Light Scanning Patents (Class 356/629)
  • Patent number: 11789322
    Abstract: According to one embodiment, a display device includes a plurality of red subpixels, a plurality of green subpixels, and a plurality of blue subpixels, wherein, in a first direction, the red subpixel and the green subpixel, the green subpixel and the blue subpixel, and the blue subpixel and the red subpixel are arranged to be adjacent to each other, and in a second direction, the red subpixel and the blue subpixel, the blue subpixel and the green subpixel, and the green subpixel and the red subpixel are arranged to be adjacent to each other, and in the subpixels, as to subpixel columns adjacent to each other, when an image signal of the same gradation is input with respect to the subpixels of same color, brightness of one subpixel column is higher than that of another subpixel column.
    Type: Grant
    Filed: December 30, 2022
    Date of Patent: October 17, 2023
    Assignee: Japan Display Inc.
    Inventors: Kazunari Tomizawa, Tsutomu Harada
  • Patent number: 11573461
    Abstract: According to one embodiment, a display device includes a plurality of red subpixels, a plurality of green subpixels, and a plurality of blue subpixels, wherein, in a first direction, the red subpixel and the green subpixel, the green subpixel and the blue subpixel, and the blue subpixel and the red subpixel are arranged to be adjacent to each other, and in a second direction, the red subpixel and the blue subpixel, the blue subpixel and the green subpixel, and the green subpixel and the red subpixel are arranged to be adjacent to each other, and in the subpixels, as to subpixel columns adjacent to each other, when an image signal of the same gradation is input with respect to the subpixels of same color, brightness of one subpixel column is higher than that of another subpixel column.
    Type: Grant
    Filed: June 22, 2022
    Date of Patent: February 7, 2023
    Assignee: Japan Display Inc.
    Inventors: Kazunari Tomizawa, Tsutomu Harada
  • Patent number: 11402701
    Abstract: According to one embodiment, a display device includes a plurality of red subpixels, a plurality of green subpixels, and a plurality of blue subpixels, wherein, in a first direction, the red subpixel and the green subpixel, the green subpixel and the blue subpixel, and the blue subpixel and the red subpixel are arranged to be adjacent to each other, and in a second direction, the red subpixel and the blue subpixel, the blue subpixel and the green subpixel, and the green subpixel and the red subpixel are arranged to be adjacent to each other, and in the subpixels, as to subpixel columns adjacent to each other, when an image signal of the same gradation is input with respect to the subpixels of same color, brightness of one subpixel column is higher than that of another subpixel column.
    Type: Grant
    Filed: June 1, 2021
    Date of Patent: August 2, 2022
    Assignee: Japan Display Inc.
    Inventors: Kazunari Tomizawa, Tsutomu Harada
  • Patent number: 9880079
    Abstract: The invention relates to a method in the preparation of samples for microscopic examination onto which a coverslip is applied. The method is notable for the fact that the coverslipping quality is checked automatically and at least partly optically. The invention further relates to an apparatus for carrying out the method, and to an apparatus for checking the coverslipping quality of samples onto which a coverslip is applied.
    Type: Grant
    Filed: February 19, 2013
    Date of Patent: January 30, 2018
    Assignee: Leica Biosystems Nussloch GmbH
    Inventors: Bernhard Neef, Christian Wilke, Karl-Heinrich Westerhoff
  • Patent number: 9560230
    Abstract: An image forming apparatus of this invention includes abbreviated keys that realize abbreviated input of a transmission destination, an openable cover provided so as to cover the abbreviated keys, and first and second cover open/closed detection switches configured to output an open state and a closed state of the cover. When an operation of an abbreviated key is received, if the first and second cover open/closed detection switches indicate different detection results, mismatch information indicating that different output has been occurred from the first and second cover open/closed detection switches is stored in a non-volatile storage unit, and the image forming apparatus is restarted.
    Type: Grant
    Filed: March 19, 2015
    Date of Patent: January 31, 2017
    Assignee: Canon Kabushiki Kaisha
    Inventor: Keiko Kamoi
  • Patent number: 9541378
    Abstract: A system for determining a sash panel position. An example system includes a linear array of light emitting elements spaced at equal distances from one another mounted on a fume hood frame. The light emitting elements generate a light path towards a sash panel such that the sash panel blocks the light path when positioned at the light emitting element. A linear array of light sensing elements is spaced at equal distances from one another on a side opposite the sash panel. The light sensing elements receive the light path generated by corresponding light emitting elements when the sash panel does not block the light path. The light sensing elements may be on modules having shift registers with bits corresponding to the light sensing elements. The shift register stores a state of the light sensing element and outputs a series of bits indicating the state of each light sensing element.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: January 10, 2017
    Assignee: Siemens Industry, Inc.
    Inventors: Donald E. Charles, Guy P. Caliendo
  • Patent number: 9207072
    Abstract: A leaf area index measurement system includes: imaging means for capturing an image of a measurement target plant and outputting the captured image; a light source placed either on a side of the measurement target plant opposite to the imaging means or at a position of the measurement target plant; intensity calculation means for calculating an intensity of light when the light source emits light, based on the captured image output from the imaging means; and leaf area index calculation means for calculating a leaf area index, based on the intensity of light calculated by the intensity calculation means.
    Type: Grant
    Filed: December 2, 2011
    Date of Patent: December 8, 2015
    Assignee: NEC CORPORATION
    Inventor: Masahiro Serizawa
  • Patent number: 8958065
    Abstract: A beam reformatter to receive and split a beam into a plurality of beam portions, and further distribute and propagate two or more of the plurality of beam portions in substantially the same direction to create a reformatted composite beam, wherein the plurality of beam portions each contain the same spatial and spectral information as the received beam.
    Type: Grant
    Filed: January 18, 2013
    Date of Patent: February 17, 2015
    Assignee: Tornado Spectral Systems, Inc.
    Inventors: Jeffrey T. Meade, Arsen R. Hajian, Bradford B. Behr, Andrew T. Cenko
  • Patent number: 8841603
    Abstract: Optical scanning with an optical probe composed of an elongated cylinder of transparent material mounted upon an optical scanner body; one or more sources of scan illumination mounted in the probe distally or proximally with respect to the scanner body and projecting scan illumination longitudinally through the probe; a radially-reflecting optical element mounted in the probe having a conical mirror on a surface of the radially-reflecting optical element, the mirror oriented so as to project scan illumination radially away from a longitudinal axis of the probe with at least some of the scan illumination projected onto a scanned object; a lens mounted in the probe between the radially-reflecting optical element and the scanner body and disposed so as to conduct to an optical sensor scan illumination reflected from the scanned object.
    Type: Grant
    Filed: December 6, 2013
    Date of Patent: September 23, 2014
    Assignee: United Sciences, LLC
    Inventors: Keith A. Blanton, Karol Hatzilias, Stefan T. Posey, Wess Eric Sharpe
  • Patent number: 8797552
    Abstract: A non-contact laser triangulation scanning apparatus for generating a three-dimensional image of the surface of an object based on the 3D surface position and surface contrast information. The apparatus comprises a laser source, a first optical unit, a second optical unit, a photosensitive positional detector having a plurality of sensor elements, and an incident light measurement device. According to generated timing signals having a predetermined time interval, a reset timing of the sensor elements of the photosensitive positional detector is controlled. The incident light measurement device measures an amount of a certifying laser light after one timing signal. An amount of a measurement laser light is determined dependent on the measured amount of the certifying laser light. The three-dimensional image is generated by combining position data derived from signals of the positional detector with contrast data derived at least from signals of the incident light measurement device.
    Type: Grant
    Filed: July 3, 2009
    Date of Patent: August 5, 2014
    Assignees: Leica Geosystems AG, Hexagon Metrology Kabushiki Kaisha
    Inventors: Satoshi Suzuki, Kengo Suzuki, Masaki Takabayashi, Yoichi Sano, Masahiro Suzuki
  • Patent number: 8760668
    Abstract: Embodiments of methods are disclosed for characterizing a tested polycrystalline diamond (“PCD”) element, such as a PDC cutting element. In an embodiment, a method for characterizing a tested PCD element is disclosed. An initial volume of a PCD element is measured using a coordinate measuring machine (“CMM”). A workpiece is cut with the PCD element so that the PCD element develops a wear flat. A post-cut volume of the PCD element is measured after cutting the workpiece using the CMM. A wear volume of the PCD element is determined at least partially based on the post-cut volume and the initial volume of the PCD element.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: June 24, 2014
    Assignee: US Synthetic Corporation
    Inventors: Jason K. Wiggins, Richard B. Smith, Bryan H. Jansen
  • Patent number: 8649849
    Abstract: The present invention includes using optical spectroscopy as an innovative technique for ex-vivo demonstration of renal and prostate tumors. The apparatus and methods disclosed herein demonstrate the ability of optical spectroscopy to reliably differentiate tumor from normal tissue in renal specimens.
    Type: Grant
    Filed: May 21, 2008
    Date of Patent: February 11, 2014
    Assignee: Board of Regents, The University of Texas System
    Inventors: Hanli Liu, Jeffrey A. Cadeddu, Disha L. Peswani
  • Publication number: 20140002829
    Abstract: According to example embodiments, an optical measurement apparatus may include: a station configured to support a measurement target; an image acquisition unit configured to acquire a one-dimensional (1D) line image of the measurement target; a driver configured to move the station and the image acquisition unit; and a controller. The controller may be configured to control the driver and the image acquisition unit to acquire a plurality of 1D line images of the measurement target while varying a distance between the image acquisition unit and the measurement target to generate a two-dimensional (2D) scan image from combining the plurality of 1D line images; and to detect a pattern of the measurement target based on comparing a plurality of 2D reference images and the 2D scan image. The optical measurement apparatus may measure critical dimensions of non-repeating ultrafine patterns at high speed.
    Type: Application
    Filed: June 26, 2013
    Publication date: January 2, 2014
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Kwang Soo KIM, Hyun Jae Lee, Byeong Hwan Jeon, Chang Hoon Choi
  • Patent number: 8352208
    Abstract: Evaluation of tree production capacity by a non-destructive method using a tree crown structure measurement device or using an image capture device with a fisheye lens mounted, for isolated trees or for trees existing at intervals, is enabled without requiring a large amount of time. A semi-spheroid of revolution model is established as a representation of the outer shape of a tree, an optical tree structure measurement device is placed at a position apart from the main trunk by a prescribed distance, the intensity of light passing through tree leaves and the intensity of light not passing through tree leaves are measured, the optical path length of light incident on the tree is calculated using the semi-spheroid model and the total tree leaf area is determined from the measured light intensities and optical path length.
    Type: Grant
    Filed: December 15, 2006
    Date of Patent: January 8, 2013
    Assignee: Yamaguchi University
    Inventors: Haruhiko Yamamoto, Kiyoshi Iwaya, Yasushi Tsuchiya
  • Patent number: 8284483
    Abstract: A method for acquiring signals in laser scanning microscopy, includes the steps of: moving a focused optical excitation beam relative to an object to be measured so that the focus point of the beam follows a predetermined path in the space of the object; and acquiring optical measurement signals along the path according to at least one acquisition parameter; characterized in that the path of the excitation beam is determined so as to substantially minimize the variations of the optical properties of at least one portion of the environments crossed by the excitation beam between consecutive acquisitions, and in that at least one acquisition parameter among the acquisition parameters is modulated during the movement of the excitation beam. A device for implementing the method is also described.
    Type: Grant
    Filed: February 3, 2010
    Date of Patent: October 9, 2012
    Assignee: Ecole Polytechnique
    Inventors: Emmanuel Jean-Marc Beaurepaire, Israel Veilleux, Nicolas Olivier, Delphine Malvina Daniele Marie Debarre, Jean-Louis Martin
  • Patent number: 8020960
    Abstract: An inkjet printing system includes; a stage configured for mounting a substrate thereon, an inkjet head which drips an ink droplet on the substrate, a conveying device which moves the inkjet head, and a measuring device which measures a height of the ink droplet on the substrate.
    Type: Grant
    Filed: December 19, 2008
    Date of Patent: September 20, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Youn-Ho Lee
  • Patent number: 7920277
    Abstract: A laser irradiation process includes: scanning a substrate with laser having a predetermined lasing frequency at different irradiation intensities to form a plurality of first irradiation areas corresponding to the irradiation intensities; illuminating the first irradiation areas to reflected light receive from the first irradiation areas; determining microcrystallization intensity based on the received reflected light; and determining irradiation intensity based on the thus determined microcrystallization intensity. The laser irradiation process uses the irradiation intensity for irradiating a polycrystalline film in a product semiconductor device.
    Type: Grant
    Filed: April 2, 2010
    Date of Patent: April 5, 2011
    Assignees: NEC Corporation, NEC LCD Technologies, Ltd.
    Inventors: Mitsuru Nakata, Hirofumi Shimamoto, Hiroshi Kanoh
  • Patent number: 7835014
    Abstract: A method for absolute position measuring that includes scanning a code having code elements arranged one behind the other in a measuring direction, wherein the code elements include sequential first and second code elements which define a code word containing absolute position information. The method including generating scanning signals within the first code elements and the second code elements. The method further including forming information regarding the sequential first and second code elements from the scanning signals via a reference value and determining the reference value as a function of at least one of the scanning signals within the first code elements and the scanning signals within the second code elements.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: November 16, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Elmar Mayer, Johann Oberhauser
  • Patent number: 7751871
    Abstract: Disclosed is an optical imaging method and device enabling display and 3D measurement of tridimensional objects (1), whereby at least two individual images are captured one after the other and the image conversion is controlled or regulated differently for these individual images. By employing adustable optical means (10-14) for the illumination of the object or in the optical path for the imaging of the object on the image converter (15) it is possible to acquire a larger amount of visual information on the object observed than that which is available in an individual image due to the limitations imposed by the design of the converter used (15). The invention relates to processes and design forms of the device enabling recording units to be designed, using simply and generally commercial components, which are able to display and measure larger objects (1) despite a reduced field of vision imposed by the design.
    Type: Grant
    Filed: November 18, 2004
    Date of Patent: July 6, 2010
    Assignee: Orametrix, Inc.
    Inventor: Rudger Rubbert
  • Patent number: 7724382
    Abstract: A laser irradiation process includes: scanning a substrate with laser having a predetermined lasing frequency at different irradiation intensities to form a plurality of first irradiation areas corresponding to the irradiation intensities; illuminating the first irradiation areas to reflected light receive from the fist irradiation areas; determining microcrystallization intensity based on the received reflected light; and determining irradiation intensity based on the thus determined microcrystallization intensity. The laser irradiation process uses the irradiation intensity for irradiating a polycrystalline film in a product semiconductor device.
    Type: Grant
    Filed: April 19, 2007
    Date of Patent: May 25, 2010
    Assignees: NEC Corporation, NEC LCD Technologies, Ltd.
    Inventors: Mitsuru Nakata, Hirofumi Shimamoto, Hiroshi Kanoh
  • Patent number: 7667859
    Abstract: Method and device for the detection of an essentially rectilinear contrast edge (E) in a direction, whereby a periodic sweep (?) of global visual angle (??) of the optical sensors, by translation (S) in another direction transverse to the first direction, is carried out. The translation provides a periodic sweep of non-uniform angular speed (?) during a part of the period of sweeping and a measurement of a time difference (t) from the signals provided by the sensors (D1, D2), depending on the angular position of the contrast edge (E) with relation to a reference direction (OY12) within the global visual angle (??) from the sweep law (?), the reference direction being connected to a specific value for the time difference (t). The above is of application to spatial stabilization of a sight line and the fine following and fixing of an object with at least one contrast edge.
    Type: Grant
    Filed: March 16, 2005
    Date of Patent: February 23, 2010
    Assignee: Centre National de la Recherche Scientifique (C.N.R.S.)
    Inventors: Nicolas Franceschini, Stephane Viollet, Marc Boyron
  • Publication number: 20090281733
    Abstract: Evaluation of tree production capacity by a non-destructive method using a tree crown structure measurement device or using an image capture device with a fisheye lens mounted, for isolated trees or for trees existing at intervals, is enabled without requiring a large amount of time. A semi-spheroid of revolution model is established as a representation of the outer shape of a tree, an optical tree structure measurement device is placed at a position apart from the main trunk by a prescribed distance, the intensity of light passing through tree leaves and the intensity of light not passing through tree leaves are measured, the optical path length of light incident on the tree is calculated using the semi-spheroid model and the total tree leaf area is determined from the measured light intensities and optical path length.
    Type: Application
    Filed: December 15, 2006
    Publication date: November 12, 2009
    Applicant: YAMAGUCHI UNIVERSITY
    Inventors: Haruhiko Yamamoto, Kiyoshi Iwaya, Yasushi Tsuchiya
  • Publication number: 20090273795
    Abstract: A device for measuring the properties of moving objects comprises a station (5) for measuring predetermined properties of an object (100) and a first conveyor (2) for transferring the object (100) towards the measuring station (5). The device (1) comprises accelerator means (6) for accelerating the object (100), acting on the object and positioned upstream of the measuring station (5) and slowing means (7) for slowing or stopping the object (100), acting on the object and positioned at the measuring station (5). A method for measuring the properties of moving objects comprises the steps of: transporting an object (100) along a first conveyor (2) having a predetermined feed speed (T1); accelerating the object (100) relative to the first conveyor (2) feed speed (T1) then slowing the object (100) relative to the first conveyor (2) feed speed (T1) at least at a station (5) for measuring predetermined properties of the object (100).
    Type: Application
    Filed: May 28, 2007
    Publication date: November 5, 2009
    Applicant: MICROTEC S.R.L
    Inventors: Martin Bacher, Federico Giudiceandrea
  • Patent number: 7512457
    Abstract: In-process non-contact measurement systems and methods for automated lapping systems are disclosed. In an embodiment, a moveable frame can be controllably positioned proximate to a lapped work product. A control component can provide first control signals to control a movement of the moveable frame relative to the lapped work product. A non-contact measuring device can be coupled to the moveable frame measures a surface of the lapped work product and can transmit measurement data of the surface of the lapped work product to the control component. The control component can further provide second control signals to control a movement of the non-contact measuring device relative to the moveable frame.
    Type: Grant
    Filed: March 6, 2007
    Date of Patent: March 31, 2009
    Assignee: The Boeing Company
    Inventors: Jeffrey H Wood, Thomas R Berkel, Robert E Bender
  • Patent number: 7456842
    Abstract: A method and system for determining surface topology of a three-dimensional (3D) structure, based on a structured pattern that is projected onto the surface structure, and images of the pattern superposed on the structured surface are analysed to provide surface coordinates of the structure. The pattern comprises a plurality of unique color edges defined between pairs of differently-colored stripes, which substantially overcomes ambiguity problems. In one embodiment, a calibration method is provided enabling the surface coordinates to be obtained from a single image of the structure.
    Type: Grant
    Filed: September 9, 2004
    Date of Patent: November 25, 2008
    Assignees: C.M.D. Controlled Micro Devices Ltd., Cyber Vision (2004) Ltd.
    Inventor: Samuel Kosolapov
  • Patent number: 7379194
    Abstract: A method of measuring a mailpiece includes deflecting a laser beam through an arc, determining an angle at which the laser beam is currently directed, and calculating a dimension of the mailpiece based at least in part on the determined angle.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: May 27, 2008
    Assignee: Pitney Bowes Inc.
    Inventors: Frederick W Ryan, Jr., Ronald P Sansone
  • Patent number: 7202467
    Abstract: A system is described for the optical detection of a distant object, having a light beam generating device for generating a parallel light beam, a scanning unit for generating a scan pattern by deflecting the parallel light beam over a defined angular range, and a detector unit for detecting light reflected by the distant object. The scanning unit includes a rotating polygonal mirror with several reflecting partial mirror surfaces. The light beam generating device is provided for generating a parallel light beam in two different beam positions which, in response to a rotating position indicating signal indicating the rotating position of the polygonal mirror, can be switched over from a partial mirror surface to an adjacent partial mirror surface. Accordingly, a system is provided for the optical direction of a distant object, which system has a high capacity.
    Type: Grant
    Filed: November 3, 2004
    Date of Patent: April 10, 2007
    Assignee: EADS Astrium GmbH
    Inventors: Jess Koehler, Wolfgang Holota
  • Patent number: 6956661
    Abstract: Device measures external and internal dimensions of measurement objects using a light source for illuminating a slit diaphragm, in front of or behind which a spirally slotted disc is arranged, slit diaphragm and disc being rotatable in relation to each other and the disc having a spiral slot intersecting the slit of the slit diaphragm, the interaction of which with the slit creates a hole aperture. Evaluation device measures the time in which the light beams scan the measurement object and determines dimensions from the measured times. To scan the measurement object simultaneously in different spacial planes or in one plane in different axes, several slits are provided in the slit diaphragm. Slits may be disposed radially around axis of rotation. Light source(s) may emit light of one or more wavelengths or different frequency modulated light amplitudes.
    Type: Grant
    Filed: December 6, 2004
    Date of Patent: October 18, 2005
    Inventor: Udo Tutschke
  • Patent number: 6791697
    Abstract: In one illustrative embodiment, the method involves forming a ring oscillator that includes a first grating structure comprised of a plurality of gate electrode structures for a plurality of N-channel transistors and a second grating structure comprised of a plurality of gate electrode structures for a plurality of P-channel transistors, and measuring the critical dimension and/or profile of at least one of the gate electrode structures in the first grating structure and/or the second grating structure using a scatterometry tool. In another embodiment, the method further involves forming at least one capacitance loading structure, comprised of a plurality of features, as a portion of the ring oscillator, and measuring the critical dimension and/or profile of at least one of the features of the capacitance loading structure using a scatterometry tool.
    Type: Grant
    Filed: March 21, 2002
    Date of Patent: September 14, 2004
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Homi E. Nariman
  • Publication number: 20030179430
    Abstract: A laser beam machine according to the invention comprises a scanning lens for gathering laser light deflected by a deflection mirror on a workpiece for applying the laser light to a plurality of parts in a deflection area using the above-mentioned deflection mirror and the above-mentioned scanning lens and machining the workpiece. The laser beam machine comprises energy measurement means for measuring energy of the laser light applied to a plurality of different positions in the above-mentioned deflection area, so that the energy of the laser light applied to a plurality of different positions in the deflection area can be measured, occurrence of partial energy lowering depending on the laser light application position, caused by dirt of the scanning lens can be known, and appropriate maintenance is executed based on the information, whereby it is made possible to perform stable machining over a long term without causing a machining failure to occur.
    Type: Application
    Filed: February 14, 2003
    Publication date: September 25, 2003
    Inventor: Miki Kurosawa
  • Patent number: 6602716
    Abstract: A method and device for fluorimetric determination of a biological, chemical or physical parameter of a sample utilize at least two different luminescent materials, the first of which is sensitive to the parameter, at least with respect to luminescence intensity, and the second of which is insensitive to the parameter, at least with respect to luminescence intensity and decay time. The luminescent materials have different decay times. The time- or phase behaviour of the resulting luminescence response is used to form a reference value for determination of a parameter.
    Type: Grant
    Filed: April 10, 2000
    Date of Patent: August 5, 2003
    Assignee: PreSens Precision Sensing GmbH
    Inventor: Ingo Klimant
  • Patent number: 6449036
    Abstract: A sensor unit (50), a device, and a process for inspection of a surface (10′, 10&Dgr;) of an object (10) for the purpose of identifying surface characteristics, such as structural defects. The device contains an emitting module (51) and a receiving module (52). The emitting module emits at least one beam bundle (6, 6′, 6″). The receiving module has at least one light receiver (15, 16, 20). A rotating polygonal mirror wheel (2) is located in the focal point of a parabolic mirror (1). A beam bundle (6) of the laser (3, 4) is directed onto the mirror (1) by means of a telecentric lens, which guides the emitter and receiver beam on the same optical axis, whereby the parabolic mirror (1) guides the deflected beam bundle (6, 6′, 6″) under a constant angle relative to the axis of symmetry (7) of the parabolic mirror (1) along a scanning line (23, 24) over the object (10).
    Type: Grant
    Filed: January 10, 2000
    Date of Patent: September 10, 2002
    Assignee: Baumer Optronic GmbH
    Inventors: Christian Wollmann, Lutz Wenert, Joachim Ihlefeld, Ralf Grieser