For Flaws Or Imperfections Patents (Class 356/430)
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Patent number: 12174151Abstract: A moving inspection device capable of realizing significant size reduction/weight reduction without affecting the inspection performance for an inspection target, a moving inspection method, and a method for manufacturing a steel material. A moving inspection device includes: a moving inspection device body configured to inspect an inspection target for defects while moving over a surface of the inspection target; and water supply devices separate from the body and configured to supply water required for the inspection onto the surface of the inspection target. The body is installed with a flow adjustment plate configured to push out the water supplied onto the surface of the inspection target from the water supply devices in the advancing direction and form streamlines for supplying the water between inspection sensors configured to inspect the inspection target for defects and the surface of the inspection target simultaneously with the movement of the body.Type: GrantFiled: September 15, 2020Date of Patent: December 24, 2024Assignee: JFE STEEL CORPORATIONInventors: Masaki Kobayashi, Koji Yamashita, Kouyou Miyawaki
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Patent number: 11748873Abstract: A product defect detection method, device and system are disclosed. The product defect detection method comprises: constructing a defect detection framework including a classification network, a locating detection network and a judgment network; training the classification network by using a sample image of a product containing different defect types to obtain a classification network capable of classifying the defect types existing in the sample image; training the locating detection network by using a sample image of a product containing different defect types to obtain a locating detection network capable of locating a position of each type of defect in the sample image; inputting an acquired product image into the defect detection framework, inputting a classification result and a detection result obtained into the judgment network to judge whether the product has a defect, and detecting a defect type and a defect position when the product has a defect.Type: GrantFiled: August 26, 2020Date of Patent: September 5, 2023Assignee: GOERTEK INC.Inventors: Jie Liu, Li Ma, Liang Zhang
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Patent number: 11709110Abstract: Method for detecting a defect in a zone of interest of an optical lens, the method including: an image reception step, during which a plurality of images is received, each image includes a view of the zone of interest in front of a plurality of specific patterns, each specific pattern including a bright area and a dark area, and at least one image received is saturated in light intensity; a sampling step, during which each image of the plurality of images are sampled based on a common sampling pattern; a recombination step, during which a recombined image of the zone of interest is determined based on the common sampling pattern; and a defect detection step, during which a defect is detected in the zone of interest of the optical lens based on an analysis of the recombined image.Type: GrantFiled: June 21, 2019Date of Patent: July 25, 2023Assignee: Essilor InternationalInventor: Cédric Lemaire
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Patent number: 11211092Abstract: A magnetic tape device (100) includes: a winding reel (101) winding a magnetic tape (201); a drive head (103) performing writing information onto the magnetic tape (201) and/or reading the information recorded on the magnetic tape (201); an image sensor (104) picking up an image of a surface of the magnetic tape (201); and a control unit (105) performing image processing on the image picked up the image sensor (104) and determining presence/absence of an abnormality on the surface of the magnetic tape (201), in which the control unit (105) adjusts, in accordance with at least either one of a type of the drive head (103) and a recording density of the magnetic tape (201), a winding speed at which the magnetic tape (201) is wound by the winding reel (101) when the image sensor (104) picks up the image of the surface of the magnetic tape (201).Type: GrantFiled: March 13, 2019Date of Patent: December 28, 2021Assignee: NEC Platforms, Ltd.Inventor: Mitsunori Suzuki
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Patent number: 11169026Abstract: A measurement system includes an optical probe that has a reflective prism structure, an input system, and an output system. The reflective prism structure comprises at least two mirrored surfaces on opposing sides of an axis which extends in a direction towards a target. The input system is positioned to receive and direct source light towards one of the mirrored surfaces which is positioned to reflect the source light towards the target. The output system is positioned to receive and output converging light from reflected light that comprises measurement data related to the target. The reflected light is the source light reflected from the target via the other one of the mirrored surfaces and is without substantial overlap with the source light.Type: GrantFiled: November 27, 2019Date of Patent: November 9, 2021Assignee: MUNRO DESIGN & TECHNOLOGIES, LLCInventor: James F. Munro
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Patent number: 11150201Abstract: The present disclosure relates to a system and a method of detecting a defect of an optical film, and more particularly, to a system and a method of detecting a defect of an optical film, which obtain an image of a defect of an optical film projected onto a screen and detect the defect of the optical film. As an exemplary embodiment of the present disclosure, a system for detecting a defect of an optical film may be provided.Type: GrantFiled: March 23, 2017Date of Patent: October 19, 2021Assignee: SHANJIN OPTOELECTRONICS (SUZHOU) CO., LTD.Inventors: Ho Jin Kim, Myoung Gon Yang, Chang Seok Park, Je Hyun Kim, Hang Suk Choi
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Patent number: 11132726Abstract: Methods of allowing a customer to access information related to an order of a commodity include gathering inspection information from a commodity lot, collecting grower, field, and packing information associated with the commodity lot, recording purchase orders associated with the commodity lot, assigning a trace code to each of the purchase orders, entering the inspection information; the grower, field, and packing information; the purchase orders; and the trace codes into a database maintained through online accounts. Many members of a supply chain are entitled to accounts that are linked, each account being given limited access to other accounts, thereby allowing the customer to access the inspection information, and the grower, field, and packing information, by entering one of the trace codes into the web-based application. According to one exemplary embodiment, each of the purchase orders associated with the commodity lot is linked within the web-based application.Type: GrantFiled: July 3, 2019Date of Patent: September 28, 2021Assignee: Trace Produce, LLCInventors: James G. Farmer, Charles W. Farmer, Joseph W. Farmer
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Patent number: 11124379Abstract: A method of producing a film is provided. The method involves a winding step including a point-of-interest detecting step including detecting a point-of-interest on the film, a number-of-turns counting step including counting the number of turns of the film wound around a winding core, and a number-of-turns storing step including storing, in association with the number of turns of the film wound around the winding core, a position of the point-of-interest in a direction of transfer of the film. The method eliminates the need for a step of printing on a film for the purpose of locating a point-of-interest on the film.Type: GrantFiled: February 21, 2019Date of Patent: September 21, 2021Assignee: SUMITOMO CHEMICAL COMPANY, LIMITEDInventor: Koji Kashu
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Patent number: 11120182Abstract: A hot spot methodology incorporates wafer physical measurement with digital simulation for identifying and monitoring critical hot spots. Wafer physical data are collected from the processed wafer of the semiconductor device on a plurality of target locations. Hot spot candidates and corresponding simulation data are generated by digital simulation based on models and verifications of optical proximity and lithographic process correction according to the design data of a semiconductor device. Data analytics provides data correlation between the collected wafer physical data and the simulation data. Data analytics further performs data correction on the simulation data according to the wafer physical data that have best correlation with the simulation data to better predict critical hot spots.Type: GrantFiled: July 30, 2019Date of Patent: September 14, 2021Assignee: APPLIED MATERIALS, INC.Inventors: Jason Zse-cherng Lin, Shauh-Teh Juang
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Patent number: 10891746Abstract: A three-dimensional geometry measurement apparatus includes: a projection part that projects a projection image onto an object to be measured; an image capturing part that generates a captured image by capturing the object to be measured on which the projection image is projected; a relationship identification part that identifies a projection pixel position having correspondence with a captured pixel position; and a defective pixel determination part that determines whether the pixel at the captured pixel position is a defective pixel on the basis of a positional relationship between a projection light beam starting from the projection part and passing through the pixel at the projection pixel position and a captured light beam starting from the image capturing part and passing through the pixel at the captured pixel position having correspondence.Type: GrantFiled: August 29, 2019Date of Patent: January 12, 2021Assignee: MITUTOYO CORPORATIONInventor: Kaoru Miyata
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Patent number: 10594965Abstract: An electronic device may include an array of pixels. Each pixel may include a first single photon avalanche photodiode circuit that generates a first output signal on a first conductive line, a second avalanche photodiode circuit that generates a second output signal on a second conductive line, and a logic NAND gate having a first input coupled to the first conductive line, a second input coupled to the second conductive line, and an output coupled to an output line. The logic NAND gate may generate a third output signal based on the first and second output signals that is independent of dark current generated by the avalanche photodiodes. The third output signal may be processed to generate range values that are further processed to generate three-dimensional images of a scene.Type: GrantFiled: September 13, 2017Date of Patent: March 17, 2020Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLCInventor: Minseok Oh
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Patent number: 10432140Abstract: The invention relates to a method for testing a concentrated photovoltaic module comprising a plurality of sub-modules, each containing a plurality of assemblies of a photovoltaic cell and of a concentrator arranged relative to the cell in order to concentrate on the cell radiation arriving at normal incidence, in which: a plurality of almost collimated light beams are transmitted toward the module by means of a plurality of light sources coupled to respective parabolic mirrors, each light source comprising a lamp suitable for emitting a light pulse and a supply device suitable for electrically supplying the lamp, there being a turn-on delay between the triggering of the supply device and the emission of the pulse, and the supply device of each lamp is triggered at a respective instant set depending on the turn-on delay of the lamp so that the pulses of all the lamps are emitted simultaneously and received simultaneously by the sub-modules.Type: GrantFiled: November 14, 2014Date of Patent: October 1, 2019Assignee: Saint-Augustin Canada Electric Inc.Inventors: Remi Blanchard, Philippe Gastaldo
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Patent number: 10302488Abstract: An optical slit device that combines microelectromechanical design techniques, semiconductor laser technology, and micro-optics to provide a spectrometer entrance slit on a semiconductor substrate with integrated calibration light sources, which integrated light enters the entrance slit and is transmitted down the same optical path as a light source under test and by which the spectrometer can be wavelength calibrated in situ is disclosed.Type: GrantFiled: May 17, 2018Date of Patent: May 28, 2019Assignee: Ocean Optics, Inc.Inventor: Kirk Clendinning
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Patent number: 9933373Abstract: A glass sheet acquisition and positioning mechanism and associated method are utilized in an in-line glass sheet optical inspection system. The mechanism includes an exterior support frame mounted in proximity to one of the glass sheet processing system conveyors, and an interior support frame operably connected to the exterior support frame such that the interior support frame may be selectively positioned from its first orientation to a second orientation whereby the retained glass sheet is positioned between the camera and the screen at a preselected position. The interior support frame is also operably connected to the exterior support frame to provide for positioning of the interior support frame to a third orientation in which the glass sheet is released from the interior support frame for continued movement on the conveyor. An in-line glass sheet optical inspection system incorporating the glass sheet acquisition and positioning mechanism is also disclosed.Type: GrantFiled: April 29, 2014Date of Patent: April 3, 2018Assignee: GLASSTECH, INC.Inventors: Michael J. Vild, Stephen D. Snyder, Jr.
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Patent number: 9898074Abstract: Mapping apparatus includes a transmitter, which emits a beam comprising pulses of light, and a scanner, which is configured to scan the beam, within a predefined scan range, over a scene. A receiver receives the light reflected from the scene and to generate an output indicative of a time of flight of the pulses to and from points in the scene. A processor is coupled to control the scanner so as to cause the beam to scan over a selected window within the scan range and to process the output of the receiver so as to generate a 3D map of a part of the scene that is within the selected window.Type: GrantFiled: March 30, 2017Date of Patent: February 20, 2018Assignee: APPLE INC.Inventors: Alexander Shpunt, Raviv Erlich
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Patent number: 9620046Abstract: A method of detecting a defect in an organic light-emitting display device includes: preparing an organic light-emitting display device including an organic light-emitting display panel which includes a plurality of pixels, where each of the pixels includes a driving transistor which operates in a saturation region or a transition region based on a potential difference between a source and a drain thereof and outputs a driving current, and an organic light-emitting diode which emits light based on the driving current; providing a plurality of voltages to the organic light-emitting display panel to operate the driving transistor in the transition region, and determining whether the organic light-emitting display device is defective based on an image, which is displayed on the organic light-emitting display panel based on data applied thereto.Type: GrantFiled: August 22, 2014Date of Patent: April 11, 2017Assignee: SAMSUNG DISPLAY CO. LTD.Inventor: Bong Sub Song
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Patent number: 9224197Abstract: A system and method are provided for employing a unique optical roll scanning technique, scheme or process for detecting and identifying periodic surface defects associated with rolls usable in image production devices. An apparatus is provided for mounting the roll to implement an inspection technique that facilitates forming an image of a surface of the roll by rotating the roll through an entire cycle above a full width scanner device. The formed image of the surface of the scanned roll is filtered and analyzed particularly by applying a Fourier analysis technique, and/or by subjecting the filtered image data to a series of fast Fourier transforms (FFTs), potentially including 2D FFTs. The analysis process allows detected periodic defects in the formed image of the surface of the roll under analysis to be characterized by a magnitude of a response in a spatial frequency domain.Type: GrantFiled: November 12, 2013Date of Patent: December 29, 2015Assignee: Xerox CorporationInventor: Christopher Jensen
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Patent number: 9194831Abstract: A thermographic test method locally resolves detection and identification of defects near the surface in a test object. A surface area of the test object is heated up. A series of thermographic images following one after another at a time interval is recorded within a heat propagation phase, each image representing a local temperature distribution in a surface region of the test object recorded by the image. Positionally correctly assigned temperature profiles are determined from the images, each positionally correctly assigned temperature profile being assigned to the same measuring region of the test object surface. Variations over time of temperature values are determined from the temperature profiles for a large number of measuring positions of the measuring region. These variations are evaluated on the basis of at least one evaluation criterion indicative of the heat flow in the measuring region.Type: GrantFiled: April 7, 2011Date of Patent: November 24, 2015Assignee: Institut Dr. Foerster GmbH & Co. KGInventors: Gerhard Traxler, Werner Palfinger
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Patent number: 9019500Abstract: A system for differentiating between oil spots and non-oil spots in a wrapped article comprising a web and a wrapped material. The system includes a heat source that applies heat to a wrapped article for a predetermined amount of time when the wrapped article is placed in a sample area on a surface that is arranged at a predetermined distance away from a heating element of the heat source; and a light source that provides backlighting to the web of the wrapped article when the web has been separated from the wrapped material and placed on a viewing surface of the light source. A method for differentiating between oil spots and non-oil spots in wrapped articles and a field test kit are also provided.Type: GrantFiled: December 28, 2012Date of Patent: April 28, 2015Assignee: Altria Client Services Inc.Inventors: Narendra K. Meruva, Christopher B. McFarlane, Jennifer H. Smith
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Patent number: 9013697Abstract: A band detection sensor includes LEDs configured to radiate detection light onto one side of a web, photodiodes configured to receive the detection light reflected by the web and output a detection signal corresponding to the detection light, and a discrimination section configured to discriminate bands on the web on the basis of the detection signal from the photodiodes, wherein the discrimination section includes a rise discriminating criterion indicating a rate of rise of the detection signal and generates a band signal indicative of the presence of a band when change of the detection signal fulfills the rise discriminating criterion.Type: GrantFiled: February 12, 2014Date of Patent: April 21, 2015Assignee: Japan Tobacco Inc.Inventors: Shinzo Kida, Takafumi Izumiya
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Patent number: 8760667Abstract: The present invention relates to a method and a device for the detection of a substrate edge in a printing machine comprising a substrate transport unit that defines a substrate transport path (8). In this method, at least one light value of a first section of a sensor line (10) and a dark value of a second section of the sensor line are determined, and a threshold value is calculated based thereon. When the threshold value on one pixel is exceeded and the threshold value on another pixel is not reached, it is possible to calculate a position of the substrate edge. The device comprises a light source arrangement (5) for generating diffuse light, and comprises a sensor line for the detection of light from the light source arrangement.Type: GrantFiled: April 15, 2010Date of Patent: June 24, 2014Assignee: Eastman Kodak CompanyInventors: Thomas Jacobsen, Wolfgang Kuphaldt, Joerg Zessin
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Patent number: 8654333Abstract: A surface inspection apparatus includes a light source for applying a detection laser beam to a film sample. A light receiver has plural photomultiplier tubes arranged in a width direction of the film sample, for receiving output light reflected by the film sample. A defect detector detects a defect on the film sample according to an output signal output by each of the photomultiplier tubes. A sensitivity corrector sets sensitivity of the photomultiplier tubes to process an output of the light receiver for output noise suppression. Specifically, the sensitivity corrector determines a set sensitivity of the photomultiplier tubes by correcting a sensitivity characteristic thereof for abnormality detection, to keep a sensitivity difference between the photomultiplier tubes as small as a predetermined value or less. Furthermore, plural light valves upstream from the light receivers are controlled by the sensitivity corrector for their transmittance.Type: GrantFiled: March 24, 2011Date of Patent: February 18, 2014Assignee: Fujifilm CorporationInventors: Bungo Shigeta, Ippei Takahashi
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Patent number: 8593635Abstract: Web supports (30, 32, 34, 36, 38, 330, 332, 334, 336, 338, 340) form a first web path (46, 48, 346, 348) in which a web is presented opposite to a camera (26, 326) and an alternative second web path (46, 48, 346, 348) in which the web (230) is overturned prior to being presented opposite to the camera (26, 326).Type: GrantFiled: October 1, 2008Date of Patent: November 26, 2013Assignee: Hewlett-Packard Development Company, L.P.Inventors: Paul C. Ray, Madhu Babu, Nadeem E. Khan, Raul A. Sumera, Robert W. Braun
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Patent number: 8506758Abstract: A method for guiding web patching, using a re-reeler, in connection with a paper machine and an off-line coating machine, in which method a defect map of the web is created on the paper machine, to show deviations some of which are shown on the coating machine, using selected criteria, to the operator, the deviations being patched using the re-reeler, guided by the defect map and preset patching rules. On the coating machine, the virtual location of the selected deviations is monitored through the coating machine and if a possible web break occurs, a deviation is localized relative to the web break, and on the basis of this monitoring, feedback is provided to the patching rules of the re-reeler, in order to optimize them.Type: GrantFiled: November 24, 2009Date of Patent: August 13, 2013Assignee: Metso Automation OyInventor: Hannu Ruuska
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Patent number: 8428686Abstract: A system and method for monitoring a physiological parameter includes a garment that includes a fabric that exhibits both a light transmission property and a light reflection property. The amount of light transmitted through the fabric relative to the amount of light reflected by the fabric changes when the fabric stretches in response to motion, such as the motion induced by physiological activity (e.g., heart rate). The system includes at least one source of radiation having wavelength(s) in the range of 400 to 2200 nanometers and at least one detector responsive to such incident radiation. The source and detector are associated with the fabric such that the reception of incident radiation by the detector is directly affected by a change in the amount of light transmitted through the fabric relative to the amount of light reflected by the fabric when the fabric stretches.Type: GrantFiled: April 9, 2010Date of Patent: April 23, 2013Assignee: Textronics, Inc.Inventors: Chia Kuo, George W. Coulston
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Patent number: 8405831Abstract: Methods and systems for indicating the displacement of a flexible web are described. An elongated, flexible web includes an integral scale having scale features configured to modulate energy directed towards the web. A transport mechanism provides relative movement between the web relative to a transducer. The transducer detects energy modulated by the scale features and generates a signal indicting a continuous web displacement based on the modulated energy.Type: GrantFiled: June 18, 2008Date of Patent: March 26, 2013Assignee: 3M Innovative Properties CompanyInventors: Daniel H. Carlson, Dale L. Ehnes, Daniel S. Wertz, Luis A. Aguirre, Levent Biyikli, Alan B. Campbell
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Patent number: 8345246Abstract: A running yarn line inspection method inspects yarn lines running in parallel in the same surface. The running yarn line inspection method is provided with a first illumination means and a line sensor for imaging the yarn lines on the side of the first surface of the running surface of the yarn lines and a second illumination means on the side of the second surface, and comprises a data processing means which processes data obtained by the line sensor and a recording means which records data processed by the data processing means with time.Type: GrantFiled: April 25, 2008Date of Patent: January 1, 2013Assignee: Toray Industries, Inc.Inventors: Kazuhisa Miyahara, Kouji Kagitani, Hiroki Nakajima
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Patent number: 8145291Abstract: A garment and system includes a monitoring fabric that exhibits a light reflection property and substantially no light transmission property when the fabric is illuminated with light having wavelength(s) in the range of 400 to 2200 nanometers. The amount of useful light reflected by the fabric into an aperture of acceptance defined with respect to an imaginary axis extending from the fabric relative to the amount of light lost to the aperture of acceptance detectably changes when the fabric stretches in response to motion, as the motion induced by physiological activity (e.g., heart rate). The system includes at least one radiation source and at least one radiation detector, with the detector disposed in the aperture of acceptance.Type: GrantFiled: March 30, 2010Date of Patent: March 27, 2012Assignee: Textronics, Inc.Inventor: George W. Coulston
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Patent number: 8131008Abstract: Methods, apparatuses, and systems for image-based measurement and inspection of pre-engineered structural components, such as building trusses and wall panels. A system can include: a light source; a camera; a first memory storage; a second memory storage; and a processing unit configured to (i) detect a characteristic of the structural component, (ii) compare the characteristic to a corresponding characteristic of at least one reference data, and (iii) indicate a result of the comparison. A method can include: causing a light source to illuminate a portion of the structural component, receiving a reflection of the light source from the illuminated portion of the structural component, and storing data corresponding to the intensity of the reflection; comparing the stored data to at least one reference data; and indicating a result of the comparison.Type: GrantFiled: January 30, 2008Date of Patent: March 6, 2012Assignee: Building Component Verification Systems, Inc.Inventors: Cyril Robert Thompson, Steven Corley
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Patent number: 8115929Abstract: A system for detecting the lateral movement of thread includes an optical device configured to emit an optical signal. The optical device includes a resonant cavity. The system further includes a driver configured to drive the optical signal. A mechanical guide is configured to receive a moving thread that scatters the optical signal such that a portion of the optical signal is reflected back into the resonant cavity of the optical device; causing a change in the optical signal. An optical detector is configured to detect the changed optical signal. Lateral movement detection circuitry is configured to detect lateral movements such as vibrations.Type: GrantFiled: November 26, 2008Date of Patent: February 14, 2012Assignee: Finisar CorporationInventors: Jimmy A. Tatum, James K. Guenter, Andre Lalonde
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Patent number: 8078307Abstract: A defect testing apparatus for testing defects of optical film sheet-shaped product of an optical displaying apparatus, which includes a defect detecting means for detecting defects of a monolayer body and/or a laminate body constituting the sheet-shaped product in a state in which a protective layer on a surface of the sheet-shaped product is not disposed and defect information preparing means for preparing defect information which is information related to the defects detected by the defect detecting means, and the defect information is used for producing the sheet-shaped product provided in a roll form or in separate sheets.Type: GrantFiled: November 10, 2010Date of Patent: December 13, 2011Assignee: Nitto Denko CorporationInventor: Hiromichi Ohashi
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Patent number: 8069859Abstract: A wrapping paper inspection apparatus includes a nozzle arranged in a wrapping-paper discharge path, in which wrapping paper is wound and continuously discharged, for wetting one side of the wrapping paper with a liquid; an image pickup section for irradiating light to the wrapping paper wetted with the liquid by the nozzle, detecting light transmitted through or reflected from the wrapping paper, and generating an image signal; and a wrapping paper inspection section for determining defects in wrapping paper portions applied or affixed with a low flame spread material, from the image signal generated by the image pickup section, to thereby inspect such defects easily and reliably. This inspection apparatus can be mounted to a tobacco wrapping machine.Type: GrantFiled: June 15, 2005Date of Patent: December 6, 2011Assignee: Japan Tobacco Inc.Inventors: Keisuke Minami, Tsuyoshi Futamura
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Publication number: 20110242537Abstract: A surface inspection apparatus includes a light source for applying a detection laser beam to a film sample. A light receiver has plural photomultiplier tubes arranged in a width direction of the film sample, for receiving output light reflected by the film sample. A defect detector detects a defect on the film sample according to an output signal output by each of the photomultiplier tubes. A sensitivity corrector sets sensitivity of the photomultiplier tubes to process an output of the light receiver for output noise suppression. Specifically, the sensitivity corrector determines a set sensitivity of the photomultiplier tubes by correcting a sensitivity characteristic thereof for abnormality detection, to keep a sensitivity difference between the photomultiplier tubes as small as a predetermined value or less. Furthermore, plural light valves upstream from the light receivers are controlled by the sensitivity corrector for their transmittance.Type: ApplicationFiled: March 24, 2011Publication date: October 6, 2011Applicant: FUJIFILM CORPORATIONInventors: BUNGO SHIGETA, IPPEI TAKAHASHI
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Patent number: 7989769Abstract: Thermographic imaging equipment is incorporated directly into cabinets housing electrical switchgear to provide for dedicated, nearly continuous monitoring of the contained equipment. A mechanical scanning technique may allow low-cost sensors to provide essentially continuous thermographic monitoring. Dedicated thermal imaging equipment allows automatic analysis through predefined temperature threshold maps.Type: GrantFiled: August 21, 2008Date of Patent: August 2, 2011Assignee: Rockwell Automation Technologies, Inc.Inventors: David D. Brandt, David L. Jensen
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Patent number: 7986410Abstract: This invention relates to a method for detecting a tear in a fibrous web in a drying section of a machine for producing the fibrous web, whereby the fibrous web is passed through the drying section by way of at least one dryer fabric, whereby the tear is detected by at least one optical web tear detection device, which includes at least one luminous source and one detector, and whereby a cut-off apparatus for the fibrous web is directly or indirectly activated by the web tear detection device. The optical web tear detection device is operated over an extended wave length range in order to detect a tear in the fibrous web reliably. In addition, the invention relates to an apparatus for performing the inventive method.Type: GrantFiled: March 18, 2008Date of Patent: July 26, 2011Assignee: Voith Patent GmbHInventors: Armin Bauer, Dietmar Üblacker
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Patent number: 7978328Abstract: A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course material. The line generator generates a line of illumination across the area. The sensor captures an image of the area. The image processor analyzes the image. The image processor is configured to identify debris on the course material in response to the area light being activated and the image processor is configured to identify placement aberrations in response to the line generator being activated.Type: GrantFiled: April 22, 2008Date of Patent: July 12, 2011Assignee: The Boeing CompanyInventors: Roger W. Engelbart, Reed Hannebaum, Tim Pollock
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Patent number: 7901096Abstract: The invention is directed to a method for illuminating an object and projecting its image on a ground glass screen. Optical comparators conventionally use incandescent illumination, either mercury arc or halogen. The use of an array of high intensity LED devices, provides many options for packaging the required optical components used in comparators.Type: GrantFiled: July 16, 2007Date of Patent: March 8, 2011Assignee: Dorsey Metrology InternationalInventor: Peter Donald Klepp
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Patent number: 7889907Abstract: A system for inspecting a composite material laid onto a substrate by a lamination machine. An imaging assembly attached to a rear portion of a delivery head of the machine obtains an image of at least a portion of the laid material beneath the imaging assembly. A processor inspects the image to detect a flaw. This system can provide an image of laid tape obtained close to a tape compaction point and can be implemented as a retrofit or as original equipment in lamination machines.Type: GrantFiled: January 12, 2005Date of Patent: February 15, 2011Assignee: The Boeing CompanyInventors: Roger W Engelbart, Reed Hannebaum, Brian S Hensley, Timothy T Pollock, Samuel D Orr
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Patent number: 7847943Abstract: A sensor is provided that measures web caliper using optical and magnetic measuring devices. The optical measuring devices may employ a confocal chromatic aberration method to accurately determine the distance to the moving web and the magnetic devices may be ferrite core coil and target. Means of stabilizing a moving web are included for improving dynamic measurement accuracy.Type: GrantFiled: August 28, 2008Date of Patent: December 7, 2010Assignee: ABB Ltd.Inventors: Ake Hellstrom, Rambod Naimi, Michael O'Hora
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Patent number: 7839547Abstract: An inspection apparatus includes a light source unit which irradiates illumination light onto a hologram of a medium from a predetermined direction at which diffraction light from the hologram is obtained, a first light receiving member which receives the diffraction light from the hologram, a second light receiving member which receives transmitted part of illumination light irradiated onto the hologram, having passed through the medium, and an identification processing unit which identifies authenticity of the hologram from the diffraction light received by the first light receiving member and identifies a defect of the hologram from the transmitted light received by the second light receiving member.Type: GrantFiled: March 6, 2007Date of Patent: November 23, 2010Assignee: Kabushiki Kaisha ToshibaInventors: Junji Miura, Takahisa Nakano
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Patent number: 7783103Abstract: A defect detecting device includes: a block generating section dividing an inspection image in which a defective region will be detected into a plurality of blocks; an intra-block sum calculating section calculating an intra-block sum for each of the blocks generated by the block generating section, the intra-block sum being a sum of pixel data for pixels in that block; and a statistical processing section and a defect determining section determining whether there exists a defective region by determining through statistical processing whether the intra-block sums have an outlier. Accordingly, the device determines whether there is a defective region in a digital image quickly and using small circuitry.Type: GrantFiled: September 26, 2006Date of Patent: August 24, 2010Assignee: Sharp Kabushiki KaishaInventors: Toshimasa Kuchii, Hideyuki Ichihara
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Patent number: 7773225Abstract: A device for the optical analysis, including two-dimensional, of a thread or yarn (F) fed to a textile machine, said device comprising at least one light emitter element (3, 4) and at least one receiver element (5), said emitter element (3, 4) generating a light signal which strikes said thread (F) before being sensed by the receiver element (5) which, based on this sensing, defines a characteristic of the thread (F) such as its movement or its stoppage, a dimensional defect or another dimensional characteristic, between said light emitter element (3, 4) and said receiver element (5), there being interposed light transparent means (6) which are encountered by the light signal after it has interacted with the thread (F), and which act as a thread guide.Type: GrantFiled: January 27, 2005Date of Patent: August 10, 2010Inventor: Tiziano Barea
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Patent number: 7755749Abstract: An apparatus inspecting a superconducting wire includes: a blue LED emitting light in a direction normal to a front surface of a superconducting wire to illuminate the front surface; a red LED emitting light in a direction forming an angle with the direction normal to the front surface of the superconducting wire to illuminate the front surface; a color line sensor mainly receiving light reflected by the superconducting wire, and mainly receiving light diffused by the superconducting wire; and a computer accumulating and outputting a quantity of light received by the color line sensor. The apparatus can inspect with high sensitivity whether the superconducting wire has a defect or not.Type: GrantFiled: April 6, 2006Date of Patent: July 13, 2010Assignee: Sumitomo Electric Industries, Ltd.Inventors: Shinichi Kobayashi, Noritsugu Hamada
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Patent number: 7746463Abstract: Disclosed are an apparatus for inspecting defect of a rubbing cloth and a rubbing apparatus with the same. The apparatus for inspecting defect of the rubbing cloth includes a housing surrounding the periphery of the rubbing cloth, a transfer unit connected to the upper portion of the housing for transferring the housing along a length direction of a rubbing roll, an illumination unit installed at one side in the housing for illuminating the rubbing cloth, and a camera unit installed at the other side in the housing to correspond to the illumination unit on the basis of the rubbing roll. The apparatus for inspecting defect of the rubbing cloth can rapidly and precisely detect the defect of the rubbing cloth by using the illumination unit and the camera unit.Type: GrantFiled: December 15, 2006Date of Patent: June 29, 2010Assignee: LG Display Co., Ltd.Inventor: Yong-Chul Yoo
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Publication number: 20100157301Abstract: A running yarn line inspection method inspects yarn lines running in parallel in the same surface. The running yarn line inspection method is provided with a first illumination means and a line sensor for imaging the yarn lines on the side of the first surface of the running surface of the yarn lines and a second illumination means on the side of the second surface, and comprises a data processing means which processes data obtained by the line sensor and a recording means which records data processed by the data processing means with time.Type: ApplicationFiled: April 25, 2008Publication date: June 24, 2010Applicant: Toray Industries ,Inc.Inventors: Kazuhisa Miyahara, Kouji Kagitani, Hiroki Nakajima
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Patent number: 7725152Abstract: A garment and system includes a monitoring fabric comprising a first plurality of reflective yarns knitted or woven with a second plurality of stretchable yarns. The fabric exhibits both a light transmission property and a light reflection property. The amount of light transmitted through the fabric relative to the amount of light reflected by the fabric changes when the fabric stretches in response to motion, such as the motion induced by physiological activity (e.g., heart rate). The system includes at least one source of radiation having wavelength(s) in the range of 400 to 2200 nanometers and at least one detector responsive to such incident radiation. The source and detector are associated with the fabric such that the reception of incident radiation by the detector is directly affected by a change in the amount of light transmitted through the fabric relative to the amount of light reflected by the fabric when the fabric stretches.Type: GrantFiled: September 9, 2004Date of Patent: May 25, 2010Assignee: Textronics, Inc.Inventors: Chia Chyuan Kuo, George W. Coulston
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Publication number: 20100117010Abstract: The present invention relates to a system for measuring wrinkles on a web in an R2R process. The system includes a laser generation device (100) for projecting a laser beam, emitted in a linear shape, onto a surface of a web (200), which is stopped or moving. A camera (300) captures a band of light, formed when the laser beam generated by the laser generation device (100) is projected onto the surface of the web (200), and transmitting image data of the captured light band. A measurement device (400) calculates coordinates of an arbitrary location on the web (200) on a basis of the image data transmitted from the camera (300), processes an image of the light band on a basis of the calculated coordinates, and displays the processed image. Accordingly, the results of reliable wrinkle measurement are provided for a web in an R2R process.Type: ApplicationFiled: June 20, 2008Publication date: May 13, 2010Applicant: Konkuk University Industrial Cooperation Corp.Inventors: Sung Lim Ko, Dong Keun Shin, Hoang Minh To, Kee Hyun Shin
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Patent number: 7715897Abstract: A garment and system includes a monitoring fabric that exhibits a light reflection property and substantially no light transmission property when the fabric is illuminated with light having wavelength(s) in the range of 400 to 2200 nanometers. The amount of useful light reflected by the fabric into an aperture of acceptance defined with respect to an axis extending from the fabric relative to the amount of light lost to the aperture of acceptance detectably changes when the fabric stretches in response to motion, as the motion induced by physiological activity (e.g., heart rate). The system includes at least one radiation source and at least one radiation detector, with the detector disposed in the aperture of acceptance.Type: GrantFiled: September 9, 2004Date of Patent: May 11, 2010Assignee: Textronics, Inc.Inventor: George W. Coulston
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Patent number: 7684033Abstract: In an apparatus at a spinning preparatory plant for detecting foreign objects, for example, pieces of cloth, tapes, string, pieces of sheeting and the like, in fibre material, the fibre material is transportable in an air flow through a fibre transport duct or a feed chute and an optical sensor system is associated with the duct or chute, the wall surfaces of which have at least one transparent region through which the sensor system detects the fibre-air flow. To permit the at least one transparent region to be kept clean in a simple manner during operation, and to permit an unobstructed detection of the foreign objects, the transparent region projects into the fibre-air flow and the fibre-air flow is able to flow along the transparent region in force-applying contact therewith.Type: GrantFiled: November 29, 2007Date of Patent: March 23, 2010Assignee: Trützschler GmbH & Co. KGInventors: Guido Engels, Franz Nohr, Konrad Temburg
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Publication number: 20100045988Abstract: The invention relates to a method for finding holes, and other related defects and measuring characteristics of sheets of industrial material. Optical detections systems are constantly plagued by intense ambient light and challenged in accuracy. The invention exhibits a defect detection method and means that is resistant to intense ambient light and is capable of inspecting sheets of material (410, 510, 610, 710) continuously, without integration of long periods. In the invention, synchronous detection between the optical transmitters and receivers is utilised. The invention is applicable for inspecting and measuring materials like paper, metal, rubber, plastic, aluminium foil, copper foil, film, coated metal sheet or any other sheet-like material that could run on a production line. The invention is also applicable for finding special defects like holes, pinholes, scratches, spots, cracks, edge faults, streaks, surface faults or any other conceivable defects.Type: ApplicationFiled: August 27, 2009Publication date: February 25, 2010Applicant: SR-INSTRUMENTS OYInventors: Iiro HIETANEN, Heimo Keranen, Seppo Pyorret