With Calibration Device Or Gauge For Nuclear Reactor Element Patents (Class 33/502)
  • Patent number: 10663110
    Abstract: In the present disclosure, systems and apparatuses for stabilizing a metrology device may be provided. The metrology device may be connected with a metrology apparatus that may prevent and/or correct for unintended movement of the metrology device. The metrology apparatus may include a base plate having a top surface and a bottom surface, and the base plate may include a plurality of holes from the top surface to the bottom surface. The metrology apparatus may further include a plurality of suspension rods, and a distal end of a respective suspension rod may be positioned through a respective hole such that a first portion of the distal end is disposed on the top surface of the base plate and a second portion of the distal end is disposed on the bottom surface of the base plate. The metrology device may be connected to the bottom surface of the base plate such that at least a portion of an assembly cell is within a field of view of the metrology device.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: May 26, 2020
    Assignee: DIVERGENT TECHNOLOGIES, INC.
    Inventor: Oussama Rawas
  • Patent number: 10627202
    Abstract: A step gauge includes: measurement blocks each having reference measurement surfaces; interval blocks each interposed between a pair of ones of the measurement blocks to keep a distance between the pair of ones of the measurement blocks at a predetermined distance, the measurement blocks and the interval blocks being alternately aligned one by one in one direction. The measurement blocks and the interval blocks each have a coefficient of linear thermal expansion of less than 0.03×10?6(1/K) and have through holes aligned in the one direction. The step gauge further includes a tie rod inserted in the through holes and countersunk screws respectively fixed to ends of the tie rod. The tie rod is made of a material having a coefficient of linear thermal expansion of less than 0.5×10?6(1/K).
    Type: Grant
    Filed: April 25, 2018
    Date of Patent: April 21, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Tatsuya Narumi, Akihiko Matsuura, Kentaro Yano
  • Patent number: 10627204
    Abstract: A step gauge and a reference gauge block are placed in a temperature-controlled chamber in parallel with each other. A temperature of the step gauge is changed to a first temperature and a second temperature using a measurement-target temperature adjuster and the temperature-controlled chamber. A distance between a first surface and a second surface of the step gauge is relatively measured at each of the first and second temperatures with reference to a distance between a first reference surface and a second reference surface of the reference gauge block. A coefficient of thermal expansion of the measurement target is calculated from the length of the measurement target at the first temperature and the length of the measurement target at the second temperature.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: April 21, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Takeshi Hagino, Yuichiro Yokoyama
  • Patent number: 10591270
    Abstract: A method of operating an articulated arm CMM is provided. Instructions for the CMM can be inputted to the CMM arm by an action chosen from the group consisting of placing the arm in a predefined position and moving the arm in a predefined manner.
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: March 17, 2020
    Assignee: Hexagon Technology Center GmbH
    Inventors: Laurent Desforges, Jean-Paul De Lemos
  • Patent number: 10533852
    Abstract: A leveling sensor, a load port including a leveling sensor, and a method of leveling a load port using a load port are disclosed. In an embodiment, a sensor includes an accelerometer configured to detect leveling and vibration of a load port and produce a plurality of data; a plurality of indicator lights configured to display a level measurement and a level direction based on the leveling of the load port; a processor configured to process the data produced by the accelerometer; and a wired connection configured to connect the processor to an external device.
    Type: Grant
    Filed: February 14, 2019
    Date of Patent: January 14, 2020
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yi-Lin Wang, Jung-Tang Wu, Chin-Szu Lee, Hua-Sheng Chiu
  • Patent number: 10481575
    Abstract: A thermal compensation control system for a machine tool having a milling cutter and a cutter driver includes a tool setting probe, a temperature sensor, a workpiece touch probe, and a controller. The cutter driver is connected to the milling cutter to drive the milling cutter to process the work piece based on a control signal. The tool setting probe is configured to detect a cutter length of the milling cutter. The temperature sensor is configured to sense a measured temperature of the cutter driver or the milling cutter. The workpiece touch probe is configured to measure processing errors of the processed work piece. The controller is configured to generate the control signal based on a processing instruction, a temperature compensation model, the cutter length, and the measured temperature. The controller is further configured to determine whether to modify the temperature compensation model based on the processing errors.
    Type: Grant
    Filed: December 27, 2017
    Date of Patent: November 19, 2019
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Sheng-Ming Ma, Ta-Jen Peng, Yung-Chih Lin, Chien-Hung Chen, Ke-Hen Chen, Shin-Tzong Su
  • Patent number: 10416647
    Abstract: A non-transitory computer readable storage medium has instructions executed by a processor to compute an x-axis axial position based upon a first host border measurement signal, a second host border measurement signal, first x-axis axial measurement signals and second x-axis axial measurement signals. A y-axis axial position is computed based upon the first host border measurement signal, the second host border measurement signal, first y-axis axial measurement signals and second y-axis axial measurement signals. A z-axis axial position is computed based upon the first host border measurement signal, the second host border measurement signal, first z-axis axial measurement signals and second z-axis axial measurement signals. The operation of a computer numerical control milling machine is coordinated based upon the x-axis axial position, the y-axis axial position and the z-axis axial position.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: September 17, 2019
    Assignee: BENEFICIAL MACHINE TOOLS LLC
    Inventors: George Benedict, Oscar Lim
  • Patent number: 10286614
    Abstract: A method and system for assisting in the manufacture of composite parts such as those used for various high-strength assemblies such as aircraft wings, vertical stabilizers, racing car shells, boat hulls, and other parts which are required to have a very high strength to weight ratio. The system uses laser technology to measure the resultant surfaces of a first manufactured composite part. A computer system analyzes and compares the as-built dimensions with the required production specifications. Supplemental composite filler plies are designed including shape and dimensions. These plies are nested together into a single composite sheet and manufactured to minimize wasted material. The plies are then cut out and applied to the first part guided by a laser projection system for locating the plies on the part. The part is then re-cured. The final assembly is then re-measured for compliance with production dimensions.
    Type: Grant
    Filed: October 26, 2015
    Date of Patent: May 14, 2019
    Inventors: Michael Spellman, Jeff Godfrey, Gregory MacLean
  • Patent number: 10281255
    Abstract: A method for performing measurements using a test element, comprising: arranging a test element in a measurement region of a coordinate-measuring apparatus, wherein the test element is arranged on a base of the coordinate-measuring apparatus or at/on a first, rotatable part of a rotating apparatus arranged within the measurement region, and wherein the test element is arranged in a first pose relative to the base or to the first part. performing a measurement by incorporating the test element in the first pose, arranging the test element with the movement device in a second pose on the base or on the first part using the movement device, performing a measurement by incorporating the test element in the second pose.
    Type: Grant
    Filed: December 20, 2016
    Date of Patent: May 7, 2019
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Dominik Seitz, Rainer Sagemueller
  • Patent number: 10222193
    Abstract: A series of nominally identical production workpieces are measured on a workshop coordinate measuring apparatus. They are corrected using correction values generated by comparing coordinate values of a reference workpiece measured on the workshop apparatus with corresponding values derived from external measurements. To reduce the care and skill required, the external measurements are used to determine reference values of a geometric property of a feature of the reference workpiece, rather than coordinate values corresponding directly to those made on the workshop apparatus. Corresponding coordinate values are then generated from knowledge of the perfect form of the feature of the reference workpiece.
    Type: Grant
    Filed: August 26, 2015
    Date of Patent: March 5, 2019
    Assignee: RENISHAW PLC
    Inventors: Leo Christopher Somerville, Kevyn Barry Jonas
  • Patent number: 10209048
    Abstract: A double ball-bar measuring system includes a calibration unit, at least two double ball-bars and a measuring module. Among the double ball-bars, at least one is a measuring double ball-bar and at least one is a reference double ball-bar. The measuring double ball-bar is installed on a measurement apparatus to measure or calibrate a target machine. The reference double ball-bar is disposed on the calibration unit to measure thermal errors. When the target machine is driven for measurement or calibration, the geometric and thermal errors of the measuring double ball-bar are compensated so that the measurement apparatus can achieve highly accurate measurement.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: February 19, 2019
    Assignee: NATIONAL TSING HUA UNIVERSITY
    Inventor: Wei-Tai Lei
  • Patent number: 10189137
    Abstract: There is provided a tool shape measuring apparatus that allows detection of shape abnormality in a tool having a plurality of cutting edges with a simple configuration. A light receiving section 6 includes a light receiving face 9 perpendicular to an optical axis 6b of a light receiving lens 6a. In the light receiving face 9, there are disposed a plurality of line sensors 8 arranged in different directions from each other, each line sensor having a plurality of sensor elements arranged in one direction. The line sensor 8 is disposed across a first area not reached by the irradiation light L as being completely blocked by the tool 4, a second area disposed adjacent the first area and reached by the irradiation light L with a portion thereof being blocked, and a third area disposed adjacent the second area and reached by the irradiation light L not blocked at all.
    Type: Grant
    Filed: June 30, 2015
    Date of Patent: January 29, 2019
    Assignee: Big Daishowa Co., Ltd.
    Inventors: Masataka Yauchi, Kouichi Uemura, Reina Oohashi, Shunsuke Kumasaki, Akihito Funashoku
  • Patent number: 10168134
    Abstract: A portable articulated arm coordinate measurement machine (AACMM) is provided. The AACMM having a manually positionable articulated arm having first and second ends, the arm including a plurality of connected arm segments, each of the arm segments including at least one position transducer for producing position signals, at least one of the position signals passing between two of the arm segments through a first slip ring assembly. A first a first electronic circuit is provided that receives the position signals. A base section is connected to the second end. A probe assembly includes a probe end and a cover. The cover rotates about an axis extending through the probe assembly, the cover having at least one indentation formed thereon. The probe assembly is connected to the first end. The AACMM measures a three-dimensional coordinate of a point in space associated with the probe end.
    Type: Grant
    Filed: October 27, 2016
    Date of Patent: January 1, 2019
    Assignee: FARO TECHNOLOGIES, INC.
    Inventors: Simon Raab, Marc M. Barber
  • Patent number: 10146205
    Abstract: A method which allows an operator to quickly form a clear picture with regard to the positioning accuracy of a machine part that is displaceable along an axis by means a drive controlled by a controller includes specifying with the controller nominal position values of the machine part in relation to a single axis, wherein the nominal position values are defined by a sine function; displacing the machine part with respect to the single axis in accordance with the nominal position values; determining with a measuring device actual position values of the machine part in relation to the single axis; and visualizing the actual position values of the machine part in relation to the single axis graphically in a circular representation.
    Type: Grant
    Filed: February 25, 2016
    Date of Patent: December 4, 2018
    Assignee: Siemens Aktiengesellschaft
    Inventors: Ricky Berghold, Lars Immenroth, Robert Pulawski, Johannes Welker
  • Patent number: 10099337
    Abstract: A lens processing system used for removing a lens blank (98, 110) from an edging block (40). The system includes an elongated collet (22) that engages the mating edging block (40). The block (40) includes an enlarged groove (41) that receives a pair of blades (65, 66) extended upwardly from the floor (75) of the collet (22). Each lens blank (98,110) is formed to include a series of surface markings (191,192) to verify proper functioning of the edging machine that forms a finished lens. Each lens blank also includes a series of circular markings (117,133) arranged in diagonal rows to verify the accurate drilling of bores with the lens blank (98,110).
    Type: Grant
    Filed: September 5, 2016
    Date of Patent: October 16, 2018
    Inventor: James Gregory Goerges
  • Patent number: 10088304
    Abstract: A thickness measurement system includes a composite carrier assembly and a thickness sensor system. The composite carrier assembly includes a sample carrier and a gauge standard carrier. The sample carrier and gauge standard carrier are configured to simultaneously support a sample and a gauge standard, respectively. The thickness sensor system is configured to generate a signal representative of a thickness of the sample and to be calibrated with the gauge standard while the sample and the gauge standard are simultaneously supported by the sample carrier and the gauge standard carrier, respectively.
    Type: Grant
    Filed: February 4, 2016
    Date of Patent: October 2, 2018
    Assignee: OCEAN INDUSTRIES, LLC
    Inventors: John A. Kane, II, John A. Kane, III
  • Patent number: 10065319
    Abstract: A tool calibration apparatus for a robot manipulator having a tool is disclosed. The tool calibration apparatus comprises a base, an X-axis measurement device, a Y-axis measurement device and a Z-axis measurement device. Each of the X-axis measurement device, the Y-axis measurement device and the Z-axis measurement device comprises a measuring plate and a sensor. The measuring plates of the X-axis measurement device, the Y-axis measurement device and the Z-axis measurement device move in a direction along the X-axis, Y-axis, and Z-axis, respectively. The sensors of the X-axis measurement device, the Y-axis measurement device and the Z-axis measurement device measure a displacement of the corresponding measuring plate. According to the displacements, information of a tool center point of the tool is acquired so as to calibrate the tool center point.
    Type: Grant
    Filed: May 4, 2016
    Date of Patent: September 4, 2018
    Assignee: DELTA ELECTRONICS, INC.
    Inventors: Cheng-Hao Huang, Chih-Ming Hsu
  • Patent number: 10066922
    Abstract: A manual measuring system (an articulated three-dimensional coordinate measuring machine or a gantry three-dimensional coordinate measuring machine) allows a measuring probe to be manually moved while enabling a user to focus on making measurements and allows the user to manually move the measuring probe in order to facilitate and accelerate measurements. The manual measuring system includes a sub-monitor (portable terminal) that is mounted near the tip of the measuring probe. It is possible to display on the sub-monitor a guided route for the measuring probe to a measurement point or to indicate on the sub-monitor that the measuring probe has entered a measurement allowable range or to allow the user to direct by means of the sub-monitor to obtain a measurement value by the measuring probe.
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: September 4, 2018
    Assignee: MITUTOYO CORPORATION
    Inventors: Shinsaku Abe, Kozaburo Suzuki
  • Patent number: 9976852
    Abstract: A system includes an environment for programming workpiece inspection operations for a coordinate measurement machine (CMM). The environment includes a user interface comprising a program simulation portion configured to display a 3D view of the workpiece and/or representations of inspection operations to be performed on the workpiece. The user interface further includes auxiliary collision avoidance volume (CAV) creation elements that create CAV's that are represented in the 3D view. The 3D CAVs and/or their representations have integrated graphical modification properties which are controllable in the user interface. The modification properties are activated by selection of a face of the CAV representation, without the explicit activation of a separate modification control element mode or tool. This results in a simplified and intuitive user interface. Users perform a constrained set graphical modifications in the 3D view using an input device, to modify a CAV.
    Type: Grant
    Filed: August 29, 2016
    Date of Patent: May 22, 2018
    Assignees: Mitutoyo Corporation, Mitutoyo Europe Gmbh
    Inventors: Brenan N. Kelley, Kareem G. Fawell, Matthew Buza, Dahai Yu
  • Patent number: 9952044
    Abstract: A calibration block for calibrating a touch probe includes a calibration block body forming a bored hole providing a concave measurement surface, and a three dimensional object protruding from the calibration block body and providing a convex measurement surface, wherein the convex measurement surface provides opposing measurement contact points in at least two dimensions.
    Type: Grant
    Filed: February 1, 2016
    Date of Patent: April 24, 2018
    Assignee: Rolls-Royce North American Technologies, Inc.
    Inventor: Geoffrey L. Gatton
  • Patent number: 9915516
    Abstract: There is provided a method for controlling a shape measuring apparatus which continues to perform nominal scanning measurement to a workpiece having a slightly large deviation from a design data. A scanning path to move a stylus tip is calculated based on design data of a workpiece. The stylus tip is moved along the scanning path. It is monitored whether a distance between the scanning path and an actual workpiece is excessive. When the distance between the scanning path and the actual workpiece is excessive, a trajectory difference error is generated. When the trajectory difference error is generated, geometric correction is performed to the design data so that the design data approaches to the actual workpiece. Scanning measurement is performed based on the design data after the geometric correction.
    Type: Grant
    Filed: April 28, 2016
    Date of Patent: March 13, 2018
    Assignee: MITUTOYO CORPORATION
    Inventor: Takashi Noda
  • Patent number: 9746858
    Abstract: A control device of the present invention estimates warm-up time that it takes for a warm-up of a machine based on the temperature of the machine to be warmed up and the saturation temperature that is unique to the machine. Warm-up start time is calculated based on the obtained warm-up time and predefined warm-up end time. In this way, the warm-up can be efficiently performed as the warm-up can be performed for an appropriate period of time in consideration of the saturation temperature unique to the machine.
    Type: Grant
    Filed: October 20, 2014
    Date of Patent: August 29, 2017
    Assignee: Fanuc Corporation
    Inventor: Kaname Matsumoto
  • Patent number: 9618331
    Abstract: A method and equipment based on detecting the polarization property of a polarization maintaining fiber (PMF) probe for measuring structures of a micro part are provided. The provided method relates to how to accomplish measuring structures of a micro part by transforming two or three-dimensional contact displacements into polarization property changes of the PMF probe, and how to reconstruct the structure geometry of a micro part. The provided equipment can be used to bring the spherical tip of the PMF probe into contact with a micro part, to determine coordinates of contact points, and to reconstruct the structure geometry of a micro part. The provided method and equipment feature high sensitivity, low probing force, high inspecting aspect ratio and immunity to environment interference.
    Type: Grant
    Filed: December 31, 2014
    Date of Patent: April 11, 2017
    Assignee: HARBIN INSTITUTE OF TECHNOLOGY
    Inventors: Jiwen Cui, Junying Li, Kunpeng Feng, Jiubin Tan
  • Patent number: 9612107
    Abstract: A length artifact has a first side wall, a second side wall, and a base portion, the first side wall and the second side wall separated by an air gap at least four millimeters wide, the base portion being attached to a bottom of the first side wall and the second side wall, the base portion further having a first platform region that includes a first nest and a second platform region that includes a second nest, the first nest and the second nest configured to accept a spherical surface of a retroreflector target.
    Type: Grant
    Filed: March 19, 2015
    Date of Patent: April 4, 2017
    Assignee: FARO TECHNOLOGIES, INC.
    Inventor: Robert E. Bridges
  • Patent number: 9575163
    Abstract: A system and method of calibrating a laser tracker is provided. The system includes a support system for quickly and easily moving an artifact to a desired position and orientation and for holding the artifact in the position and orientation. An adjustable alignment mirror is coupled to a first end of the artifact so that the more accurate ranging system of the laser tracker can be isolated to determine a reference length of the artifact. Additional measurements are then taken to exercise one or more error source within the tracker. The support system includes a positioner and a support beam for positioning and supporting the artifact. The artifact is coupled to the support beam using kinematic clamps that are designed to reduce or eliminate errors associated with over-constraining the artifact.
    Type: Grant
    Filed: July 10, 2015
    Date of Patent: February 21, 2017
    Assignee: Brunson Instrument Company
    Inventors: Aaron A. Hudlemeyer, Mark J. Meuret
  • Patent number: 9541385
    Abstract: An error correction method for coordinate positioning apparatus is described. The method comprises (i) taking a first data set comprising one or more first data values, each first data value describing a position on the surface of a first object, (ii) taking a second data set comprising one or more second data values, each second data value describing a position on the surface of the first object, and (iii) calculating an error map comprising one or more error values, each error value describing a positional difference between the surface as described by the first data set and the surface as described by the second data set. The surface normal of the first object is known at each position described by each first data value and step (iii) comprises calculating each error value by determining the positional difference substantially in the direction of the known surface normal.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: January 10, 2017
    Assignees: RENISHAW PLC, METROLOGY SOFTWARE PRODUCTS LIMITED
    Inventors: Kevyn Barry Jonas, Geoffrey McFarland, Peter Russell Hammond, Anthony Brown
  • Patent number: 9500078
    Abstract: A segment roundness measuring device including a correction means that corrects the positional deviation of the turning center of an erector turning portion resulting from eccentricity on the basis of an angle detected by an angle detector and distances measured by three or more distance meters arranged at angular positions different from each other in the erector turning portion.
    Type: Grant
    Filed: November 12, 2013
    Date of Patent: November 22, 2016
    Assignee: HITACHI ZOSEN CORPORATION
    Inventor: Toshiyuki Okada
  • Patent number: 9482746
    Abstract: A method of measuring with a coordinate measurement device and a target sensor a sense characteristic and a surface set associated with the sense characteristic, the method including the steps of: providing the target sensor having a body, a first retroreflector, a sensor, and a sensor processor, providing the coordinate measurement device, sending the first beam of light from the coordinate measurement device to the first retroreflector; receiving the second beam of light from the first retroreflector; measuring the orientational set and the translational set, the translational set based at least in part on the second beam of light; determining the surface set; sensing the sense characteristic; and saving the surface set and the sense characteristic.
    Type: Grant
    Filed: April 11, 2012
    Date of Patent: November 1, 2016
    Assignee: FARO TECHNOLOGIES, INC.
    Inventor: Robert E. Bridges
  • Patent number: 9446495
    Abstract: A lens processing system used for removing a lens blank (98, 110) from an edging block (40). The system includes an elongated collet (22) that engages the mating edging block (40). The block (40) includes an enlarged groove (41) that receives a pair of blades (65, 66) extended upwardly from the floor (75) of the collet (22). Each lens blank (98,110) is formed to include a series of surface markings (191,192) to verify proper functioning of the edging machine that forms a finished lens. Each lens blank also includes a series of circular markings (117,133) arranged in diagonal rows to verify the accurate drilling of bores with the lens blank (98,110).
    Type: Grant
    Filed: September 26, 2013
    Date of Patent: September 20, 2016
    Inventor: James Gregory Goerges
  • Patent number: 9429409
    Abstract: An inner diameter measuring device (4) for measuring an inner diameter by inserting an inner diameter measuring unit into an inside of a hollow member to be measured, comprises a supporting shaft (18) having the inner diameter measuring unit supported at a forward end, and a supporting mechanism unit (30) for cantilever-supporting the supporting shaft, wherein the supporting mechanism unit has a frame (31), a spherical bearing (33) and a deflection adjusting unit (35), wherein the shaft is supported by the frame via the spherical bearing, an end portion (32) of the supporting shaft is passed through the spherical bearing and is extended, and a position of an end of the end portion in vertical direction is adjusted by the deflection adjusting unit.
    Type: Grant
    Filed: February 7, 2013
    Date of Patent: August 30, 2016
    Assignee: IHI Corporation
    Inventors: Michiko Baba, Kouzou Hasegawa, Norimasa Taga
  • Patent number: 9383198
    Abstract: A method reduces errors in a turning device during a determination of coordinates of a work piece or during machining of the work piece. The turning device allows a rotational movement of the work piece about a rotation axis of the turning device. The method includes measuring errors in the turning device on account of deviations between actual positions and actual orientations of the rotation axis, on the one hand, and corresponding ideal positions and ideal orientations of the rotation axis, on the other hand, in a range of rotation angles. Expected error values of the turning device are determined from error measurements and are used to correct the turning device.
    Type: Grant
    Filed: March 22, 2013
    Date of Patent: July 5, 2016
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Rainer Sagemueller, Dominik Seitz, Thomas Engel
  • Patent number: 9366592
    Abstract: An arm type three-dimensional measuring apparatus includes: a multi-jointed arm mechanism including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount.
    Type: Grant
    Filed: November 18, 2014
    Date of Patent: June 14, 2016
    Assignee: MITUTOYO CORPORATION
    Inventor: Tomonori Goto
  • Patent number: 9335143
    Abstract: A form measuring apparatus includes a probe for measuring a measured object; a rotary table on which the measured object is placed; and a coordinate system calculator calculating coordinate axes configuring a coordinate system for the rotary table. The coordinate system calculator calculates, based on a position of a master ball fixated to the rotary table, a center of a circle traced by the master ball when the rotary table is rotated; calculates a rotary table coordinate system having the center of the circle as an origin point; and corrects coordinates of the origin point based on a calibrated diameter value of a gauge fixated to the rotary table, a first diameter value of the gauge measured by a first measurement in which the probe approaches the gauge in a first direction, and a second diameter value of the gauge measured by a second measurement.
    Type: Grant
    Filed: August 20, 2014
    Date of Patent: May 10, 2016
    Assignee: MITUTOYO CORPORATION
    Inventors: Takashi Noda, Hiroshi Kamitani, Tomohiro Usui
  • Patent number: 9207076
    Abstract: In a method for determining ricochet vectors of a probe of a coordinate measuring machine (CMM) using a computing device, the computing device sets an approach distance between the probe and a manufactured object. Coordinates of a center of the probe and an initial vector of the probe for each measurement point of the manufactured object are obtained when the probe is manually operated to measure the manufactured object. A measurement element of the manufactured object is fit according to all measurement points of the manufactured object. For each measurement point, an approach point of the manufactured object is calculated, a position relation between the approach point and the measurement element of the manufactured object is determined, and a ricochet vector of the probe is calculated according to the position relation.
    Type: Grant
    Filed: December 11, 2012
    Date of Patent: December 8, 2015
    Assignees: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Zhong-Kui Yuan, Zheng-Cai She, Yu-Hua Xu, Xiao-Guang Xue
  • Patent number: 9110457
    Abstract: Disclosed are systems and apparatus adapted to aid in calibration of an offset position—between a position sensor and an end effector in a processing system. The system includes a robotic component having an end effector and a position sensor coupled thereto, a teach target having a first geometrical feature, and an offset tool adapted to be engaged by the end effector, the offset tool including a first docking feature. The system further includes a moveable offset target having a second docking feature adapted to be engaged by the first docking feature and a second geometrical feature adapted to be sensed by the position sensor. The end effector moves the offset tool to the offset target and docks them. A position of the teach target and the offset target may then be sensed with the position sensor to determine an actual offset of the end effector with respect to the position sensor. Methods of operating the system are provided, as are other aspects.
    Type: Grant
    Filed: June 21, 2011
    Date of Patent: August 18, 2015
    Assignee: Siemens Healthcare Diagnostics Inc.
    Inventors: Glenn Friedman, Thomas Creazzo, Chris Beliveau
  • Patent number: 9038434
    Abstract: In a method for calibrating a star probe of an image measuring machine, the star probe includes one or more probe heads. Probe configuration information for the star probe is configured when there is no probe configuration file of the star probe stored in a storage device of the image measuring machine, and one of the probe heads to be calibrated is selected from the star probe. The method calibrates a radius value of the selected probe head, and calibrates the deviation between the center point of the selected probe head and the focus of the camera lens. The method further generates a star probe model of the star probe according to the probe configuration information and the probe calibration information, and displays the star probe model of the star probe on a display device of the image measuring machine.
    Type: Grant
    Filed: July 23, 2012
    Date of Patent: May 26, 2015
    Assignees: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Zheng-Cai She, Zhong-Kui Yuan, Zhi-Jun Zou, Dong-Hai Li
  • Patent number: 9003670
    Abstract: A method for inspecting a surface geometry of a workpiece includes mounting the workpiece to a measurement artifact that includes a plurality of parametric datum features. The parametric datum features may be utilized by a first inspection device and a second inspection device to establish a measurement coordinate system. The surface geometry is measured relative to the measurement coordinate system with the first inspection device to provide first measurement data. The surface geometry is also measured relative to the measurement coordinate system with the second inspection device to provide second measurement data.
    Type: Grant
    Filed: March 8, 2012
    Date of Patent: April 14, 2015
    Assignee: United Technologies Corporation
    Inventor: James Romanelli
  • Patent number: 8973279
    Abstract: A coordinate measuring machine has 1) an anchor beam with a top end and a bottom end, 2) at least one support beam having a top end and a bottom end, and 3) a cross-beam supported on the top ends of both the anchor beam and the at least one support beam. In addition, the coordinate measuring machine also has 4) a base supporting the bottom ends of the anchor beam and the at least one support beam. At least one of the at least one support beams has a first spring and a second spring. In preferred embodiments, the first spring is adapted to allow movement and is spaced from the second spring in a direction that is generally parallel with the longitudinal axis of the cross-beam.
    Type: Grant
    Filed: March 1, 2013
    Date of Patent: March 10, 2015
    Assignee: Hexagon Metrology, Inc.
    Inventors: Gurpreet Singh, John Langlais, Jie Zheng
  • Patent number: 8950078
    Abstract: An apparatus for inspecting a measurement object, comprising a workpiece support for supporting the measurement object and a measuring head carrying an optical sensor. The measuring head and the workpiece support are movable relative to one another. The optical sensor has an objective and a camera designed to capture an image of the measurement object. The objective has a light entrance opening and a light exit opening, and comprises a multitude of lens-element groups arranged in the objective between the light entrance opening and the light exit opening one behind another along a longitudinal axis of the objective. Furthermore, the apparatus has a reflection element and a calibration arrangement. The reflection element can selectively be introduced into a beam path running from the measurement object through the objective to the camera. The calibration arrangement is coupled into the beam path to the camera by means of the reflection element.
    Type: Grant
    Filed: August 6, 2013
    Date of Patent: February 10, 2015
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventor: Thomas Engel
  • Patent number: 8949071
    Abstract: According to the present invention, a center deviation amount, which is an amount of deviation (distance) between the center line of a reference measurement target and the detection point is calculated using the reference measurement target having a known diameter, and a measurement value of a diameter of an arbitrary measurement target is corrected using the center deviation amount. Therefore, an accurate diameter value can be calculated even in the case of a measurement target having a diameter value different from the diameter value of the reference measurement target.
    Type: Grant
    Filed: January 12, 2012
    Date of Patent: February 3, 2015
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Ryo Takanashi
  • Patent number: 8942940
    Abstract: Implementing a portable articulated arm coordinate measuring machine includes receiving a first request to perform a function. The portable AACMM includes a manually positionable articulated arm portion having opposed first and second ends, the arm portion including a plurality of connected arm segments, each arm segment including at least one position transducer for producing a position signal, a measurement device attached to a first end of the AACMM, and an electronic circuit which receives the position signals from the transducers and provides data corresponding to a position of the measurement device.
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: January 27, 2015
    Assignee: Faro Technologies, Inc.
    Inventor: Frederick John York
  • Patent number: 8898918
    Abstract: The invention relates, in particular, to an instrument for measuring length, comprising an inductive sensor comprising an elongate body and a tip that is movable along a longitudinal axis. The body contains windings and defines a first cavity receiving a magnetic core. The instrument further comprises a casing which extends the body along the longitudinal axis, and which defines, together with the body, a second sealed cavity containing the tip. The capacity of the casing to resiliently deform along the longitudinal axis is greater than the capacity of said casing to resiliently deform along axes that are orthogonal to said longitudinal axis.
    Type: Grant
    Filed: August 1, 2012
    Date of Patent: December 2, 2014
    Assignee: Comissariat a l'Energie Atomique et Aux Energies Alternatives
    Inventor: Frédéric Rodiac
  • Patent number: 8832952
    Abstract: Provided is an apparatus for measuring outer diameters of fuel rods of a nuclear fuel assembly, in which the fuel rods are standing upright and are used in a light water reactor. The apparatus includes a support unit fixed to a floor at a lower portion thereof so as to be kept insulated from vibrations caused by external forces, a measuring unit mounted on the support unit and moving up and down to measure the outer diameters of the fuel rods, and a transducer cooperating with the measuring unit, converting the measured outer diameters of the fuel rods into electrical signals, and sending the converted signals to the outside. Thus, the apparatus moves up and down to measure the outer diameters of the fuel rods, so that it can accurately check abnormalities in the outer diameters of the fuel rods.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: September 16, 2014
    Assignee: Kepco Nuclear Co., Ltd.
    Inventors: Jung Cheol Shin, Soon Ki Kim, Jin Man Joo, Dae Hee Kang
  • Patent number: 8707571
    Abstract: Provided is an apparatus for measuring dimensions of a spacer grid for nuclear fuel assemblies. The apparatus includes a fixing unit fixed to a measuring table placed on a floor and kept insulated from vibrations caused by external force, a measuring unit mounted on the fixing unit and configured so that measuring members are installed on both sides of a rectangular spacer grid and move in forward and backward directions by cylinders while grasping the both sides of the spacer grid, and measure abnormalities in the both sides of the spacer grid, and a displacement measuring unit mounted on one side of the measuring unit and sending the measured abnormalities in the both sides of the spacer grid to the outside.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: April 29, 2014
    Assignee: Kepco Nuclear Co., Ltd.
    Inventors: Jung Cheol Shin, Yong Gu Han, Eun Hye Kim, Jung Yoon Han
  • Publication number: 20140109419
    Abstract: A profile measuring instrument usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in the form of a revolution solid, includes: a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis; a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable; a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis. The linear scanning measurement unit and the turntable are adjusted to relative positions at which the measurement axis passes through the rotation axis.
    Type: Application
    Filed: October 16, 2013
    Publication date: April 24, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideki Shindo, Yoshiyuki Omori
  • Publication number: 20140109420
    Abstract: A double cone stylus includes a shank and a double cone-shaped tip attached to the tip end of the shank, the double cone-shaped tip being a rotationally symmetric body obtained by rotating a triangle having a base extending along the shank around the shank as the symmetric rotation axis. The double cone stylus allows the shape of an inner wall surface of a measurement object with the inner wall surface retracted from an upper reference plane to be measured from above.
    Type: Application
    Filed: October 17, 2013
    Publication date: April 24, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Masaki KURIHARA, Yasuhiro TAKAHAMA, Masanori ARAI, Tomoyuki MIYAZAKI
  • Publication number: 20140096405
    Abstract: A measurement apparatus and corresponding method can be used to measure an absolute diameter of a part in a shop floor environment. A tracker such as a laser tracker monitors a position of a probe end of a measurement arm of the apparatus. The position measured by the laser tracker can be used directly account for errors in the apparatus such as, for example, positioning errors of the measurement arm. The position monitoring of the tracking device eliminates complex apparatus calibrations and calculations used for previous devices.
    Type: Application
    Filed: November 18, 2013
    Publication date: April 10, 2014
    Applicant: Axiam, Inc.
    Inventors: Robert M. Lee, Robert E. Parsons
  • Publication number: 20140059872
    Abstract: A shape measuring machine includes a slider that supports a scanning probe. A scale unit detects a displacement of the slider. A tip sphere displacement detection unit detects a displacement of the tip sphere. A calculation unit includes a correction filter including a first and second filters and an adder, and calculates a measurement value from the displacements of the slider and the tip sphere. The first filter corrects the displacement of the slider based on a frequency transfer characteristic from the scale unit to the tip of the slider. The second filter outputs a value that is obtained by correcting a value corrected by the first filter based on a frequency transfer characteristic from the tip of the slider to the tip sphere as the correction value. The adder outputs a measurement value obtained by adding the correction value and the displacement of the tip sphere.
    Type: Application
    Filed: August 20, 2013
    Publication date: March 6, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideyuki NAKAGAWA, Nobuhiro ISHIKAWA
  • Patent number: 8661700
    Abstract: The present system, method, article of manufacture, software, and apparatus is an “intelligent” probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error free probe swapping on a CMM.
    Type: Grant
    Filed: January 10, 2013
    Date of Patent: March 4, 2014
    Assignee: Faro Technologies, Inc.
    Inventors: Clark H. Briggs, Keith George Macfarlane, Frederick John York, Marc Barber
  • Publication number: 20140041242
    Abstract: An apparatus for inspecting a measurement object, comprising a workpiece support for supporting the measurement object and a measuring head carrying an optical sensor. The measuring head and the workpiece support are movable relative to one another. The optical sensor has an objective and a camera designed to capture an image of the measurement object. The objective has a light entrance opening and a light exit opening, and comprises a multitude of lens-element groups arranged in the objective between the light entrance opening and the light exit opening one behind another along a longitudinal axis of the objective. Furthermore, the apparatus has a reflection element and a calibration arrangement. The reflection element can selectively be introduced into a beam path running from the measurement object through the objective to the camera. The calibration arrangement is coupled into the beam path to the camera by means of the reflection element.
    Type: Application
    Filed: August 6, 2013
    Publication date: February 13, 2014
    Applicant: Carl Zeiss Industrielle Messtechnik GmbH
    Inventor: Thomas ENGEL