Abstract: An image processor which is capable of performing correction of defective pixels without degrading image quality when synthesizing a plurality of still images. When a plurality of image data items are synthesized, a first reference value which is smaller than a second reference value for use in determining whether or not to correct pixel data forming the image data is compared with a pixel value indicated by each of synthesized pixel data items forming the synthesized image data, and first correction processing is performed in which the synthesized pixel data of the synthesized image data is corrected according to a result of comparison.

Abstract: A camera with defective pixel compensation is provided. The camera comprises a register and a compensating unit. The compensating unit receives an image datum and a plurality of adjacent image data relating to the image datum and, according to the value installed in the register, the compensator selects a reference datum from the plurality of adjacent image data. When the image datum is greater than the reference datum by a threshold value, the compensating unit modifies the image datum according to the reference datum.

Abstract: A defective pixel detecting device determining defective pixels as correction targets in an imaging device that produces image signals is provided, and the device includes: defect information storage configured to store priority of defective pixels to be corrected; a defective pixel detector configured to detect defective pixels by comparing levels of imaging signals from the imaging device with a predetermined detection level; a priority setter configured to set priority of the detected defective pixels, based on the levels of the imaging signals of the defective pixels detected by the defective pixel detector; and a correction target determiner configured to newly determine defective pixels to be corrected based on the priority of the defective pixels out of the defective pixels that are currently detected by the defective pixel detector and the defective pixels to be corrected stored in the defect information storage, determining priority of the newly determined defective pixels to be corrected, and storin

Abstract: An image processing apparatus capable of performing a correction process by filtering speedily and easily. A digital signal processor captures image data including effective area data from within a preset range of an image pickup device and ineffective area data from outside the preset range of the image pickup device. The digital signal processor superimposes a defective pixel detection signal and an ineffective image data detection signal to thereby generate a defective pixel determination signal. When a target pixel in the image data is determined based on the defective pixel determination signal as a determined-as-defective pixel, the digital signal processor corrects the value of the target pixel using values of the image data associated with ones, which are not determined, based on the defective pixel determination signal, as the determined-as-defective pixel, of pixels around the target pixel.

Abstract: An image sensor uses a single row of an array of pixels elements to determine whether a pixel is defective and to recover the defective pixel. The image sensor includes a “maximum of minimum” filter to remove a “black” pixel from a raw image. The image sensor also includes a “minimum of maximum” filter to remove a “white” pixel from the raw image.

Abstract: A method and apparatus for eliminating defective pixels and noise in which each pixel value of an image is extracted using a color filter. A mean value of the extracted image is calculated A noise variance, a first threshold for determining whether a pixel is defective, and a second threshold for calculating a weight value for a pixel are all estimated from the mean value. There is a determination as to whether each pixel is defective, and a weight value, a weighted signal mean and a weighted signal variance of the each pixel are all calculated, and noise eliminated from the image using the noise variance, the weighted signal mean, and the weighted signal variance.

Abstract: Systems and methods are provided that facilitate mitigating pixel or column fixed pattern noise in a CMOS imaging System-on-Chip (iSoC) sensor. For instance, pixel or column fixed pattern noise can be recognized by gating a pixel array without firing a transfer signal (TX). Inhibiting the transfer signal can cause zero input to be provided to pixels in the pixel array; thus, the sampled output from the pixels under such conditions can be a function of noise. Calibration and correction can thereafter be effectuated. Moreover, uniform frame rates for outputted frames can be yielded irrespective of use of a subset of read out frames for calibration. For example, frames employed for calibration can be replaced in a sequence of outputted frames by copies of stored frames. Further, signal levels can be balanced to account for differences in light integration time, which can result from blocking and unblocking firing of transfer signals.

Abstract: A method and apparatus for processing imager pixel signals to reduce noise. The processing includes receiving a target pixel signal, receiving at least one neighboring pixel signal, formulating a dynamic noise signal based at least in part on a value of the target pixel signal, and controlling a noise reduction operation using the dynamic noise signal.

Abstract: An image processing apparatus includes a noise reduction unit which performs noise reduction processing to image signals, a first noise presumption unit which presumes a first noise amount from a present image signal among the image signals, and a second noise presumption unit which presumes a second noise amount based on the first noise amount, the present image signal, and the image signal of the past which underwent the noise reduction processing. The noise reduction unit performs the noise reduction processing to the present image signal based on the second noise amount.

Abstract: In one embodiment of the invention, a digital zoom and panning system for digital video is disclosed including an image acquisition device to capture digital video images; an image buffer to store one or more frames of digital video images as source pixels; a display device having first pixels to display images; a user interface to accept user input including a source rectangle to select source pixels within frames of the digital video images, a destination rectangle to select target pixels within the display device to display images, and a region of interest within the digital video images to display in the destination rectangle; and a digital mapping and filtering device to selectively map and filter source pixels in the region of interest from the image buffer into target pixels of the display device in response to the user input.

Abstract: A system and method for detecting defective pixels in a sensor. A plurality of pixel values of the sensor may be detected. The values may include those of a first pixel and each nearest neighboring pixel to the first pixel. A second pixel may have the highest value of the neighboring pixels. A third pixel may have the next highest value of the neighboring pixels. A first function may be performed on the second pixel value, producing a first output value. A second function may be performed on the third pixel value, producing a second output value. If the first pixel value is higher than the first output value, or, if the first pixel value is higher than the second output value and the second pixel value is higher than the second output value, it may be determined that the first pixel is defective.

Abstract: An image processing device that corrects and interpolates pixel values of defective pixels present upon an image sensor, includes: a position information storage memory that stores a position of a defective pixel of a first type whose pixel value can be utilized after correction, and a position of a defective pixel of a second type whose pixel value is to be interpolated using pixel values of other pixels, distinguished from one another; a correction amount storage memory that stores a correction amount for the defective pixel of the first type; a correction unit that corrects the pixel value of the defective pixel of the first type according to the correction amount; and an interpolation unit that interpolates the pixel value of the defective pixel of the second type, using the pixel values of pixels including the defective pixel of the first type whose pixel value has been corrected by the correction unit.

Abstract: Solid-state imaging device having a plurality of vertical signal lines, includes for each vertical signal line, an effective pixel and a dummy pixel, a switch transistor provided on a path connecting the dummy pixel and the vertical signal line, and a read-out unit. The switch transistor is OFF while a first signal is outputted from the effective pixel and ON while a second signal is outputted from the dummy pixel. The read-out unit (i) reads out a level of the first signal while the switch transistor is OFF, and (ii) reads out a difference between the level of the first signal and a level of the second signal when the switch transistor is turned from OFF to ON.

Abstract: A method and apparatus to detect a dead pixel in an image sensor having a pixel array to generate a plurality of image frames, and a method and apparatus to capture an image from the image sensor detect a dead pixel in the image sensor. A change of a scene of the image frames is sensed, and a detection operation to detect a dead pixel in the pixel array is performed if the change of the scene is sensed.

Abstract: There is provided an apparatus for removing color noise including: a color interpolation unit performing color interpolation on a bayer pattern image output from an image sensor; a high-pass filter unit performing high-pass filtering on each of the pixels of the bayer pattern image to generate high-pass filtered values of each of the pixels; a high frequency region determining unit comparing pixel values of a target pixel, from which color noise is removed, and pixels adjacent to the target pixel with the high-pass filtered values to determine whether the target pixel is included in a high frequency region; and a color noise region determining unit using differences between color values of the target pixel interpolated by the color interpolation unit and determining whether the target pixel is included in a color noise region when it is determined that the target pixel is included in the high frequency region.

Abstract: A system for correcting image characteristic data from a plurality of pixels comprises at least one field programmable gate array (FPGA), a lookup table, and a correction module. The FPGA may include a plurality of configurable logic elements and a plurality of configurable storage elements. The lookup table may be accessible by the FPGA and may store a plurality of correction components associated with each pixel, including a gain value, an offset value, and a bad pixel value. The correction module may be formed from the configurable logic elements and configurable storage elements and may receive the characteristic data and the correction components. The correction module may generate corrected data for each characteristic data by utilizing the gain value, the offset value, and the bad pixel value.

Abstract: Pixel signals output from an imaging device having pixels arranged in horizontal and vertical directions are compensated if there are pixel defects. Extracted from the pixel signals are: a first signal from a target pixel; second signals from second pixels having the same color as the target pixel; and third signals from third pixels having a different color from the target pixel, the second and third pixels being located as close to the target pixel on both sides thereof in each direction. Extracted from the second signals are a highest-level signal having the highest luminance level and a second-level signal having the second luminance level. An average luminance level of the second signals is calculated. It is determined whether a particular pixel among the second pixels and causing generation of the highest-level signal is defective by using the highest and average levels. The highest-level signal is selected when the particular pixel is not defective, otherwise, the second-level signal.

Abstract: An image defect correction apparatus capable of satisfactorily correcting a white vertical line caused by point defects on the same vertical CCD. A first correction value is determined from a difference between an average value of luminance signals obtained by a vertical CCD including one or more point defects and an average value of luminance signals obtained by the vertical CCDs when light-receiving elements face a predetermined ineffective signal region. It is determined to which of regions divided by Y addresses of point defects on the same vertical CCD each of Y-directional positions of luminance signals outputted from a horizontal CCD is positioned. The first correction value is multiplied by a predetermined coefficient corresponding to the determined region to calculate a second correction value with which the luminance signals from the horizontal CCD are corrected.

Abstract: A defective pixel specifying method and a defective pixel specifying system for a semiconductor device having a defective pixel are provided. Also provided are an image correcting method and an image correcting system for making a defective pixel inconspicuous on the screen when a read image is displayed. The present invention determines whether or not there is a defective pixel for each pixel and specifies the coordinate of the defective pixel using image signals obtained by reading a plurality of images. The image signal of the defective pixel is set based on the image signals of the pixels adjacent to the defective pixel to correct the image of the subject read.

Abstract: According to one embodiment, an image processing apparatus includes a defect correction unit, a noise reduction processing unit, and an output selection unit. The defect correction unit includes a contrast determination unit and an illuminance determination unit. The output selection unit selects the output from the defect correction unit when a target pixel is determined to be a defect. The defect correction unit enables a correction value to be output as a signal value which is applied to the target pixel in accordance with the contrast determination and the illuminance determination.

Abstract: An imaging apparatus is provided, which improves correction accuracy at the time of pixel addition reading and scarcely deteriorates in resolution of the image data. This apparatus comprises: a conversion unit comprising a plurality of unit-pixels and converting an incident radiation or a light into pixel information; a signal processing unit capable of reading the pixel information for each unit-pixel, or capable of reading additional added pixel information for a plurality of unit-pixels, based on a control from a control unit for controlling a driving of the conversion unit according to a plurality of operation modes; a storage unit for storing a plurality of correction information according to the plurality of operating modes; and a correction unit for performing the correction of the pixel information based on the correction information extracted from the plurality of correct information according to the operation mode.

Abstract: Provided are method and apparatus for eliminating image noise caused by variation between the imaging pixels on an image sensor. Preferably, a uniform light source is provided firstly, and the image sensor records exposure values taken from the source. Method is to sum the exposure values in each channel of each line, and calculate channel's average of sum for each channel and sum for adjacent lines' channels. A channel compensation value is then obtained by subtracting the average from the sum of one channel in one line, and divided by the pixel number in one channel. A compensation average constituted of a first part and a second part for each pixel is further calculated. A pixel compensation value for each pixel is obtained by suitably allotting the two parts. The pixel compensation value is finally recorded in memory and being a reference for future photographing.

Abstract: An image sensor includes a storage unit configured to store at least a portion of image data, a homogeneous pixel determination unit configured to determine whether dead pixels exist in homogeneous pixels having the same color characteristic as a center pixel in a window of the image data, and an offset correction processing unit configured to calculate a difference value between the center pixel and homogeneous pixels determined as normal pixels by the homogeneous pixel determination unit, and correct a center pixel value by using the calculated difference value.

Abstract: The object is to provide a uniform impression of noise for an entire image signal by performing grayscale conversion and noise reduction in a balanced manner. The signal processing unit performs first signal conversion on an image signal from an image-acquisition device and transfers the processed image signal to a correction-coefficient calculation unit. The correction-coefficient calculation unit calculates, on the basis of the image signal from the signal processing unit, an area correction coefficient for each area used for grayscale conversion of each area. A noise reducing unit uses the area correction coefficients calculated by the correction-coefficient calculation unit to perform noise reduction on the image signal from the image-acquisition device and transfers the processed signal to the signal processing unit.

Abstract: An image capturing system includes a signal correction unit which corrects a signal output from a defective pixel in an optical black region based on a signal output from a normal pixel. The optical black region has a plurality of pixel blocks. Each of the plurality of pixel blocks has a plurality of pixels each including one or more elements which have the same functions as in the remaining pixels and which have relative positions different from the remaining pixels. The signal correction unit corrects the signal output from the defective pixel in the optical black region based on a signal output from a normal pixel which is included in another pixel block different from the pixel block of the defective pixel in the optical black region and includes one or more elements having the same functions and same relative positions as in the defective pixel.

Abstract: A method of improving a first color filter array image from an image sensor having a plurality of color channels and a panchromatic channel, includes capturing the panchromatic channel at a different exposure time than at least one of the color channels with the image sensor; using the color channels to provide a luminance channel; and analyzing the color filter array image and the luminance channel to determine defective pixels in the color channels and using neighboring color and luminance pixel values to improve the defective pixels to produce a second color filter array image or full-color image having at least one improved channel.

Abstract: An image signal generated by a CCD image sensor is processed by the block-generating section 28 provided in an image-signal processing section 25. A class tap and a prediction tap are thereby extracted. The class tap is output to an ADRC process section 29, and the prediction tap is output to an adaptation process section 31. The ADRC process section 29 performs an ADRC process on the input image signal, generating characteristic data. A classification process section 30 generates a class code corresponding to the characteristic data thus generated and supplies the same to an adaptation process section 31. The adaptation process section 31 reads, from a coefficient memory 32, the set of prediction coefficients which corresponds to the class code. The set of prediction coefficients and the prediction tap are applied, thereby generating all color signals, i.e., R, G and B signals, at the positions of the pixels which are to be processed.

Abstract: According to one embodiment, a second determining unit performs defect determination according to an illumination light component, which is a component of illumination light irradiated onto an object, of pixel values of a plurality of adjacent pixels. A third determining unit performs defect determination according to a reflectivity component, which is a component based on a unique reflectivity of the object, of the pixel values of the plurality of adjacent pixels.

Abstract: A technique for processing at least one bad pixel occurring in an image sensing system is provided. Dynamic bad pixel detection is performed on a plurality of streaming pixels taking from at least one controlled image and value and coordinate information for each bad pixel is subsequently stored as stored bad pixel information. Thereafter, static bad pixel correction may be performed based on the stored bad pixel information. The stored bad pixel information may be verified based on histogram analysis performed on the plurality of streaming pixels. The technique for processing bad pixels in accordance with the present invention may be embodied in suitable circuitry or, more broadly, within devices incorporating image sensing systems.

Abstract: A CMOS image sensor includes: a plurality of CDS/PGAs (correlating double sampling/programmable gain amplifiers) for processing output signals of pixels corresponding to same colors on different paths; and an offset difference removing part for removing offset difference that occurs when the same color signals are processed on the different paths, wherein the offset difference removing part includes: a dummy pixel array where light is shielded; a unit for reading signals of the dummy pixel array through the CDS/PGAs and storing average offset values for each path; and a signal synthesizing unit for synthesizing the average offset values and signals of an effective pixel array, which are read through the respective CDS/PGAs, and outputting signals of which offset difference is removed.

Abstract: Rather than storing a table within a digital camera or other optical device of defective pixels within its image sensor, defective pixels are dynamically identified by comparing the output values of individual pixels under test with those of neighboring pixels. If the neighbors are all above or below the pixel under test by a defined threshold amount, the output of the pixel under test is replaced with a value calculated from the outputs of neighboring pixels.

Abstract: An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.

Abstract: An image sensor includes a corrector configured to receive a bayer raw data of a pixel array and output a corrected pixel value by correcting a dead pixel occurring in the pixel array, a memory configured to store the corrected pixel value updated in real-time, and a controller configured to control the real-time updating of the corrected pixel value to be stored in the memory, wherein when the corrector corrects the dead pixel in response to a clock, the corrector uses the corrected pixel value which is updated and stored in the memory in response to a previous cycle of the clock.

Abstract: An image processing apparatus includes an information extraction unit which extracts foreign substance information which is information of a position and size of a foreign substance in an image sensing plane of an image capture unit and is recorded in association with captured image data and lens information of a lens used when acquiring the captured image data, which is recorded in association with the captured image data, a conversion unit which converts the foreign substance information extracted by the information extraction unit into second foreign substance information form on the basis of the lens information extracted by the information extraction unit, and an interpolation unit which interpolates a pixel corresponding to the foreign substance in the captured image data on the basis of the second foreign substance information form.

Abstract: When pixel data of a solid-state image-pickup device is read in various types of methods to pick up images, a correction process for defective pixels is easily performed at a low cost. As defect-correction data in a case in which a still image is shot, data is used, which is acquired when an image-pickup device is shipped from a manufacturing factory. In a case of an operation in a reading mode for a moving image, immediately before a reading operation is performed, charge is accumulated in a state in which the image-pickup device is shielded from light, and image data is read. Addresses of defective pixels to be corrected are detected from the image data, and stored in a RAM as the defect-correction data. When a moving image is shot, a defect-correction process is performed using the data.

Abstract: An image processing system can realize a more accurate and high-quality correction of defective pixels by including an image pickup device, an obtaining unit obtaining information showing positions of defective pixels occurred at the image pickup device, a creating unit creating discrimination information showing the positions of the defective pixels in an image generated via the image pickup device, a detecting unit detecting a correlativity with neighborhood pixels by each defective pixel, and an estimating unit estimating a pixel value by each defective pixel in accordance with a detected result by the detecting unit. Incidentally, the image processing system is configured by an imaging device and a computer recording an image processing program, in which the imaging device includes the image pickup device, the obtaining unit, and the creating unit, and the image processing program may make the computer function as the detecting unit and the estimating unit.

Abstract: A defect pixel correction circuit that can easily determine a defect of an image sensor that has the defect that ranges to one direction and replace with the correcting pixel is provided. The defect pixel correction circuit 1 includes: a defect pixel determination unit 10 configured to determine whether a noteworthy pixel oo is a defect pixel referring to a referring pixels ko, mo, qo and so that excludes the noteworthy pixel oo, the referring pixels centering on the noteworthy pixel oo and lining up in one direction; and a defect pixel correcting unit 20 configured to generate a correcting pixel value on the basis of the referring pixels mo and qo, and replace the noteworthy pixel value that is pixel value of the noteworthy pixel oo with the correcting pixel value, when the noteworthy pixel oo is a defect pixel.

Abstract: Systems and methods for reconstructing pixel values at bad (i.e. fully or partially defective, saturated, and/or non-responsive in one or more spectral bands) pixel locations in multi-spectral photo-detectors are provided herein. A detector having pixel locations responsive in two or more spectral bands may have pixel values at bad pixel locations reconstructed from adjacent pixel location band ratios so long as the bad pixel location is operational/responsive in at least one spectral band. Pixel locations may be two (or more) color pixels, stacked FPAs, “virtual” locations created by mapping pixels in a first detector to pixels in a second detector, or “super pixels” defined on a detector with a patterned band-pass filter.

Abstract: An image pickup apparatus includes: an image pickup element having a plurality of pixels; a drive unit moving the image pickup element; a defective position storage unit storing position data on the image pickup element about a defective pixel contained in the plurality of pixels; an image extraction unit extracting a moving picture regeneration area depending on the position of the image pickup element during capturing an image from a captured image obtained by the image pickup element; and a defect correction unit complementing a defective pixel of a captured image obtained by the image pickup element using image data of captured image obtained by the image pickup element in another position. Moving pictures are formed by continuously outputting captured images in the moving picture regeneration area for which the defect correction unit has complemented the defective pixel.

Abstract: A digital image system identifies defective pixels of a digital image sensor based on sensor values of pixels positioned in at least two dimensions on the digital image sensor. The exemplary imaging system includes a buffer for receiving sensor values that are each associated with a pixel in the digital image sensor and electronics for comparing the sensor value associated with a test pixel to the sensor values of pixels positioned in at least two dimensions on the digital image sensor. The electronics determines whether the test pixel is a defective pixel based on the comparison.

Abstract: A column circuitry architecture for an imager includes redundant column or row circuits. The column or row circuitry includes a number of redundant column or row circuits. Each column or row circuit include circuitry for controllably coupling the column or row circuit to one of plural signal lines from an array of pixels. A control mechanism is used to select a configuration of plural column or row circuits in the column or row circuitry. In this manner, some column or row circuits are decoupled from the pixel in favor of other column or row circuits. The decoupled column or row circuits may include defective or noisy circuits.

Abstract: An imaging apparatus is provided, which improves correction accuracy at the time of pixel addition reading and scarcely deteriorates in resolution of the image data. This apparatus comprises: a conversion unit comprising a plurality of unit-pixels and converting an incident radiation or a light into pixel information; a signal processing unit capable of reading the pixel information for each unit-pixel, or capable of reading additional added pixel information for a plurality of unit-pixels, based on a control from a control unit for controlling a driving of the conversion unit according to a plurality of operation modes; a storage unit for storing a plurality of correction informations according to the plurality of operating modes; and a correction unit for performing the correction of the pixel information based on the correction information extracted from the plurality of correct informations according to the operation mode.

Abstract: An image capturing system includes a signal correction unit which corrects a signal output from a defective pixel in an optical black region based on a signal output from a normal pixel. The optical black region has a plurality of pixel blocks. Each of the plurality of pixel blocks has a plurality of pixels each including one or more elements which have the same functions as in the remaining pixels and which have relative positions different from the remaining pixels. The signal correction unit corrects the signal output from the defective pixel in the optical black region based on a signal output from a normal pixel which is included in another pixel block different from the pixel block of the defective pixel in the optical black region and includes one or more elements having the same functions and same relative positions as in the defective pixel.

Abstract: A system for detecting blemishes on an image sensor package includes an initialization module configured for initializing a suspected blemish standard mean value range and a blemish standard deviation value; an image capturing module configured for capturing an image produced by the image sensor package and acquiring a brightness value of each of pixels of the image; a calculation module configured for calculating a mean value and a standard deviation of differences of brightness values of a pixel and any other pixels surrounding the pixel; a comparison module configured for respectively comparing the mean value and the standard deviation with the suspected blemish standard mean value range and the blemish standard deviation value; and a marking module configured for marking the suspected blemish which is inside the suspected blemish standard mean value range and the blemish which is larger than the blemish standard deviation value.

Abstract: A method and associated architecture for dividing column readout circuitry in an active pixel sensor in a manner which reduces the parasitic capacitance on the readout line. In a preferred implementation, column readout circuits are grouped in blocks and provided with block signaling. Accordingly, only column output circuits in a selected block significantly impart a parasitic capacitance effect on shared column readout lines. Block signaling allows increasing pixel readout rate while maintaining a constant frame rate for utility in large format high-speed imaging applications.

Abstract: A method and associated architecture for dividing column readout circuitry in an active pixel sensor in a manner which reduces the parasitic capacitance on the readout line. In a preferred implementation, column readout circuits are grouped in blocks and provided with block signaling. Accordingly, only column output circuits in a selected block significantly impart a parasitic capacitance effect on shared column readout lines. Block signaling allows increasing pixel readout rate while maintaining a constant frame rate for utility in large format high-speed imaging applications.

Abstract: The first array register stores neighboring pixels of the same color as the pixel of interest, which are sorted according to the size of the pixel value. The maximum signal comparison circuit compares the value obtained by adding the threshold ThB to the pixel value maxC, which is the (b1)th largest pixel value of the pixels in the first array register and the pixel value P22 of the pixel of interest. When the comparison shows that the pixel value of the pixel of interest P22 is larger, the pixel of interest P22 is determined to be noise, and the pixel value of the pixel of interest is replaced by maxC. The limit signal comparison circuit compares the pixel value P22 of the pixel of interest and the signal upper limit LB. When the comparison shows that P22 is larger than LB and is equal to or larger than maxC, only the pixel of interest is determined to be totally overexposed, and the pixel value of the pixel of interest is replaced by maxC.

Abstract: An opening is made in a surface intercepting a wave propagating through space. An image of an object is formed on an intermediate surface from the wave passing through this opening. After wave conversion, that is to say, after the entity of a wave is converted into a detectable wave from which a two-dimensional image can be picked up, an image is picked up with a two-dimensional image pick-up device. Distortion caused by the two-dimensional image pick-up device is corrected using a calibration grid pattern provided on the intermediate surface. The intermediate surface provides a wave converting function, distortion calibrating function, distortion-free wide field of view ensuring function, and wave entity converting function, and a place of detection elements themselves.

Abstract: A defective pixel specifying method and a defective pixel specifying system for a semiconductor device having a defective pixel are provided. Also provided are an image correcting method and an image correcting system for making a defective pixel inconspicuous on the screen when a read image is displayed. The present invention determines whether or not there is a defective pixel for each pixel and specifies the coordinate of the defective pixel using image signals obtained by reading a plurality of images. The image signal of the defective pixel is set based on the image signals of the pixels adjacent to the defective pixel to correct the image of the subject read.

Abstract: A method of processing images from an imaging device corrects defective pixels in an image acquired with the imaging device. The method includes a step of acquiring position information about continuous defective pixels from the position information about the defective pixels, a first correcting step of correcting the defective pixels with at least one normal pixel adjacent at least one defective pixels based on the position information about the defective pixels and a second correcting step of correcting the continuous defective pixels with a plurality of normal pixels adjacent at least one continuous defective pixels based on the position information about the continuous defective pixels. The second correcting step relies upon a greater number of normal pixels than the first correcting step to correct the defective pixels in a higher precision than the first correcting step.