Having Indicator Of Probe Position Or Movement Patents (Class 33/555)
  • Patent number: 11692801
    Abstract: A modular gage system includes a base plate having an array of holes and a coordinate system to identify each hole. The modular gage system further includes a plurality of risers and at least one form block. Each riser is assigned to a particular hole and the at least one form block is configured to be positioned atop one or more of the risers. Moreover, each form block is assigned to be located over a particular hole.
    Type: Grant
    Filed: September 16, 2021
    Date of Patent: July 4, 2023
    Inventor: Jacob Ethan Verduin
  • Patent number: 11454486
    Abstract: A measurement device can include a plurality of wheel support modules. Each of the wheel support modules can be configured to attach to a different type of vehicle wheel and to provide for rotation of the vehicle wheel about an axis. An arm can be removably attached to the first wheel support module. A measurement element that measures deformation of the vehicle wheel can be moveably attached to the arm. The different configuration of each of the wheel support modules allows for various types of vehicle wheels to be measured for deformation using the same measurement device.
    Type: Grant
    Filed: August 28, 2019
    Date of Patent: September 27, 2022
    Assignee: HONDA MOTOR CO., LTD.
    Inventor: Claude Lawrence
  • Patent number: 10837121
    Abstract: Embodiments described herein generally relate to a susceptor support for supporting a susceptor in a deposition process. The susceptor support includes a shaft, a plate with a first major surface coupled to the shaft, and a support element extending from a second major surface of the plate. The plate may be made of a material that is optically transparent to the radiation energy from a plurality of energy sources disposed below the plate. The plate may have a thickness that is small enough to minimize radiation transmission loss and large enough to be thermally and mechanically stable to support the susceptor during processing. The thickness of the plate may range from about 2 mm to about 20 mm.
    Type: Grant
    Filed: March 27, 2017
    Date of Patent: November 17, 2020
    Assignee: Applied Materials, Inc.
    Inventors: Richard O. Collins, Errol Antonio C. Sanchez, David K. Carlson, Mehmet Tugrul Samir
  • Patent number: 9752873
    Abstract: A tool for measuring geometrical parameters of a vane or a blade of a turbomachine, particularly for measuring a distance between the tip of the vane or blade and a reference plane is provided. The tool includes a first guiding plate and a second guiding plate. The first guiding plate and the second guiding plate are spaced apart from each other in a defined position by means of at least two spacers. Each of the first guiding plate and the second guiding plate is equipped with a first through hole and one or more second through holes. The first through hole is designed to insert through an airfoil of said vane or blade. Each of the second through holes is designed to receive a length measuring tool, e.g. a depth gauge.
    Type: Grant
    Filed: August 27, 2015
    Date of Patent: September 5, 2017
    Assignee: ANSALDO ENERGIA SWITZERLAND AG
    Inventors: Bernard Feuillard, Ernst Vogt, Fabian Gubelmann, Alexey Voskoboynikov
  • Patent number: 9714881
    Abstract: In order to determine the machining axis of a rotatable workpiece blank, a reference workpiece, which has bearing surfaces concentric to its imbalance reference axis, and subsequently a workpiece blank are received in a measurement device, and as yet unmachined surface regions of the reference workpiece and of the workpiece blank are measured by a sensor device, and the measured position data are stored by a computer as a reference partial surface and a blank partial surface in a data storage device. The computer calculates deviations between the blank partial surface and the reference partial surface and, from these, an imbalance effect which is expressed by the position of the main axis of inertia of a given workpiece. The machining axis is calculated by adding an offset to the position of the main axis of inertia, which offset has been empirically determined with the aid of the actual imbalances of previously produced workpieces measured relative to the machining axis.
    Type: Grant
    Filed: January 27, 2014
    Date of Patent: July 25, 2017
    Assignee: Schenck RoTec GmbH
    Inventor: Martin Rogalla
  • Patent number: 9548580
    Abstract: A terminal crimping system for a crimping machine includes an anvil, a movable ram, an image acquisition device, and a display device. The anvil is located in a crimping zone and configured to receive a terminal thereon. The terminal has a wire crimp barrel configured to receive a wire therein. The ram has crimp tooling configured to crimp the wire crimp barrel of the terminal to the wire during a crimp stroke of the ram. The image acquisition device is configured to be mounted on the crimping machine above the crimping zone. The image acquisition device is positioned to acquire an image of the wire within the wire crimp barrel of the terminal in the crimping zone. The display device is configured to display the image.
    Type: Grant
    Filed: May 23, 2014
    Date of Patent: January 17, 2017
    Assignee: TYCO ELECTRONICS CORPORATION
    Inventors: Michael Edward Hallman, Mark Elton Unger, III
  • Patent number: 9075080
    Abstract: Methods and apparatuses are described for adaptively tracking a feature of a sample using a scanning probe microscope. The adaptive technique provides an adaptive method for tracking the feature scan-to-scan despite actual or apparent changes in feature shape due, for example, to an evolving/transitioning state of the sample, and/or actual or apparent changing position due, for example, to movement of the sample and/or drift of the piezoelectric tube actuator. In a preferred embodiment, each scan may be processed line-by-line, or subpart-by-subpart, and may be analyzed either in real time or off-line. This processing technique improves speed, processing, reaction, and display times.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: July 7, 2015
    Assignee: Bruker Nano, Inc.
    Inventors: Judith Mosley, Johannes Kindt
  • Patent number: 8584371
    Abstract: A detecting member 35 has three substantially rectangular plate-shaped detecting plates 51a, 51b, and 51c formed integrally therewith which are arranged to face an arc-shaped portion 33a of a following member 33. The detecting plates 51a, 51b, and 51c are, at one end, supported on a main portion 50, and are composed of base-end portions R1, with which, at their reverse side, a prop 60 makes contact, and swing portions R2, which are located on the tip-end side of the base-end portions R1 and with which protrusions 43a and 43b on the arc-shaped portion 33a make contact. The base-end portions R1 have a wider elastically deformable range than the swing portions R2.
    Type: Grant
    Filed: September 15, 2011
    Date of Patent: November 19, 2013
    Assignee: Kyocera Document Solutions, Inc.
    Inventors: Takeshi Marumoto, Kazuhisa Hirahara, Shinichi Kotera
  • Publication number: 20120117814
    Abstract: A detecting member 35 has three substantially rectangular plate-shaped detecting plates 51a, 51b, and 51c formed integrally therewith which are arranged to face an arc-shaped portion 33a of a following member 33. The detecting plates 51a, 51b, and 51c are, at one end, supported on a main portion 50, and are composed of base-end portions R1, with which, at their reverse side, a prop 60 makes contact, and swing portions R2, which are located on the tip-end side of the base-end portions R1 and with which protrusions 43a and 43b on the arc-shaped portion 33a make contact. The base-end portions R1 have a wider elastically deformable range than the swing portions R2.
    Type: Application
    Filed: September 15, 2011
    Publication date: May 17, 2012
    Applicant: KYOCERA MITA CORPORATION
    Inventors: Takeshi MARUMOTO, Kazuhisa Hirahara, Shinichi Kotera
  • Patent number: 7922963
    Abstract: A method for inspecting a honeycomb structured body of the present invention is a method for inspecting a honeycomb structured body comprising a pillar-shaped honeycomb fired body having a multitude of cells placed in parallel with one another in the longitudinal direction with a cell wall therebetween, the method comprising: measuring the shape of the honeycomb structured body in the longitudinal direction through preparing a contact measurement apparatus including a reference surface, a rail disposed perpendicularly to the reference surface, and a measurement probe including a contacting probe configured to move along the rail; contacting one end face of the honeycomb structured body with the reference surface; and moving the measurement probe in a direction nearing the reference surface to contact the contacting probe with the other end face of the honeycomb structured body.
    Type: Grant
    Filed: January 10, 2007
    Date of Patent: April 12, 2011
    Assignee: Ibiden Co., Ltd
    Inventors: Toru Idei, Norio Suzuki
  • Patent number: 7587836
    Abstract: A detecting apparatus for detecting the angle of a bend in an electrically conductive workpiece is provided. The detecting apparatus includes a platform, a holding bracket mounted on the platform, at least one detecting portion slidably mounted to the platform, a processor, and an indicator electrically connected to the processor. The holding bracket is grounded and configured for holding and electrically connecting with the workpiece. The at least one detecting portion includes a short pin and a long pin. During operation, the pins are normally at high potential and go low if they contact the workpiece. The pins are electrically connected to the processor. The processor judges an eligibility of the angle of the workpiece according to the potential pattern of each pins. The indicator outputs a detecting result done by the processor.
    Type: Grant
    Filed: October 10, 2007
    Date of Patent: September 15, 2009
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Bing-Jun Zhang, Lian-Zhong Gong
  • Patent number: 7526872
    Abstract: A gage assembly for measuring a generally cylindrical workpiece. The gage assembly includes a support member and a gage block subassembly located opposite of the support member. The subassembly includes a moveable contact located in spaced relation from the support member so as to define a gaging space therebetween. A measuring device is coupled to the contact and a part handling member, coupled to an actuator, moves the workpiece from a first side of the gaging space to a position where the workpiece is in the gaging space and subsequently to a position where the workpiece is on an opposing side of the gaging space, passing the workpiece between said support member and said gage block subassembly. In its method of operation, the workpiece is dynamically gaged by the gage assembly.
    Type: Grant
    Filed: November 18, 2004
    Date of Patent: May 5, 2009
    Assignee: Control Gaging, Inc.
    Inventor: Karl J. Liskow
  • Publication number: 20090025241
    Abstract: An exemplary measuring device includes a standard element, a first contour measuring probe, and a controller. The standard element has a first standard plane opposite to a measured object. The first contour measuring probe has a tip extension. The controller is electrically connected to the first contour measuring probe. The tip extension contacts the first standard plane during a measuring process. In addition, a method for using the measuring device is also provided.
    Type: Application
    Filed: December 28, 2007
    Publication date: January 29, 2009
    Applicants: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO. LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: QING LIU, JUN-QI LI
  • Publication number: 20080184580
    Abstract: The invention relates to a collar for measuring the lateral deformation of a test piece during uniaxial or triaxial compression tests. According to the invention, the collar includes a metal hoop or a hoop that is made from composite materials, which can clasp the test piece and which is open. The free ends thereof are separated by a distance A. The inventive collar also includes a mechanism for directly or indirectly measuring the distance A. Between the free ends of the hoop, the mechanism includes at least one strain gauge.
    Type: Application
    Filed: May 22, 2006
    Publication date: August 7, 2008
    Applicant: UNIVERSITE DES SCIENCES ET TECHNOLOGIES DE LILLE
    Inventor: Jean Secq
  • Patent number: 7376261
    Abstract: A measuring system includes a coordinate measuring machine for driving a scanning probe and a host computer. The host computer includes a compensation table (53) and a profile analysis unit (54). The compensation table stores, as compensation data, compensation coefficients to correct counter values of a probe counter (415), and compensation radiuses “r” to the workpiece surface concerning central coordinate values of a contact portion, for respective contact directions. The profile analysis unit has a contact direction calculation unit (542), a compensation data selection unit (543), a compensation calculation unit (544). The contact direction calculation unit calculates the contact direction along which the scanning probe comes into contact with a workpiece W, and the compensation data selection unit selects compensation data set up in the compensation table based on thus calculated contact direction.
    Type: Grant
    Filed: November 22, 2004
    Date of Patent: May 20, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Takashi Noda, Katsuyuki Ogura
  • Patent number: 7363181
    Abstract: A surface texture measuring instrument is provided that is capable of performing a correction operation depending on the rotation angle position of a detector even when the detector is rotated for measurement.
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: April 22, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Minoru Katayama, Takafumi Kano
  • Patent number: 7345773
    Abstract: In a flatness measurement apparatus, a sensor unit having a flatness-detection sensor is slidable along the linear guide rail. A support system supports the linear guide rail such that the linear guide rail is rotatable in a horizontal plane, whereby a surface of a wafer stage to be measured is scanned all over with the sensor unit having the flatness-detection sensor so as to ensure a flatness measurement of the whole surface of the wafer stage.
    Type: Grant
    Filed: October 12, 2005
    Date of Patent: March 18, 2008
    Assignee: NEC Electronics Corporation
    Inventor: Katsuhiro Yano
  • Patent number: 7328517
    Abstract: An apparatus comprises one or more pairs of mutually coaxial and opposing linear measuring devices including movable, biased fingers for simultaneously determining the thickness and warpage of a substrate such as a circuit board passing between the movable fingers. Each measuring device is calibrated to a zero point by bringing the ends of the movable fingers together and recording the distance or position thereof. Data for computation of substrate thickness and warpage measurements is obtained by recording displacement distances or positions of the movable fingers in contact with opposing surfaces of the substrate with respect to the zero point, the thickness and warpage then being calculated. The apparatus may be integrated with an assembly line, including incorporation with an existing piece of equipment, so that substrates exhibiting out-of-specification thickness or excessive warpage may be reworked, discarded or downgraded during the manufacturing process.
    Type: Grant
    Filed: September 29, 2006
    Date of Patent: February 12, 2008
    Assignee: Micron Technology, Inc.
    Inventor: Rodney L. Kirstine
  • Patent number: 7304751
    Abstract: An apparatus and method for automatically measuring characteristics of a hard disk drive carriage arm. The method provides a first measuring device for automatically measuring a first side of a carriage arm. A second measuring device for automatically measuring a second side of the carriage arm is also provided. The second measuring device operates in conjunction with the first measuring device to cancel a measurement contact bias. Measurement data from the first measuring device and the measurement data from the second measuring device are provided to a computing device, wherein the measurement data is automatically stored and manipulated by the computing device.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: December 4, 2007
    Assignee: Hitachi Global Storage Technologies Neterlands B.V.
    Inventor: Alan Tegethoff
  • Patent number: 7251901
    Abstract: A measuring device includes a receiver having a cavity with differing narrowing diameters from an opening. The receiver can be moved axially. A part is moved a predetermined fixed distance, including movement while engaging and moving the receiver. The distance moved by the receiver is sensed, and the acceptability of the dimension of the object is determined by evaluating the distance moved by the receiver.
    Type: Grant
    Filed: September 16, 2005
    Date of Patent: August 7, 2007
    Assignee: Illinois Tool Works Inc
    Inventor: Glenn G. Heavens
  • Patent number: 7243439
    Abstract: A touch sensor using a Hall IC is provided. To this end, in a cantilever mechanism 15 of a parallel link by two plate springs 16, a coupling member 18 on the fixed side is fixed to a supporting block 24 which penetrates through the center of a plate spring 16 on a lower side and uprightly provided on a pedestal 22. A movable portion 28 on the free end side is a lightweight coupling member 19 provided by bend-processing an aluminum thin plate, to which a rare-earth magnet 25 is adhered. An elastic part 20a of a Hall IC supporting member 20 is fixed to the coupling member 18 on the fixed side, and a rigid part 20b with a rib 17a is supported by an adjusting rod 36 to fine-adjust relative position of a Hall IC 26 provided on the free end with respect to the magnet 25.
    Type: Grant
    Filed: November 14, 2003
    Date of Patent: July 17, 2007
    Assignee: ASA Electronics Industry Co., Ltd.
    Inventor: Yukihiro Asa
  • Patent number: 7197836
    Abstract: Positions of a plurality of reference points arranged on a reference plate (200) having a larger area than a measurement area of a measuring machine (300) are obtained as coordinate points on a standardized reference coordinate system. First, the plurality of reference points are grouped according to the measurement area of the measuring machine (300). At this time, the reference points are grouped so that one of the groups shares a predetermined number or more of the reference points with the other one of the groups (a grouping step). The reference points are measured for each of the groups (a measuring step).
    Type: Grant
    Filed: August 9, 2005
    Date of Patent: April 3, 2007
    Assignee: Mitutoyo Corporation
    Inventor: Naoya Kikuti
  • Patent number: 7188429
    Abstract: A dimensional gage adapted to make measurements on a workpiece has a fixed member, a spindle assembly comprising a hollow spindle which receives the fixed member and is rotatable with respect to the fixed member, a motor which rotates the spindle assembly, and a sensing assembly attached to the fixed member and adapted to measure one or more dimensions of the workpiece. The dimensions may be measured both statically and dynamically, and the sensing assembly can have separate sensor assemblies for each dimension to be measured.
    Type: Grant
    Filed: January 27, 2005
    Date of Patent: March 13, 2007
    Inventors: John W. Haidler, Robert A. Cooper
  • Patent number: 7140119
    Abstract: Rotational motions between a displacement-measuring probe and an optical test surface define a spherical or near spherical datum surface against which measurements of the probe are taken. The probe has a measurement axis that is maintained substantially normal to the optical test surface during the course of measurement.
    Type: Grant
    Filed: April 23, 2004
    Date of Patent: November 28, 2006
    Assignee: Corning Incorporated
    Inventors: Vivek G. Badami, John H. Bruning
  • Patent number: 7131211
    Abstract: An apparatus comprises one or more pairs of mutually coaxial and opposing linear measuring devices including movable, biased fingers for simultaneously determining the thickness and warpage of a substrate such as a circuit board passing between the fingers. Each measuring device is calibrated to a zero point by bringing the ends of the movable fingers together and recording the distance or position thereof. Data for computation of substrate thickness and warpage measurements is obtained by recording displacement distances or positions of the movable fingers in contact with opposing surfaces of the substrate with respect to the zero point, the thickness and warpage then being calculated. The apparatus may be integrated with an assembly line, including incorporation with an existing piece of equipment, so that substrates exhibiting out-of-specification thickness or excessive warpage may be reworked, discarded or downgraded during the manufacturing process.
    Type: Grant
    Filed: August 18, 2003
    Date of Patent: November 7, 2006
    Assignee: Micron Technology, Inc.
    Inventor: Rodney L. Kirstine
  • Patent number: 7121013
    Abstract: A length measuring probe that includes a base body, a guide element and a probe pin having a touch scanning element for touch scanning a measuring object, the probe pin is seated, displaceable in relation to the base body in a measuring direction opposite a spring force F via the guide element. A detection device detects a position of the probe pin with respect to the base body and a first spring element and a second spring element arranged behind the first spring element in the measuring direction so as to prestress the probe pin. The guide element is arranged between the first and second spring elements, on which facing end areas of the first and second spring elements are fixed in place, and wherein the at least one guide element is seated, displaceable in the measuring direction, on the probe pin and on the base body.
    Type: Grant
    Filed: March 28, 2002
    Date of Patent: October 17, 2006
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Peter Herkt, Ludwig Böge
  • Patent number: 7107695
    Abstract: A hand-operated feeler includes a rod on a crossed movement table mounted on a support fitted with an immobilization device at a fixed reference as compared to the part to be measured and a processing unit configured to store and process the results. Such a device results in rapidly measuring the contours of parts including deep and sunken honeycomb cells.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: September 19, 2006
    Assignee: Snecma Moteurs
    Inventors: Bernard Paillarse, Pierre Jamault, Dominique Thibault
  • Patent number: 7100429
    Abstract: A surface profile measuring instrument for measuring a surface profile of a workpiece has: a probe having a stylus provided with a measuring portion for measuring a surface of a workpiece at a tip end thereof and a detector for outputting a detection signal which varies depending on a measurement condition between the surface of the workpiece and the measuring portion; a scanning mechanism for relatively moving the measuring portion along the surface of the workpiece; a memory (46) that stores a position information of the contact portion when the detection signal reaches a predetermined reference signal value; a vibration inclination angle calculator (51) that calculates a response variation factor (vibration inclination angle ?) that applies variation to the detection signal from the surface of the workpiece; and a profile processor (53) that corrects the position information to obtain an actual profile of the surface of the workpiece using the response variation factor.
    Type: Grant
    Filed: July 8, 2003
    Date of Patent: September 5, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kazuhiko Hidaka
  • Patent number: 7047657
    Abstract: An apparatus for recording the contour of a surface of a body is provided in accordance with the present invention. The apparatus comprises a carrier on which at least one distance measuring element is disposed. The at least one distance measuring element is capable of determining a distance between the carrier and a location on the surface of the body. A navigation system with marking elements is provided. The marking elements are fixable on the carrier and on the body, such that positional data regarding the position of the body and the carrier can be determined by the navigation system. A data-processing device device is also provided, which is adapted to calculate the contour of the surface from the positional data of the body and of the carrier and the distance measurements of the at least one distance measuring element.
    Type: Grant
    Filed: March 3, 2005
    Date of Patent: May 23, 2006
    Assignee: Aesculap AG & Co. KG
    Inventors: Andreas Goeggelmann, Josef Kozak
  • Patent number: 6971182
    Abstract: A measuring apparatus is provided comprising: a stage, including three or more pads formed on a surface of the stage, the pads forming an invisible plane and capable of supporting a panel to be measured; a movable measuring stylus, having a tip, the measuring stylus being movable between an initial position, through an insertion region, and a measuring position; a spring, the spring being disposed to apply downward force upon the measuring stylus so that the measuring stylus presses against the panel; a lever, movably mounted on said base, capable of moving the measuring stylus between the initial position, through the insertion region, and the measuring position; and a means for measuring the difference between the height of a tip of the measuring stylus in the measuring position and the height of the invisible plane.
    Type: Grant
    Filed: October 12, 2004
    Date of Patent: December 6, 2005
    Assignee: Huber Engineered Woods LLC
    Inventors: Shannon Dee Guffey, James Edward Mealor
  • Patent number: 6904693
    Abstract: The object of the invention is a method for defining elastic deformations and integral angle between of the most important parts of a gyratory compactor, in which method the angle of gyration of a gyratory compactor is measured during the use of the gyratory compactor. The object of the invention is also a device in accordance with the claim 1, which device includes measuring elements (13, 20, 27, 28) for measuring the angle of gyration of a gyratory compactor. Characteristic to the method in accordance with the invention is the fact that a loading device (1) is adjusted in the place of mass specimen, the loading of which on the gyratory compactor is earlier known and that the gyratory compactor will be in use while the loading device (1) is inside the gyratory compactor. Characteristic to the device in accordance with the invention is the fact that the device includes at least one loading device which can be placed inside the specimen cylinder mold of the gyratory compactor.
    Type: Grant
    Filed: March 21, 2003
    Date of Patent: June 14, 2005
    Assignee: Pine Instrument Company
    Inventor: Antti Paakkinen
  • Patent number: 6901676
    Abstract: A device and method are provided for inspecting an eccentric bushing having interior and exterior surfaces. The device includes a fixed roller and a pair of movable rollers disposed in a triangular configuration. The eccentric roller is disposed between the fixable roller and the movable rollers such that the fixed roller is disposed against an interior surface of the bushing and the movable rollers are disposed against the exterior surface of the bushing. A contact element of a gauge is disposed between the movable rollers and against the exterior surface of the bushing. Rotation of the eccentric bushing moves the contact element, which causes a display of the gauge to provide readings showing changes in the distance between the interior and exterior surfaces of the bushing.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: June 7, 2005
    Assignee: Honda Motor Co., Ltd.
    Inventor: David Macke
  • Patent number: 6860025
    Abstract: Apparatus for measuring wall thickness of a container having an open mouth includes a gauge indicator mounted on a support base, and having a first tip and a readout that provides an indication of position of the first tip. A probe arm includes a rod mounted on the base, a second tip pivotally mounted on the rod, a sleeve slidable on the rod, and a link connecting the sleeve to the second tip such that pivotal position of the second tip on the rod is controlled by position of the sleeve along the rod. The second tip is movable between a first position at which a container mouth is receivable over the second tip, and a second position at which the second tip internally engages the wall of the container in opposition to the first tip such that the readout provides a measure of container wall thickness between the first and second tips.
    Type: Grant
    Filed: December 30, 2002
    Date of Patent: March 1, 2005
    Assignee: Owens-Brockway Glass Container Inc.
    Inventors: Shaun P McMackin, James H. Jaquillard
  • Patent number: 6796050
    Abstract: A presetting device is proposed for a tool holder (1) which holds the shank (23) of a rotary tool (3) in an interference fit in a locating opening (5) and releases said shank (23) during heating, in particular by means of an induction heating arrangement (7), and which has inside the locating opening (5) an axially adjustable positioning stop surface (21) for the tool shank (23). The presetting device comprises a holder receptacle (11), which holds the tool holder (1) in an axial position and has an opposing reference surface (25), and means (43) for measuring the axial overall length of the rotary tool (3). The presetting device also comprises a measuring device (27) which measures the axial distance between the positioning stop surface (21) of the tool holder (1) and the opposing reference surface (25) of the holder receptacle (11) and has a measured-value indicator (55), the indicated distance value of which can be increased by the measured value of the overall length of the rotary tool (3).
    Type: Grant
    Filed: March 7, 2003
    Date of Patent: September 28, 2004
    Assignee: Franz Haimer GmbH
    Inventors: Franz Haimer, Josef Haimer, Wolfgang Kügle
  • Patent number: 6792691
    Abstract: A gage assembly for measuring a distance d from an end edge of a blade segment to a center location of a groove formed in the segment comprising a gage body having at least two reference surfaces adapted to engage edges of the segment; a dial indicator gage having a dial and a stem, the stem passing through a portion of the gage body; and a slide gage adapted for insertion into the groove, the slide gage fitted with an element that, in use, aligns with the stem of the dial indicator gage.
    Type: Grant
    Filed: November 12, 2002
    Date of Patent: September 21, 2004
    Assignee: General Electric Company
    Inventors: Shawn Gregory Genal, James Philip Stanley, Lynn Charles Gagne, Stewart William Beitz
  • Patent number: 6745616
    Abstract: In advance to measuring texture of the workpiece by a surface texture measuring machine (1), a workpiece orientation adjustment stage (10) is manually moved by the surface texture measuring machine (1) in accordance with calculated orientation correction amount of the workpiece, thus adjusting orientation of the workpiece. Since it is only necessary for an operator to operate respective adjustment means until reaching a displayed correction amount, operation thereof can be facilitated and orientation thereof can be highly accurately adjusted without impairing operability.
    Type: Grant
    Filed: October 18, 2000
    Date of Patent: June 8, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Minoru Katayama, Hideki Mishima, Toshihiro Kanematsu, Hiroomi Honda, Hiroyuki Hidaka, Kazushige Ishibashi
  • Patent number: 6725557
    Abstract: A measuring system including a linear gauge 8 is placed on a vibration isolation table 7, and this system assembly is placed in a temperature controllable, constant-temperature chamber. A specimen table 16, which has a centrally-disposed circular protrusion 16C of a diameter sufficiently smaller than a specimen under measurement, is mounted on a surface plate 2 of a linear gauge 8. The position of a measuring element 1 is measured when it is brought into contact with the centrally-disposed circular protrusion 16C, and the position of the measuring element 1 is measured when it is brought into contact with the specimen placed on the specimen table. The measured values are used to determine the thickness of the specimen.
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: April 27, 2004
    Inventors: Jun-ichi Kushibiki, Mototaka Arakawa, Ryoichi Okabe
  • Publication number: 20040069077
    Abstract: A method for inspecting a component. The method includes coupling the component to a fixture such that the component is fixedly secured in position during machining of the component, and inspecting the component using an inspection tool while the component is coupled to the fixture.
    Type: Application
    Filed: October 9, 2002
    Publication date: April 15, 2004
    Inventors: Aaron Henry King, James Marion Vau, Brett Wayne Byrnes
  • Patent number: 6718645
    Abstract: A measuring device for measuring the concentricity of cartridges (30, 31), more particularly rifle cartridges, is essentially composed of a main body (1) provided with chambers (2) for cartridges of one or a plurality of calibers. The cartridges are radially retained in the chambers by so-called diameter compensators (9) but rotatable about their longitudinal axis. In the area of the point (39) of the projectile, an access for a measuring means (3) is provided, e.g., a dial gauge, the latter indicating the deviation of the projectile from perfect concentricity by the magnitude of its deflection variation when the cartridge (30, 31) is rotated. An aligning device (4) that is preferably also provided allows to exert a lateral pressure on the projectile in order to obtain an improved concentricity.
    Type: Grant
    Filed: December 2, 2002
    Date of Patent: April 13, 2004
    Inventor: Heinz Berger
  • Patent number: 6718610
    Abstract: A system and method for assembling a fuel tank is disclosed. A measuring device is mounted on a carriage on which at least one machine tool (e.g., saw, router) is also mounted. This carriage is operatively interconnected with a computer and may be longitudinally moved between a headstock and tailstock which are longitudinally displaced and on which various subassemblies of the fuel tank may be mounted during the assembly of a given fuel tank. Length measurements are preferably made of each fuel tank subassembly prior to any machining operation being executed thereon, as well as after each such machining operation, by monitoring/knowing the longitudinal position of the carriage via the measuring device. These length measurements may be automatically recorded on an appropriate computer-readable storage medium in relation to the subject fuel tank subassembly and the subject fuel tank.
    Type: Grant
    Filed: March 29, 2001
    Date of Patent: April 13, 2004
    Assignee: Lockheed Martin Corporation
    Inventors: Richard K. Hansen, Jeffrey M. Simonson
  • Patent number: 6701633
    Abstract: There is provided a shape measuring apparatus which defines an XYZ-axis coordinate and measures a surface shape of an object, the apparatus including a plurality of probes arranged in a Y-axis direction, the probes contacting a surface of the object, and moving in a Z-axis direction according to the surface shape of the object, a probe holder for holding each of the plurality of probes movable in the Z-axis direction, a moving mechanism for moving the probe holding mechanism in an X-axis direction relative to the object, first and second measuring instruments for measuring positions of each probe in the X-axis and Y-axis directions, a third measuring instrument for measuring a position of each probe in the Z-axis direction; and a computing unit for calculating the surface shape of the object based on measuring results from the first, second, and third measuring instruments.
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: March 9, 2004
    Assignee: Canon Kabushiki Kaisha
    Inventor: Masaru Ohtsuka
  • Patent number: 6694627
    Abstract: A printed circuit board processing machine has: a table that can travel in a X-direction carrying a printed circuit board thereon; a cross rail arranged so as to straddle the table; a plurality of sliders supported for independently movement in a Y-direction by the cross rail; a plurality of spindles supported for movement in a Z-direction by the sliders; a magnetic rail of a linear-motor fixed to the cross rail; and a plurality of coils of the linear-motor fixed to the sliders so as to oppose the magnetic rail.
    Type: Grant
    Filed: April 24, 2001
    Date of Patent: February 24, 2004
    Assignee: Hitachi Via Mechanics, Ltd.
    Inventors: Yasushi Ito, Akira Irie
  • Patent number: 6684517
    Abstract: A device for determining geometrical defects in a vehicle wheel comprises, for measuring the eccentricity of the wheel rim (5) and of the wheel (4), means (7) to be positioned in contact alternately with the tyre (6) and with the wheel rim (5) of the wheel of which the eccentricity is to be measured, a sensor (8) for measuring the angular position assumed by said means (7) about a fixed reference point (9), and means for associating and processing the data measured by said means (7) and by said sensor (8) to determine the angle through which the tyre (6) must be rotated on the wheel rim (5) to compensate their errors of shape. Said angular sensor (8) comprises a fixed part (80) carried by a shaft (23) associated with self-centering support means (21, 19, 200, 203) arranged to position it exactly coaxial with said wheel rim, and a movable part (81) rotatably mounted on said shaft (23).
    Type: Grant
    Filed: May 17, 2001
    Date of Patent: February 3, 2004
    Assignee: Corghi S.p.A.
    Inventor: Remo Corghi
  • Patent number: 6671973
    Abstract: A method of adjusting the relative attitude of a work in a surface texture measuring instrument for measuring the work having a feature region includes a measurement step of performing measurement of the feature region along an X-axis direction after positioning a detector in a Y-axis direction and the X-axis direction, a determination step of repeating the measurement which is performed while changing the position in the X-axis direction, and a step of adjusting the attitude of the work on the basis of the amount of relative attitude correction. Therefore, the direction of the feature region in the work is adjusted so as to be parallel to the Y axis.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: January 6, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Fumihiro Takemura, Minoru Katayama
  • Patent number: 6634114
    Abstract: An adjustable gage comprises a centerline hub and a swing gage. The hub includes a body with position jaws adjustably attached thereto, and a central post. The gage comprises a pair of parallel slide bars and front and rear blocks slidable along the slide bars. A movable, spring-biased probe is slidably connected to the front block via a rail and carriage bearing apparatus. The probe is operably connected to a probe-movement indicator. The rear block has a fixed probe. Both probes have end roller bearings. In use, the part to be measured is placed within the position jaws, previously adjusted to the approximate inner or outer diameter of the part. Then, the gage is placed over the post, with the roller bearings coming into contact with the part, and the gage is rotated. The probes track along the part, with any variances in part diameter showing up on the indicator.
    Type: Grant
    Filed: April 12, 2001
    Date of Patent: October 21, 2003
    Assignee: Bidwell Corporation
    Inventor: Steven T. Bidwell
  • Patent number: 6629374
    Abstract: A method and an apparatus for measuring linearity in a reproduction appliance includes an operating carriage bearing a scanning or recording device. The operating carriage is able to be moved in discrete steps in a given direction along a straight line. The operating carriage is successively moved along partial segments of the line. Each of the partial segments is longer than a travel corresponding to one of the steps and is shorter than the entire length of the line. The partial segments each have an exactly defined length defined by an additional carriage moveable along the given direction. The number of steps needed for each partial segment are counted and deviations between values for a travel of the operating carriage resulting from the partial segment and values for the travel of the operating carriage resulting from counting the steps are calculated.
    Type: Grant
    Filed: November 4, 2001
    Date of Patent: October 7, 2003
    Assignee: Heidelberger Druckmaschinen AG
    Inventors: Peter Melzer, Volker Haushahn, André Wirtz
  • Patent number: 6622397
    Abstract: A shim measuring apparatus to determine the thickness of a shim, with the shim used with a ball joint including a snap-ring and a controlled arm having a bore and a notch. The measuring apparatus comprises an upper housing including a measuring device and a lower housing coupled to the upper housing. The lower housing is configured to receive the ball joint and to engage the notch in the bore. The distance between the upper housing and the lower housing while a load is applied is measured by the measuring device. Such distance between the upper housing and the lower housing represents the shim thickness.
    Type: Grant
    Filed: April 25, 2002
    Date of Patent: September 23, 2003
    Assignee: Oshkosh Truck Corporation
    Inventor: Jesse Knoble
  • Patent number: 6594532
    Abstract: A measurement probe is carried by a carriage movable in a first direction to cause the measurement probe to traverse a measurement path across a surface of an object received by a support surface to provide measurement data representing variations in a second direction different from the first direction of surface features along the measurement path. The support surface is movable in a third direction different from the first and second directions. Measurement of a surface area is effected by controlling the carriage to cause the measurement probe to traverse a plurality of measurement paths across an area of the surface of an object mounted on the support surface and by controlling the support surface to move in the third direction after each measurement path traverse. Measurement data thus obtained for a reference sphere of previously known radius is used to determine the relative orientation of the first and third directions.
    Type: Grant
    Filed: November 26, 2001
    Date of Patent: July 15, 2003
    Assignee: Taylor Hobson Limited
    Inventor: Michael Mills
  • Patent number: 6516528
    Abstract: A system and method are disclosed for determining properties of a feature located at a surface of a substrate. A plurality of probe tips are operable to traverse a surface of the substrate and provide measurement data indicative of topographical features scanned thereby. The measurement data obtained from the plurality of probe tips is aggregated and processed to determine feature properties, such as may include line edge roughness and/or linewidth.
    Type: Grant
    Filed: February 26, 2001
    Date of Patent: February 11, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Bryan K. Choo, Bhanwar Singh
  • Patent number: 6508009
    Abstract: An improved gemstone measuring apparatus includes a pair of linearly aligned measurement flanges used to determine the linear dimensions of a gemstone alone a plurality of axes. One of the measurement flanges is linearly moveable relative to the other. A measurement member translates the distance between the measurement flanges to display indicia responsive thereto. A rotatable support platform is coupled to the housing intermediate the measurement flanges, the axis of rotation thereof being co-extensive with a measurement flange. The gemstone whose dimensions are to be measured is disposed upon the rotatable support platform intermediate the measurement flanges. The rotatable platform is positioned to align the gemstone axis being measured with the axis of alignment of the measurement flanges.
    Type: Grant
    Filed: September 15, 2000
    Date of Patent: January 21, 2003
    Inventors: Semyen Tubis, Igor Borisov