With Means To Inspect Passive Solid Objects Patents (Class 250/358.1)
  • Publication number: 20010036243
    Abstract: Described are a process and an apparatus for the remote measurement of uranium or plutonium in radioactive materials, in which the sample of the material to be analyzed is to be handled as little as possible. To attain that object it is proposed that the laser beam of a laser is focused by means of a focusing unit onto the sample to be analyzed, so that a light-emitting plasma is generated, an image of the emission spectrum of the plasma is formed in a spectrograph by means of an imaging unit, and finally it is analyzed by means of an analyzing unit.
    Type: Application
    Filed: May 21, 2001
    Publication date: November 1, 2001
    Inventors: Kay Niemax, Lars Hiddemann, Lothar Koch, Jean-Francois Babelot
  • Patent number: 6305224
    Abstract: A method for determining warp potential of wood. One embodiment comprises nondestructively obtaining lengthwise shrinkage rates and grain angles of wood—such as trees, logs, or lumber—then determining warp potential of the wood based on the lengthwise shrinkage rates and grain angles. The method typically comprises measuring plural lengthwise shrinkage rates and plural grain angles to determine warp potential. Where the wood comprises lumber, lengthwise shrinkage rate and grain angle measurements typically are made on at least one major planar surface of the lumber at at least two measuring points separated by a predetermined distance, such as at substantially one-foot intervals along the lumber. Particular embodiments of the present invention determine lengthwise shrinkage rates using electromagnetic energy, acoustic energy, and combinations thereof. Working embodiments of the method use ultrasound energy to determine lengthwise shrinkage rates and grain angles.
    Type: Grant
    Filed: September 2, 1999
    Date of Patent: October 23, 2001
    Assignee: Weyerhaeuser Company
    Inventors: Mark A. Stanish, Stan L. Floyd, Steven M. Cramer
  • Patent number: 6300634
    Abstract: An apparatus and method for the in-situ measurement of the condition of degradable components such as electrical cable insulation, valve internals, and gaskets. A stream of energetic subatomic particles is directed to the component under test, thereby inducing the emission of secondary gamma radiation which is detected by one or more radiation detectors positioned in proximity to the component. The secondary radiation emission spectrum is recorded and analyzed to identify features and/or changes resulting from the application of one or more stressors to the component. In the specific case of aging, the radiation spectra taken from the same component at different intervals during its lifetime are compared to identify changes in the component which then may be correlated with artificially (or naturally) aged specimens to estimate the relative level of aging of the component.
    Type: Grant
    Filed: August 31, 2000
    Date of Patent: October 9, 2001
    Inventor: Robert F. Gazdzinski
  • Patent number: 6293152
    Abstract: A method for determining twist potential of wood is described. One embodiment of the method comprises nondestructively obtaining a grain angle of wood, such as trees or lumber, and then determining twist potential of the wood based on the grain angle. Where the wood comprises lumber, grain angle determinations typically are made on at least one major surface of the lumber. The method typically comprises determining grain angle at at least two measuring locations separated by a predetermined distance, such as at substantially one-foot intervals along the board. The method also can further comprise obtaining at least one fiber dive angle. Particular embodiments of the present invention determine grain angle using infrared radiation, microwave radiation, light energy (such as by using a laser), electricity, ultrasound energy, and combinations thereof. Working embodiments of the method used light energy and ultrasound energy to determine grain angle.
    Type: Grant
    Filed: September 2, 1999
    Date of Patent: September 25, 2001
    Assignee: Weyerhaeuser Company
    Inventors: Mark A. Stanish, Stan L. Floyd, Steven M. Cramer
  • Publication number: 20010020682
    Abstract: A system and method of density detection in a target object involve irradiating the target object, detecting a first and second discrete number of photons penetrating the target object through respective first and second prescribed volumes and entering respective first and second radiation detectors. First and second numbers of photons detected by the first and second radiation detectors are counted, and a display output signal is generated in response to the first and second numbers. A graphical representation of the densities within the first and second volumes of the target object is displayed.
    Type: Application
    Filed: April 12, 2001
    Publication date: September 13, 2001
    Inventors: Victor V. Verbinski, Scott T. Smith, Kenneth H. Valentine, Victor J. Orphan
  • Patent number: 6285199
    Abstract: A device and method for optimally detecting the surface conditions of different types of wafers are disclosed. The device includes a light generating unit for impinging light on a wafer to generate a reflected light from the wafer, a combining unit including a plurality of filters having different light cut-off ratios for reducing the amount of the reflected light to generate a reduced amount of the reflected light depending on the reflection rate of the wafer, and a detection unit for processing the appropriately reduced amount of the reflected light to detect the surface condition of the wafer. A different filter or a different combination of the filters are selected depending on the reflection rate of the wafer being processed in order to appropriately reduce the amount of reflected light to be processed by the detection unit.
    Type: Grant
    Filed: January 14, 1999
    Date of Patent: September 4, 2001
    Assignee: Hyundai Electronics Industries Co., Ltd.
    Inventor: Tae-Kye Kim
  • Patent number: 6272368
    Abstract: A medical installation, having an apparatus for acquiring the position of at least one object located in a room, also has a light transmitter for emitting a light fan and a camera for acquiring at least one object. The signals of the camera are supplied to an evaluation unit that generates 3D data on the basis of these signals corresponding to the at least one object that are utilized for avoiding collisions of the object.
    Type: Grant
    Filed: October 1, 1998
    Date of Patent: August 7, 2001
    Assignee: Siemens Aktiengesellschaft
    Inventor: Mircea Alexandrescu
  • Patent number: 6255654
    Abstract: A system and method of density detection in a target object involve irradiating the target object, detecting a first and second discrete number of photons penetrating the target object through respective first and second prescribed volumes and entering respective first and second radiation detectors. First and second numbers of photons detected by the first and second radiation detectors are counted, and a display output signal is generated in response to the first and second numbers. A graphical representation of the densities within the first and second volumes of the target object is displayed.
    Type: Grant
    Filed: September 17, 1999
    Date of Patent: July 3, 2001
    Assignee: Science Applications International Corporation
    Inventors: Victor V. Verbinski, Scott T. Smith, Kenneth H. Valentine, Victor J. Orphan
  • Patent number: 6243601
    Abstract: Transillumination imaging instrumentation is improved by eliminating the detection of stray light beams, and facilitating the detection of light beams which pass straight through an illuminated object. Three dimensional images can be constructed using either curved emitter and detector arrays or by using emitter and detector elements that rotate about a common axis.
    Type: Grant
    Filed: September 18, 1998
    Date of Patent: June 5, 2001
    Inventor: Abund Ottokar Wist
  • Patent number: 6208886
    Abstract: An apparatus utilizing non-linear optical signals for use in constructing a three-dimensional tomographic map of an in vivo biological tissue for medical disease detection purposes. In one embodiment, said apparatus comprises a stage for supporting the in vivo biological tissue; a laser for illuminating the in vivo biological tissue with a focused beam of laser light, the light emerging from the in vivo biological tissue comprising fundamental light, harmonic wave light, and fluorescence due to multi-photon excitation; a filter for selectively passing only at least one of the harmonic wave light and the fluorescence; one or more detectors for individually detecting each of the harmonic wave light and the fluorescence selectively passed; and a mechanism for moving the laser relative to the stage in x, y and z directions.
    Type: Grant
    Filed: April 3, 1998
    Date of Patent: March 27, 2001
    Assignee: The Research Foundation of City College of New York
    Inventors: Robert R. Alfano, Yici Guo, Feng Liu, Ping Pei Ho
  • Patent number: 6205195
    Abstract: This invention provides coded aperture imaging apparatus and methods for the detection and imaging of radiation which results from nuclear interrogation of a target object. The apparatus includes: 1) a radiation detector for detecting at least a portion of the radiation emitted by the object in response to nuclear excitation and for producing detection signals responsive to the radiation; 2) a coded aperture disposed between the detector and the object such that emitted radiation is detected by the detector after passage through the coded aperture; and 3) a data processor for characterizing the object based upon the detection signals from the detector and upon the configuration of the coded aperture.
    Type: Grant
    Filed: February 26, 1999
    Date of Patent: March 20, 2001
    Assignee: Massachusetts Institute of Technology
    Inventor: Richard C. Lanza
  • Patent number: 6204507
    Abstract: A device for testing flat materials during production of material webs has a radiation source from which radiation passes through the material under investigation, residual radiation on another side of the material being detected by a gas-filled ionization detector. The detector arrangement has a plurality of interconnected measurement chambers provided with collector electrodes and arranged inside a common housing. The measurement chambers can together be evacuated and filled with an ionizable gas. Each of the measurement chambers is allocated its own radiation inlet window. The radiation source is allocated to the measurement chamber and has a linear radiation distribution.
    Type: Grant
    Filed: June 5, 1998
    Date of Patent: March 20, 2001
    Assignee: Vacutec Messtechnik GmbH
    Inventors: Christian Feige, Franz-Josef Urban, Steffen Hildebrandt
  • Patent number: 6195163
    Abstract: Disclosed is a process for analyzing the surface characteristics of opaque materials. The method comprises in one embodiment the use of a UV reflectometer to build a calibration matrix of data from a set of control samples and correlating a desired surface characteristic such as roughness or surface area to the set of reflectances of the control samples. The UV reflectometer is then used to measure the reflectances of a test sample of unknown surface characteristics. Reflectances are taken at a variety of angles of reflection for a variety of wavelengths, preferably between about 250 nanometers to about 400 nanometers. These reflectances are then compared against the reflectances of the calibration matrix in order to correlate the closest data in the calibration matrix. By so doing, a variety of information is thereby concluded, due to the broad spectrum of wavelengths and angles of reflection used.
    Type: Grant
    Filed: October 19, 1998
    Date of Patent: February 27, 2001
    Assignee: Micron Technology, Inc.
    Inventors: Randhir P. S. Thakur, Michael Nuttall, J. Brett Rolfson, Robert James Burke
  • Patent number: 6178218
    Abstract: A method is provided for performing nondestructive examination of a metal specimen using neutron activated positron annihilation wherein the positron emitter source is formed within the metal specimen. The method permits in situ nondestructive examination and has the advantage of being capable of performing bulk analysis to determine embrittlement, fatigue and dislocation within a metal specimen.
    Type: Grant
    Filed: May 19, 1999
    Date of Patent: January 23, 2001
    Assignee: Bechtel BWXT Idaho, LLC
    Inventors: Douglas W. Akers, Arthur B. Denison