Abstract: A system for sorting metals from a batch of mixed material scrap includes an array of inductive proximity detectors, a processing computer and a sorting mechanism. The inductive proximity detectors identify the location of the metal pieces and the processing computer instructs the sorting mechanism to place the metal and non-metallic pieces into separate containers.

Abstract: An automated system for sorting dissimilar materials, and in particular for sorting plastics from other materials and for sorting different types of plastics from one another comprises, depending upon the embodiment, combinations of a sizing mechanism, a friction separation, an air separator, a magnetic separator, a dielectric sensor sortation bed, shaker screening, a ballistic separator, an inductive sensor sortation system and a float/sink tank. The dielectric sensor sortation system may be either analog or digital, depending upon the particular implementation. One or more float/sink tanks can be used, depending upon the embodiment, each with a media of a different specific gravity. The media may be water, or water plus a compound such as calcium chloride. In addition, multiples of the same general type of module can be used for particular configurations. A heavy media system or a sand float process can be used either alternatively or additionally.

Abstract: A method, apparatus and system for sorting contaminated glass from a stream of glass particles used light of a wavelength suited to inducing fluorescence in the contaminated glass pieces. Automatic cleaning mechanisms are included in some embodiments to facilitate removal of coatings which would prevent the contaminated particles from fluorescing. The identified particles are then automatically separated from the remaining particles.

Abstract: A system of testing semiconductor devices includes a classification module configured to classify a plurality of lots into a plurality of groups; an apparatus assignment module configured to assign a plurality of testing apparatuses to each of the groups; and a test recipe creation module configured to create a test recipe to test defects in a second group other than a first group specified in the groups, the test recipe including a definition of testing positions in the second group defined by a rule different from the first group.

Abstract: Processing metallic materials, such as copper, from waste materials. The systems and methods employ a dynamic sensor, which measures the rate of change of current generated by metallic objects that pass by the sensor to identify metallic objects in a waste stream. The dynamic sensor may be coupled to a computer system that controls a material diverter unit, which diverts the detected metallic objects for collection and possible further processing. The systems or methods may employ stages of sensors for sequential recovery of materials.

Abstract: A method, system, and apparatus for a radio frequency identification (RFID) tag inlay tester and sorter system are described. A tag inlay is received. A characteristic of the tag inlay is tested. The tag inlay is disposed if the tag inlay is determined to fail the test of characteristic. The tag inlay is transported to a processing station if the tag inlay is determined to have passed the test of characteristic. The tag inlay is processed at the processing station. In an aspect, the tag inlay testing and tag inlay processing is performed in a single apparatus. In an alternative aspect, the tag inlay testing is performed by a first apparatus, and the tag inlay processing is performed by a second apparatus.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes, is disclosed.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes, is disclosed.

Abstract: A system and method for separating batches of mail in a mailpiece sorter. The system employs a card stock interposed between batches of mail, which card stock includes a ferromagnetic symbology disposed on a face surface of the card stock. An inductive proximity detector is employed to scan the ferromagnetic symbology and produce a ferromagnetic signature signal indicative of the ferromagnetic parameters of the symbology. The system conveys batches of mail containing the card stock past the inductive proximity detector such that the signature signals may be read and compared to predefined ferromagnetic signature signals stored in a signal processor. The processor may then determine the beginning and/or ending of a mailpiece job run for use by the mailpiece sorter.

Abstract: A die sorting apparatus for a wafer is provided that associates logical positions of each die from a map file for storing records of testing information based upon testing performed on individual dice comprised in the wafer with its physical position as illustrated by an image acquired by an image capturing device showing physical positions of the dice, after the dice have been singulated. A processing device can thus determine actual physical positions of the dice for reference by a die pick-up device configured to selectively pick up dice that meet predetermined criteria according to the testing information from their actual physical positions as determined.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes, is disclosed.

Abstract: An optical illumination and monitoring subsystem controls the operation of a flow cytometer having a carrier fluid that flows along a channel coupled to a droplet generator, which controls a point at which droplets break off from the carrier fluid, and a droplet sorter that is operative to cause selected droplets to be sorted along one or more droplet travel paths. The subsystem is operative to illuminate a respective droplet monitoring location along each of one or more droplet travel paths with a respective beam of light, such as that sourced from a common laser. In response to backscatter reflection from a droplet passing through the respective beam of light at a respective droplet monitoring location, the amplitude of the beam of light is increased. Then the droplet is monitored for the presence of a particle therein exhibiting detectable fluorescence as a result of the increase in the amplitude of the respective beam of light.

Abstract: Improved flow cytometer system particularly adapted to use for sex-selected sperm sorting include enhanced sheath fluid and other strategies which minimize stress on the sperm cells, including a 2.9 percent sodium citrate sheath solution for bovine species and a HEPES bovine gamete media for equine species. Improved collection systems and techniques for the process are described so that commercial applications of sperms samples as well as the resulting animals may be achieved.

Abstract: In a method for monitoring the properties of pharmaceutical articles (2), in particular capsules (2), in a machine (1) that makes the articles (2), the pharmaceutical articles (2) are fed in single file from a station (3) where the articles (2) are made to an article (2) outfeed portion (6) of the machine (1) along a defined feed path (P) passing through an inspection station (8). In the inspection station (8) each pharmaceutical article (2) passes through an electromagnetic field (E) created by microwave radiation.

Abstract: A method of manufacturing disk drives that are subject to disk pack imbalance includes steps of measuring the disk pack imbalance of each drive and assigning each of the drives to one of a predetermined plurality of categories, depending upon the measured disk pack imbalance. The measured imbalance of the disk drives assigned to fewer than the predetermined plurality of categories may then be reduced. Each category may be associated with one or more customers and the drives assigned to each category may be shipped to the associated customer(s).

Abstract: The present invention provides an apparatus for processing a sheet. When a medium having various patterns detected by a plurality of detecting sections for individually detecting plural kinds of features from a sheet, each detecting section detects plural kinds of features from the medium. The features detected from the medium are compared with a predetermined reference value so that the condition of the apparatus can be judged.

Abstract: An apparatus for handling, storing and reloading carriers for disk-shaped items, such as semiconductor wafers or CDs, has at least one cleaning unit and at least one storage unit for the carriers containing the disk-shaped items. The apparatus further has at least one sorting unit for the disk-shaped items. The cleaning unit, the storage unit and the sorting apparatus are integral component parts of the apparatus and are operated by a common automatic control.

Abstract: The invention relates to a method for increasing strength and/or reducing strength variations in multi-layer wood, plywood, and the like sandwich material. The method comprises measuring wood veneers (10) for dry substance density (?) with high-frequency electromagnetic resonance (TEM) and additionally analyzing the homogeneity and/or grain structure of wood veneers from a wood veneer surface in the way of its darkness (R). If the wood veneer comprises a number of local first regions, which are darker than a predominant darkness of the veneer surface, the wood veneer in question has its calculated dry substance density (?C) established to be lower than its initially measured value (?M).

Abstract: In a sorting and separating method for recycling plastics provided in a mixture of plastics as refuse, said mixture of plastics is sorted and separated according to colours. Fractions of plastics thus obtained, separated according to colours, are sorted and separated according to types of plastic.

Abstract: A work inspection system 2 includes: a conveyor table 7 vertically positioned, and conveying works W stored in work-storing pockets 9; a work inspection apparatus for inspecting the works stored in the work-storing pockets 9 of the conveyor table 7; and a sorting and ejecting apparatus 12 for sorting the inspected works stored in the work-storing pockets of the conveyor table in accordance with a property of the works and ejecting the same. The work-storing pockets 9 of the conveyor table 7 are positioned inside the periphery 7a of the conveyor table 7 to surround the works W. The work-storing pockets 9 are disposed along two concentric circles on the conveyor table 7.

Abstract: The invention relates to a system for placing electronic components maintained in an array to feed tracks (2) of a placement unit (1) wherein, the correct placement of the array is accomplished in a feed supervisory unit (4) by comparison of component-related data stored on identification carriers (9) respectively assigned to the arrays with placement-related data stored on a portable equipment supervisory carrier (8).

Abstract: Electrical or electro-mechanical apparatuses are disclosed that include a plurality of superconducting nanotubes or a plurality of superconducting nanotube bundles, especially superconducting carbon nanotubes and a stabilizing means or structure, where the nanotubes are maximally proximate and where the means stabilizes the nanotubes to increase mechanical durability. Methods of sorting nanotubes based on their conductive properties are also disclosed.

Abstract: The invention describes a method for measuring and classifying resistors (2), in which in a measuring station (3) the resistance value of the resistor (2) supplied by a feed and transport device (12) of the measuring station (3) is measured. The measured resistance value is transmitted to an evaluation unit (40) of a control device (20). The resistor (2) is delivered sorted according to predetermined measurement ranges into an output device (25) arranged after the measuring station (3). The resistor (2) is heated to a predefined nominal temperature by a temperature regulating device (7), in particular by a medium (9). After reaching this nominal temperature the resistor (2) is contacted in the medium (9). Afterwards the measurement of the resistor (2) is carried out.

Abstract: A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug-in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.

Abstract: A flow cytometry system is disclosed for oscillating the exterior of a flow cytometer nozzle. Oscillating the exterior of a flow cytometer nozzle at selected oscillations or a sweeping range of oscillations disintegrates particles and gas entrapped within the flow cytometer nozzle. Adherents absorbed to the exterior of the flow cytometer nozzle may also be removed. An energy source (1) serves to generate a selected oscillation or range of oscillations. The energy source (1) is connected to a flexible transfer element (2) which conducts the electrical signals to an oscillation system (3). The oscillation system (3) turns the electrical energy from the energy source (1) into mechanical oscillations and is connected to a portable device (4) which disintegrates particles, dislocates gas within the flow cytometer nozzle and cleans the exterior of the flow cytometer aperture.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.

Abstract: The invention relates to a device and a method for blowing out metal fractions from a stream of bulk material that is conveyed by bulk material means. The device comprises blow-out nozzles which are located on a drop section, and which are arranged along a width-wise extension of the stream of bulk material, for blowing against individual particles of bulk material in order to modify the trajectory in such a way as to produce a second sub-stream that branches off. The blow-out nozzles can be controlled according to the sensor coil scanning results relating to the bulk material particles. A plurality of sensor coils is provided underneath an essentially horizontal section of the stream of bulk material in the form of an LC oscillating circuit. Said sensor coils are provided for detecting the eddy currents that are induced. Optoelectronic means are also provided for determining the blow-out position and for determining the location of each of the particles of bulk material.

Abstract: The present invention relates to an automatic sorting compression machine for iron, aluminum cans and plastic bottles. An inlet is provided atop the main body of the present invention. At least one detecting switch is arranged in a preset position of the inlet. A receptacle is disposed under the inlet. A one-way outlet and a two-way outlet are fitted at the front and rear ends of the receptacle. An exit selector controlled by a change-over magnetic valve is disposed at the two-way outlet. A container is placed under each of the three channels of the outlets. The press shaft of a spindle passes through the receptacle. The press shaft is fitted with an electrified magnet and an electrified pole at the front end thereof while another electrified pole opposite to the electrified pole is mounted in preset position of the main body. A microswitch is disposed in the farthest position of the press shaft being drawn back.

Abstract: The invention relates to a device and a method for blowing out metal fractions from a stream of bulk material that is conveyed by bulk material means. The device comprises blow-out nozzles which are located on a drop section, and which are arranged along a width-wise extension of the stream of bulk material, for blowing against individual particles of bulk material in order to modify the trajectory in such a way as to produce a second sub-stream that branches off. The blow-out nozzles can be controlled according to the sensor coil scanning results relating to the bulk material particles. A plurality of sensor coils is provided underneath an essentially horizontal section of the stream of bulk material in the form of an LC oscillating circuit. Said sensor coils are provided for detecting the eddy currents that are induced. Optoelectronic means are also provided for determining the blow-out position and for determining the location of each of the particles of bulk material.

Abstract: Improved flow cytometer system particularly adapted to use for sex-selected sperm sorting include enhanced sheath fluid and other strategies which minimize stress on the sperm cells, including a 2.9 percent sodium citrate sheath solution for bovine species and a HEPES bovine gamete media for equine species. Improved collection systems and techniques for the process are described so that commercial applications of sperms samples as well as the resulting animals may be achieved.

Abstract: A method and apparatus is provided for sorting semiconductor devices for processing where the semiconductor devices have been singulated from a strip containing a plurality of semiconductor devices and where an electronic strip map has been created corresponding to the strip of semiconductor devices and the electronic strip map contains address and quality information related to each individual singulated semiconductor device. The method includes the steps of moving a pickup device to a location adjacent the singulated semiconductor devices and selectively picking up a first plurality of singulated semiconductor devices based on the electronic strip map information related to the singulated semiconductor devices and moving the semiconductor devices that have been picked up to a predetermined location based on the electronic strip map information related to the specific semiconductor devices that have been picked up and unloading the first plurality of semiconductor devices at the predetermined location.

Abstract: A computerized system for analyzing information associated with a process unit. A database contains historical information relating to previously compiled information. A secure input receives criteria from a restricted source. A computer mathematically determines a limit based upon the criteria. An open input receives the information associated with the process unit from multiple test locations. A compiler selectively adds to the database of historical information the information. The computer also selects at least a portion of the information based upon selection criteria. In addition, the computer manipulates the selected information based upon manipulation criteria. The manipulated information is compared against the limit. An output indicates a first disposition of the process unit when the manipulated information violates the limit. The output indicates a second disposition of the process unit when the manipulated information does not violate the limit.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.

Abstract: The present invention relates to a SIMM/DIMM board handler, which enables a single test site handling machine to be integrated into an inline, multi-site test cell, and includes an angled conveyor belt, an angled fail tray for transporting and sorting tested circuit boards and an adjustable circuit probe for performing separate testing of circuit boards.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.

Abstract: A semiconductor device testing system is provided which can efficiently utilize a plurality of semiconductor device testing apparatus. There are provided a host computer 2 for controlling a plurality of semiconductor device testing apparatus 1A, 1B, and 1C, and a dedicated classifying machine 3. Storage information memory means 4 for storing storage information of each semiconductor device such as a number assigned to each tested semiconductor device, the test results of each semiconductor device, and the like is provided in the host computer 2. Without sorting the tested devices or with the sorting operation of the tested devices into only two categories in the handler part 11 of each testing apparatus, the tested devices are transferred from the test tray to a general-purpose tray, and during this transfer operation, the storage information of each device is stored in the storage information memory means.

Abstract: An improved needle inspection station for use in a combined index machine for forming drilled taper point needles of the type having a plurality of chucks mounted on a rotating platform adapted to selectively engage and release a needle to be formed, a rotary drive for indexing the platform and the chucks through a plurality of radial positions, and a plurality of work stations circumferentially disposed adjacent the radial positions occupied by the chucks. A needle inspection platform slidably mounted on the baseplate reciprocally movable toward and away from a chuck occupying a position adjacent the inspection station. A slide member is movable toward the chuck to permit the gripper to engage the needle, retract it from the chuck and rotate it 180 degrees to reverse the orientation of the needle relative to the chuck. The slide member is then movable back toward the chuck to allow the gripper to replace the needle in the chuck.

Abstract: A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug-in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.

Abstract: An installation for processing wafers in at least one clean room is described. The installation has a configuration of production units for carrying out individual production steps and measuring units for inspecting the production steps. The production units and the measuring units are connected via a transport system for feeding and removing the wafers. At least one measuring unit together with an unloading station for delivering wafers to the transport system forms a measuring station, in which case wafers processed so as to be free of defects can be delivered from the measuring station separately from the remaining wafers.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.

Abstract: An inventive method for sorting integrated circuit (OC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes. The inventive method can be used in conjunction with an IC manufacturing process that includes providing semiconductor wafers, fabricating the IC's on each of the wafers, causing each of the IC's to store its ID code, separating each of the IC's from its wafer to form IC dice, assembling the IC dice into IC devices, and testing the IC devices.

Abstract: An inventive method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes. The inventive method can be used in conjunction with an IC manufacturing process that includes providing semiconductor wafers, fabricating the IC's on each of the wafers, causing each of the IC's to store its ID code, separating each of the IC's from its wafer to form IC dice, assembling the IC dice into IC devices, and testing the IC devices.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.

Abstract: An inventive method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices, and sorting the IC devices in accordance with their automatically read ID codes. The inventive method can be used in conjunction with an IC manufacturing process that includes providing semiconductor wafers, fabricating the IC's on each of the wafers, causing each of the IC's to store its ID code, separating each of the IC's from its wafer to form IC dice, assembling the IC dice into IC devices, and testing the IC devices.

Abstract: A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.

Abstract: A method for classifying defects includes imaging an inspected object. An image of a defect candidate is extracted from an image obtained by said imaging step. Said extracted defect candidate image is classified into a first category. Said extracted defect candidate image is classified into a second category. Said extracted defect candidate image and information relating to said classification into said first category and information relating to said classification into said second category are displayed on a screen.

Abstract: An inventive method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes. The inventive method can be used in conjunction with an IC manufacturing process that includes providing semiconductor wafers, fabricating the IC's on each of the wafers, causing each of the IC's to store its ID code, separating each of the IC's from its wafer to form IC dice, assembling the IC dice into IC devices, and testing the IC devices.

Abstract: A microdevice reject handling system is provided for in a microdevice processing/feeder system. The feeder mechanism is immediately adjacent to the processing mechanism for receiving and moving microdevices away from the processing mechanism. It uses a conveyor which has a dead space in which microdevices cannot be placed by a robotic transport system, which moves microdevices from the processing mechanism to the feeder mechanism. The microdevice reject handling system is partially positioned in the feeder mechanism dead space for receiving rejected microdevices. It includes a reject bin with a storage portion for storing rejected microdevices beside the feeder mechanism and rests on a bracket containing an optical sensor system for determining when the storage portion is full.

Abstract: A test control system for controlling overall test procedures which processes test data generated from the final test process and analyzes bin category results. The control system uses testers for testing electrical characteristics of IC devices, a host computer for processing data transmitted from the testers and for creating a number of database structures, and distributed computers for monitoring the test progress and analyzing the test results using the database structures stored in the host computer. A control method using the control system includes the steps of: performing a final test as a lot; monitoring the status of the final test progress while storing test data during the final test; determining if the final test is completed; performing a lot decision after the final test is completed based on bin category limits; and displaying the lot decision result and storing the test data.