Swept Or Scanned Patents (Class 219/121.29)
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Patent number: 11545334Abstract: The invention provides a charged particle beam device that can accurately move a convergence point of a charged particle beam to a surface of a sample and facilitates a user to grasp a positional relation between the surface of the sample and the convergence point of the charged particle beam.Type: GrantFiled: August 2, 2018Date of Patent: January 3, 2023Assignee: Hitachi High-Tech CorporationInventor: Ryo Komatsuzaki
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Patent number: 10518359Abstract: The present relates to a method of welding in deep joints in narrow-gap geometry. The two metallic components are arranged next to each other such that there is nearly a zero gap between the two components. The step of joining two metallic components is performed in two stages, the first stage being a root weld and the second stage being a fill up weld. The root weld is completed at the joining of the two discs starting from a middle portion to a point up to which there is still a zero gap between the two discs. From the point there exists a non-zero gap between the two discs up to an outer portion. The filler gap is filled by fill up welding. During fill up welding, a filler wire is melted along with the two discs by using the first source of energy, and to fill the filler gap along with molten material of the two discs.Type: GrantFiled: October 19, 2015Date of Patent: December 31, 2019Assignee: General Electric Technology GMBHInventors: Dirk Jaekel, Balint Horvath, Sorin Keller, Guenter Ambrosy
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Patent number: 9909972Abstract: A system and method are provided to observe and count particles in polydisperse solutions with dark field microscopy while distinguishing among particles of different sizes and accurately counting particles. A calibration mask, calibration light source, and multiple wavelengths of light are used. Opaque calibration marks on the transparent calibration mask define a region of interest. Multiple beams of various wavelengths are combined into a beam or a light sheet and the perpendicular component of scattered light from the specimen particles is then split into separate wavelengths and detected by separate sensors attuned to each wavelength.Type: GrantFiled: February 8, 2016Date of Patent: March 6, 2018Assignee: Manta Instruments, Inc.Inventor: Jan J. Tatarkiewicz
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Patent number: 9358635Abstract: A method of progressing a melt front (55) around a curved progression path (20) via a pattern (LP) of transverse laser scan lines (S1-S8) of differing lengths. Multiple area bands (B1-B8) conceptually divide a width of the curved path. The multiple transverse scan lines distribute the laser power among the bands with a predetermined uniformity that provides relatively consistent power density across the melt front. The scan lines may extend from a less curved side (24) of the curved path, through a band (B4 or B8) of largest area, toward a more curved side (22) of the path. At least one of the scan lines (S1, S8) may cross all bands. Other scan lines are shorter and extend by varying distances into the inner bands (B1-B3 or B1-B7), normalizing the power density across the bands.Type: GrantFiled: December 19, 2013Date of Patent: June 7, 2016Assignee: SIEMENS ENERGY, INC.Inventor: Gerald J. Bruck
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Patent number: 8933368Abstract: A modified region is accurately formed at a desirable position with respect to a laser light irradiation surface of an object to be processed. When an average difference ? has a value exceeding a predetermined threshold during trace recording, a particle segment Z including a line segment S where the average difference ? exceeds the predetermined threshold is defined. This determines that a particle exists on a line to cut 5 and randomly reflects measuring laser light, whereby a segment where the presence of the particle affects a control signal in a line segment to cut is detected as the particle segment Z. Correcting the control signal in the particle segment Z inhibits a converging lens from moving more than necessary because of an error included in the signal value under the influence of the presence of the particle, thus allowing the converging point of the processing laser light to accurately follow a front face 3.Type: GrantFiled: September 25, 2007Date of Patent: January 13, 2015Assignee: Hamamatsu Photonics K.K.Inventors: Kazuhiro Atsumi, Koji Kuno, Tatsuya Suzuki
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Publication number: 20140312009Abstract: This device scans a high-energy beam in a direction traversing a feed path of a grain-oriented electrical steel sheet having subjected to final annealing so as to irradiate a surface of the steel sheet being passed through with the high-energy beam to thereby perform magnetic domain refinement, the device including an irradiation mechanism for scanning the high-energy beam in a direction orthogonal to the feed direction of the steel sheet, in which the irradiation mechanism has a function of having the scanning direction of the high-energy beam oriented diagonally, relative to the orthogonal direction, toward the feed direction at an angle determined based on a sheet passing speed of the steel sheet on the feed path.Type: ApplicationFiled: December 25, 2012Publication date: October 23, 2014Inventors: Seiji Okabe, Shigehiro Takajo, Yasushi Kitani
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Publication number: 20140158667Abstract: A method for layer-by-layer manufacturing of a three-dimensional work piece, including: (a) delivering a metallic feed material into a feed region; (b) emitting an electron beam; (c) translating the electron beam through a first predetermined raster pattern frame that includes: (i) a plurality of points within the feed region; and (ii) a plurality of points in a substrate region that is outside of the feed region; (d) monitoring a condition of the feed region or the substrate region for the occurrence of any deviation from a predetermined condition; (e) upon detecting of any deviation, translating the electron beam through at least one second predetermined raster pattern frame that maintains the melting beam power density level substantially the same, but alters the substrate beam power density level; and (f) repeating steps (a) through (e) at one or more second locations for building up layer-by-layer.Type: ApplicationFiled: May 10, 2013Publication date: June 12, 2014Applicant: SCIAKY, INC.Inventors: Scott Stecker, Phillip E. Wollenhaupt
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Patent number: 8461474Abstract: A method for layer-by-layer manufacturing of a three-dimensional work piece including, (a) delivering a metallic feed material into a feed region; (b) emitting an electron beam; (c) translating the electron beam through a first predetermined raster pattern frame that includes: (i) a plurality of points within the feed region; and (ii) a plurality of points in a substrate region that is outside of the feed region; (d) monitoring a condition of the feed region or the substrate region for the occurrence of any deviation from a predetermined condition; (e) upon detecting of any deviation, translating the electron beam through at least one second predetermined raster pattern frame that maintains the melting beam power density level substantially the same, but alters the substrate beam power density level; and (f) repeating steps (a) through (e) at one or more second locations for building up layer-by-layer.Type: GrantFiled: February 17, 2011Date of Patent: June 11, 2013Assignee: Sciaky, Inc.Inventors: Phillip E. Wollenhaupt, Scott Stecker
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Patent number: 8410392Abstract: The invention relates to a machining device (10) comprising at least one machining head (16) designed to provide at least one high-energy machining beam (22), especially an electron or laser beam. Such a machining device is used to remove material from workpieces (28) or for connecting workpieces (28) by bonding, especially by means of welding. According to the invention, at least one scanning device (32) designed as an optical coherence tomograph and provided for surface scanning is associated with the machining head (16). The invention also relates to a method for machining material using a high-energy machining beam for scanning surface areas of a workpiece which is machined, not yet machined, or being machined, by means of an optical coherence tomograph.Type: GrantFiled: March 4, 2008Date of Patent: April 2, 2013Assignee: Precitec Optronik GmbHInventors: Markus Kogel-Hollacher, Christoph Dietz
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Patent number: 8319149Abstract: The time between illumination of adjacent zones of a workpiece edge is extended by a long cool-down period or delay, by interlacing a radiation beam scanning pattern. During the cool-down period, the beam successively scans (along the fast axis) two rows separated by about half the wafer diameter, and travels back and then forth (along the slow axis) across the distance between the two rows, while the radiation beam source continuously generates the beam.Type: GrantFiled: September 29, 2008Date of Patent: November 27, 2012Assignee: Applied Materials, Inc.Inventors: Kai Ma, Abhilash J. Mayur, Vijay Parihar
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Patent number: 8178858Abstract: The invention relates to a device and a method for altering the characteristics of a three-dimensional article by means of electrons, including at least one electron accelerator for generating accelerated electrons and two electron exit windows, wherein the two electron exit windows are arranged opposite one another, wherein the two electron exit windows and at least one reflector delimit a process chamber in which the surface or surface layer of the article are bombarded with electrons, wherein an energy density distribution inside the process chamber can be detected at least over one spatial dimension by means of a sensor system.Type: GrantFiled: March 20, 2007Date of Patent: May 15, 2012Assignee: Fraunhofer-Gesellschaft zur Foerderung der Andgewandten Forschung E.V.Inventors: Rainer Bartel, Volker Kirchhoff, Goesta Mattausch, Olaf Roeder, Joerg Kubusch
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Patent number: 6436466Abstract: A method is disclosed for the operation of a high-power electron beam for the vaporization of materials in a target. With this method, static and dynamic deflection errors are corrected. First, the static and dynamic deflection errors are ascertained by means of a teach-in process for concrete spatial coordinates and concrete frequencies of the deflection currents and stored in a memory. For the later operation, this stored data is used in such a way that input geometric data for the incidence points of the electron beam is automatically recalculated into corrected current values which bring about the exact incidence onto the input points. A corresponding procedure takes place with the input of frequencies for the deflection current. The input frequencies are automatically corrected in terms of frequency and amplitude in order to eliminate the frequency-dependent attenuation effects.Type: GrantFiled: January 2, 2001Date of Patent: August 20, 2002Assignee: Unaxis Deutschland Holding GmbHInventors: Martin Bähr, Erik Laux
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Patent number: 6214408Abstract: A method is disclosed for the operation of a high-power electron beam for the vaporization of materials in a target. With this method, static and dynamic deflection errors are corrected. First, the static and dynamic deflection errors are ascertained by means of a teach-in process for concrete spatial coordinates and concrete frequencies of the deflection currents and stored in a memory. For the later operation, this stored data is used in such a way that input geometric data for the incidence points of the electron beam is automatically recalculated into corrected current values which bring about the exact incidence onto the input points. A corresponding procedure takes place with the input of frequencies for the deflection current. The input frequencies are automatically corrected in terms of frequency and amplitude in order to eliminate the frequency-dependent attenuation effects.Type: GrantFiled: October 16, 1998Date of Patent: April 10, 2001Assignee: Balzers und Leybold Deutschland Holding AGInventors: Martin Bähr, Erik Laux