Nonlinearity Patents (Class 324/626)
  • Patent number: 11041893
    Abstract: A system is provided to analyze cross-modulation distortion in audio devices, which may include testing with audio frequencies. One or more distortion signals from the audio device may be measured for an amplitude, phase, and or frequency modulation effect. In another embodiment a musical signal may be used as a test signal. Providing additional test signals to the audio device can induce a time varying cross-modulation distortion signal from an output of the audio device. Also utilizing at least one additional filter, filter bank, demodulator and or frequency converter and or frequency multiplier provides extra examination of distortion. Also frequency and or phase response can be measured with the presence of a de-sensing signal and or another signal that induce near slew rate limiting or near overload condition of the device under test.
    Type: Grant
    Filed: September 16, 2019
    Date of Patent: June 22, 2021
    Inventor: Ronald Quan
  • Patent number: 9046565
    Abstract: Techniques for performing built-in self-test (BIST) of performance of an RF system are disclosed. The techniques may be used, for example, for measuring distortion generated by the RF system under test, detecting faults in the system, determining calibration of the system, and/or assisting in compensating analog circuitry that is sensitive to temperature, supply voltage, and/or process variations. Also, a BIST architecture for determining RF performance of an RF systems is disclosed.
    Type: Grant
    Filed: August 29, 2011
    Date of Patent: June 2, 2015
    Assignee: BAE Systems Information and Electronic Systems Integration Inc.
    Inventors: Thomas E. Collins, III, Gregory M. Flewelling
  • Patent number: 8128561
    Abstract: A hydration and composition measurement device and technique that in one embodiment includes a microcontroller; a phase lock loop frequency synthesizer controlled by the microcontroller to generate radio frequencies; a cavity for use in resonating at a set of frequencies; a radio frequency power detector for measuring perturbed cavity resonance; and an analyzer. The hydration and composition measurement device may further include a circulator, which receives frequencies from the phase lock loop frequency synthesizer, and an antenna connected to the circulator and cavity. The cavity may be defined by a metallic material or members, and the cavity includes a hole configured to provide access of tissue to be tested to the cavity.
    Type: Grant
    Filed: June 10, 2009
    Date of Patent: March 6, 2012
    Assignee: Intelligent Automation, Inc.
    Inventors: Arvind Bhat, Shan Chiang, Eric van Doorn, Pencheng Lv
  • Patent number: 7944214
    Abstract: Methods and systems using Pade' Approximant expansion ratios provide mappings between nonlinear sensors and a more linear output domain. The method includes a method of converting an input digital signal having a nonlinear dependency on a physical variable into an output digital signal that exhibits a substantially linear dependency with respect to the variable is disclosed. The method includes: (a) multiplying the input digital signal by a variable multiplying factor to thereby generate a multiplied digital version of the input signal; (b) adding to the multiplied digital version of the input signal, a predefined digital offset signal to thereby produce the output digital signal; (c) multiplying the output digital signal by a predefined feedback gain correction factor to thereby produce a digital feedback signal; (d) using the digital feedback signal to produce the variable multiplying factor.
    Type: Grant
    Filed: November 17, 2010
    Date of Patent: May 17, 2011
    Assignee: Semiconductor Components Industries, LLC
    Inventors: Jose Marcos Laraia, Jose G Taveira, Robert P. Moehrke
  • Patent number: 7696761
    Abstract: The invention provides a spectrum analyzing method, a distortion detector and a distortion compensation amplifying device for performing time/frequency conversion processing at high speed, and reducing a convergent time of a compensation coefficient. The distortion detector for detecting distortion in a frequency area with respect to an input signal includes a time window processing section for multiplying the input signal by a time window; an averaging processing section for averaging an output of the time window processing section; an FFT processing section for converting an output of the averaging processing section from a time area to a frequency area; and a distortion extracting section for extracting a distortion component from an output of the FFT processing section.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: April 13, 2010
    Assignee: Hitachi Kokusai Electric, Inc.
    Inventors: Tetsuhiko Miyatani, Masashi Naito, Naoki Hongo, Takashi Okazaki
  • Patent number: 7683631
    Abstract: A nonlinear distortion is compensated based upon a characteristic relating to a characteristic of a device under test. An inverse characteristic measuring device measures an output signal output from the device under test as a result of supplying the device under test with an input signal generated by a signal source. Further, the inverse characteristic measuring device acquires an ideal signal output from the device under test based upon the input signal if the device under test is ideal. Moreover, the inverse characteristic measuring device acquires an inverse characteristic which is a relation of the ideal signal with respect to the output signal. This inverse characteristic is applied to a distortion compensator. The distortion compensator supplies the device under test with the input signal converted based upon the inverse characteristic. As a result, a signal output from the device under test is an ideal signal whose distortion caused by the device under test is compensated.
    Type: Grant
    Filed: September 12, 2005
    Date of Patent: March 23, 2010
    Assignee: Advantest Corporation
    Inventor: Makoto Kurosawa
  • Patent number: 7378858
    Abstract: Methods and systems using Pade' Approximant expansion ratios provide mappings between nonlinear sensors and a more linearized output domain. In one embodiment (a) a variable gain amplifier receives a supplied input signal, the amplifier has at least a first input terminal, an output terminal, and a gain control terminal; (b) a first summer coupled to the output terminal of the variable gain amplifier adds in a first offset signal; (c) a first multiplier coupled to an output of the first summer receives a proportional feedback factor signal and correspondingly generates a multiplied feedback; (d) a second summer coupled to an output terminal of the first multiplier adds in a corresponding second offset signal; and (e) a second multiplier coupled to an output of the second summer receives a gain factor signal and generates a multiplied gain signal; where the gain control terminal of the variable gain amplifier is operatively coupled to an output terminal of the second multiplier.
    Type: Grant
    Filed: January 30, 2007
    Date of Patent: May 27, 2008
    Assignee: AMI Semiconductor, Inc.
    Inventors: Jose Marcos Laraia, Jose G. Taveira, Robert P. Moehrke
  • Patent number: 7221167
    Abstract: The invention relates to an arrangement for measuring and assessing properties of a system (28) which transfers an electrical, mechanical or acoustical signal or converts an excitation signal x into another signal y. An error system (30) models the transfer behavior of the system, estimates a desired output signal y?, and generates an error signal e which reveals the excess distortion and disturbances of the output signal y at any time instant t, and can reveal peak values of transient distortion having low power which might otherwise be masked by noise and regular distortion. The error signal is supplied to an assessment system (44), where convenient distortion measures are calculated and the distortion is displayed versus properties of the signal (e.g., instantaneous frequency and amplitude). The assessment system may also generate a control output (42) to modify signal x to ensure an optimal excitation of the system.
    Type: Grant
    Filed: February 28, 2003
    Date of Patent: May 22, 2007
    Assignee: Klippel GmbH
    Inventors: Wolfgang Klippel, Ulf Seidel
  • Patent number: 6140822
    Abstract: A system that utilizes a reference signal for testing signal paths for complex frequency response (linear distortion), and non-linear distortion. This reference signal, which is also known as a ghost canceling reference signal or a training waveform, has excellent properties for channel characterization. The reference signal is a waveform that operates for a major time interval that is subdivided into multiple minor time intervals. During each minor time interval, a sine wave oscillates at a constant angular velocity or frequency. The sine wave frequency may take uniform steps between the minor time intervals, or it may skip a group of frequencies. The phase of the waveform may optionally be continuous between the end of one minor time interval and the start of the next minor time interval. This waveform is generated by loading the time sample values from a digital memory into a digital to analog converter (D-A), or by rapidly reprogramming a numerically-controlled oscillator.
    Type: Grant
    Filed: November 7, 1998
    Date of Patent: October 31, 2000
    Inventor: Thomas H. Williams
  • Patent number: 5818240
    Abstract: A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.
    Type: Grant
    Filed: December 12, 1996
    Date of Patent: October 6, 1998
    Assignee: Audio Precision, Inc.
    Inventor: Richard C. Cabot
  • Patent number: 5748001
    Abstract: A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.
    Type: Grant
    Filed: December 12, 1996
    Date of Patent: May 5, 1998
    Assignee: Audio Precision, Inc.
    Inventor: Richard C. Cabot
  • Patent number: 5744969
    Abstract: Analog and mixed signal integrated circuits are tested using the modified Volterra series to model the integrated circuit being tested. An adaptive algorithm, for example, least mean square or Kalman, is used to determine to coefficients of the Volterra series. The coefficients are then used to calculate the THD and SNR.
    Type: Grant
    Filed: December 29, 1995
    Date of Patent: April 28, 1998
    Assignee: Lucent Technologies Inc.
    Inventors: Andrew Grochowski, Shwu-Liang Luke Hsieh
  • Patent number: 5644243
    Abstract: A system (36, 98) for determining the linearity of an RF detector (46, 106). A first technique involves combining two RF signals from two stable local oscillators (38, 40) to form a modulated RF signal having a beat frequency, and applying the modulated RF signal to a detector (46) being tested. The output of the detector (46) is applied to a low frequency spectrum analyzer (48) such that a relationship between the power levels of the first and second harmonics generated by the detector (46) of the beat frequency of the modulated RF signal are measured by the spectrum analyzer (48) to determine the linearity of the detector (46). In a second technique, an RF signal from a local oscillator (100) is applied to a detector (106) being tested through a first attenuator (102) and a second attenuator (104).
    Type: Grant
    Filed: December 5, 1994
    Date of Patent: July 1, 1997
    Assignee: Hughes Aircraft Company
    Inventors: Victor S. Reinhardt, Yi-Chi Shih, Paul A. Toth, Samuel C. Reynolds
  • Patent number: 5594612
    Abstract: A analog calibration signal including at least one frequency component is generated by a very pure signal source, such as a digital oscillator and a digital-to-analog converter (DAC) that has been calibrated to be ultralinear. The analog calibration signal is converted by an analog-to-digital converter (ADC) to a digital signal. The digital signal is digitally compensated in accordance with compensation coefficients to produce a compensated digital signal. The compensated digital signal is digitally processed to isolate and measure distortion components, and the compensation coefficients are adjusted in response to the distortion components in order to reduce the distortion components. Feedback causes the distortion components to be minimized so that the compensation coefficients correct the nonlinearity in the analog-to-digital converter.
    Type: Grant
    Filed: August 24, 1994
    Date of Patent: January 14, 1997
    Assignee: Crystal Semiconductor Corporation
    Inventor: W. S. Henrion
  • Patent number: 5594439
    Abstract: Abnormal changes in the non-linear characteristics of electronic components are an indication of abnormal conditions such as impending component or system failure. To detect such abnormal changes in nonlinearity, an electronic circuit is subjected to a calibration signal including at least one frequency component. Nonlinearity in the electronic circuit causes distortion components to be generated from the calibration signal. Preferably the nonlinearity is characterized by compensation coefficients that digitally compensate the nonlinearity. The compensation coefficients are adjusted in a feedback loop in response to measured values of the distortion components, so that the distortion components are minimized. At the end of the adjustment process, the transfer function of the electronic circuit is specified by the compensation coefficients, which are stored in memory.
    Type: Grant
    Filed: August 24, 1994
    Date of Patent: January 14, 1997
    Assignee: Crystal Semiconductor Corporation
    Inventor: Eric J. Swanson
  • Patent number: 5475315
    Abstract: A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.
    Type: Grant
    Filed: July 23, 1993
    Date of Patent: December 12, 1995
    Assignee: Audio Precision, Inc.
    Inventor: Richard C. Cabot
  • Patent number: 5465050
    Abstract: A dynamic range tester which simultaneously generates two signals, each of hich is composed of a clean signal plus an excess quantity of independent and isolated random noise is disclosed for use in producing real world signals which can be used to provide a simulated operating environment within which to evaluate the dynamic range or evaluate the processing gain of an electronic or acousto-optic system. The power level of the signal and power level of the noise in each of the two outputs of the dynamic range tester can be independently varied such that a range of signal-to-noise ratios may be set-up in each output.
    Type: Grant
    Filed: July 13, 1994
    Date of Patent: November 7, 1995
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Anne M. P. Marinelli, Michael S. Patterson
  • Patent number: 5420516
    Abstract: A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.
    Type: Grant
    Filed: July 23, 1993
    Date of Patent: May 30, 1995
    Assignee: Audio Precision, Inc.
    Inventor: Richard C. Cabot
  • Patent number: 5250907
    Abstract: In this digital signal measurement apparatus, an approach is employed to deliver a measurement signal from a measurement signal generator to a measured circuit to transform the signal on the time base through the measured circuit to a signal on the frequency base by a frequency base transform circuit and to further obtain a signal on the time base by a time base transform circuit. Thus, a difference between the signal on the time base through the measured circuit and the signal on the time base from the time base transform circuit is employed. Thus, for example, even if the measured circuit is a linear system, a measured result in the digital region and a result of the analog measurement can be in correspondence with each other. Accordingly, gain correction of a measurement signal is unnecessary, thus making it possible to prevent an increase in an error of a measured result of S/N.
    Type: Grant
    Filed: April 16, 1992
    Date of Patent: October 5, 1993
    Assignee: Sony Corporation
    Inventor: Takao Fukui
  • Patent number: 5241269
    Abstract: Apparatus for measuring a hysteresis characteristic of magnetic material, dielectric material or the like in a high frequency range without using a high-speed A/D converter. A current having a predetermined frequency is applied to an object being examined 4 and the magnetic field and magnetic flux density in the object 4 are detected. The detection signals are successively subjected to frequency conversion with predetermined frequencies corresponding to a fundamental wave and harmonic waves by mixers 17, 18. The frequency-converted signals are input to bandpass filters 19, 20. The output signals of the bandpass filters, which are signals of an intermediate frequency, are converted to digital signals by A/D converters 25, 26, the apparatus thereby detecting the fundamental wave component and each higher harmonic component.
    Type: Grant
    Filed: February 6, 1992
    Date of Patent: August 31, 1993
    Assignee: Hewlett-Packard Company
    Inventors: Shigeo Kamiya, Hideo Akama
  • Patent number: 5170114
    Abstract: A portable instrument for locating and measuring harmonic distortion in a conductor. The instrument permits voltage and current harmonics to be easily read while the load is changing. Thus, the instrument may provide a great deal of insight as to the source of problem causing harmonics.
    Type: Grant
    Filed: September 11, 1991
    Date of Patent: December 8, 1992
    Assignee: Myron Zucker, Inc.
    Inventors: Michael Z. Lowenstein, Ronald G. Jawernycky
  • Patent number: RE40322
    Abstract: A system for determining a composite signal level at which a signal path begins to generate non-linear distortion. A uses a reference test signal, which is preferably a short-duration burst of repeatable broadband energy, that is passed through the signal path and received on a digital signal acquisition unit. An impaired received reference test signal is comprised of is formed from the transmitted reference test signal, linear distortion components, and non-linear distortion components. The impaired received reference test signal is digitally processed to reveal the non-linear distortion components. The impaired received reference test signal may be processed with a stored reference test signal to find a time-domain impulse response from which the uncorrelated distortion energy can be measured.
    Type: Grant
    Filed: May 27, 2005
    Date of Patent: May 20, 2008
    Assignee: Alta Vocal Data, LLC
    Inventor: Thomas H. Williams