Abstract: A method and circuit for a power supply unit (PSU) suitable for use in an information handling system to detect an inrush current reaching an inrush current threshold, to fully turning off, by a control circuit of the PSU, a series transistor to block the inrush current, to transfer, while the series transistor is fully turned off, magnetic energy stored in a boost choke to a bulk capacitor, and to fully turn on, by the control circuit of the PSU, the series transistor again immediately after the series transistor was in a fully turned off state, wherein the fully turning on occurs after the magnetic energy stored in the boost choke has been transferred to the bulk capacitor.

Abstract: A seating structure includes a base, a seat, a backrest connected to the seat, and an electronic circuit supported by the base. The seat or the backrest includes a carrier and a suspension material secured to the carrier and spanning across an opening formed by the carrier. The suspension material includes a plurality of electrostatic discharge fibers. The electronic circuit is coupled to the electrostatic discharge fibers. The electronic circuit includes an electronic processor and a sensor. The sensor is configured to generate an output signal indicative of an electrical parameter of one of the electrostatic discharge fibers. The electronic processor is configured to apply a drive signal to one of the plurality of electrostatic discharge fibers, receive the output signal from the sensor, and determine a state of the seating structure based on the output signal from the sensor.

Abstract: A partial discharge charge amount measuring method includes generating a partial discharge in a sample by applying a voltage from a voltage impressing device connected to the sample, the voltage being higher than a partial discharge inception voltage, continuously measuring and recording terminal voltages of a capacitor connected in series between the sample and a ground at least until a breakdown of the sample occurs by alternately operating at least two data loggers connected to the capacitor at intervals of a predetermined time, calculating an amount of electric charge discharged from the sample and remaining in the capacitor by multiplying a difference in the recorded terminal voltages of the capacitor by a capacitance of the capacitor, and calculating an accumulated discharge amount by accumulating the discharged amount of electric charge at earliest until the breakdown of the sample occurs.

Abstract: A pulse generator circuit arrangement for the search for insulation faults in IT networks includes a rectifier circuit for transforming an IT network voltage into a DC intermediate circuit and switching elements having a trigger signal input for switching on and off a DC intermediate circuit voltage. A circuit device downstream of the switching elements generates a pulsed current to be supplied to the IT network. The circuit arrangement includes a control and evaluating logic for determining the insulation resistance of the IT network and also a circuit device for generating the pulsed current, which is formed as a current regulating device and allows a dynamic adjustment of the pulsed current depending on the determined insulation resistance.

Abstract: Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

Abstract: A method of implementing electrostatic discharge (ESD) testing of an integrated circuit includes applying an ESD event to an exposed backside of a substrate of the integrated circuit, wherein the backside of the substrate is electrically isolated from circuit structures formed at a front-end-of-line (FEOL) region of the integrated circuit. The operation of the circuit structures is tested to determine whether the ESD event has caused damage to one or more of the circuit structures as a result of a breakdown in the electrical isolation between the circuit structures and the backside of the substrate.

Abstract: It is an object of the present invention to provide an eddy current testing apparatus capable of accurately detecting any flaws occurring in a columnar or cylindrical subject to be tested regardless of their extending directions, with the use of the same probe coil. The eddy current testing apparatus 100 according to the present invention comprises a spinning plate 1 and a probe coil 2 disposed on the spinning plate 1. The probe coil is a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested. The spinning plate is disposed in such a position that a spinning center RC of the spinning plate faces with an axial center PC of the subject to be tested.

Abstract: A method for evaluating the electric performances of an FDSOI transistor, including the steps of: measuring capacitance and/or conductance of the FDSOI transistor, by applying a voltage VBG>0 on a substrate composed of semiconductor of the FDSOI transistor when the FDSOI transistor is NMOS or a voltage VBG<0 on the substrate composed of semiconductor of the FDSOI transistor when the FDSOI transistor is PMOS, depending on a voltage VFG applied between a gate and source and drain regions of the FDSOI transistor.

Abstract: The device for examining moving tablets comprises a discharging device for discharging the tablets conducted past it, a charging device arranged downstream from the discharging device for charging the discharged tablets conducted past it, and a charge detector arranged downstream from the charging device to detect the charges produced on the tablets.

Abstract: A method of implementing electrostatic discharge (ESD) testing of an integrated circuit includes applying an ESD event to an exposed backside of a substrate of the integrated circuit, wherein the backside of the substrate is electrically isolated from circuit structures formed at a front-end-of-line (FEOL) region of the integrated circuit. The operation of the circuit structures is tested to determine whether the ESD event has caused damage to one or more of the circuit structures as a result of a breakdown in the electrical isolation between the circuit structures and the backside of the substrate.

Abstract: In the illustrated embodiment of the invention a scanning system is provided for scanning a chargeable surface for latent image detection. The chargeable surface is charged to a first potential, and a scanner probe is charged to a second potential within a predetermined potential difference from the first potential. The scanner probe is oscillated at a selected frequency and reads or measures the oscillation current that is induced from the oscillation and detects any latent images or other electrostatic distributions on the chargeable surface. A processor processes the probe measurements for determining the potential of a latent image on the chargeable surface based on the scanner probe readings.

Abstract: Disclosed herein is a method of testing a substrate. In the method, a first test terminal is connected to a first external circuit layer coupled to a first connection pad of a first active element included in a substrate, and a second test terminal is connected to a second external circuit layer coupled to a second connection pad of the first active element. Static electricity is applied through the first test terminal and a voltage drop of an electrostatic discharge protection circuit of the first active element is measured at the second test terminal, thus testing a status of a connection between the first active element and the external circuit layers. In the method, status of a connection of a connection circuit layer, a connection of an external circuit layer, a connection of a surface mount element, and a normal operation of the substrate is further tested.

Abstract: A system including a charge source and at least one voltage measurement device is disclosed. The charge source is for generating a charging environment to produce at least one of a voltage profile and a current on an area of dielectric material disposed over a conductive substrate. The area of dielectric material includes a first area containing a subsurface defect. The area of dielectric material also includes a second area that is defect-free. The at least one voltage measurement device is for outputting voltage measurements at different positions over the area of dielectric material. The voltage measurements over the first area differ from voltage measurements over the second area to define a voltage differential.

Abstract: Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.

Abstract: In the illustrated embodiment of the invention a scanning system is provided for scanning a chargeable surface for latent image detection. The chargeable surface is charged to a first potential, and a scanner probe is charged to a second potential within a predetermined potential difference from the first potential. The scanner probe is oscillated at a selected frequency and reads or measures the oscillation current that is induced from the oscillation and detects any latent images or other electrostatic distributions on the chargeable surface. A processor processes the probe measurements for determining the potential of a latent image on the chargeable surface based on the scanner probe readings.

Abstract: MRI echo data is acquired by performing selective-excitation on regions composed of multi-slices of an object, while the object is moved continuously. The positions of the multi-slices are moved within a predetermined imaging range fixedly determined by an MRI system, according to object movement. This allows positions of the multi-slices to be changed in compliance with the moved object, so that the multi-slices positionally track with the object within the imaging range. Accordingly, a multi-slice imaging technique can be provided, which is executable during even continuous movement of the object.

Abstract: A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.

Abstract: Characterizing dielectric surfaces by detecting electron tunneling. An apparatus includes an atomic force probe. A mechanical actuator is connected to the atomic force probe. A mechanical modulator is connected to the mechanical actuator. The mechanical modulator modulates the mechanical actuator and the atomic force probe at the resonant frequency of the atomic force probe. An electrical modulator is connected to the atomic force probe. A feedback sensing circuit is connected to the mechanical modulator to detect movement of the atomic force probe and provide information about the movement of the atomic force probe to the mechanical modulator allowing the mechanical modulator to modulate the atomic force probe at the resonant frequency of the atomic force probe as the resonant frequency of the atomic force probe changes. An FM detector is connected to the feedback circuit detects changes in the resonant frequency of the atomic force probe.

Abstract: A system and method for testing the electromagnetic (EM) susceptibility of an electronic display unit monitors the light emitted from the electronic display unit as EM noise is applied at a particular testing location of the electronic display unit. An error in the electronic display unit caused by the EM noise is detected using an electrical signal generated in response to the light from the electronic display unit.

Abstract: A method for detecting charge defect spots (CDSs) on a chargeable surface is provided, including charging the chargeable surface to receive and hold a first voltage charge, spacing a surface of a scanner probe a distance from the chargeable surface, the scanner probe having a diameter, and biasing the scanner probe to a second voltage charge within a predetermined voltage threshold of the first voltage charge, wherein a parallel plate capacitor is established with the chargeable surface and a dielectric substance between the scanner probe and the chargeable surface.

Abstract: An electrostatic discharge testing system includes a measurement chamber to hold a discharge electrode and a target electrode in separation from each other, a first conductive path to supply an ESD pulse to the discharge electrode, and a second conductive path to receive a discharge pulse from the target electrode. A transmission line, field-coupled to the second conductive path, generates a measurement signal in response to the discharge pulse.

Abstract: In a surface potential distribution measurement method and device, a sample having a surface with a surface potential distribution is scanned using a charged particle beam in a two-dimensional manner. A detection signal caused by the two-dimensional scanning is obtained to measure the surface potential distribution. Charged particles, other than charged particles of the charged particle beam incident to the sample surface by the two-dimensional scanning, with which components of an incidence velocity vector of the charged particles in a direction perpendicular to the sample surface are reversed, are detected so that a detection signal indicating an intensity according to the detected charged particles is obtained in correspondence with a position on the sample surface.

Abstract: A tracer material is embedded in a component of electrical equipment to detect excessive wear of the component when it is exposed to an electrical arc. As the component wears, the tracer material becomes exposed to the electrical arc and emits electromagnetic radiation, which is monitored continuously. The tracer material is selected so that it emits electromagnetic radiation when it is exposed to an electrical arc that is distinct from electromagnetic radiation emitted by any other parts of the component. A fluorescent tracer material may also be used.

Abstract: Inspection and leak detection of electrically insulated containers having an electrically conductive solution therein in high speed assembly carrier line systems, includes controlled carrier structure and methods for carrying, conveying, orientating, and spinning the containers in a desired line of travel for high frequency high voltage spark testing workstation processing. A plurality of carriers convey the containers along a pathway to a particular orientation relative to a high voltage leak detection system to obtain an electric current volume reading.

Abstract: A semiconductor device evaluation method includes the steps of measuring a total injected electron quantity before an insulating film causes a dielectric breakdown and obtaining the ratio between the total injected electron quantity and a total injected electron quantity before retention degradation is caused. In this method, using the ratio and the total injected electron quantity, the total injected electron quantity before the retention degradation is caused is calculated.

Abstract: A tracer material is embedded in a component of electrical equipment to detect excessive wear of the component when it is exposed to an electrical arc. As the component wears, the tracer material becomes exposed to the electrical arc and emits electromagnetic radiation, which is monitored continuously. The tracer material is selected so that it emits electromagnetic radiation when it is exposed to an electrical arc that is distinct from electromagnetic radiation emitted by any other parts of the component.

Abstract: A method and an apparatus for detecting foreign fibers in a moving textile material, in particular in moving threads, yarns or slivers, include providing a probe for picking up triboelectric signals from the moving textile material and comparing the output of the probe with a reference value to provide a signal representative of detection of a foreign fiber in the textile material. The apparatus may be used in a card, a drawing bench, a ring spinning machine, an air-jet spinning machine, an open-end spinning machine, a chemical spinning machine, a bobbin winding machine a doubling machine, a combing machine, a bobbin frame, a texturing machine or a loom.

Abstract: An electric discharge machine for machining a workpiece by an electric discharge by supplying a machining fluid to a gap between an electrode and the workpiece and supplying pulses to the workpiece while providing the electrode with a jump motion, the jump motion being a periodic motion of the electrode relative to the workpiece; wherein the electric discharge machine detects a state quantity caused in a main body of the electric discharge machine by a reactive force produced by a machining operation in the gap between the electrode and the workpiece and changes machining conditions of the workpiece in accordance with a detected value of the state quantity.

Abstract: A semiconductor device evaluation method includes the steps of measuring a total injected electron quantity before an insulating film causes a dielectric breakdown and obtaining the ratio between the total injected electron quantity and a total injected electron quantity before retention degradation is caused. In this method, using the ratio and the total injected electron quantity, the total injected electron quantity before the retention degradation is caused is calculated.

Abstract: A device and a method for the non-destructive testing of passive components by applying an electrical test signal to passive components and an acoustic emission is measured by a microphone and, the measured signal is applied to an evaluation unit.

Abstract: An electrostatic force microscope wherein electrostatic force applied to the detector is determined through obtaining the field distribution on several different shaped detectors with the calculation of the voltage distribution near the detector with the Finite Element Method to direct the measurement of the absolute charge amount on surface under test so that one can define the differences between the analysis and the results from the parallel plate model. Of interest is how large the error in the charge detection occurs in conjunction with thickness change of dielectric materials to be tested. There is provided a detector with cantilever which has proper shape for the spatial resolution of 10&mgr; made out of nickel foil for an electrostatic force microscope and the electrostatic force which appeared on it has been calculated.

Abstract: An automated test system is provided for evaluating characteristics of photoreceptors used in the electrophotographic process. The test system includes a dielectric material support adapted to receive said dielectric material one or more electrodes adapted to apply electrical energy from a source to a two dimensional area adjacent the support for storage by the dielectric material and a sensor for the electrical energy stored in the dielectric material and providing an output representation of the dielectric relaxation of the material in response to the stored energy over the two dimensional area. This test system provides advantages over conventional Electrostatic Charge Decay (ECD) methods by eliminating corona pre-charging and a moving detector when a full-length array is used. Also, this test system utilizes a lower cost current detector in comparison to conventionally used voltage detectors.

Abstract: The invention relates to a method and apparatus for identification of the disconnection of a current protection device, in particular of a protection device which is connected in series with a semiconductor component and is arranged on a rotating shaft. According to the invention, electromagnetic pulses which are produced during disconnection of the current protection device are received by an antenna which is arranged in the vicinity of the protection device.

Abstract: A method and apparatus (12-20, 32) for automatically locating faults in a network of signal carriers (cables) utilises an interrogation waveform which is pulse-like in form and receives composite reflected signals from the carriers which are a time distributed collection of individual reflections. These are sampled and compared using the function of an adaptive filter (52) to minimise the difference signal. The difference signals are analysed to determine significant points of departure which identify the fault location which is then represented as a distance value.

Abstract: A stressing voltage is applied to a dielectric film (step S23). An A-SILC is monitored with stressing time and is plotted on a log-log scale (step S24). A straight line is applied to the plotting, a stressing time at which the line crosses a predetermined value of the A-SILC (a breakdown threshold) is obtained, and the obtained stressing time is predicted as the lifetime of the dielectric film (step S26).

Abstract: A contactless process for detecting electrical patterns on the outer surface of a member comprising providing a member having a charge pattern on an outer surface, repetitively measuring the charge pattern on the outer surface of the member with an electrostatic voltmeter probe maintained at a substantially constant distance from the surface, the distance between the probe and the imaging member being slightly greater than the minimum distance at which Paschen breakdown will occur to form a parallel plate capacitor with a gas between the probe and the surface, the frequency of repetition being selected to cause all time dependent signals to fall out of phase by a predetermined amount, and averaging the out of phase time dependent signals over a sufficient number of measuring repetitions to eliminate the time dependent signals. In one embodiment, the contactless process detects surface potential charge patterns in an electrostatographic imaging member.

Abstract: A contactless system including an aerodynamically floatable device, a member having an outer surface adjacent to and spaced from the aerodynamically floatable device, a support mechanism adapted to support the aerodynamically floatable device for free movement toward and away from the outer surface of the member, the aerodynamically floatable device having a side adjacent to, spaced from, parallel to and facing the outer surface of the member, the aerodynamically floatable device also containing at least one passageway for directing at least one stream of a gas from the side of the aerodynamically floatable device toward the outer surface of the member with sufficient pressure to maintain the aerodynamically floatable device a constant distance from the outer surface of the member.

Abstract: A measuring apparatus has a capacitor incorporated in a handy measuring tool electrically connected to a voltage meter, and a sharp leading end of the capacitor is brought into contact with a lead of a large scale integrated circuit device for accumulating movable electric charge induced in the presence of a charged insulating package into the capacitor so that the amount of the accumulated movable electric charge is calculated from a potential difference produced between electrodes of the capacitor.

Abstract: A contactless process for detecting surface potential charge patterns in an electrophotographic imaging member including at least one photoconductive imaging layer having an imaging surface, providing a scanner including a capacitive probe having an outer shield electrode, maintaining the probe adjacent to and spaced from the imaging surface to form a parallel plate capacitor with a gas between the probe and the imaging surface, providing a probe amplifier optically coupled to the probe, establishing relative movement between the probe and the imaging surface, maintaining a substantially constant distance between the probe and the imaging surface, applying a constant voltage charge to the imaging surface prior to relative movement of the probe and the imaging surface past each other, synchronously biasing the probe to within about .+-.

Abstract: A electrostatic adhesion tester for thin film conductors. In one embodiment, a device is provided for testing the adhesion strength of a thin film conductor that has been formed upon a substrate. The device includes an adhesion tester that is primarily comprised of a conducting portion. The conducting portion is applied to the thin film conductor so that it does not physically contact the thin film conductor, but leaves a small space there between. A power supply may further be provided for coupling to either the adhesion tester, the thin film conductor, or both in order to create a potential difference between the conducting portion and the thin film conductor. The potential difference creates an electric field between the conducting portion and the thin film conductor that induces stress in the thin film conductor.

Abstract: A method and an apparatus for providing non-contact measurement of waveforms proximate to a surface of a sample. In one version, the describe apparatus includes a probe waveform generator that generates probe waveforms with the same repetition rate as a sample waveform to the measured from the sample. The apparatus includes a cantilever with a signal path to carry the probe waveform to a position above the sample surface where the sample waveform is to be measured. The apparatus of the present invention also includes a gate to periodically route the probe waveforms to the cantilever tip. The gate is controlled by a periodic gating signal with a period substantially longer than the signal period of the sample waveform. In one version, the gate is switched at a repetition rate substantially equal to a mechanical resonant repetition rate of the cantilever. Capacitive coupling between the cantilever and the signal line of the sample results in a periodic motion of the cantilever at the gating repetition rate.

Abstract: A system and method for detecting and controlling ungrounded parts during the electrostatic coating process in order to improve production flow, provide an overall cost saving by efficient use of the coating material and prevention of accidental fires and false shutdown during production. The system of the present invention comprises a detection system for detecting any ungrounded parts prior to entering a coating environment, such as a painting booth. The detection system in accordance with one embodiment, comprises an array of detectors, specifically, an ultraviolet sensor, a radio-frequency wave sensor, an acoustic sensor and a light sensor, which upon sensing specific characteristics generate representative signal waveforms. These waveforms are than compared with stored waveforms relating to profiles of sparking or corona discharge characteristics. Correlation circuits may correlate data obtained by two or more sensors in order to ensure that the spark or corona discharge is caused by an ungrounded part.

Abstract: Prior to beginning a dielectric withstand (leakage current) or insulative impedance test, but after applying the high voltage that will be used in the test, the temporary charging currents resulting from application of the high voltage are measured and analyzed to determine if the test sample is properly connected to the test apparatus. If no charging currents are measured, or if the insulation resistance is too high, then it is determined that the test sample is not properly connected and the test is terminated.

Abstract: An automated test system is provided for evaluating characteristics of photoreceptors used in the electrophotographic process. The test system includes a retainer for holding the photoreceptor, typically in the form of a cylinder or drum, high voltage power supplies, a charging device, light sources, and non-contact electrostatic surface potential probes, the entirety of the test system enclosed in a light-proof cabinet. A control unit responsive to user defined parameters automatically performs tests for drum substrate surface cleanliness, photoreceptor layer thickness, physical defects, and electrophotographic properties. Linear and circular scanning and fixed adaptable systems are shown.

Abstract: An apparatus and method are disclosed for use in detecting and localizing electrostatically susceptible areas of electronic systems. An exemplary apparatus includes: (1) an ESD gun for providing a source of electric current; (2) a wire coil for generating a magnetic field; and (3) a shielded transmission line, such as a coaxial transmission line ("coax"), for receiving current from the gun. The center conductor of the coax is coupled at one end to the gun and at the other end to one end of the wire coil. The other end of the wire coil is coupled to ground. The current flowing through the wire coil creates a magnetic field, which is bi-directional and orthogonal to the plane of the coil. The magnetic field causes errors in the operation of the system under test when the coil is placed in close proximity with ESD susceptible system components. As such, components that are ESD susceptible can be easily detected and localized.

Abstract: The invention is directed to a piping system for a side wall vented mid-efficiency furnace. The piping system comprises a plurality of sections of steel pipe having a glass coated interior surface. The interior surface is continuous and resistant to corrosion. An electronic testing apparatus and a method for utilizing same in testing for flaws in the glass coating of pipes is also provided.

Abstract: An ESD sensor includes a plurality of layers of dielectric material positioned on a substrate, each having a different thickness, a first contact positioned adjacent each of the plurality of layers and a plurality of second contacts, one each positioned on each layer of the plurality of layers of dielectric material. Each different thickness of each individual layer of dielectric material is formed to provide a specific voltage at which an electrical short will occur between the first and second contacts when an ESD appears thereacross, so that the sensor provides an indication of a range of voltages.

Abstract: A process is disclosed for ascertaining the microdefect levels of an electrophotographic imaging member comprising the steps of measuring either the differential increase in charge over and above the capacitive value or measuring reduction in voltage below the capacitive value of a known imaging member and of a virgin imaging member and comparing differential increase in charge over and above the capacitive value or the reduction in voltage below the capacitive value of the known imaging member and of the virgin imaging member.

Abstract: Process for the preparation of ceramic materials for parts having friction surfaces subject to friction and free from auto/self-adhesion under stress or during aging. A precursor of the ceramic undergoes successive operations of pressing, sintering, polishing the surface obtained, cleaning the solid gangue resulting from the polishing, roasting in the presence of oxygen, and a doping treatment for increasing the dielectric susceptibility and homogeneity of the ceramic material adjacent the friction surfaces and to increase the mobility of the charges.

Abstract: A high voltage differential is applied across two separated electrodes by a oltage supply. Between these electrodes is located a sample of the solid propellant or other energetic material. The voltage differential across the electrodes generates a spark of measurable voltage, current and time duration in the sample in order to foretell at what energy level sustained ignition of the sample occurs. This spark is measured by a voltage monitor which, upon reaching a predetermined level, sends a signal to a short-circuiting network. The short-circuiting network, after a predetermined time delay, shorts the electrical path across the electrodes thereby removing the voltage differential across the sample and ending the ignition test. An operator is then able to determine visually whether or not the spark of known voltage, current and time duration has created sustained ignition of the sample material.