Having Plural Contact Members Patents (Class 33/552)
  • Patent number: 11047668
    Abstract: The present application discloses a wheel space detecting device, comprising a frame, a first servo motor, a bottom plate, an adapter shaft, a shaft sleeve, a radial bearing, a lower end cap, a pedestal, a pressure bearing, a base, a clamping cylinder, first linear guide rails, first guide rail sliding seats, first sliding seat frames, racks, first sleeves, first bearings, rotating shafts, first end caps, clamping wheels, a guide rail, and so on. The present invention can meet the needs of wheel brake space detection, has the characteristics of simple structure, stable detection performance, high positioning precision, simple operation and the like, and therefore is very suitable for automatic batch production.
    Type: Grant
    Filed: May 9, 2019
    Date of Patent: June 29, 2021
    Assignee: CITIC DICASTAL CO., LTD
    Inventors: Zuo Xu, Guoyuan Xiong, Weidong Liu, Na Zhang, Liangjian Yue, Yingfeng Wang
  • Patent number: 10920620
    Abstract: Mounting apparatuses for turbine airfoils of turbine systems are disclosed. The mounting apparatuses may include a body portion configured to be at least partially positioned between a first airfoil and a second airfoil of the turbine system, and an adjustable, first retention component formed on a first side of the body portion. The adjustable, first retention component may be configured to contact a portion of a suction side of the first airfoil of the turbine system. The mounting apparatuses may also include a second retention component formed on a second side of the body portion, opposite the first side. The second retention component may be configured to contact a portion of a pressure side of the second airfoil of the turbine system.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: February 16, 2021
    Assignee: General Electric Company
    Inventors: Sandra Beverly Kolvick, Daryl Paul Capriotti, Ansley Michelle Heard, Rachel Kate King, Travis Edwin Lipstein, Maithri Muddasani, Tewodros Fiseha Wondimu
  • Patent number: 10893826
    Abstract: A system for displaying and collecting biomechanical measurements is provided. The system comprises: an electronic caliper including a bar, two arms slidably mounted on the bar and extending normal therefrom, a display module, and an electronic system housed in the display module and comprising a light emitting diode string of lights, a nine-axis sensor, firmware, a wireless radio, and a power source connector for electronic communication with a power source; and a remote computing device, the wireless radio in communication with the remote computing device. The electronic caliper and method of use thereof is also provided.
    Type: Grant
    Filed: May 29, 2018
    Date of Patent: January 19, 2021
    Inventors: Aslam Khan, Henri Corniere
  • Patent number: 10830581
    Abstract: A method of determining a smoothness of a surface of an object is provided. The method includes processing an image of the object to obtain opposed first and second boundary lines of a first area of the image where light from a light source is reflected off the surface of the object. The method also includes resizing the image to normalize an average distance between the first and second boundary lines. The method includes processing the resized image to obtain resized first and second boundary lines. The method also includes calculating a variance from linearity for at least one of the resized first and second boundary lines to determine a smoothness value of the surface of the object.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: November 10, 2020
    Assignee: International Business Machines Corporation
    Inventors: Dan Zhang, Jing Wu, Fan Li, Xue Ping Liu, Yun Jing Zhao, Hong Bing Zhang
  • Patent number: 10760889
    Abstract: A masking and coating check inspection tool for inspecting a masking and/or coating edge on a fan blade includes an elongate planar base having distal first and second ends, bottom surface, top face, length, width, and thickness. The length is greater than the width. A pillar perpendicular to the elongate planar base and projecting upward from the top face between the first and second ends has a first end datum, and a first masking check tolerance band disposed on the first end, configured to provide a pass/fail indication of the first masking edge with respect to the first end datum. The pillar can have second end datum and second masking check tolerance band on the second end configured to provide a pass/fail indication of a second masking edge with respect to the second end datum. The inspection tool can be used on root and platform masking/coating edges.
    Type: Grant
    Filed: September 12, 2018
    Date of Patent: September 1, 2020
    Assignee: United Technologies Corporation
    Inventor: James R. Sweeney
  • Patent number: 10578417
    Abstract: A method of measuring the perimetric width of a hollow component. The hollow component comprises a first panel and a second panel, with the first and second panels being bonded to one another around their respective perimeters, and a perimetric width being defined as the width of the bonded portion joining the first panel to the second panel.
    Type: Grant
    Filed: January 9, 2018
    Date of Patent: March 3, 2020
    Assignee: ROLLS-ROYCE plc
    Inventors: Wu Xin Charles Ng, Wei Hock Teh, Shao Chun Ye, Kevin Hau-Kong Chan
  • Patent number: 10352679
    Abstract: A compact portable coordinate measuring machine (CMM) with a large working volume for measuring workpieces is provided. The CMM includes a vertical support, a workpiece stage and a movement configuration that provides relative motion between a measurement probe and a workpiece. The movement configuration includes a vertical translation mechanism with a vertical translation element that couples to a vertical guide and moves over a vertical translation range. The workpiece stage is located above a top end of the vertical support and at least a majority of the vertical guide and the vertical translation range is located below a top end of the workpiece stage. In various implementations, the movement configuration may also include a rotary motion configuration and a horizontal translation mechanism. A controller controls the movement configuration to provide relative motion between the measurement probe and a workpiece that is located in the working volume on the workpiece stage.
    Type: Grant
    Filed: March 31, 2017
    Date of Patent: July 16, 2019
    Assignee: Mitutoyo Corporation
    Inventor: Joseph Daniel Tobiason
  • Patent number: 10296132
    Abstract: A method and a device for testing a rotation performance of a touch display screen are provided. The method comprises: determining at least two test positions in a display region of the touch display screen, the at least two test positions including at least one test position located in a central region of the display region and at least one test position located in an edge region of the display region; and testing a rotation performance corresponding to each test position of the at least two test positions.
    Type: Grant
    Filed: August 17, 2016
    Date of Patent: May 21, 2019
    Assignee: BOE Technology Group Co., Ltd.
    Inventors: Zhiying Zhang, Hangman Lai, Zhigang Zhang
  • Patent number: 9587926
    Abstract: A device and method for measuring the spacing between adjacent airfoils. A notched member engages a trailing edge of one of the adjacent airfoils with the notched member being rotatable about the one airfoil trailing edge. A wheel is rollable across the surface of the other airfoils while moving in a first direction toward and away from the notched member, and biased away from the notched member. A gauge secured to the notched member measures the distance of the guide from the notched member in the first direction.
    Type: Grant
    Filed: February 20, 2015
    Date of Patent: March 7, 2017
    Assignee: Turbine Services Ltd.
    Inventor: Justin D. Hyslop
  • Patent number: 9568405
    Abstract: The present invention includes the following steps: setting the thickness of an interposer to an initial value; determining the axial force of the interposer and the radius of curvature of the warpage caused by the difference in the thermal expansion coefficients of the supporting substrate, the joined layer and the interposer at the set thickness; determining the absolute value of the stress on the chip-connecting surface of the interposer from the stress due to the axial force of the interposer and the stress due to the warpage using the determined axial force and the radius of curvature; determining whether or not the absolute value of the stress is within a tolerance; changing the thickness of the interposer by a predetermined value; and confirming the set thickness as the thickness of the interposer when the determined absolute value of the stress is within the tolerance.
    Type: Grant
    Filed: November 26, 2014
    Date of Patent: February 14, 2017
    Assignee: International Business Machines Corporation
    Inventors: Sayuri Hada, Akihiro Horibe, Keiji Matsumoto
  • Patent number: 9080851
    Abstract: A size inspection device includes a detecting platform, a positioning assembly, four first detecting assemblies, four second detecting assemblies, a third detecting assembly, and a controller. The detecting platform includes a mounting plate. The positioning assembly is detachably mounted on the mounting plate for holding the workpiece on the detecting platform. The controller is electronically connected to the first detecting assemblies, the second detecting assemblies, and the third detecting assembly. The four first detecting assemblies and the four second detecting assemblies are slidably mounted on the mounting plate and are capable of obtaining a first moving distance and a second moving distance respectively. The third detecting assembly is mounted on the mounting plate and is capable of obtaining a third moving distance. The controller obtains the moving distances and determines whether or not the workpiece is of passing or failing quality.
    Type: Grant
    Filed: July 22, 2013
    Date of Patent: July 14, 2015
    Assignees: FU DING ELECTRONICAL TECHNOLOGY (JIASHAN) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Jian-Hua Xu, Jian-Qiang Lu
  • Patent number: 8991064
    Abstract: Provided is a measuring head (1) for a feeler (2) of workpieces (3) being machined, including a fixed portion (10) to be secured to an outer fixed support, a movable portion (11) including a constraint element (14) for a feeler arm (4), a rotational hinge (12) adapted to connect the fixed portion (10) to the movable portion (11), wherein the fixed portion (10), movable portion (11) and pivot bearing (12) are of one piece construction.
    Type: Grant
    Filed: March 22, 2013
    Date of Patent: March 31, 2015
    Assignee: Balance Systems S.R.L.
    Inventor: Gianni Trionfetti
  • Patent number: 8621761
    Abstract: A component inspection system comprises a sensor apparatus and a template having a component side and an opposing inspection side. The inspection side includes a plurality of inspection bosses projecting therefrom, each of the plurality of inspection bosses having a first coupling and a sensor aperture. Each aperture is disposed axially through each respective boss to the component side of the template. The sensor apparatus includes a receptacle for retaining a sensor. The receptacle has a second coupling configured to individually engage with each of the plurality of first couplings for removably securing the sensor apparatus to a respective at least one of the plurality of inspection bosses.
    Type: Grant
    Filed: December 30, 2011
    Date of Patent: January 7, 2014
    Assignee: United Technologies Corporation
    Inventors: Jesse R. Boyer, Robert E. Erickson, Christopher F. O'Neill, James Romanelli
  • Patent number: 8359761
    Abstract: A method for improving an accuracy of measurement of the thickness of a green sheet, and additionally improving yield of a green sheet used for formation of a laminated body is provided. The thickness of each of a plurality of ceramic green sheets is measured, and an average and a variation of obtained thickness measurement values are checked against predetermined ranking criteria. Thereby, a ranking is performed in which the plurality of ceramic green sheets are classified into a plurality of ranks set in the ranking criteria. When forming the laminated body, only a ceramic green sheet belonging to at least one of the ranks which is in advance allowed to be used is used as a ceramic green sheet constituting each layer of the laminated body.
    Type: Grant
    Filed: October 19, 2010
    Date of Patent: January 29, 2013
    Assignees: NGK Insulators, Ltd., NGK Ceramic Device Co., Ltd.
    Inventors: Hiroyuki Shindo, Toyohiko Asai
  • Patent number: 8294758
    Abstract: Disclosed herein is a downhole fish-imaging system. The fish-imaging system includes, a fish-imaging device positionable downhole near the fish, and a processor. The fish-imaging device has at least one shape changeable portion with a plurality of sensors therein for monitoring the shape of the at least one shape changeable portion, a shape of the at least one shape changeable portion is influenced by a shape of the fish. The processor is in operable communication with the fish-imaging device and is coupled to a wired pipe for transmitting data therealong from the sensors.
    Type: Grant
    Filed: February 5, 2008
    Date of Patent: October 23, 2012
    Assignee: Baker Hughes Incorporated
    Inventor: Gerald D. Lynde
  • Patent number: 8272139
    Abstract: A curvature examining jig for examining the curvature of a circuit board quickly and accurately includes a platform and a carrier. An examining region is defined on the platform so as for the circuit board to be disposed flatly within the examining region. A recess is disposed in the examining region and configured to receive a protrusion of the circuit board. The carrier is slidably coupled to the platform, configured to move along the margin of the circuit board, and provided with a plurality of plug gauges facing the platform closely and configured to move to the examining region along with the carrier. Accordingly, the curvature examining jig is convenient in holding a circuit board having a protrusion, quick and accurate in examining the curvature of the circuit board, and effective in enhancing the efficiency of production lines.
    Type: Grant
    Filed: December 1, 2010
    Date of Patent: September 25, 2012
    Assignee: Askey Computer Corp.
    Inventors: Jia-Chun Zhang, Ching-Feng Hsieh
  • Patent number: 8245411
    Abstract: An exemplary surface geometry characters measuring gauge includes a chassis, a spindle, a locating assembly, and a micrometer. The spindle is rotatably mounted on a surface of the chassis. The locating assembly is mounted on the spindle and structured and arranged for fastening a workpiece on the spindle. The micrometer is attached on the chassis corresponding to and spaced from the spindle. The micrometer is configured for contacting a surface of the workpiece and measuring one or more surface geometry characters of the workpiece.
    Type: Grant
    Filed: December 28, 2009
    Date of Patent: August 21, 2012
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Zih-Wei Wang
  • Publication number: 20120096727
    Abstract: A curvature examining jig for examining the curvature of a circuit board quickly and accurately includes a platform and a carrier. An examining region is defined on the platform so as for the circuit board to be disposed flatly within the examining region. A recess is disposed in the examining region and configured to receive a protrusion of the circuit board. The carrier is slidably coupled to the platform, configured to move along the margin of the circuit board, and provided with a plurality of plug gauges facing the platform closely and configured to move to the examining region along with the carrier. Accordingly, the curvature examining jig is convenient in holding a circuit board having a protrusion, quick and accurate in examining the curvature of the circuit board, and effective in enhancing the efficiency of production lines.
    Type: Application
    Filed: December 1, 2010
    Publication date: April 26, 2012
    Applicant: ASKEY COMPUTER CORP.
    Inventors: JIA-CHUN ZHANG, CHING-FENG HSIEH
  • Patent number: 8109007
    Abstract: A method for sensing an object profile shape involves relatively sweeping (whisking or translating) in angular or translational increments an elongated whisker element having a deflectable cantilever region and an object so that the cantilever region bends as a result of sliding along an object periphery. The moment (torque) at a base region of the whisker element as a result of the bending is determined. The method then iteratively determines successive contact point locations on the object periphery based on small successive increments in angle or position of the whisker element and the sensed moment (torque).
    Type: Grant
    Filed: June 1, 2009
    Date of Patent: February 7, 2012
    Assignee: Northwestern University
    Inventors: Joseph H. Solomon, Mitra J. Hartmann, Christopher L. Schroeder
  • Patent number: 7922963
    Abstract: A method for inspecting a honeycomb structured body of the present invention is a method for inspecting a honeycomb structured body comprising a pillar-shaped honeycomb fired body having a multitude of cells placed in parallel with one another in the longitudinal direction with a cell wall therebetween, the method comprising: measuring the shape of the honeycomb structured body in the longitudinal direction through preparing a contact measurement apparatus including a reference surface, a rail disposed perpendicularly to the reference surface, and a measurement probe including a contacting probe configured to move along the rail; contacting one end face of the honeycomb structured body with the reference surface; and moving the measurement probe in a direction nearing the reference surface to contact the contacting probe with the other end face of the honeycomb structured body.
    Type: Grant
    Filed: January 10, 2007
    Date of Patent: April 12, 2011
    Assignee: Ibiden Co., Ltd
    Inventors: Toru Idei, Norio Suzuki
  • Patent number: 7774951
    Abstract: A sensing device includes an elongated whisker element having a flexible cantilever region and a base region where a change in moment or curvature is generated by bending of the cantilever region when it contacts an object. One or more sensor elements cooperatively associated with the whisker element provide one or more output signals that is/are representative of two orthogonal components of change in moment or curvature at the whisker base region to permit determination of object distance, fluid velocity profile, or object contour (shape) with accounting for lateral slip of the whisker element and frictional characteristics of the object. Multiple sensing devices can be arranged in arrays in a manner to sense object contour without or with adjustment for lateral slip.
    Type: Grant
    Filed: October 3, 2007
    Date of Patent: August 17, 2010
    Assignee: Northwestern University
    Inventors: Mitra J. Hartmann, Joseph H. Solomon
  • Patent number: 7490413
    Abstract: An exemplary contour measuring device (100) includes a pair of guide rails (13), a movable fixture (14), a first probe (15), a second probe (16), and an error correcting unit (17). The movable fixture is movably disposed on the guide rails. The first probe is configured for measuring an object along a contour measuring direction and obtaining a first measured contour value from the object to be measured. The second probe is configured for measuring a standard object whose contour is known along the contour measuring direction and obtaining a second measured contour value from the standard object. The error correcting unit is configured for compensating the first measured contour value according to the second measured contour value.
    Type: Grant
    Filed: August 23, 2007
    Date of Patent: February 17, 2009
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd., Fine Tech Corporation
    Inventors: Qing Liu, Jun-Qi Li, Takeo Nakagawa
  • Patent number: 7412778
    Abstract: A checking apparatus, for example a plug gauge, for checking diameters and/or geometrical features of mechanical parts includes a support structure (1) and checking means (20,21) coupled to the support structure, with mutually movable feelers (36) for contacting the surface of the part and transducer means for providing electrical signals. The support structure includes at least two studs (11,12) that achieve a guide along a longitudinal axis, and the checking means are coupled to the studs in a removable and adjustable way along such longitudinal axis. Several checking means can be coupled to the studs. A particular embodiment foresees three flanked studs and checking means coupled to pairs of adjacent studs. An adapting system allows the feelers to self-center on the part to be checked, for example the surface of a hole.
    Type: Grant
    Filed: September 29, 2005
    Date of Patent: August 19, 2008
    Assignee: Marposs Societa' Per Azioni
    Inventor: Guido Golinelli
  • Patent number: 7370407
    Abstract: A disc centering device includes a base plate, a chuck which is installed on the base plate, a hub unit which is detachably engaged to the chuck and receives discs to be stacked, disc pushers which are slidably provided outside the hub unit and include corresponding pressure members which center the discs by pushing circumferences of the discs, and a driving unit which slides the disc pushers simultaneously. Accordingly, as the accuracy of centering the discs is improved, discs with data recorded thereon having a uniform quality can be obtained. Additionally, vibration of a rotation body can be minimized due to the simple configuration the disc centering device. Therefore, in view of the simplified maintenance and repair of the disc centering device, the productivity and manufacturability of HDDs can be improved.
    Type: Grant
    Filed: October 2, 2003
    Date of Patent: May 13, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ki-keon Yeom, Sang-jin Choi, Sang-chul Ko, Soo-hyung Kim, Tae-hoe Ha
  • Patent number: 7343690
    Abstract: A shape-measuring device 1 measures the shape of a object to be measured 1 in which segments are arranged and bonded in rows while relatively moving the object 1 in one direction. The shape-measuring device includes rollers 31 provided corresponding to the rows of segments and displaced to follow unevenness of an end face 1a of the object while being rotated on the end face 1a due to the relative movement, detection means 35 provided corresponding to each roller 31 and detecting the amount of displacement of each roller 31, and calculation means 37 for calculating shape data of the object 1 based on the amount of displacement of the roller 31 detected by the detection means 35. The shape-measuring device 1 can accurately and promptly measure the shape of the object such as a DPF in which segments are bonded in rows.
    Type: Grant
    Filed: November 16, 2004
    Date of Patent: March 18, 2008
    Assignee: NGK Insulators, Ltd.
    Inventors: Yoshihiro Sato, Tadayoshi Yasui, Akihiro Mizutani
  • Patent number: 7335280
    Abstract: A method in the measurement of the flatness of the flow surface of a headbox of a paper machine is disclosed. The flatness is determined by placing a measuring tool on the flat surface formed by the flow surface and measuring the position of the measuring tool at each point. A measuring sensor is arranged in the measuring tool, in order to determine the distance between the measuring tool and the flat surface. In addition, the dimensions provided by the measuring sensors are read and the position of the measuring tool and the dimensions from the measuring sensors are combined, in order to determine the values of the measured points. The invention also relates to equipment in the measurement of the flatness of the flow surface of the headbox of a paper machine.
    Type: Grant
    Filed: August 23, 2004
    Date of Patent: February 26, 2008
    Assignee: Metso Paper, Inc.
    Inventors: Petri Lampi, Jukka Sallinen
  • Patent number: 7328517
    Abstract: An apparatus comprises one or more pairs of mutually coaxial and opposing linear measuring devices including movable, biased fingers for simultaneously determining the thickness and warpage of a substrate such as a circuit board passing between the movable fingers. Each measuring device is calibrated to a zero point by bringing the ends of the movable fingers together and recording the distance or position thereof. Data for computation of substrate thickness and warpage measurements is obtained by recording displacement distances or positions of the movable fingers in contact with opposing surfaces of the substrate with respect to the zero point, the thickness and warpage then being calculated. The apparatus may be integrated with an assembly line, including incorporation with an existing piece of equipment, so that substrates exhibiting out-of-specification thickness or excessive warpage may be reworked, discarded or downgraded during the manufacturing process.
    Type: Grant
    Filed: September 29, 2006
    Date of Patent: February 12, 2008
    Assignee: Micron Technology, Inc.
    Inventor: Rodney L. Kirstine
  • Patent number: 7267018
    Abstract: A steering lock system includes at least an ignition switch and a locking mechanism capable of inhibiting the turning of a steering shaft. In a state in which the steering lock system is retained by a retaining means on a support table, a movable table is moved toward the support table, a turnable shaft which includes a key chuck means retaining a key at its tip end is rotatably driven by a driving means, thereby rotatably driving a rotor of the steering lock system. By examining the change in the switching mode of the ignition switch in accordance with the turning of the rotor by a switch signal checking means and examining the operational state of the locking mechanism by a locking operation examining means, the inspection can be conducted continuously and automatically on the operation of at least the ignition switch and the locking mechanism of the steering lock system.
    Type: Grant
    Filed: July 6, 2005
    Date of Patent: September 11, 2007
    Assignee: Kabushiki Kaisha Honda Lock
    Inventor: Mitsuhiro Kai
  • Patent number: 7228640
    Abstract: A feeler device (1) of workpieces being machined, in particular for measurement instruments (2) of workpieces being machined on machine tools, of the type comprising a head (7) including control and measurement members, and a pivoting arm (6) extending in an operating position between the head (7) and a workpiece (3) being machined, the pivoting arm (6) comprising a pivot (10), a base portion (11) extending between the head (7) and the pivot (10), and an end portion (12) extending between the pivot (10) and the workpiece (3) being machined, control means (13) of the pivot (10) being provided, to allow movements between the base portion (11) and the end portion (12) in the event of forcing on the end portion (12).
    Type: Grant
    Filed: August 8, 2005
    Date of Patent: June 12, 2007
    Assignee: Balance Systems S.R.L.
    Inventor: Gianni Trionfetti
  • Patent number: 7225554
    Abstract: The invention relates to apparatus and methods for measuring a human head. The apparatus disclosed herein involve the use of linear rulers, or rotating contacting members, coupled to a support member. The apparatus disclosed herein can be positioned on a human head, using the methods disclosed herein, to determine the outer contour of the head. Such a measurement can aid in the diagnosis and monitoring of various abnormalities of the human head, including plagiocephaly.
    Type: Grant
    Filed: February 28, 2005
    Date of Patent: June 5, 2007
    Assignee: Children's Hospital Boston
    Inventor: Joseph R. Madsen
  • Patent number: 7131211
    Abstract: An apparatus comprises one or more pairs of mutually coaxial and opposing linear measuring devices including movable, biased fingers for simultaneously determining the thickness and warpage of a substrate such as a circuit board passing between the fingers. Each measuring device is calibrated to a zero point by bringing the ends of the movable fingers together and recording the distance or position thereof. Data for computation of substrate thickness and warpage measurements is obtained by recording displacement distances or positions of the movable fingers in contact with opposing surfaces of the substrate with respect to the zero point, the thickness and warpage then being calculated. The apparatus may be integrated with an assembly line, including incorporation with an existing piece of equipment, so that substrates exhibiting out-of-specification thickness or excessive warpage may be reworked, discarded or downgraded during the manufacturing process.
    Type: Grant
    Filed: August 18, 2003
    Date of Patent: November 7, 2006
    Assignee: Micron Technology, Inc.
    Inventor: Rodney L. Kirstine
  • Patent number: 7047657
    Abstract: An apparatus for recording the contour of a surface of a body is provided in accordance with the present invention. The apparatus comprises a carrier on which at least one distance measuring element is disposed. The at least one distance measuring element is capable of determining a distance between the carrier and a location on the surface of the body. A navigation system with marking elements is provided. The marking elements are fixable on the carrier and on the body, such that positional data regarding the position of the body and the carrier can be determined by the navigation system. A data-processing device device is also provided, which is adapted to calculate the contour of the surface from the positional data of the body and of the carrier and the distance measurements of the at least one distance measuring element.
    Type: Grant
    Filed: March 3, 2005
    Date of Patent: May 23, 2006
    Assignee: Aesculap AG & Co. KG
    Inventors: Andreas Goeggelmann, Josef Kozak
  • Patent number: 7020973
    Abstract: The invention is a device used to measure and mark floor tile that must be cut to fit around obstructions. A key feature of the invention is that it has removable elements that make it possible to use the device with tile of any size. A second key feature is a plurality of telescoping members that can be extended to varying lengths in order to describe the perimeter geometry that must be duplicated by cutting away a portion of the tile. The invention is compatible with all tile and similar flat floor or wall coverings, such as pavers or carpet squares.
    Type: Grant
    Filed: August 17, 2004
    Date of Patent: April 4, 2006
    Inventor: David Knight, Jr.
  • Patent number: 7013573
    Abstract: A hole center detecting apparatus for positioning the hole of a spool and a cord accurately by determining the coordinates of two points of intersection between the inner circumference of the spool hole and a virtual straight line to compute the coordinates of the center of the hole and by moving the cord according to the computed coordinates of the hole center. A straightness measuring apparatus for measuring the curvature of a cord automatically by detecting the coordinates of three longitudinal points of the cord. A measurement apparatus for measuring a residual torsion automatically by measuring the rotation angle of the end portion of the cord before and after clamped, electrically.
    Type: Grant
    Filed: April 28, 2003
    Date of Patent: March 21, 2006
    Assignee: Bridgestone Corporation
    Inventors: Takashi Kinoshita, Yoshiki Mizuta, Takahiro Yamada, Shogo Ueda, Eiji Kudo, Yuichi Kimura, Yukio Sangawa
  • Patent number: 7003894
    Abstract: A general method is disclosed for using distance sensors to measure the surface profile and twist of objects, even in the presence of rigid-body motions in the measurement directions between the surface and the sensors. The method involves making multiple sequential measurements from a group of sensors while the object moves longitudinally relative to the sensors. The surface height features of the measured object appear in delayed sequence as the observed surface moves longitudinally relative to the sensor array. However, any rigid-body motions in the measurement directions appear simultaneously at all sensors. Mathematical procedures are used to separate the delayed and simultaneous components of the measurements, from which the surface height profile is determined. The invention can handle many different measurement types, including simultaneous measurement of the surfaces of two-sided objects, measurement of surface twist and two-dimensional surface scanning.
    Type: Grant
    Filed: March 18, 2004
    Date of Patent: February 28, 2006
    Assignee: Forintek Canada Corp.
    Inventors: Gary Stephen Schajer, Javier Ignacio Gazzarri
  • Patent number: 6996913
    Abstract: An apparatus and method are provided for circumferentially measuring cross-sectional characteristics of a tubular member. The apparatus includes first and second template members that cooperably define an aperture for receiving the tubular member. At least one of the template members is adjustable so that the aperture can be adjusted between open and closed positions. A measurement device can be configured to detect the relative position of the first and second template members, thereby measuring the relative adjustment of the members between the open and closed positions. This measurement is indicative of the cross-sectional size of the tubular member, e.g., for determining the diameter of the tubular member. Alternatively, multiple measurement devices can respond to a contact force between the measurement devices and the tubular member, e.g., to determine a variation in wall thickness of the tubular member.
    Type: Grant
    Filed: January 29, 2004
    Date of Patent: February 14, 2006
    Assignee: The Boeing Company
    Inventors: Matthew K. S. Lum, Albert E. Seifert, Mark L. Younie
  • Patent number: 6907672
    Abstract: A system and method for measuring a three-dimensional object uses a number of elongate measuring members that can be displaced with respect to a base in response to a surface of the object. The displaced distances of the elongate measuring members due to the surface of the object are then determined. The displaced distances are measurements of the object surface.
    Type: Grant
    Filed: October 11, 2003
    Date of Patent: June 21, 2005
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventor: Amir Said
  • Patent number: 6742273
    Abstract: A workpiece measuring apparatus for measuring at least one of a size and a shape of a workpiece, machined by a turning or a grinding process system, includes a machine base, a column mounted on the machine base and having a mounting mechanism on at least one of the sides thereof, a measuring gauge unit removably mounted at an arbitrary position on the mounting mechanism of the column, and a conveying unit for conveying the machined workpiece to the measurement position where measurement can be performed by the measuring gauge unit. Thus, in the workpiece measuring apparatus according to the present invention, a measuring gauge unit can be fixedly added or removed in response to the change in the shape of the workpiece or the number of the desired measurement points.
    Type: Grant
    Filed: August 30, 2002
    Date of Patent: June 1, 2004
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventors: Shinji Nagatsuka, Mamoru Kamiya, Yoichi Kawasaki
  • Patent number: 6701633
    Abstract: There is provided a shape measuring apparatus which defines an XYZ-axis coordinate and measures a surface shape of an object, the apparatus including a plurality of probes arranged in a Y-axis direction, the probes contacting a surface of the object, and moving in a Z-axis direction according to the surface shape of the object, a probe holder for holding each of the plurality of probes movable in the Z-axis direction, a moving mechanism for moving the probe holding mechanism in an X-axis direction relative to the object, first and second measuring instruments for measuring positions of each probe in the X-axis and Y-axis directions, a third measuring instrument for measuring a position of each probe in the Z-axis direction; and a computing unit for calculating the surface shape of the object based on measuring results from the first, second, and third measuring instruments.
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: March 9, 2004
    Assignee: Canon Kabushiki Kaisha
    Inventor: Masaru Ohtsuka
  • Patent number: 6648708
    Abstract: An apparatus (20) for measuring alignment and tilt of a CRT neck (14) attached to a recycled CRT funnel portion (11) includes a support structure (21) that engages and supports a seal edge (24) of the CRT funnel portion (11), and a plurality of stopper pads (28-30) which engage respective alignment stoppers (34-36) molded on the CRT funnel portion (11). Distance measuring gauges (45-48) contact lower and upper points on two sides of the CRT neck (14). The alignment of the CRT neck (14) is determined by readings from the lower gauges (45, 47) on the first and second sides of the CRT neck (14). The tilt of the CRT neck (14) is measured by comparing the readings from the lower and upper gauges (45-48) on each of the first and second sides of the CRT neck. The stopper pads (28-30) on the support structure (21) can be changed to accommodate different sizes of CRT funnel portions (11, 11′).
    Type: Grant
    Filed: June 13, 2001
    Date of Patent: November 18, 2003
    Assignees: Sony Corporation, Sony Electronics Inc.
    Inventor: Christopher Monks
  • Patent number: 6640459
    Abstract: A multidimensional surface mechanics measurement system applies forces to a surface while minimizing coupling between the forces so applied. The system includes first, second, and third elongate members, a coupler for coupling the elongate members together, and a probe connected to the coupler having a contact point for contacting the surface. The first elongate member extends in a first axial direction that is substantially normal to the surface, the second elongate member extends in a second axial direction that is substantially orthogonal to the first axial direction, and the third elongate member extends in a third axial direction that is substantially orthogonal to the first and second axial directions. Desired relationships between the free length and diameter, and between the axial stiffness and transverse stiffness, and the orthogonal relative positioning of the elongate members, minimizes cross-talk between the measurement axes while maintaining the necessary structural rigidity.
    Type: Grant
    Filed: February 15, 2001
    Date of Patent: November 4, 2003
    Assignee: Fast Forward Devices, LLC
    Inventors: Barry N. Lucas, John C. Hay, Jr.
  • Patent number: 6637123
    Abstract: A contact gauge for measuring a contoured surface on work piece is presented having a matching contoured profile and multiple sensors inserted in a gauge body. The gauge body uses bores filled with spherical balls. At least one ball from each bore contacts the contoured surface, which causes displacement of the ball. The displacement is transferred to and recorded by the sensor. The layout of the gauge permits multiple sensors to be mounted in a compact gauge housing and the gauge housing, in turn, may connected to a robotic arm for rapid and repeated use as an automated measurement apparatus for a component assembly line.
    Type: Grant
    Filed: October 23, 2001
    Date of Patent: October 28, 2003
    Assignee: ABB Inc.
    Inventors: Robert J. Rucha, Daniel W. McGillis, Peter J. Deir
  • Patent number: 6634114
    Abstract: An adjustable gage comprises a centerline hub and a swing gage. The hub includes a body with position jaws adjustably attached thereto, and a central post. The gage comprises a pair of parallel slide bars and front and rear blocks slidable along the slide bars. A movable, spring-biased probe is slidably connected to the front block via a rail and carriage bearing apparatus. The probe is operably connected to a probe-movement indicator. The rear block has a fixed probe. Both probes have end roller bearings. In use, the part to be measured is placed within the position jaws, previously adjusted to the approximate inner or outer diameter of the part. Then, the gage is placed over the post, with the roller bearings coming into contact with the part, and the gage is rotated. The probes track along the part, with any variances in part diameter showing up on the indicator.
    Type: Grant
    Filed: April 12, 2001
    Date of Patent: October 21, 2003
    Assignee: Bidwell Corporation
    Inventor: Steven T. Bidwell
  • Patent number: 6634915
    Abstract: An apparatus for rotating a CRT panel (12) to facilitate inspecting a seal edge (13) thereof includes a support structure (30) rotatably connected to a base frame (21) for rotation about a horizontal axis (31). The CRT panel (12) is placed into the support structure (30) with the seal edge (13) positioned in a holding groove (77) formed on a bottom door assembly (40). A top door assembly (58) is slidable to a closed position to enclose and support the CRT panel (12) while the support structure (30) is rotated 180 degrees. The bottom door assembly (40) is movable to an open position to inspect the seal edge (13). The door assemblies (40, 58) are both arranged to engage the base frame (21) and prevent rotation of the support structure (30) relative to the base frame (21) when the door assemblies are moved to their respective open positions.
    Type: Grant
    Filed: June 7, 2001
    Date of Patent: October 21, 2003
    Assignees: Sony Corporation, Sony Electronics, Inc.
    Inventor: Christopher Monks
  • Publication number: 20030074802
    Abstract: A contact gauge for measuring a contoured surface on work piece is presented having a matching contoured profile and multiple sensors inserted in a gauge body. The gauge body uses bores filled with spherical balls. At least one ball from each bore contacts the contoured surface, which causes displacement of the ball. The displacement is transferred to and recorded by the sensor. The layout of the gauge permits multiple sensors to be mounted in a compact gauge housing and the gauge housing, in turn, may connected to a robotic arm for rapid and repeated use as an automated measurement apparatus for a component assembly line.
    Type: Application
    Filed: October 23, 2001
    Publication date: April 24, 2003
    Applicant: ABB Automation Inc.
    Inventors: Robert J. Rucha, Daniel W. McGillis, Peter J. Deir
  • Patent number: 6519862
    Abstract: In accordance with the present invention, a device for acquiring contoured human body surface vibration signals is provided. The device comprises a first component for sensing the displacements of a skin surface as a function of time at multiple points on the human body, with the first component having a plurality of sensing elements, a second component for measuring time average displacements of the skin surface at nominal locations of the sensing elements in the first component; and a third component for correcting for the effect of positional error from a set of nominal displacement sensor locations.
    Type: Grant
    Filed: October 4, 2000
    Date of Patent: February 18, 2003
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Norman L. Owsley, Andrew J. Hull
  • Patent number: 6516528
    Abstract: A system and method are disclosed for determining properties of a feature located at a surface of a substrate. A plurality of probe tips are operable to traverse a surface of the substrate and provide measurement data indicative of topographical features scanned thereby. The measurement data obtained from the plurality of probe tips is aggregated and processed to determine feature properties, such as may include line edge roughness and/or linewidth.
    Type: Grant
    Filed: February 26, 2001
    Date of Patent: February 11, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Bryan K. Choo, Bhanwar Singh
  • Patent number: 6493959
    Abstract: An automated adjustment system that permits an operator to quickly and accurately adjust the various adjustable components in a tape path. The adjustment system comprises an automated adjustment tool connected to a processing system. The automated adjustment tool comprises a plurality of probes connected to a nest fixture. The nest fixture is configured to receive a tape drive and securely position the tape drive for adjustment of the tape path. The plurality of probes are configured to individually engage the adjustable components in the tape path and provide a computer readable output to the processing system that indicates the vertical position of the individual components. The processing system is configured to receive the computer readable output, convert the computer readable output into a measurement and display the measurement on a display for an operator.
    Type: Grant
    Filed: December 7, 2000
    Date of Patent: December 17, 2002
    Assignee: Benchmark Tape Systems Corporation
    Inventor: John F. deLassus
  • Publication number: 20020148130
    Abstract: There is provided a shape measuring apparatus which defines an XYZ-axis coordinate and measures a surface shape of an object, the apparatus including a plurality of probes arranged in a Y-axis direction, the probes contacting a surface of the object, and moving in a Z-axis direction according to the surface shape of the object, a probe holder for holding each of the plurality of probes movable in the Z-axis direction, a moving mechanism for moving the probe holding mechanism in an X-axis direction relative to the object, first and second measuring instruments for measuring positions of each probe in the X-axis and Y-axis directions, a third measuring instrument for measuring a position of each probe in the Z-axis direction; and a computing unit for calculating the surface shape of the object based on measuring results from the first, second, and third measuring instruments.
    Type: Application
    Filed: February 28, 2002
    Publication date: October 17, 2002
    Inventor: Masaru Ohtsuka
  • Patent number: 6427353
    Abstract: A method and apparatus for high speed acquisition of the dimensional parameters of a work piece are effected by simultaneously acquiring probe positional information, converting the probe positional information to standard characteristic data, and calculating multiple dimensional geometries using the converted probe position information. Selected characteristic data may be stored for use with multiple dimensional geometry calculations, reducing the calculation time. A computer and associated software are used to convert the positional information to dimensional geometry information.
    Type: Grant
    Filed: May 28, 1998
    Date of Patent: August 6, 2002
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Cecil H. Nelson, Rodney R. Hintz, Thomas P. Bartsch