With Computer Responsive To Contact Probe Patents (Class 33/504)
  • Patent number: 11880191
    Abstract: Various embodiments of the teachings herein include a control device for controlling one or more field devices connected to the control device by data technology in the form of a communication network. The control device includes a wireless service interface. The communication network connects the control device to one or more tools. The wireless service interface can be activated by first tool via the communication network.
    Type: Grant
    Filed: November 18, 2020
    Date of Patent: January 23, 2024
    Assignee: SIEMENS SCHWEIZ AG
    Inventors: Beat Kyburz, Herbert Meier
  • Patent number: 11435175
    Abstract: Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: September 6, 2022
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventor: Hideki Morii
  • Patent number: 11397073
    Abstract: Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: July 26, 2022
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventor: Hideki Morii
  • Patent number: 11340193
    Abstract: A form-fitting eddy current array probe for inspecting helical gears is provided, the probe comprising: a leg which includes a sensor zone with a plurality of eddy current arrays; an arm attached to and normal with the leg to provide an L-shaped probe, the arm including a sensor zone with a plurality of eddy current arrays; a resilient layer underlying the sensor zones; a gel layer attached to an upper surface of the sensor zones, the gel layer including a fluid gel and an outer covering encasing the fluid gel; and an encoder distally located on the leg. A method of inspecting a girth gear set including a helical gear and a girth gear using the form-fitting eddy current array probe is also provided.
    Type: Grant
    Filed: January 15, 2018
    Date of Patent: May 24, 2022
    Assignee: Global Physical Asset Management, Inc.
    Inventors: Thomas Shumka, Jason Shumka
  • Patent number: 11313660
    Abstract: In an embodiment, an apparatus includes one or more probes, a tip, a pin, and a measurement device. The one or more probes may be configured for insertion through an aperture in a component. The tip may be slidably engaged with the one or more probes and include a first end configured to contact a first surface of the component. The first end of the tip may be conically shaped. The pin may be slidably engaged with the one or more probes and include a first end configured for insertion into the aperture in the component such that the one or more probes are configured to contact a second surface of the component. The pin may be configured to move between a first position and a second position. An axis of the pin may be substantially aligned with an axis of the tip. The measurement device may be coupled to the tip and configured to measure a value indicating a grip length.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: April 26, 2022
    Assignee: Lockheed Martin Corporation
    Inventors: Jonathan Richard Olson, Tyler Martin Rup, Philip Michael Chovanec, Matthew Timothy McKee, Alondra Renee Guevara, Carl Bargainer, Glynn Bartlett, Thomas E. Lyons, Jr., J. Mark Major, Ryan McBee, Paul Wood, Stephen L. Wiedmann
  • Patent number: 11162771
    Abstract: The invention provides a solution according to which the diameters of a large plurality of cylindrical measuring pins (1A-1E) can be measured fast and accurately, while using an affordable, non-complex and universally applicable measuring apparatus. In concise summary, the key features of the invention are formed by using a two-dimensional tracing apparatus (10) having a simultaneous holding structure (12) for simultaneously holding the measuring pins in fixed positions relative to the apparatus frame (11), while the measuring pins are alongside one another with their central axes parallel to one another, and by performing first and second joint tracing operations by tracing against and along diametrically opposite first and second parts of first and second circular sections of the cylindrical outer surfaces of the measuring pins, to thereby determine measured values of the diameters.
    Type: Grant
    Filed: January 22, 2018
    Date of Patent: November 2, 2021
    Inventor: Reginald Galestien
  • Patent number: 11068624
    Abstract: A three-dimensional model generating method selecting a predetermined plane element defining a three-dimensional model element using measurement data, which includes measurement point group data obtained by measuring a measured object, a type of a plane element, and geometric values of the plane element; obtaining a condition required for generating a three-dimensional model element; generating the three-dimensional model element using the selected plane element and the obtained condition; and generating the three-dimensional model of the measured object using one or a plurality of three-dimensional model elements. A calculator displays a three-dimensional image corresponding to the measured object as well as a list of at least the structural elements which, of the plane elements included in the measurement data, configure the three-dimensional image.
    Type: Grant
    Filed: August 21, 2015
    Date of Patent: July 20, 2021
    Assignee: MITUTOYO CORPORATION
    Inventors: Yasushi Tomono, Takanori Asamizu
  • Patent number: 10934020
    Abstract: A method includes making a first structure with a first plurality of pre-drilled holes at pre-defined locations, making a second structure with a second plurality of pre-drilled holes at pre-defined locations, making a third structure without pre-drilled full-size holes, measuring the location and orientation of the first and second plurality of pre-drilled holes in the first and second structures, determining the location of a third plurality of holes to be drilled in the third structure that correspond to first and second plurality of pre-drilled holes measured in the first and second structures, creating a program to drill the third plurality of holes in the third structure that align with the measured location and orientation of the first and second plurality of pre-drilled holes in the first and second structures based on the measure location and orientation of the first and second plurality of pre-drilled holes in the first and second structure, drilling the third plurality of holes in the third structu
    Type: Grant
    Filed: January 25, 2017
    Date of Patent: March 2, 2021
    Assignee: The Boeing Company
    Inventors: Craig A. Charlton, Branko Lakic, Jerald A. Hull, Christopher A. Greer, Justin H. Pratt
  • Patent number: 10190860
    Abstract: A measuring device includes a rotatable stage configured to receive and rotate an object long a rotational axis of the object. A housing is located adjacent to the rotatable stage and is movable along the rotational axis of the object. The housing has a pivoting arm located between a pair of opposing compression springs which are configured to provide a preload force in a direction parallel to the rotational axis of the object. A probe tip is coupled to the pivoting arm and extends from the housing, the probe tip configured to contact a portion of the object. A displacement measuring device is coupled to the pivoting arm and is configured to measure displacement of the probe tip in the direction parallel to the rotational axis of the object based on movement of the pivoting arm against one of the opposing compression springs.
    Type: Grant
    Filed: August 24, 2016
    Date of Patent: January 29, 2019
    Assignee: Adcole Corporation
    Inventors: Paul D. Richards, Stephen J. Corrado
  • Patent number: 9952045
    Abstract: A calibration gauge having plane symmetry is set in a position other than a rotation center of a rotary table. The calibration gauge is measured while the rotary table is driven to rotate. Offset of a measurement axis is determined based on a phase pattern of the rotary table when a stylus head detects the calibration gauge.
    Type: Grant
    Filed: March 7, 2016
    Date of Patent: April 24, 2018
    Assignee: MITUTOYO CORPORATION
    Inventor: Madoka Yasuno
  • Patent number: 9869538
    Abstract: A measuring device and related methods include, in at least one aspect, a method for controlling a measuring device: including processing data providing information on a shape of the part to determine a set of suitable surface touch positions, the set of suitable surface touch positions being used to generate a first queue; instructing the measuring device to move at least one of one or more probes to each position listed in the first queue, and to take a surface touch measurement at each position; calculating a set of suitable edge touch positions based on the surface touch measurements, the set of suitable edge touch positions being used to generate a second queue of measurements; and instructing the measuring device to move the at least one of the one or more probes to each position listed in the second queue, and to take an edge measurement at each position.
    Type: Grant
    Filed: October 8, 2015
    Date of Patent: January 16, 2018
    Assignee: Delcam Limited
    Inventor: Dmitriy Dolgikh
  • Patent number: 9689652
    Abstract: The invention relates to a handheld measurement instrument and a configurator forming a measurement kit. The measuring instrument and the configurator are provided each with an interface, enabling communication between the measuring instrument and the configurator. The handheld measurement instrument further comprises a measuring unit for measuring distances or angles of an object by contacting physically distinct points of said object; and a circuit unit applying a function of a functionality on electronic signals/electronic measurement results delivered from the measuring unit in order to deliver the measuring results in a desired form to the user by output means. The form the results should be presented can be selected by the user using input means of the measuring instrument. The circuit unit is configurable by the user using the configurator in order to determine, with which functionality the circuit unit and the input means, respectively should be equipped.
    Type: Grant
    Filed: August 5, 2013
    Date of Patent: June 27, 2017
    Assignee: HEXAGON TECHNOLOGY CENTER GMBH
    Inventor: Pascal Jordil
  • Patent number: 9207059
    Abstract: A method for operating a coordinate measuring machine or a machine tool. A movement of a machining part is controlled in such a way that, during the movement of the machine part, a predetermined maximum acceleration and/or a predetermined maximum jerk is not exceeded. The maximum acceleration and/or the maximum jerk is varied depending on the position of the machine part and/or depending on the alignment of the machine part.
    Type: Grant
    Filed: April 18, 2011
    Date of Patent: December 8, 2015
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Henning Schon, Jochen Burger, Guenter Grupp, Otto Ruck, Eugen Aubele, Ralf Bernhardt
  • Publication number: 20150088458
    Abstract: A shape measurement method includes acquiring a plurality of partial measurement data sets of a measurement surface and inclination data corresponding to the partial measurement data sets; performing fitting of the partial measurement data sets so that differences between a reference equation and the partial measurement data sets are reduced, while the relative tilt between the partial measurement data sets is maintained less than or equal to a predetermined threshold; and obtaining the shape of the measurement surface by connecting the fitted partial measurement data sets.
    Type: Application
    Filed: September 18, 2014
    Publication date: March 26, 2015
    Inventor: Akinori Miyata
  • Publication number: 20150025844
    Abstract: A metrological apparatus has a workpiece support surface (16) and a mover (9) to carry out a measurement by effecting relative movement in a measurement direction, X, between the workpiece support surface and a stylus (11) such that the stylus is deflected as a stylus tip of the stylus follows surface variations. A transducer (39) provides a measurement data set in a measurement coordinate system representing the deflection, a, of the stylus at measurement points in the measurement direction, X. A rotation device (16) effects relative rotation of the workpiece support surface and the mover about a rotation axis.
    Type: Application
    Filed: February 27, 2013
    Publication date: January 22, 2015
    Inventor: Daniel Ian Mansfield
  • Patent number: 8907244
    Abstract: The present invention includes steps of, determining a search starting position; setting a center position, and a first position and a second position with a distance provided therebetween; obtaining a measurement point group including measurement points of the center position, the first position, and the second position; and determining a measurement point closest to the tip portion in the measurement point group based on positions of the measurement points in a second direction and selecting a position of the measurement point in a first direction as a selected position. When the measurement point group is obtained initially after the determination of the search starting position, the search starting position is set as the center position; and when the measurement point group is obtained after the selection of the selected position, the selected position is set as the center position. The distance is narrowed for every selection of the selected position.
    Type: Grant
    Filed: April 28, 2009
    Date of Patent: December 9, 2014
    Assignee: Mitsubishi Electric Corporation
    Inventors: Toshiaki Kurokawa, Hidetaka Katougi
  • Patent number: 8874406
    Abstract: A system for measurement of spatial coordinates and/or orientation of a probe, comprising a first spatial direction sensor associated with a pattern of targets with known positions relative to each other and to the first spatial direction sensor, a second spatial direction sensor, and processing means for the computation of the orientation and/or spatial coordinates of the pattern of targets relative to the second spatial direction sensor based on the known positions of the targets relative to each other and a determination of the spatial directions of the targets with respect to the second spatial direction sensor, wherein at least three of the targets are in the field of view (FOV2) of the second spatial direction sensor irrespective of the orientation of the pattern of targets and wherein the first spatial direction sensor determines the spatial coordinates and/or orientation of the probe.
    Type: Grant
    Filed: April 15, 2011
    Date of Patent: October 28, 2014
    Assignee: Metronor AS
    Inventors: Øyvind Røtvold, Knut Åmdal, Harald Suphellen
  • Patent number: 8849607
    Abstract: A system for measurement of spatial coordinates and/or orientation of a probe, comprising a first spatial direction sensor associated with a pattern of targets with known positions relative to each other and to the first spatial direction sensor, a second spatial direction sensor, and processing means for the computation of the orientation and/or spatial coordinates of the pattern of targets relative to the second spatial direction sensor based on the known positions of the targets relative to each other and a determination of the spatial directions of the targets with respect to the second spatial direction sensor, wherein at least three of the targets are in the field of view (FOV2) of the second spatial direction sensor irrespective of the orientation of the pattern of targets and wherein the first spatial direction sensor determines the spatial coordinates and/or orientation of the probe.
    Type: Grant
    Filed: April 15, 2011
    Date of Patent: September 30, 2014
    Assignee: Metronor AS
    Inventors: Øyvind Røtvold, Knut Åmdal, Harald Suphellen
  • Patent number: 8504316
    Abstract: Provided is method of calibrating Y-axis direction position of contact tip of form measuring instrument including: table rotatable about Z-axis; contact tip capable of contacting workpiece; and contact tip driving means to drive contact tip in at least X- and Z-axis directions among X-, Y- and Z-axis directions perpendicular to one another. Method performs tracing measurement of inclined surface or inclined cylinder side surface which is part of workpiece obtained by inclining workpiece placed on table about Y-axis, or side surface of off-centered cylinder having center axis off-centered in X-axis direction by rotating surface to obtain measurement value at each angular position of rotation of table, obtains angular position of rotation at which smallest value among measurement values of tracing measurement is detected as angular position of rotation with smallest detected value, and adjusts Y-axis direction position of contact tip based on angular position of rotation with smallest detected value.
    Type: Grant
    Filed: April 30, 2010
    Date of Patent: August 6, 2013
    Assignee: Mitutoyo Corporation
    Inventors: Toshiyuki Tamai, Tomonori Goto
  • Patent number: 8486576
    Abstract: An in-line planar fuel cell height measurement system is mainly composed of a main stand, at least a top platform above a high temperature furnace, a displacement detection unit on the top platform with a central axis connecting to an extension rod that goes downward into the high temperature furnace and contacts the top surface of the cell stack inside the high temperature furnace, a displacement display unit connecting to the displacement detection unit through signal transmission cables, and a data processing unit connecting to the displacement display unit through signal transmission cables, so the displacement detection unit can sense the height change for the cell stack in the high temperature furnace during temperature rise and operation and send out a signal, which can be directly displayed by the displacement display unit and received by a data processing unit for further analysis and storage.
    Type: Grant
    Filed: December 2, 2008
    Date of Patent: July 16, 2013
    Assignee: Institute of Nuclear Energy Research
    Inventors: Yung-Neng Cheng, Ruey-Yi Lee, Hung-Hsiang Lin
  • Patent number: 8083444
    Abstract: A method and apparatus are provided to machine a curved surface such as an inner or outer peripheral surface of a pipe. The pipe is held stationary during machining and a rotatable spindle of a machine head moves along multiple orthogonal axes to align the rotational axis of the spindle with the longitudinal pipe axis. Preferably, the pipe axis is located by using a touch probe to engage the curved surface at multiple spots and the calculating the location of the pipe axis. The cutting tool, which is preferably a cutting tool insert, is rotated by the spindle to machine the curved surface.
    Type: Grant
    Filed: March 8, 2010
    Date of Patent: December 27, 2011
    Assignee: Mazak Corporation
    Inventor: Bernard Edward Schawe
  • Patent number: 7992314
    Abstract: An elevation measuring device comprises a measuring column at which a vertically movable measuring slide is supported, so it can be moved by hand and also by a drive motor through a clutch device. The measuring slide supports a scan head, which imparts a constant measuring force onto the measuring location at the work piece, which is generated by the drive motor and the clutch device. A measuring system detects the elevation coordinate of the scan head and hands said elevation coordinate to a control device for further processing and evaluation. The control device comprises logic for automating the measuring process. This logic automatically detects a positioning of the scan head in a certain direction, which is manually performed by the operator, subsequently controls the drive motor in a suitable manner in order to cause a scanning of the work piece and determines the measurement values.
    Type: Grant
    Filed: November 17, 2008
    Date of Patent: August 9, 2011
    Assignee: Carl Mahr Holding GmbH
    Inventors: Peter Strack, Jens Stockburger, Zoran Ostric
  • Patent number: 7983790
    Abstract: A method for modifying a component may comprise measuring the component using a modifying tool, and recording position data for the component based on the measuring. A path for the modifying tool may be provided using the position data, and the component may be modified by moving the same modifying tool based on the provided path.
    Type: Grant
    Filed: December 19, 2008
    Date of Patent: July 19, 2011
    Assignee: The Boeing Company
    Inventors: Phillip John Crothers, Robert Coulter Fraser
  • Patent number: 7896658
    Abstract: An apparatus, includes a plurality of pins which include a longitudinal axis, each of the pins to be respectively electronically contacted with each of a plurality of terminals of an electronic component by pressing each of the terminals onto each of the pins from a direction corresponding to the longitudinal axis, and an adjusting unit which adjusts a position of the electronic component so that each of the terminals corresponds to each of the pins respectively.
    Type: Grant
    Filed: July 14, 2008
    Date of Patent: March 1, 2011
    Assignee: NEC Corporation
    Inventor: Hironobu Ikeda
  • Patent number: 7784333
    Abstract: An approach controller (234) of a coordinate measuring instrument enables a position control loop (RP) and drives an actuator (133) so that a force sensor (1) is brought to a close position under a position control. When recognizing that the force sensor (1) reaches the close position, a contact controller (235) controls a switch (227) to enable a force control loop (RF) and drives the actuator (133) to bring the force sensor (1) into contact with a workpiece under a force control.
    Type: Grant
    Filed: May 14, 2007
    Date of Patent: August 31, 2010
    Assignee: Mitutoyo Corporation
    Inventors: Kentaro Nemoto, Takeshi Yamamoto
  • Patent number: 7715999
    Abstract: A surface texture measuring instrument includes: a movement-estimating unit for estimating a movement condition of a drive mechanism based on a scanning vector command issued by a scanning vector commander to calculate an estimated operation state quantity; and a correction-calculating unit for correcting a detection value of a drive sensor in accordance with the estimated operation state quantity calculated by the movement-estimating unit. The movement-estimating unit includes: a nominal-model setting unit in which a nominal model representing signal transfer function of the scanning vector command from the issuance of the scanning vector command to a reflection on a movement position of the scanning probe is stored.
    Type: Grant
    Filed: August 1, 2008
    Date of Patent: May 11, 2010
    Assignee: Mitutoyo Corporation
    Inventor: Shingo Kiyotani
  • Patent number: 7694426
    Abstract: A method is disclosed for eliminating sources of error in the system correction of a coordinate measuring machine. Herein, a number j of reference structures 33 on a rigid reference object 30 are measured in a starting orientation k=0, and the starting coordinates and the reference coordinates of the reference structures 33 on the reference object 30 are determined in a number k?3 of mutually different orientations.
    Type: Grant
    Filed: January 31, 2008
    Date of Patent: April 13, 2010
    Assignee: Vistec Semiconductor Systems GmbH
    Inventors: Michael Heiden, Klaus Rinn
  • Patent number: 7685726
    Abstract: In probing by scanning a workpiece (71) to be measured using a coordinate measuring machine a stylus tip is moved before the scanning along a scanning path (73) along an initialization path (83) or/and after the scanning path (73) along a finalization path (85). A length (Lv, Ln) of the initialization path, respectively finalization path, is chosen in dependence of parameters of a concrete measuring task, in particular in dependence of a pre-determined scanning speed, a stiffness of the stylus or a mass of the stylus.
    Type: Grant
    Filed: July 3, 2006
    Date of Patent: March 30, 2010
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Andreas Fuchs, Hermann Deeg, Heinz Peter
  • Patent number: 7689379
    Abstract: A dimensional measurement probe (10) is mounted in a machine tool (48), which reorientates the probe about at least one axis A. Strain gauges (34) sense when a stylus (20) of the probe contacts a workpiece (50), to produce a trigger signal. False trigger signals may be produced when the probe is reorientated. To overcome this, the reorientation is detected by monitoring changes in the fluctuations of the strain gauge outputs, caused by vibrations of the stylus.
    Type: Grant
    Filed: June 15, 2006
    Date of Patent: March 30, 2010
    Assignee: Renishaw PLC
    Inventors: Jonathan Paul Fuge, Michael John Wooldridge, Jamie John Buckingham, Peter Kenneth Hellier
  • Patent number: 7659509
    Abstract: In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: February 9, 2010
    Assignee: Agilent Technologies, Inc.
    Inventors: Richard K. Workman, David Patrick Fromm
  • Patent number: 7539595
    Abstract: The invention relates to a method for determining the co-ordinates of a workpiece (9). According to said method: a first co-ordinate system, which has a fixed position in relation to the workpiece (9), is defined; first co-ordinates of the workpiece (9) are measured using a first co-ordinate measuring device (3); second co-ordinates of the workpiece (9) are measured using a second co-ordinate measuring device (5); and a common set of co-ordinates is generated from the first co-ordinates and the second co-ordinates in the first co-ordinate system or in a second co-ordinate system, which has a fixed position in relation to the workpiece (9). The method can be used in particular to determine co-ordinates of a plurality of workpieces (9) during and/or after the production and/or processing of the workpieces (9).
    Type: Grant
    Filed: January 12, 2005
    Date of Patent: May 26, 2009
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Bernd Georgi, Andreas Lotze
  • Publication number: 20090071024
    Abstract: An elevation measuring device (1) comprises a measuring column (3) at which a vertically movable measuring slide (4) is supported, so it can be moved by hand and also by a drive motor (14) through a clutch device (15). The measuring slide (4) supports a scan head (8), which imparts a constant measuring force onto the measuring location at the work piece, which is generated by the drive motor (14) and the clutch device (15). A measuring system (19) detects the elevation coordinate of the scan head (8) and hands said elevation coordinate to a control device (21) for further processing and evaluation. The control device (21) comprises logic (33) for automating the measuring process.
    Type: Application
    Filed: November 17, 2008
    Publication date: March 19, 2009
    Inventors: Peter Strack, Jens Stockburger, Zoran Ostric
  • Patent number: 7490411
    Abstract: A screw measuring apparatus comprising: an internal-dimension measuring unit for obtaining internal-dimension information Dw of a female screw placed on a coordinate measuring machine when the stylus-tip sphere having the diameter selected according to the pitch of the female screw is butted against the screw groove of the female screw; and an effective-diameter calculating unit for obtaining effective-diameter information De of the female screw from the internal-dimension information Dw obtained by the internal-dimension measuring unit, diameter information 2r of the stylus-tip sphere, and thread angle information ? and pitch information P of the female screw, by using an effective-diameter calculation expression De=Dw+2r×cosec(?/2)?(P/2)×cot(?/2).
    Type: Grant
    Filed: March 1, 2007
    Date of Patent: February 17, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Sadayuki Matsumiya, Masanori Arai
  • Patent number: 7392692
    Abstract: A surface scan measuring device, a surface scan measuring method, a surface scan measuring program and a recording medium storing such a program which can appropriately adjust the scanning speed, the sampling pitch and other measurement parameters according to the surface condition of a workpiece are provided. The surface scan measuring device includes a radius of curvature computing section (543) for computing the radius of curvature of the scanning point from the measurement data acquired during the ongoing scanning operation, a moving speed deciding section (544) for deciding the moving speed of the scanning probe according to the computed radius of curvature and a sampling pitch deciding section (546) for deciding the sampling pitch according to the computed radius of curvature.
    Type: Grant
    Filed: May 26, 2005
    Date of Patent: July 1, 2008
    Assignee: Mitutoyo Corporation
    Inventor: Takashi Noda
  • Patent number: 7316077
    Abstract: A probe (10) for a machine tool has a switch (32) or other sensor for connecting its battery power supply in response to movement of the probe. In a preferred embodiment, the switch responds to rotation of the probe in the machine tool spindle. The switch (32) is responsive to linear accelerations, but is mounted in the probe so as to respond also to the rotation. A circuit is provid to discriminate between the rotation and linear movements.
    Type: Grant
    Filed: March 13, 2004
    Date of Patent: January 8, 2008
    Assignee: Renishaw, PLC
    Inventors: Jonathan Paul Fuge, Robin William Cashmore, David Collingwood, Mark Acres
  • Patent number: 7254506
    Abstract: A method of measuring an object on a coordinate positioning apparatus. A first object is placed on a coordinate positioning apparatus and measured with a workpiece contacting probe to create measurement data. The measurement data is collected at multiple stylus deflections or probe forces. For a plurality of points on the surface of the first object, the measurement data is extrapolated to that corresponding to zero stylus deflection or zero probe force. An error function or map is created from the measurement data and the extrapolated data. Subsequent objects are then measured using a known stylus deflection or known probe force and the error function or map is used to apply an error correction to these measurements.
    Type: Grant
    Filed: July 4, 2003
    Date of Patent: August 7, 2007
    Assignee: Renishaw, PLC
    Inventors: David Roberts McMurtry, Geoffrey McFarland
  • Patent number: 7055367
    Abstract: A method of calibrating an analogue probe (10) having a stylus (12) with a workpiece-contacting tip (14) or a non-contact probe (26). A calibration artefact such as a calibration sphere (16) is mounted on a coordinate measuring machine (CMM) (18). The probe (10,26) is mounted on an arm (8) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe (10) having a workpiece-contacting stylus (12), the path is such that the deflection of the stylus varies along the path. For a non-contact probe (26) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.
    Type: Grant
    Filed: November 1, 2002
    Date of Patent: June 6, 2006
    Assignee: Renishaw PLC
    Inventors: Peter Hajdukiewicz, Geoffrey McFarland, David Sven Wallace
  • Patent number: 7024273
    Abstract: A probe driving mechanism for displacement measuring apparatuses, capable of carrying out a stable, constant speed probe feeding operation without additionally providing a motor rotation detecting rotary encoder and a tachometer generator. When an output from a scale varies in accordance with the power applied to a motor, the power applied to the motor is controlled in accordance with an output from the scale. When the variation of an output from the scale becomes small even though the same level of power continues to be applied to the motor, a judement that a probe contacts the workpiece is given, and the power applied to the motor is set smaller. When an output from the workpiece sensor varies, the power applied to the motor is controlled in accordance with one of an output from the scale and that from the workpiece sensor the speed variation of which is larger than that of the other.
    Type: Grant
    Filed: October 20, 2003
    Date of Patent: April 4, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Masashi Tsuboi, Hiroshi Yamashiro
  • Patent number: 7023358
    Abstract: A method and an assembly 10 for identifying the existence and the size of a gap. Particularly, the assembly 10, in one embodiment, includes a member 50, which forcibly engages a staring gauge 16 as two members or portions abuttingly engage. The force is representative of the amount of space between the two members or portions and this information is wirelessly transmitted to a receiver and display assembly 40.
    Type: Grant
    Filed: November 27, 2001
    Date of Patent: April 4, 2006
    Assignee: Ford Global Technologies LLC
    Inventor: Kelly Michael Kohlstrand
  • Patent number: 7024333
    Abstract: A coordinate measuring apparatus includes probe pin(s) fixed to a probe head displaceable in coordinates. The probe pin includes probe shafts having respective ends to which probe balls are attached. At least two of the probe shafts are differently oriented when the probe pins are fixed to the probe head. A control and evaluation unit controls the course of measurement and evaluates the measuring points recorded. At least one probe shaft is determined for measuring a geometric element on a workpiece by determining at least one characteristic piece of directional information for the points to be measured of a geometric element to be measured on the workpiece, either on the basis of the measured measuring points or according to predefined nominal data of the geometric element. At least one probe shaft for measuring the measuring points is determined from the directional information.
    Type: Grant
    Filed: September 10, 2003
    Date of Patent: April 4, 2006
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Rudolf Rögele, Dieter Kalmbach
  • Patent number: 6952883
    Abstract: Method enabling a command to switch the measure mode to be entered in a single vertical axis dimension-measuring column. The mode witch command is entered by pressing the probe tip against the piece to be measured during a time interval greater than a predetermined value. The measuring and displaying system then engages in a search mode of the turn-back point of said piece to be measured. Application: measurement of inner or outer diameters by means of a single-axis measuring column. The method allows the hole's minimal and maximal points to be determined with a minimum of handling operations.
    Type: Grant
    Filed: November 21, 2003
    Date of Patent: October 11, 2005
    Assignee: Tesa SA
    Inventors: Pascal Jordil, Charles-Henri Zufferey
  • Patent number: 6848315
    Abstract: A stylus structure (40) integrally incorporating a stylus (2), a vibrator (4), a detector (6), a first secondary magnetic circuit (12) and a second primary magnetic circuit (21), and a stylus support (30) integrally incorporating a first primary magnetic circuit (11) and a second secondary magnetic circuit (22) are mutually fittable, thereby achieving signal transmission by the respective magnetic circuits using no electrical contact.
    Type: Grant
    Filed: February 14, 2002
    Date of Patent: February 1, 2005
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kazuhiko Hidaka, Kiyokazu Okamoto
  • Patent number: 6830659
    Abstract: An apparatus for measuring wear of a doctor blade includes measuring members placed around the doctor blade for measuring at least one dimension of the doctor blade. The measuring members are arranged to permit longitudinal movement of the doctor blade between the doctor blade and the measuring members. In addition, measurement sensors are connected to the measuring members to obtain a continuous measurement result when the doctor blade or the apparatus is moved. The invention also relates to a method in the measurement of wear of a doctor blade and in controlling a paper machine.
    Type: Grant
    Filed: November 5, 2002
    Date of Patent: December 14, 2004
    Assignee: Metso Paper, Inc.
    Inventor: Tero Sovijärvi
  • Patent number: 6802133
    Abstract: Method enabling a command to switch the measure mode to be entered in a single vertical axis dimension-measuring column. The mode witch command is entered by pressing the probe tip against the piece to be measured during a time interval greater than a predetermined value. The measuring and displaying system then engages in a search mode of the turn-back point of said piece to be measured. Application: measurement of inner or outer diameters by means of a single-axis measuring column. The method allows the hole's minimal and maximal points to be determined with a minimum of handling operations.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: October 12, 2004
    Assignee: Tesa SA
    Inventors: Pascal Jordil, Charles-Henri Zufferey
  • Publication number: 20040172215
    Abstract: The number and weight of wires interconnecting a host and/or controller with a precision measurement assembly is reduced using a common or shared bus. The bus may be entirely electrical or may include optical fibers to reduce EMI susceptibillty. A custom bus or a known serial network bus such as CAN or SIRCOS may be used.
    Type: Application
    Filed: November 26, 2003
    Publication date: September 2, 2004
    Inventor: Gary W. Russell
  • Publication number: 20040103548
    Abstract: Method enabling a command to switch the measure mode to be entered in a single vertical axis dimension-measuring column. The mode witch command is entered by pressing the probe tip against the piece to be measured during a time interval greater than a predetermined value. The measuring and displaying system then engages in a search mode of the turn-back point of said piece to be measured.
    Type: Application
    Filed: November 21, 2003
    Publication date: June 3, 2004
    Applicant: Brown & Sharpe TESA SA, a corporation of Switzerland
    Inventors: Pascal Jordil, Charles-Henri Zufferey
  • Patent number: 6704684
    Abstract: The invention relates to a method for detecting measurement data on coordinate measuring and digitalizing machines. When the measuring times of the coordinate measuring machine and the sensor are determined by an electric signal (trigger), the equality thereof can be guaranteed and the influence of signal propagation delays can be excluded. The nth sensor information always corresponds to the nth machine information. Allocation is made easier when each value detected at a measuring time obtains an identifier. In one embodiment, surface points of a free forming surface can be detected during movement of the sensor on the coordinate measuring machine and by means of a measuring sensor. The measuring times are determined by an electric signal that is produced by the sensor and is transmitted to the coordinate measuring machine. The signal triggers distance measuring of the sensor as well as the output of the current machine position.
    Type: Grant
    Filed: April 19, 2002
    Date of Patent: March 9, 2004
    Assignee: Carl-Zeiss-Stiftung
    Inventor: Rolf Beck
  • Patent number: 6601311
    Abstract: A method of calibrating a scanning system comprising a machine and a measuring probe, includes the steps of error mapping the system statically and qualifying the stylus tip so that the system will provide accurate measurements, determining the positions of a number of datum points on the surface of an artefact with the probe stylus in contact with the workpiece and at zero deflection normal to the surface, scanning the surface through the datum points at a nominal stylus deflection and at the maximum speed which provides repeatable position measurements to make a second determination of the positions of the datum points, determining the errors attributable to the scanning process by subtracting the positions obtained in the first and second determinations, and storing the error values for correction of subsequent measurements of similar artefacts.
    Type: Grant
    Filed: July 10, 2002
    Date of Patent: August 5, 2003
    Assignee: Renishaw PLC
    Inventors: David R McMurtry, Alexander T Sutherland, David A Wright
  • Patent number: 6516669
    Abstract: A stylus 20 is mounted directly on detector 32 and the detector 32 is mounted directly on a holder 10. Thus, an vibration-type contact detection sensor 1 is formed in a state in which the holder 10 and the stylus 20 are placed out of contact with each other and the stylus 20 and the detector 32 are placed in contact with each other. Therefore, attenuation of vibration and status change of the stylus 20 by the holder 10 can be circumvented and vibration and status change of the stylus 20 can be propagated directly to the detector 32, so that the detector 32 can detect vibration and status change of the stylus 20 with high sensitivity, and contact with a workpiece can be detected with high sensitivity.
    Type: Grant
    Filed: May 15, 2001
    Date of Patent: February 11, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kazuhiko Hidaka, Masanori Arai
  • Patent number: 6502056
    Abstract: A distribution of sample points, which are obtained by a two or three-dimensional coordinate measuring machine, is examined to classify into zero through third degrees. A geometry element is discriminated on the basis of the distribution of the sample points (zero through third degrees) and the number of the sample points. When the number of the sample points is equal to 2 or more and the distribution of the sample points is of the second degree, the geometry element can be discriminated as a plane or a circle in consideration of the probe moving direction. When the number of the sample points is equal to 6 or more, the geometry element can be discriminated as a cylinder or a circular cone on the basis of calculation of a half vertical angle of a circular cone that is specified from the sample points.
    Type: Grant
    Filed: March 1, 2001
    Date of Patent: December 31, 2002
    Assignee: Mitutoyo Corporation
    Inventors: Naoya Kikuchi, Hirokazu Michiwaki