By Change In Motion Of Movable Element Patents (Class 374/22)
-
Patent number: 11761914Abstract: Provided are a method of and a device for measuring a glass transition temperature and a degree of crystallinity of a polymer. According to the measurement method and the device of one exemplary embodiment of the present invention, a glass transition temperature and a degree of crystallinity may be measured easily, rapidly, and accurately in a field other than a laboratory, and fast and accurate conversion is possible for various measurement conditions such as temperature, frequency, etc.Type: GrantFiled: August 6, 2020Date of Patent: September 19, 2023Assignee: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGYInventors: Siyoung Choi, Jinwon Park, Jaehong Lee
-
Publication number: 20100322280Abstract: The present invention relates to a measurement method of dew-point in low temperature, and more specifically to a measurement method of accurately distinguishing dew-point and frost-point using a quartz crystal microbalance dew-point sensor in a low temperature of 0° C. or less. To this end, the present invention provides a measurement method of distinguishing dew and frost point using a quartz crystal microbalance dew-point sensor in low temperature, comprising the steps of: measuring a resonant frequency of a quartz crystal microbalance dew-point sensor while slowly dropping temperature; observing shock waves of the resonant frequency; and determining dew point or frost point through the observation of the resonant frequency and shock waves of the quartz crystal microbalance dew-point sensor.Type: ApplicationFiled: December 26, 2007Publication date: December 23, 2010Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCEInventors: Su Yong Kwon, Jong Chul Kim, Byung IL Choi
-
Patent number: 6869024Abstract: A first mounting plate attachable to the wall has a hub on which a second enhanced mounting plate is rotated by a humidity sensing spring to decrease the setting registered by the mercury bulb switch when moist air is present and increase the setting when drier air is present.Type: GrantFiled: February 11, 2004Date of Patent: March 22, 2005Inventor: Duane W. Kinnear
-
Publication number: 20020196834Abstract: A glass transition temperature Tg measurement system includes a probe point penetrating into a sample under test that has been heated by a heater to a temperature where the sample undergoes a phase change from a solid to a semisolid. A thermocouple is used to measure the temperature while a motion transducer is used to measure the amount of penetration. The penetration amount sharply increases at the glass transition temperature. A portable unit can be used in the field to test the Tg properties of various composite materials used, for example, in structures including buildings and bridges.Type: ApplicationFiled: June 22, 2001Publication date: December 26, 2002Inventors: Rafael J. Zaldivar, James P. Nokes, Gary F. Hawkins
-
Patent number: 6425686Abstract: A glass transition temperature Tg measurement system includes a probe point penetrating into a sample under test that has been heated by a heater to a temperature where the sample undergoes a phase change from a solid to a semisolid. A thermocouple is used to measure the temperature while a motion transducer is used to measure the amount of penetration. The penetration amount sharply increases at the glass transition temperature. A portable unit can be used in the field to test the Tg properties of various composite materials used, for example, in structures including buildings and bridges.Type: GrantFiled: June 9, 2000Date of Patent: July 30, 2002Assignee: The Aerospace CorporationInventors: Rafael J. Zaldivar, James P. Nokes, Gary F. Hawkins
-
Patent number: 6231228Abstract: A device and method is disclosed for determining the melting point of a sample material utilizing an infrared thermometer to measure the indicated temperature of the sample material while under pressure as such sample material is being heated. Upon melting, the sample material is substantially displaced from the field of view of the infrared thermometer by the force of the applied pressure, resulting in a spike in the sensed temperature.Type: GrantFiled: April 8, 1999Date of Patent: May 15, 2001Inventor: Gregory R. Brotz
-
Patent number: 6155098Abstract: A dewpoint sensor comprises a pressure vessel having an entry port, an exit port, and a temperature controlled plate. A quartz crystal resonator is housed within the pressure vessel and disposed in intimate contact with the temperature controlled plate. A temperature sensor is disposed to generate signals representative of the quartz crystal resonator temperature. Circuitry is coupled to the quartz crystal resonator and the temperature sensor, which circuitry is configured to control the temperature of the quartz crystal resonator, to measure the frequency of the quartz crystal resonator and to monitor the temperature signals and the frequency of the quartz crystal resonator when exposed to a flow between the entry port and the exit port so as to calculate a dewpoint value of the flow.Type: GrantFiled: October 12, 1999Date of Patent: December 5, 2000Assignee: General Electric CompanyInventors: Andrew Philip Shapiro, Anthony John Dean
-
Patent number: 6073479Abstract: A dewpoint sensor comprises a pressure vessel having an entry port, an exit port, and a temperature controlled plate. A quartz crystal resonator is housed within the pressure vessel and disposed in intimate contact with the temperature controlled plate. A temperature sensor is disposed to generate signals representative of the quartz crystal resonator temperature. Circuitry is coupled to the quartz crystal resonator and the temperature sensor, which circuitry is configured to control the temperature of the quartz crystal resonator, to measure the frequency of the quartz crystal resonator and to monitor the temperature signals and the frequency of the quartz crystal resonator when exposed to a flow between the entry port and the exit port so as to calculate a dewpoint value of the flow.Type: GrantFiled: November 13, 1998Date of Patent: June 13, 2000Assignee: General Electric CompanyInventors: Andrew Philip Shapiro, Anthony John Dean
-
Patent number: 5682331Abstract: An object tracking and motion control system includes a thermal marking unit such as a laser for inducing localized thermal indicia on objects. A thermal tracking unit, typically a two dimensional thermal sensing array, is positioned to measure movement of objects marked with localized thermal indicia. A motion control unit is connected to the thermal tracking unit to permit adjustment of motion of objects marked with induced localized thermal indicia based on their measured movement.Type: GrantFiled: January 5, 1996Date of Patent: October 28, 1997Assignee: Xerox CorporationInventor: Andrew A. Berlin
-
Patent number: 5454257Abstract: A wax appearance point in a petroleum produce is determined by measuring change in volume as a function of temperature. The appearance point appears as a deviation from a rectilinear graph. The quantity of wax which appears is determined by comparing a measured volume graph as a function of temperature with an estimated volume graph.Type: GrantFiled: June 22, 1993Date of Patent: October 3, 1995Assignee: Norsk Hydro A.S.Inventors: Fotland Per, Knut Erik Grung
-
Patent number: 5209566Abstract: A testing apparatus (dynamic thermomechanical analyzer) for analyzing a change of the state of a sample from a fluid state to a solid state. The dynamic thermomechanical analyzer includes: a) a vessel in which the sample is set; b) a spring standing in the vessel; the top of the spring rising above the surface of the sample; c) an oscillator for oscillating the spring via a push rod with a constant amplitude of force; and d) a displacement detector for detecting the displacement of the spring or the push rod. When the spring is oscillated at a constant amplitude of force, the amplitude .DELTA.L of the displacement of the push rod decreases as the initially fluid sample solidifies.Type: GrantFiled: March 23, 1992Date of Patent: May 11, 1993Assignee: Shimadzu CorporationInventor: Hiroji Kuwata
-
Patent number: 4567849Abstract: For HgCdTe liquid phase epitaxy (LPE), in situ differential thermal analysis apparatus is used to precisely monitor the liquidus temperature of each HgCdTe melt. The neutral body, e.g. a slug of copper enclosed in a silica ampoule, is placed near the LPE reactor in a furnace. During heating or cooling, differential sensing of a pair of thermocouples (in the melt and in the neutral body) will show an accelerated change at transformation points, since at these points the temperature of the melt will be changed by the energy of the physical change, while that of the neutral body remains subject only to passive heat transfer. Thus, the actual liquidus temperature of each melt can be measured with extreme precision, and isothermal or programmed cooling methods of LPE can be precisely and reliably controlled under production conditions.Type: GrantFiled: May 7, 1984Date of Patent: February 4, 1986Assignee: Texas Instruments IncorporatedInventor: Chang-Feng Wan