Offset Patents (Class 122/93)
  • Patent number: 12163937
    Abstract: An embodiment provides a method for deriving an amount of PFAS substances from a total organic fluoride measurement in a sample, including: removing inorganic fluoride from the sample using one or more of an ion exchange cartridge and an exclusion apparatus; preconcentrating, using a solid phase extraction, at least one PFAS substance in the sample; digesting, using a working electrode and a counter electrode, the at least one PFAS substance to an amount of total organic fluoride; and determining, using an analyzer, the amount of total organic fluoride in the sample. Other aspects are described and claimed.
    Type: Grant
    Filed: January 20, 2022
    Date of Patent: December 10, 2024
    Assignee: HACH COMPANY
    Inventors: Vishnu Vardhanan Rajasekharan, Cary Burton Jackson, Matthew Ryan Salzer, Dan Jonathan Kroll
  • Patent number: 5073502
    Abstract: The present invention is a single phase analysis process and apparatus which is zero gravity compatible and capable of detecting trace levels of organic halogens. The process utilizes a sorbent bed, oxidation chamber, and an ion chromatograph. Current technology does not allow determination of which organic halogens are present at trace levels. Additionally, the commonly utilized technique for monitoring organic halogens is a two phase analysis which is not zero gravity compatible.
    Type: Grant
    Filed: June 27, 1990
    Date of Patent: December 17, 1991
    Assignee: United Technologies Corporation
    Inventor: John W. Steele