Abstract: A gas sensing element reflects light incoming along an optical path on a sensing face. The light reflected by the gas sensing element changes in a characteristic depending on quantity of a specific gas that is in contact with the gas sensing element. Each of a first optical element and a second optical element bends the optical path. The gas sensing element, a light source, a photodetector, and a magnetic field applicator are disposed on the same side with respect to a virtual plane that is perpendicular to an incident plane of the incoming light to the sensing face of the gas sensing element and includes a point on the optical path where light goes out from the first optical element and a point on the optical path where light enters the second optical element.

Abstract: When reading a coupon that displays a pattern when a target substance is detected, recognition of the target pattern can be hindered by nonuniform illumination of the coupon. In one aspect, methods and devices are disclosed for uniform illumination of a coupon using a negative axicon lens and a light diffusing assembly. In another separate aspect, methods are disclosed for mathematically compensating for nonuniform illumination of a coupon.

Abstract: An information-reading element may be provided, which can be made small, and allows the number of adjustment steps to be reduced, and an information-reading device may be provided. An information-reading element may be provided and equipped with a light-emitting element, which serves as a polarized light-emitting part for emitting polarized light as outgoing light, and a light-receiving element, which serves as a polarized light-receiving part for receiving the polarized light as returning light after the polarized light is reflected off a reflecting plate, said reflecting plate being a target object from which information is to be read, wherein the light-emitting element and the light-receiving element have different polarization characteristics from each other.

Abstract: A method of manufacturing chemical mechanical polishing pads is provided, wherein an automated inspection system is configured to detect macro inhomogeneities is skived sheets and to classify the skived sheets as either acceptable or suspect; wherein the acceptable skived sheets are further processed to form polishing layers of chemical mechanical polishing pads.

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.

Abstract: Methodology for determining uncertainty in a data set which characterizes a sample involving elimination of the influence of sample alteration drift caused by data set acquisition, and/or elimination of the influence of system drift during data acquisition.

Abstract: A photoelectric sensor includes a phototransmitter that outputs light toward a detection target region of an object; an optical receiver that receives the light outputted from the phototransmitter; a signal processing unit that outputs a signal indicating that the object is detected in response to a decrease of an amount of light received by the optical receiver; and two optical filters that are provided between the phototransmitter and the optical receiver to transmit only pieces of light having specific characteristics.

Abstract: Methods and systems for a photonically enabled complementary metal-oxide semiconductor (CMOS) chip are disclosed. The CMOS chip may comprise a laser, a microlens, a turning mirror, and an optical bench, and may generate an optical signal utilizing the laser, focus the optical signal utilizing the microlens, and reflect the optical signal at an angle defined by the turning mirror. The reflected optical signal may be transmitted into the photonically enabled CMOS chip, which may comprise a non-reciprocal polarization rotator, comprising a latching faraday rotator. The CMOS chip may comprise a reciprocal polarization rotator, which may comprise a half-wave plate comprising birefringent materials operably coupled to the optical bench. The turning mirror may be integrated in the optical bench and may reflect the optical signal to transmit through a lid operably coupled to the optical bench.

Abstract: Methodology for determining uncertainty in a data set which characterizes a sample involving elimination of the influence of sample alteration drift caused by data set acquisition, and/or elimination of the influence of system drift during data acquisition.

Abstract: Methods and systems for a light source assembly for coupling to a photonically enabled complementary metal-oxide semiconductor (CMOS) chip are disclosed. The light source assembly may comprise a laser, a microlens, a turning mirror, and an optical bench, and may generate an optical signal utilizing the laser, focus the optical signal utilizing the microlens, and reflect the optical signal at an angle defined by the turning mirror. The reflected optical signal may be transmitted out of the assembly to grating couplers in the photonically enabled CMOS chip. The assembly may comprise a non-reciprocal polarization rotator, comprising a latching faraday rotator. The assembly may comprise a reciprocal polarization rotator, which may comprise a half-wave plate comprising birefringent materials operably coupled to the optical bench. The turning mirror may be integrated in the optical bench and may reflect the optical signal to transmit through a lid operably coupled to the optical bench.

Abstract: A system (40) for diagnosis and staging of early stages of cancer in the tissue of a patient is provided. The system—is configured to combine information from a Polarized Light Scattering Spectroscopy measurement (70) having a first probe depth, and a Differential Path Length Spectroscopy measurement (60) having a second probe depth, wherein the second probe depth is set larger than' the first probe depth. By comparing the results of the Polarized Light Scattering Spectroscopy and Differential Path Length Spectroscopy measurements early stages of cancer, such as dysplasia may be detected. Also hyperplasia, carcinoma in situ, and carcinoma may be detected. A computer-readable medium, method and use are also provided.

Abstract: A method and apparatus for testing a magnetic medium. The method comprises applying a magnetic field of a time-varying strength; directing a polarized optical beam towards a portion of the medium that is in the magnetic field, wherein the optical beam is reflected by a surface of the medium at a point of incidence in the magnetic field; moving the medium relative to the optical beam so as to cause the point of incidence to repeatedly traverse each of a plurality of sectors along a track on the surface; obtaining a series of Kerr signal measurements of the reflected optical beam; grouping measurements into ensembles such that the measurements in an individual ensemble are those obtained while the point of incidence was in a corresponding one of the sectors; and determining at least one magnetic property of at least one of the sectors from the measurements in the corresponding ensemble.

Abstract: The invention relates to a method of characterizing a scattering medium. According to the invention, the processing on the electromagnetic radiation scattered by the scattering medium is carried out for an unpolarized signal. In this way, only the anisotrophic incoherent transport of radiation induced by the scattering medium is obtained in the characterization according to the invention. According to the invention, the data representative of the angular variation of the first image representing the unpolarized scattered radiation is representative of the purely isotrophic part of the scattering. Having obtained this purely isotrophic part, it is then possible, according to the invention, to calculate a second image representative of the non-isotrophic part of the scattering. This non-isotrophic part represents the anisotrophic transport of radiation induced by the medium at the moment of scattering.

Abstract: An optical device for assessing optical depth in a sample illuminated by polarized radiation from a source include two radiation guides having their end portions arranged for capturing reflected radiation from the sample. A detector measures two polarizations of the reflected radiation, and two intensities of the reflected radiation in the two radiation guides, respectively. A processor is configured to calculate two pectral functions, which are indicative of single scattering events in the sample. The processor is further configured to calculate a measure of the correlation between the two spectral functions so as to assess whether the single scattering events originate from substantially the same optical depth within the sample. Thus, the causal relation between the two spectral functions can be used for assessing whether the single scattering events giving rise to the two spectral functions come from substantially the same optical depth within the sample.

Abstract: Methods and systems for a light source assembly supporting direct coupling to a photonically enabled complementary metal-oxide semiconductor (CMOS) chip are disclosed. The assembly may include a laser, a microlens, a turning mirror, reciprocal and/or non-reciprocal polarization rotators, and an optical bench. The laser may generate an optical signal that may be focused utilizing the microlens. The optical signal may be reflected at an angle defined by the turning mirror, and may be transmitted out of the light source assembly to one or more grating couplers in the chip. The laser may include a feedback insensitive laser. The light source assembly may include two electro-thermal interfaces between the optical bench, the laser, and a lid affixed to the optical bench. The turning mirror may be integrated in a lid affixed to the optical bench or may be integrated in the optical bench.

Abstract: A signal processing apparatus comprising: an optical sensor for outputting a detection signal by detecting a surface of a recording medium on which a correction image is to be formed; and a control section configured to obtain a detection signal of the surface of the recording medium with the correction image from which a dominant frequency component has been deleted by making reverse frequency analysis of an analysis signal that has been obtained by making a frequency analysis of a detection signal outputted by the optical sensor detecting the surface of the recording medium on which the correction image it formed.

Abstract: Methods and systems for improving high resolution imaging using a polarization-modulated tip enhanced optical microscope. A polarizer is configured to alternately create and remove a region of enhanced optical intensity adjacent the tip of the microscope probe at the focus of a light source. The sample being studied emits photons at specific rates relative to a background rate depending on the existence or nonexistence of the region of enhanced optical intensity. Comparing the rate of emissions when the region of enhanced optical intensity exists to when it does not creates a detailed image of the sample. By not requiring the probe to oscillate, this system enhances the resolution of the microscope without potentially causing damage to the sample.

Abstract: The invention relates to a value document, such as a banknote (1), which includes one or more window zones (2A, 2B) with one for example optically active element each which rotates a polarization plane P0 of polarized light LA, LB, penetrating the window zone by a defined angle. If such value documents are stacked and polarized light penetrates the superimposed window zones, the number of stacked value documents can be determined by way of the overall rotation of the polarization plane PA, PB. The overall nominal value of a stack of banknotes can thus be determined. The window zones can have category-specific rotational characteristics for different categories or nominal values and/or can be disposed in category-specific positions in the valuable document.

Abstract: A detection apparatus for detecting perforation holes of a cinematographic film comprises at least one light source, at least one scanning sensor, which is arranged so as to receive light emitted by the light source after interaction with a perforation zone of the film, and an evaluation circuit for detecting, by means of an output signal of the scanning sensor, when an edge of a perforation hole passes through between light source and scanning sensor. The light source emits light which is polarized with a first polarization and the scanning sensor is sensitive selectively to light with a second polarization.

Abstract: The present invention relates to a scanning module, which is capable of integrating optical paths of illuminating and imaging for size reduction, and improving the quality of scanned image by using optical polarizers for filtering, and further achieving the same effect as the “projection scanning” digital camera. The scanning module comprises: a light source, a first polarizer, a quarter-wave plate, a polarizing beamsplitter, an image detection device, and a second polarizer. The light from the light source consists of both a first-polarized and a second-polarized light. The first polarizer is placed in front of the light source that only allows the first-polarized light to pass through. The optics unit directs the first-polarized light to a scanning object and transforms the reflected light into the second-polarized light before receiveded by the image detection device for image acquiring.

Abstract: A method for inspecting an object using a structured light measurement system that includes a light source and an imaging sensor. The method includes emitting light from the light source, polarizing each of a plurality of different wavelengths of the light emitted from the light source at different polarization angles, projecting light emitted from the light source onto a surface of an object, receiving light reflected from the object surface with the imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.

Abstract: Systems and methods are disclosed for using ellipsometer configurations to measure the partial Mueller matrix and the complete Jones matrix of a system that may be isotropic or anisotropic. In one embodiment two or more signals, which do not necessarily satisfy any symmetry assumptions individually, are combined into a composite signal which satisfies a symmetry assumption. The individual signals are collected at two or more analyzer angles. Symmetry properties of the composite signals allow easy extraction of overlay information for any relative orientation of the incident light beam with respect to a 1D grating target, as well as for targets comprising general 2D gratings. Signals of a certain symmetry property also allow measurement of profile asymmetry in a very efficient manner. In another embodiment a measurement methodology is defined to measure only signals which satisfy a symmetry assumption. An optional embodiment comprises a single polarization element serving as polarizer and analyzer.

Abstract: A method of characterizing the outermost material on an article manufactured by deposition or removal of material from its surface, which requires no prior knowledge of the composition of the article.

Abstract: An image-based technique that measures the orientation of fibers in a moving web of nonwoven material. At least four light spots on one side of the web are illuminated essentially simultaneously with at least four plane-polarized incident substantially perpendicular light beams having different polarization characteristics. Dispersion of the excident light spots is measured on the opposite side of the web along at least one linear section which is at a known angle relative to the plane of polarization of the corresponding plane-polarized incident light beam, wherein at least one such linear section lies substantially across the center of the transmitted excident light spot and extends substantially across the width of the transmitted excident light spot. Variations in the dispersion of the transmitted excident light spot for the at least four plane-polarized light beams are calculated, and the fiber orientation is estimated from the variations.

Abstract: A confocal scanning microscope system (10) using cross polarization effects and an enhancement agent (acetic acid) to enhance confocal microscope reflectance images of the nuclei of BCCs (basal cell carcinomas) and SCCs (squamous call carcinomas) in the confocal reflectance images of excised tumor slices. The confocal scanning microscope system having a laser (11) for generating an illumination beam (12), a polygon mirror (18) for scanning the beam to a tissue sample (22) and for receiving a return beam from the tissue sample and detector (28) for detecting the returned beam to form an image. The system further includes a half-waveplate (13) having a rotatable stage (14) and a quarter-wave plate (21) having a rotatable stage (20) disposed in the optical path of the illumination beam and at least a linear polarizer (24) having a rotatable stage (25) disposed in the optical pat of the returned beam from the tissue sample.

Abstract: A method and apparatus for determining polarization-resolved scattering parameters of an optical device. A method comprises stimulating a port of the optical device with a stimulation field having at least two polarization states, measuring the optical field emerging from the port in amplitude and phase, and calculating the scattering parameters using the measurements. By stimulating a port of an optical device with a stimulation field having at least two different polarization states, measurements needed to determine scattering parameters of the optical device can be conducted by stimulating the port with only one sweep of a swept optical source.

Abstract: A reading arrangement includes at least one linear detector arrangement which is arranged in parallel relationship above a reading plane and behind an optical imaging element and is oriented on to a reading region of the reading plane, lighting devices and an evaluation unit and serves for machine reading of an information strip with optically encoded information. The light which is scattered or diffracted out of the reading region in which the information strip to be read off by machine is disposed into the optical imaging element is so projected on to the photosensitive faces of the detector arrangement that an image of the reading region is formed. The detector arrangement produces two detector signals and from a comparison of the detector signals, the read information is determined and its authenticity verified.

Abstract: An apparatus and a method for detecting an amount of depolarization of a linearly polarized beam transmitted by a birefringent medium in the direction of the optical axis thereof includes a first beam splitter for separating an on-axis portion of the linearly polarized beam into the orthogonal components, two photodetectors for detecting each component, a second beam splitter for separating an off-axis portion of the linearly polarized beam into the orthogonal components, the second beam splitter being disposed off-axis of the incident linearly polarized beam, a second set of photodetectors for detecting the components separated by the second beam splitter, and a subtracting device for subtracting the signals received by the second set of photodetectors from the respective signals received by the first two photodetectors.

Abstract: The invention relates to a device for detecting the location of an edge (2) of a transparent, anisotropic material (3,3′) comprising at least one sensor (1) with a light source (4), two polarization filters (6,7) with transmission axes (8,9) meeting at a 90° angle as well as a light detector (10), whereby the light source (4) and one polarization filter (6) are located on one side of the edge (2) to be detected and the second polarization filter (7) and the light detector are located on the other side. This type of device is to be configured in such a way that it can be used for detecting material (3,3′) with optical axes (14) in various directions without requiring assembly. This is achieved by at least one of the sensors (1) being configured and/or adjustable so that various angles (32) between the transmission axis of the first polarization filter (6) and the optical axis (14) of the transparent, anisotropic material (3,3′) are possible.

Abstract: A system and method for determining the orientation of fibers in a fibrous material web. The system includes at least one source of electromagnetic radiation disposed on one side of the fibrous material web, at least one sensor for sensing the electromagnetic radiation emitted by the at least one source disposed on another side of the fibrous material web, and at least one optical device disposed between the at least one source and the at least one sensor, wherein the electromagnetic radiation travels through the at least one optical device and the fibrous material web such that the at least one optical device influences a propagation of the electromagnetic radiation as a function of its polarization properties.

Abstract: A method for characterizing a misprocessed wafer includes providing a wafer having a grating structure; illuminating at least a portion of the grating structure; measuring light reflected from the grating structure to generate a reflection profile; and characterizing a misprocessed condition of the wafer based on the reflection profile. A metrology tool adapted to receive a wafer having a grating structure includes a light source, a detector, and a data processing unit. The light source is adapted to illuminate at least a portion of the grating structure. The detector is adapted to measure light reflected from the grating structure to generate a reflection profile. The data processing unit is adapted to characterize a misprocessed condition of the wafer based on the reflection profile.

Abstract: A method and device for detecting the position of a transparent conveyor belt including directing light beams (2) onto the region of an edge (3) of the conveyor belt, detecting a jump in intensity of the light beam (2, 2′) as a consequence of the partial insertion of the conveyor belt into the beam path (2) and evaluating the detected jump in intensity in order to determine the position of the conveyor belt, wherein the light beams (2) are linear polarized light and the beam path (2) is directed at an angle or irradiation (&agr;) between 40° and 80° of the light (2) onto the bounding surface (7) in such a way that a high degree of reflection is achieved and reflected light and non-reflected light is detected.

Abstract: Detecting a transparent object, in particular a web or conveyor belt of a printing press with at least one radiation source and at least one receiver arrangement for receiving rays from the radiation source, whereby the light intensity change based on the transparent object is independent of the position of the major optical axis h of the transparent object. A particular embodiment envisages two &lgr;/4 small plates, which are each attached to one of two linear polarization filters, which intersect one another.

Abstract: A beam of light from a light source is irradiated toward a surface of a transparent plate at an angle of incidence ranging from 86 to 89 degrees or at an angle of incidence ranging from 60 to 89 degrees after being polarized as a P-polarized light beam or S-polarized light beam by a polarizing element disposed between the light source and the transparent plate. This enables a reflected image from a front surface of the transparent plate to be projected on a screen without being influenced by reflection from a rear surface of the transparent plate. By visually inspecting the reflected image on the screen, or by picking up the reflected image by a camera and visually inspecting a picture on a monitor display, or by picking up the reflected image by a camera to obtain density signals representative of the reflected image and calculating the irregularities of the surface of the transparent plate on the basis of the density signals by an image processor.

Abstract: A method and apparatus for detecting position deviation of an electron gun in which, by increasing the light utilization efficiency to render the field of sight lighter and by reducing the amount of reflected light from the grid surface, the reflected light from the electron beam emitting surface is lighter to enable an edge of an electron beam transmitting hole to be discerned accurately to detect the position deviation of the electron gun accurately. The linear polarized light is illuminated on the electron gun and the light reflected by this electron gun is observed by a light polarization unit to detect the position deviation between grids of the electron gun.