Abstract: An electro-optic probe is provided which is able to prevent unnecessary reflected light from optical components in the electro-optic probe from entering photodiodes. The optical components which constitutes an isolator 13 are disposed inclining from an optical path of a parallel light emitted from a collimating lens 8, such that the unnecessary reflected light beams from these optical component surfaces are not incident to the photodiodes 10 and 11. The inclination angle of these optical components are set within a range from an angle formed by an optical path from said optical component to a light receiving element in said photodiode, and the diameter of said light receiving element to an angle allowable for the optical component to maintain the transmittance thereof.

Abstract: An electro-optic sampling probe for preventing noise from being transmitted to photodiodes and improving the measurement accuracy is disclosed. In the probe, the optical system module comprises wavelength plates and polarized beam splitters arranged along an optical path of the relevant laser beam, and photodiodes facing the polarized beam splitters, wherein each photodiode is fixed via an insulating material to the main frame of the optical system module.

Abstract: The present invention consists of a method and apparatus for measuring first and higher order PMD vectors in optical fibers. For each first-order PMD vector determination, two distinct polarization states are sequentially injected into an optical device under test for each of a pair of frequencies &ohgr; and &ohgr;+&Dgr;&ohgr;f. A Stokes vector s1 representing the first polarization state must not be parallel or anti-parallel to a Stokes vector sa representing the second polarization state, but the relative angle between s1 and sa need not be known. The frequency interval &Dgr;&ohgr;f is large to obtain a high signal-to-noise ratio. Thus, four light beams are injected, the first at frequency &ohgr; and polarization s1, the second at frequency &ohgr; and polarization sa, the third at frequency &ohgr;+&Dgr;&ohgr;f and polarization s1, and the fourth light at frequency &ohgr;+&Dgr;&ohgr;f and polarization sa.

Abstract: A beam of light from a light source is irradiated toward a surface of a transparent plate at an angle of incidence ranging from 86 to 89 degrees or at an angle of incidence ranging from 60 to 89 degrees after being polarized as a P-polarized light beam or S-polarized light beam by a polarizing element disposed between the light source and the transparent plate. This enables a reflected image from a front surface of the transparent plate to be projected on a screen without being influenced by reflection from a rear surface of the transparent plate. By visually inspecting the reflected image on the screen, or by picking up the reflected image by a camera and visually inspecting a picture on a monitor display, or by picking up the reflected image by a camera to obtain density signals representative of the reflected image and calculating the irregularities of the surface of the transparent plate on the basis of the density signals by an image processor.

Abstract: A surface inspection device irradiates a laser beam onto the surface of a sample, scans the surface two-dimensionally, and detects the intensities of the s-polarized light component and p-polarized light component of the reflected laser beam. RR (reflectance ratio), which is the ratio of the reflective intensities of the s- and p-polarized light components, is calculated for each position of the surface of the sample, and the two-dimensional distribution of RR on the surface of the sample is detected. The distribution width of this measured RR is compared with the natural width for a clean sample, and the. surface of the sample is determined to be contaminated when, as the result of comparison, the RR distribution width diverges from the natural width. The absence or presence of contamination on the microscopically rough surface of a sample can therefore be quickly and easily determined based on the RR of the reflective intensities of the s- and p-polarized light components.

Abstract: A detection apparatus includes a differential interference microscope having a light source, an illumination optical system for splitting light from the light source into two polarized components, which are introduced onto an observation object and an imaging optical system for forming an image of the observation object; a device for changing the amount of retardation between the two polarized components; a device for photographing the image of the observation object; and a device for performing a calculation on the image captured by this photographing device. In the detection apparatus, amounts of retardation between the two polarized components are detected to form two differential interference images relative to the observation object in which the amounts of retardation between the polarized components are equal, but signs are different. Image information is extracted from these two differential interference images and thereby the profile of the observation object can be detected.

Abstract: The present invention discloses a multiple-beam holographic optical pick-up head, which has the advantages of the multiple-beam optical pick-up head and the holographic optical pick-up head and can increase the light usage efficiency. This invention uses the property that a polarized diffractive optical element can generate different optical effects for laser beam with different polarizations and places a polarized multiple-beam grating and polarized hologram on the optical path for splitting the incident light toward the disc into multiple reading beams by the multiple-beam grating. The returning laser beams reflected from the disc are diffracted and diverted by the hologram to reach a photodetector. Both the incident and reflective beams are diffracted once only; thus the light usage efficiency can be increased.

Abstract: A surface inspection device irradiates a laser beam onto the surface of a sample, scans the surface two-dimensionally, and detects the intensities of the s-polarized light component and p-polarized light component of the reflected laser beam. RR (reflectance ratio), which is the ratio of the reflective intensities of the s- and p-polarized light components, is calculated for each position of the surface of the sample, and the two-dimensional distribution of RR on the surface of the sample is detected. The distribution width of this measured RR is compared with the natural width for a clean sample, and the surface of the sample is determined to be contaminated when, as the result of comparison, the RR distribution width diverges from the natural width. The absence or presence of contamination on the microscopically rough surface of a sample can therefore be quickly and easily determined based on the RR of the reflective intensities of the s- and p-polarized light components.

Abstract: A system for automatically inspecting matter for varying composition includes one or more detection stations through which one or more streams of matter are advanced and particular materials therein are detected through their diffusely reflected IR spectra, if any, and/or through their variation of an electromagnetic field by their metallic portions, if any. A row of light sources distributed across the overall width of one or more belt conveyors may cause desired portions of the stream to reflect light diffusely onto a part-toroidal mirror extending over that overall width, whence the light is reflected, by a rotating, polygonal mirror through optical filters dedicated to differing IR wavelengths, onto detectors the data output of which is utilized in controlling solenoid valves operating air jet nozzles which separate-out the desired portions.

Abstract: A high voltage measuring device is disclosed for measuring the voltage between two spaced-apart points using a poled optical fiber that is extended between the points and subjected to an electric field associated with the voltage. A control unit of the device has a light source, which transmits light into the fiber. The device also has a detecting unit for receiving light transmitted through the fiber and for generating a signal (Sout) corresponding to a change in refractive index of the fiber caused by the electric field.

Abstract: A linearly polarized light is condensed by a lens 4 and set incident on a liquid crystal sample 5 with the incident angle being distributed continuously. The incident angle dependence of the polarization of the transmitted light is measured by a method of rotating an analyzer and the like, and thereby a pretilt angle of the liquid crystal sample is determined.

Abstract: Methods and apparatus for detecting objects are disclosed. In one embodiment of the invention, a person entering a secured or “Safe Zone™” is illuminated with low-power polarized radio waves. Differently polarized waves which are reflected back from the person are collected and measured. Persons carrying a concealed weapon such as a handgun are detected by calculating the difference of a pair of differences between levels of different polarized reflected energy. Alternative embodiments of the invention may be used to detect a wide variety of objects other than concealed firearms. The invention may be used for inventory control or to thwart shoplifting.

Abstract: The integrating cavity effect is reduced by using a polarizing filter. The polarizing filter reduces the secondary illumination onto a document being scanned. The filter is placed at the opening to the cavity of the scanner. The sum effects of using a polarizing filter reduces the integrating cavity effect by a factor of 2.

Abstract: A photodetector device comprising a photosensitive detector (12; 96) and one or more interfaces (20′, 20″, 28, 98) between dissimilar media is configured so that a light beam (LB) for detection will pass through the interface(s) along a beam axis that is not normal to the interface(s). The deviation (&thgr;) from the normal will be such that polarization dependent transmission introduced at the interface(s) will compensate for inherent polarization dependency of the detector (12; 96). The deviation may be achieved by inclining the interface(s) relative to a predetermined direction along which the light beam will be incident. Where the photosensitive detector is in a housing (84) with a window (20) through which the light beam enters the housing, the housing can be tilted. In such as case, there are three interfaces, one (28; 98) at the surface of the detector (12; 96), and one at each surface (20′, 20″) of the window (20).

Abstract: A method of processing documents of value.

Abstract: A polarization-type laser detection system is provided, which is capable of distinguishing between a reflected light signal from a target object and a back-scattered light signal from a mass of suspended particles in the air. This allows the laser detection system to be reliably operable under bad weather conditions when the air is filled with suspended particles. The laser detection system includes a laser means for producing a linearly-polarized laser beam which is the directed to a specified direction for target detection. When echoed back, the echoed signal is first polarized by an analyzer lens into a direction that is perpendicular to the direction in which the emitted laser beam is polarized. Further, a Fresnel lens is used for focusing the emerging light from the analyzer lens into a focal point where an optical detection module is mounted.

Abstract: Improvements in accuracy and sensitivity in mechanical-optical metrology apparatus are achieved through the use of a value for angle of incidence that is an average of positive and negative values for different arrangements of the metrology apparatus. In the ellipsometry type of metrology the average value for angle of incidence is established by using one of a reversal of light beam direction, the providing of a separate light beam mounting arm and the mechanical rotation of the sample.

Abstract: A method and apparatus for optical wavelength routing separates even and odd optical channels from an input WDM signal. The input beam is first converted to at least one pair of orthogonally-polarized beams. A split-mirror resonator has a front mirror with two regions having different reflectivities, and a reflective back mirror spaced a predetermined distance behind the front mirror. Each of the orthogonally-polarized beams is incident on a corresponding region of the front mirror of the split-mirror resonator. A portion of each beam is reflected by the front mirror, which the remainder of each beam enters the resonator cavity where it is reflected by the back mirror back through the front mirror. The group delay of each reflected beam is strongly dependent on wavelength. The two reflected beams from the resonator are combined and interfere in a birefringent element (e.g., a beam displacer or waveplates) to produce a beam having mixed polarization as a function of wavelength.

Abstract: The present invention provides microfluidic devices and systems that utilize optical detection systems, and where one or more light altering optical elements are integrated into the body structure of the microfluidic device. The resulting devices perform at least a portion of the optical manipulations used in the optical detection method employed.

Abstract: A surface inspection apparatus is provided which uses at least two sets of surface inspection systems each comprising with a paired surface illumination device (A1, B1) and detection device (A2, B2), with each set of illumination devices and detection devices creating their own irradiation regions (51A, 51B) and detection regions (23A,23B), in which the irradiation and detection regions of one pair of illumination and detection devices does not over lap the illumination and detection regions of the adjacent pair of illumination and detection devices. The surface illumination devices preferably project light at an angle of 80° or more with respect to a normal to the surface being inspected (21). The detection devices detect light scattered by dust or defects on the surface to be inspected. The surface to be inspected can be moved in a direction perpendicular to the direction of the illumination and detection regions on the surface being inspected. Thus, the entire surface can be inspected.

Abstract: An optical measurement system for evaluating the surface of a substrate or the thickness and optical characteristics of a thin film layer overlying the substrate includes a light source for generating a light beam, a static polarizing element for polarizing the light beam emanating from the light source, and a measurement system for measuring the light reflected from the substrate location. The measurement system includes a static beam splitting element for splitting the light reflected from the substrate into s-polarized light and p-polarized light. The measurement system further includes two optical sensors for separately measuring the amplitude of the s-polarized light and the intensity of the p-polarized light. A control system analyzes the measured amplitude of the s-polarized light and the p-polarized to determine changes in the topography of substrate or changes in the thickness or optical characteristics of the thin film layer.

Abstract: A sampling device that samples a first signal by modulating a second signal using the first signal, comprising: a holding circuit that holds a value of the first signal; a modulator that modulates the second signal using a difference between the value held by the holding circuit and a present value of the first signal to produce a third signal indicating the difference; and an adder that adds the difference indicated by the third signal to the value held by the holding circuit. Preferably, the first signal is an electric signal, the second signal is an optical signal, and the modulator modulates the optical signal by applying to the optical signal an electric field formed by the electric signal.

Abstract: The present invention concerns an apparatus for combining light from at least two laser light sources, preferably in the context of confocal scanning microscopy, and in order to make laser light sources of low output power usable as light sources, in particular for confocal scanning microscopy, is characterized in that the light from the laser light sources has at least approximately the same wavelength; and that at least one beam combining unit that combines the light beams in at least largely lossless fashion is provided.

Abstract: An optical assaying method and system having a movable sensor is described. In one aspect, the present invention is a sensing system having a rotating sensor disk coated with indicator dyes sensitized to a variety of substances. In this configuration the sensing system further includes a detector for sensing spectral changes in light received from one or more of the indicator dyes. In another aspect, the present invention is a sensing system having a surface plasmon resonance sensor disk having grooves extending radially from a center of the disk. In yet another aspect, the present invention is a sensing system including a diffraction anomaly sensor disk having a dielectric layer that varies in thickness. The present invention allows for construction of an inexpensive sensing system that is capable of easily detecting a variety of substances either in a sample or a surrounding environment.

Abstract: An optical measurement system is disclosed for evaluating samples with multi-layer thin film stacks. The optical measurement system includes a reference ellipsometer and one or more non-contact optical measurement devices. The reference ellipsometer is used to calibrate the other optical measurement devices. Once calibration is completed, the system can be used to analyze multi-layer thin film stacks. In particular, the reference ellipsometer provides a measurement which can be used to determine the total optical thickness of the stack. Using that information coupled with the measurements made by the other optical measurement devices, more accurate information about individual layers can be obtained.

Abstract: Disclosed is a source of polychromatic electromagnetic radiation which, utilizing a beam combiner system, combines beams of polychromatic electromagnetic radiation from a plurality of sources to provide a relatively broad and flattened intensity characteristic vs. wavelength output spectrum, and its application in material system investigation systems, such as ellipsometers, spectrophotometers and polarimeters which comprise a polychromatic source of electromagnetic radiation.

Abstract: Disclosed is a system for testing liquid crystal and end seal of liquid crystal displays. In the present invention, a test unit P for liquid crystal distribution is disposed at a side of a loading unit L. The test unit P for liquid crystal distribution is disposed orthogonal to a test unit G for end seal. Unloading units Ug, Ur, Uj of good, repair, reject are disposed in parallel by a selected distance. A robot unit R one by one to the respective testing units, is disposed between the loading and unloading units L,U. An operating panel S is installed between the test units P,G according to the test result and a monitor M displaying the liquid crystal injecting hole is installed at the operating panel S. Furthermore, the investigator may conduct two tests for liquid crystal and for end seal simultaneously at one position in front of the operating panel S.

Abstract: Metrology for ultrathin dielectric layers of the order of less than 10 nanometers in thickness is achieved by specular ellipsometry in a totally controlled ambient between the light source and the detector, in which, a precise 2.75 through 9.0 eV photon energy range continuum of light is employed. In the signal analysis there is the taking into consideration the effect of noise in the development of the ellipsometric parameter values and in the resulting data. In the invention the precise photon energy range operates to sharpen the identifiability of the change parameters imparted into the reflected light in the ellipsometry while minimizing absorption and signal definiteness masking; and the taking into consideration of noise in the signal analysis involves providing a simulated noise spectrum for comparison with the least squares fitting algorithm-derived parameters to determine the quality of the minimum and the reliability of the inferred parameters.

Abstract: In an optical pickup, a beam splitter is arranged on an optical path between a hologram and a grating. Beam splitter includes a first reflecting surface reflecting part of a beam reflected from a disk, and a second reflecting surface arranged parallel to the first reflecting surface. Part of the beam which is reflected from the disk and passed through hologram is reflected at the first reflecting surface and thereafter reflected by the second reflecting surface of beam splitter, and thereafter directed to optical waveguide device, whereby a signal recorded on the disk is detected (reproduced). The beam which has transmitted through hologram and the first reflecting surface is directed to photodiode and detected as a servo error signal.

Abstract: The invention provides for assessing location and/or proximity to a buried or submerged optical fiber cable. A seismic generator creates seismic pulses, at known frequencies, on the ground (or water) at a first location and the synchronous rotation of the polarization state of light transmitted through the optical fiber cable is detected. Other seismic pulses are generated at different locations and the polarization rotation is detected at each such location to locate a closest proximity to the cable, corresponding to a minimum or maximum of polarization rotation. A wireless synchronous signal is generated with the seismic pulses to differentially isolate the polarization rotation signal; and, if desired, to further determine distance between the cable and the source of the seismic pulse.

Abstract: A method and apparatus for detecting position deviation of an electron gun in which, by increasing the light utilization efficiency to render the field of sight lighter and by reducing the amount of reflected light from the grid surface, the reflected light from the electron beam emitting surface is lighter to enable an edge of an electron beam transmitting hole to be discerned accurately to detect the position deviation of the electron gun accurately. The linear polarized light is illuminated on the electron gun and the light reflected by this electron gun is observed by a light polarization unit to detect the position deviation between grids of the electron gun.

Abstract: A polarization detection device includes a photocoupler; an optical waveguide layer for propagating light from the photocoupler therethrough; a polarization splitter for splitting the propagation light into two components having different refractive angles; and a photodetector formed of a semiconductor material for performing photoelectric conversion on the propagation light split into the two components. The photocoupler, the optical waveguide layer, the polarization splitter, and the photodetector are provided on a single semiconductor substrate. The photocoupler is one of a prism and a beam splitter formed of a dielectric material and supported by the optical waveguide layer only by an adhesive layer, the adhesive layer having a straight edge in the vicinity of the photocoupler.

Abstract: The present invention is devices and methods for indicating, to a wearer of a shoe, a loss of shock absorption in the shoe so that the wearer can know that it is time to obtain new shoes and thereby avoid injury. The devices and methods of the present invention indicate a loss of shock absorption as follows. First, one or more sensors in the sole of the shoe detect the amount of force that is applied to the sensors while a wearer's body weight is pressing down on the shoe. Then, when a sufficient amount of force is detected by the sensors in the sole of the shoe, the sensors provide a warning to the wearer of the shoe that the shoe has lost its shock-absorbing capability.

Abstract: An optical two-dimensional position sensor including a selective optical unit which faces, and is displaceable relative to, an integrated device. The selective optical unit is formed by a polarized light source and a filter with four quadrants which permits passage of light through two quadrants only. The selective optical unit is attached to a control lever such as to translate in a plane along a first direction and a second direction, and to pivot around an axis which is orthogonal to the preceding directions. In a transparent package, the integrated device comprises a first group of sensor elements which are spaced along the first direction, a second group of sensor elements which are spaced along the second direction and a third group of sensor elements which detect an angular position of the selective optical unit.

Abstract: In mutually opposite directions, two light signals traverse an optical series circuit including a first multi-mode fiber, a first polarizer, a Faraday sensor device, a second polarizer and a second multi-mode fiber. An intensity-normalized measuring signal is derived with the aid of direct signal components from light intensities of the two light signals after traversal of the series circuit.

Abstract: An apparatus and method for simultaneously taking measurements that are used for determining PMD vectors. This reduces the time interval over which all measurements are taken and reduces inaccuracy caused by PMD variation during the time measurement interval. The apparatus and method may be used in conjunction with any technique for calculating PMD, such as the Poincare Sphere Technique or Jones Matrix Eigenanalysis. The apparatus simultaneously produces multiple light beams. To distinguish each light beam from the others, each beam is given a distinct modulation. All the beams are then combined and passed through the optical device under test. A polarization measuring device then measures the output polarization of the combined beam and outputs one or more composite electrical signals that describe the Stokes components of the output polarization of the combined beam and that have the same modulations present in the original combined beam.

Abstract: Sensor for measuring the electrical current strength and/or voltage. Magneto-optical sensor (1) for measuring the current strength (I), with the aid of the temperature-dependent Verdet constant (V), of a fiber coil (3) arranged in the electromagnetic field (F) produced by the electrical current (i), whereby the temperature-dependent decay time (.DELTA.t) of the fluorescence of a fluorescing material (6) arranged in the vicinity of the coil is measured, the temperature (T) associated therewith of the coil is determined, and the value (V.sub.eff) belonging to this temperature, of the Verdet constant (V) is determined, with which the current strength is to be determined. Application in current and voltage sensors.

Abstract: An optical measurement system for evaluating the surface of a substrate or the thickness and optical characteristics of a thin film layer overlying the substrate includes an intensity stabilized light source configured to generate a stabilized light beam, a polarizing element for polarizing the light beam emanating from the light source, and a detection system for measuring the light reflected from the substrate The measurement system includes a polarizing beam-splitter for splitting the light reflected from the substrate into s-polarized light and p-polarized light. The measurement system further includes two optical sensors for separately measuring the amplitude of the s-polarized light and the intensity of the p-polarized light and a third detector for measuring either the phase difference between the s-polarized light and the p-polarized light or the reflection angle of the light reflected from the substrate.

Abstract: An ellipsometer, and a method of ellipsometry, for analyzing a sample using a broad range of wavelengths, includes a light source for generating a beam of polychromatic light having a range of wavelengths of light for interacting with the sample. A polarizer polarizes the light beam before the light beam interacts with the sample. A rotating compensator induces phase retardations of a polarization state of the light beam wherein the range of wavelengths and the compensator are selected such that at least a first phase retardation value is induced that is within a primary range of effective retardations of substantially 135.degree. to 225.degree., and at least a second phase retardation value is induced that is outside of the primary range. An analyzer interacts with the light beam after the light beam interacts with the sample. A detector measures the intensity of light after interacting with the analyzer as a function of compensator angle and of wavelength, preferably at all wavelengths simultaneously.

Abstract: Measurement light, which has been emitted from a Xe light source (20) and then linearly polarized by a polarizer (21), is made to be incident at a tilt angle on a region in a silicon substrate (11) with crystallinity disordered by the implantation of dopant ions. And the spectra of cos.DELTA. and tan .psi. are measured with a variation of the measurement light, where .DELTA. is a phase difference between respective components in p and s directions as to the light reflected as an elliptically-polarized ray, and .psi. is a ratio between the amplitudes of these components. By correlating in advance the spectral patterns of cos.DELTA. and so on with the thickness of an amorphous region through a destructive test or the like, or by paying special attention to characteristic parts of the patterns of cos.DELTA. and so on, the thickness or the degree of disordered crystallinity of the amorphous region is estimated.

Abstract: A light intensity control apparatus includes an optical beam splitter which splits light into monitor light and principal light; a polarization beam splitter which splits the monitor light into two polarized light components; a monitor light detector which detects the polarized light components; a polarization correction device which corrects the output of the monitor light detector so that the intensity of the output signal of the monitor light detector and the light intensity of the principal light on an object surface have a predetermined correlation, regardless of the polarization state of the light incident upon the optical beam splitter; and a humidity dependency correction device which corrects the output of the monitor light detector via the polarization correction device by detecting a variation in polarization dependency characteristics of the optical beam splitter, caused by a change in humidity, and feeding the variation back to the polarization correction device, so that the output signal intensi

Abstract: An apparatus and method for high throughput surface plasmon resonance (SPR) sensor subarray comprising two or more SPR sensor subarrays (10) having a target layer on an SPR layer (22), wherein the SPR sensor subarrays (10) are exposed to a solution until a baseline measurement is attained, is disclosed. Once the SPR sensor subarrays (10) have attained baseline, the SPR sensor subarrays (10) are used to determine the interaction properties between said SPR sensor subarray and a test entity.

Abstract: An optical system that folds a light path multiple times with all the folded paths being coplanar. The light is first polarized. Then, the polarized light is reflected multiple times through a quarter-wave plate, finally being phase shifted to the proper polarization state to enable transmission out of the system. One optical element transmits light that is at one planar polarity and reflects light at the orthogonal planar polarity. Another optical element transmits light that is at one circular polarity and reflects light at the orthogonal circular polarity.

Abstract: An apparatus and method to determine the surface orientation of objects in a field of view is provided by utilizing an array of polarizers and a means for microscanning an image of the objects over the polarizer array. In the preferred embodiment, a sequence of three image frames is captured using a focal plane array of photodetectors. Between frames the image is displaced by a distance equal to a polarizer array element. By combining the signals recorded in the three image frames, the intensity, percent of linear polarization, and angle of the polarization plane can be determined for radiation from each point on the object. The intensity can be used to determine the temperature at a corresponding point on the object. The percent of linear polarization and angle of the polarization plane can be used to determine the surface orientation at a corresponding point on the object. Surface orientation data from different points on the object can be combined to determine the object's shape and pose.

Abstract: A method of magneto-optically modulating light comprises the steps of linearly polarizing the light on its transmission path, and placing a magneto-optic effect element on the transmission path of the polarized light with the spontaneous magnetization direction of the magneto-optic effect element being substantially parallel with the transmission path. The plane of polarization of the polarized light is rotated about the transmission path in the absence of the magnetic field applied to the magneto-optic effect element having the polarized light pass therethrough. The method further comprises the step of applying the magnetic field to the magneto-optic effect element with its internal magnetization being oriented in a direction perpendicular to the transmission path. The plane of polarization of the polarized light is maintained in its initial state in the presence of the magnetic field applied to the magneto-optic effect element having the polarized light pass therethrough.

Abstract: Infrared and visible light energies are directed through a container onto a CCD camera that is responsive to both the visible and infrared light energy. Crossed polarizers are positioned on opposed sides of the container, and operate on the visible light energy in such a way as to block transmission of visible light to the camera in the absence of stress variations in the container, which alter polarization of the visible light energy traveling through the container. On the other hand, the polarizers have little or no effect on the infrared light energy, which creates a normally gray intensity of background light at the camera. In this way, incidence of visible light on the camera due to stress variations in the container appears as a bright signal against a normally gray background, while blockage of infrared light due to opaque variations in the container appears as a dark signal against the normally gray background.

Abstract: A system for automatically inspecting matter for varying composition comprises one or more detection stations through which one or more streams of matter are advanced and particular materials therein are detected through their diffusely reflected IR spectra, if any, and/or through their variation of an electromagnetic field by their metallic portions, if any. A row of light sources distributed across the overall width of one or more belt conveyors may cause desired portions of the stream to reflect light diffusely onto a part-toroidal mirror extending over that overall width, whence the light is reflected, by a rotating, polygonal mirror through optical filters dedicated to differing IR wavelengths, onto detectors the data output of which is utilized in controlling solenoid valves operating air jet nozzles which separate-out the desired portions.

Abstract: A method and apparatus are disclosed for controlling the quantum state probability distribution of one quantum object of a pair of correlated quantum objects, which include providing a pair of correlated quantum objects, each of said objects having a uniform quantum state probability distribution, providing a system for controlling the quantum state probability distribution of the one quantum object by using said controlling system to choose the probability distribution of the observable quantum states of the other quantum object of the pair of correlated quantum objects, using said controlling system to choose the probability distribution of the quantum states of the other quantum particle, choosing whether to observe the quantum state of the other quantum object, and subsequently observing the quantum state of the one quantum object of said pair of correlated quantum objects to determine if said prepared quantum state probability distribution of said one quantum object has been altered by an observation of

Abstract: An optical fiber probe which has a minute opening on the top of a sharpened tip is allowed to get close to a sample, and the probe is moved by a piezo actuator along x- and y-axis directions so that a minute spot beam emanating from the minute opening can scan over the sample. For circular polarization modulation to be incorporated in the process, a beam, before it is incident on the optical fiber probe, is given an optical delay changing at a frequency of p (Hz) by means of a piezo-optical modulator. A minute spot beam emanating from the minute opening passes through the sample to be received after the passage through an analyzer by a light receiving element. The output from the light receiving element is fed to a lock-in amplifier, p- and 2p-components are separated through lock-in rectification, and they are rendered images by a controller.

Abstract: A method and apparatus for optically assaying a targeted substance in a sample using a diffraction anomaly grating sensor. The optical sensor has a diffraction grating coated with at least one dielectric layer such that the sensor is sensitized to interact with the targeted substance. Upon interaction, light incident upon the sensor at a particular angle propagates through the dielectric, thereby exhibiting a dip in zero-order reflectance. Advantages of the present invention include facilitating increased sensitivity while protecting the metal grating from tarnishing and degradation. The present invention also allows for the construction of sensors that are sensitized to a plurality of substances, thus eliminating the need for an operator to reconfigure the sensing system in order to assay different substances.