Test Probe Patents (Class 439/169)
  • Patent number: 11588264
    Abstract: An electrical connector comprising a plug arranged and designed to connect to a receptacle. The plug includes an electrically-insulating body, a conductor ring, and a conductive member connected to the plug conductor ring. The receptacle includes an electrically-insulating body, a conductor ring having an axial inner bore and an annular groove facing radially inward, a conductive member connected to the receptacle conductor ring, and an electrically-conductive contact having a generally annular profile, at least a portion of the electrically-conductive contact received in and contacting the annular groove and at least a portion of the electrically-conductive contact not received in the annular groove. Upon insertion of the plug into the receptacle and substantially radially aligning the plug and receptacle conductor rings, the electrically-conductive contact is elastically deformed and provides electrical contact between the plug conductor ring and the receptacle conductor ring.
    Type: Grant
    Filed: November 30, 2021
    Date of Patent: February 21, 2023
    Assignee: RAMPART PRODUCTS LLC
    Inventors: Sean W. Carter, Michael A. Czuppon, Edward J. Beshoory
  • Patent number: 11056252
    Abstract: Electrical signal transmission cable systems and methods of using the same are disclosed. The systems and methods use an electrical signal transmission cable system, wherein the electrical signal transmission cable system includes a parallel set of electrical signal transmission cables in electrical communication between an electrical signal transmitting device and an electrical signal receiving device.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: July 6, 2021
    Inventors: Douglas W Schroeder, Daniel W Celander
  • Patent number: 9134343
    Abstract: An apparatus includes a robot and a sort probe gripper. The sort probe gripper includes a body, a jaw mount inserted into the body, a plurality of grippers mounted in the jaw mount and an actuator sleeve slidable along the body to engage the plurality of grippers.
    Type: Grant
    Filed: September 28, 2012
    Date of Patent: September 15, 2015
    Assignee: Intel Corporation
    Inventors: David Shia, Todd P. Albertson
  • Patent number: 9124022
    Abstract: In an accommodation space formed by a rotator and a stator, a flat cable and a dummy cable are accommodated. A retainer placed in a bottom part of the accommodation space is provided with a press guide for allowing a reversed part of the dummy cable, at which a winding direction thereof is reversed, to be pressed thereon.
    Type: Grant
    Filed: September 9, 2013
    Date of Patent: September 1, 2015
    Assignees: FURUKAWA ELECTRIC CO., LTD., FURUKAWA AUTOMOTIVE SYSTEMS INC.
    Inventor: Ryoichi Adachi
  • Patent number: 9081033
    Abstract: A testing arrangement is provided for testing the electrical circuits of an assembly of terminal blocks arranged in side-to-side relation, each of the terminal blocks including two mutually-insulated collinearly-arranged horizontal bus bar sections that are normally electrically connected by first and second pairs of leaf spring contacts arranged above and below the bus bar sections, respectively. During the testing operation, the testing device may be arranged either above or below the assembly, and an insulating test plug on the testing device is inserted either vertically downwardly from above, or upwardly from below, the terminal block, thereby to disengage one pair of contacts. A dummy plug is vertically inserted in the opposite direction to disengage the other pair of contacts. The remote ends of the bus bar sections are provided with clamping devices for connection with the bare ends of insulated conductors, respectively.
    Type: Grant
    Filed: May 21, 2012
    Date of Patent: July 14, 2015
    Assignee: WEIDMUELLER INTERFACE GMBH & CO. KG
    Inventors: Frank Hackemack, Joerg Richts, Bernhard Jaschke
  • Patent number: 9075084
    Abstract: A testing arrangement for testing the electrical circuits of a terminal block assembly, comprising a generally rectangular testing unit housing formed of insulating material and containing a chamber, at least one connection device mounted in chamber and having an elongated connector body formed of insulating material and including center and end portions. An integral measuring tab portion extends downwardly from the body center portion for insertion into a testing opening contained in the terminal block assembly, and a pair of coplanar measurement portions extend upwardly from the connector body ends and terminating at different elevations, thereby to afford a compact testing arrangement. Two electrical circuit connecting portions are mounted on the connector body, each including an input conductive contact plate mounted on one side of said measuring tab portion, and an output contact mounted within one of said measurement portions for connection with one end of a testing component.
    Type: Grant
    Filed: May 21, 2012
    Date of Patent: July 7, 2015
    Assignee: WEIDMUELLER INTERFACE GMBH & CO. KG
    Inventors: Frank Hackemack, Joerg Richts, Bernhard Jaschke
  • Patent number: 8922234
    Abstract: A probe card for conducting an electrical test on a test subject includes a substrate body including a first surface, which faces toward the test subject, and a second surface, which is opposite to the first surface. A through electrode extends through the substrate body between the first surface and the second surface. A contact bump is formed in correspondence with the electrode pad and electrically connected to the through electrode. An elastic body is filled in an accommodating portion, which is formed in the substrate body extending from the first surface toward the second surface. The contact bump is formed on the elastic body.
    Type: Grant
    Filed: October 30, 2013
    Date of Patent: December 30, 2014
    Assignee: Shinko Electric Industries Co., Ltd.
    Inventors: Akinori Shiraishi, Hideaki Sakaguchi, Mitsutoshi Higashi
  • Publication number: 20140273569
    Abstract: An adapter for attaching an active probe to a device under test is disclosed. According to one aspect, an active probe adapter includes an adapter body for connecting an active probe to a device under test (DUT), the adaptor body having an impedance controlled conducting path for connecting a signal of the DUT to a signal input of the active probe, the path including a signal conductor and a reference conductor. The adapter body includes probe-side electrical contacts for electrically connecting an active probe to the signal and reference conductors of the adapter, and a set of DUT-side electrical contacts for electrically connecting the signal and reference conductors of the adapter to the DUT via one or more connectors attached to the contacts. The DUT-side electrical contacts are physically arranged to allow different orientations of the connector relative to the adapter body.
    Type: Application
    Filed: March 13, 2013
    Publication date: September 18, 2014
    Applicant: SanDisk Technologies Inc.
    Inventor: Max Jakobson
  • Patent number: 8710856
    Abstract: A terminal end for a flat test probe having tapered cam surfaces providing a lead-in angle on the tail of the terminal end which extend to a sharp rear angle to engage detents or projections within a receptacle. The tapered cam surfaces and shape rear angles allow the probe to be inserted into the receptacle with minimal force to retain the flat test probe within the receptacle.
    Type: Grant
    Filed: December 14, 2010
    Date of Patent: April 29, 2014
    Assignee: LTX Credence Corporation
    Inventors: Mark A. Swart, Kenneth R. Snyder
  • Patent number: 8502550
    Abstract: There is provided an operation control structure for a continuity test device for performing lock of a connector and actuation of a continuity test part timely, low cost, easily, and surely including a connector attachment part 3, a continuity test part 4 having a probe pin 12, a first cylinder 16 for locking a connector 10 in the connector attachment part, a second cylinder 15 for moving the continuity test part to the connector attachment part, wherein plugs 30 and 54 of the first cylinder and the second cylinder respectively are supplied with the same pressured air, a speed control valve 26 being provided within a plug 30 of the second cylinder 15, a fine hole 28 thinner than a hole 56 in a plug 54 of the first cylinder being provided in the speed control valve, and wherein the continuity test part is actuated by the second cylinder through the fine hole following lock of the connector by the first cylinder.
    Type: Grant
    Filed: July 15, 2011
    Date of Patent: August 6, 2013
    Assignee: Yazaki Corporation
    Inventor: Kozo Kogasumi
  • Patent number: 8277236
    Abstract: A calibration adapter with coaxial connector for connecting to a complementary coaxial connector of a device to be calibrated, where the coaxial connector has an inner conductor part, an outer conductor part arranged coaxially thereto, and a male termination. The calibration adapter has a drum where at least two calibration standards are arranged, the drum is rotatably arranged on a pin connected centrally to a first cap such that a longitudinal axis of the pin is flush with a longitudinal axis of the first cap. The coaxial connector with a second termination opposite the male termination, is connected eccentrically to the longitudinal axis of the first cap, and the at least two calibration standards are arranged in the drum such that by the rotation of the drum relative to the first cap, the second termination can be optionally connected to one of the calibration standards.
    Type: Grant
    Filed: January 31, 2008
    Date of Patent: October 2, 2012
    Assignee: Rosenberger Hochfrequenztechnik GmbH & Co. KG
    Inventor: Frank Weiss
  • Publication number: 20110124215
    Abstract: A jig for probe connector adapted for clutching a plurality of probe assemblies each of which has a connecting portion, a probing pin and a soldering portion disposed at two ends of the connecting portion respectively. The jig for probe connector has a base body. The base body has a plurality of passageways each penetrating a front end thereof. The passageway includes a first receiving recess and a second receiving recess disposed at a front of the first receiving recess. A cross section of the second receiving recess is larger than that of the first receiving recess, with a drop defined as a preventing portion formed therebetween. A side of the second receiving recess has a portion protruded inward to form a buckling lump, which is spaced from the preventing portion with a predetermined distance.
    Type: Application
    Filed: November 26, 2009
    Publication date: May 26, 2011
    Inventors: Te-Hung Yin, Jui-Pin Lin, Yung-Yi Chen
  • Patent number: 7928738
    Abstract: A detecting system for detecting the connection of two connectors includes a number of first and second linking lines. The detecting system includes a number of first detection switches, a number of pull-down resistors, a number of second detection switches, a number of pull-up resistors, and a detection module. Each first linking line is grounded via each first detection switch and each pull-down resistor in series. The terminals of the pull-down resistors connected to the first detection switches are defined as first detecting ends. Each second linking line is electrically coupled to a high potential via each second detection switch and each pull-up resistors in series. The detection module with a threshold value preset is configured for comparing the voltage value at the first detecting ends with the threshold value, and outputting a result to determine whether the first linking lines are electrically connected to the second linking lines respectively.
    Type: Grant
    Filed: May 20, 2009
    Date of Patent: April 19, 2011
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventor: Kim-Yeung Sip
  • Publication number: 20100330830
    Abstract: A vertical probe interface system includes a flex PCB system where a portion of the flex PCB is pressed together to form a solid board and the other portion of the flex PCB is in layer or layers form. A metal plate mounts the flex PCB to the stiffener of the probe interface board. The flex PCB is electrically connected to the probe interface board by connectors, soldering or other known method.
    Type: Application
    Filed: June 25, 2009
    Publication date: December 30, 2010
    Applicant: Corad Technology Inc.
    Inventor: Ka Ng Chui
  • Patent number: 7857642
    Abstract: A probe tip for use with an inductive amplifier unit having an inductive generator circuit connected to an indicator, such as an acoustic transducer. The tip includes a substantially non-conducting inductive member having a distal end insertable into an opening of a communication jack housing contacts and having a keyway portion. The tip includes a conductive member having a first end portion at least partially encased inside the distal end of the inductive member and a second end portion extending outwardly away therefrom. The distal end has a key portion configured to be received inside the keyway portion of the jack. Engagement between the key member and the keyway member prevents lateral movement of the distal end across the contacts inside the opening. The second end portion is connectable to the circuit, which is configured to use the indicator to indicate to a user when the tip detects a signal.
    Type: Grant
    Filed: September 2, 2009
    Date of Patent: December 28, 2010
    Assignee: Leviton Manufacturing Co., Inc.
    Inventor: Dennis L. Manes
  • Patent number: 7746090
    Abstract: A system for testing connections of two connectors, each of which includes a pair of verification pins and a number of signal pins, includes a verification testing module, a controlling module, a signal testing module, and a reporting module. The verification testing module is configured for detecting whether each pair of verification pins are electrically connected. The controlling module is configured for allowing communication between each pair of signal pins if the pair of verification pins is detected to be electrically connected. The signal testing module is configured for testing whether each pair of signal pins are electrically connected. The reporting module is configured for reporting the results of the verification testing module and the signal testing module.
    Type: Grant
    Filed: March 27, 2009
    Date of Patent: June 29, 2010
    Assignees: Hong Gu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventor: Kim-Yeung Sip
  • Patent number: 7697270
    Abstract: A portable electronic device includes a stationary cover (10), a sliding mechanism (40) fixed with the stationary cover, a first sliding body (20) slidably connected to the sliding mechanism; and a second sliding body (30) slidably connected to the sliding mechanism and arranged to be abreast with the first sliding body. The stationary cover is slidably connected with the first sliding body and the second sliding body by the sliding mechanism, and the first sliding body and/or the second sliding body are/is operative to reveal out from the stationary cover.
    Type: Grant
    Filed: December 26, 2007
    Date of Patent: April 13, 2010
    Assignee: Chi Mei Communication Systems, Inc.
    Inventor: Ping-Chou Chen
  • Patent number: 7663387
    Abstract: A support block has a first face, a second face opposed to the first face, and first and second through holes communicating between the first face and the second face, and is formed with resin material. The first face, the second face, and the first and second through holes are covered with an electrically conductive plated coating. First and second probes are electrically connected to terminals of a device to be tested provided on a side of the first face and to terminals connected to a testing apparatus provided on a side of the second face. The first probe is provided in the first through hole and is electrically connected to the plated coating on the first through hole, the second probe is provided in the second through hole and is electrically connected to the plated coating on the second through hole.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: February 16, 2010
    Assignee: Yokowo Co., Ltd.
    Inventors: Takuto Yoshida, Alvy V. Padiyil
  • Patent number: 7349223
    Abstract: Several embodiments of enhanced integrated circuit probe card and package assemblies are disclosed, which extend the mechanical compliance of both MEMS and thin-film fabricated probes, such that these types of spring probe structures can be used to test one or more integrated circuits on a semiconductor wafer. Several embodiments of probe card assemblies, which provide tight signal pad pitch compliance and/or enable high levels of parallel testing in commercial wafer probing equipment, are disclosed. In some preferred embodiments, the probe card assembly structures include separable standard components, which reduce assembly manufacturing cost and manufacturing time. These structures and assemblies enable high speed testing in wafer form. The probes also have built in mechanical protection for both the integrated circuits and the MEMS or thin film fabricated spring tips and probe layout structures on substrates.
    Type: Grant
    Filed: June 16, 2004
    Date of Patent: March 25, 2008
    Assignee: Nanonexus, Inc.
    Inventors: Joseph Michael Haemer, Fu Chiung Chong, Douglas N. Modlin
  • Patent number: 7199596
    Abstract: A manual testing instrument 1 is configured by an IC device holding member 2 mounted on a socket guide 6 in a removable way and capable of regulating a position of an IC device 7 in the planar direction with respect to connection terminals of a socket 51; and a height regulating device 3, a position of which is variable in the height direction, having a contact member 31 for contacting an upper surface of the IC device 7 and regulating a position of the IC device 7 in the height direction. A position of the contact member 31 in the height direction can be changed by combination of a block 35 formed with a plurality of grooves 351 having different depths and a regulating member 34 formed with an arm portion 342 to fit in a groove 351 on the block 35.
    Type: Grant
    Filed: December 6, 2005
    Date of Patent: April 3, 2007
    Assignee: Advantest Corporation
    Inventor: Masanori Nagashima
  • Patent number: 7056134
    Abstract: A attachable/detachable probing tip system (10) has a housing (12) that includes a probing tip mounting member (14) and opposing substantially orthogonal attachment (16, 18) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member (56). First and second probing tips (42, 44) are disposed over the non-compressive, resilient member (56) and secured to the housing by latching means (60, 66, 92, 96, 100, 130). The attachable/detachable probing tip system allows mounting of the probing tips (42, 44) to probing contacts on a device under test without a probe body or probing tip member (38) being attached. The attachment arms (16, 18) allows a probe body or probing tip member (38) to be attached and detached to the probing tip system (10). The probing tip member (38) includes contact pins that engage contact areas (82, 82, 92) of the probing tips (42, 44).
    Type: Grant
    Filed: May 27, 2004
    Date of Patent: June 6, 2006
    Assignee: Tektronix, Inc.
    Inventors: Jim L. Martin, Marc A. Gessford, William R. Pooley, William Q. Law, Ira G. Pollock, William A. Hagerup
  • Patent number: 7052297
    Abstract: A connector that includes a male connector assembly having a nose portion that removably fits within an axial cavity in a female connector assembly and which has removable, replaceable contacts. The connector assemblies are constructed for attachment to equipment and instrumentation in wet or dry environments. Each connector assembly may include a plurality of conductors that are constructed for attachment to conductors in the equipment and instrumentation. Each conductor in the male connector assembly is matched with a conductor in the female connector assembly for transmission of a signal therethrough. Electrical contacts within the connector assemblies provide individual contact of the matching conductors. Insulators separate and insulate the electrical contacts from one another.
    Type: Grant
    Filed: August 25, 2004
    Date of Patent: May 30, 2006
    Assignee: Wireline Technologies, Inc.
    Inventors: Mario Panzar, Alan L. Carmichael
  • Patent number: 6966782
    Abstract: An adapter includes a wireless card, and a bracket fixed on the wireless card. The bracket includes a base plate that has an aperture for positioning an antenna terminal, and a mask extended from the base plate for substantially shielding an end of the antenna terminal welded on the wireless LAN card inside the mask.
    Type: Grant
    Filed: June 4, 2004
    Date of Patent: November 22, 2005
    Assignee: Micro-Star Int'l Co., Ltd.
    Inventors: Cheng-Kuo Wang, Chen-Hsiung Mo
  • Patent number: 6773938
    Abstract: Various aspects of the invention provide methods of manufacturing probe cards and test systems which may test microelectronic components using such probe cards. In one specific example, a probe card may be manufactured by forming a plurality of blind holes in a substrate, with each hole having a closed bottom spaced from a back of the substrate by a back thickness. An electrically conductive metal may be deposited on the substrate to fill the holes and define an overburden on the substrate. The metal in each hole may define a conductor. At least a portion of the overburden may be removed to electrically isolate each of the conductors from one another. A portion of the substrate including the back thickness is removed to define an array of pins extending outwardly from a remaining thickness of the substrate, with each pin being an exposed length of one of the conductors.
    Type: Grant
    Filed: August 29, 2002
    Date of Patent: August 10, 2004
    Assignee: Micron Technology, Inc.
    Inventors: Alan G. Wood, Trung T. Doan, David R. Hembree
  • Patent number: 6404215
    Abstract: A variable spacing probe tip adapter for a differential measurement probe has a measurement probe head with first and second probe tips extending from the probe head. Ribs and grooves formed in the probe head that extend radially from around each of the probe tips. Each of first and second first probing tips have an electrically conductive shaft that has a bore formed in one end for engaging the probe tips of the measurement probe. Each shaft has ribs and grooves formed therein that extend radially from the bore for engaging the corresponding grooves and ribs in the probe head. The other end of the conductive shaft tapers to a probing point with and a portion of the shaft toward the tapered end of the shaft being angled such that the probing tips. The conductive shafts are rotatable on measurement probe tips and locked into position by the engagement of the ribs and grooves in the probe head and the probing tips.
    Type: Grant
    Filed: November 16, 2000
    Date of Patent: June 11, 2002
    Assignee: Tektronix, Inc.
    Inventors: Mark W. Nightingale, R. Kenneth Price, William Q. Law
  • Patent number: 6351405
    Abstract: An integrated circuit device having a first type of pads with a probing portion and a bonding portion. The integrated circuit device includes a memory cell array, a logic circuit, and a plurality of the first type of pads and a plurality of a second type of pads. The second type of pads are electrically connected to the logic circuit. The first type of pads are electrically connected to the memory cell array and the logic circuit. Only the probing portion of the first type of pads is contacted by probes during testing of the memory cell array, and the bonding portion is used exclusively for attachment of a bond wire to permit connection to an external system.
    Type: Grant
    Filed: June 15, 2000
    Date of Patent: February 26, 2002
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Yong-hee Lee, Kyu-hyung Kwon
  • Publication number: 20010055900
    Abstract: A contact pin for use in a contactor for inspecting electrical characteristics of a to-be-inspected object, comprising a shank having a lower end surface directed to the to-be-inspected object, and a needle end section provided on a portion of the lower end surface. At least part of that portion of the lower end surface, on which the needle end section is not provided, serves as a reflection surface for enabling optical detection of the contact pin.
    Type: Application
    Filed: June 5, 2001
    Publication date: December 27, 2001
    Inventor: Rikihito Yamasaka
  • Patent number: 6254425
    Abstract: A temporary cardiac pacing wire, or a similar device, includes a pair of flexible electrode wires extending conjointly from a distal end of the pacing wire to its proximal end, where two electrically conductive sections are located. The conductive sections are suitable for connection to a power source adapted to generate electrical signals for stimulating, pacing, sensing, monitoring or defibrillating the heart of a patient. One conductive section results from the distal end of a Keith-type needle that breaks away from the rest of the needle. The other conductive section is arranged at the free end of a third electrode wire which is movable independently of the other two electrode wires, thereby permitting its connection to the power source in a plug-like fashion.
    Type: Grant
    Filed: November 30, 1999
    Date of Patent: July 3, 2001
    Assignee: Ethicon, Inc.
    Inventors: Semyon Shchervinsky, Claude O. Clerc, Alex Ilori
  • Patent number: 5790896
    Abstract: An input/output module in a system for testing the functionality of an elronic system. The input/output module includes a plurality of input connections for receiving signals from the electronic system and a number of output connectors with different structural characteristics adapted for mating with plugs of correspondingly different structural characteristics to direct signals to another component of the testing system. For example the input/output module can include a plurality of BNC type plugs for signals of a first type and TNC type plugs for signals of a second type. This arrangement inhibits unintended cross connections between specific output connectors.
    Type: Grant
    Filed: June 24, 1996
    Date of Patent: August 4, 1998
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: John Thai Nguyen
  • Patent number: 5692915
    Abstract: The electrical connecting device has a cable compartment including spaced inner and outer annular portions. At least one of the top and bottom walls of each annular portion is formed with an annular groove. The portion of compartment other than the portions having annular grooves has a height H1 between the top and bottom walls. The height H1 is substantially equal to the width W of a flexible flat cable. The cable may be formed with projections on its edges. The compartment height H1 may be set between the width of the cable portion with the projections and the width of the cable portion without the projections. Therefore, the connector with high quality and high reliability can prevent an impinging noise from being made by vibration.
    Type: Grant
    Filed: December 5, 1995
    Date of Patent: December 2, 1997
    Assignee: Yazaki Corporation
    Inventors: Satoshi Ishikawa, Norihito Suzuki
  • Patent number: 5216802
    Abstract: A convertible, metered, power system, apparatus and method, of readily converting a construction site electric meter box between providing temporary metered power and providing permanent metered power; wherein the method of the present invention includes connecting a service line to the permanent meter box and diverting metered power from the meter away from the construction structure wiring, and into one or more, portable, temporary power outlets. In the preferred embodiment, the diversion and the portable power outlets are provided by the unique, portable, temporary electric service assembly of the present invented apparatus.
    Type: Grant
    Filed: February 18, 1992
    Date of Patent: June 8, 1993
    Inventors: Michael P. Cole, Gregory L. Heard
  • Patent number: 5151042
    Abstract: A rotary connector which includes a fixed case and a rotatable case, each having an opening for connection with a lead wire, a belt-like flat cable spirally wound and housed within the fixed and rotatable cases, the flat cable having a plurality of electrical conductors, and a connection terminal having one end connected to the electrical conductors of the flat cable and the other end connected to the lead wire and arranged at the opening of the rotatable case, wherein the flat cable is allowed to loosen and tighten to thereby permit the rotatable case to rotate relative to the fixed case. The rotary connector further comprises a fixing member attached to the lead wire, and a retaining member arranged at the opening of the rotatable case for engagement with the fixing member. The retaining member has a retaining portion for holding the lead wire in a predetermined position relative to the connection terminal.
    Type: Grant
    Filed: September 27, 1991
    Date of Patent: September 29, 1992
    Assignee: The Furukawa Electric Co., Ltd.
    Inventor: Tetsuya Okada
  • Patent number: 4964807
    Abstract: An electrical connector and dual purposes test jack used for testing electrical devices includes both a spring clamp member and a "plug in" pin assembly. The pin assembly has, at one end, an electrically conductive wire receiving portion, a setscrew for attaching an electrical wire thereto, an insulator sleeve therearound and, at the opposite end, a cylindrical, radially compressible, bifurcated, conductive pin having an externally threaded inner end portion. The spring clamp member has, at one end, an electrically conductive tubular receptacle internally threaded adjacent the end thereof and, and its other end, a conductive spring clamp. The pin is longitudinally bifurcated at its outer end portion and is dimensioned such that it may be axially inserted past the internal threads of the receptacle and securely held therein place by the radial compression thereof.
    Type: Grant
    Filed: November 6, 1989
    Date of Patent: October 23, 1990
    Inventor: Thomas A. Draus
  • Patent number: 4871322
    Abstract: An electrical connector for linking a clip to a base plug, the connector having a threaded portion for securing itself to the base plug, and also having a laterally positioned, flattened segment to be grasped by the clip.
    Type: Grant
    Filed: June 24, 1988
    Date of Patent: October 3, 1989
    Inventor: Robert E. Hardcastle
  • Patent number: 4789342
    Abstract: A neutral position indicator for an electrically conductive cable coiled in an automotive steering wheel includes a fixed storage case for storing the electrically conductive cable therein, the storage case including a rotatable member rotatable with the steering wheel, and a position indicator unit rotatably mounted in the fixed storage case and angularly movable for a first angular interval each time the rotatable member rotates through a second angular interval in response to completion of the rotation of the rotatable member through the second angular interval, the position indicator unit being indicative of a neutral position of the electrically conductive cable when the position indicator unit reaches a prescribed angular position. The storage case is covered with a cover having a window for allowing visual observation of the position indicator unit. The angular position of the rotatable member, i.e.
    Type: Grant
    Filed: April 7, 1987
    Date of Patent: December 6, 1988
    Assignee: Honda Giken Kogyo Kabushiki Kaisha
    Inventor: Kazuaki Shitanoki
  • Patent number: 4718862
    Abstract: The present invention is a "two-way" handle that accepts an electrical cord in one end and an interchangeable electrical apparatus, e.g., test probe cartridges for nondestructive resistivity measurements in the other end, and wherein the handle can accept said electrical cord or electrical apparatus in either end interchangebly, or when desired, two electrical cords, one at each end of the handle.
    Type: Grant
    Filed: April 18, 1986
    Date of Patent: January 12, 1988
    Assignee: AT&T
    Inventor: Dean A. Beeman
  • Patent number: 4676568
    Abstract: A test plug is disclosed for alternatively providing releasable electrical connection between a test lead and a first and second electrical contact where the first contact is a female contact and the second contact is a male contact. The plug includes a housing sized to be manually engageable and having a slot formed through a first end of the housing. A plunger is slidably disposed within the housing and slidable between an extended position and a retracted position with the plunger having a contact portion sized to extend through the slot and be received within the female contact when the plunger is in the extended position. The contact portion is further sized to be received within the housing when the plunger is in the retracted position with the slot being unobstructed to the insertion of a male contact. A first electrical contact point is disposed within the slot and yieldably biased into electrical connection with a male contact received within the slot.
    Type: Grant
    Filed: February 21, 1986
    Date of Patent: June 30, 1987
    Assignee: ADC Telecommunications, Inc.
    Inventors: Gary F. Nault, Loren A. Singer