. By measuring the current flowing through the first interface end using a current sensor with a small measuring range, the current flowing through the power inductor can be estimated based on ratio.

Abstract: A circuit has a supply line, a reference line and circuitry coupled between the supply line and the reference line. The circuitry outputs a regulated voltage and a measurement voltage. An analog-to-digital converter (ADC) generates a digital signal indicative of variations of potential differences between the supply line and the reference line based on the regulated voltage and the measurement voltage. The generated digital signal may be used to control the circuit.

Abstract: Provided are an analysis apparatus and an analysis method which are capable of recognizing a local state change of an internal structure of a secondary battery. The analysis apparatus includes: an observation cell that houses a secondary battery; a charging and discharging controller that controls charging and discharging of the secondary battery; an image pickup device that captures color images of the secondary battery at a predetermined time interval; and a charging and discharging data detection unit that acquires charging and discharging data on the secondary battery during charging and discharging. Color image signals output from the image pickup device and charging and discharging data signals output from the charging and discharging data detection unit are supplied to a signal processing device. The signal processing device outputs a unit that temporally links time-series color image signals and time-series charging and discharging data signals, and designated analysis data.

Abstract: The conventional demand target display device based on time information differing from the information used by electric power companies and electric power consumers causes a divergence regarding their demand values. Therefore, a demand target display device with a dual-purpose scale, which acquires AC signals based on the AC waveform of AC power from a power supply line, generates time information based on the acquired AC signals, transmits the generated time information via radio waves within a housing, receives the transmitted time information via radio waves within the housing, indicates the time on the dual-purpose scale based on the received information, acquires electrical energy consumption within a segment for a given target demand value including the current time, and indicates the relationship between the acquired electrical energy consumption within a segment recorded and a target demand value set for such segment, is proposed.

Abstract: A capacitive touch keyboard includes a shielding layer, a intermediate layer, and a one-dimensional sensor layer where the soft intermediate layer is interposed between the other two to form a capacitor structure. The shielding layer includes a ground plane, and plural first key areas at its outer surface. The one-dimensional sensor layer includes plural sensing cells and plural second key areas where the first key areas correspond to the second key areas, and respective cells are electrically connected to a sensing circuit. Therefore, features of more compact size, simplified structure design, and tactile feel are provided in a capacitive keyboard.

Abstract: A method of assessing a pulse-width-modulated signal in which the pulse-width-modulated signal to be assessed is applied to a first input of a microcontroller and a signal, that depends on the pulse-width-modulated signal being assessed, is applied to a second input of the microcontroller for assessment. The pulse-width-modulated signal being assessed is applied to a voltage divider to produce the signal that depends on the same. For the pulse-width-modulated signal to be assessed and for the signal that depends on the same, in each case, the microcontroller determines a time interval between signal edges of the respective signal, and the signal is assessed on the basis of a difference between the time interval between the signal edges in the pulse-width-modulated signal to be assessed and the time interval between the signal edges in the signal that depends on the same.

Abstract: A method of detecting thermal hotspots in a power distribution system is provided. The power distribution system includes a conductive hub including a connection point for coupling to an electrical distribution component. The method includes measuring a first temperature of the conductive hub at the connection point, estimating a second temperature of the conductive hub at the connection point, and determining when a difference between the first temperature and the second temperature exceeds a first predetermined threshold. The estimation based at least partially on an amount of electric current flowing through the conductive hub.

Abstract: An electronic open-circuit current measuring circuit is configured to measure a current delivered between a current source and a load during an open circuit condition. The electronic open-circuit current measuring circuit includes an electronic voltage drop component electrically connected between a first buffer output and an electrical voltage difference calculating circuit. The voltage drop component is configured to reduce a first voltage level of the first buffered output voltage below a second voltage level of the second buffered output voltage in response to an open circuit condition.

Abstract: Methods and apparatus are provided for detecting faults in excitation wiring. A first sum of a first high voltage and a first low voltage related to a first sensor is determined, where the first sensor is further related to an excitation voltage. A second sum of a second high voltage and a second low voltage related to a second sensor is determined, where the second sensor is further related to the excitation voltage. The excitation voltage is provided to both the first and second sensors using excitation wiring. A determination is made whether each of the first sum and the second sum changes beyond a threshold amount during a first time interval. After determining that each of the first sum and the second sum has changed beyond the threshold amount during the first time interval, an indication of a fault in the excitation wiring is provided.

Abstract: A DC level detection circuit between high speed signal line connecting ports and a system using the same in optical communications is disclosed. Corresponding ports of a high speed signal line each have an additional resistor, where one additional resistor has a resistance significantly greater than that of the other resistor. The smaller resistor is grounded. The larger resistor is connected to a DC voltage source, a low pass filter, and a signal detection port. Thus, when both ports of the high speed signal line are connected, a status of the electrical level detected at the signal detection port changes. The circuit detects the connection state of the high speed signal line without negative effects on signal transmission and is applicable to various circuits, especially plug-in modules and corresponding slots. Thus, the circuit further enables signal port multifunctionality, increases module installation accuracy, and provides higher compatibility for plug-in modules.

Abstract: A method of detecting a digital leakage signal originating from a leak in a coaxial cable portion of an HFC network. The network has a transmission end from which a digital signal is transmitted to the coaxial cable portion. The digital signal is emitted into free space from the leak to produce the leakage signal. The method comprises: (a) producing a first set of samples representing the digital signal; (b) transmitting the first set of samples to a leakage detector; (c) moving the leakage detector to a detection point in the vicinity of the network; (d) receiving the leakage signal from the leak; (e) sampling the leakage signal to produce a second set of samples; and (f) performing a cross-correlation of the first set of samples with the second set of samples, to produce a cross-correlation function having a peak, whereby the leakage signal is detected from the peak.

Abstract: An apparatus is for a power circuit providing an alternating current to a load. The apparatus includes a high frequency current sensor structured to cooperate with the power circuit to provide a high frequency current signal. A voltage zero crossing detector is structured to cooperate with the power circuit to provide a voltage zero crossing signal. A high pass filter is structured to provide a filtered current signal from the high frequency current signal. A threshold comparator is structured to provide an output when the filtered current signal exceeds a predetermined value. A processor is structured to receive the voltage zero crossing signal and the output of the threshold comparator and output a trip signal in response to undesired series arcing by detecting an unsymmetrical high frequency signal for a predetermined number of cycles.

Abstract: A defect coordinates measurement method includes a step of detecting detected coordinates of a fiducial mark and a defect of a mask blank placed on support pins, a step of detecting detected coordinates of the alignment mark of a reference mask placed on the support pins, a step of extracting a reference mark near the detected coordinates of the defect among the plurality of reference marks based on the detected coordinates of the defect of the mask blank and the alignment mark of the reference mask, a step of detecting detected coordinates of the extracted reference mark, and a step of calculating coordinates of the defect based on the detected coordinates of the reference mark and the detected coordinates of the defect.

Abstract: A test system with rotational test arms for testing semiconductor components includes a transport device, a first test socket, a second test socket, a first test arm, and a second test arm. The first test socket and the second test socket are electrically connected to different test signals respectively and correspond to the first test arm and the second test arm. The first test arm and the second test arm test arms operate rotationally to carry and place the semiconductor components to the transport device, the first test socket and the second test socket, so the test time is improved.

Abstract: A method and apparatus for the inspection of light emitting semiconductor devices. The semiconductor device is illuminated with a light source, wherein at least an area of the light emitting semiconductor is illuminated with a waveband of light. The waveband of light ?A+?B can generate electron-hole pairs in the light emitting semiconductor to be inspected. Through an objective lens at least a part of the light ?C emitted by the light emitting semiconductor is detected. The emitted light is captured with a sensor of a camera that is sensitive to wavelengths of the emitted light, wherein the wavelength of the emitted light is above the width of the waveband. The data of the emitted light, captured with the sensor, are transmitted to a computer system for calculating inspection results of the light emitting semiconductor.

Abstract: A test system and method for identifying open and shorted connections on a printed circuit board (PCB). An integrated circuit (IC) unit on the PCB is configured to generate a test signal on an output pin connected to a test pin on a second device, connector, or socket on the PCB. For a connection, the test signal is capacitively coupled to a detector plate proximal the second device. Based on the signal coupled to the detector, time domain analysis is performed on the coupled signal to determine if the test pin has a good connection to the PCB or if the pin is open or shorted. Analysis may include cross-correlating the coupled signal with a learned signal obtained from a known “good” PCB. The test pin may pass the test if the cross-correlation is within a specified threshold window. If the test fails, additional tests may be performed to troubleshoot the cause of the testing failure.

Abstract: Techniques for estimating state-dependent capacitance of a circuit are described herein. In one embodiment, a method for determining a circuit state for a circuit comprises determining a capacitance of the circuit for each one of a plurality of circuit states, and selecting one of the circuit states based on the determined capacitances.

Abstract: An integrated circuit device comprises a first integrated circuit and a second integrated circuit wherein the first and second integrated circuits are comprised on a single semiconductor die. The second integrated circuit is a safety circuit arranged to monitor the operation of the first integrated circuit, report any detected faults and drive the device into a failsafe state if a fault is detected. The first integrated circuit may be a power management module for a safety critical system. An isolation barrier in the form of a trench is formed between the two integrated circuits so that the safety circuit is protected from any high voltage or thermal stresses arising in the first integrated circuit. The device has particular application to automotive safety-critical systems such as electric power steering systems.

Abstract: Disclosed is a method for mounting a wafer on a probe card. In the wafer mounting method, an extendable tubular member is placed to surround the probe card, the wafer is placed on a chuck top, the chuck top is supported by a movable stage, and the stage is moved toward the probe card together with the wafer and the chuck top to bring the chuck top into contact with the tubular member. After the chuck top is in contact with the tubular member, the stage is moved toward the probe card together with the wafer and the chuck top to bring the wafer into contact with the probe card and maintain a positional relationship of the stage, the wafer, and the chuck top. After the wafer is in contact with the probe card, a space surrounded by the chuck top, the tubular member, and the probe card is evacuated.