Surface Area, Porosity, Imperfection, Or Alteration Patents (Class 436/5)
  • Patent number: 7105350
    Abstract: A method for evaluating the integrity of the closure on a hot-filled container in which the hot-filled container is subjected to a pressurized spray of cooling medium, including the step of providing a cooling medium having an effective amount of a fluorescing dye contained therein, is provided. The sealed container then is sprayed with the cooling liquid. After the container has exited the cooling portion of the filling and sealing operation, the container is subjected to ultraviolet light to activate any fluorescing dye which may have migrated past the closure into the interior of the container. The container is then viewed to determine the presence or absence of activated dye.
    Type: Grant
    Filed: August 30, 2002
    Date of Patent: September 12, 2006
    Assignee: Tropicana Products, Inc.
    Inventors: Tammy Foster, Tammy Svoboda
  • Patent number: 7004969
    Abstract: Artificial skin having a thickness of 100 to 1,000 ?m, and prepared from a polymer which, when formed into a thin film having a thickness of 100–1,000 ?m, exhibits a percent transmission of light having a wavelength of 450–280 nm of at least 10%. In the artificial skin of the present invention, grooves which imitate furrows are provided on one surface. Also disclosed is a method for evaluating UV screening agents making use of the artificial skin of the present invention, on the basis of the relation between UV shielding power of a UV screening agent and UV transmission through the artificial skin.
    Type: Grant
    Filed: December 17, 2002
    Date of Patent: February 28, 2006
    Assignee: Shiseido Company, Ltd.
    Inventors: Akira Ishikubo, Tohru Okamoto, Hideo Nakajima
  • Patent number: 6916657
    Abstract: An evaluation method for polycrystalline silicon including the steps of immersing the polycrystalline silicon in an agent which is capable of dissolving the polycrystalline silicon, and counting the number of foreign particles in the agent. The polycrystalline silicon thus evaluated may be used as a material for pulling single crystal silicon. The evaluation method may further include a step of analyzing the composition of the foreign particles. In yet another aspect, the evaluation method may further include a step of subjecting the agent to a circulation filtering process prior to the immersion of the polycrystalline silicon in the agent.
    Type: Grant
    Filed: May 31, 2001
    Date of Patent: July 12, 2005
    Assignees: Mitsubishi Materials Silicon Corporation, Mitsubishi Materials Polycrystalline Silicon Corporation
    Inventors: Kenji Hori, Go Sasaki
  • Patent number: 6890764
    Abstract: Described herein are assays and components for encoding and decoding microspheres. Each assay or component described utilizes at least one nanocrystal.
    Type: Grant
    Filed: December 31, 2002
    Date of Patent: May 10, 2005
    Assignee: Illumina, Inc.
    Inventors: Mark S. Chee, Steven M. Barnard, Chanfeng Zhao
  • Publication number: 20040266011
    Abstract: Provided is an in-situ analysis method for an atomic layer deposition (ALD) process. The provided method includes transferring a substrate to a reaction chamber in a vacuum container, depositing an atomic layer on the upper surface of the substrate, and analyzing the state of the atomic layer to determine the quality of the atomic layer in real time. Using the method decreases failure and the cost for additional analysis.
    Type: Application
    Filed: June 24, 2004
    Publication date: December 30, 2004
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Jae-cheol Lee, Chang-bin Lim, Ran-ju Jung
  • Publication number: 20040266012
    Abstract: Methods and devices for detecting photoresist coating failures are disclosed. A disclosed method to detect a photoresist coating failure on a semiconductor wafer comprises: loading a photoresist coated wafer on a notch position check block; rotating the coated wafer; detecting the position of a notch in the wafer; blowing air toward the surface of the wafer with at least one air nozzle located over the rotating wafer; detecting an amount of the air blown from the at least one air nozzle; and generating a coating failure signal if a variation in the amount of air blown from the at least one air nozzle is indicative of a photoresist coating failure.
    Type: Application
    Filed: June 24, 2004
    Publication date: December 30, 2004
    Inventor: Ook Hyun Kim
  • Patent number: 6833273
    Abstract: A method for evaluating concentration of metal impurities contained in a silicon wafer, which comprises dropping concentrated sulfuric acid onto a surface of the silicon wafer to extract metal impurities solid-solubilized in the inside of the silicon wafer into the concentrated sulfuric acid, and chemically analyzing metal impurities contained in the concentrated sulfuric acid. The problem imposed on high sensitivity evaluation of metals contained in silicon bulk is, in addition to increase of sensitivity of analysis apparatus itself, how to extract metals contained in a silicon wafer to a surface and recover them. This problem can be solved by the method of the present invention.
    Type: Grant
    Filed: September 25, 2001
    Date of Patent: December 21, 2004
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventor: Michihiro Mizuno
  • Publication number: 20040235177
    Abstract: The invention concerns a method for characterising the surface of a sensitive layer deposited on the base of an optical prism, said surface comprising active zones whereof the optical thickness is capable of varying with time, said method using a technique based on analysis of the reflective variation of the prism-sensitive layer interface. The method consists in causing: a collimated light beam with an angle of incidence enabling total reflection on the prism base to penetrate into the prism, said beam illuminating a fixed part of the interface corresponding to the part to be characterised; scanning at an angle so as to locate an incidence whereon the reflectivity of the active zones is minimal; determining an angle of incidence optimal for sensitivity of detection of the active zones; adjusting the incidence to the optimal value; and measuring the reflectivity with an imaging system. The invention also concerns a device for implementing said method.
    Type: Application
    Filed: January 21, 2004
    Publication date: November 25, 2004
    Inventors: Philippe Guedon, Yves Levy
  • Patent number: 6808928
    Abstract: A method of determining a surface property of a plurality of solids by contacting the solids with a fluid, measuring the radiation emitted, absorbed, or altered during desorption of the fluid using a detector, and then determining at least one surface property of the solids from the radiation measurements has been invented. The invention is particularly useful in combinatorial applications in order to evaluate a plurality of solids or mixtures of solids to determine at least one surface property of each of the solids.
    Type: Grant
    Filed: November 7, 2001
    Date of Patent: October 26, 2004
    Assignee: UOP LLC
    Inventors: LaSalle R. Swenson, Timothy A. Brandvold, Michael J. McCall, Kurt M. Vanden Bussche, Richard R. Willis
  • Publication number: 20040197920
    Abstract: A method of determining a surface property of a plurality of solids by contacting the solids with a fluid, measuring the radiation emitted, absorbed, or altered during desorption of the fluid using a detector, and then determining at least one surface property of the solids from the radiation measurements has been invented. The invention is particularly useful in combinatorial applications in order to evaluate a plurality of solids or mixtures of solids to determine at least one surface property of each of the solids.
    Type: Application
    Filed: September 30, 2003
    Publication date: October 7, 2004
    Inventors: LaSalle R. Swenson, Timothy A. Brandvold, Richard R. Willis, Kurt M. Vanden Bussche, Michael J. McCall
  • Publication number: 20040199436
    Abstract: The present invention relates to a method of specifying a batch, lot, or shipment of particulate material by using at least one interfacial potential property value to specify the batch, lot, or shipment of particulate material. A method of representing a grade, brand, or type of particulate material is also disclosed. At least one morphological value and/or chemical value may also be included. The values can be included on a product specification sheet.
    Type: Application
    Filed: August 27, 2003
    Publication date: October 7, 2004
    Inventors: Steven R. Reznek, Charles A. Gray, Ian D. Morrison, Steven E. Brown
  • Patent number: 6777238
    Abstract: A dual purpose corrosion inhibitor and penetrant composition sensitive to radiography interrogation is provided. The corrosion inhibitor mitigates or eliminates corrosion on the surface of a substrate upon which the corrosion inhibitor is applied. In addition, the corrosion inhibitor provides for the attenuation of a signal used during radiography interrogation thereby providing for detection of anomalies on the surface of the substrate.
    Type: Grant
    Filed: November 27, 2001
    Date of Patent: August 17, 2004
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Phillip B. Hall, Howard L. Novak
  • Publication number: 20040157333
    Abstract: Methods of analyzing pore structure in a microporous polyolefin film comprise applying a detectable material to one surface of a microporous polyolefin film, wherein the detectable material is capable of traveling through pores in the film, and focusing a confocal microscope at a depth within the film to obtain a first image of the detectable material within pores of the film at the depth within the film. Three-dimensional images of pore structure within a microporous polyolefin film comprise a plurality of aligned confocal microscope images wherein each confocal microscope image comprises a two-dimensional image of pore structure at a depth within the film.
    Type: Application
    Filed: November 5, 2003
    Publication date: August 12, 2004
    Inventors: Larry H. McAmish, David L Green
  • Publication number: 20040077091
    Abstract: A library of material samples is screened for properties such as permeability. A library of material samples is provided. A stimulus such as an exposure to a permeate fluid is provided to each member of the library. A response of each of the material samples due to the stimulus is measured and the response, the stimulus or both are recorded and related to provide data. Thereafter, the data is analyzed to reach conclusions regarding the properties of the material samples.
    Type: Application
    Filed: October 18, 2002
    Publication date: April 22, 2004
    Applicant: Symyx Technologies, Inc.
    Inventors: Damian A. Hajduk, Oleg Kolosov
  • Publication number: 20040065350
    Abstract: The invention provides method for the evaluation of washing or cleaning techniques on a substrate comprising:
    Type: Application
    Filed: October 3, 2003
    Publication date: April 8, 2004
    Applicant: Unilever Home & Personal Care USA, Division of Conopco, Inc.
    Inventors: Sudhir Achar, Nimish Harshadrai Shah
  • Patent number: 6686201
    Abstract: A sensor device is disclosed, as well as methods and systems for determining a barrier property of each coating of an array of barrier coatings deposited onto a fluid-permeable or fluid-impermeable substrate. The systems and methods include the sensor device having a sensing layer responsive to a fluid of interest for which the barrier property of the array of coatings are desired to be determined. The sensor device further includes an overlayer disposed between the array of barrier coatings and the sensing layer. The overlayer protects the sensing layer from being damaged by the coatings.
    Type: Grant
    Filed: April 4, 2001
    Date of Patent: February 3, 2004
    Assignee: General Electric Company
    Inventors: Radislav Alexandrovich Potyrailo, Joseph Richard Wetzel
  • Patent number: 6682932
    Abstract: A weathering test method comprising making active oxygen and light simultaneously act on a test piece, a weathering test method comprising successive and/or alternate steps of making active oxygen and light simultaneously act on a test piece and making at least one of light, oxygen, and water to act on the test piece, and apparatus for carrying out the methods are disclosed. In evaluating weatherability of organic materials, articles made of organic materials or articles coated with organic materials, the methods and apparatus achieve acceleration of deterioration of test pieces to greatly reduce the testing time.
    Type: Grant
    Filed: September 20, 1999
    Date of Patent: January 27, 2004
    Assignee: Kabushiki Kaisha Toyota Chuo Kenkyusho
    Inventors: Kanji Mori, Takeshi Narita, Kazuo Okamoto, Masao Tsuji, Kazuyuki Tachi
  • Patent number: 6649413
    Abstract: Methods and apparatus for the preparation and use of a substrate having an array of diverse materials in predefined regions thereon. A substrate having an array of diverse materials thereon is generally prepared by delivering components of materials to predefined regions on a substrate, and simultaneously reacting the components to form at least two materials. Materials which can be prepared using the methods and apparatus of the present invention include, for example, covalent network solids, ionic solids and molecular solids. More particularly, materials which can be prepared using the methods and apparatus of the present invention include, for example, inorganic materials, intermetallic materials, metal alloys, ceramic materials, organic materials, organometallic materials, non-biological organic polymers, composite materials (e.g., inorganic composites, organic composites, or combinations thereof), etc.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: November 18, 2003
    Assignees: Lawrence Berkeley National Laboratory, Symyx Technologies, Inc.
    Inventors: Peter G. Schultz, Xiaodong Xiang, Isy Goldwasser
  • Patent number: 6627443
    Abstract: The present invention relates to new color compositions which are especially suitable to be used in oxygen indicators. The compositions comprise iron(II), an agent containing pyrogallol entities and an organic acid.
    Type: Grant
    Filed: April 27, 2000
    Date of Patent: September 30, 2003
    Assignee: Fresenius Kabi AB
    Inventors: Åke Stenholm, Lars Karlsson, Anders Löfgren, Bo Nystrom, Otto Skolling
  • Publication number: 20030180954
    Abstract: A method of determining a molecular descriptor of absorption for a candidate compound is disclosed. The method includes: providing a test solution comprising one or more candidate compounds; contacting the test solution with a simulated biological membrane to partition the one or more candidate compounds into the membrane detecting the presence or amount of the one or more candidate compound in the membrane at one or more permeation times; and determining a molecular descriptor of absorption using the presence or amount of the one or more candidate compound in the membrane at the one or more permeation times. In one aspect the invention provides a skin-imitating membrane, and one or more percutaneous absorption parameters are determined. In another aspect the membrane is disposed on a fiber. In another aspect the test solution is contacted with two or more simulated biological membranes to partition the one or more candidate compounds into the membranes.
    Type: Application
    Filed: March 5, 2003
    Publication date: September 25, 2003
    Applicant: North Carolina State University
    Inventors: Jim E. Riviere, Xin-Rui Xia, Ronald E. Baynes, Nancy A. Monteiro-Riviere
  • Patent number: 6607918
    Abstract: A fluorescent probe is applied to bind to a metal oxide on a substrate and the substrate is exposed to an ultraviolet light to identify the metal oxide. A chemical cleaning or stripping solution is selected by combinatorial high throughput screening (CHTS). In the method, an array of regions is defined on a substrate, a candidate cleaning/stripping solution is deposited onto the regions to effect cleaning/stripping of the regions; a fluorescent probe is applied to bind to a metal oxide on the substrate; the substrate is exposed to an ultraviolet light to identify the metal oxide and a product of the cleaning/stripping is evaluated according to the identified metal oxide. An activated metal substrate composition is provided that comprises a metal substrate with a contaminant metal oxide coating and a fluorescent activator bound to the substrate by reaction with the metal oxide coating.
    Type: Grant
    Filed: February 1, 2001
    Date of Patent: August 19, 2003
    Assignee: General Electric Company
    Inventors: John Robert LaGraff, James Claude Carnahan, D Sangeeta, James Anthony Ruud
  • Publication number: 20030138957
    Abstract: A weathering test method comprising making active oxygen and light simultaneously act on a test piece, a weathering test method comprising successive and/or alternate steps of making active oxygen and light simultaneously act on a test piece and making at least one of light, oxygen, and water to act on the test piece, and apparatus for carrying out the methods are disclosed. In evaluating weatherability of organic materials, articles made of organic materials or articles coated with organic materials, the methods and apparatus achieve acceleration of deterioration of test pieces to greatly reduce the testing time.
    Type: Application
    Filed: September 20, 1999
    Publication date: July 24, 2003
    Inventors: KANJI MORI, TAKESHI NARITA, KAZUO OKAMOTO, MASAO TSUJI, KAZUYUKI TACHI
  • Patent number: 6544732
    Abstract: Described herein are assays and components for encoding and decoding microspheres. Each assay or component described utilizes at least one nanocrystal.
    Type: Grant
    Filed: May 20, 1999
    Date of Patent: April 8, 2003
    Assignee: Illumina, Inc.
    Inventors: Mark S. Chee, Steven M. Barnard, Chanfeng Zhao
  • Patent number: 6537816
    Abstract: An article of manufacture forms a tool for determining cleaning parameters of an oxide removal process. The article comprises a block of material upon which an oxide can be formed and a simulated defect structure disposed in the block of material. The article is capable of determining oxide removal parameters of an oxide removal process by disposing an oxidized standard in a reactor, conducting an oxide removal process to remove oxide from the standard, and evaluating the standard and simulated defect structure for remaining oxide and other oxide removal parameters.
    Type: Grant
    Filed: June 14, 1999
    Date of Patent: March 25, 2003
    Assignee: General Electric Company
    Inventors: Don Mark Lipkin, Paul Leonard Dupree, Scott Andrew Weaver
  • Patent number: 6537762
    Abstract: The present invention provides a peptide mimotope of the non-peptide mycotoxin deoxynivalenol. In particular, the peptide mimotope competes with deoxynivalenol for binding to a monoclonal antibody and is antagonistic to the inhibitory effects of deoxynivalenol on in vitro protein synthesis. The present invention also provides a method that uses the peptide mimotope to determine whether corn, grains or mixed feed is contaminated with fungi that produces deoxynivalenol. The present invention further provides transgenic plants resistant to deoxynivalenol.
    Type: Grant
    Filed: July 27, 2000
    Date of Patent: March 25, 2003
    Assignee: Board of Trustees of Michigan State University
    Inventors: Lynn Patrick Hart, James J. Pestka, Qiaoping Yuan
  • Publication number: 20030024817
    Abstract: The present invention relates to an apparatus for monitoring the progress of membrane fouling that occurs on pores as well as on the surface of a membrane by means of variations of zeta potential (&zgr;) of a hollow-fiber membrane according to time passage of filtration of a suspension, wherein colloid particles, biopolymers and other inorganic particles are dispersed, and the method thereof. Moreover, the present invention also relates to a method to identify the effect of concentration polarization layer and cake layer which can vary according to the axial position of a hollow-fiber and the developing progress of a membrane fouling by measuring the position-dependent zeta potential of the hollow-fiber membrane.
    Type: Application
    Filed: July 18, 2001
    Publication date: February 6, 2003
    Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Myung-Suk Chun, Jae-Jin Kim, Sang Yup Lee
  • Patent number: 6461812
    Abstract: Apparatus for delivering a plurality of different biological materials onto discrete locations on a receiving surface, as for example to fabricate an array of different biological material, includes a plurality of orifices in an orifice member, at least six delivery chambers each in fluid conducting relationship with at least one of the orifices, a plurality of reservoirs each in fluid communication with at least one of the delivery chambers, means associated with each orifice for propelling fluid through the associated orifice from the delivery chamber that is in fluid conducting relationship with the orifice, and a vent for commonly venting at least two of the reservoirs. In some embodiments the chambers and reservoirs are loaded with fluids containing selected biomolecules by drawing the selected fluids into the chambers through the orifices; in other embodiments the fluids are introduced into the reservoirs.
    Type: Grant
    Filed: September 9, 1998
    Date of Patent: October 8, 2002
    Assignee: Agilent Technologies, Inc.
    Inventors: Phillip W. Barth, Michael P. Caren, William H. McAllister, Carol T. Schembri, Arthur Schleifer
  • Patent number: 6448084
    Abstract: A method for preparing at least one metal layer of an integrated circuit for visual analysis. The at least one metal layer to be visually analyzed is exposed, and a solution of nitric acid, acetic acid, and ammonium fluoride is applied to the at least one metal layer. The at least one metal layer is rinsed to substantially remove the solution, and the s integrated circuit is dried. The solution is made with one part nitric acid, three parts acetic acid, and two parts ammonium fluoride. The nitric acid is a solution of about seventy percent by weight in water, the acetic acid is glacial acetic acid, and the ammonium fluoride is a solution of about forty percent by weight in water. The solution is at a temperature of about seventy degrees Fahrenheit, and is applied to the at least one metal layer by swabbing the solution onto the layer for between about ten seconds and about fifteen seconds. The step of exposing the at least one metal layer includes sawing the integrated circuit along a desired cross section.
    Type: Grant
    Filed: January 20, 2000
    Date of Patent: September 10, 2002
    Assignee: LSI Logic Corporation
    Inventors: Patricia M. Batteate, Kristine T. Griley
  • Publication number: 20020121148
    Abstract: An apparatus for automatically analyzing a trace substance capable of automatic analysis of a trace substance in a short time with high accuracy is provided. This apparatus comprises (a) samplers for making samples each containing a desired substance at different sampling points, (b) concentrators for concentrating the substance contained in the samples to thereby produce concentrated samples, (c) a quantitative analyzer for analyzing quantitatively the substance contained in the concentrated samples, and (d) a controller for controlling the samplers, the concentrators and the analyzer to cause automatically operations of the samplers, the concentrators, and the analyzer repeatedly at specific intervals of time. Each of the concentrators receives alternatively the samples from at least two ones of the samplers. The analyzer receives alternatively the concentrated samples from the concentrators.
    Type: Application
    Filed: June 29, 1999
    Publication date: September 5, 2002
    Inventors: TSUTOMU SHINOZAKI, MASARU SHIMOBAYASHI, YUUICHI SATOU
  • Patent number: 6399387
    Abstract: The present invention relates to new color compositions which are especially suitable to be used in oxygen indicators. The compositions comprise iron(II), an agent containing pyrogallol entities and an organic acid.
    Type: Grant
    Filed: January 22, 1999
    Date of Patent: June 4, 2002
    Assignee: Pharmacia AB
    Inventors: Åke Stenholm, Lars Karlsson, Anders Löfgren, Bo Nyström, Otto Skolling
  • Patent number: 6387704
    Abstract: For use in a sorption analysis system, a method compensating for measuring error due to the time-dependent evaporation of liquid coolant and the resulting change in the level of the coolant and temperature increase around the stem of the sample cell, during a gas sorption analysis of a sample in the sample cell. This error compensation does not inhibit coolant evaporation and is without recourse to mechanical means or other physical contrivances for causing the system to act as if the coolant were not evaporating. This method employs fixed and time-dependent data, including: changing coolant level and sample cell stem temperature changes, both of which can be obtained off-line, cold zone volume changes, and volumes of adsorptive gas transferred into the sample cell, to generate progressive error correction; whereby, system output is being corrected throughout the duration of the sorption analysis.
    Type: Grant
    Filed: April 17, 2000
    Date of Patent: May 14, 2002
    Assignee: Quantachrome Corporation
    Inventors: Martin A. Thomas, Nicholas N Novella, Seymour Lowell
  • Patent number: 6383815
    Abstract: Methods and devices are disclosed for measuring barrier properties of a barrier coating or coating arrays where each barrier coating has a small cross section. To reduce the edge effects in the measurements of barrier properties, measurements are made using a waveguide structure that includes at least one waveguide coated with a chemically sensitive layer and an array of barrier coatings. The coated waveguide is exposed to a material of interest that has the ability to produce an analyzable variation in the chemically sensitive layer, thereby providing the ability to detect an impact of the material of interest on the barrier coatings. In one variation, an initial light wave is propagated within the waveguide structure, a resulting wave associated with the initial wave and each barrier coating is detected, and any impacts on the coatings by the material of interest are correlated to a value of a barrier property for each of the array of barrier coatings.
    Type: Grant
    Filed: April 4, 2001
    Date of Patent: May 7, 2002
    Assignee: General Electric Company
    Inventor: Radislav Alexandrovich Potyrailo
  • Patent number: 6383816
    Abstract: A method for assessing a surface finish on a substrate. The method applies molecules that have an interaction with the substrate to the substrate. Then illuminating the surface of the substrate and monitoring the molecules on the surface of the substrate to determine the finish of the surface of the substrate.
    Type: Grant
    Filed: November 9, 1999
    Date of Patent: May 7, 2002
    Assignee: University of Delaware
    Inventors: Mary J. Wirth, Cozette Cuppett, Leon Doneski
  • Patent number: 6335202
    Abstract: This invention relates to a method and apparatus for on-line measurement of permeation characteristics (transmitting chemicals) through dense nonporous membrane. This invention is intended to facilitate various research activities, such as simultaneous analyses of diffusion coefficient, solubility coefficient, permeation rate and permeant composition, and presentation of new analysis about the permeation behavior, kinetics and so on. The object of this invention is to provide the method and apparatus for measurement of permeation characteristics of permeants in liquid, vapor or gas phase through dense nonporous membrane and more practicuraly, to provide permeation apparatus for measurement of permeation characteristics by analyzing permeation rate and permeation concentration of permeants through an on-line type dense porous membrane with time, not only for a steady state but also for an unsteady state in an accurate and reliable manner.
    Type: Grant
    Filed: June 10, 1999
    Date of Patent: January 1, 2002
    Assignee: Korea Research Institute of Chemical Technology
    Inventors: Jung Min Lee, Choong Kyun Yeom, Chul Ung Kim, Beom Sik Kim, Kwang Joo Kim
  • Publication number: 20010036666
    Abstract: A deterioration indicator for a resin mold member in a product includes a deteriorating state checking portion configured to allow evaluation of a deterioration state of the resin mold member. The deteriorating state checking portion includes a material whose weather resistance value, &Dgr;E, is less than a weather resistance value, &Dgr;E, of the resin mold member.
    Type: Application
    Filed: March 16, 2001
    Publication date: November 1, 2001
    Applicant: Ricoh Company, Ltd.
    Inventor: Toshiro Sahashi
  • Publication number: 20010033815
    Abstract: A process for checking the operability of an exhaust gas purification catalyst for diesel engines, which has a light-off temperature and a degree of conversion rCO for carbon monoxide (CO), by direct measurement of the carbon monoxide concentration in combination with a temperature measurement.
    Type: Application
    Filed: March 16, 2001
    Publication date: October 25, 2001
    Inventors: Ulrich Neuhausen, Harald Klein, Egbert Lox, Jurgen Gieshoff, Thomas Kreuzer
  • Patent number: 6306349
    Abstract: The present invention relates to a catalyst characterization apparatus, and in particular to an improved catalyst characterization apparatus which is capable of characterizing the surface of a catalyst more accurately by a volumetric method without requiring a pre-treatment step which may vary the characteristics of the catalyst as well as without exposing the catalyst in air, by combining a dynamic flow type reactor with a volumetric type adsorption apparatus, whereby it is possible to accurately characterize the catalyst during an actual reaction. It is possible to accurately characterize the various catalysts and to characterize the catalyst during the reaction, alternately and/or continuously, by combining a dynamic flow type reactor with a volumetric type characterization apparatus as well as a dynamic flow type characterization apparatus.
    Type: Grant
    Filed: November 29, 1999
    Date of Patent: October 23, 2001
    Assignee: Korea Institute of Science and Technology
    Inventors: Dong Ju Moon, Kun You Park, Moon Jo Chung, Byoung Sung Ahn
  • Patent number: 6261843
    Abstract: A method and metal test pattern for monitoring metal corrosion susceptibility for integrated circuit wafers. Test patterns having an array of metal circles to simulate contact regions, an array of metal strips to simulate electrode regions, and a blanket metal layer to simulate bulk metal regions are formed. A first number of defects per unit area for the test patterns is measured, using a defect scan system. The test pattern wafers are then subjected to environmental stress conditions for a first time and a second number of defects per unit area for the test patterns is measured, again using a defect scan system. The difference between the second number and the first number is compared with a critical number. If excessive corrosion occurs the process for producing wafers is corrected before continuing to process product wafers.
    Type: Grant
    Filed: December 10, 1998
    Date of Patent: July 17, 2001
    Assignee: Taiwan Semiconductor Manufacturing Company
    Inventors: Chao-Hsin Chang, Hsien-Wen Chang, Chih-Chien Hung, Kuang-Hui Chang
  • Patent number: 6242260
    Abstract: A measuring method for determining the specific surface area available for reaction of a noble metal catalyst of an electrode for use in a polymer electrolyte membrane fuel cell. The method includes measuring the total specific surface area of the noble metal catalyst and the specific surface area of the noble metal catalyst mixed with a polymer electrolyte by detecting the adsorption amounts of carbon monoxide upon exposure to carbon monoxide after reduction in hydrogen, and subtracting the latter from the former. Also provided is an electrode material for use in a polymer electrolyte membrane fuel cell having excellent polarization characteristics by controlling the utilization of a noble metal catalyst determined from the total specific surface area and specific surface area available for reaction of the noble metal catalyst.
    Type: Grant
    Filed: October 28, 1998
    Date of Patent: June 5, 2001
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Yasushi Sugawara, Makoto Uchida, Yuko Fukuoka, Nobuo Eda
  • Patent number: 6174727
    Abstract: A silicon wafer having microscopic defects is immersed into the diluted hydrofluoric acid with spiking metal salt such as CuSO4.5H2O for 1 to 3 minutes. After immersing, metals which have selectively deposited on the microscopic defects are detected by using particle counters.
    Type: Grant
    Filed: November 3, 1998
    Date of Patent: January 16, 2001
    Assignees: Komatsu Electronic Metals, Co., The University Board of Trustees of the Leland Stanford Junior
    Inventors: Takayuki Homma, Christopher E. D. Chidsey, Masaharu Watanabe
  • Patent number: 6162738
    Abstract: A cleaning method includes providing a stack including at least a layer of Ta.sub.2 O.sub.5 and a layer of conductive material. The stack includes a conductive etch residue on at least portions thereof. A dilute aqueous composition is provided including hydrochloric acid (HCl), hydrogen peroxide (H.sub.2 O.sub.2), and deionized water (H.sub.2 O). The stack is exposed to the dilute aqueous composition to remove the conductive etch residue. The dilute aqueous composition may include a ratio of H.sub.2 O:H.sub.2 O.sub.2 :HCl in a range of about 100:1:0.5 to about 100:10:5. A cleaning composition for use in the method includes a dilute aqueous composition including hydrochloric acid (HCl), hydrogen peroxide (H.sub.2 O.sub.2), and deionized water (H.sub.2 O).
    Type: Grant
    Filed: September 1, 1998
    Date of Patent: December 19, 2000
    Assignee: Micron Technology, Inc.
    Inventors: Gary Chen, Li Li
  • Patent number: 6097484
    Abstract: A method for amplifying defects connected to a top surface of a semiconductor device comprises the steps of applying a dye, removing the dye, and applying a developing gel. The dye enters into defects connected to the top surface of the semiconductor device. After removal of the dye from the top surface and application of the developing gel, the dye contained within the defects leaches into the developing gel to form defect indications. These defect indications have a better optical visibility than the defects themselves. An apparatus for performing this method is also disclosed.
    Type: Grant
    Filed: July 15, 1999
    Date of Patent: August 1, 2000
    Assignee: Lucent Technologies, Inc.
    Inventors: John M. McIntosh, Brittin C. Kane, Annette M. Crevasse, Todd C. Henry
  • Patent number: 6096550
    Abstract: A method of testing a material without the use of animals to determine the potential of the material to harm human or animal cells due to contact includes forming a biomembrane having at least some constituent matter of human or animal tissue, applying a quantity of material to the membrane, maintaining the biomembrane and quantity of material in contact for a period of time, and monitoring the change in the physical properties of the biomembrane caused by the quantity of material.
    Type: Grant
    Filed: April 30, 1998
    Date of Patent: August 1, 2000
    Inventor: Brian P. Argo
  • Patent number: 6087179
    Abstract: A non-destructive testing method for revealing surface and through defects in materials and articles. The method comprises filling up defects with a volatile penetrant, applying indicator material to a surface to be tested, removing the indicator material from the surface and registrating defects according to the presence color spots, shapes and dimensions which are functions of shapes and dimensions of real defects. The indicator material comprises a gas-permeable base with applied sulfonephthalein indicator in the range of 10.sup.-4 to 10.sup.-3 grams per 1 cubic centimeter of the base.
    Type: Grant
    Filed: October 26, 1994
    Date of Patent: July 11, 2000
    Assignees: Marvic Ltd., Marotta Scientific Controls, Inc.
    Inventors: Nadejda G. Beriozkina, Ilia O. Leipunsky, Victor J. Maklashevsky
  • Patent number: 6022720
    Abstract: The present invention relates, in general, to a protein that regulates programmed cell death and, in particular, to the pro-apoptotic protein, Bax, which forms channels in lipid membranes. The invention further relates to methods of identifying agonists and antagonists of Bax channel formation and/or activity and thereby agents that can be used therapeutically to promote or inhibit cell death.
    Type: Grant
    Filed: July 17, 1997
    Date of Patent: February 8, 2000
    Assignee: Glaxo Wellcome Inc.
    Inventors: Jean-Claude Martinou, Remy Sadoul, Bruno Antonsson, Franco Conti, Gonzalo Mazzei
  • Patent number: 6005668
    Abstract: A "highlighter" liquid for detecting cosmetic defects in non-metallic surfaces, particularly those intended for high quality automotive finishes comprises organic substances each molecule of which contains at least one continuosly chemically bonded chain or ring of atoms in which there are at least two carbon atoms and at least two oxygen, nitrogen, sulfur, and phosphorus heteroatoms, the carbon atoms and heteroatoms being arranged in such an order along the chain or ring that (i) each heteroatom is bonded to at least one carbon atom and (ii) the chain does not include more than three consecutive continuosly chemically bonded carbon atoms. Particularly suitable materials include glycerin, propylene glycol, low molecular weight glycol condensation polymers, and monoethers of these glycol condensation polymers. Water is also usually present in the highlighter liquid, which has a long open time and does not damage the substrate even if left in place for a day or more.
    Type: Grant
    Filed: July 9, 1998
    Date of Patent: December 21, 1999
    Assignee: Henkel Corporation
    Inventors: Theodore D. Held, III, Gerald J. Cormier
  • Patent number: 5965446
    Abstract: A method for placing fluorescent single molecules on a surface of a substrate includes dropping a sample solution in which fluorescent molecules are dissolved in a predetermined concentration in a volatile, organic solvent, onto a slip of paper placed on the substrate and pulling the slip of paper so as to make the dropped sample solution traverse the surface of the substrate before the organic solvent evaporates. Since a single molecular layer of fluorescent molecules with high uniformity can be placed readily on the surface of the substrate, measurement of fluorescence and measurement of scattered light can be carried out accurately and structural defects of the surface of substrate can be visualized from luminous spots of fluorescence and from luminous spots of scattered light.
    Type: Grant
    Filed: October 24, 1997
    Date of Patent: October 12, 1999
    Assignee: Hamamatsu Photonics K.K.
    Inventor: Mitsuru Ishikawa
  • Patent number: 5928948
    Abstract: A porous material (10) is contaminated with soil (14). Optionally, the porous material is partially shielded by an impermeable layer. The contaminated porous material is packaged and shipped to a user site. The contaminated porous material is removed from the package and placed in an automated processor containing medical equipment (22). The medical equipment and porous material are subjected to a cleaning, disinfecting, or sterilizing cycle in the processor. The cleaning process is evaluated by examining the porous material with an infrared or other electronic reader (24) to determine the presence of remaining soil which has not be removed during the cleaning, disinfecting, or sterilizing cycle.
    Type: Grant
    Filed: March 10, 1997
    Date of Patent: July 27, 1999
    Assignee: Steris Corporation
    Inventor: Paul S. Malchesky
  • Patent number: 5916811
    Abstract: The present invention relates to a method and apparatus for quantitative determination of the level of spalling of a protective surface coating as a result of repetitive heating and cooling. The method comprises introducing at least one radionuclide into the protective coating of an article, alternately heating and cooling the article for a predetermined number of heating and cooling cycles, collecting the spalled particles and measuring the radioactivity thereof. The apparatus comprises a chamber for receiving the coated article, means for heating the chamber or the article and a spall collector. The spall collector is characterized in having means for immobilizing any spalled coating particles and in being so adapted that the level of radioactivity of any spalled particles can be measured by a .gamma.-spectrometer.
    Type: Grant
    Filed: January 11, 1996
    Date of Patent: June 29, 1999
    Assignee: European Economic Community
    Inventors: Marinus Freder Stroosnijder, Giovanni Michele Macchi
  • Patent number: 5910445
    Abstract: The use of an aqueous, synthetic composition containing Ca.sup.++ and having a controlled, specified pH value for revealing the presence of protein contamination on the membrane of a pH measuring electrode.
    Type: Grant
    Filed: August 6, 1991
    Date of Patent: June 8, 1999
    Assignee: Rolic AG
    Inventor: Eiler Larsen