Abstract: Briefly stated, the present invention discloses a novel device that automatically calibrates and adjusts the intensity, dosage, and other parameters of a radiation delivery system and radiation source based on selected or detected radiation delivery systems. Such radiation delivery systems include optical fiber systems, and any type of diffuser, as well as bare fiber tips. The functions of a radiation source and a calibration device are combined by storing the characteristics of a wide variety of delivery system types and brands and calibrating the radiation based on those stored characteristics. In a preferred embodiment, a calibration sheath is provided that fits over a delivery system, such as a bare fiber tip or a diffuser at the distal end of a fiber, to both protect the system during calibration and direct output radiation to a detector.

Abstract: The present invention relates to a method for calibrating elements in a spatial light modulator (SLM) as a function of an applied element control signal. A plurality of elements are calibrated simultaneously. A beam of electromagnetic radiation is projected onto at least a part of the SLM. An image of said part of said SLM is formed on a device for measuring intensity of electromagnetic radiation. Element calibrating data is generated by using the intensity data as a function of the applied element control signal by either driving a sub-matrix comprising at least two elements out of said part of the SLM to a sequence of applied element control signals or by seeking out the control signal for each element which give the same predetermined intensity value on the device for measuring the intensity of electromagnetic radiation and stepping through N different predetermined intensity values. The invention also relates to an apparatus for patterning a workpiece having such a calibration method.

Abstract: An image forming apparatus including a detector, a write controller, and a light controller. The detector detects, with an optical sensor, an edge of a recording medium in a direction perpendicular to a reading medium convey direction. The write controller shifts an image write position in the direction perpendicular to the recording medium convey direction on the basis of a detection result of the detector. The light controller controls a light emission amount of the optical sensor to set an output of the optical sensor to a predetermined value at a predetermined portion in an area where the detection result of the optical sensor is effective.

Abstract: A built-in autotuning system of a motor control system provides an autotuning of the motor control system based on BQF. The system measures the effective inertia and determines whether there exists a high-frequency resonance. If there is a high-frequency resonance, the system sets the BQF as a low pass filter, otherwise the system sets the BQF as a high pass filter. The system then adjusts the gains of the controller to set the phase and gain margins within a specified values.

Abstract: The present invention provides a method and system for optimizing the time required for scanning a document with any conventional scanner. More specifically, the present invention will utilize calibration information from the initial power-up calibration or any other calibration, and the information from any previous scans to expedite or eliminate the need for future calibration requests. This process will save time for the user to obtain an optimal scan and increase the operable life span of the scanner by eliminating many repetitive scan cycles.

Abstract: The disclosed electronic processing apparatus calculates and applies calibrations to sensors that produce quasi-sinusoidal, quadrature signals. The apparatus includes either or both of fixed and programmable electronic circuits. The apparatus includes a circuit to calculate the phase and magnitude corresponding to the two input (quadrature) signals. The apparatus also includes a circuit for accumulating the number of cycles of the input signals. The apparatus also includes a circuit to generate Gain, Offset, and Phase calibration coefficients, wherein the circuit compares the phase space position of the measured phasor with the position of an idealized phasor, the locus of the idealized phasor in phase space being a circle of predetermined radius with no offset. The calculation of the coefficients occurs without user intervention, according to a pre-programmed rule or rules.

Abstract: A system to monitor light emitting diodes (LEDs) in a printbar is described. The system integrates photodetectors into a printer or into the printbar itself such that as the printbar ages, the photodetectors can detect the decrease in intensity of the LEDs in the printbar and recalibrate driver circuits providing power to each LED. The recalibrated power output of each driver circuit compensates for nonuniformities in the LEDS that result from uneven aging of the LEDs.

Abstract: A scanner and calibration method use therein. Setting first exposure duration and a second exposure duration for a transparency, wherein the first exposure duration is proportional to the second exposure duration. Scanning the transparency and a calibration area to produce a scan signal and a calibration signal, respectively, wherein the exposure duration for scanning the transparency is referred to as the first exposure duration, and the exposure duration for scanning the calibration area is referred to as the second exposure duration. Calculating a first gain coefficient according to the calibration signal. Calculating a second gain coefficient according to the first gain coefficient and a specific ratio of the first exposure duration to the second exposure duration, and finally, amplifying the scan signal by the second gain coefficient.

Abstract: The invention relates to a method for the geometrical measurement of a material strip (2), whereby the material strip (2) defines a longitudinal direction, whereby, by means of a first measuring device with at least one radiation source (6) and with at least one detector (8), the strip thickness of the material strip (2) is determined, whereby for this purpose the radiation (10) from the radiation source (6) penetrates the material strip (2) at at least one measurement point (12) arranged in the material strip (2), and the resultant weakening of the intensity of the radiation (10) is determined by the corresponding detector (8). It is proposed that, by means of a second measuring device, the transverse contour of the material strip (2) is determined. In this situation, the measurement of the strip thickness and the transverse contour is effected at the same place on the material strip. The measured values of the thickness measurement are corrected with the measured values of the transverse contour.

Abstract: A system (100) and method for focal plane array calibration using an internal non-uniform calibration source (30). In the illustrative embodiment, the system (100) includes a first mechanism (16) for calculating a relative gain of each detector element in the focal plane array (20) relative to at least one reference element, a second mechanism (17) for obtaining the absolute gain of the reference element, and a third mechanism (18) for calculating the absolute gains for all other detector elements using the relative gains in conjunction with the absolute gain of the reference element. The relative response of each pixel is calculated from measurements of the response of each pixel using an internal calibration source (30) at two or more different source positions, and two illumination intensities at each position. Measurements using a pair of source positions separated by k pixels establishes the relative response of the ith pixel with respect to the (i+k)th pixel.

Abstract: A testing system operable to accurately position a plurality of contact electrodes relative to a plurality of electrical contacts is disclosed. For one embodiment, the testing system comprises a first imaging system coupled to a wafer chuck. The wafer chuck is used to place the electrical contacts of a wafer in contact with the plurality of electrodes. To facilitate accurate positioning between the wafer electrical contacts and the contact electrodes, the first imaging system is configured to locate the plurality of contact electrodes. The testing system also comprises a second imaging system configured to locate the wafer electrical contacts. An image generator coupled to the first imaging system generate an alignment image on a focal point of the first imaging system. The testing system calibrates the first imaging system to the second imaging system using the alignment image.

Abstract: A method of calibrating a position measurement device which device utilizes signals from a plurality of detectors, more than two of which view at least one edge between a dark region and a light region at any one position, comprising: measuring the signals of the plurality of detectors at a plurality of positions with respect to the edge; and calculating at least one average of some of the measured signals from individual ones of the detectors that do not view the edge at the position; and calibrating the individual detectors based on averages.

Abstract: A system and method are provided for calibrating an output from a sensor array in a scanner. The system comprises a processor circuit having a processor and a memory. Stored on the memory and executable by the processor is the scanner calibration logic. The scanner calibration logic comprises logic for determining a minimum dark value for the sensor array, and logic for determining an optimum exposure time of a number of light sources associated with the sensor array. The scanner calibration logic also includes logic for determining a maximum white value for the sensor array at the exposure time, and logic for setting an analog offset based upon the minimum dark value. The scanner calibration logic further comprises logic for setting an analog gain associated with the sensor array based on a sensor output range from the minimum dark value to a maximum white value.

Abstract: A testing system operable to accurately position a plurality of contact electrodes relative to a plurality of electrical contacts is disclosed. For one embodiment, the testing system comprises a first imaging system coupled to a wafer chuck. The wafer chuck is used to place the electrical contacts of a wafer in contact with the plurality of electrodes. To facilitate accurate positioning between the wafer electrical contacts and the contact electrodes, the first imaging system is configured to locate the plurality of contact electrodes. The testing system also comprises a second imaging system configured to locate the wafer electrical contacts. An image generator coupled to the first imaging system generate an alignment image on a focal point of the first imaging system. The testing system calibrates the first imaging system to the second imaging system using the alignment image.

Abstract: A method and apparatus for non-invasively measuring a biological attribute, such as the concentration of an analyte, particularly a blood analyte in tissue such as glucose. The method utilizes spectrographic techniques in conjunction with an improved subject-tailored calibration model. In a calibration phase, calibration model data is modified to reduce or eliminate subject-specific attributes, resulting in a calibration data set modeling within- subject physiological variation, sample location, insertion variations, and instrument variation. In a prediction phase, the prediction process is tailored for each target subject separately using a minimal number of spectral measurements from each subject.

Abstract: A method and apparatus for strip insertion detection in an analytical meter system. The invention allows for individual meter calibration, adaptive thresholding and ambient light correction. Increased performance is economically realized, while providing enhanced meter accuracy in varying light conditions.

Abstract: Computation of digital gains and offsets used in digital scanners for shading correction (linearity correction) is particularly vulnerable to imperfections in the reference strips, particularly the light reference strip. It is extremely difficult and expensive to create references which are completely free of imperfections or contaminated in some way. This invention eliminates artifacts caused by the presence of small imperfections on the references. It does so by detecting the presence of an artifact and then excluding data contributed by the artifact from the calibration computation process.

Abstract: Computation of digital gains and offsets used in digital scanners for shading correction (linearity correction) is particularly vulnerable to imperfections in the reference strips, particularly the light reference strip. It is extremely difficult and expensive to create references which are completely free of imperfections or contaminated in some way. This invention eliminates artifacts caused by the presence of small imperfections on the references. It does so by detecting the presence of an artifact and then excluding data contributed by the artifact from the calibration computation process.

Abstract: A method an apparatus for strip insertion detection in an analytical meter system. The invention allows for individual meter calibration, adaptive thresholding and ambient light correction. Increased performance is economically realized, while providing enhanced meter accuracy in varying light conditions.

Abstract: The detection threshold of an optical sensor is dynamically calibrated by measuring the maximum and minimum levels of the analog output produced by the sensor's light detector and setting the detection threshold of the sensor at an intermediate level between the two. The new detection threshold thus established is then used as the voltage reference that determines the logic state of the system. The invention may be implemented using analog-to-digital converter hardware already embedded in the system. Alternatively, the invention may be implemented using digital-to-analog converter hardware that may also be already present in the system.

Abstract: The invention concerns a method for wavelength calibration of an electromagnetic radiation filtering device (16) included in an apparatus (10; 32) measuring spectral transmission of a propagating medium external to said apparatus and wherein said radiation flows through, said filtering device having spectral transmission tuneable on a wavelength range based on the value of a physical parameter. The invention is characterized in that it consists in: selecting at least one absorbing gaseous line which is always present in natural form in the propagation medium and whereof the corresponding wavelength is included in said filtering device tunability wavelength range; and in calibrating the filtering device with respect to said at least one absorbing gaseous line which is used as natural reference.

Abstract: A method of calibrating a position measurement device which device utilizes signals from a plurality of detectors, more than two of which view at least one edge between a dark region and a light region at any one position, comprising:

Abstract: For calibrating a spectrophotometer having a monochromator with a rotary mechanism to rotate a diffraction grating for producing a monochromatic beam of light of a specified target wavelength, transmission errors by the rotary mechanism are preliminarily measured to obtain an error curve having peaks corresponding to feed angles. A smallest angular interval, greater than an allowable limit, between a pair of feed angles corresponding to a mutually adjacent pair of peaks in the error curve is selected. One or more lamps emitting bright lines with wavelength interval which corresponds to motion of the rotary mechanism by less than one half of the selected smallest angular interval are used as a light source. Control values to be supplied to the rotary mechanism for obtaining monochromatic beams of light from the bright lines emitted from the selected lamps are determined by measurements.

Abstract: For the purpose of calibration which is simple and can also be carried out as often as desired, an arrangement and a method for calibrating a preferably confocal laser scanning microscope, it being possible for an object (1) to be scanned by a scanning beam (2), are defined by calibration means (12) which are arranged in the plane of an intermediate image (11) and can likewise be scanned by the scanning beam (2).

Abstract: A friction drive apparatus includes an edge detection system for determining a lateral position of a strip material advancing in a longitudinal direction. The edge detection system includes a first sensor and a second sensor for monitoring the lateral position of the strip material. The friction drive apparatus also includes instructions for automatically aligning the strip material as the strip material is advanced a predetermined aligning distance and instructions for calibrating the second sensor with respect to the first sensor to compensate for any potential discrepancies therebetween. The apparatus and methods of the present invention ensure that the strip material is properly aligned in the friction drive apparatus and limit waste of strip material during those operations.

Abstract: A manuscript document detecting system and method, wherein a rotatable body having a scanning mirror surface is rotated by a motor, and thereby light emitted from an light-emitting-diode (LED) is guided to a surface of a manuscript document. The rotatable body directs, toward a photo-diode (PD), light reflected from the manuscript document and a light-reflection processing device on a rear surface of an outer frame of a manuscript document mounting stand generates a light receiving signal. The rotatable body further includes an encoder having a row of slits mounted on a circular disk. When the slits pass through a photo sensor, pulse signals are output therefrom. Disturbance light reflected when a pressing plate, which holds the manuscript document against the mounting stand, is lifted generates a light receiving signal of a 75% duty cycle. The reflected light from the manuscript document generates a light receiving signal of a 25% duty cycle.

Abstract: A proximity sensor receives light beams reflected from a goods. A proximity sensor control unit determines that the goods exists when a light quantity of the reflected light received by the proximity sensor exceeds a determination threshold value. The determination threshold value increases as elapsed time since the bar code was read last time becomes longer, and, as a result, a detection sensitivity decreases. A CPU restores a duty of irradiation of the laser beam back to 100% and resumes rotations of a motor for driving an operation optical system when the proximity sensor control unit determines that the goods exists.

Abstract: A method and apparatus measure the accuracy of and optically calibrate a scan mirror. Both the method and apparatus may operate over a wide range of environmental conditions. The environmental conditions may include variations in pressure from a vacuum to several atmospheres. Similarly, large variations in temperature may be accommodated. The apparatus includes a laser source, a plurality of facet mirrors and a detector. The laser source projects a beam onto a reflective surface of a rotatable scan mirror, which directs the beam to each of the plurality of facet mirrors. Each facet mirror is positioned at a known angle. Each facet mirror in turn reflects the beam from the reflective surface of the scan mirror substantially back onto itself (autocollimation). The angle detector then receives the reflected beam and measures a value related to a return angle of the beam.

Abstract: A temperature compensation system (300) is provided for compensating measurements from a sensor (240). A temperature transducer (310) is placed in close proximity to a manufacturing workstation as a means of measuring the ambient temperature associated with the workstation (200). A reference workpiece (100) is placed within a sensing zone of the sensor (240). The system (300) includes a temperature compensating module (320) that is connected to the sensor (240) and to the temperature transducer (310) for determining a baseline measurement of the reference workpiece at a reference temperature. The temperature compensating module (320) is further adapted for collecting a plurality of measurements of the reference workpiece over a plurality of temperatures for establishing a relationship between these measurements and their corresponding temperature values.