Abstract: A method and system for detecting a fall risk condition, the system comprising a surveillance camera configured to generate a plurality of frames showing an area in which a patient at risk of falling is being monitored, and a computer system comprising memory and logic circuitry configured to store motion feature patterns that are extracted from video recordings, the motion feature patterns are representative of motion associated with real alarm cases and false-alarm cases of fall events, receive a fall alert from a classifier, determine motion features of one or more frames from the plurality of frames that correspond to the fall alert; compare the motion features of the one or more frames with the motion feature patterns, and determine whether to confirm the fall alert based on the comparison.

Abstract: There is provided a method and a system configured to obtain an image of a one or more first areas of a semiconductor specimen acquired by an examination tool, determine data Datt informative of defectivity in the one or more first areas, determine one or more second areas of the semiconductor specimen for which presence of a defect is suspected based at least on an evolution of Datt, or of data correlated to Datt, in the one or more first areas, and select the one or more second areas for inspection by the examination tool.

Abstract: Disclosed is a system, method and computer readable medium for selecting a coreset of potential defects for estimating expected defects of interest. An example method includes obtaining a plurality of defects of interest (DOIs) and false alarms (FAs) from a review subset selected from a group of potential defects received from an inspection tool. The method further includes generating a representative subset of the group of potential defects. The representative subset includes potential defects selected in accordance with a distribution of the group of potential defects within an attribute space. The method further includes, upon training a classifier using data informative of the attribute values of the DOIs, the potential defects of the representative subset, and respective indications thereof as DOIs or FAs, applying the classifier to at least some of the potential defects to obtain an estimation of a number of expected DOIs in the specimen.

Abstract: To obtain an absorption distribution from a detected signal with a practical device. Light is applied to a subject, and a photoacoustic signal generated in the subjectA photoacoustic is detected. From the detected photoacoustic signal, a light differential waveform, which is a differential waveform of a temporal waveform of the light applied to the subject, is deconvolved. As a result of this deconvolution, an absorption distribution is obtained.

Abstract: A surface topography of a sample with a transparent surface layer is measured using surface topographies of a reference sample. The surface topographies of the reference sample are measured before and after the deposition of an opaque film over the surface layer. A surface topography of the sample is measured at the same relative positions as the surface topography measurements of the reference sample. A height difference at multiple corresponding positions on the sample and the pre-opaque film reference sample is determined. The actual surface height of the reference sample at each position is known from the surface topography of the post-opaque reference sample. The actual surface topography of the sample is determined by combining the actual surface heights of the reference sample with the determined height differences. The resulting surface topography of the sample may be used to characterize the sample, such as detecting defects on the sample.

Abstract: A method and system for detecting a fall risk condition, the system comprising a surveillance camera configured to generate a plurality of frames showing an area in which a patient at risk of falling is being monitored, and a computer system comprising memory and logic circuitry configured to store motion feature patterns that are extracted from video recordings, the motion feature patterns are representative of motion associated with real alarm cases and false-alarm cases of fall events, receive a fall alert from a classifier, determine motion features of one or more frames from the plurality of frames that correspond to the fall alert; compare the motion features of the one or more frames with the motion feature patterns, and determine whether to confirm the fall alert based on the comparison.

Abstract: An inspection system that may include a motion device, for supporting an inspected object and for moving the inspected object, in response to motion device triggering signals, by a movement that is characterized by speed variations; a signal generator, for generating camera triggering signals and motion device location triggering signals; a motion device location generator, for providing location information indicative of locations of the stage at points of time that are determined by the motion device location triggering signals; a continuous illuminator for continuously illuminating areas of the inspected object; and a camera for acquiring images of areas of the inspected object in response to the camera triggering signals.

Abstract: A display system includes: an imaging unit that images a mold from below; and a display unit that displays an image taken by the imaging unit together with a carry-in range of the mold in order to transport the mold in place between the stationary platen and the moving platen.

Abstract: An electrooptic device includes a plurality of first pixels, a plurality of second pixels, a first supplying section that supplies a first data signal to the first pixels and drives the first pixels, a second supplying section that supplies a second data signal to the second pixels and drives the second pixels, and a controller that supplies a third data signal to the first supplying section and supplies a fourth data signal to the second supplying section. The first supplying section generates the first data signal based on the third data signal. The second supplying section generates the second data signal based on the fourth data signal. The controller individually corrects a fifth data signal serving as a source of the third data signal and a sixth data signal serving as a source of the fourth data signal and generates the third data signal and the fourth data signal.

Abstract: A radial imaging system is provided for capturing an image of an object which extends radially around an image sensor in an object plane. A reflector (42) is used for reflecting incident light (46) to a generally axial direction. The image sensor (40) receives the generally axially directed reflected light, and it has a stepped reflector surface having a series of reflecting linear facets (48) which together form a generally curved, e.g. concave surface. This design enables improved uniformity of the imaging performance with respect to the radial distance to the object being imaged.

Abstract: A method for creating an electronic device including a semiconductor substrate, an element unit, a through wiring line, and a wiring portion includes forming interstitial via holes in a first surface of the substrate, forming a first insulating film on the inner walls of the via holes, forming openings that reach the first insulating film on the bottoms of the via holes from a second surface of the substrate, forming a second insulating film on the bottoms of the openings, forming a through wiring line in the via holes, forming an element unit that electrically connects the through wiring line, reducing the thickness of the substrate from the second surface so that the second surface becomes flush with the second insulating film on the bottoms of the openings, and forming a wiring portion, on the second insulating film, that electrically connects to the through wiring line.

Abstract: A method and system for detecting a fall risk condition, the system comprising a surveillance camera configured to generate a plurality of frames showing an area in which a patient at risk of falling is being monitored, and a computer system comprising memory and logic circuitry configured to store motion feature patterns that are extracted from video recordings, the motion feature patterns are representative of motion associated with real alarm cases and false-alarm cases of fall events, receive a fall alert from a classifier, determine motion features of one or more frames from the plurality of frames that correspond to the fall alert; compare the motion features of the one or more frames with the motion feature patterns, and determine whether to confirm the fall alert based on the comparison.

Abstract: An acoustic wave is modified by initiating excitation of an acoustic wave from a first location on a substrate to a second location on the substrate and selectively heating the second location of the substrate so as to alter a property of the second location. With such arrangements, the altered property of the second location modifies the acoustic wave to result in a modified acoustic wave that is propagated from the second location to a third location on the substrate. Related apparatus, systems, and methods are also described.

Abstract: A method and system for detecting a fall risk condition, the system comprising a surveillance camera configured to generate a plurality of frames showing an area in which a patient at risk of falling is being monitored, and a computer system comprising memory and logic circuitry configured to store motion feature patterns that are extracted from video recordings, the motion feature patterns are representative of motion associated with real alarm cases and false-alarm cases of fall events, receive a fall alert from a classifier, determine motion features of one or more frames from the plurality of frames that correspond to the fall alert; compare the motion features of the one or more frames with the motion feature patterns, and determine whether to confirm the fall alert based on the comparison.

Abstract: A method of inspecting a silicon article includes irradiating a silicon article with infrared radiation, transmitting a portion of the infrared radiation through the silicon article, and filtering the infrared radiation transmitted through the silicon article. Image data is acquired from the filtered infrared radiation and an image of the silicon article reconstructed from the image data. Based on the reconstructed image of the silicon article, one or more anomalies defined within the silicon article are identified.

Abstract: A desired structure is selectively imaged by photoacoustic imaging. Photoacoustic signals are detected, and the detected photoacoustic signals are reconstructed to generate photoacoustic image data. A Fourier transform in a two-dimensional or higher dimensional space is applied to the photoacoustic image data to generate spatial frequency domain photoacoustic image data. Given spatial frequency components are extracted from the spatial frequency domain photoacoustic image data, and an inverse Fourier transform is applied to the extracted spatial frequency components to generate spatial frequency-processed photoacoustic image data.

Abstract: The invention relates to a method for assessing the depth of a crack near the surface of a material, characterized in that said method includes the following steps: heating an area located near the crack using of a heat source (2) that is periodically modulatable into a heat flow at a controllable frequency, a so-called “modulation frequency”, varying the frequency so as to vary the heat diffusion length between an initial value, less than the distance between the heated area and the crack, and a final value that is greater than the distance between the heated area and the crack; determining the variation, depending on the heat diffusion length, in a function on the basis of at least one derivative, relative to a space variable, of the amplitude of the sinusoidal component of the temperature, on the surface of the material and at the modulation frequency, at each point of a set of points of the crack so as to cause a first area of variation in the function to appear, wherein said function increases at a first

Abstract: An apparatus (10) is provided for inspecting a flexible glass ribbon. In one example, the apparatus includes at least one storage roll (16) for storing a length of the flexible glass ribbon (12). In another example, the apparatus further includes an inspection device (50). In yet another example, the inspection device can inspect a characteristic of an unrolled portion (28) of the flexible glass ribbon (12) spanning along a travel path (14) of the flexible glass ribbon.

Abstract: The invention teaches a new apparatus and method to photograph glasses in multiple layers for taking high quality photo images with scratch, crash, black/white defect, lack, crack, pin-hole, concave edge and raised edge, bubble and smudge defects on the surface-layer, backside-layer or/and mid-layer of the glasses. The invention also introduces flexible and expendable photographing hardware architecture that will meet various customers inspecting defects requirements and speed requirements.

Abstract: This invention discloses a super-resolution microscopy method and device, of which the method comprises the following steps: converting laser beam into linearly polarized light after collimation; linearly polarized light is deflected and phase modulated by a spatial light modulator; the deflected beam is focused, collimated and then converted into circularly polarized light for projection on the sample to collect signal light from various scanning points on the sample, and obtaining the first signal light intensity; switching over modulation function to project linearly polarized light modulated by the second phase modulation on the sample to collect signal light from various scanning points on the sample, and obtaining the second signal light intensity; calculating valid signal light intensity to obtain the super-resolution image.

Abstract: A system for generating an image of a seal impression. The system includes: means for acquiring N still images of a face of a seal corresponding respectively to N beams of light striking the face in succession, wherein N is at least 2; and means for combining the N still images to generate a composite image of pixels, wherein a common area of pixels in the composite image appears on the face of the seal in all still images of the N still images, and wherein the common area includes a character area pertaining to where an engraved character is located on the face of the seal.

Abstract: Device for detecting the position of at least a first and a second hand of an electromechanical watch, said first and second hands moving above a dial, the detection device including a single light source emitting a light beam towards the first and second hands, and a first and a second light detection system, the light source and the first and second light detection systems being mounted on or underneath the dial, the light source and the first and second light detection systems being arranged so that, in a determined position of the first hand, the light beam emitted by the light source is reflected by the first hand towards the first detection system, and in a determined position of the second hand, the light beam emitted by the light source is reflected by the second hand towards the second detection system.

Abstract: A defect detecting apparatus detects a defect that is present on the outer circumferential surface of work having the outer circumferential surface thereof formed as a bent surface. The defect detecting apparatus is provided with: a jig which supports the work, and holds the work in a state wherein the work is rotated by a predetermined angle; an image pickup device, which picks up an image of the outer circumferential surface of the work held by the jig, the work being in the state wherein the work is rotated by the predetermined angle; and a controller, which processes an image obtained by means of the image pickup device, and determines a defect.

Abstract: A method and system to map density and temperature of a chip, in situ, is disclosed. The method includes measuring a propagation time that a mechanical propagation wave travels along at least one predefined path in a substrate. The method further includes calculating an average substrate density and temperature along the at least one predefined path as a function of the propagation time and distance. The method further includes determining a defect or unauthorized modification in the substrate based on the average substrate density being different than a baseline substrate density.

Abstract: A monitoring system for monitoring a patient in a patient-support apparatus includes a detector, a standard, and a controller. The detector detects electromagnetic radiation in a field. The standard conveys a predetermined electromagnetic signature to the detector. The controller monitors the electromagnetic radiation in the field and compares the electromagnetic radiation to the standard to determine the position of a patient supported on a patient-support apparatus positioned in the field.

Abstract: Systems and methods for imaging an imprinted substrate on a printing press is provided. One method comprises sensing light reflected by the substrate using a contact image sensor to produce data representative of the imprinted substrate. The substrate has been imprinted with different colors at a plurality of printing units of the printing press. Each printing unit comprises a plate cylinder. The data representative of the imprinted substrate is output by the contact image sensor as analog voltage signals. The method further comprises receiving the analog voltage signals from the contact image sensor at a sensor interface circuit and converting the analog voltage signals to digital signals using an analog-to-digital converter of the sensor interface circuit. The method further comprises processing the digital signals using the sensor interface circuit to produce corrected digital signals and storing data based on the corrected digital signals in a memory.

Abstract: Inspection guided overlay metrology may include performing a pattern search in order to identify a predetermined pattern on a semiconductor wafer, generating a care area for all instances of the predetermined pattern on the semiconductor wafer, identifying defects within generated care areas by performing an inspection scan of each of the generated care areas, wherein the inspection scan includes a low-threshold or a high sensitivity inspection scan, identifying overlay sites of the predetermined pattern of the semiconductor wafer having a measured overlay error larger than a selected overlay specification utilizing a defect inspection technique, comparing location data of the identified defects of a generated care area to location data of the identified overlay sites within the generated care area in order to identify one or more locations wherein the defects are proximate to the identified overlay sites, and generating a metrology sampling plan based on the identified locations.

Abstract: The invention provides a system for sensing a cigarette filter, comprising: a plurality of rotary conveyance drums (12) delivering a first cigarette filter and second cigarette filters into which the first cigarette filter is divided by a cutter; two sensors (18) disposed adjacent to the rotary conveyance drum (12) to detect the second cigarette filters; an opto coupler connected to the two sensors (18) and operated by AND logic; a HIP connected to the opto coupler, it controlling a device of supplying cigarette filters to reject a cigarette having defects; and, a PLC connected with the HIP, it controlling the device of supplying cigarette filters, wherein the two sensors (18) detect active charcoal filters located at both ends of the second cigarette filters, the HIP controls the device such that the cigarette having defects are rejected when signals sensed by the sensors (18) are different from signals sensed from the normal active charcoal filter, the PLC controls the operation and stop of the device by pe

Abstract: A multifunction detector for detecting energy reflected from the surface, the detector comprising: a focal plane array in communication with the optical receiving path; and an optical receiving path; a read-only integrated circuit in communication with the optical receiving path, integrated with a focal plane array; and a processor programmed to operate the focal plane array and read-out integrated circuit in a first mode to process signals in a first frequency band, and in a second mode to process signals in a second, wider frequency band.

Abstract: Various embodiments related to monitoring for optical faults in an optical system are disclosed. For example, one disclosed embodiment provides, in an optical system comprising a light source, a light outlet, and an optical element disposed between the light source and the light outlet, a method of monitoring for optical system faults. The method includes detecting, via a light sensor directed toward an interface surface of the optical element closest to the light source, an intensity of light traveling from the interface surface of the optical element to the light sensor, and comparing an intensity of light detected to one or more threshold intensity values. The method further includes identifying an optical system fault condition based on comparing the intensity of light detected to one or more threshold values, and modifying operation of the optical system.

Abstract: An image forming apparatus includes a sensor having a light emitting section for irradiating a detection area and a light receiving section for outputting a light sensitive signal indicative of the amount of the light received from the detection area. A sensor adjustment section adjusts the sensitivity of the sensor by varying the set value of an adjustable characteristic value associated with the sensitivity, based on explorative measurement of the adjustable characteristic value corresponding to a predetermined reference level of the light sensitive signal. If an estimation section estimates that the amount of a leakage current generated on the light receiving section is larger than a reference amount, a mitigation section mitigates the influence of the leakage current on the explorative measurement, by at least one of adjustment of the light receiving section for reduction of the leakage current and modification of the predetermined reference level.

Abstract: The invention relates to a system for determining a position by emitting a first laser beam (7) by a laser source (6) positioned in a reference system onto a detector (1) and simultaneously detecting the first laser beam (7) by the detector (1), thus defining an emission direction of the laser source (7). The detector (1) has a segmented detection area comprising a plurality of discrete partial detection areas (17), each having a defined partial detection direction and at least two partial detection directions thereof being different. When detecting the first laser beam (7), an impingement point (9) of the first laser beam (7) on the detector (1) is detected by means of at least one partial detection area (17), and when determining the incidence direction (10), said direction is derived from the at least one partial detection direction. The location of the detector (1) relative to the laser source (6) and the reference system is then determined using the emission direction and the incidence direction (10).

Abstract: Design data and sample characteristic information corresponding to individual areas on the design data are used to perform an image quality improvement operation to make appropriate improvements on image quality according to sample characteristic corresponding to the individual areas on the image, allowing a high speed area division on the image. Further, the use of a database that stores image information associated with the design data allows for an image quality improvement operation that automatically emphasizes portions of the image that greatly differ from past images of the similar design data.

Abstract: A method of imaging an imprinted substrate on a printing press is provided. The method comprises sensing light reflected by the substrate using a contact image sensor to produce data representative of the imprinted substrate. The substrate has been imprinted with different colors at a plurality of printing units of the printing press. Each printing unit comprises a plate cylinder. The method further comprises storing the data representative of the imprinted substrate in a memory.

Abstract: A method of inspecting an imprinted substrate on a printing press comprises illuminating a portion of the substrate which has been imprinted with different colors at a plurality of printing units of the printing press. The method further comprises sensing light reflected by the substrate using a contact image sensor to produce data representative of the imprinted substrate, and comparing the data representative of the printed substrate with stored reference data.

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic or monochromatic illumination source. The illumination is positioned in certain locations including locations where the layer stack includes a reduced number of thin film layers. Such locations may be discrete sampled points located within scribe lines, contact frames or dedicated measurement targets. The light collected from such discrete sampled points is transferred to a photo-sensitive sensor through an optical switch. The spectral signal of the light reflected, transmitted or scattered by the sampled points is collected by the sensor and processed by a controller in such a way that parameters of simplified stacks are used for accurate determination of desired parameters of the full cell stack. In this way the photovoltaic thin film parameters applicable to the quality control are derived e.g.

Abstract: To perform a method for identifying color measuring strips having measuring areas on printed products, the color measuring strips are scanned with a color measuring instrument. The measured color values acquired by the color measuring instrument are stored in a computer and that the measured color values acquired are each assigned to a printing ink. A sequence formed in this way of printing inks is stored in the computer and then compared with color measuring strip types stored in the computer. The stored color measuring strip type having the greatest probability is then selected.

Abstract: A method of inspecting an imprinted substrate on a printing press comprises illuminating a portion of the substrate which has been imprinted with different colors at a plurality of printing units of the printing press. The method further comprises sensing light reflected by the substrate using a contact image sensor to produce data representative of the imprinted substrate, and comparing the data representative of the printed substrate with stored reference data.

Abstract: An inspection system for inspecting an imprinted substrate on a printing press has a light source, a contact image sensor, and a processor. The light source is configured to illuminate a portion of the substrate which has been imprinted with different colors at a plurality of printing units of the printing press. The contact image sensor has a plurality of sensing elements. Each sensing element senses light reflected by a corresponding region on the substrate to produce data representative of the corresponding region printed on the substrate. The processor is configured to receive the data representative of the imprinted substrate and to compare the data representative of the corresponding region printed on the substrate with stored reference data.

Abstract: An automated defect inspection system has been invented and is used on patterned wafers, whole wafers, broken wafers, partial wafers, sawn wafers such as on film frames, JEDEC trays, Auer boats, die in gel or waffle packs, MCMs, etc. and is specifically intended and designed for second optical wafer inspection for such defects as metalization defects (such as scratches, voids, corrosion, and bridging), diffusion defects, passivation layer defects, scribing defects, glassivation defects, chips and cracks from sawing, solder bump defects, and bond pad area defects.

Abstract: Fabric wrinkles are automatically evaluated using a reliable, accurate, affordable, and efficient system. Two algorithms are used, the facet model algorithm and the plane-cutting algorithm, to extract features for evaluating wrinkles in fabrics. These algorithms eliminate the need for independent evaluation of a fabric specimen by a technician.

Abstract: A method of reducing receipt fraud comprises attempting to detect emission from a receipt associated with one or more luminescent markers that are incorporated in a valid receipt. The receipt is validated when the attempt is successful.

Abstract: An exposure method for exposing a pattern of a reticle onto a plate, via a projection optical system, while synchronously scanning the reticle and the plate. The exposure method includes the steps of (a) measuring before exposing, the measuring step including (i) a first substep of obtaining surface form data that shows a surface form of the reticle, and (ii) a second substep of detecting a measurement position having an abnormal measurement result as an error measurement position among measurement positions, to measure the surface form of the reticle based on a measurement result of the obtaining substep, and (b) controlling synchronous scanning of the reticle and the plate using the measurement result of the detecting substep, except for the detecting result of the error measurement position.

Abstract: Disclosed are techniques and apparatus for accounting for differing levels of defect susceptibility in different pattern areas of a reticle in an inspection of such reticle or in inspection of a semiconductor device fabricated from such reticle. In general terms, two or more areas of a reticle are analyzed to quantify each area's susceptibility to defects on the final semiconductor product. That is, each reticle area is analyzed and given a quantified defect susceptibility value, such as a MEEF (mask error enhancement factor) value. Such analysis includes analysis of an image that is estimated to result from the lithography tool which is to be utilized to expose semiconductor devices with the reticle. The defect susceptibility value generally depends on the reticle area's density and whether the correspond area of the estimated lithography image has intensity values which are proximate to an exposure threshold for a particular resist material to be used on the final semiconductor device.

Abstract: An apparatus for identifying the condition of a conveyor belt (6) has a capturing device (12) which can be used to capture two-dimensional images (B) of successive belt sections (15) of the conveyor belt (6) during operation of the conveyor belt (6). The capturing device (12) and the evaluation device (13) have a data-processing connection, so that the captured images (B) can be transmitted to the evaluation device (13). The evaluation device (13) compares the images (B) transmitted to it with two-dimensional reference images (R) which are associated with the belt sections (15), determines at least one statement about the condition of the belt on the basis of the comparison, and outputs the statement about the condition of the belt.

Abstract: A web inspection module is described for scanning an imprinted web in a printing press. The web inspection module includes a light source for illuminating a portion of the web, a contact image sensor having a plurality of sensing elements, and a processor for receiving and processing image data representative of the imprinted web.

Abstract: A method and apparatus for protecting an optical transmission measurement when sensing transparent materials. Sensing apparatus located in a housing directs a light beam at an upward angle to a sheet of transparent material and detects downward surface reflections of the beam from the transparent material. The light beam and the reflections pass through a transparent protective layer on the housing. A flow of clean air is passed between the protective layer and the transparent material to remove particles and liquid from the protective layer and from the space between the protective layer and the transparent material. Preferably, the protective layer is either made from a hydrophobic material or has a hydrophobic surface coating to facilitate blowing liquid and particles from the surface.

Abstract: A compensation apparatus for image scan, applied to an optical scanner with a platform, on which an object to be scanned is disposed. The optical scanner has a photosensitive apparatus with a set of scan photosensitive devices and a storage apparatus. When the object is scanned by the set of scan photosensitive devices, a scanned image is obtained and saved in the storage apparatus temporarily. The compensation apparatus has a set of calibration boards, a set of calibration photosensitive devices and an image processor. The set of calibration boards has two calibration boards located at two sides of the platform. The set of calibration photosensitive devices is located at two sides of the set of scan photosensitive device. The image processor is used to extract and compare the calibrated image, so as to adjust the scanned image.

Abstract: In an inspection for protrusion of the melted thermoplastic material of transversal line seal into inside, it is an object to provide a quality inspection method and a quality inspection device which can easily detect projection on edge of seal, securely capture even fine unevenness which could not visually found, and allows for accurate and reliable inspection without variation of inspection. The quality inspection method comprise steps of returning container formed from a web-like packaging laminated material to a shape of pillow-like preliminary forming, cutting container wall to sample a filled food, preparing the sampled body, measuring an edge of the transversal seal zone on the inside of the container over the whole length of the outer surface of the edge for unevenness of the outer surface by a detecting unit, and judging an acceptability of the transversal seal zone based on signals from the detecting unit by an analyzing unit.

Abstract: Various edge detection arrangements are disclosed, including an edge detection method and arrangement that utilizes outputs of commonly illuminated reference and edge sensors as the inputs for a comparator. The reference sensor is configured to have a wide field of view and the edge sensor is configured to have a narrow, high gain, field of view. Therefore, the reference sensor has a broad signal response to an edge passage and the edge sensor a steep and narrow signal response. When the two signals are biased to cross each other, the comparator output changes state, indicating passage of an edge. Because the reference sensor provides a base signal level directly related to the real time illumination level that the edge sensor also receives, the reference sensor provides a switch point along the transition ramp of the edge sensor that integrates a majority of the random error sources.