Abstract: A method for contactlessly determining an exact passage of an athlete at points placed along a track in sports, wherein the method comprises gearing the athlete with a wearable magnetometer sensor unit, whereby the magnetometer sensor unit is equipped with at least a magnetic sensor, a processing unit, and a storage medium; placing at each point at least a permanent magnet in proximity of a track surface of the track. When the athlete moves along the track, the method further comprises recording at the magnetic sensor a signal; detecting for each permanent magnet a disturbance of a local magnetic field generated by the permanent magnet in the recorded signal and measuring the disturbance; mapping of the measured disturbance to a movement speed of the athlete and a distance of the athlete to the magnet corresponding to the local magnetic field; and correcting the movement speed and the distance for a time offset between the magnet passage of an athlete's center of mass and the magnetometer sensor unit.

Abstract: An air data computer configured to be installed on an aircraft includes an inertial sensor assembly having a plurality of accelerometers and a plurality of rate gyroscopes. The air data computer is configured to: determine a pressure altitude of the aircraft based on measured pressure of the airflow about the exterior of the aircraft; determine an estimated attitude of the aircraft based on rotational rate sensed by the plurality of rate gyroscopes; and determine a vertical acceleration of the aircraft based on the estimated attitude of the aircraft and the acceleration sensed by the plurality of accelerometers. The air data computer is further configured to blend the vertical acceleration and the pressure altitude using a complementary filter to produce a blended altitude rate that is output to consuming systems.

Abstract: An Air Data Test System (ADTS) for testing an aircraft pitot-static system including at least one pneumatic pump configured to generate an air pressure, at least two pairs of impact and static ADTS ports, a manifold system in fluid communication with the pneumatic pump and each pair of impact and static ADTS ports, and a signal processor operatively coupled to, and controlling, the at least one pneumatic pump and the manifold system. The signal processor is configured to issue control signals for independently and/or collectively testing each of the pilot and co-pilot pitot-static systems. One pair of ADTS ports is configured to supply air pressure to the pilot pitot-static system and the other pair of ADTS ports is configured to supply air pressure to the co-pilot pitot-static system. A mobile device wirelessly communicates with the signal processor to input the pressure values for testing the pilot and co-pilot pitot-static systems.

Abstract: Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.

Abstract: A test device for electrically testing a component having a component body and one or more component contacts adjacent to or extending from a side of the component body orthogonal to a contact direction, the component contacts electrically connected to an electrical circuit disposed in the component body. The test device has two or more test terminals for being electrically connected to at least one of the component contacts, the two or more test terminals being arranged substantially parallel to each other and extending in a terminal direction different from the contact direction.

Abstract: Electrical properties of a semiconductor device are reproducibly and stably measured in a testing step of the semiconductor device. A probe pin includes a first plunger, a second plunger, a cleaning shaft, a first coil spring, and a second coil spring. The cleaning shaft accommodated in the inside of the first plunger is allowed to enter and exit through a tip of a contact of the first plunger by the second coil spring, thereby solder shavings attached to the tip of the contact are removed. The first plunger is electrically coupled to the second plunger by the first coil spring wound on an outer side face of the first plunger and on an outer side face of the second plunger.

Abstract: A voltage sensor comprises a conductor (102) having a first end (101) and a second end (103), the first end including a first connection interface (150) and the second end having no connection, and a sensor section (125) including at least one sensor disposed over the conductor, the sensor sensing the sensor sensing at least a voltage or a sample of the voltage of the conductor. The voltage sensor is coupleable to a power line or cable, such as an overhead power line or cable, or a cable accessory, and can also be used in underground applications.

Abstract: Methods and apparatuses for monitoring a power circuit are disclosed. Electric conditions in the power circuit are sampled by a sensor device attached to the power circuit. The sampling can be based on a first sampling window and a second sampling window, the second sampling window being shorter than the first sampling window. Results of the sampling are analysed to determine at least one device drawing current from the circuit and to determine for the at least one device a harmonic vector based on the first sampling window and a transient vector based on the second sampling window. A signature vector for the at least one device is determined based on the harmonic vector and the transient vector.

Abstract: A sensor to measure dielectric constant of a medium may have a transmission line acting as a probe, and electronic circuit, and cable filter providing to reduce sensitivity of the sensor to cable parameters and influences. The sensor circuit may use a periodic signal generator to produce a carrier wave, which stimulates the transmission line, through a complex network coupling element. The complex impedance network forms a voltage divider with the transmission line, wherein the output of the voltage divider may be demodulated with an AM demodulator, such as a thermally compensated peak detector. This demodulated signal would be related to the characteristic impedance of the transmission line, and thus to the dielectric constant of the material surrounding the partially inserted transmission line probe. The demodulated signal may be offset, scaled, and linearized with a microcontroller containing signal processing routines, linearizing equations, stored calibration constants and look up tables.

Abstract: Some embodiments relate to a device for simulating characteristics of human tissues in electromagnetic dosimetry. The device includes a substrate bearing a metallised shielding, a layer of a dielectric material arranged on or preferentially beneath the substrate and the device including a plurality of openings made in the shielding and at least one array of sensors in the layer of dielectric material.

Abstract: A method for detecting the presence of an energized e-field in a space, wherein the space includes at least one electrically conductive element disposed in the space and coupled with a controller, the method including receiving in the controller a signal from the at least one electrically conductive element, determining that an energized e-field occupies the space, and generating an indication, by the controller, indicative of the presence of the energized e-field in the space.

Abstract: The invention discloses an electromagnetic signal detecting circuit and a corresponding method. Both the electromagnetic signal transported from a signal source and the reference signal transported from a reference source may be amplified and transported alternately at the same time to the processing circuit for further processing, or may be amplified respectively before the amplified signals being transported alternately to the processing circuit for further processing. In the modern technology, the switcher has almost a non-zero switching loss, and the gain of an amplifier is gradually degraded in the situation that the frequency of a signal to be amplified is gradually larger or smaller than a specific frequency range corresponding to the amplifier. Therefore, the invention may effectively detect the signal(s) no matter what the switching loss of the utilized switcher is and/or what the frequency of the electromagnetic signal(s) is.

Abstract: Various approaches to can be used to interrogate a surface such as a surface of a layered semiconductor structure on a semiconductor wafer. Certain approaches employ Second Harmonic Generation and in some cases may utilize pump and probe radiation. Other approaches involve determining current flow from a sample illuminated with radiation. Decay constants can be measured to provide information regarding the sample. Additionally, electric and/or magnetic field biases can be applied to the sample to provide additional information.

Abstract: A method identifies a diagnosis variable which indicates an aging state of an operating device in an electrical energy supply network. In the method, first measurement values of at least one measurement variable are detected at a first measuring point of the operating device. Then simultaneously second measurement values of the at least one measurement variable are detected at a second measuring point of the operating device. The diagnosis variable is identified using respective simultaneously detected first and second measurement values. It is proposed that the first and second measurement values are detected in a time-controlled manner in such a way that a signal of the at least one measurement variable is sampled at a prescribed sampling rate at set times and over a set measurement duration so as to generate time profiles of the first and second measurement values.

Abstract: A leakage current detection device which includes a switching unit for controlling electrical connection between an input end and an output end; a leakage current detection unit, including a plurality of current carrier wires and at least one leakage current detection wire, the leakage current detection wire being configured to detect whether a leakage current exists in any one of the plurality of current carrier wires; and a temperature monitoring unit, including at least one temperature-sensitive resistive element disposed at a temperature monitoring location, the temperature-sensitive resistive element being coupled to the switching unit via the leakage current detection wire and controlling the switching unit based on a temperature at the temperature monitoring location. By providing the temperature monitoring circuit, the leakage current protection device can prevent the appliance form being in a high temperature condition for prolonged time period, greatly improving safety of the appliance.

Abstract: Embodiments herein relate to a system and method for detecting an open circuit in a sensor measurement system. The system including a sensor having a direct current (DC) output, operably connected to a wiring harness and configured to transmit a sensor signal, and a controller, the controller operably connected to the wiring harness. The controller is configured execute a method including receiving a sensor signal from the sensor, AC coupling an AC signal with the sensor signal to form a coupled signal, measuring the coupled signal, determining if an open circuit is present based on the coupled signal and characterizing the sensor as failed if the open circuit is detected.

Abstract: An apparatus and method of detecting movement of a plunger of the solenoid includes detecting a peak (IPEAK) in a current signal applied to a coil of the solenoid. A predetermined threshold is added to the current signal applied to the coil of the solenoid to generate a level shifted signal. The level shifted signal and the peak signal are compared to detect movement of a plunger of the solenoid.

Abstract: The invention relates to insulation fault location systems and methods for insulation fault location for an ungrounded DC power supply system, which is redundantly fed from a first direct voltage supply source coupled to diodes and a second direct voltage supply source coupled to diodes and to which a consumer is redundantly coupled. Due to the diode coupling and the asymmetric current splitting of the load current associated therewith, non-compensational partial currents arise in the supply lines in such a power supply system and consequently differential current portions, which can be captured by measuring current transformers and which can interfere with a valid test current during an insulation fault location. In order to eliminate the interfering differential current portions, compensating measures on the primary side are proposed in the measuring current transformers and indirect compensating measures on the secondary side are proposed in an insulation fault location apparatus.

Abstract: The present disclosure pertains to novel systems and methods that incorporate advanced inference algorithms can be developed to detect floating neutrals using phasor measurements. In one aspect, the present disclosure relates to the use of phasor measurements to detect and localize floating neutrals in a distributed power network.

Abstract: The present disclosure relates to detection of faults in an electric power system. In one embodiment, a time-domain traveling wave directional subsystem is configured to receive a plurality of current traveling wave and a plurality of voltage traveling wave time-domain representations based on electrical conditions in the electric power delivery system. The plurality of current and voltage traveling wave time-domain representations may be compared to respective minimum thresholds. An integral may be generated based on a product of the plurality of current and voltage traveling wave time-domain representations when the current and voltage traveling wave time-domain representations exceed the minimum thresholds. A sign of the integral may reflect whether the fault is in the forward or reverse direction. A fault detector subsystem configured to declare the fault when the sign reflects that the fault is in the forward direction and the integral exceeds a security margin.

Abstract: A testkey structure including the following components is provided. A fin structure is disposed on a substrate and stretches along a first direction. A first gate structure and a second gate structure are disposed on the fin structure and stretch along a second direction. A first common source region is disposed in the fin structure between the first gate structure and the second gate structure. A first drain region is disposed in the fin structure at a side of the first gate structure opposite to the first common source region. A second drain region disposed in the fin structure at a side of the second gate structure opposite to the first common source region. A testkey structure is symmetrical along a horizontal line crossing the first common source region. The present invention further provides a method of measuring device defect or connection defect by using the same.

Abstract: In accordance with an embodiment of the present invention, a method of testing a plurality of semiconductor devices includes applying a stress voltage having a peak voltage on a shield line disposed over a substrate. The substrate has functional circuitry of a semiconductor device. A fixed voltage is applied to a first metal line disposed above the substrate adjacent the shield line. The first metal line is coupled to the functional circuitry and is configured to be coupled to a high voltage node during operation. The peak voltage is greater than a maximum fixed voltage. The shield line separates the first metal line from an adjacent second metal line configured to be coupled to a low voltage node during operation. The method further includes measuring a current through the shield line in response to the stress voltage, determining the current through the shield line of the semiconductor device, and based on the determination, identifying the semiconductor device as passing the test.

Abstract: A printed circuit board (PCB) test apparatus and testing method are described. The PCB test apparatus includes a motor connected to a gearbox that includes a gear that is directly connected to an output shaft. The test apparatus includes two printed circuit board connections for testing an electric-component connector that includes two circuit boards. One connection port includes a plurality of contact pins for attaching one of the PCBs while the other connector port is part of a position encoder that includes a diametrically magnetized magnet that tests the other PCB's ability to detect changes in magnetic fields. The apparatus is configured such that both PCBs of the electric-component connector are tested in tandem.

Abstract: A device for pressing an electronic component with different downward forces includes a first downward-pressure generating device, a depressing head, a second downward-pressure generating device and a depressing piston. The first downward-pressure generating device has the depressing head to apply a first downward pressure to the test socket and a portion of the electronic component. The second downward-pressure generating device has the depressing piston to apply a second downward pressure downward to another portion on the electronic component, so that the electronic component can couple electrically with a plurality of probe of the test socket. Thereupon, at least two downward-pressure generating devices are included to provide at least two different downward pressures to the electronic component solely or simultaneously to the electronic component and the testing equipment, such that specific downward-pressure requirements by precision electronic components can be fulfilled.

Abstract: An integrated circuit for measuring a signal, including a parametric pin measurement unit (PPMU) that sends a forced signal, the PPMU having a first amplifier, a second amplifier with an output terminal connected to the input terminals of the first amplifier through a common resistor; a voltage-to-current convertor connected to a PPMU output and having a first output and a second output; n channel MOSFETs connected to the first output of the voltage-to-current converter; p channel MOSFETs connected to the second output of the voltage-to-current converter; a buffered amplifier connected to an output port between the n channel MOSFETs and the p channel MOSFETs; and a resistance divider connected to the output of the buffered amplifier.

Abstract: A programmable device comprises a plurality of programmable blocks, a debug interface coupled with the plurality of programmable blocks, a debug interface coupled with the plurality of programmable blocks, and a power manger coupled with the plurality of programmable blocks. The power manager is configured to supply power to a subset of the plurality of programmable blocks during debugging of the subset while maintaining a different subset of the plurality of programmable blocks in a lower power mode.

Abstract: A device test architecture and interface is provided to enable efficient testing embedded cores within devices. The test architecture interfaces to standard IEEE 1500 core test wrappers and provides high test data bandwidth to the wrappers from an external tester. The test architecture includes compare circuits that allow for comparison of test response data to be performed within the device. The test architecture further includes a memory for storing the results of the test response comparisons. The test architecture includes a programmable test controller to allow for various test control operations by simply inputting an instruction to the programmable test controller from the external tester. The test architecture includes a selector circuit for selecting a core for testing. Additional features and embodiments of the device test architectures are also disclosed.

Abstract: A method and associated system. The method includes steps of: (a) a voltage bin is selected from of a set of voltage bins, each voltage bin having a different range of frequencies based on the highest operating frequency and the lowest operating frequency specified for an integrated circuit chip not previously tested; (b) a functional path test is performed on a selected path of a set of testable data paths of the integrated circuit chip not previously tested; (c) if the integrated circuit chip fails the functional path test, then a current supply voltage value is changed to a voltage value associated with a not previously selected voltage bin; (d) a not previously tested path of the set of testable paths is selected. Steps (b), (c) and (d) are repeated until every path of the set of testable paths has been tested.

Abstract: A method of analyzing an electrical circuit applied for an electrical system is disclosed. The method includes steps of obtaining a loss parameter and an eye diagram of a circuit channel of the electrical system; comparing the eye diagram with a standard eye diagram to generate a comparison result; generating an analytic result of the loss parameter according to the comparison result in order to adjust the eye diagram; and adjusting the loss parameter according to the analytic result.

Abstract: A Joint Test Action Group (JTAG) communication lockout processor is disclosed. The processor is configured to generate a multi-channel unlock sequence based on an operational mode change of an operably connected programmable device, and save the unlock sequence to one or more memory registers. The processor can also receive an execution of the multi-channel unlock sequence via two or more unlock channels, determine, via an unlock logic, whether the execution of the multi-channel unlock sequence is valid, and responsive to determining that the execution of the multi-channel unlock sequence is valid, allow or disallow the JTAG communication with an embedded processor.

Abstract: Disclosed is an apparatus for bypassing and testing a fuel pump relay for a fuel pump of a vehicle. In an aspect, the apparatus includes a first pair of terminal pins configured to be inserted into the run/start signal fuse slot in the fuse box of the vehicle, a second pair of terminal pins configured to be inserted into a fuel pump fuse slot in the fuse box of the vehicle, a power input device configured to be conductively coupled to a power source of the vehicle, and a circuit configured to conductively couple, based on reception of electrical current from a run/start signal out terminal pin of the first pair of terminal pins, the power input device to a fuel pump terminal pin of the second pair of terminal pins to provide electrical current from the power input device to the fuel pump of the vehicle.

Abstract: A system for assuring safe use of a battery pack includes a display unit and a state of health (SoH) monitor connected to the battery pack, the SoH monitor.

Abstract: Provided are a method of predicting a battery charge limit not to cause lithium (Li)-plating, and a battery charging method and apparatus capable of quickly charging a battery based on the battery charge limit. A battery charge limit prediction method according to the present disclosure includes (a) fabricating a three-electrode cell including a unit cell and a reference electrode, (b) measuring a negative electrode potential (CCV) based on a state of charge (SOC) while charging the three-electrode cell, and (c) determining a point at which the negative electrode potential is not dropped but starts to be constant, as a lithium (Li)-plating occurrence point, and setting the Li-plating occurrence point as a charge limit.

Abstract: A state of charge calculation apparatus and storage battery system improve the estimation accuracy of the state of charge of a secondary battery. A state of charge calculation apparatus (15) for a secondary battery (14) includes a charging/discharging current detector (22) that detects a charging/discharging current of the secondary battery (14), a terminal voltage detector (23) that detects a terminal voltage of the secondary battery (14), a first estimator (24) that integrates the charging/discharging current and estimates a first state of charge, a second estimator (25) that estimates a second state of charge on the basis of the relationship between open circuit voltage and state of charge of the secondary battery (14), and a state of charge calculator (26) that calculates a third state of charge on the basis of the first state of charge and second state of charge respectively weighted by the charging/discharging current.

Abstract: Method and system to improve the calculation of the State of Charge (SOC) of a battery with a model based on an adaptive parabolic function, including a feature to dynamically update the key parameters of the model, to compensate the behavior deviations of the battery from the ideal new battery model as it ages. The battery model has a parabolic region and a linear region.

Abstract: Provided are an inspection apparatus and method capable of accurately detecting a defective membrane electrode assembly based on the rate of deterioration of carbon forming an electrode catalyst layer or the like of the assembly.

Abstract: Disclosed are methods and systems that facilitate the estimation of entropy in a dissipative process of a system, via a structured approach to degradation and failure modeling that solves the analysis as a geometric problem, to measure degradation and/or expected life or failure of a system. It was found that data collected to estimate entropies produced by dissipative processes in association with degradation or ageing of batteries, grease, and fatigue, exhibit linearity between related degradation measure and combination of specific accumulated entropies (e.g., joule dissipation entropy, heat storage entropy, heat transfer entropy, electrochemical entropy, shear work entropy, thermal entropy, oxidation entropy, and plastic strain entropy, thermal entropy). A universally consistent approach is further disclosed for characterizing lead-acid batteries of all configurations.

Abstract: The invention relates to insulation fault location systems and methods for insulation fault location for an ungrounded DC power supply system, which is redundantly fed from a first direct voltage supply source coupled to diodes and a second direct voltage supply source coupled to diodes and to which a consumer is redundantly coupled. Due to the diode coupling and the asymmetric current splitting of the load current associated therewith, non-compensational partial currents arise in the supply lines in such a power supply system and consequently differential current portions, which can be captured by measuring current transformers and which can interfere with a valid test current during an insulation fault location. In order to eliminate the interfering differential current portions, compensating measures on the primary side are proposed in the measuring current transformers and indirect compensating measures on the secondary side are proposed in an insulation fault location apparatus.

Abstract: The invention relates to a monitoring unit configured for monitoring a power converter of a wind turbine, the monitoring unit comprising: electric connection means configured for connecting the monitoring unit to one or more electric converter components, a cold area comprising a data communication interface, and one or more hot areas dedicated to obtain measurements from the one or more electric converter components.

Abstract: Systems, methods and non-transitory, computer-readable mediums are disclosed for a magnetic field sensor array with electromagnetic interference cancellation. In an embodiment, a circuit comprises: a first circuit configured for obtaining an output signal from a magnetic field sensor array in an electronic system, the output signal representing a magnetic field present in the electronic system, the magnetic field including electromagnetic interference (EMI) generated by one or more magnetic aggressors of the electronic system; and a second circuit configured to apply one or more magnetic field gradient heat maps to the output signal.

Abstract: The present invention relates to a method and to a sensor arrangement for determining the transverse sensitivity of a magnetic field sensor or an arrangement of magnetic field sensors. The sensor, or the arrangement of sensors, has a defined direction of sensitivity here. In the method, one or more electrical conductors are applied to a substrate or integrated into the substrate in such a way that they generate a magnetic field at the location of the respective magnetic field sensor, of which magnetic field only one magnetic field component, which is perpendicular to the defined direction of sensitivity, contributes to a measurement signal or combined measurement signal of the magnetic field sensor or of the arrangement of magnetic field sensors. Therefore, the transverse sensitivity of the magnetic field sensor or of the arrangement of magnetic field sensors can be obtained by measuring this measurement signal.

Abstract: Aspects are generally directed to a compact and low-noise magnetic field detector, methods of operation, and methods of production thereof. In one example, a magnetic field detector includes a proof mass, a magnetic dipole source coupled to the proof mass, and a substrate having a substrate offset space defined therein, the proof mass being suspended above the substrate offset space. The magnetic field detector further includes a sense electrode disposed on the substrate within the substrate offset space and positioned proximate the proof mass, the sense electrode being configured to measure a change in capacitance relative to the proof mass from movement of the proof mass in response to a received magnetic field at the magnetic dipole source. The magnetic field detector includes a control circuit coupled to the sense electrode and configured to determine a characteristic of the magnetic field based on the measured change in capacitance.

Abstract: A technology is described for detecting a mechanical device. An example method may include retrieving magnetometer data generated by a magnetometer coupled to a mobile device. Magnetic features may be extracted from the magnetometer data, where the magnetometer data may be associated with magnetic field distortion patterns generated by mechanical motions of a mechanical device. Accelerometer data generated by an accelerometer coupled to the mobile device may be retrieved. Acceleration features associated with vibration patterns generated by the mechanical motions of the mechanical device may be extracted from the accelerometer data. Thereafter, the mechanical device may be identified using the magnetic features and the acceleration features.

Abstract: A magneto-resistive effect element includes a magnetization free layer, an intermediate layer, and a magnetization pinned layer. The magnetization free layer extends along a first plane. The intermediate layer extends along the first plane, and is stacked on the magnetization free layer. The magnetization pinned layer extends along the first plane, and is provided on side opposite to the magnetization free layer with the intermediate layer being interposed therebetween. Here, the magnetization free layer includes an end surface that has a maximum inclination angle of 42° or less relative to the first plane.

Abstract: A magnetic sensor cell including a magnetic tunnel junction including a reference layer having a reference magnetization oriented substantially parallel to the plane of the reference layer, a sense layer having a sense magnetization, and a tunnel barrier layer between the sense and reference layers. The sense layer includes an intrinsic anisotropy substantially perpendicular to the plane of the sense layer such that the sense magnetization is orientable between an initial direction perpendicular to the plane of the sense layer and a direction parallel to the plane of the sense layer; the intrinsic anisotropy having in anisotropy field being above 150 Oe.

Abstract: A method and system that includes injecting light into a vapor cell; detecting an output of the light from the vapor cell; modulating the light injected into the vapor cell in dependence on the detected output to achieve an oscillating signal; applying an energy pulse to the vapor cell prior to achieving the oscillating signal to decrease a time required to achieve the oscillating signal; and determining a magnetic field measurement in dependence on a frequency of the oscillating signal.

Abstract: It is an object of the invention to provide for an improved method for device localization using magnetic resonance imaging (MRI) during MRI guided interventions.

Abstract: NMR microprobe detectors and methodologies that provide enhanced signal sensitivity for low-volume sample detection and analysis are described. In one embodiment the microprobe detector is a flat wire detector with a strip conductor having a length and width and ratio greater than 5 with a substantially uniform surface positioned on a low loss substrate in contact with a sample holder having a generally thin wall or at least a thin portion near where the sample probing and analysis occur.

Abstract: Pressure coring where the core apparatus drills the core sample and seals the core sample at its native downhole pressure (e.g., several thousand psi) may be expanded to include nuclear magnetic resonance (NMR) imaging components to produce a pressurized NMR core holder that allows for NMR imaging of the core samples having been maintained in a downhole fluid saturation state. NMR imaging performed may include 1H and also 19F imaging depending on the chamber fluid used in the pressurized NMR core holder.

Abstract: An imaging apparatus for imaging a sample includes a magnetic apparatus that defines a sample volume that is large enough to accommodate the sample to be imaged, and one or more magnetically manipulatable materials within the sample. The magnetic apparatus includes a magnet that is configured to create a magnetic field having a magnitude B in the sample Each magnetically manipulatable material is a material that exhibits a transition between a first magnetic state and a second magnetic state in response to a change in a property associated with the sample while the magnetic field having the magnitude B is maintained in the sample.