Abstract: A metering apparatus enclosed within a first housing, the metering apparatus comprising a plurality of metering points, wherein the metering apparatus, via the plurality of metering points, measures electricity usage for each of a plurality of corresponding electricity consumer lines; the metering apparatus in communication with one or more sensors that sense environmental conditions in a second housing enclosing a distribution transformer that steps down voltage from a distribution level to a consumer level, wherein the sensors are not operable to sense environmental conditions in the first housing, and wherein the meter apparatus is operable to connect and disconnect service on one or more of the plurality of electricity consumer lines in response to information received from the one or more sensors, without affecting voltage supplied to the distribution transformer.

Abstract: A method and apparatus for analysing a signal, in which a spectrum of the signal is provided, which spectrum is the result of a multiplication of the signal by a predefined window function and a subsequent Fourier transform, the highest spectral line and the adjacent second-highest spectral line are determined in the spectrum in the region of at least one local maximum, the amplitude of the highest spectral line and of the second-highest spectral line is determined, at least one value dependent on the amplitude of the highest spectral line and on the amplitude of the second-highest spectral line is determined, a frequency correction value is determined for the frequency of the highest spectral line from the determined value using a frequency correction characteristic curve which was created for the predefined window function, and the frequency of the highest spectral line is corrected by the frequency correction value.

Abstract: A capacitance sensing circuit includes a buffer circuit, a modulation circuit, and an integral circuit. The buffer circuit is coupled to an external capacitor through a touch-sensing pad, and includes a pull-up device and a pull-down device. The modulation circuit includes a first current mirror device having a current drivability corresponding to one Nth (where “N” denotes a positive real number) a current drivability of the pull-up device and a second current mirror device having a current drivability corresponding to one Nth a current drivability of the pull-down device. The integral circuit integrates voltage values at an output node of the modulation circuit to output the integrated voltage values. The pull-up device and the first current mirror device constitute a current mirror circuit, and the pull-down device and the second current mirror device constitute another current mirror circuit.

Abstract: A subset of mobile devices is selected from a set of mobile devices located in a local area. From a mobile device in the subset, a magnetic measurement value obtained by performing a magnetic measurement is received. The magnetic measurement value comprises a change in a magnetic property of an immediate surrounding ambient environment of the mobile device. When the magnetic measurement corresponds to a deviation in a network condition in a portion of a network, the portion being located in the local area, a conclusion is output that the deviation is caused by an electromagnetic disturbance (EMD), where an effect of the EMD causes the magnetic measurement value. A notification including an indication of the EMD and an identification of the local area is generated.

Abstract: A measurement system including an anechoic chamber, a turntable, N measurement antennas, in which N is a natural number and N in which a spherical coordinate system is established by taking a center of a measured piece as an origin and a coordinates of the i (i=1, 2, 3, . . . , N) measurement antenna is Ai(?i, ?i, ?i), (i=1, 2, 3, . . . , N), in which ?i is a positive integral multiple of 15°, and at least one measurement antenna is arranged at a position where the angle 0 is 15°, 30°, 30°, 45°, 60°, 75°, 90°, 105°, 120°, 135°, 150° or 165° correspondingly; and 0??i?360°, and the N measurement antennas are not located in the same plane. The present disclosure can create a measurement environment with small coupling interference and low reflection between the measurement antennas in a relatively small anechoic chamber, improving the measurement accuracy.

Abstract: Disclosed are a system for testing a wireless terminal and a method for controlling the same. The system includes: a reflecting surface, configured to totally reflect one or more first wireless signals emitted by the wireless terminal; a test antenna, configured to receive the one or more first wireless signals reflected by the reflecting surface; and an absorbing screen, configured to absorb one or more second wireless signals emitted by the wireless terminal. The device under test, the test antenna and the reflecting surface correspond to a same ellipsoid, the device under test and the test antenna are arranged at two foci of the ellipsoid respectively, the reflecting surface is arranged on the ellipsoidal surface and the absorbing screen is arranged on a straight line between the device under test and the test antenna.

Abstract: An electrostatic detecting system and an electrostatic detecting method for detecting the static electricity generated at an active surface of a substrate are provided. The electrostatic detecting system includes a sensing apparatus and a signal processing apparatus. The sensing apparatus is disposed at least adjacent to a back surface opposite to the active surface of the substrate, for measuring the static electricity generated at the active surface and generating an initial electric signal. The signal processing apparatus is electrically connected to the sensing apparatus, for receiving the initial electric signal and correcting the initial electric signal based on a voltage compensation value to obtain a final electric signal.

Abstract: In order to provide a voltage abnormality detection circuit and a semiconductor device which are capable of detecting a voltage abnormality in an internal power supply voltage of the semiconductor device with a simple circuit configuration, the voltage abnormality detection circuit includes: a reference voltage circuit configured to output a first reference voltage, which is higher than the internal power supply voltage, and a second reference voltage, which is lower than the internal power supply voltage; a first voltage detection circuit configured to detect that the internal power supply voltage has exceeded a desired voltage value, with the use of the first reference voltage; and a second voltage detection circuit configured to detect that the internal power supply voltage has dropped lower than the desired voltage value, with the use of the second reference voltage.

Abstract: In described examples, a time-domain analyzer is arranged to generate an indication of a number of high-frequency events of an electrical monitor signal that includes a fundamental periodic frequency. The high-frequency events include frequencies higher than the fundamental periodic frequency. A frequency-domain analyzer is arranged to generate frequency band information in response to frequencies of the electrical monitor signal that are higher than the fundamental periodic frequency. A fault detector is arranged to monitor the indication of the number of high-frequency events and the generated frequency band information, and to generate a fault flag in response to the monitored indication of the number of high-frequency events and the generated frequency band information.

Abstract: A bypass diode with a disconnection fault is identified. A test device includes: a signal introduction circuit that applies a disconnection position identification signal to between a positive electrode and a negative electrode of a solar battery string; and a fault calculating part that identifies the bypass diode with a disconnection fault on the basis of an AC component of a voltage between a frame ground and the positive electrode or an AC component of a voltage between the frame ground and the negative electrode when the disconnection position identification signal is applied.

Abstract: A semiconductor element test apparatus includes a first switch having a switching element, a coil, a second switch, a semiconductor element, a first rectifying element, and a second rectifying element. The first switch, the coil, and the second switch are connected in series to a power source. The semiconductor element is disposed to configure a loop path along with the coil and the second switch when the switching element is switched off. The semiconductor element has a diode element. A cathode electrode of the diode element is connected to a positive electrode of the power source. The second rectifying element is connected to the first rectifying element in series, and has a rectification direction opposite to a rectification direction of the first rectifying element. The first rectifying element and the second rectifying element configure, along with the coil, another loop path which is different from the loop path.

Abstract: Various embodiments of a gate oxide breakdown detection technique detect gate oxide degradation due to stress on a per part basis without destroying functional circuits for an intended application. Stress on the gate oxide may be applied while nominal drain currents flow through a device, thereby stressing the device under conditions similar to actual operating conditions. The technique is relatively fast and does not require analog amplifiers or tuning of substantial amounts of other additional circuitry as compared to conventional gate oxide breakdown detection techniques.

Abstract: Systems and methods for detecting a diode fault are provided. In one example implementation, a method for determining a diode fault condition in a rotating rectifier associated with an electrical machine in an aircraft includes obtaining, by one or more processors, a signal associated with a diode of a rotating rectifier; determining, by the one or more processors, a frequency of interest; isolating, by the one or more processors, the frequency of interest from the signal to generate an isolated signal; determining, by the one or more processors, an amplitude of the isolated frequency of interest; and determining, by the one or more processors, a diode fault condition based on the determined amplitude.

Abstract: A test tool for a low voltage devices is described. The test tool comprises a voltage sensor, a current sensor, a diode sensor, a testing module, and an indicator. The voltage sensor determines a voltage between a first and second electrical wire from an alternating current (AC) transformer. The current sensor determines a current between the first and second electrical wires. The diode sensor determines a presence of a diode connected to the first and second electrical wires based on the current and the voltage. The testing module identifies one or more installation diagnostics related to a device to be coupled with the AC transformer. The indicator generates a visual or audible indicator corresponding to the one or more installation diagnostics.

Abstract: A method for detecting a short circuit (10) of a resolver exciter line (11, 12) comprising the steps of: •measuring (31) the excitation voltage (U(ti) for the resolver (16) at a number of points in time during each excitation period; •determining (32) the amplitude of the excitation voltage; •starting a diagnostic mode (33) having the following steps (34 bis 37) if the amplitude of the excitation voltage does not reach a first threshold value; •retrieving (34) the time-dependent voltage curves UH(ti) of the first and the second exciter line (H; 11) with respect to ground at the number of points in time; •calculating (35) the amplitudes and the offset values of the time-dependent voltage curves; •identifying (36) the exciter line that has a short circuit by determining that the calculated amplitudes do not exceed a second threshold value; •identifying (37) the potential to which the short-circuited line (H or L) can be connected by comparing the offset values to third threshold values.

Abstract: A method for detecting an open resolver exciter line (10) comprises the following steps:—measuring the signal voltages Us and Uc of the sine coil (17) and the cosine coil (18) of the resolver (15);—comparing the amplitude Us2+Uc2 of the resolver signal to a first threshold value CS1;—starting a diagnostic mode having the following steps if the amplitude Us2+Uc2 does not reach the first threshold value CS1;—applying a constant voltage to the exciter line (11, 12) via a series resistance (25) RLE that is large compared to the ohmic resistance of the exciter coil (16) RE;—measuring the voltage difference UE(t1) at the terminals (5, 6) of the exciter line at a number of points in time ti during at least one excitation period; and—determining the DC voltage component UE,Offs of the voltage difference UE;—determining that there is an open exciter line (10) if, during the excitation period, the DC voltage component UE,Offs is larger than a second threshold value CS2.

Abstract: A voltage monitoring circuit and a semiconductor device that can reduce time required for self-diagnosis are provided. A selection circuit selects one of a determination threshold voltage for normal use, a determination threshold voltage for self-diagnosis, and a determination threshold voltage for boost having a potential difference larger than that of the determination threshold voltage for normal use. A comparison circuit detects a presence or absence of a specification violation of the voltage to be monitored by comparing a selected voltage selected by the selection circuit and the voltage to be monitored.

Abstract: A method and apparatus for platform component interconnect testing is disclosed. In one embodiment, an integrated circuit comprises: a plurality of interface circuitries, wherein each interface circuitry comprises a driver with adjustable pullup and pulldown resistances and having a driver output to output a driver voltage to a pad during test mode, and a comparator having a first input coupled to the driver output and a second input coupled to a voltage reference, the comparator being operable to generate a comparator output in response to comparing the driver voltage with the voltage reference; and analysis circuitry coupled to receive the comparator output, the analysis circuitry operable, during the test mode, to detect existence of a fault associated with a signal path coupled to the pad for each interface circuitry.

Abstract: A contact device (200, 200?) and a method for testing a singulated electronic component (101). The contact device (200, 200?) comprises a plunger unit (202) comprising a chamber lid (220) and a nest (230) which is adapted to carry the singulated electronic component (101), and a socket unit (201) comprising a socket (132) and a chamber (210) having an open front side and surrounding the socket (132). The chamber (210) is adapted in that closing of the chamber (210) at its open front side (219) by the chamber lid (220) comprises automatically contacting the singulated electronic component (101) to the socket (132).

Abstract: An integrated circuit comprising: a plurality of on-chip-instrument-modules; a test-controller-module configured to communicate data with the plurality of on-chip-instrument-modules; a functional-module configured to communicate data with the plurality of on-chip-instrument-modules; and an on-chip-instrument-controller. The on-chip-instrument controller is configured to: for each of the plurality of on-chip-instrument-modules, store an access-indicator; and based on a value of the access-indicator for each on-chip-instrument-module, enable the on-chip-instrument-module to communicate with either: the test-controller-module; or the functional-module.

Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.

Abstract: This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations.

Abstract: A method, apparatus and system are provided for the tuning of embedded subsystems of a device under test (DUT) that have analog characteristics. In response to a tester invoking one or more test procedures via a command channel between the tester and a target embedded subsystem of the DUT, test firmware of the invoked tests is loaded into the target embedded subsystem. The target embedded subsystem executes the tests under control of the tester in accordance with test parameters received from the tester over the command channel and in accordance with test commands received from the tester over a test signaling channel. The target embedded subsystem returns results of the one or more tests to the tester via the command channel. The results can be used to trim analog characteristics of the target embedded subsystem and can be stored in memory. The test firmware can then be deleted to free up memory space.

Abstract: According to one general aspect, an apparatus may include an interconnect bus, an interconnect-to-debug bus interface, and a debug bus. The interconnect bus may be configured to connect and manage combinatorial logical blocks during normal operation of a processor and operate synchronous to a core clock. The interconnect-to-debug bus interface may be configured to translate communications between the interconnect bus and the debug bus. The debug bus may include a plurality of debug wrapper circuits arranged in a daisy chain for unidirectional communication, and configured to operate synchronous to the core clock. Each of the plurality of debug wrapper circuits may be configured to: identify if the respective debug wrapper circuit is activated by the debug bus, receive a non-invasive input from a respective combinatorial logic block, and place the non-invasive input from the respective combinatorial logic block on the debug bus.

Abstract: A device, including: a sensor circuit that senses the state of contact impedance of a mechanical electrical switch; and a switch-off circuit that represents a sensed high impedance contact of the switch as a low or constant impedance, where the sensor circuit detects an open or closed condition of the switch by sensing a voltage across the switch passing a threshold value.

Abstract: An electronic trip unit for a circuit interrupter includes a line side voltage sensing module for measuring first voltages on a line side of separable contacts, a load side voltage sensing module for measuring second voltages on a load side of the separable contacts, a current sensor, and a main controller. The main controller is further structured and configured to: (i) for each of a plurality of arc interruption events in the circuit interrupter, determine a mass loss due to contact erosion during the arc interruption event based on one or more of the first voltages, the second voltages and the current measured by the current sensor, (ii) determine a total mass loss based on each determined mass loss due to contact erosion, and (iii) monitor a remaining life of the separable contacts based on the determined total mass loss due to contact erosion.

Abstract: A system and method for detecting a phase-to-ground fault in an AC electrical machine operates to receive measurements of three-phase voltages and currents provided to the AC electrical machine, compute at least one of a zero sequence component and a negative sequence component of voltage and current from the three-phase voltages and currents, and calculate a fault severity index (F SI) based on the zero or negative sequence component of voltage and current, so as to identify a phase-to-ground fault in the AC electrical machine. Calculating the FSI further includes determining a total value of the zero or negative sequence current, determining a noise-contributed value of the zero or negative sequence current included in the total value, determining a compensated value of the zero or negative sequence current based on the total value and the noise-contributed value, and calculating the FSI based on the compensated value.

Abstract: The present invention provides a battery pack state parallel-monitoring device having a battery pack configured with a plurality of battery cells, a cell monitoring unit for measuring a state of the plurality of battery cells, a BMIC for generating a diagnostic signal indicating a state of the battery pack through the cell monitoring unit, a main MCU for receiving the diagnostic signal, and an auxiliary MCU for receiving the diagnostic signal and transmitting/receiving data of the main MCU, the battery pack state parallel-monitoring device including data lines connecting the BMIC and the main MCU to each other, parallel lines connected in parallel to the data lines, and a communication monitoring unit connected to the parallel lines to monitor data transmitted/received between the BMIC and the main MCU and transfer the monitored data to the auxiliary MCU.

Abstract: A battery management system is provided, which may include a power supply module, a measurement module, a switch module and a processing module. The power supply module may be electrically coupled to a load or a charging power source via the switch module. The measurement module may measure a plurality of operation signals from the power supply module. The processing module may determine the operation status of the power supply module by cross comparison between the operation signals, and activate a safety protection item according to the operations signals and the operation status; the processing module may determine to activate a global protection process to turn off the switch module or activate a local protection process to turn off the switch module after a buffer time according to the danger level of the safety protection item.

Abstract: A secondary battery monitoring device is equipped with a resistance circuit and a detection circuit detecting an abnormality of a secondary battery, a current generation circuit generating a failure detection circuit for setting an output terminal of the resistance circuit to a failure diagnosis voltage, and a switch which permits the failure detection circuit to flow to the output terminal of the resistance circuit by switching. Further, a method for diagnosing failure of the secondary battery monitoring device is provided.

Abstract: The present application relates to an online detection method for internal short-circuit of power battery, which comprises the following steps: in the process of charging and discharging, when the state of charge of a power battery is greater than a preset first threshold, monitoring and recording the voltage for each cell in the power battery; in accordance with the recorded historical voltages of each cell, determining whether there is a cell with voltage less than a second threshold in the process of charging, and less than a third threshold in the process of discharging, if so, then marking the corresponding cell as an internal short-circuited cell. The present application could accurately determine whether a malfunction of internal circuit of power battery occurs during the operation of a vehicle, so as to guarantee the safety of the vehicle and the people on-board.

Abstract: According to one embodiment, a storage battery device in which a plurality of battery boards are connected in parallel, each of the battery boards including a plurality of cell modules connected in series, and each of the cell modules including a battery cell, includes a performance value acquisition unit and an information generator. The performance value acquisition unit acquires a performance value of the cell module. The information generator generates rearrangement information. The rearrangement information is information for performing rearrangement of the cell module between the plurality of battery boards based on the acquired performance value of the cell module to reduce a variation in the performance value of the cell module after being rearranged in one battery board than before being rearranged.

Abstract: Disclosed herein is an apparatus for updating charging/discharging efficiency factors of an energy storage system. The apparatus includes: a correlation coefficient calculate unit configured to calculate correlation coefficients between n charging/discharging reference values input to the energy storage system during a predetermined update cycle and (n+k) charging/discharging power values measured in the energy storage system after the predetermined update cycle has started, where n and k are natural numbers; a selection unit configured to select n charging/discharging power values corresponding to the n charging/discharging reference values among the (n+k) charging/discharging power values based on correlation coefficients; and an update unit configured to update the charging/discharging efficiency factors set for each power range with n charging/discharging efficiency factors calculated by using the n charging/discharging reference values and the selected n charging/discharging power values.

Abstract: Pitch system (1) comprising at least one pitch motor drive (3) connected an electrical network (5). Each pitch motor drive (3) is connected to a power bank, and the pitch system comprises a test module adapted to be activated in a test position. The test module comprises a brake module (8) each connected to a pitch motor drive (3), and each brake module (8) is adapted to load a pitch motor drive (3) with a certain load Rb. Hereby a voltage drop takes place over the power bank (6).

Abstract: A power storage system includes a power storage device including cells connected in parallel with each other; a voltage sensor; a current sensor; a data acquisition unit configured to acquire voltage-current data sets; a linear approximation processing unit configured to perform first-order linear approximation on the acquired voltage-current data sets using a function form, Y=aX+b where Y denotes a voltage between terminals of the power storage device at a time of charging/discharging and X denotes a charge/discharge current, and to obtain constants a, b and a ratio b/a between the constants; and a determination unit configured to determine that variation in SOC has not occurred among the cells when the ratio b/a is within a prescribed constant ratio range, and to determine that the variation in SOC has occurred among the cells when the ratio b/a is not within the prescribed constant ratio range.

Abstract: A vehicle and method are provided in which deterioration of a battery is controlled. The method includes detecting deterioration severity of the battery and determining whether the deterioration severity is equal to or greater than a reference value. A cause of battery deterioration is determined when the deterioration severity is equal to or greater than the reference value. The method further includes determining whether the cause of the battery deterioration is vehicle driving and reducing an SOC management range of the battery when the cause of deterioration of the battery is charging/discharging due to vehicle driving. The deterioration cause of the battery is determined as a state of the vehicle left unattended and the central SOC of the battery is adjusted when the cause of deterioration of the battery is not charging/discharging due to vehicle driving.

Abstract: Systems and methods are provided for detecting instability in power hardware-in-the-loop simulations for protection of the equipment being tested. The technology includes computing the magnitude of the time-derivative of reference quantities supplied to a power amplifier and applying a moving average filter. The result from the filter is compared to a threshold for detection of an instability resulting in oscillations of the reference quantities. Once oscillations are detected mitigating steps are taken to protect the device under test.

Abstract: A central idea of techniques herein is that by means of modulation or variation of the supply signal of a Hall sensor, the useful signal portion in the resulting sensor output signal can be separated from the offset portion during operation of the Hall sensor, with no previous calibration or previous serial tests. That course of the sensor output signal resulting from the modulation or variation of the supply signal can then be evaluated or decomposed relative to the components which can be attributed to the offset portion and the useful signal portion. Thus, the offset portion in the sensor output signal can be determined with no (or a negligibly small) external magnetic field applied or with an external magnetic field applied, in case the external magnetic field is constant within a tolerance range while determining the offset portion.

Abstract: A calibration method for a Hall sensor having a Hall sensitive layer with four electrical contacts and a first field plate, wherein, at a first temperature and at a first magnetic flux density, a resistance value of the Hall sensitive layer is determined for each of at least three different field plate voltages present at the field plate, a calibration curve is produced from the at least three resistance values, a deviation value of the calibration curve is determined from a reference calibration curve, and the field plate voltage that is present at the first field plate or an operating voltage that is present at the sensitive layer is readjusted by a correction value corresponding to the deviation value.

Abstract: A triaxial magnetic sensor that can detect with high precision magnetic fields in three axial directions comprises a substrate having a first surface and a second surface opposite the first surface, and a magnetic sensor element group provided on the first surface. The magnetic sensor element group includes a first magnetic sensor element for magnetic detection in the x-axis direction, a second magnetic sensor element for magnetic detection in the y-axis direction and a third magnetic sensor element for magnetic detection in the z-axis direction. The first through third magnetic sensor elements respectively contain first through third magneto-resistive effect elements composed of laminated bodies including at least a magnetization fixed layer and a free layer, and the magnetization direction of each of the magnetization fixed layers of the first through third magneto-resistive elements is fixed in a direction inclined at a prescribed angle with respect to the first surface.

Abstract: A magnetic field detection device includes a first soft magnetic body, a second soft magnetic body, and a magnetism detection element. The first soft magnetic body extends to have a first length in a first direction, and has a first width, smaller than the first length, in a second direction. The second direction is substantially orthogonal to the first direction. The second soft magnetic body is disposed to be spaced apart from and face the first soft magnetic body in the first direction, extends to have a second length in the first direction, and has a second width, smaller than the second length, in the second direction. The magnetism detection element is disposed, in the first direction, between the first and second soft magnetic bodies, and extends to have a third length in the first direction and a third width, larger than the third length, in the second direction.

Abstract: In some examples, a device includes a first conductive region and a second conductive region that is galvanically isolated from the first conductive region. The device further includes one or more conductors, wherein each conductor of the one or more conductors is electrically connected to circuitry in the first conductive region. The device also includes a giant magnetoresistive (GMR) sensor electrically connected to circuitry in the second conductive region and magnetically coupled to the one or more conductors, wherein the GMR sensor is positioned at least partially lateral relative to the one or more conductors.

Abstract: The invention relates to a system and a method for tracking position and orientation of an object in a magnetic resonance (MR) apparatus.

Abstract: A magnetic resonance imaging system (10) comprising at least one magnetic resonance radio frequency antenna device (30) and at least one metal detector unit (38) for detecting metal within the subject of interest (20) including at least one metal detector coil (40), wherein the at least one magnetic resonance radio frequency antenna device (30) and the at least one metal detector coil (40) mechanically or electrically or spatially form an integral unit (34); and a method of operating, with regard to detecting metal-comprising implants (36) and selecting magnetic resonance pulse sequences, such magnetic resonance imaging system (10).

Abstract: Various approaches of amplifying an NMR signal in response to a transmitted NMR pulse include estimating the characteristic time associated with the NMR signal; transmitting the NMR pulse to the sample and receiving the NMR signal therefrom; and applying a time-dependent amplifier gain to the received NMR signal based at least in part on the estimated characteristic time.

Abstract: In a method and system for shutting down a superconducting magnet of a magnetic resonance apparatus using a monitoring processor and an energy store, the monitoring processor determines stored energy stored in the energy store at a first point-in-time, and determines a ramp energy required for shutting down, and determines a second point-in-time based on the stored energy and the ramp energy. At the second point-in-time, shutting down of the superconducting magnet is begun.

Abstract: Accelerated 3D multispectral imaging (MSI) on a magnetic resonance imaging (MRI) system uses phase-encoding in two dimensions and frequency-encoding in the third.

Abstract: Embodiments of the invention provide a magnetic resonance (MR) compatible transducer for magnetic resonance elastography applications having a cantilevered drive element (54) a free end of which is arranged in use to move reciprocally, and a flexible non-conductive connection rod (62) slidably disposed within a flexible non-conductive sleeve (60). The connection rod is affixed at a proximal end to the cantilevered drive element via a proximal flexible connection piece (64) that in use accommodates the slight rotational movement of the cantilevered drive element as it reciprocates about its secured end, whilst translating the rotational reciprocation of the cantilevered drive element into a pure translational reciprocation of the connection rod within the sleeve. The distal end of the connection rod is affixed against a protrusion connected to another cantilevered driven element (56), upon which is mounted a piston element (58) that in use contacts the subject.

Abstract: An EPR resonator for a cylindrical TE01n microwave mode, where n=1, 2, 3, or 4, has: a cylindrical body (10) which has an RF absorption of less than 5% at RFs below 1 kHz, a first plunger (11) delimiting the resonating volume within the body in an axial direction at a first end and a second plunger (12) delimiting the resonating volume within the body at a second end, the second plunger having an opening (13) for inserting an EPR sample. The first and second plunger each has a spiral winding of an electrically conductive filament wherein neither the ends nor neighboring turns of the spiral windings have electrically conductive connections prone to forming electrically closed loops. Using spiral winding plungers for cylindrical TE01n microwave modes provides equivalent functionality compared to conventional plungers, but without creating Eddy currents at frequencies lower than the frequency of the TE01n microwave mode.

Abstract: In a method and apparatus for generating corrected magnetic resonance measurement data in an examination region of an object undergoing examination, a magnetic resonance sequence is applied to a subject in order to acquire magnetic resonance measurement data from an examination region within a time period. A first resonant frequency of nuclear spins in the examination region is determined at a first time point within the time period. A second resonant frequency of nuclear spins in the examination region is determined at a second time point within the time period. Magnetic resonance measurement data that are acquired at a further time point within the time period are corrected, based on the first resonant frequency and the second resonant frequency.