Linearization Of Measurement Patents (Class 702/86)
  • Publication number: 20120290244
    Abstract: A method and apparatus for compensating nonlinear damage are disclosed. The method for compensating nonlinear damage, including: determining an additive parameter indicating an amount of nonlinear damage based on a plurality of sampled signal sets among which a sampling time of an input signal varies according to different time; and subtracting the additive parameter from the input signal.
    Type: Application
    Filed: March 5, 2012
    Publication date: November 15, 2012
    Applicant: FUJITSU LIMITED
    Inventors: Weizhen YAN, Zhenning Tao, Takeshi Hoshida
  • Patent number: 8275571
    Abstract: An exemplary embodiment, the present invention sets forth a method for correlating at least one weapon firing event to at least one scoring event. The method comprising: receiving information relating to a first scoring event; receiving information relating to a first weapon firing event; calculating an angle between a reference line, extending from location of the first weapon event to the location of the first scoring event, and the reference direction at the first computing device; comparing the time of the first scoring event to the time of the weapon firing event at the first computing device; comparing the angle of incidence for the projectile to the calculated angle at the first computing device; and identifying whether the weapon firing event and the scoring event are an unambiguous, one-to-one pairings at the first computing device.
    Type: Grant
    Filed: June 18, 2009
    Date of Patent: September 25, 2012
    Assignee: AAI Corporation
    Inventor: Niall B. McNelis
  • Patent number: 8239157
    Abstract: A method and apparatus is disclosed that guides a user through a sequence of steps that will allow the user to complete a predefined task using the flow meter. The steps include: selecting a predefined task, displaying a sequence of steps that directs the user through a process for using the Coriolis flow meter to complete the predefined task, and operating the Coriolis flow meter in response to the sequence of steps to complete the predefined task.
    Type: Grant
    Filed: February 24, 2011
    Date of Patent: August 7, 2012
    Assignee: Micro Motion, Inc.
    Inventors: Craig B McAnally, Andrew T Patten, Charles P Stack, Jeffrey S Walker, Neal B Gronlie
  • Publication number: 20120191395
    Abstract: An intelligent electronic device, and in particular, an electrical power meter, featuring an internal calibration system capable of calibrating its measurement mechanisms for the integral nonlinearities introduced by the components which make up those mechanisms, in particular, the analog-to-digital converter, is disclosed. The analog-to-digital converter is coupled with at least one sensor which is operable to sense electrical energy in one or more conductors and output a corresponding electrical signal indicative thereof, the analog-to-digital converter being operative to convert the electrical signal output by the sensor to at least one corresponding digital signal. Integral non-linearity (“INL”) is a term describing the deviation between the ideal output of an analog-to-digital converter and the actual output (after offset and gain errors have been removed).
    Type: Application
    Filed: January 21, 2011
    Publication date: July 26, 2012
    Inventor: Michael D. Bandsmer
  • Patent number: 8228218
    Abstract: A method of reproducing an original analog signal modified by a distortion and sampled. The distortion may be linear or nonlinear, and the samples may be either ideal or non-ideal. The method determines a stationary point of a cost function based on an error vector. The method iteratively computes approximated analog signals until the approximated analog signals converge to the original analog signal. The method may utilize Fr?chet derivatives and Moore-Penrose pseudo inverse transformations in order to iteratively compute the original analog signal. An apparatus performing said method is also disclosed.
    Type: Grant
    Filed: October 29, 2008
    Date of Patent: July 24, 2012
    Assignee: Technion Research and Development Foundation Ltd.
    Inventors: Yonina Eldar, Tsvi Gregory Dvorkind
  • Patent number: 8224609
    Abstract: Systems, methods, and other embodiments associated with MRI excitation are described. One example method includes performing a calibration to determine a set of transmission parameters for a set of excitation pulses for transmission channels available on a multi-channel MRI transmitter. The set of excitation pulses are configured to produce a resulting nuclear magnetic resonance (NMR) signal from an object exposed to the set of excitation pulses. The resulting NMR signal comprises NMR signal associated with a first NMR resonance associated with the object and NMR signal associated with a second NMR resonance associated with the object.
    Type: Grant
    Filed: March 20, 2009
    Date of Patent: July 17, 2012
    Inventors: Mark A. Griswold, Jeremiah Heilman
  • Patent number: 8199611
    Abstract: A seismic sensor module includes sensing elements arranged in a plurality of axes to detect seismic signals in a plurality of respective directions, and a processor to receive data from the sensing elements and to determine inclinations of the axes with respect to a particular orientation. The determined inclinations are used to combine the data received from the sensing elements to derive tilt-corrected seismic data for the particular orientation.
    Type: Grant
    Filed: February 5, 2009
    Date of Patent: June 12, 2012
    Assignee: WesternGeco L.L.C.
    Inventor: Nicolas Goujon
  • Patent number: 8200449
    Abstract: A method for testing the linearity or non-linearity of an actual analyte concentration and a test result, where the actual concentration of the analyte and a test result are determined so that a computation based upon an algorithm may be performed, which allows computation of various variables so that regression may be performed and the linear significance may be determined.
    Type: Grant
    Filed: July 25, 2011
    Date of Patent: June 12, 2012
    Inventor: Howard L. Mark
  • Patent number: 8095329
    Abstract: A method for testing the linearity or non-linearity of an actual analyte concentration and a test result, where the actual concentration of the analyte and a test result are determined so that a computation based upon an algorithm may be performed, which allows computation of various variables so that regression may be performed and the linear significance may be determined.
    Type: Grant
    Filed: August 17, 2004
    Date of Patent: January 10, 2012
    Inventor: Howard L. Mark
  • Patent number: 8077080
    Abstract: A method of calibrating antenna-position detection associated with a radar system, the radar system including a first gimbal and a first angle sensor configured to detect an angular position of the first gimbal, includes mounting a second angle sensor to the first gimbal configured to detect an angular position of the first gimbal. The first gimbal is rotated through each angular position of a set of the angular positions. A first set of data is generated with the first angle sensor that characterizes a detected angular position of the first gimbal. A second set of data is generated with the second angle sensor that characterizes a detected angular position of the first gimbal. A third data set is determined comprising differences, between the first and second data sets, in detected angular position at each first-gimbal angular position. The third data set is stored in a memory device.
    Type: Grant
    Filed: March 17, 2009
    Date of Patent: December 13, 2011
    Assignee: Honeywell International Inc.
    Inventors: David Y. Lam, Walter Niewiadomski, Steve Mowry, Eric Klingler
  • Publication number: 20110270561
    Abstract: A test system may include multiple test stations. Electronic devices may be tested using the test system. Each test station may include a test unit such as a radio-frequency tester that can make wireless and wired radio-frequency signal measurements on devices under test. The test stations may be configured to perform pass-fail testing on devices under test during manufacturing. One or more selected devices under test that have passed the pass-fail tests may be retested using the test stations. Multiple tests may be performed at a given test station using the same selected device under test. Gathered test data may be analyzed to determine whether the test stations have sufficient accuracy and precision or need to be recalibrated or taken offline.
    Type: Application
    Filed: April 28, 2010
    Publication date: November 3, 2011
    Inventors: Justin Gregg, Tomoki Takeya, Adil Syed
  • Patent number: 8026906
    Abstract: A software compensation method that allows a touch sensitive display to be built using low-cost FSR force sensors The compensation method comprises an array of functional compensation modules including filtering, voltage conversion, temperature compensation, humidity compensation, sensor calibration, sensor reading linearization, auto calibration, positioning determination and finally end-user and mechanical calibration. The array of compensation modules can bring system accuracy from a non-compensated average positioning error in the 25% to 50% range, down to aN end-user acceptable range of 0% to 5%. The increased positioning accuracy makes it possible to use FSRs as opposed to traditional piezoresistive based touch screen sensors.
    Type: Grant
    Filed: January 23, 2008
    Date of Patent: September 27, 2011
    Assignee: F-Origin, Inc.
    Inventors: Anders L Mölne, Joseph Carsanaro, Toni Leinonen, Konstantin Klimov
  • Patent number: 8000931
    Abstract: Provided is a deterministic component model determining apparatus that determines a type of a deterministic component included in a probability density function supplied thereto, comprising a standard deviation calculating section that calculates a standard deviation of the probability density function; a spectrum calculating section that calculates a spectrum of the probability density function; a null frequency detecting section that detects a null frequency of the spectrum; a theoretical value calculating section that calculates a theoretical value of a spectrum for each of a plurality of predetermined types of deterministic components, based on the null frequency; a measured value calculating section that calculates a measured value of the spectrum for the deterministic component included in the probability density function, based on the standard deviation and the spectrum; and a model determining section that determines the type of the deterministic component included in the probability density function
    Type: Grant
    Filed: October 23, 2008
    Date of Patent: August 16, 2011
    Assignee: Advantest Corporation
    Inventors: Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi
  • Patent number: 7949480
    Abstract: The exemplary embodiments of the method, system, software arrangement and computer-accessible medium according to the present invention facilitates an analysis of interactions between nonlinear absorbing materials and an incident electromagnetic wave based on material properties and characteristics of the incident beam of the electromagnetic energy. Using the exemplary embodiments of the present invention, it is possible to determine laser beam propagation in a variety of multiphoton absorbing materials. Energy levels associated with such materials, which may be associated with various electron absorption and/or relaxation phenomena, may be added to and/or removed from the analysis. Incident laser beams can vary from continuous wave to attoseconds in duration and a numerical solution can be obtained that is radially and/or temporally dependent.
    Type: Grant
    Filed: November 13, 2006
    Date of Patent: May 24, 2011
    Assignee: Simphotek, Inc.
    Inventors: Evgueni Parilov, Mary Potasek
  • Publication number: 20110119012
    Abstract: The invention describes a method that is used to determine the linearization curve of a sensor for specific gas components by combining this sensor with an ultrasonic molar mass sensor. The described method uses the fact that the molar mass sensor exhibits a completely linear response when two gas compositions of differing molar mass values are mixed. Using this feature a non linear-response of a sensor for specific gas components can be determined and a linearization curve can be computed.
    Type: Application
    Filed: December 10, 2009
    Publication date: May 19, 2011
    Applicant: ndd Medizintechnik AG
    Inventor: Christian Buess
  • Patent number: 7925456
    Abstract: A method and apparatus is disclosed that guides a user through a sequence of steps that will allow the user to complete a predefined task using the flow meter. The steps include: selecting a predefined task, displaying a sequence of steps that directs the user through a process for using the Coriolis flow meter to complete the predefined task, and operating the Coriolis flow meter in response to the sequence of steps to complete the predefined task.
    Type: Grant
    Filed: December 30, 2004
    Date of Patent: April 12, 2011
    Assignee: Micro Motion, Inc.
    Inventors: Craig B. McAnally, Andrew T. Patten, Charles P. Stack, Jeffrey S. Walker, Neal B. Gronlie
  • Patent number: 7899638
    Abstract: A system for estimating bit error rates (BER) may include using a normalization factor that scales a BER to substantially normalize a Q-scale for a distribution under analysis. A normalization factor may be selected, for example, to provide a best linear fit for both right and left sides of a cumulative distribution function (CDF). In some examples, the normalized Q-scale algorithm may identify means and probabilistic amplitude(s) of Gaussian jitter contributors in the dominant extreme behavior on both sides of the distribution. For such contributors, means may be obtained from intercepts of both sides of the CDF(Qnorm(BER) with the Q(BER)=0 axis, standard deviations (sigmas) may be obtained from reciprocals of slopes of best linear fits, and amplitudes may be obtained directly from the normalization factors. In an illustrative example, a normalized Q-scale algorithm may be used to accurately predict bit error rates for sampled repeating or non-repeating data patterns.
    Type: Grant
    Filed: October 16, 2006
    Date of Patent: March 1, 2011
    Assignee: LeCroy Corporation
    Inventor: Martin Miller
  • Patent number: 7869968
    Abstract: A diagnostic system designed such that an aggregate of parameter combinations is stored, which is an aggregate of combinations of parameters consisting of a first parameter for determining the output of the high-frequency power source, a second parameter for determining the flow rate of the carrier gas in the aerosol, and a third parameter for determining the distance between the plasma torch and the interface, and which forms a specific array such that the measurement points corresponding to the respective combinations are lined up in order along the direction of length of an envelope that forms the end on the high-sensitivity side of a graph drawn as an aggregate of all measurement points on a sensitivity-oxide ion ratio graph, and a diagnostic measurement is performed with a specific diagnostic sample using the parameter value of each combination of the above-mentioned parameter combinations that form the aggregate such that the device properties can be confirmed from the position on the envelope on the se
    Type: Grant
    Filed: September 25, 2007
    Date of Patent: January 11, 2011
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenichi Sakata, Tatsuya Shibukawa
  • Patent number: 7844414
    Abstract: A method of calibrating an individual sensor of a particular sensor type whose output varies non-linearly with at least one measured quantity and at least one operating condition. The first step includes producing a set of calibration curves for each sample sensor of the particular sensor type. The resulting sets of calibration curves are then averaged and the results used to produce a generic calibration surface for the particular sensor type showing its variation. Individual calibration measurements are then taken for a number of different values of the measured quantity at a small number of discrete values. The individual calibration readings are then used to map the generic calibration surface to the individual calibration measurements of the individual sensor.
    Type: Grant
    Filed: December 4, 2008
    Date of Patent: November 30, 2010
    Assignee: Transense Technologies PLC
    Inventor: Victor Alexandrovich Kalinin
  • Patent number: 7818091
    Abstract: A process and a device are provided for determining the pose as the entirety of the position and the orientation of an image reception device. The process is characterized in that the pose of the image reception device is determined with the use of at least one measuring device that is part of a robot. The device is characterized by a robot with an integrated measuring device that is part of the robot for determining the pose of the image reception device.
    Type: Grant
    Filed: September 28, 2004
    Date of Patent: October 19, 2010
    Assignee: Kuka Roboter GmbH
    Inventors: Arif Kazi, Rainer Bischoff
  • Publication number: 20100241381
    Abstract: A method of calibrating antenna-position detection associated with a radar system, the radar system including a first gimbal and a first angle sensor configured to detect an angular position of the first gimbal, includes mounting a second angle sensor to the first gimbal configured to detect an angular position of the first gimbal. The first gimbal is rotated through each angular position of a set of the angular positions. A first set of data is generated with the first angle sensor that characterizes a detected angular position of the first gimbal. A second set of data is generated with the second angle sensor that characterizes a detected angular position of the first gimbal. A third data set is determined comprising differences, between the first and second data sets, in detected angular position at each first-gimbal angular position. The third data set is stored in a memory device.
    Type: Application
    Filed: March 17, 2009
    Publication date: September 23, 2010
    Applicant: Honeywell International, Inc.
    Inventors: David Y. Lam, Walter Niewiadomski, Steve Mowry, Eric Klingler
  • Publication number: 20100153049
    Abstract: Receiving gain factors for channels that are combined to be transmitted in a communications signal, and calculating, on the basis of the gain factors, a non-linearity metric for controlling a transmission power of the communications signal.
    Type: Application
    Filed: May 11, 2009
    Publication date: June 17, 2010
    Inventors: Mika Ventola, Antti Hiltunen
  • Patent number: 7734441
    Abstract: Disclosed is a method and system for measuring and controlling an amount of flow and volume of liquid fluid and/or electrical energy consumed by an electro-pump. The method and system obtains a plurality of values for electrical parameters of the electro-pump including voltage value, currents value and active/reactive energy value; calculates the plurality values; and determines and controls the amount of instant flow and volume of said liquid fluid based on said calculated values. The system/method gathers these two measuring and controlling features (i.e. measuring and controlling the volume of liquid and amount of energy) in one casing, thereby, where applicable, provides a secure reference for policy making of both two parameters at the same time (e.g. for underground water resources).
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: June 8, 2010
    Inventors: Mohsen Taravat, Amin Moazedi, Hossein Nazarboland Jahromi
  • Patent number: 7724942
    Abstract: A high-accuracy optical aberration correction system and method. Z-heights determined by an auto-focus tool, which would otherwise vary depending on the orientation angle of surface features or edges in the focus region of interest, and on the location of the focus region of interest in the field of view, are corrected based on a novel error calibration method. Error calibration data includes a set of Z-corrections for a range of different feature orientation angles (e.g., 180 degrees), for multiple locations in the field of view. Error calibration data may be interpolated to correspond to the location of the current focus region of interest. During auto-focus measurements, a Z-correction may be adapted for a current measurement by weighting orientation-dependent error calibration data based on a histogram of the gradient (edge) directions present in the current focus region of interest.
    Type: Grant
    Filed: October 31, 2005
    Date of Patent: May 25, 2010
    Assignee: Mitutoyo Corporation
    Inventor: Robert Kamil Bryll
  • Patent number: 7693672
    Abstract: A signal processing method includes receiving an unknown signal that includes a distorted component and an undistorted component, and performing self-linearization based at least in part on the unknown signal to obtain an output signal that is substantially undistorted, wherein performing self-linearization includes adaptively generating a replica distortion signal that is substantially similar to the distorted component, and subtracting the replica distortion signal from the unknown signal to obtain the output signal.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: April 6, 2010
    Assignee: Optichron
    Inventor: Roy G. Batruni
  • Patent number: 7689295
    Abstract: A method and apparatus for monitoring and control of a system is disclosed. The method and apparatus include providing a plurality of sensors, a table, and a network processor. The sensors monitor attributes of the system. The table includes a plurality of entries. Each of the entries indicates at least one action to be taken in response to a portion attributes having particular values. The network processor is coupled with the sensors and with the table. The network processor receives from the sensors a plurality of statuses for the attributes. The network processor further determines at least one entry of the entries to access based upon the statuses and accesses the at least one entry to determine a corresponding action.
    Type: Grant
    Filed: November 19, 2007
    Date of Patent: March 30, 2010
    Assignee: International Business Machines Corporation
    Inventor: Norman C. Strole
  • Patent number: 7668617
    Abstract: The invention relates to a method of calibrating an ophthalmic-lens-piercing machine, a device used to implement one such method and a ophthalmic-lens-machining apparatus comprising one such device. The inventive method applies to a machine including a piercing tool, a lens support which is associated with a first reference mark (O1, X1, Y1), and programmable tool-control means which are associated with a second reference mark expressing set co-ordinates which define a target piercing point (M). A template is placed on the support, and the template includes pre-applied markings defining a third reference mark (O3, X3, Y3), such that the third reference mark in essentially in line with the first reference mark. The template is pierced at a pre-determined point corresponding to a target point, and an image of the template this point position, and a correction is applied to the set co-ordinates that can compensate for the misalignment.
    Type: Grant
    Filed: September 6, 2004
    Date of Patent: February 23, 2010
    Assignee: Briot International
    Inventors: Michaël Vassard, Jean-Jacques Videcoq
  • Patent number: 7660687
    Abstract: A method of increasing consistency between separate parametric measurement readings that are taken with an electron beam imaging tool at different times within a period of time, by correcting drift in the imaging tool at a time frequency that is less than a time period during which the drift is anticipated to be undesirably large.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: February 9, 2010
    Assignee: KLA-Tencor Corporation
    Inventors: Indranil De, Mark A. McCord, David L. Adler
  • Patent number: 7640106
    Abstract: Apparatus for determining the position of a selected object relative to a moving reference frame, the apparatus including at least one reference frame transceiver assembly firmly attached to the moving reference frame, at least one object transceiver assembly firmly attached to the selected object, an inertial measurement unit firmly attached to the selected object, an inertial navigation system firmly attached to the moving reference frame, and a tracking processor coupled with the object transceiver assembly, with the inertial measurement unit and with the inertial navigation system, the object transceiver assembly communicating with the reference frame transceiver assembly using magnetic fields, the inertial measurement unit producing IMU inertial measurements of motion of the selected object with respect to an inertially fixed reference frame, the inertial navigation system producing INS inertial measurements of motion of the moving reference frame with respect to the inertially fixed reference frame, the
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: December 29, 2009
    Assignee: Elbit Systems Ltd.
    Inventors: Saul Stokar, David Neustadter
  • Patent number: 7636641
    Abstract: Many areas of technology need highly accurate data compression to provide small, multifunctional devices. In the area of communication governed by the IEEE 802.11 standards, a wireless device could significantly improve its performance by using its calibration data. Moreover, because of the increased mobility of users, a wireless device should be able to operate in different regulatory domains. This flexibility requires access to significant amounts of data regarding such regulatory domains. Advantageously, piecewise linear abstraction and/or mapping can be used to significantly reduce the amount of stored data while ensuring accuracy in reproducing the total data at a later point in time.
    Type: Grant
    Filed: June 5, 2003
    Date of Patent: December 22, 2009
    Assignee: Atheros Communications, Inc.
    Inventors: Praveen Dua, David Nakahira, James Hoffman, Fiona Cain
  • Patent number: 7630327
    Abstract: A system and method of managing collection and maintenance of performance data for a wireless communications network including collecting configuration data for the network, encoding the collected configuration data and storing the data, collecting a transmitted signal, measuring a parameter of the collected signal, and encoding and storing the parameter. These steps are repeated for additional configurations of the network. The transmitted signals are transmitted by a base station or a mobile device. Further, the transmitted signals are collected by a base station or a mobile device.
    Type: Grant
    Filed: July 13, 2006
    Date of Patent: December 8, 2009
    Assignee: Andrew LLC
    Inventor: John Arpee
  • Patent number: 7608468
    Abstract: Disclosed are techniques and apparatus are provided for determining overlay error or pattern placement error (PPE) across the field of a scanner which is used to pattern a sample, such as a semiconductor wafer or device. This determination is performed in-line on the product wafer or device. That is, the targets on which overlay or PPE measurements are performed are provided on the product wafer or device itself. The targets are either distributed across the field by placing the targets within the active area or by distributing the targets along the streets (the strips or scribe areas) which are between the dies of a field. The resulting overlay or PPE that is obtained from targets distributed across the field may then be used in a number of ways to improve the fabrication process for producing the sample.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: October 27, 2009
    Assignee: KLA-Tencor Technologies, Corp.
    Inventors: Mark Ghinovker, Michael E. Adel, Jorge Poplawski, Joel L. Seligson
  • Patent number: 7556423
    Abstract: The output of a solid-state temperature sensor is the ratio of a voltage proportional to a reference voltage. The solid-state temperature sensor used diodes in its sensing and reference circuits, however, these diodes exhibit a second order behavior that causes the temperature sensor output response to deviate from an ideal straight line. This output response deviation has a characteristic error curve that is shaped like a parabola. An offset that varies opposite to that of the temperature sensor output response deviation may be determined and applied in the digital domain as offset compensation after the temperature has been conversed to a digital value with an analog-to-digital converter (ADC). By adding this offset compensation to the digital output of the ADC, digital representations of the measured temperatures will track more linearly.
    Type: Grant
    Filed: September 25, 2007
    Date of Patent: July 7, 2009
    Assignee: Microchip Technology Incorporated
    Inventor: Amado Abella Caliboso
  • Patent number: 7536264
    Abstract: Disclosed are methods, systems, and computer program products for balancing net inventory using a dynamic expansion coefficient of liquid product relative to the temperature changes with density. The method can include receiving an API gravity report that includes a measurement of a specific gravity and a temperature of the product reported at a rack. Utilizing the API gravity report, the method can include maintaining correct densities of the liquid product by utilizing a plurality of expansion coefficients to dynamically convert a gross volume measurement to a net volume measurement for transactions of liquid product in a tank and at a dispenser in order to maintain a net perpetual book balance.
    Type: Grant
    Filed: February 18, 2005
    Date of Patent: May 19, 2009
    Assignee: Flying J, Inc.
    Inventors: John D. Hillam, Vincent J. Memmott
  • Publication number: 20090098022
    Abstract: A multi-channel device includes up to three channels for optical testing of liquid samples. The liquid sample(s) may include surface water, drinking water, processed water or the like. The multi-channel device may include a turbidity channel and a color channel that measure turbidity and color, respectively, of a liquid sample using spectrographic analysis. The multi-channel device may also include a colorimetric channel that measures the concentration of various analytes in a liquid sample, such as free chlorine, total chlorine, copper and phosphate.
    Type: Application
    Filed: October 8, 2008
    Publication date: April 16, 2009
    Applicant: Ecolab Inc.
    Inventors: Eugene Tokhtuev, Christopher J. Owen, Viktor Slobodyan, William M. Christensen, Paul Schilling, Joseph Phillip Erickson
  • Patent number: 7519492
    Abstract: The present invention provides an apparatus and method for automated quality control of a substance comprising a compartment wherein a substance is located, a monitoring device coupled to the compartment and configured to monitor at least one quality control parameter prior to an end-use of the substance, and a processor coupled to the monitoring device, wherein the monitoring device is configured to communicate data to the processor for comparing at least one quality control parameter to an end-use value, and wherein the processor is further configured to control the release of the substance from the compartment to its end-use.
    Type: Grant
    Filed: May 2, 2007
    Date of Patent: April 14, 2009
    Assignee: General Electric Company
    Inventors: Peter Miller, Jan Henrik Ardenkjaer-Larsen, Martin John Bradney, Andrew Michael Leach, Per Christian Sontum, Eric John Telfeyan, David Brandon Whitt, Jan Wolber
  • Publication number: 20090088999
    Abstract: A system and method for correcting surface height measurements for optical aberration is provided. Heights determined by an autofocus tool, which may depend on surface feature angles in a focus region of interest (ROI) and on the ROI location in the field of view, are corrected based on a novel error calibration. Error calibration data includes height corrections for different feature angles in images, and for multiple locations in a field of view. Height corrections are determined by weighting and combining the angle dependent error calibration data, e.g., based on a gradient (edge) angle distribution determined in the ROIs. When Z-heights are determined for multiple ROIs in a field of view, storage of image data from particular images of a global image stack may be efficiently controlled based on determining early in processing whether a particular image is a sufficiently focused “near-peak” focused image or not.
    Type: Application
    Filed: November 4, 2008
    Publication date: April 2, 2009
    Applicant: MITUTOYO CORPORATION
    Inventors: Robert K. Bryll, Mark L. Delaney
  • Publication number: 20090066673
    Abstract: A software compensation method that allows a touch sensitive display to be built using low-cost FSR force sensors The compensation method comprises an array of functional compensation modules including filtering, voltage conversion, temperature compensation, humidity compensation, sensor calibration, sensor reading linearization, auto calibration, positioning determination and finally end-user and mechanical calibration. The array of compensation modules can bring system accuracy from a non-compensated average positioning error in the 25% to 50% range, down to aN end-user acceptable range of 0% to 5%. The increased positioning accuracy makes it possible to use FSRs as opposed to traditional piezoresistive based touch screen sensors.
    Type: Application
    Filed: January 23, 2008
    Publication date: March 12, 2009
    Inventors: Anders L. Molne, Joseph Carsanaro, Toni Leinonen, Konstantin Klimov
  • Publication number: 20090063079
    Abstract: Systems and methods are described that facilitate calibrating a scanner by capturing a plurality of white calibration files and generating a mathematical function that models the scanner. For instance, a white calibration file can be captured before and after a page is scanned, and the function can be an average of offset and gain values for pixels in scanlines of the scanned page. Three or more white calibration files can be used to generate a linear function (e.g., using linear regression) or an exponential function describing the gain an offset values of the pixels.
    Type: Application
    Filed: August 28, 2007
    Publication date: March 5, 2009
    Inventor: R. Victor Klassen
  • Publication number: 20090048798
    Abstract: A method for performing write calibrations on holographic storage media is disclosed. Initially, five identical and known calibration holograms are written on a holographic storage medium, in which three of the five calibration holograms are written with different laser power and three of the five calibration holograms are written with different time durations. A matched filter is then utilized to determine a cross-correlation between the five calibration holograms read from the holographic storage medium and their corresponding ideal calibration holograms previously stored within a memory device within the holographic storage drive. A least-squares fit of an ellipsoidal parabola to the cross-correlations is subsequently calculated to yield an optimal laser write power level and an optimal duration for a laser write pulse.
    Type: Application
    Filed: August 15, 2007
    Publication date: February 19, 2009
    Inventors: Allen Keith Bates, Nils Haustein, Craig A. Klein, Daniel J. Winarski
  • Publication number: 20090043524
    Abstract: A two-dimensional (2D) mesh is applied over a distortion surface to approximate a lens roll-off distortion pattern. The process to apply the 2D mesh distributes a plurality of grid points among the distortion pattern and sub-samples the distortion pattern to derive corrected digital gains at each grid location. Non-grid pixels underlying grid blocks having a grid point at each corner are adjusted based on the approximation of the lens roll-off for the grid points of the grid block. In one example, bilinear interpolation is used. The techniques universally correct lens roll-off distortion irregardless of the distortion pattern shape or type. The technique may also correct for green channel imbalance.
    Type: Application
    Filed: August 7, 2007
    Publication date: February 12, 2009
    Inventors: Szepo Robert Hung, Jingqiang Li, Hsiang-Tsun Li, Xin Zhong
  • Patent number: 7483802
    Abstract: A method of linearising a non-linear opto-electronic apparatus that includes an opto-electronic Mach-Zehnder modulator that receives an incoming electrical signal for modulating a light signal passing through the modulator, where the transfer characteristic of the modulator is sinusoidal, and including means for detecting the modulating light signal and for digitizing the detected signal, wherein the method comprises the following steps: injecting one or more calibration tones as an input electrical signal and obtaining a digitized form of the output signal obtaining the spectrum of said digitized form and measuring the spectral values at the frequencies of the input tone or tones and at the frequencies of spectral lines arising from the non-linearity; providing, from said spectral values, an inverse form of the non-linearity; and performing linearization on subsequent output signals for arbitrary input signals by applying said inverse form of the non-linearity to the output signal.
    Type: Grant
    Filed: May 27, 2005
    Date of Patent: January 27, 2009
    Assignee: BAE Systems plc.
    Inventor: John Michael Wood
  • Publication number: 20090012732
    Abstract: Methods, systems and computer readable media for removing trends in signal intensity values from features on a chemical array. Inputted signal values from features on the array are surface fitted to calculate a surface approximation. The surface approximation is normalized and used to de-trend the signal intensity values from the features.
    Type: Application
    Filed: September 2, 2008
    Publication date: January 8, 2009
    Inventors: John Frederick Corson, Jayati Ghosh, Svetlana Shchegrova
  • Publication number: 20080319695
    Abstract: A sensing circuit includes a first sensing element, a second sensing element, a reduction unit, a storage unit, a specifying unit and a detection unit. The reduction unit reduces the amount of the energy applied to the second sensing element. The storage unit stores a degradation characteristic of the sensing element. The specifying unit specifies a rate of degradation. The detection unit detects the amount of the energy on the basis of the rate of degradation.
    Type: Application
    Filed: June 17, 2008
    Publication date: December 25, 2008
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Ryo ISHII, Takashi SATO, Takashi KUNIMORI
  • Patent number: 7460983
    Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.
    Type: Grant
    Filed: August 23, 2006
    Date of Patent: December 2, 2008
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, William A. Hagerup, Rolf P. Anderson, Sharon M. Mc Masters
  • Publication number: 20080288199
    Abstract: A method of signal processing includes receiving a distorted signal comprising a distorted component and an undistorted component, the distorted component being at least in part attributed to an exogenous signal, and performing linearization, based at least in part on the distorted signal and information associated with the exogenous signal, to obtain a corrected signal that is substantially similar to the undistorted component. An adaptive distortion reduction system includes an input interface configured to receive a distorted signal comprising a distorted component and an undistorted component, the distorted component being at least in part attributed to an exogenous signal; and an adaptive distortion reduction module coupled to the input interface, configured to perform linearization based at least in part on the distorted signal and information associated with the exogenous signal, to obtain a corrected signal that is substantially similar to the undistorted component.
    Type: Application
    Filed: May 19, 2008
    Publication date: November 20, 2008
    Inventor: Roy G. Batruni
  • Patent number: 7444252
    Abstract: A linearizer circuit which corrects inherent nonlinearity of a capacitive pressure sensor is provided. The linearizer is based on an operational amplifier configuration including a feedback network of switched capacitor type that is switched between a first switching phase and a second switching phase .In this switched capacitor configuration, DC gain of the operational amplifier configuration in the second switching phase can be adapted to realize a linearization function required to substantially linearize a non-linear capacitance-pressure characteristic of a capacitive pressure sensor when the capacitive pressure sensor is connected to be part of the feedback network.
    Type: Grant
    Filed: May 8, 2006
    Date of Patent: October 28, 2008
    Assignee: Micro Analog Systems OY
    Inventor: Esa Sihvola
  • Patent number: 7438056
    Abstract: A method for setting an initial compensation value of a sensor complex module, the method including the steps of: reading a preset sensitivity value and an offset; detecting an acceleration value; calculating an accelerating-force sensitivity value using the acceleration value and the offset value; calculating an accelerating-force error value using the accelerating-force sensitivity value and the sensitivity value; calculating a gradient error value using the accelerating-force error value and the acceleration of gravity; setting a polarity value according to the accelerating-force sensitivity value; and setting the accelerating-force error value, the gradient error value and the polarity as the initial compensation value.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: October 21, 2008
    Assignee: Samsung Electro-Mechanics Co., Ltd.
    Inventors: Kyoung Soo Chae, Ghun Hahm, Hyun Joon Kim, Sung Whan Cho
  • Publication number: 20080255798
    Abstract: A number of wafer center finding methods and systems are disclosed herein that improve upon existing techniques used in semiconductor manufacturing.
    Type: Application
    Filed: February 15, 2008
    Publication date: October 16, 2008
    Inventor: Forrest T. Buzan
  • Publication number: 20080234963
    Abstract: A metrological apparatus has a driver (33) that effects relative movement between a support (4) and a measurement probe (8) carriage (7) in a first direction (X) to cause the measurement probe (8) to traverse a measurement path along a surface of an object supported by the support. The measurement probe (8) moves in a second direction (Z) transverse to the first direction as it follows surface characteristics. Respective first and second position transducers (35, 32) provide first and second position data representing the position of the measurement probe in the first and second direction. A calibrator (300) carries out a calibration procedure using measurement data obtained on a surface of known form. The calibrator determines calibration coefficients of an expression relating corrected measurement data and the actual measurement data by using the known form of the reference surface as the corrected measurement data.
    Type: Application
    Filed: August 16, 2006
    Publication date: September 25, 2008
    Applicant: TAYLOR HOBSON LIMITED
    Inventor: Paul James Scott