Electrothermal Delay Means Patents (Class 335/66)
  • Patent number: 7498913
    Abstract: A thermal trip device in which a bimetal (2) is heated by overcurrent and performs trip operation of a circuit by curvature of the heated bimetal (2), wherein at least one part of the surface of the bimetal (2) is made to be black or matte black (7). Thereby, temperature of the bimetal (2) can be highly accurately measured using a no-contact thermometer. Furthermore, a temperature measurement part (8) of the bimetal is provided with a bending part (11), and the surface of the bending part is made to be matte black.
    Type: Grant
    Filed: April 21, 2004
    Date of Patent: March 3, 2009
    Assignee: Mitsubishi Electric Corporation
    Inventors: Kouji Kawamura, Hiroyuki Akita, Masatoshi Murai, Hirotoshi Yonezawa, Satoru Naito
  • Patent number: 4555684
    Abstract: A motor starting device for de-energizing the starting winding the required motor speed is reached comprising electromagnetic means (3) to urge actuation of the switching means (20,21) and a latch member (10) controlled by a thermal temperature-balanced bimetallic strip (5) to prevent switching until the bimetallic strip (5) reaches a selected temperature through current flow flow therethrough.
    Type: Grant
    Filed: August 9, 1984
    Date of Patent: November 26, 1985
    Assignee: Texas Instruments Incorporated
    Inventor: Douglas J. Slack