Abstract: A test apparatus for testing an IR sensor of train undercarriage temperatures is disclosed. The IR sensor may be used to obtain infrared IR emission data by sensing a wheel or a wheel bearing of a rail vehicle. The test apparatus may comprise a heat emitter for supplying IR emissions at a reference temperature to the IR sensor. A support may support the heat emitter at a position spaced from the passage of the rail vehicle and in an orientation for directing the IR emissions at the IR sensor.

Abstract: A method of forming a thermocouple (12), including: depositing a first material on a component (10) to form a first leg (14); depositing a second material through a mask (30) to form a pattern (50) on the component (10), the pattern (50) forming a plurality of discrete second leg junction ends (20) and a continuous patch (52) of the second material comprising indiscrete lead ends of the second legs (16), each second leg junction end (20) spanning from a respective junction (18) with the first leg (14) to the continuous patch (52); and laser-ablating the continuous patch (52) to form discrete lead ends (22) of the second legs (16), each lead end (22) electrically connected to a respective junction end (20), thereby forming discrete second legs (16).

Abstract: A method of in-situ pyrometer calibration for a wafer treatment reactor such as a chemical vapor deposition reactor desirably includes the steps of positioning a calibrating pyrometer at a first calibrating position and heating the reactor until the reactor reaches a pyrometer calibration temperature. The method desirably further includes rotating the support element about the rotational axis, and while the support element is rotating about the rotational axis, obtaining first operating temperature measurements from a first operating pyrometer installed at a first operating position, and obtaining first calibrating temperature measurements from the calibration pyrometer. Both the calibrating pyrometer and the first operating pyrometer desirably are adapted to receive radiation from a first portion of a wafer support element at a first radial distance from a rotational axis of the wafer support element.

Abstract: A system (100) for sensing a temperature of a light emitting diode (LED). The system may comprise an LED having a spectral output centered at a first wavelength, a first filter (104) that transitions from attenuation to transmission at about the first wavelength, and a second filter (106) that transitions from transmission to attenuation at about the first wavelength. The system may also comprise a first sensor (108) positioned to sense a first intensity of the LED through the first filter and a second sensor (110) positioned to sense a second intensity of the LED through the second filter. It will be appreciated that a single sensor may be substituted instead of the first and second sensors, provided that the single sensor is capable of selectively viewing the LED through the first and the second filters. The system may also comprise a computer (112) configured to derive a temperature of the LED considering the first intensity and the second intensity.

Abstract: Infrared IR thermometer calibration systems and methods are disclosed in which the temperature of an IR thermometer calibration system is controlled such that radiation emitted by a target at a given input temperature is equal to the radiation emitted by a graybody heated to the input temperature and having an emissivity equal to an emissivity setting of an IR thermometer to be calibrated using the IR thermometer calibration system.

Abstract: A sensor part is provided with a printed circuit board that is made of resin and formed with a pair of electrically conductive metal patterns. Each of the pair of electrically conductive metal patterns includes: a first pattern part connected to a pair of electrodes of a temperature sensor; a second pattern part connected to a pair of conductive wires; and a connection part making a connection between the first and second pattern parts. The connection between the pair of electrodes of the temperature sensor and the first pattern part or between the pair of conductive wires and the second pattern part is made with the use of Dotite or solder.

Abstract: A system for enabling the measurement of a temperature in a furnace (30, 48) using a pyrometer (38) that includes a pallet support (32, 52) for supporting a pallet (40, 50) a given distance (c) above a furnace floor (31) and a pyrometer target (10, 60, 80) that includes a support member (12, 62, 82) and a target member (14, 68) separable from said support member (12, 62, 82) where the support member (12, 62, 82) has a height less than the given distance (c).

Abstract: A fixed-point cell is provided which can provide a fixed-point in a wide temperature range by changing the fixed-point material. During the use of the fixed-point cell, the fixed-point material can be prevented from being contaminated, and the crucible of the cell can be prevented from being cracked. The fixed-point cell includes: the crucible composed of carbon; the fixed-point material enclosed in the crucible and composed of one of a metal, a eutectic of a metal and carbon, and a eutectic of a metal carbide and carbon; and a woven fabric of graphite fibers containing 10 ppm or lower of impurities and interposed between the crucible and the fixed-point material.

Abstract: The present standard radiation source comprises a black body having a cavity, a shielding plate positioned at an open end of the cavity, at least one first heater positioned in the shielding plate, at least one second heater positioned on the outer wall of the black body, a first insulation device covering the second heater and a temperature-controlling device positioned on the first insulation device.

Abstract: The present invention discloses a method for calibrating an infrared thermometer, which can obtain a sensitivity of a radiation sensor of an infrared thermometer and a reference resistance of an ambient-temperature sensor of the infrared thermometer. The method of the present invention uses an infrared thermometer to detect two test objects respectively placed in two environments having different ambient temperatures to obtain output signals of the radiation sensor and resistances of the ambient-temperature sensor from the two test objects. Then, the method of the present invention uses the output signals of the radiation sensor and the resistances of the ambient-temperature sensor to work out the sensitivity of the radiation sensor and the reference resistance of the ambient-temperature sensor.

Abstract: A calibration method for infrared temperature measuring instruments is disclosed. The calibration method of the present invention comprises the following five steps: (1) Calibrating the heat-flux resistor of an infrared temperature measuring instrument so as to obtain its calibrated resistance value (2) Using a digital multimeter to measure the parameters of the components and relevant circuits of the infrared temperature measuring instrument (3) Placing the infrared temperature measuring instrument in a blackbody radiation furnace so as to measure a single-point parameter of the blackbody radiation amplifier because the blackbody radiation furnace can provide a standard blackbody radiation source (4) Using the linear equation to obtain two additional parameters at two other temperatures so as to obtain a linear curve of the blackbody radiation amplifier (5) Storing the calibrated parameters in the memory of the infrared temperature measuring instrument.