Abstract: A method of locating a feature of an object in which the method includes bringing a stylus of a contact probe mounted on a positioning apparatus into contact with the object to obtain at least first and second measurements of the object. Each which the measurements gives rise to a range of possible points of contact between the object and a part of the stylus along its length and therefore inherently containing uncertainty in the location of the object along said length. The at least first and second measurements are used to reduce the extent of said uncertainty which includes using stylus orientation related information associated with the at least first and second measurements.

Abstract: An eyeglass lens measuring apparatus includes a measuring optical system configured to measure optical properties of an eyeglass lens for the right eye and optical properties of an eyeglass lens for the left eye; and a point marking mechanism including a first point marking member configured to provide a first mark point defining an optical center and an astigmatic axis of the eyeglass lens which are acquired by using the measuring optical system, and a second point marking member configured to provide a second mark point defining an upper portion and a lower portion of the eyeglass lens, wherein the point marking mechanism is configured to provide the eyeglass lens for the right eye and the eyeglass lens for the left eye respectively with the second mark points almost the same in position.

Abstract: A metrology system includes a laser, a position sensitive detector array, a first collimator, a second collimator, and a mirror. The position sensitive detector array and the first collimator are positioned at a reference point. The second collimator and the mirror are positioned at a point target at a distance from the reference point. A laser beam is alternately provided to the first collimator and the second collimator by optical fiber. The position sensitive detector array measures position data from a first laser crosshair generated by the first collimator and from a second laser crosshair generated by the second collimator. By alternating the activation of the first collimator and the second collimator it is possible to measure 5 degrees-of-freedom for the point target. A metrology system processing unit provides analog data processing. The metrology system that is suitable for, but not limited to, facilitating active compensation of large spacecraft structures.

Abstract: A template for evaluating a part, comprising: a surface having a shape corresponding to the part; and at least one element on the surface corresponding to a desired location of a feature on the part. A method of evaluating a part, comprising the steps of: providing a template having a shape corresponding to the part and at least one element thereon corresponding to a desired location on the part; associating the template with the part; and using the element to determine whether the feature is at the desired location.

Abstract: An optoelectronic apparatus for the dimension and/or shape checking of pieces, more specifically pieces with complex tridimensional shape, as the supports for magnetic read/write heads (33, 47, 63) for hard disk storage units, comprises a base (1) with two guide elements (7, 9) to which there is coupled a slide (11), movable in a longitudinal direction along the guide elements (7, 9), and a system (31) for locking and referring the piece (33, 47, 63) to be checked. The slide (11) supports a rotary table (13), to which there is fixed a support (15) for an optoelectronic measuring system. Rotational displacements of the rotary table (13) about an axis parallel to the guide elements (7, 9) make the optoelectronic measuring system oscillate substantially in a plane perpendicular to said axis for optimizing the reciprocal arrangement between the components (75, 77) of the optoelectronic measuring system and the piece (33, 47, 63) in the course of the checking.

Abstract: A method of preparing a surface on a die coater to improve the uniformity of the coating layer on the substrate. A surface of the die block is machined. The die block is then positioned on a measuring surface in a free state so that the machined surface being measured is substantially vertical. The vertical orientation of the die block substantially removes the effect of gravity on any residual stress during measuring. The steps of machining, positioning, and measuring the die block are repeated until the desired total indicated run-out is achieved. The positioning step may also include interposing at least two point supports between the die block and the measuring surface. In another embodiment, the die blocks are positioned in a reference state or a production state for measuring.

Abstract: The present invention provides a method of alignment between sheet materials, a method of alignment, a substrate assembling method, and an aligning apparatus, which are capable of easily and surely performing highly accurate alignment and suppressing a reduction in material yield.

Abstract: A margin inspector for IC wafers includes an upper plate and a supporting portion. The upper plate, which is formed as a transparent plate, has a plurality of concentric circular segments thereon for establishing a set of reference lines to examine the periphery ring of the wafer located under the upper plate while in examining operation. The supporting portion connected with the upper plate is used to form a working space, between the supporting portion and the upper plate, for accommodating the wafer to be examined. By applying these inspecting lines, any deviation on the washout periphery ring of the wafer can be easily and correctly located by eyesight.

Abstract: A technique for measuring distortion in a structure of interest, such as a spacecraft antenna reflector (18), and optionally compensating for the distortion. A first set of targets (22) on the structure (18) is scanned by an attitude transfer system (24) to measure the angular location and range of each target relative to a reference point on another structure (12) having a frame of reference. The orientation of the structure of interest is them determined from the measured locations of the targets. A second set of targets (60 or 82) on the structure of interest is scanned by a figure sensing module (26) located at a reference point on the structure itself. From measured angular locations and ranges of the second set of targets, any shape distortion in the structure of interest can be determined, and distortion may be corrected with the use of actuators (98).

Abstract: A three-dimension measuring apparatus having a probe, such as non-contact optical probe, is used to measure the surface of an object, such as an aspherical lens. Initially, the apparatus is used to obtain reference probe measured values of a reference spherical surface having a concave surface and a convex surface. The thus obtained reference probe measure values are compared with data denoting an ideal spherical surface to determine measurement errors corresponding to inclinations of the surface of an object to be measured. Then, the apparatus is used to measure the object to obtain respective probe measured values. The previously determined measurement errors are subtracted from the measured values of corresponding inclinations, thereby compensating for the measurement errors during measurement of the object surface.

Abstract: A measuring device for allowing a user to rapidly determine that an article such as a tortilla is properly sized and shaped. The measuring device consists of a transparent disc that is supported by a handle. The transparent disc includes a minimum size line and a maximum size line such that the user may place the transparent disc over the tortilla and then rapidly verify whether or not the edge of the tortilla falls between the minimum and maximum lines. The device may further include an optimum size line. The central portion of the disc is preferably transparent so that the user can inspect the surface of the tortilla. However, the central portion of the disc may also be opaque so that the user may focus his attention on whether or not the edge of the tortilla lies between the minimum and maximum lines.

Abstract: A tool system for an integrated manufacturing and assembly system includes a plurality of profile boards which are connected together with connector boards. The profile board include a profile edge which define a mold line surface. Each of the profile boards includes a slot for each connector board which is connected to it. Each connector board includes a slot for each profile board which is connected to it. Each slot in both of the profile and the connector boards has opposing edges. One of these opposing edges serves as a locator edge for precisely and accurately positioning the respective profile boards to the connector boards and the respective connector boards to the profile boards. The other edge of the respective slots serves as a non-locator edge. Wedges fitting against the non-locator edges are used to fixedly maintaining the profile boards connected to the connector boards.

Abstract: An apparatus and method is provided for measuring the wear in the cross-sectional profile of a railroad rail. A carriage is adapted for travel along the length of the rail and includes means for moving transversely with respect to its direction of travel in response to wear in the railhead of the rail. Distance sensors fixedly mounted to the carriage sense the changes in distances from the carriage to the rail as the carriage moves in a direction transverse to the direction of travel. The sensors relate the changes in these distances to wear in the top and gauge sides of the railhead.

Abstract: An invention is disclosed for positioning an object wherein three point supports provide three contact points which define a first plane. Three additional point supports provide three additional contact points which are not coplanar with the first plane and which define a second plane. The first and second planes are nonperpendicular. The point supports accurately and repeatably position the object for optical measurement of a dimension of the object. The invention can be used in connection with the quality control testing of weldments which attach blade tips to gas turbine engine blades.

Abstract: A pattern for determining dimensions of projected or printed figures is provided having individual scaling figures therein on a mask or template. Dimensional measurement may be indicated by alignment of opposing edges of scaling figures offset from each other along the corresponding axis of alignment. Reference marks may be provided on the pattern and associated with each possible axis of alignment for indicating an absolute dimension of a concurrently projected or printed figure. To conserve space, the pattern may be "densepacked" with scaling figures such that each scaling figure includes a plurality of opposing edges, each alignable along a different axis in response to different levels of dimensional distortion.