Inspection Of Packaged Consumer Goods Patents (Class 382/143)
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Patent number: 7580137Abstract: A method of determining one or more physical properties of a rolled smoking article is disclosed, the method comprising disposing a rolled smoking article within a field of view, illuminating the field of view, imaging the rolled smoking article to form an image, and analyzing the image to determine one or more physical properties of the rolled smoking article. Preferably the image is a digital image, which may be electronically processed to determine the physical properties. The physical properties may include the length of the rolled smoking article, or its mean diameter, ovality, circumference, roundness or shape. Also disclosed is an apparatus for performing such method comprising imaging means defining the field of view, means for positioning a smoking article in the field of view, illuminating means for illuminating the field of view, and processing means for processing the image to determine one more physical properties.Type: GrantFiled: March 19, 2004Date of Patent: August 25, 2009Assignee: Molins PLCInventors: Ronald F. Wilson, Gary J. Pitt, Timothy G. Irons, William A. H. Everitt
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Patent number: 7570787Abstract: An X-ray inspection apparatus is provided with a shied box, a conveyor, an X-ray irradiator, an X-ray line sensor, a monitor, and a control computer to enable the apparatus to inspect an article by automatically selecting an appropriate image processing procedure that is most appropriate for the article. The control computer creates function blocks comprising an image forming section, an image processing procedure adoption determination unit, and a contaminant determination unit as a CPU loads various programs stored in a memory units such as HDD.Type: GrantFiled: March 25, 2005Date of Patent: August 4, 2009Assignee: Ishida Co., Ltd.Inventor: Osamu Hirose
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Patent number: 7570797Abstract: Methods and systems for generating an inspection process for an inspection system are provided. One computer implemented method includes generating inspection data for a selected defect on a specimen at different values of one or more image acquisition parameters of the inspection system. The method also includes determining which of the different values produces the best inspection data for the selected defect. In addition, the method includes selecting the different values determined to produce the best inspection data as values of the one or more image acquisition parameters to be used for the inspection process.Type: GrantFiled: May 10, 2005Date of Patent: August 4, 2009Assignee: KLA-Tencor Technologies Corp.Inventors: David Wang, Patrick Huet, Tong Huang, Martin Plihal, Adam Chien-Huei Chen, Mike Van Riet, Stewart Hill
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Patent number: 7545949Abstract: Disclosed are systems and methods for setting various operating parameters of a vision detector from production line information that can be supplied by a manufacturing technician who is not skilled in the art of the invention. These operating parameters include shutter time, video gain, idle time, frame count, and locator search range. The production line information includes line speed, field of view size, direction of motion, and object spacing.Type: GrantFiled: November 2, 2004Date of Patent: June 9, 2009Assignee: Cognex Technology and Investment CorporationInventors: Brian V. Mirtich, William M. Silver
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Patent number: 7541201Abstract: Disclosed are overlay targets having flexible symmetry characteristics and metrology techniques for measuring the overlay error between two or more successive layers of such targets. In one embodiment, a target includes structures for measuring overlay error (or a shift) in both the x and y direction, wherein the x structures have a different center of symmetry (COS) than the y structures. In another embodiment, one of the x and y structures is invariant with a 180° rotation and the other one of the x and y structures has a mirror symmetry. In one aspect, the x and y structures together are variant with a 180° rotation. In yet another example, a target for measuring overlay in the x and/or y direction includes structures on a first layer having a 180 symmetry and structures on a second layer having mirror symmetry.Type: GrantFiled: September 14, 2005Date of Patent: June 2, 2009Assignee: KLA-Tencor Technologies CorporationInventor: Mark Ghinovker
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Patent number: 7542821Abstract: A conversion control system is described that includes a database to store data defining a set of rules and an interface to receive local anomaly information from a plurality of different analysis machines associated with a plurality of manufacturing process lines that perform a plurality of operations on a web of material, and each of the manufacturing process lines includes position data for a set of regions on the web containing anomalies. The system also includes a computer that registers the position data of the local anomaly information for the plurality of manufacturing process lines to produce aggregate anomaly information. The system further includes a conversion control engine that applies the rules to the aggregate anomaly information to determine which anomalies represent actual defects in the web for a plurality of different products.Type: GrantFiled: July 26, 2007Date of Patent: June 2, 2009Assignee: 3M Innovative Properties CompanyInventors: Steven P. Floeder, Kenneth G. Brittain, James A. Masterman, Carl J. Skeps
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Patent number: 7433590Abstract: A system for synchronizing image capture and a light source has a first strobing light emitting diode (LED) array with a plurality of LEDs located to light an illumination area. The LED array has an on cycle during which the LED array is activated and an off cycle during which the LED array is inactivated. The system also has a camera located with a view of the illumination area. The camera has an image exposure that coincides with the on cycle of the strobing LED array.Type: GrantFiled: September 1, 2005Date of Patent: October 7, 2008Assignee: Accu-Sort Systems, Inc.Inventor: Christopher Alan Freyman
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Patent number: 7430311Abstract: A system and method for imaging an interior of a substantially cylindrical object are disclosed. In accordance with an embodiment of the present invention, a substantially cylindrical illuminator is positioned above an opening of a substantially cylindrical object to be imaged (e.g., a beverage can) in order to illuminate at least a portion of the interior surface of the object. A truncated conical mirror is positioned within an interior space of the illuminator to reflect an image of at least a portion of the interior surface of the object. A single camera is positioned above the illuminator and mirror to capture a single image of at least the interior surface of the object via light reflected directly from at least a portion of the interior surface of the object to the camera and from the mirror to the camera. The entire interior surface of the object is captured in the single image which may be analyzed for defects.Type: GrantFiled: January 13, 2005Date of Patent: September 30, 2008Assignee: Applied Vision Company, LLCInventors: Richard A. Sones, Melvin L. Dick
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Patent number: 7422147Abstract: A method of detecting a fraudulent transaction of an item having an item-identifying indicium processes the indicium to obtain item-identifying information, and captures a digital representation of a surface area of the item. The item-identifying information is used to retrieve a stored digital representation of the surface area of the item. Further, the method compares the captured digital representation with the stored digital representation to determine if the captured digital representation corresponds to the stored digital representation.Type: GrantFiled: December 22, 2006Date of Patent: September 9, 2008Inventor: Walter Steven Rosenbaum
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Patent number: 7421112Abstract: A cargo sensing system is configured to determine if cargo is present within a container. In one implementation, the cargo sensing system senses lines within an image of a cargo space. The lines may be straight, curved or otherwise configured, and are evaluated for indications of the presence of cargo within the cargo space. In a first implementation of the cargo sensing system, the lines within the cargo space are formed by a laser tracing over a predetermined projection pattern. In a second implementation of the cargo sensing system, the lines sensed are formed by intersection of planes defining the cargo space.Type: GrantFiled: March 12, 2004Date of Patent: September 2, 2008Assignee: General Electric CompanyInventors: Andrew J. Calver, Rick Cobello, Kurtis G. McKenney
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Patent number: 7406192Abstract: The invention relates to a method for determining the change in position of an item of luggage in order to examine a suspect region in this item of luggage.Type: GrantFiled: October 6, 2004Date of Patent: July 29, 2008Assignee: GE Homeland Protection, Inc.Inventors: Armin Schmiegel, Helmut Strecker
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Patent number: 7399983Abstract: In an inspection for protrusion of the melted thermoplastic material of transversal line seal into inside, it is an object to provide a quality inspection method and a quality inspection device which can easily detect projection on edge of seal, securely capture even fine unevenness which could not visually found, and allows for accurate and reliable inspection without variation of inspection. The quality inspection method comprise steps of returning container formed from a web-like packaging laminated material to a shape of pillow-like preliminary forming, cutting container wall to sample a filled food, preparing the sampled body, measuring an edge of the transversal seal zone on the inside of the container over the whole length of the outer surface of the edge for unevenness of the outer surface by a detecting unit, and judging an acceptability of the transversal seal zone based on signals from the detecting unit by an analyzing unit.Type: GrantFiled: October 8, 2003Date of Patent: July 15, 2008Assignee: Tetra Laval Holdings & Finance S.A.Inventor: Ryuji Yokote
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Patent number: 7397940Abstract: A method for placement of a object such as a substrate or a mask on a table, said method including: a first placement step in which the object is placed on a first position on the table; a measuring step in which a displacement between the first position of the object and the required position of the object is determined; a removing step in which the object is released and removed from the table; a moving step in which the object and the table are moved relatively to each other by substantially the said displacement, in a direction substantially parallel to the surface of the table; and a second placement step in which the object is placed at the required position on the table.Type: GrantFiled: February 8, 2001Date of Patent: July 8, 2008Assignee: ASML Netherlands B.V.Inventors: Marcus J. H. Willems van Dijk, Engelbertus A. F. van de Pasch, Thomas J. M. Castenmiller, Andreas B. G. Ariens
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Patent number: 7366342Abstract: Methods, and program storage devices, for performing model-based optical proximity correction by providing a region of interest (ROI) having an interaction distance and locating at least one polygon within the ROI. A cut line of sample points representative of a set of vertices, or plurality of cut lines, are generated within the ROI across at least one lateral edge of the polygon(s). An angular position, and first and second portions of the cut line residing on opposing sides of an intersection between the cut line and the lateral edge of the polygon are determined, followed by generating a new ROI by extending the original ROI beyond its interaction distance based on such angular position, and first and second portions of the cut line. In this manner, a variety of new ROIs may be generated, in a variety of different directions, to ultimately correct for optical proximity.Type: GrantFiled: October 27, 2003Date of Patent: April 29, 2008Assignee: International Business Machines CorporationInventors: Gregg M. Gallatin, Emanuel Gofman, Kafai Lai, Mark A. Lavin, Maharaj Mukherjee, Dov Ramm, Alan E. Rosenbluth, Shlomo Shlafman
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Patent number: 7336814Abstract: A system and method facilitate machine-vision, for example three-dimensional pose estimation for target objects, using one or more images sensors to acquire images of the target object at one or more positions, and to identify features of the target object in the resulting images. A set of equations is set up exploiting invariant physical relationships between features such as constancy of distances, angles, and areas or volumes enclosed by or between features. The set of equations may be solved to estimate a 3D pose. The number of positions may be determined based on the number of image sensors, number of features identified, and/or number of known physical relationships between less than all features. Knowledge of physical relationships between image sensors and/or between features and image sensors may be employed. A robot path may be transformed based on the pose, to align the path with the target object.Type: GrantFiled: July 14, 2005Date of Patent: February 26, 2008Assignee: Braintech Canada, Inc.Inventors: Remus F Boca, Babak Habibi, Mohammad Sameti, Simona Pescaru
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Patent number: 7330579Abstract: Methods, systems and apparatuses for inspecting tinted ophthalmic parts are disclosed.Type: GrantFiled: November 12, 2003Date of Patent: February 12, 2008Assignee: Johnson & Johnson Vision Care, Inc.Inventors: Russell J. Edwards, Gary S. Hall
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Patent number: 7317824Abstract: An overlay mark for determining the relative shift between two or more successive layers of a substrate is disclosed. The overlay mark includes at least one test pattern for determining the relative shift between a first and a second layer of the substrate in a first direction. The test pattern includes a first set of working zones and a second set of working zones. The first set of working zones are disposed on a first layer of the substrate and have at least two working zones diagonally opposed and spatially offset relative to one another. The second set of working zones are disposed on a second layer of the substrate and have at least two working zones diagonally opposed and spatially offset relative to one another. The first set of working zones are generally angled relative to the second set of working zones thus forming an “X” shaped test pattern.Type: GrantFiled: March 30, 2006Date of Patent: January 8, 2008Assignee: KLA-Tencor Technologies CorporationInventors: Mark Ghinovker, Michael Adel, Walter Dean Mieher, Ady Levy, Dan Wack
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Patent number: 7310438Abstract: A method of inspecting a stencil having apertures through which a substance is deposited onto an electronic substrate includes depositing the substance through the stencil and onto the substrate, capturing a first image of the stencil after the deposit of the substance and detecting variations in texture of the substance in the first image, capturing a second image of the electronic substrate having the substance on its surface and detecting variations in texture of the substance in the second image, defining a region of interest in the first image and in the second image to determine whether at least one feature exists in the region of interest, measuring a first span of the at least one feature in the region of interest in the first image and a second span of the at least one feature in the region of interest in the second image, and correlating the first span of the at least one feature and the second span of the at least one feature to determine whether a threshold span of the at least one feature has beeType: GrantFiled: June 30, 2006Date of Patent: December 18, 2007Assignee: Speedline Technologies, Inc.Inventor: David P. Prince
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Publication number: 20070286472Abstract: In an exemplary method, repeated patterns are identified in a strip-like product. In the method the strip-like product is observed by at least one camera, and at least one digital image signal comprised of pixels is created for inspection. The image signal is searched for anomalies comprised of one or more pixels. A search image is created of any detected anomaly and its neighbourhood, and the search image is used to convolute the image signal being examined, creating a response image signal. The response image signal is used to determine image areas in the image signal being examined that are substantially similar to the search image.Type: ApplicationFiled: June 6, 2007Publication date: December 13, 2007Applicant: ABB OYInventors: Juha Reunanen, Antti Saarela
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Patent number: 7302091Abstract: A method of determining defect detection sensitivity data, comprises: taking image data from the desired surface areas of each of semiconductor devices, processing at least two of the image data through arithmetic operations and comparing the processed image data with a parameter of defect detection sensitivity substituted by predetermined threshold data to obtain information on defects in the desired areas at least in one-to-one correspondence with any of the image data arithmetically processed, repeating more than once the step of varying the parameter of the defect detection sensitivity to obtain the defect information, so as to obtain more than one sets of combination data on a value of the parameter of the defect detection sensitivity correlated with the defect information, processing more than one sets of the combination data to produce a mathematical function expressing a relation of the desired statistical data with the parameter of the defect detection sensitivity, the mathematical function being useType: GrantFiled: October 20, 2003Date of Patent: November 27, 2007Assignee: Kabushiki Kaisha ToshibaInventors: Akira Hamaguchi, Takamitsu Nagai
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Patent number: 7260255Abstract: Digital pixel data is obtained from radiographic imaging of one or more objects, and corresponds to an imaged area containing a feature to be measured. A data profile for a region around the measured feature is created from the digital pixel data. A reference profile is then created from the data profile. The reference profile represents an expected data profile for a reference condition of the objects, and accounts for the point spread function of the imager. The difference between the data profile and the reference profile is calculated. Based on that difference, the degree by which the actual condition of the objects varies from the reference condition is determined. The calculated difference can be compared to a lookup table mapping previously calculated differences to degrees of variation from the reference condition. The calculated difference can also be used as an input to an experimentally derived formula.Type: GrantFiled: May 7, 2004Date of Patent: August 21, 2007Assignee: Science Applications International CorporationInventors: Raulf M. Polichar, Gary M. Rush, Scott T. Smith
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Patent number: 7209575Abstract: A method for visual inspection of printed matter on moving lids is disclosed. An associated visual inspection system is also disclosed.Type: GrantFiled: September 8, 2004Date of Patent: April 24, 2007Assignee: Berry Plastics CorporationInventor: Scott Spaeth
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Patent number: 7197177Abstract: An optical scanner scans a piece support of know thickness holding a cross-section of laminate material such as fiber composite laminate, metal laminates, brazed parts, welded parts, sandwiched parts to determine layer thickness and layer properties such as fiber content, matrix content, density, void content, and other desired properties related to quality control for real time feedback to manufacturing and archiving for future reference. The electronic visual image from the scan depicts the number and quality of pixels in each layer. A programmable data processor uses the scan information and reference data to determine the physical properties and of the stacking order and the fiber orientation of a fiber reinforced laminate, and the thickness of each ply of metal and sandwich laminates as well as bonded, welded and brazed joints and for the determination of the thickness of each ply, of the stacking order and fiber orientation of a fiber reinforced laminate.Type: GrantFiled: August 29, 2003Date of Patent: March 27, 2007Inventor: Elvin P. Lowe
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Patent number: 7190895Abstract: A photographic imaging system and method for brachytherapy device verification is disclosed. The method involves receiving an order from a customer; loading a container with materials according to the order to create a loaded container; making a photographic image of the loaded container; and using the photographic image to verify that the order and the loaded container match. The verification system employs an order form, a photographic imaging device and apparatus for associating information with the photographic image to provide verification that an order has been filled correctly. Also disclosed is a brachytherapy system including at least one container containing radioactive brachytherapy materials, an order form and at least one photographic image of said at least one container showing the radioactive brachytherapy materials. The brachytherapy system of the invention ensures easy, safe and essentially error-free verification that orders for brachytherapy materials have been properly filled.Type: GrantFiled: November 21, 2003Date of Patent: March 13, 2007Assignee: Theragenics CorporationInventors: Matthew T. Groves, Jack C. White, James C. Cauthen
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Patent number: 7181057Abstract: An overlay mark for determining the relative position between two or more successive layers of a substrate or between two or more separately generated patterns on a single layer of a substrate is disclosed. The overlay mark includes a plurality of working zones, which are used to calculate alignment between a first and a second layer of the substrate or between a first and a second pattern on a single layer of the substrate. Each of the working zones is positioned within the perimeter of the mark. Each of the working zones represents a different area of the mark. The working zones are configured to substantially fill the perimeter of the mark such that the combined area of the working zones is substantially equal to the total area of the mark.Type: GrantFiled: June 26, 2002Date of Patent: February 20, 2007Assignee: KLA-Tencor Technologies CorporationInventors: Michael Adel, Mark Ghinovker, Walter Dean Mieher, Ady Levy, Dan Wack
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Patent number: 7177444Abstract: A method and apparatus is disclosed for reading and decoding information extracted from a form. In the system of the present invention, packages are randomly placed on a conveyor belt, with their labels facing a two-camera subassembly. As the conveyor belt moves, the two-camera subassembly continuously takes images of the belt underneath the overhead camera. The design of the camera permits it to take a high resolution image of a non-singulated, unjustified package flow. A digital image of the packages within the field of view of the camera is then transferred to the processing system for analysis. The processing system identifies individual packages in the image, extracts them and then analyzes the information written on the package labels. The analysis process utilizes conventional Optical Character Recognition (OCR) and Intelligent Character Recognition (ICR) techniques to evaluate the information written on the package label.Type: GrantFiled: March 2, 2004Date of Patent: February 13, 2007Assignee: Federal Express CorporationInventors: Brett Bracewell Bonner, Ole-Petter Skaaksrud, Andris Jankevics
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Patent number: 7142707Abstract: An apparatus in one example comprises a computer component that receives one or more images of one or more packaging materials from one or more imaging components. The computer component employs an analysis of the one or more images to make a determination of a package integrity of the one or more packaging materials.Type: GrantFiled: December 12, 2003Date of Patent: November 28, 2006Assignee: Northrop Grumman CorporationInventors: Mohsen Abdollahi, Kevin H. Giles, Charles L. Guffey, Jun Liu, Bernard Roche, Peter W. Sites, Robert P. Whalen
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Patent number: 7116814Abstract: The image-based container defects detector consists of a plurality of camera units, a sensor unit, a frame grabber, and an image recognizer unit. The sensor unit serves to detect the vehicles entering the inspection station, and transmit a signal to the frame grabber for capturing the vehicle image by triggering the CCD camera thereby obtaining the information about the container's defect position and size. By dexterously utilizing image processing technique, the HIS (hue, saturation and intensity) color is employed to distinguish a normal area from a defected area in the container. Then quad-tree and merge is used to segregate image roughly. As for the non-defected area becoming obscured due to noise is removed using a filter. Finally the defected area is displayed on the screen. The present invention is well-suited for after detection as well as for on-line immediate detection for defect containers.Type: GrantFiled: September 27, 2002Date of Patent: October 3, 2006Assignee: Chunghwa Telecom Co., Ltd.Inventors: Bor-Shenn Jeng, Quen-Zong Wu, Yu-Pin Chen, Wei-Yuan Cheng
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Patent number: 7103207Abstract: Apparatus for the spectral assessment of fruit includes a sensor head (10) positioned adjacent a near infrared light source (11). The sensor head is coupled to a spectrometer via fibre optics (30). The sensor head is positioned close to the periphery of fruit substantially parallel with the light from the light source so that the fibre optics sense only the internally reflected or refracted light emanating from the fruit.Type: GrantFiled: March 7, 2001Date of Patent: September 5, 2006Assignees: Color Vision Systems PTD Ltd., Central Queensland UniversityInventors: Peter Gary Brown, Colin Victor Greensill, Kerry Brian Walsh
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Patent number: 7068833Abstract: An overlay mark for determining the relative shift between two or more successive layers of a substrate is disclosed. The overlay mark includes at least one test pattern for determining the relative shift between a first and a second layer of the substrate in a first direction. The test pattern includes a first set of working zones and a second set of working zones. The first set of working zones are disposed on a first layer of the substrate and have at least two working zones diagonally opposed and spatially offset relative to one another. The second set of working zones are disposed on a second layer of the substrate and have at least two working zones diagonally opposed and spatially offset relative to one another. The first set of working zones are generally angled relative to the second set of working zones thus forming an “X” shaped test pattern.Type: GrantFiled: June 27, 2001Date of Patent: June 27, 2006Assignee: KLA-Tencor CorporationInventors: Mark Ghinovker, Michael Adel, Walter Dean Mieher, Ady Levy, Dan Wack
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Patent number: 7020306Abstract: The object of the present invention is to establish a technology for directly evaluating polishing pad surface conditions, to allow high-precision CMP process management, and to improve process throughput. The pad surface is illuminated with light. The intensity of reflected light or fluorescence from the illuminated area or an intensity distribution image is used directly evaluate the pad surface condition. Based on the results of this evaluation, conditioning conditions for a conditioner are optimized, thus allowing high-precision CMP processing while maintaining good pad surface conditions.Type: GrantFiled: February 1, 2001Date of Patent: March 28, 2006Assignee: Hitachi, Ltd.Inventors: Takenori Hirose, Hiroyuki Kojima, Mineo Nomoto, Susumu Aiuchi
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Patent number: 6999611Abstract: Defects are detected in a reticle used in integrated circuit chip fabrication by obtaining digital image data corresponding to an image of the reticle. Typically, this is accomplished by scanning the reticle using a laser scanner. The digital image data are then processed according to predetermined criteria to identify defects. Such processing may include, for example, processing the digital image data in comparison to reference digital image data for the same or a similar portion of the reticle. Next, a response that would be produced if the reticle were to be utilized in a photolithographic system is simulated by processing the digital image data corresponding to the reticle.Type: GrantFiled: February 13, 1999Date of Patent: February 14, 2006Assignee: KLA-Tencor CorporationInventors: Daniel Lopez, Frank Schellenberg
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Patent number: 6987873Abstract: A method and apparatus is provided for automatically classifying a defect on the surface of a semiconductor wafer into one of, e.g., seven core classes: a missing pattern on the surface, an extra pattern on the surface, a deformed pattern on the surface, a particle on the surface, a particle embedded in the surface, a particle and a deformed pattern on the surface, or craters and microscratches on the surface. The defect may also be further classified into a subclass of arbitrarily defined defects defined by the user or preprogrammed in the apparatus. Embodiments include using a scanning electron microscope (SEM) capable of collecting electrons emitted from a plurality of angular sectors to obtain an image of the defect and a reference image containing topographical and location information, then analyzing this information to classify the defect.Type: GrantFiled: July 8, 1998Date of Patent: January 17, 2006Assignee: Applied Materials, Inc.Inventors: Ariel Ben-Porath, Mark Wagner
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Patent number: 6973207Abstract: An embodiment of the invention provides a method for training a system to inspect a spatially distorted pattern. A digitized image of an object, including a region of interest, is received. The region of interest is further divided in to a plurality of sub-regions. A size of each of the sub-regions is small enough such that a conventional inspecting method can reliably inspect each of the sub-regions. A search tool and an inspecting tool are trained for a respective model for each of the sub-regions. A search tree is built for determining an order for inspecting the sub-regions. A coarse alignment tool is trained for the region of interest. Another embodiment of the invention provides a method for inspecting a spatially distorted pattern. A coarse alignment tool is run to approximately locate a pattern. Search tree information and an approximate location of a root image, found by the coarse alignment tool, is used to locate sub-regions sequentially in an order according to the search tree information.Type: GrantFiled: November 30, 1999Date of Patent: December 6, 2005Assignee: Cognex Technology and Investment CorporationInventors: Mikhail Akopyan, Lowell Jacobson, Lei Wang
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Patent number: 6961456Abstract: A method and apparatus is disclosed for reading and decoding information extracted from a form. In the system of the present invention, packages are randomly placed on a conveyor belt, with their labels facing a two-camera subassembly. As the conveyor belt moves, the two-camera subassembly continuously takes images of the belt underneath the overhead camera. The design of the camera permits it to take a high resolution image of a non-singulated, unjustified package flow. A digital image of the packages within the field of view of the camera is then transferred to the processing system for analysis. The processing system identifies individual packages in the image, extracts them and then analyzes the information written on the package labels. The analysis process utilizes conventional Optical Character Recognition (OCR) and Intelligent Character Recognition (ICR) techniques to evaluate the information written on the package label.Type: GrantFiled: March 2, 2004Date of Patent: November 1, 2005Inventors: Brett Bracewell Bonner, Ole-Petter Skaaksrud, Andris Jankevics
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Patent number: 6950547Abstract: An imaging device for sequentially imaging a portion of a continuously moving web to provide a digital data stream which is then analyzed by a single computer without the used of dedicated signal processing hardware. Techniques for operating on the data stream from an imaging device are disclosed, particularly including operations based on blob information stored in terms of starting position and segment run lengths in a crossweb direction. These allow definitions of blobs to be accumulated in a line-by-line fashion, and allow classes of defects commonly found in continuous web manufacturing to be identified with far less computing power than was previously required. In particular, in the challenging application of inspecting flexible circuits, data rates in excess of 10 mega-pixels/second are achieved and successfully processed.Type: GrantFiled: February 12, 2001Date of Patent: September 27, 2005Assignee: 3M Innovative Properties CompanyInventors: Steven P. Floeder, James A. Masterman, Matthew P. Peick, Carl J. Skeps, Steven R. Wageman, Wenyuan Xu, Xi Yu
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Patent number: 6944324Abstract: A system and method for detecting multiple object conditions, such as side-by-side and overlapped objects, such as packages, on a conveyor. The system includes at least one machine vision system including at least one machine vision camera, at least one illumination subsystem and at least one machine vision computer. The illumination subsystem(s) is configured to illuminate a plurality of objects as they are conveyed past at least one field of view at an inspection station along a conveyor belt. Each machine vision camera is positioned to capture one or more images of the objects as the objects are conveyed past the field of view(s). Each machine vision computer is programmed to detect the presence of multiple object conditions by detecting and counting the number of edges appearing in an image of an object captured by one of the machine vision cameras. The method illuminates at least one object as it passes through the field of view, at which time at least one image of the object is captured.Type: GrantFiled: January 24, 2001Date of Patent: September 13, 2005Assignee: Robotic Vision Systems, Inc.Inventors: Don Tran, George W. Schurr
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Patent number: 6941007Abstract: A pattern inspection apparatus and method that uses multiple images in a pattern recognition process used to detect defects in an object being inspected is disclosed. A user is provided with multiple image selection windows allowing the user to select multiple desired images from the object to form a pattern to be recognized within the object. The multiple desired images will be substantially free from undesired features of the object. Once the multiple desired images are selected, the spatial relationship between them is determined and used to learn the pattern to be recognized. The spatial relationship between the desired images further filters out undesired features. The pattern to be recognized is used in a subsequent pattern recognition analysis. Since the pattern to be recognized includes only desired images and their relationship, undesired features that could corrupt the pattern recognition analysis are not present during the analysis.Type: GrantFiled: January 28, 2000Date of Patent: September 6, 2005Assignee: Micron Technology, Inc.Inventor: Douglas D. Do
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Patent number: 6888957Abstract: An embodiment of the invention is a method for detecting defects in an optical fiber. The method includes obtaining an image of the optical fiber and separating a portion of the image for processing. A blob threshold is determined to isolate a blob in the portion of the image and characteristics of the portion of the image are adjusted to enhance detection of the blob. One or more blobs are detected in the image and a characteristic of the detected blobs is compared to blob criteria. The optical fiber is failed if the blob criteria are not met.Type: GrantFiled: March 29, 2001Date of Patent: May 3, 2005Assignee: CIENA CorporationInventors: Wonoh Kim, Darryl S. Ennels
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Patent number: 6868176Abstract: In image processing method and device used in, for instance, wire bonding, the amount of positional deviation, which is of between a reference image and a rotated image which is obtained by rotating the reference image by a particular angle, is calculated by pattern matching between such two images, and then a first alignment point is determined based upon the calculated amount of the positional deviation and the rotational angle which is a known quantity. By way of using the first alignment point as a reference, pattern matching is executed between the reference image and an image of a comparative object (a semiconductor device, for instance) that is obtained by imaging the comparative object disposed in an attitude that includes positional deviations in the rotational direction, thus minimizing the error in the detected position of the comparative object.Type: GrantFiled: January 10, 2002Date of Patent: March 15, 2005Assignee: Kabushiki Kaisha ShinkawaInventor: Kenji Sugawara
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Patent number: 6868175Abstract: First, a pattern inspection apparatus detects the first edge from an image of a pattern to-be-inspected. Next, the pattern inspection apparatus conducts matching of the image of the pattern to-be-inspected and the first reference pattern by comparing the first edge and an edge of the first reference pattern. Since, as a result of the matching, a shift quantity S1 can be obtained, and then the first reference pattern is shifted by this shift quantity S1. Subsequently the pattern to-be-inspected is inspected by comparing the first edge and the edge of the first reference pattern so shifted. In this first inspection, pattern deformation quantities are obtained and defects are detected. A shift quantity S2 can be obtained as one of the pattern deformation quantities. Next, in order to detect the second edge from the pattern image to-be-inspected, the corresponding second reference pattern is shifted by a shift quantity S1+S2.Type: GrantFiled: August 25, 2000Date of Patent: March 15, 2005Assignee: Nanogeometry ResearchInventors: Masahiro Yamamoto, Tadashi Kitamura
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Patent number: 6757420Abstract: The invention is concerned with the problem of providing an automatic inspection device, with which it is possible to determine, with little effort and without contact, whether packages, particularly sealed blister packages consisting of a blister container and a cover film, are free of defects. This problem is solved by the use of at least two light sources, which are arranged at a certain distance from one another and each emit a light bundle at a predetermined wavelength range, whereby the emission maxima of the two light sources are offset in relation to one another. The light sources are arranged such that the packages are vertically illuminated. The light reflected by the packages is recorded by a CCD camera and the digital images are stored in a computer, so that they are available in a computer-supported image-processing and documentation system.Type: GrantFiled: December 21, 2000Date of Patent: June 29, 2004Assignee: Novartis AGInventors: Andreas Krahn, Jürgen Saedler, Jan Schlegel, Anette Therese Lang-Schöll, Egbert Jux
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Patent number: 6754366Abstract: A method that enables the carrier of letters, flats and/or packages (mail) that are addressed to a recipient to determine if the mail contains life harming materials, before the mail is delivered to the recipient. The invention accomplishes the foregoing by receiving mail that is addressed to a recipient which contains material that may or may not be life harming; capturing an image of the face of the mail, which includes the name and physical address of the recipient; processing the image on the face of the mail to determine if characteristics of the image match characteristics of known mail that may contain life harming materials; testing the mail if the image contains characteristics of life harming material; and delivering the mail to the recipient if the image does not contain life harming characteristics.Type: GrantFiled: March 27, 2001Date of Patent: June 22, 2004Assignee: Pitney Bowes Inc.Inventor: Ronald P. Sansone
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Patent number: 6732921Abstract: In the system for managing a large number of reusable multi-trip receptacles each of which is marked by a code in an identifiable manner, the multi-trip receptacles are used in a number of cycles in several local stations (20, 21, 22) separated from each other and the code is read at each cycle. Data which have been recorded in the local stations. (20, 21, 22) for the individual multi-trip receptacles are stored allocated to the read code in a central station (10), and are evaluated to establish the number of cycles or uses of each multi-trip receptacle. The age and number of uses of each multi-trip receptacle is established using the data stored in the central station (10) and when a certain age or a certain number of cycles is reached, the local stations (20, 21, 22) are informed that the relevant multi-trip receptacle is no longer to be used.Type: GrantFiled: July 25, 2001Date of Patent: May 11, 2004Assignee: Heuft Systemtechnik GmbHInventors: Bernhard Heuft, Friedrich Wehren
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Patent number: 6678404Abstract: A method for creating and using reference images in a defect detection or location system which receives a plurality of learning images containing objects of interest and creates at least one reference image output. Using the reference image, the computer vision system detects discrepancies between objects of interest in an input image and the expected object from the reference images. The defect detection system generates a discrepancy image output. The computer vision system further determines the existence of the object of interest in an input image and provides the object of interest location if detected.Type: GrantFiled: October 31, 2000Date of Patent: January 13, 2004Inventors: Shih-Jong J. Lee, Seho Oh
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Patent number: 6661868Abstract: A radiation inspection apparatus is configured in such a way as to totalize pixels, whose gray levels represented by pixel gray level information, which is outputted from radiation detector, are within a preset gray level range of gray level profile from XL to XH, and to inspect from a result of the totalization whether or not a stockout of object occurs. Thus, the apparatus is enabled to correctly determine an occurrence of a stockout of the object by simple data processing without performing pattern recognition on a radiation perspective image.Type: GrantFiled: April 16, 2002Date of Patent: December 9, 2003Assignee: Shimadzu CorporationInventor: Ryoichi Sawada
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Patent number: 6661911Abstract: An automatic inspecting apparatus has a function for generating a discharge signal for discharging a defective object at a predetermined position. The automatic inspecting apparatus comprises an imaging device for imaging a moving object, a sensor for detecting the arrival of the object, an image processing unit for processing images produced by the imaging device to detect defective objects, and a discharge signal generating unit for discharging defective objects at a predetermined position. An ID number is assigned to each image produced by the imaging device, and pulses generated by an encoder start to be counted when each ID number is assigned. If the object is determined to be defective after image processing by the image processing unit, the discharge signal generating unit generates a discharge signal when the number of pulses counted for the corresponding ID number reaches a pulse number equivalent to the distance between the sensor position and the discharge position.Type: GrantFiled: June 1, 2000Date of Patent: December 9, 2003Assignee: Kirin Techno-System CorporationInventors: Tohru Ishikura, Hiroyuki Fukuchi, Yasuo Miwa, Takanori Hatsuki
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Patent number: 6614928Abstract: An automatic parcel volume capture system and an automatic parcel volume capture method are provided. An automatic parcel volume capture system in accordance with an embodiment of the present invention includes stereo image input means, image processing means, feature extraction means, and volume measurement means. The stereo image input means captures images of an object from at least two different angles. The image processing means performs signal-processing on the images captured by the stereo image input means and extracts region of object in the images. The feature extraction means extracts lines and cross points of the lines from results of the image processing means. The volume measurement means generates three dimensional model on the basis of the extracted images and measures volume of the object.Type: GrantFiled: February 1, 2000Date of Patent: September 2, 2003Assignee: Electronics and Telecommunications Research InstituteInventors: Yoon Su Chung, Hee Jeong Cheong, Jin Seog Kim, In So Kweon
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Publication number: 20030044056Abstract: A method for inspecting composite tape including cover tape bonded to carrier tape comprises capturing a digital image of the composite tape, dividing the seal tracks within the image into a plurality of fragments or segments. The method also provides for analyzing each segment of the seal track for the presence or absence of the seal and for the width of the seal, and assigning a failing grade to the segment if the seal is not continuous within the segment or if the seal has a width less than a minimum width within the segment. The method further provides for notifying a machine operator of a defective seal if the number consecutively-failed segments in the seal track exceeds a defect tolerance. The method also provides for measuring the spacings of the carrier tape edge, cover tape edge, and seal tracks from each other and comparing those spacings to acceptable values.Type: ApplicationFiled: June 13, 2002Publication date: March 6, 2003Applicant: Robotic Vision Systems, Inc.Inventors: Dallin Katt, Mark R. Shires, Robert G. Bertz, Michael Reilly, Merlin Behnke
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Patent number: 6525333Abstract: A system and method of the present invention allows the inspection of an object having an annular opening, such as a container or can, and uses a plurality of cameras that acquire grayscale images of arcuate sectors that together comprise a circumferential area within the opening. A processor is connected to the plurality of cameras for receiving the grayscale images and determining defects within the container based on contrast differences and grayscale intensity. The invention allows smart analysis of defects using qualitative inspections and quantitative measurements at higher speeds.Type: GrantFiled: July 18, 2000Date of Patent: February 25, 2003Assignee: Intelligent Machine Concepts, L.L.C.Inventors: Jeff Hooker, Timothy Hebert