Abstract: A method for assembling an ultrahigh-frequency spring probe test assembly includes: drilling signal cavities, power supply cavities, and grounding cavities, assembling an upper mold core and a lower mold core and performing curing, mounting an upper shaft sleeve and a lower shaft sleeve, inserting a signal probe, a power supply probe and a grounding probe, and mounting an upper base to complete assembling the probe test assembly. The signal probe becomes coaxial with the signal cavity by mounting the insulating ring, achieving small signal loss; the insulating mold core is inserted into the power supply cavity after drilling and is bonded to the power supply cavity via adhesive to form a dual-layer insulating structure between the power supply probe and the base, having high insulation performance and low power loss; the grounding probe is in direct contact with the metal base, achieving high conductivity.

Abstract: Disclosed are an anti-pull-apart decorative lamp and an anti-pull-apart lamp string. The anti-pull-apart decorative lamp includes a light source, a connecting wire, a conductive terminal, and an insulating plastic. The anti-pull-apart lamp string includes anti-pull-apart decorative lamps and a cable. The light source includes a light-emitting chip and a lead wire frame with a first end electrically connected to the light-emitting chip, and a second end at which a pin is provided. The connecting wire includes a conducting wire and an insulating layer, the conducting wire at one end of the connecting wire protrudes from the insulating layer and forms a wiring connector. A first end of the conductive terminal is provided with a first clip, a second end of the conductive terminal is provided with a second clip, the first clip is roll-pressed against the pin, and the second clip is roll-pressed against the wiring connector.

Abstract: Disclosed are apparatuses including a cable header block with apertures for floating inserts and a cover plate. The cable header block includes an aperture pattern that matches a pattern of connector terminals. The floating inserts fit in the apertures of the cable header block. The cover plate can also include a through-hole pattern that matches the aperture pattern. Also, each of the through-holes can include a first geometric shape larger than a cross-section of a cable terminal end and a second geometric shape adjacent to the first shape that is smaller than the cross-section of the cable terminal end. The cover plate retains the floating inserts within the apertures. Also, the cover plate aligns the first geometric shape over the floating inserts when the fastener is in a first position and aligns the second geometric shape over the floating inserts when the fastener is in a second position.

Abstract: An audio demonstration kit encourages understanding of audio concepts by enabling children to construct and study speaker performance. In a particular embodiment, the audio demonstration kit includes a paper speaker and instructions. The paper speaker includes a backplate, a suspension, and a diaphragm cut from a single sheet of paper. The demonstration kit may feature an amplifier that is configurable to accommodate various hardware additions as a child is ready for more progressively challenging construction. For example, the amplifier of an embodiment allows single and dual mode operation, as well as drives a rotary motor and is coordinated with a strobe light. The amplifier of an embodiment is synchronized with the strobe light and a moveable platform to create the impression of that jiggling figures attached to the table are dancing. Interfaces with smart phone, recording, and other technologies further enhances and encourages the learning experience.

Abstract: Electrical properties of a semiconductor device are reproducibly and stably measured in a testing step of the semiconductor device. A probe pin includes a first plunger, a second plunger, a cleaning shaft, a first coil spring, and a second coil spring. The cleaning shaft accommodated in the inside of the first plunger is allowed to enter and exit through a tip of a contact of the first plunger by the second coil spring, thereby solder shavings attached to the tip of the contact are removed. The first plunger is electrically coupled to the second plunger by the first coil spring wound on an outer side face of the first plunger and on an outer side face of the second plunger.

Abstract: Spring-loaded contacts having an improved reliability. One example may provide spring-loaded contacts having a reduced likelihood of entanglement between a spring and a plunger. For example, a piston may be placed between a plunger and a spring. The piston may have a head portion that is wider than the diameter of the spring and located between the spring and the plunger to isolate the spring and the plunger. In these and other examples, an additional object, such as a sphere, may be placed between the plunger and spring. In another example, two additional objects, such as two spheres, may be placed between a plunger and piston.

Abstract: An alligator clip has an operating clipping body, a connection clipping body, a pivot and a resilient member. The operating clipping body has a clipping segment and an operating segment. The connection clipping body is pivotally connected with the operating clipping body by the pivot and has a clipping segment, an operating segment and a wire connection segment. The clipping segment corresponds to the clipping segment of the operating clipping body in position. The operating segment corresponds to the operating segment of the operating clipping body in position. The wire connection segment is connected with the operating segment of the connection clipping body and has two squeezing tabs and at least one conducting claw being jagged. The resilient member is mounted around the pivot and between the operating clipping body and the connection clipping body.

Abstract: An electric motor of an electric submersible pump is electrically isolated from a power conduit for diagnostic testing of the power conduit and wet connection components in place within a wellbore. The electric motor is electrically connected to the power conduit through a wet connection assembly having motor leads in electrical connection with a transfer contact and a receptacle assembly disposed on a tubing string having a supply contact electrically connected to the power conduit. Electric power flows through the power conduit, through the supply contact, through the transfer contact, and through the motor leads to the motor. The supply contact and the transfer contact are separated by a sliding sleeve that hydraulically inserts between the contacts, insulating the transfer contact and grounding the supply contact for testing. The contacts may also be separated by a relative rotation of the assemblies that grounds the supply contact for testing.

Abstract: A probe card for conducting an electrical test on a test subject includes a substrate body including a first surface, which faces toward the test subject, and a second surface, which is opposite to the first surface. A through electrode extends through the substrate body between the first surface and the second surface. A contact bump is formed in correspondence with the electrode pad and electrically connected to the through electrode. An elastic body is filled in an accommodating portion, which is formed in the substrate body extending from the first surface toward the second surface. The contact bump is formed on the elastic body.

Abstract: An electrical connecting module includes a first electrical connection terminal with a first connection pole and a second connection pole; a module element with a second electrical connection terminal, which comprises a first connection pole and a second connection pole, and with a third electrical connection terminal, which comprises a first connection pole and a second connection pole. A test channel is provided for accommodating a test probe. wherein the test channel is intended for making electrical contact with the second connection pole of the first connection terminal by means of the test probe when there is an electrical connection between the first connection pole of the first connection terminal and the first connection pole of the third connection terminal and when the electrical connection between the second connection pole of the first connection terminal and the second connection pole of the third connection terminal is disconnected.

Abstract: Methods and structures for testing a microelectronic packaging structure/device are described. Those methods may include placing a device in a floating carrier, wherein the floating carrier is coupled to a socket housing by pin dowels disposed in four corners of the socket housing, and wherein at least two actuating motors are disposed within the socket housing, and micro adjusting the device by utilizing a capacitive coupled or a fiber optic alignment system wherein a maximum measured capacitance or maximum measured intensity between alignment structures disposed in the socket housing and alignment package balls disposed within the device indicate optimal alignment of the device. Methods further include methods for active co-planarity detection through the use of a capacitive-coupled techniques.

Abstract: A terminal end for a flat test probe having tapered cam surfaces providing a lead-in angle on the tail of the terminal end which extend to a sharp rear angle to engage detents or projections within a receptacle. The tapered cam surfaces and shape rear angles allow the probe to be inserted into the receptacle with minimal force to retain the flat test probe within the receptacle.

Abstract: A method for manufacturing a probed for an electrical test includes producing by a deposition technique a deposit including a probe main body portion made of a nickel-boron alloy and a probe tip portion projecting downward from the probe main body portion and made of a different conductive material from the probe main body portion. The method further includes annealing the deposit. The average grain diameter of the nickel-boron alloy is between 97 ? and 170 ?. The contained amount of boron is from 0.02 wt % to 0.20 wt %.

Abstract: A testing apparatus includes a securing member adapted to be attached to a connector, a pressing member, a connecting member, a resisting member, and a resilient member. The connecting member is moveably located between the securing member and the pressing member. The resisting member is aligned with a pin of the connector and attached to a first end of the connecting member. The resisting member is attached to a second opposite end of the connecting member. The pressing member is moveable relative to the securing member, and the resisting member abuts the pin of the connector.

Abstract: Communications patching system and methods utilizing common-mode channel communications are provided for identifying patch panel ports to which a backbone cable is connected in a communications patching system, for identifying a patch panel port to which a horizontal cable terminating at a telecommunications outlet is connected in a communications patching system, and for identifying the physical location of first and second connectors of a patch cord in a communications patching system having multiple patching zones.

Abstract: A calibration adapter with coaxial connector for connecting to a complementary coaxial connector of a device to be calibrated, where the coaxial connector has an inner conductor part, an outer conductor part arranged coaxially thereto, and a male termination. The calibration adapter has a drum where at least two calibration standards are arranged, the drum is rotatably arranged on a pin connected centrally to a first cap such that a longitudinal axis of the pin is flush with a longitudinal axis of the first cap. The coaxial connector with a second termination opposite the male termination, is connected eccentrically to the longitudinal axis of the first cap, and the at least two calibration standards are arranged in the drum such that by the rotation of the drum relative to the first cap, the second termination can be optionally connected to one of the calibration standards.

Abstract: This disclosure provides a coaxial inspection connector that is connectable to and disconnectable from a receptacle, the receptacle including an external conductor, a fixed terminal, and a movable terminal that is in pressed contact with the fixed terminal from below. Housing includes an end portion that contacts the external conductor. A probe extends vertically in the end portion. The probe is insulated from the housing, and includes a plunger. The plunger includes a plunger body and a tip. The plunger body contacts the fixed terminal when the external conductor contacts the end portion. The tip is an insulating portion disposed at a lower end of the plunger. The tip pushes the movable terminal downward and separates the movable terminal from the fixed terminal when the external conductor contacts the end portion.

Abstract: A probe connector includes an insulating housing, a plurality of probe pins and a shielding shell. The insulating housing has a base body and a tongue portion. The insulating housing defines a plurality of inserting holes penetrating through the base body and the tongue portion. Two opposite surfaces of the base body defines two fastening portions. The probe pins are inserted in the inserting holes. The shielding shell has a top plate and a blocking plate extending downward from a periphery of the top plate with an accommodating chamber formed therein. The top plate defines a plurality of matching holes. The tongue portion is inserted in the accommodating chamber with the matching holes aligned with the corresponding inserting holes. Two fastening plates are protruded from two opposite bottom edges of the blocking plate. Each fastening plate has a matching fastening portion thereon for engaging with the fastening portion.

Abstract: An electronic component connecting apparatus includes an electronic component connecting section connected to an electronic component having terminals, a circuit board connecting section which is connected to a circuit board and which is electrically connects at least one of the terminals and the circuit board with each other, and a conduction section which electrically connects outside other than the circuit board and at least one of the terminals with each other. A current path between the electronic component and the external apparatus is shortened, and a heating value is suppressed. It is possible to prevent the apparatus from being damaged, and to increase the number of signal lines while preventing the circuit from becoming complicated.

Abstract: A probe block assembly includes a block and a cable terminated to a coaxial connector that is configured to electrically communicate with a plurality of probes inserted in the block. The coaxial connector includes a connector signal contact configured to separably connect to a first probe that is insertable into an aperture of the block and insulated from the block, and a resilient ground beam configured to commonly ground one or more second probes inserted in the block.

Abstract: Several embodiments of enhanced integrated circuit probe card and package assemblies are disclosed, which extend the mechanical compliance of both MEMS and thin-film fabricated probes, such that these types of spring probe structures can be used to test one or more integrated circuits on a semiconductor wafer. Several embodiments of probe card assemblies, which provide tight signal pad pitch compliance and/or enable high levels of parallel testing in commercial wafer probing equipment, are disclosed. In some preferred embodiments, the probe card assembly structures include separable standard components, which reduce assembly manufacturing cost and manufacturing time. These structures and assemblies enable high speed testing in wafer form. The probes also have built in mechanical protection for both the integrated circuits and the MEMS or thin film fabricated spring tips and probe layout structures on substrates.

Abstract: A duplex plug adapter module includes a dielectric housing having a forward end and a rearward wire receiving end. The housing is configured to be mechanically coupled to first and second signal cables. A contact is held within the housing. The contact has a forward mating end and a rearward wire terminating end. The housing includes a passageway that is configured to receive a sensor probe that is shared by the first and second signal cables. The contact is configured to interconnect the sensor probe and a sensor wire.

Abstract: A multi-piece children's toy includes a plurality of block members that are interconnected with connectors. The block members include one or more side faces, wherein at least one side face has an opening therein. The blocks may be made of a resilient foam material, and the connectors are configured to provide an interference fit with the openings in the block members to thereby interconnect the block members.

Abstract: A probe block assembly has an electrically insulative housing and an electrically conductive plate. The front side of the housing has a forward face and a recessed face. The electrically conductive plate is positioned against the recessed face of the housing. A plurality of probes extend from the forward face of the housing and are electrically isolated from each other and from the conductive plate. A plurality of probes extend from a front surface of the conductive plate and are in electrical contact with each other.

Abstract: A connection box including a binding post and a sliding binding post mechanism. The sliding binding post mechanism includes a top rail, a bottom rail, a side rail slidably engaged in the top rail and the bottom rail, and a binding post connector mechanism slidably engaged in the side rail, the binding post connector mechanism having a binding post connector attached thereto and configured to provide an electrical connection to the binding post.

Abstract: A probe block assembly has an electrically insulative housing and an electrically conductive plate. The front side of the housing has a forward face and a recessed face. The electrically conductive plate is positioned against the recessed face of the housing. A plurality of probes extend from the forward face of the housing and are electrically isolated from each other and from the conductive plate. A plurality of probes extend from a front surface of the conductive plate and are in electrical contact with each other.

Abstract: An electrical socket (10) mounts a plurality of electrical contact probes (20, 22, 24, 26, 28, 30, 32) for providing an electrical connection between terminals of an electronic package (1,1′) received in a seat (10d) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip (20m, 26m, 28m, 30m, 32m) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface (20t, 28t, 30t, 32t) for interengagement with a removable retainer member of the socket.

Abstract: Probes and methods for testing electrical circuits are provided. One such probe includes a conductive socket, a conductive spring, and a housing that guides the conductive spring to the conductive socket to form an electrical connection between the spring and the socket. Once such method includes providing a conical and a spring and guiding the spring to the socket via the conical housing. The guiding step ensures that the spring contacts the socket during assembly and, therefore, ensures that a conductive path from the socket to the spring is provided. Methods and other probes are also provided.

Abstract: The invention relates to an electric contact array having two contacts between which an electrically conductive connection exists, wherein the contact array is watertight and dust-tight, wherein the contacts are disposed in a sealed area. According to the invention, two sealing elements are disposed at a distance from one another in order to seal the sealed area. A test area is provided between the sealing elements, said test area having a hole that enables access from the outside.

Abstract: An electrical socket (10) mounts a plurality of electrical contact probes (20,22,24,26,28,30,32) for providing an electrical connection between terminals of an electronic package (1,1′) received in a seat (10d) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip (20m,26m,28m,30m,32m) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface (20t,28t,30t, 32t) for interengagement with a removable retainer member of the socket.

Abstract: A connector for testing shunted electrical terminal assemblies includes a selectively actuatable shunt displacement member for moving a terminal shunt between a shunted and unshunted position in response to a control signal. The connector allows for the testing of shunted circuits and connectors in a shunted and unshunted position. The connector is readily adaptable to systems for automated testing of airbag actuators and the like.

Abstract: An integrated circuit device having a first type of pads with a probing portion and a bonding portion. The integrated circuit device includes a memory cell array, a logic circuit, and a plurality of the first type of pads and a plurality of a second type of pads. The second type of pads are electrically connected to the logic circuit. The first type of pads are electrically connected to the memory cell array and the logic circuit. Only the probing portion of the first type of pads is contacted by probes during testing of the memory cell array, and the bonding portion is used exclusively for attachment of a bond wire to permit connection to an external system.

Abstract: A bridge clip for testing electrical connections includes a body and at least one test lead having a first end connected to the body, and a second end having a dimple formed thereon. In a second embodiment, a bridge clip for testing electrical connections includes a body, a test lead connected to the body having a free end, and a latch formed with the body, the latch including a first deflection beam formed on one side of the body and a second deflection beam formed on an opposite side of the body.

Abstract: A leadless package type electronic part, the cost and the size of which can be reduced and which exhibits excellent reliability, and an electronic part material for manufacturing the electronic parts. The electronic part of a leadless package type includes a rectangular substrate having a plurality of external electrodes in the periphery thereof, an element part placed on the surface of the substrate while being electrically connected to the external electrodes, and molding resin for molding the element part onto the surface of the substrate, wherein the surface of the molding resin is formed to be flat, and each side surface of the molding resin is flush, or aligned, with a respective side surface of the substrate.

Abstract: A test probe device is attachable to alligator clips of test equipment for establishing electrical engagement between an electrical contact supported within an insulative housing, which is accessible through an opening therein and the test equipment. The alligator clip includes a pair of actuatable jaws defining a connection region therebetween. The test probe device includes an elongate probe member insertable into the housing through the opening for electrical engagement with the contact. An attachment member is electrically coupled to the probe member. The attachment member is attachable to the alligator clip at a location remote from the connection region thereof, permitting the alligator clip to be used without removing the test probe device.

Abstract: The attachment consists of a single length of resilient wire formed into a coil spring portion, a probe engaging portion and an elongated tip portion. The tip portion extends forwardly from the coil spring portion in a direction generally parallel to the probe and has a uniform cross-sectional dimension throughout its length. A radially extending portion of the wire is bent to form a recess adapted to engage the insulated wire of the probe, so as to retain the attachment when not in use.

Abstract: A juvenile's fantasy-wand so devised as to convey the visual illusion of a sparkedly burning Jul-4th device or fairy-tale magic-wand appearance, by virtue of employing myraid flexible fiberoptic-strands stemming outward from the upper-end of a rigid baton like holding member; whereby two seperate illuminating options are set forth; 1. a minimal weight version employing a substantially conventional expendable chemiluminescent light-cartridge unit set co-axially into the wand body so as to propagate its light outward via an annular light-receptor serving to pipe the light up and outward through the fountain like cluster of billowing fiber-optic strands; 2.

Abstract: An engine-equipped apparatus including a control-display device which contains computing circuits into which is fed such data as the AC amperage data from an apparatus having an AC generator, and devices for displaying the data converted by these computing circuits. The control-display device is provided with a connection location capable of being freely connected to and disconnected from the main body of the apparatus through the use of a cable and multi-pin plug and socket.

Abstract: An automobile circuit tester is provided having an end connection receivable in the taillight socket, parking light socket, brake light socket or directional signal socket in place of the bulb. When a circuit is completed to the socket in which the tester is received, an audible signal is generated.