With Camera Patents (Class 250/559.08)
  • Patent number: 12117794
    Abstract: A method for processing a workpiece with a tool is provided with holding the workpiece, holding the tool, and moving the held tool relative to the held workpiece in accordance with an NC program including an arithmetic expression to calculate a position of the held tool.
    Type: Grant
    Filed: May 9, 2019
    Date of Patent: October 15, 2024
    Assignee: Shibaura Machine Co., Ltd.
    Inventor: Koji Tsuchiya
  • Patent number: 12099019
    Abstract: A device comprises a housing, a detector for receiving solar irradiance and for providing a detector signal providing an indication of an amount of solar irradiance received by the detector and a shield transparent to at least part of the solar irradiance to be detected, the shield and the housing providing a detector space for housing at least part of the detector. The device further comprises a first light source for emitting light to the shield and a first light sensor arranged to receive light from the first light source, arranged to provide a first signal providing an indication for an amount of light received by the first light sensor. Particles will and reflect light back to the detector space. The reflected light is received by the light sensor. Hence, a signal generated by the sensor is an indication for pollution of the shield.
    Type: Grant
    Filed: November 22, 2021
    Date of Patent: September 24, 2024
    Assignee: OTT HYDROMET B.V.
    Inventors: Xander Olivier Van Mechelen, Joachim Christian Jaus, Joop Mes
  • Patent number: 12058289
    Abstract: An image printed on a recording sheet is read, and the read image is displayed on a display unit. An instruction to use the displayed image as a correct answer image is accepted, and an image generated from the image that the instruction to use is accepted is registered as the correct answer image. A printed image is verified by comparing the printed image with the registered correct answer image.
    Type: Grant
    Filed: June 24, 2022
    Date of Patent: August 6, 2024
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yosuke Obayashi, Masanori Ichikawa, Minoru Kambegawa, Junichi Goda
  • Patent number: 11733474
    Abstract: A thinned lens module with high imaging quality comprises a base, an optical filter, and a metal sheet. The base defines a first receiving groove and a second receiving groove communicating with the first receiving groove. The metal sheet is received in the first receiving groove and fixed to a sidewall of the first receiving groove. The optical filter is received in the second receiving groove and fixed on the metal sheet. An electronic device including the lens module is also disclosed.
    Type: Grant
    Filed: September 26, 2019
    Date of Patent: August 22, 2023
    Assignee: TRIPLE WIN TECHNOLOGY (SHENZHEN) CO. LTD.
    Inventors: Sheng-Jie Ding, Shin-Wen Chen, Jing-Wei Li, Jian-Chao Song, Yu-Shuai Li
  • Patent number: 11333615
    Abstract: An improved vehicle surface scanning system for assessing the damaged surfaces of a vehicle with resulting estimates of repair costs. A mobile scanning booth is assembled in an open-ended tunnel-like rig having a plurality of reflective panels positioned along opposite sides and across the roof of the booth to serve as deflection screens. A plurality of scanner modules are mounted in fixed positions about opposite ends of the booth and positioned to face the interior of the booth. Wheels provide controlled locomotion/movement of the scanning booth over the vehicle. The scanner modules use a combined hybrid methodology of active stereo 3D reconstruction and deflectometry to acquire data measurements along the surfaces of the vehicle incrementally as the booth is moved. The incremental measurement data acquired during the mobile scanning is processed and furthermore combined to produce accurate reports of the damage surfaces and estimates of associated repair costs.
    Type: Grant
    Filed: January 25, 2019
    Date of Patent: May 17, 2022
    Assignee: Vehicle Service Group, LLC
    Inventors: Aivaras Grauzinis, Geert Willems, Richard Adelman, Robert Finkle
  • Patent number: 11273652
    Abstract: A sensor unit includes an edge detection sensor and an illumination device. The edge detection sensor is disposed in a conveying path of a recording medium and detects a recording medium edge position in a width direction perpendicular to a conveying direction. The illumination device is disposed to face the edge detection sensor in the conveying path and emits light toward the edge detection sensor. The illumination device includes a light source and a diffuser. The light source emits light. The diffuser diffuses the light from the light source and suppresses luminance unevenness.
    Type: Grant
    Filed: June 4, 2019
    Date of Patent: March 15, 2022
    Assignee: KYOCERA Document Solutions Inc.
    Inventors: Aiichiro Otana, Naoto Miyakoshi
  • Patent number: 11219148
    Abstract: A production system includes: a substrate counter configured to count the number of substrates existing in a production line including a mounting device; a mark pattern acquisition unit configured to acquire a mark pattern indicating a pattern of a mark that is provided to each of the plurality of substrates counted by the substrate counter; a determination unit configured to determine whether the respective mark patterns of the plurality of substrates acquired by the mark pattern acquisition unit are the same as each other; and a detection controller configured to control a detection process of the mark pattern by the mounting device based upon a determination result of the determination unit.
    Type: Grant
    Filed: March 20, 2020
    Date of Patent: January 4, 2022
    Assignee: JUKI CORPORATION
    Inventor: Hiroyuki Koga
  • Patent number: 11193756
    Abstract: Provided are an apparatus and method for measuring the shape and thickness of a transparent object. A light projecting section that outputs beams of light to a transparent object, a light receiving sensor that receives the beams of light that have passed through the transparent object, and a data processing section that analyzes a received light signal in each light receiving element of the light receiving sensor are included. The light projecting section outputs, in parallel, output beams of light from a plurality of light sources, and the data processing section analyzes the received light signal in each light receiving element of the light receiving sensor and identifies a light source of any beam of light input into one light receiving element by using light source combination information that is stored in a storage section and that corresponds to a value of the received light signal.
    Type: Grant
    Filed: December 6, 2018
    Date of Patent: December 7, 2021
    Assignee: SONY CORPORATION
    Inventor: Tuo Zhuang
  • Patent number: 10942131
    Abstract: A first imaging unit images a first region to be subjected to mirror finish treatment of an inspection region of a surface of the object. A second imaging unit images a second region not to be subjected to the mirror finish treatment of the inspection region of the surface of the object. An inspection unit inspects a form of the first region based on a first picked-up image taken by the first imaging unit, and a form of the second region based on a second picked-up image taken by the second imaging unit. During imaging, a holder holds the object so as to have a positional relationship in which the first region has a normal along a first direction rather than a second direction.
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: March 9, 2021
    Assignee: SCREEN HOLDINGS CO., LTD.
    Inventor: Yasushi Nagata
  • Patent number: 10724900
    Abstract: Embodiments include a spectral reflectance system comprising a light source. The system includes a platform configured to retain a sample. The system includes an optical director positioned in the optical path between the light source and the platform. The optical director couples light from the light source to the platform. The system includes a detector positioned to receive reflected light from the sample. The detector generates a signal representing the reflected light. The system includes a focusing system coupled to the optical director. In response to the signal the focusing system automatically focuses the light on the sample by controlling a position of the optical director to maximize a strength of the signal.
    Type: Grant
    Filed: September 23, 2016
    Date of Patent: July 28, 2020
    Assignee: Filmetrics, Inc.
    Inventor: Scott A. Chalmers
  • Patent number: 10500696
    Abstract: A method of detecting clogging of a chuck table includes an imaging step of capturing an image of a holding surface of the chuck table while air and water are being ejected to the holding surface of the chuck table, an image processing step of binarizing the captured image into a binary image, and a decision step of deciding a clogged ratio of the chuck table on the basis of the binary image.
    Type: Grant
    Filed: January 16, 2018
    Date of Patent: December 10, 2019
    Assignee: DISCO CORPORATION
    Inventors: Hideki Matsui, Shigenori Harada
  • Patent number: 10473593
    Abstract: An inspection system comprises an imaging device mounted so as to image a component surface. At least one controllable light mounted at low oblique angles around the component and configured to illuminate the component surface and cast at least one shadow on the component surface. A processor is coupled to the imaging device and the at least one controllable light. The processor is used for determining a feature based on a dissimilarity between image data and a reference model, and to determine damage to the component.
    Type: Grant
    Filed: May 4, 2018
    Date of Patent: November 12, 2019
    Assignee: United Technologies Corporation
    Inventors: Ziyou Xiong, Alan Matthew Finn
  • Patent number: 10356298
    Abstract: A board inspection apparatus is disclosed, which includes a surface-side irradiator irradiating a surface of each inspection area of a board, a surface-side camera taking a surface-side image of the surface, a rear face-side irradiator irradiating a rear face of each inspection area, a rear face-side camera taking a rear face-side image of the rear face, and a controller moving the surface-side irradiator and the surface-side camera to a position corresponding to the surface of each inspection area, moving the rear face-side irradiator and the rear face-side camera to a position corresponding to the rear face of each inspection area, and inspecting the surface and the rear face of each inspection area based on the surface-side image and the rear face-side image, respectively.
    Type: Grant
    Filed: March 6, 2017
    Date of Patent: July 16, 2019
    Assignee: CKD Corporation
    Inventors: Nobuyuki Umemura, Akira Kato, Tsuyoshi Ohyama, Norihiko Sakaida
  • Patent number: 10152634
    Abstract: Arrangements are detailed to process imagery of an object, captured by a camera, based on contextual data that at least partially characterizes a condition of the object when the imagery was captured. Contextual data can be obtained directly by a sensor or can be derived by pre-processing the captured imagery. The captured imagery can be processed to detect features such as digital watermarks, fingerprints, barcodes, etc. A great number of other features and arrangements are also detailed.
    Type: Grant
    Filed: May 4, 2016
    Date of Patent: December 11, 2018
    Assignee: Digimarc Corporation
    Inventors: Ajith M. Kamath, Kurt M. Eaton
  • Patent number: 9838611
    Abstract: An image capturing apparatus includes a light emitting unit and an image sensor having a plurality of pixels are disposed in a matrix. Each pixel includes a photodiode, a pixel memory connected to the photodiode, and a floating diffusion portion connected to the pixel memory via a switch. The image capturing apparatus opens the switch from the start of a charge accumulation period that includes a light emission period of the light emitting unit until a predetermined time in the light emission period, reads out a first signal corresponding to the charge accumulated in the floating diffusion portion after the switch has been closed, reads out a second signal corresponding to a charge accumulated in the pixel memory when the charge accumulation period has passed and calculates a distance to the subject based on the first and second signals.
    Type: Grant
    Filed: April 3, 2015
    Date of Patent: December 5, 2017
    Assignee: Canon Kabushiki Kaisha
    Inventor: Kazuki Haraguchi
  • Patent number: 9719939
    Abstract: An apparatus can be used for inspecting printed images for a printing or finishing machine with continuously moved printed products. An illumination unit with a light source illuminates a recording region and an image capture apparatus with at least one camera, for example a line scanning camera, is set up to capture an image inside the recording region, which extends over the width of the printed product, wherein the image capture apparatus is set up to generate a multi-line partial image.
    Type: Grant
    Filed: February 8, 2013
    Date of Patent: August 1, 2017
    Inventor: Stephan Krebs
  • Patent number: 9626752
    Abstract: A system for three-dimensional inspection of leads mounted on an integrated circuit device includes an integrated circuit device, a first light source having a first color, a second light source having a second color different from the first color, a RGB color camera and a processor. The first light source is disposed at an acute angle to the integrated circuit device, and is configured to illuminate the leads such that lead shadows are created in a first color plane. The second light source is disposed in front of a surface of the integrated circuit device on which the leads are mounted, and is configured to illuminate the leads in a second color plane. The camera is configured to image the illuminated leads and lead shadows. The processor is configured to analyze the first and second color planes of a single image to detect three-dimensional bent leads.
    Type: Grant
    Filed: May 21, 2014
    Date of Patent: April 18, 2017
    Assignee: Delta Design, Inc.
    Inventors: Walter James Frandsen, Jr., Kexiang Ken Ding
  • Patent number: 9420191
    Abstract: A sensor (1) serves for capturing the moving material web (2). It has light sources (4, 4?) and at least one light detector (10). The light sources (4, 4?) generate emission light (5) having different polarization. The polarization state of the emitted light can be influenced by selecting or mixing the emission light (5) of the light sources (4, 4?). Markings such as for example metal strips (13) in the material web (2) can thus be captured with the light detector (10) without problem.
    Type: Grant
    Filed: August 19, 2013
    Date of Patent: August 16, 2016
    Assignee: TEXMAG GMBH VERTRIEBSGESELLSCHAFT
    Inventors: Juergen Eisen, Lars Zwerger
  • Patent number: 9367912
    Abstract: A method for identifying counterfeit coins, comprising receiving surface image data and edge image data of the coin at a processor. Identifying a plurality of defects using the processor. Comparing each of the plurality of defects to a database of known authentic coin image data defects to determine whether the coin is authentic.
    Type: Grant
    Filed: November 11, 2014
    Date of Patent: June 14, 2016
    Inventor: Christopher J. Rourk
  • Patent number: 9217633
    Abstract: The invention relates to an arrangement for analyzing an at least partially reflective surface of a wafer or other objects, containing a holder for holding the object; an inspection arrangement arranged at a distance in the region in front of the surface to be analyzed; and a measurement arrangement for determining the distance and/or inclination of the surface for the inspection arrangement; characterized be a radiation source, the radiation of which is directed towards the surface to be analyzed at an angle; and a spatially resolving detector for receiving the radiation from the radiation source that is reflected from the surface to be analyzed, wherein the radiation source and the detector are arranged outside the region necessary for the inspection between the inspection arrangement and the surface to be analyzed.
    Type: Grant
    Filed: April 5, 2013
    Date of Patent: December 22, 2015
    Assignee: HSEB DRESDEN GmbH
    Inventors: Bernd Srocka, Ralf Langhans
  • Patent number: 9116071
    Abstract: Internal components of gas or steam turbines are inspected with a 3D scanning camera inspection system that is inserted and positioned within the turbine, for example through a gas turbine combustor nozzle port. Three dimensional internal component measurements are performed using projected light patterns generated by a stripe projector and a 3D white light matrix camera. Real time dimensional information is gathered without physical contact, which is helpful for extracting off-line engineering information about the scanned structures. Exemplary 3D scans, preferably with additional visual images, are performed of the gas path side of a gas turbine combustor support housing, combustor basket and transition with or without human intervention.
    Type: Grant
    Filed: August 21, 2013
    Date of Patent: August 25, 2015
    Assignee: Siemens Energy, Inc.
    Inventors: Clifford Hatcher, Jr., Yakup Genc, Richard Hatley, Anton Schick
  • Patent number: 8841603
    Abstract: Optical scanning with an optical probe composed of an elongated cylinder of transparent material mounted upon an optical scanner body; one or more sources of scan illumination mounted in the probe distally or proximally with respect to the scanner body and projecting scan illumination longitudinally through the probe; a radially-reflecting optical element mounted in the probe having a conical mirror on a surface of the radially-reflecting optical element, the mirror oriented so as to project scan illumination radially away from a longitudinal axis of the probe with at least some of the scan illumination projected onto a scanned object; a lens mounted in the probe between the radially-reflecting optical element and the scanner body and disposed so as to conduct to an optical sensor scan illumination reflected from the scanned object.
    Type: Grant
    Filed: December 6, 2013
    Date of Patent: September 23, 2014
    Assignee: United Sciences, LLC
    Inventors: Keith A. Blanton, Karol Hatzilias, Stefan T. Posey, Wess Eric Sharpe
  • Patent number: 8631577
    Abstract: A method of fabricating an integrally bladed rotor of a gas turbine engine according to one aspect, includes a 3-dimensional scanning process to generate a 3-dimensional profile of individual blades before being welded to the disc of the rotor. A blade distribution pattern on the disc is then determined in a computing process using data of the 3-dimensional profile of the individual blades such that the fabricated integrally bladed rotor is balanced.
    Type: Grant
    Filed: July 22, 2011
    Date of Patent: January 21, 2014
    Assignee: Pratt & Whitney Canada Corp.
    Inventor: Visal Ing
  • Patent number: 8461562
    Abstract: Provided is a web carrier which can prevent creasing of a web by detecting a sign of creasing of a web during carriage of the web. The web carrier (1) for carrying a sheetlike web (10) by means of a plurality of rollers (2) detects the linear pattern of a waveform generated on the web (10) from an image picked up by means of a camera (imaging means) (3) using an image analysis means (73) in a controller (7), recognizes a state becoming the sign of creasing with the aid of the image and simultaneously analyzes the entering direction of the linear pattern into a guide roller (2c), drives the shaft (20c) of the guide roller (angle adjusting roller) (2c) in the direction of canceling the waveform (so that the web is not creased), and controls an alignment adjusting means (5) such that the web is not creased.
    Type: Grant
    Filed: November 21, 2007
    Date of Patent: June 11, 2013
    Assignees: Toyota Jidosha Kabushiki Kaisha, Tokai University Educational System
    Inventor: Hiromu Hashimoto
  • Patent number: 8399838
    Abstract: A system for investigating a plurality of samples having varying positions or orientations moving with respect to the system, the system including an emitter of terahertz radiation for irradiating a sample provided in a sample space; a detector of terahertz radiation configured to detect radiation reflected from said sample space; and determining means to determine if radiation reflected from said sample space is from a sample with a predetermined orientation in the sample space.
    Type: Grant
    Filed: January 23, 2009
    Date of Patent: March 19, 2013
    Assignee: TeraView Limited
    Inventors: Michael John Evans, Ian Stephen Gregory, Hideaki Page
  • Patent number: 8167306
    Abstract: The present invention provides an apparatus for maintaining surface smoothness of note as they pass through a high speed processing machine. A note fed into the processing machine is carried through the machine by a series of conveyor belts. The note is conveyed past a line scan camera that records the note as it crosses a gap while passing from a first conveyor belt to a second conveyor belt that is approximately orthogonal to the first conveyor belt. A curved note guide redirects the path of the note as it crosses the gap between the conveyor belts. The inertia of the note causes it to remain flush against the surface of the curved guide, allowing the line scan camera to record each line of the surface of the note with equal resolution.
    Type: Grant
    Filed: March 9, 2010
    Date of Patent: May 1, 2012
    Assignee: De La Rue North America Inc.
    Inventors: Jerry Edwards, Bruce Blair
  • Patent number: 8030631
    Abstract: Provided is an apparatus for projecting multiple beams to a structure on a workpiece comprising a first light source generating a first illumination beam and a second light source generating a second illumination beam, an illumination primary mirror configured to reflect the first illumination beam onto the structure of the workpiece at a first angle of incidence, generating a first detection beam, and configured to reflect the second illumination beam onto the workpiece at a second angle of incidence, generating a second detection beam, a separate illumination secondary mirror positioned relative to the illumination primary mirror so as make the first angle of incidence substantially the same or close to a calculated optimum first angle of incidence and make the second angle of incidence substantially the same or close to a calculated optimum second angle of incidence.
    Type: Grant
    Filed: March 30, 2009
    Date of Patent: October 4, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Adam Norton, Xinkang Tian
  • Patent number: 8030632
    Abstract: Provided is a method of controlling multiple beams directed to a structure in a workpiece, the method comprising generating a first illumination beam with a first light source and a second illumination beam with a second light source, projecting the first and second illumination beams onto a separate illumination secondary mirror, reflecting the first and second illumination beams onto an illumination primary mirror, the reflected first and second illumination beams projected onto the structure at a first and second angle of incidence respectively, the reflected first and second illumination beams generating a first and second detection beams respectively. The separate illumination secondary mirror is positioned relative to the illumination primary mirror so as make the first angle of incidence substantially the same or close to a calculated optimum first angle of incidence and make the second angle of incidence substantially the same or close to a calculated optimum second angle of incidence.
    Type: Grant
    Filed: March 30, 2009
    Date of Patent: October 4, 2011
    Assignee: Tokyo Electron Limted
    Inventors: Adam Norton, Xinkang Tian
  • Patent number: 7964835
    Abstract: Digital camera systems and methods are described that provide a color digital camera with direct luminance detection. The luminance signals are obtained directly from a broadband image sensor channel without interpolation of RGB data. The chrominance signals are obtained from one or more additional image sensor channels comprising red and/or blue color band detection capability. The red and blue signals are directly combined with the luminance image sensor channel signals. The digital camera generates and outputs an image in YCrCb color space by directly combining outputs of the broadband, red and blue sensors.
    Type: Grant
    Filed: June 6, 2007
    Date of Patent: June 21, 2011
    Assignee: Protarius Filo AG, L.L.C.
    Inventors: Richard Ian Olsen, James Gates, Darryl L. Sato
  • Patent number: 7920751
    Abstract: An imaging system includes a two-dimensional detector having a plurality of cells wherein each cell is configured to detect energy or signal passing through an object. The imaging system includes a computer programmed to acquire imaging data for the plurality of cells, identify a cell to be corrected, based on the imaging data, interpolate Ix and Iy for the identified cell based on neighbor cells, and calculate local gradients gx and gy between the identified cell and its neighbor cells based on the interpolation. The computer is further programmed to calculate weighting factors wx and wy based on the local gradients, calculate a corrected final value I(0,0) for the identified cell, and correct the identified cell with the corrected final value.
    Type: Grant
    Filed: March 16, 2007
    Date of Patent: April 5, 2011
    Assignee: General Electric Company
    Inventors: Baojun Li, Jiang Hsieh
  • Patent number: 7873273
    Abstract: An apparatus for measuring the characteristics of an optical fiber is provided. An optical pulse generator generates, from a coherent light, first and second optical pulses having a time interval which is equal to or shorter tan a life time of an acoustic wave in the optical fiber. A detector couples the coherent light with a Brillouin backscattered light which includes first and second Brillouin backscattered lights belonging to the first and second optical pulses respectively, thereby generating an optical signal. The detector further converts the optical signal into an electrical signal. A signal processor takes the sum of the electrical signal and a delay electrical signal which is delayed from the electrical signal by a delay time corresponding to the time interval, thereby generating an interference signal, and finds the characteristics of the optical fiber based on the interference signal.
    Type: Grant
    Filed: December 11, 2007
    Date of Patent: January 18, 2011
    Assignees: Yokogawa Electric Corporation
    Inventor: Yahei Koyamada
  • Patent number: 7869023
    Abstract: A cylindrical mirror or lens is used to focus an input collimated beam of light onto a line on the surface to be inspected, where the line is substantially in the plane of incidence of the focused beam. An image of the beam is projected onto an array of charge-coupled devices parallel to the line for detecting anomalies and/or features of the surface, where the array is outside the plane of incidence of the focused beam.
    Type: Grant
    Filed: May 19, 2008
    Date of Patent: January 11, 2011
    Assignee: KLA-Tencor Corporation
    Inventors: Guoheng Zhao, Stanley Stokowski, Mehdi Vaez-Iravani
  • Patent number: 7795604
    Abstract: The present invention provides a trolley wire wear measurement device by image processing in which a line sensor is arranged vertically and upward on a roof of an inspection car so that the line sensor looks up to a trolley wire and a lighting means that illuminates the trolley wire is formed by arranging a plurality of point light sources in a straight line in a direction perpendicular to a travelling direction of the inspection car on the inspection car.
    Type: Grant
    Filed: March 29, 2007
    Date of Patent: September 14, 2010
    Assignee: Meidensha Corporation
    Inventors: Yusuke Watabe, Makoto Niwakawa
  • Patent number: 7601978
    Abstract: Fabric wrinkles are automatically evaluated using a reliable, accurate, affordable, and efficient system. Two algorithms are used, the facet model algorithm and the plane-cutting algorithm, to extract features for evaluating wrinkles in fabrics. These algorithms eliminate the need for independent evaluation of a fabric specimen by a technician.
    Type: Grant
    Filed: April 11, 2003
    Date of Patent: October 13, 2009
    Inventors: Hamed Sari-Sarraf, Eric Hequet, Christopher N. Turner, Aijun Zhu
  • Patent number: 7538334
    Abstract: An apparatus, system and method for targeting an image formed on an imaging member. The imaging member includes an imaging sensitive layer formed thereon. The imaging member includes imaged and non-imaged areas. Light of a predetermined wavelength reflected from a target area of the imaging member is received. The light reflected from the target area is representative of an image formed on the imaging sensitive layer using energy at approximately the predetermined wavelength. The predetermined wavelength is suitable to initiate crosslinking of the imaging sensitive layer.
    Type: Grant
    Filed: September 8, 2006
    Date of Patent: May 26, 2009
    Assignee: X-Rite, Inc.
    Inventors: Bernard J. Berg, Peter G. Vander Jagt, Rob Kuschinsky, Chris Lafontaine, Jon K. Nisper, Michael J. Weber
  • Patent number: 7513704
    Abstract: In an electronic image pickup apparatus of the present invention, a lens barrel having optical elements arranged in the optical axis direction has a CCD for photographing a luminous flux from a subject, a CCD holder formed around the CCD to hold the CCD, and a low-pass filter provided on the front side of the CCD. A low-pass filter holder as a plate-like member to hold and fix the low-pass filter is provided to contact the low-pass filter at one end through a diaphragm on the CCD side surface, and contacts the CCD holder on the side opposite to the CCD at the other end.
    Type: Grant
    Filed: July 27, 2005
    Date of Patent: April 7, 2009
    Assignee: Olympus Corporation
    Inventor: Tetsuya Takagi
  • Publication number: 20080245980
    Abstract: A monitoring system for a gas turbine or other elevated temperature environment is provided. The system has one or more photonic crystal fibers for capturing and transmitting light to an imaging camera for generation of an image. The photonic crystal fibers can be formed from a sapphire cladding. The photonic crystal fibers can be band gap fibers. The photonic crystal fibers can be arranged in a bundle, including an array or a linear bundle.
    Type: Application
    Filed: April 5, 2007
    Publication date: October 9, 2008
    Inventor: Evangelos V. Diatzikis
  • Patent number: 7408570
    Abstract: A web inspection system provides detection of web flaws along the machine direction and cross direction of a web. The detectable percent contrast between good web material and bad web material in one embodiment approaches noise level. The web inspection system utilizes a multiple of smart cameras connected to a host computer via an ethernet hub. Each smart camera includes a line scan camera for producing digital pixels, a means for lighting and pixel correction on a pixel by pixel basis, a web edge detector for monitoring the edges of a web, a multi-pipeline flaw detection pre-processor for detecting very small changes in the web material, a run length encoder for generating data regarding the location of each group of potential flaws in a cross direction, a 2D blob detector and analyzer for generating data regarding the location of block flaws along a machine direction, and an inspect/reject analysis for determining the actual flaw data from the potential flaw data.
    Type: Grant
    Filed: April 13, 2004
    Date of Patent: August 5, 2008
    Assignee: Wintriss Engineerig Corporation
    Inventors: Sujoy D. Guha, Chris M. Kiraly, Robin D. Becker
  • Publication number: 20080164430
    Abstract: An optical system is usable for forming an illuminated pattern on the surface of a material which is being displaced with respect to that illuminated pattern. An illuminating device, which includes several light sources that are driven in a pulsed manner by a control unit, emits light that is used to form the illuminated pattern. A detection device detects the light emitted by the illuminating device. The control unit controls one individual light source, or a group of light sources. An operating time of the light source or sources is synchronized with an exposure time of the detection device. The operating time of the light source is shorter than the exposure time of the detection device.
    Type: Application
    Filed: March 15, 2005
    Publication date: July 10, 2008
    Inventor: Carsten Diederichs
  • Patent number: 7375360
    Abstract: There is disclosed a light device for arranging a thin film pattern sensor array where a sensor array used for inspecting a thin film pattern is made to be arranged without a separate correction pattern film in accordance with an inspection subject. In the light device for arranging the thin film pattern sensor array, a shutter controls a width of a light beam which progresses from a light emitting element array to a sensor array. A correction pattern sled is installed in any one of a fixed location of an upper part of the shutter and a surface of the shutter to be transferable.
    Type: Grant
    Filed: January 9, 2006
    Date of Patent: May 20, 2008
    Assignee: LG Electronics Inc.
    Inventor: Kyung Gu Kim
  • Patent number: 7365310
    Abstract: The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes: a) positioning an area of the sample plate in the field of view of an imaging device; b) producing a plurality of images of the area having different in-focus regions; and c) generating an in-focus image of the area using the plurality of images. The in-focus image may be two-dimensional or three-dimensional. Systems and programming for performing the methods are also provided.
    Type: Grant
    Filed: June 27, 2005
    Date of Patent: April 29, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Jean-Luc Truche, Gregor Overney
  • Patent number: 7330583
    Abstract: Integrated inspection and test systems for liquid crystal display (LCD) active plates. The integrated inspection and test systems may combine visual imaging inspection and an electronic sensing such as voltage imaging, electron beam sensing or charge sensing, in which the potential defect information obtained by the visual inspection system is combined with the potential defect information obtained by the electronic sensing system to produce a defect report. One or more high-resolution visual cameras are scanned over a stationary plate, and the image data from the camera(s) is processed to detect potential defects. A high-resolution electronic sensing system examines the stationary plate, and the image data from the sensor(s) is processed to detect potential defects. The potential defects from the visual image data and electronic sensing image data are processed to produce the final defect information.
    Type: Grant
    Filed: August 19, 2002
    Date of Patent: February 12, 2008
    Assignee: Photon Dynamics, Inc.
    Inventors: Bernard T. Clark, David L. Freeman, Jeffrey A. Hawthorne, Alexander J. Nagy, William K. Pratt
  • Patent number: 7326901
    Abstract: A system and method for inspecting an article, the system includes a spatial filter that is shaped such as to direct output beams towards predefined locations and an optical beam directing entity, for directing the multiple output beams toward multiple detector arrays. The method includes spatially filtering multiple input light beams to provide substantially aberration free output light beams; and directing the multiple output beams by an optical beam directing entity, toward multiple detector arrays.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: February 5, 2008
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Emanuel Elyasaf, Steven R. Rogers
  • Patent number: 7321108
    Abstract: A method and apparatus for dynamically focusing an imaging mechanism on a moving target surface having a variable geometry is herein disclosed. Apparatus for focusing an imaging mechanism may include an objective, a prism, or another optical device that forms part of an optical train of an imaging mechanism, a sensor for measuring a distance to the target surface, and a mechanism for modifying the depth of focus of the objective, prism or other optical device. Data from the sensor may be used to create a predictive model of the target surface. Data from the sensor is also used to fit or correlate the generated model to an exemplary target. Data from the correlated model is used to drive the mechanism for modifying the depth of focus of the objective, prism, or other optical device to maintain the surface of the exemplary target in focus.
    Type: Grant
    Filed: January 22, 2007
    Date of Patent: January 22, 2008
    Assignee: Rudolph Technology, Inc.
    Inventors: Cory Watkins, Mark Harless, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown, Brian Delsey
  • Patent number: 7283235
    Abstract: Optical device for representing a central image (10) of an object (1) and at least one lateral image (11, 12, 13, 14) of the same object (1), with the length of the real optical path of said central image (10) being different from the length of the real optical path of said at least one lateral image (11, 12, 13, 14) and the length of the apparent optical path of said central image (10) being equal to the length of the apparent optical path of said at least one lateral image (11, 12, 13, 14), and module for the optical inspection of objects comprising such an optical device and an optical system (7) allowing a central image (10) of the object (1) and at least one lateral image (11, 12, 13, 14) of this same object (1) to be captured simultaneously. The apparent optical paths of the central image (10) and of the lateral image (11, 12, 13, 14) being identical, these two images can be captured and correctly focussed simultaneously by a same viewing system (7).
    Type: Grant
    Filed: February 14, 2005
    Date of Patent: October 16, 2007
    Assignee: Ismeca Semiconductor Holding SA
    Inventor: Aldo Salvi
  • Patent number: 7202898
    Abstract: A semiconductor surface is provided comprising a plurality of light sensitive pixels wherein each pixel of the plurality of pixels comprises an electronic circuit formed on or in the semiconductor surface, the circuit comprising: a photosensor that generates a signal responsive to light incident thereon at an output thereof; and circuitry that provides a signal responsive to a time lapse between a first time responsive to said signal and a reference time. There is also provided a 3D camera incorporating the semiconductor surface.
    Type: Grant
    Filed: December 16, 1998
    Date of Patent: April 10, 2007
    Assignee: 3DV Systems Ltd.
    Inventors: Ori J. Braun, Gavriel J. Iddan, Giora Yahav
  • Patent number: 7166856
    Abstract: An apparatus and method to inspect a display panel that can correctly detect a defect of the display panel itself. In the method of inspecting the display panel, a first image is captured from the display panel in a state in which no pattern is applied to the display panel. Light is then irradiated on the display panel in a state in which a pattern is applied to the display panel, and a second image is captured from the display panel. The first image can be compared with the second image, and a determination can be made as to whether or not a defect of the display panel is present.
    Type: Grant
    Filed: September 13, 2004
    Date of Patent: January 23, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sue Jin Cho, Hyung Sun You, Jang Hee Lee
  • Patent number: 7154596
    Abstract: Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for imaging an object having a first side and a second side includes an imager, and an optics apparatus that images two or more views of the first side of the object and images two or more views of the second side of the object. The two or more views of the first side and the second side of the object are each from different angles. The object includes at least one major surface. A divider background surface is placed near the at least one major surface of the object to obtain separate images of features of the object on the first side of the object and features of the object on the second side of the object.
    Type: Grant
    Filed: March 13, 2006
    Date of Patent: December 26, 2006
    Inventor: Bradley L. Quist
  • Patent number: 7101461
    Abstract: A system and process for measuring paper formation characteristics in real time is disclosed. The system comprises apparatus used in a papermaking process, and includes a rotating forming fabric having an upper and lower surface. A paper slurry is deposited upon the upper surface of the moving forming fabric to prepare a wet paper web. The wet paper web typically moves at a high rate of speed as it rides along upon the surface of the forming fabric. Light is transmitted from a light source to the surface of the wet paper web, and then reflected from the surface of the wet paper web to a camera. An image is formed corresponding to the pattern of the reflected light, and in some instances data generated from the reflected light may be compared to other values to provide a feedback loop to adjust the parameters of the papermaking process in real time.
    Type: Grant
    Filed: January 29, 2001
    Date of Patent: September 5, 2006
    Assignee: Kimberly-Clark Worldwide, Inc.
    Inventors: Peter J. Allen, Scott H. Delzer, Lindsay M. Brewster
  • Patent number: 7012682
    Abstract: Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for imaging an object having a first side and a second side includes an imager, and an optics apparatus that images two or more views of the first side of the object and images two or more views of the second side of the object. The two or more views of the first side and the second side of the object are each from different angles. The object includes at least one major surface. A divider background surface is placed near the at least one major surface of the object to obtain separate images of features of the object on the first side of the object and features of the object on the second side of the object.
    Type: Grant
    Filed: June 15, 2004
    Date of Patent: March 14, 2006
    Inventor: Bradley L. Quist