Density/thickness/consistency Analysis Patents (Class 250/390.06)
  • Patent number: 9739728
    Abstract: Imaging and processing techniques are employed to identify crystalline defects obtained by ECCI from surrounding topography and is combined with defect counting and automatic classification.
    Type: Grant
    Filed: June 20, 2016
    Date of Patent: August 22, 2017
    Assignee: International Business Machines Corporation
    Inventors: Stephen W. Bedell, Renee T. Mo, Kunal Mukherjee, John A. Ott, Devendra K. Sadana, Brent A. Wacaser
  • Publication number: 20140175290
    Abstract: A detector probe for detecting ionising radiation includes at least one detector (14) mounted on a support (12), and an electrically operated source of heat (18) arranged on the support in proximity to the detector so that the temperature of the detector may be changed by operation of the heat source. The detector probe may be used in the manufacture of a level gauge or density profiler.
    Type: Application
    Filed: August 16, 2012
    Publication date: June 26, 2014
    Inventors: Robert Shaun Field, Geoffrey Stuart Howe, Simon Lambert
  • Publication number: 20140158897
    Abstract: The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material.
    Type: Application
    Filed: February 17, 2014
    Publication date: June 12, 2014
    Applicant: Troxler Electronic Laboratories, Inc.
    Inventors: Robert Ernest Troxler, Wewage Hiran Linus Dep
  • Patent number: 8692184
    Abstract: The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material.
    Type: Grant
    Filed: March 11, 2013
    Date of Patent: April 8, 2014
    Assignee: Troxler Laboratories, Inc.
    Inventors: Robert Ernest Troxler, Wewage Hiran Linus Dep
  • Publication number: 20130075600
    Abstract: Disclosed is an apparatus for detecting a neutron. The apparatus includes: a neutron interaction material configured to emit a charged particle upon absorbing a neutron; a plurality of nanoparticles distributed in the neutron interaction material, each nanoparticle in the plurality being configured to scintillate upon interacting with the charged particle to emit a pulse of light; a photodetector coupled to the neutron interaction material and configured to receive the pulse of light and generate a signal based on the received pulse of light; and a processor configured to receive the signal in order to detect the neutron.
    Type: Application
    Filed: September 23, 2011
    Publication date: March 28, 2013
    Applicant: BAKER HUGHES INCORPORATED
    Inventors: Anton Nikitin, Mikhail Korjik
  • Patent number: 8071937
    Abstract: The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. The nuclear density gauge includes a radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function is configured to calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge further includes an electromagnetic moisture property gauge configured to determine a moisture property of the material. The electromagnetic moisture property gauge includes an electromagnetic field generator configured to generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material.
    Type: Grant
    Filed: April 18, 2011
    Date of Patent: December 6, 2011
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventor: Robert Ernest Troxler
  • Patent number: 7928360
    Abstract: The subject matter described herein includes methods, systems, and computer program products for measuring the density of a sample construction material. According to one aspect, a nuclear density gauge is disclosed for measuring the density of a sample construction material. The material measurement gauge includes a radiation source positioned for emitting radiation into a sample construction material. A radiation detector is positioned apart from the radiation source and configured to detect radiation from the sample construction material and to produce a signal representing the detected radiation. A non-nuclear moisture property detector is configured to determine a moisture property of the sample construction material and to produce a signal representing the moisture property. A material property calculation function is configured to calculate a property value associated with the sample construction material based upon the signals representing the detected radiation and the moisture property.
    Type: Grant
    Filed: October 22, 2010
    Date of Patent: April 19, 2011
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventor: Robert Ernest Troxler
  • Patent number: 7902518
    Abstract: A non-invasive multi-step process that includes tomography is applied to determine features of a battery.
    Type: Grant
    Filed: May 12, 2009
    Date of Patent: March 8, 2011
    Assignee: The Gillette Company
    Inventors: Erin L. Ballard, Craig Buckland, Yang Cao, Javit A. Drake, Thomas Dufresne, Richard E. Durkot, Paul Graham, Joseph H. Nurre, Philip Trainer, Darren Trokhan, Jonathan Tse
  • Patent number: 7659520
    Abstract: A microwave or terahertz and neutron radiation type detector, which uses an orbitron as a radiation source. The detector may have a polarity switching apparatus to enable the orbitron to selectively change from between short wave to neutron emission functions. A highly compact and lightweight identifier of explosives and other chemicals, which may be so small and light as to be hand held, and which is effective at stand-off distances, is thereby provided.
    Type: Grant
    Filed: December 8, 2008
    Date of Patent: February 9, 2010
    Assignee: NextGen, Inc.
    Inventor: Esmaeil Farshi
  • Patent number: 7569810
    Abstract: Methods, systems, and computer program products for measuring the density of material. According to one aspect, a nuclear density gauge is disclosed for measuring the density of a sample construction material. The gauge includes a radiation source positioned in an interior of a sample construction material and adapted to emit radiation from the interior of the sample construction material. Further, a radiation detector is positioned apart from the radiation source. The radiation detector is operable to produce a signal representing an energy level of detected radiation. A material property calculation function is configured to calculate a value associated with the density of the sample construction material based upon the signal produced by the radiation detector. Further, the radiation source may be positioned on a surface of the sample construction material and adapted to emit radiation towards the surface of the sample construction material.
    Type: Grant
    Filed: August 30, 2006
    Date of Patent: August 4, 2009
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventors: Robert Ernest Troxler, Wewage Hiran Linus Dep
  • Patent number: 7550737
    Abstract: A non-invasive multi-step process that includes tomography is applied to determine features of a battery.
    Type: Grant
    Filed: May 16, 2008
    Date of Patent: June 23, 2009
    Assignee: The Gillette Company
    Inventors: Erin L. Ballard, Craig Buckland, Yang Cao, Javit A. Drake, Thomas Dufresne, Richard E. Durkot, Paul Graham, Joseph H. Nurre, Philip Trainer, Darren Trokhan, Jonathan Tse
  • Patent number: 7409313
    Abstract: An apparatus is provided for determining thickness and thermal conductivity for an insulative coating disposed on a substrate in an object. The apparatus includes a source for rapidly applying a multiple optical pulses on a surface of the object, where the surface comprises the insulative coating. The system further includes a recording system configured to collect data representative of the propagation of the optical pulses in the object. The apparatus further includes a processor coupled to the recording system and configured to receive the data from the recording system and configured to determine a thickness value and a thermal conductivity value for the insulative coating.
    Type: Grant
    Filed: December 16, 2005
    Date of Patent: August 5, 2008
    Assignee: General Electric Company
    Inventors: Harry Israel Ringermacher, Elena Rozier
  • Patent number: 6900900
    Abstract: A high-resolution and high-speed film thickness and thickness uniformity measurement method is disclosed in this invention. The disclosed method includes a step a) of measuring a film thickness at a single point on the top surface of the substrate using an interferometry with a measuring light beam having a range of wavelengths. The method further includes a step b) of selecting an optimal wavelength from the range of wavelengths applied for measuring the film thickness at the single point. The method further includes a step c) of measuring reflection intensities by scanning over a plurality of points with a measuring light beam of the optimal wavelength over the top surface of the substrate. The method further includes a step d) of calculating a film thickness at the plurality of points applying the optimal-wavelength reflection intensities at the plurality of points over the top surface of the substrate.
    Type: Grant
    Filed: November 16, 2001
    Date of Patent: May 31, 2005
    Assignee: Process Diagnostics, Inc.
    Inventors: James A. McMillen, Evan Grund
  • Publication number: 20040164250
    Abstract: A portable radiation detector using a high-purity germanium crystal as the sensing device. The crystal is fabricated such that it exhibits a length to width ratio greater than 1:1 and is oriented within the detector to receive radiation along the width of said crystal.
    Type: Application
    Filed: February 25, 2003
    Publication date: August 26, 2004
    Inventors: Christopher P. Cork, John A. Becker, Christen M. Frankle, Norman W. Madden
  • Patent number: 6577706
    Abstract: An apparatus for measuring the lateral yarn density distribution of a yarn uses selected X-ray radiation. Radiation absorption is determined in a number of narrow planes across the yarn and in two or more rotational orientations. The measuring takes place without any damage to or physical interference with the yarn.
    Type: Grant
    Filed: August 3, 2001
    Date of Patent: June 10, 2003
    Assignee: The Hong Kong Polytechnic University
    Inventors: Ka-fai Choi, Yuen-wah Wong
  • Patent number: 6314152
    Abstract: A technique for determining percent body fat using neutron inelastic scattering is disclosed. It relies on a correlation between a carbon-oxygen ratio in the body and the percent body fat with corrections made for a level of patient hydration in the lean tissue. The animal body is irradiated with neutrons having sufficient energy to inelastically scatter off carbon and oxygen. The resulting gamma rays are detected and counted, and the level of hydration is measured. The ratio of the detected gamma rays and hydration are then related to a proportion of fat in the animal body. This technique provides accuracy approaching that achieved with hydrodensitometry with only small radiation doses between 5 and 20 millirem, but without any requirements for immersion.
    Type: Grant
    Filed: September 16, 1997
    Date of Patent: November 6, 2001
    Assignee: Trustees of Tufts College
    Inventor: Joseph J. Kehayias