Electrical Patents (Class 33/820)
  • Patent number: 7584551
    Abstract: An absolute position measuring apparatus includes a first rotary encoder that detects a rotation of a spindle as a phase signal which varies in a first cycle and a second rotary encoder that detects the rotation of the spindle as another phase signal which varies in a second cycle. A rotation of a first rotor of the first rotary encoder is transmitted to a second rotor via a relay gear that is meshed with a first gear provided on an outer circumference of a first rotary cylinder and a second gear provided on an outer circumference of a second rotary cylinder. Thus, an absolute position of the spindle is calculated on the basis of two phase signals that are different in cycle. Further, it is not necessary to provide a conventionally-known spiral key groove so that the apparatus can be easily downsized. Manufacturing costs can be also reduced.
    Type: Grant
    Filed: July 30, 2008
    Date of Patent: September 8, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Masamichi Suzuki, Shuji Hayashida, Shozaburo Tsuji
  • Publication number: 20090031578
    Abstract: An absolute position measuring apparatus includes a first rotary encoder that detects a rotation of a spindle as a phase signal which varies in a first cycle and a second rotary encoder that detects the rotation of the spindle as another phase signal which varies in a second cycle. A rotation of a first rotor of the first rotary encoder is transmitted to a second rotor via a relay gear that is meshed with a first gear provided on an outer circumference of a first rotary cylinder and a second gear provided on an outer circumference of a second rotary cylinder. Thus, an absolute position of the spindle is calculated on the basis of two phase signals that are different in cycle. Further, it is not necessary to provide a conventionally-known spiral key groove so that the apparatus can be easily downsized. Manufacturing costs can be also reduced.
    Type: Application
    Filed: July 30, 2008
    Publication date: February 5, 2009
    Applicant: MITUTOYO CORPORATION
    Inventors: Masamichi Suzuki, Shuji Hayashida, Shozaburo Tsuji
  • Patent number: 7111413
    Abstract: A distance measuring instrument has a measuring axis; a measuring spindle disposed rotatably and shiftably in a housing such that a rotary motion of the measuring spindle results in a corresponding shift of the measuring spindle along the measuring axis; a stationary sensor element which is immobile relative to the housing and a movable sensor element which is connected to the measuring spindle to rotate therewith and which is shiftable relative to the measuring spindle along the measuring axis; and a guiding device for guiding the relative shifting motion between the movable sensor element and the measuring spindle, and having a guiding sleeve connected to the movable sensor element for rotation therewith; the guiding sleeve has an inner groove which extends parallel to the measuring axis and a guiding member which is connected to the measuring spindle for rotation therewith and which projects shiftably into the inner groove.
    Type: Grant
    Filed: February 9, 2005
    Date of Patent: September 26, 2006
    Assignee: Carl Mahr Holding GmbH
    Inventor: Wolfgang Seibold
  • Patent number: 7013576
    Abstract: Provided is a measuring device 1 for measuring the size of an object comprising a body 2, and a spindle 3 which is screwed into the body 2 and axially advances and retracts by screwing with respect to the body 2, the measurement being based on the axial displacement of the spindle 3 effected by the revolution of the spindle, wherein the spindle is screwed into the body 2 via a multiple-start thread 31. Therefore, it is possible to displace the spindle 3 at a high speed, which improves the operability of the measuring device.
    Type: Grant
    Filed: December 26, 2002
    Date of Patent: March 21, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Shuuji Hayashida, Kouji Sasaki, Yuichi Ichikawa, Osamu Saito, Seigo Takahashi, Masamichi Suzuki, Tetsuya Nakadoi, Masahiko Tachikake, Takahiro Nakamura, Masafumi Okamoto, Yuuzou Hashimoto
  • Patent number: 6804896
    Abstract: An embodiment of an electronic measuring device includes a housing having an exterior surface configured and arranged to be removably secured within a support member. An electrically conductive probe is coupled to the housing and is movable between a position in contact with a workpiece and a position out of contact with the workpiece. A circuit electrically couples an indicator and a power source to the probe such that when the probe is out of contact with the workpiece, the circuit is open and no power is supplied from the power source to the indicator and such that when the probe contacts the workpiece, the circuit closes to supply power from the power source to the indicator to send a signal to the operator of the measuring device that the probe is in contact with the workpiece.
    Type: Grant
    Filed: December 20, 2002
    Date of Patent: October 19, 2004
    Assignee: Magna International Inc.
    Inventors: Bruno W. Gass, Manuel L. Avelar
  • Patent number: 5433016
    Abstract: A linear displacement measuring apparatus in which a spindle is disposed movably forwardly and backwardly to a measuring apparatus main body, a detector for detecting a linear displacing amount of the spindle is disposed to the inside of the measuring apparatus main body and a water-proof mechanism is disposed to a liquid intruding path in communication with the detector for preventing liquid from intruding.
    Type: Grant
    Filed: December 22, 1993
    Date of Patent: July 18, 1995
    Assignee: Mitutoyo Corporation
    Inventors: Masahiko Tachikake, Akio Fujimaru, Tetsuya Nakadoi
  • Patent number: 5287631
    Abstract: A cylindrical beam-type micrometer measurement system is disclosed having an extended-length measuring range of 0-100 inches or more, and an accuracy of approximately 0.000005 inches (5 microinches), and which is designed as a retrofit to the widely-used Mechanical Supermicrometer, Model A, manufactured by Pratt & Whitney. In order to maintain accuracy with a 10-foot cylindrical beam, one or more center pedestals are used to support the middle portion of the beam, and a modified tailstock housing is moveably secured to the beam using a dovetail slot and clamp configuration. This arrangement allows the tailstock to be freely moved over the center pedestals to accommodate objects of different lengths. A displacement meter probe adapter assembly is also provided, which permits a Mechanical Supermicrometer tailstock to be used with an electrical displacement meter and probe.
    Type: Grant
    Filed: December 16, 1991
    Date of Patent: February 22, 1994
    Assignee: Ronald J. Stade
    Inventor: Ronald J. Stade
  • Patent number: 5102471
    Abstract: In a portable measuring instrument using as a power source a group of solar batteries in which a plurality of solar batteries are series-connected on the same plane, respective light receiving windows are made to be substantially equal in area to one another, and each of the light receiving windows surrounds the outer periphery of other light receiving windows adjacent thereto, whereby, even if part of the light which irradiates the light receiving windows of the solar batteries is screened by a hand or other holding means for operating and holding the portable measuring instrument, it is avoided that only a specific light receiving window is screened, so that a current of the group of solar batteries can be efficiently produced.
    Type: Grant
    Filed: February 28, 1991
    Date of Patent: April 7, 1992
    Assignee: Mitutoyo Corporation
    Inventor: Koji Sasaki