Register Structure, E.g., Multigauged Registers (epo) Patents (Class 712/E9.025)
  • Patent number: 12229563
    Abstract: The disclosed system may include a processor configured to detect that a data unit size for an instruction is smaller than a register. The processor may allocate a first portion of the register to the instruction in a manner that leaves a second portion of the register available for allocating to an additional instruction. The processor may also track the register as a split register. Various other methods, systems, and computer-readable media are also disclosed.
    Type: Grant
    Filed: June 30, 2022
    Date of Patent: February 18, 2025
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Sree Harsha Kosuru, Eric Dixon, Erik Swanson, Michael Estlick, Patrick Michael Lowry
  • Patent number: 11762737
    Abstract: A memory component internally generates and stores the check bits of error detect and correct code (EDC). In a first mode, during a read transaction, the check bits are sent to the memory controller along with the data on the data mask (DM) signal lines. In a second mode, an unmasked write transaction is defined where the check bits are sent to the memory component on the data mask signal lines. In a third mode, a masked write transaction is defined where at least a portion of the check bits are sent from the memory controller on the data signal lines coincident with an asserted data mask signal line. By sending the check bits along with the data, the EDC code can be used to detect and correct errors that occur between the memory component and the memory controller.
    Type: Grant
    Filed: September 29, 2022
    Date of Patent: September 19, 2023
    Assignee: Rambus Inc.
    Inventors: Frederick A. Ware, Brent S. Haukness, Lawrence Lai
  • Patent number: 11487617
    Abstract: A memory component internally generates and stores the check bits of error detect and correct code (EDC). In a first mode, during a read transaction, the check bits are sent to the memory controller along with the data on the data mask (DM) signal lines. In a second mode, an unmasked write transaction is defined where the check bits are sent to the memory component on the data mask signal lines. In a third mode, a masked write transaction is defined where at least a portion of the check bits are sent from the memory controller on the data signal lines coincident with an asserted data mask signal line. By sending the check bits along with the data, the EDC code can be used to detect and correct errors that occur between the memory component and the memory controller.
    Type: Grant
    Filed: November 30, 2020
    Date of Patent: November 1, 2022
    Assignee: Rambus Inc.
    Inventors: Frederick A. Ware, Brent S. Haukness, Lawrence Lai