Focusing Patents (Class 313/382)
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Patent number: 8957394Abstract: One embodiment relates to a high-voltage electron gun including an insulator stand-off having a resistive layer. The resistive layer is at least on an interior surface of the insulator stand-off. A cathode holder is coupled to one end of the insulator 115 stand-off, and an anode is coupled to the other end. The resistive layer advantageously increases the surface breakdown field strength for the insulator stand-off and so enables a compact design for the high-voltage electron gun. Other embodiments, aspects and feature are also disclosed.Type: GrantFiled: November 16, 2012Date of Patent: February 17, 2015Assignee: KLA-Tencor CorporationInventors: Alan D. Brodie, Joseph Maurino, Mark A. McCord, Paul F. Petric
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Patent number: 8952604Abstract: A steak tube 1 has a container 2 with an entrance plate 2a and an output plate 2b; a photocathode 7 disposed in the container 2 and configured to emit electrons according to light to be measured, the light having been incident through the entrance plate 2a; a mesh electrode 3, a first focusing electrode 4, and an aperture electrode 5 forming an axially symmetric electron lens for focusing the electrons emitted from the photocathode 7, toward the output plate 2b; a sweep electrode 6 disposed in the container 2 and configured to sweep the electrons focused by the axially symmetric electron lens, in a sweep direction along the output plate 2b; and a second focusing electrode 9 disposed between the entrance plate 2a and the output plated 2b and forming a one-dimensional electron lens for focusing the electrons in the sweep direction.Type: GrantFiled: August 7, 2012Date of Patent: February 10, 2015Assignee: Hamamatsu Photonics K.K.Inventor: Katsuyuki Kinoshita
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Publication number: 20140292183Abstract: A steak tube 1 has a container 2 with an entrance plate 2a and an output plate 2b; a photocathode 7 disposed in the container 2 and configured to emit electrons according to light to be measured, the light having been incident through the entrance plate 2a; a mesh electrode 3, a first focusing electrode 4, and an aperture electrode 5 forming an axially symmetric electron lens for focusing the electrons emitted from the photocathode 7, toward the output plate 2b; a sweep electrode 6 disposed in the container 2 and configured to sweep the electrons focused by the axially symmetric electron lens, in a sweep direction along the output plate 2b; and a second focusing electrode 9 disposed between the entrance plate 2a and the output plated 2b and forming a one-dimensional electron lens for focusing the electrons in the sweep direction.Type: ApplicationFiled: August 7, 2012Publication date: October 2, 2014Applicant: HAMAMATSU PHOTONICS K.K.Inventor: Katsuyuki Kinoshita
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Patent number: 7167170Abstract: An electron gun used with a multi-media monitor with a low cathode voltage and improved focusing performance. The electron gun, which includes a cathode, a control electrode, a screen electrode, and a plurality of focusing electrodes to focus and accelerate an electron beam, is designed to satisfy the condition that a value of ? is greater than or equal to 0.222 or a value of k is greater than or equal to 0.11, where ?=T1/D, k=T1/L, T1 denotes a thickness of the control electrode, D denotes a diameter of an electron beam aperture of the control electrode, and L denotes the distance between a beam-entering surface of the control electrode and a beam-emitting surface of the screen electrode.Type: GrantFiled: December 30, 2002Date of Patent: January 23, 2007Assignee: Samsung SDI Co., Ltd.Inventors: Min-cheol Bae, Jong-hoon Choi
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Patent number: 6396221Abstract: A color cathode-ray tube including a main lens section comprising an anode to which an anode voltage is applied, and a focus electrode. The focus electrode has first type of focus electrode group to which a first focus voltage is applied, and a second type of focus electrode group to which a second focus voltage is applied which is obtained by superposing on a predetermined voltage a voltage that changes depending upon the deflecting amount of the electron beams. Between the first type of focus electrode group and the second type of focus electrode group are formed in a dynamic lens and an electrostatic quadrupole lens. Three electron beam passage holes are formed in the electrodes that form the dynamic lens and the centers for the outer electron beam passage holes in the first type of focus electrode group are deviated relative to the centers of the outer electron beam passage holes in the second type of focus electrode group in the horizontal direction.Type: GrantFiled: September 15, 2000Date of Patent: May 28, 2002Assignee: Hitachi, Ltd.Inventors: Go Uchida, Syoji Shirai, Shinichi Kato, Masafumi Nagaoka
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Patent number: 6072546Abstract: A correct estimation of a focussed condition of the cathode ray tube can be performed. A predetermined image (14) is displayed at a predetermined position on a screen of a cathode ray tube. A focussing voltage of the cathode ray tube is varied in a condition that a distance from a reference position to a predetermined position in the image is detected. When the changing state of the detected distance is displayed on a predetermined display means (11a), an optical low pass filter is arranged in the optical system such as the incident part of a sensor (15) or the like. From an output of the sensor (15), a condition is determined as the just-focussed condition, the under-focussed condition or the over-focussed condition and the beam spot diameter is calculated from the detected line width. On the basis of the decision of the under-focussed or the over-focussed condition and the calculated value of the beam spot diameter, a focus quantitative value is obtained.Type: GrantFiled: August 28, 1997Date of Patent: June 6, 2000Assignee: Sony CorporationInventor: Tomoyasu Nakayabu
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Patent number: 5095243Abstract: Electrons emitted from a photocathode in response to incident X-rays are accelerated and focused onto a microchannel plate (MCP). The electrons multiplied by the MCP are converted into a visible light image by a phosphor screen. An envelope tube is curved at a halfway portion, and the electrons are deflected by a deflection coil so as to travel along the curved envelope tube and enter the MCP. Even if X-rays are transmitted from the photocathode, they do not enter the MCP directly and hardly contribute to the background noise. A limiting aperture ring may further be employed to prevent the X-rays reflected by the inside wall of the envelope tube from entering the MCP.Type: GrantFiled: October 18, 1990Date of Patent: March 10, 1992Assignee: Hamamatsu Photonics K. K.Inventors: Katsuyuki Kinoshita, Tatsuya Matsumura
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Patent number: 5017829Abstract: A framing camera comprises a photocathode, a first deflection means for scanning electron beams emitted from the photocathode, a slit plate having a single slit for converting the electron beams with a spatial picture image information into electron beams with a picture image of temporal sequence and a second deflection means for scanning the electron beams passed from the slit plate to have them impinge upon a phosphor screeen to thereby produce a plurality of framed patterns, in which deflection voltages supplied to the first and second deflection means are adjustable independently of each other.Type: GrantFiled: February 24, 1989Date of Patent: May 21, 1991Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Musubu Koishi, Motoyuki Watanabe
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Patent number: 4902927Abstract: A streak tube comprising a photocathode for converting an optical image into a photoelectron beam, accelerating means for accelerating the photoelectron beam, deflecting means for deflecting the accelerated photoelectron means, focusing means for focusing the deflected photoelectron beam and a phosphor screen for receiving the focused photoelectron beam and forming a streak image corresponding to the optical image. The photoelectron beam emitted from the photocathode is deflected immediately after accelerated by the accelerating means, and subsequently is focused on the phosphor screen, to thereby eliminate the spread of the photoelectron beam on the phosphor screen upon sweeping of the photoelectron beam.Type: GrantFiled: May 2, 1988Date of Patent: February 20, 1990Assignee: Hamamatsu Photonics Kabushiki KaishaInventor: Katsuyuki Kinoshita
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Patent number: 4658182Abstract: An image pick-up tube is disclosed which includes an envelope, an electron beam source positioned at one end of the envelope, a target positioned at another end of the envelope opposite to the electron beam source and at least one electrostatic lens positioned between the electron beam source and the target. The lens includes a first electrode and a second electrode respectively deposited on the inner surface of the envelope and a lead electrode connected to the second electrode is deposited on the inner surface of the envelope across the first electrode but isolated therefrom.Type: GrantFiled: May 7, 1984Date of Patent: April 14, 1987Assignee: Sony CorporationInventor: Shoji Araki
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Patent number: 4560905Abstract: A charged particle accelerating assembly provided with a predetermined ratio of parametric structural characteristics and with related operating voltages applied to each of its linearly spaced focusing and accelerating quadrupoles, thereby to maintain a particle beam traversing the electrostatic fields of the quadrupoles in the assembly in an essentially laminar flow throughout the assembly.Type: GrantFiled: April 16, 1984Date of Patent: December 24, 1985Assignee: The United States of America as represented by the United States Department of EnergyInventor: Alfred W. Maschke
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Patent number: 4560899Abstract: An electron beam focusing lens comprises at least two cylindrical electrodes one of which is to be applied with a high potential and the other of which is to be applied with a low potential. A plate electrode having an aperture at a central portion thereof is provided at an end face of the high-potential cylindrical electrode opposite to the low-potential cylindrical electrode. The plate electrode may be of a circularly curved shape which is projected toward the low-potential cylindrical electrode between the outer and inner circumference of the plate electrode.Type: GrantFiled: December 13, 1982Date of Patent: December 24, 1985Assignee: Hitachi, Ltd.Inventors: Shigehiko Takayama, Masanori Maruyama, Masakazu Fukushima
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Patent number: 4527846Abstract: The zoom focus and deflection assembly for an image-to-electron beam converting electron discharge device comprises a magnetic deflection yoke and a magnetic electron beam focusing coil having N sections each having its own adjustable current source such that at least the opposite end ones of the N sections have the magnitude of current therethrough changed simultaneously in the opposite direction, where N is an integer greater than one.Type: GrantFiled: April 28, 1982Date of Patent: July 9, 1985Assignee: International Telephone and Telegraph CorporationInventor: Richard J. Hertel
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Patent number: 4503354Abstract: A photoconductive target camera tube provided to operate within a solenoid producing a uniform magnetic focusing field has a grid with a beam width defining aperture therein between the electron gun and the normally provided cylindrical anode. The aperture grid is mounted upon a ring of magnetic material which acts to reduce the magnitude of the focusing magnetic field at the plane of the aperture so to achieve a demagnification of the image of the aperture at the target with a consequent reduction in the beam spot size.Type: GrantFiled: November 27, 1981Date of Patent: March 5, 1985Assignee: English Electric Valve Company LimitedInventor: Eric D. Hendry
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Patent number: 4354138Abstract: A television camera tube with electrostatic focusing and magnetic deflection comprises in an cylindrical envelope a beam current control, a main lens section and a sixth grid in the form of a mesh electrode. The beam current control section includes a cathode, a first grid and a second grid with an electron beam limiting diaphragm in this order. The main lens section includes third, fourth and fifth grids in the form of cylindrical electrodes disposed in this order. Around the cylindrical envelope is mounted a magnetic deflection coil whose length along the envelope axis is 0.18 to 0.40 times the distance from the beam limiting diaphragm to the mesh electrode.Type: GrantFiled: October 2, 1980Date of Patent: October 12, 1982Assignee: Hitachi, Ltd.Inventors: Masanori Maruyama, Masashi Mizushima, Masakazu Fukushima, Satoru Miyamoto, Hideyuki Sakai