Abstract: A method of determining a calibration or maintenance time interval after which a specific measurement device of a given type for measuring a quantity to be measured on a measurement site of an industrial site shall be re-calibrated or maintained is described, comprising the steps of: determining a criticality (C) of the specific device, based on the criticality (C) setting a reliability target (RT) for the device, wherein the reliability target (RT) denominates the probability of the device to be compliant according to a predefined criterion at the end of the calibration or maintenance time interval to be determined by this method, defining compliancy ranges for a measurable degree of compliance of the device, selecting a reliability model for a reliability of the device as a function of a normalized time interval (tn) and a set of at least one parameter (c1, . . .

Abstract: A method of determining a calibration or maintenance time interval, comprising the steps of: determining a criticality of the specific device, based on the criticality setting a reliability target for the device, wherein the reliability target denominates the probability of the device to be compliant according to a predefined criterion at the end of the calibration or maintenance time interval; defining compliancy ranges for a measurable degree of compliance of the device; selecting a reliability model for a reliability of the device as a function of a normalized time interval and a set of at least one parameter from a variety of predefined reliability models, determining a separate set of parameters for the selected reliability model for each of the compliancy ranges based on prescribed reliability expectation values for each of the error ranges, which a reliability function associated with this error range shall comply to at at least one predefined normalized time, determining the degree of compliance of th

Abstract: A measurement circuit and method is provided for generating an oscillating output signal used to derive timing information. The measurement circuit includes a ring oscillator having a plurality of unit cells, where each unit cell comprises at least a storage element whose output signal is used to determine a clock input signal for an adjacent unit cell within the ring oscillator. Control circuitry performs a control operation to control either a set function or a reset function of the storage element in each of the unit cells, in dependence on set or reset signals input to the control circuitry. Oscillation initiation circuitry is used to assert a clock input signal to the storage element in a first unit cell in order to initiate generation of the oscillating output signal, and the control circuitry then performs the control operation in order to control a value of the output signal of the storage element in each unit cell so as to cause the oscillating output signal to be maintained.

Abstract: Exemplary methods and apparatus for testing an electrically fired item, e.g., a primer-only cartridge or all-up round (AUR) cartridge, in a variety of modes are provided. For example, a test system may provide a method of testing a primer-only cartridge and an apparatus to execute such method. Various parameters associated with operation of the electrically fired item, such as a primer or initiator, may be varied and measured using an embodiment including programmable selection of a pulse duration for firing control signals, a voltage of the firing control signals, and a number of pulses associated with the firing control signals. An inline resistance of the path of the control signals may also be adjusted. Test data including temperature, pressure, voltage, and/or current associated with operation of the electrically fired item may be measured during tests and displayed on a display device.

Abstract: A method of determining a calibration or maintenance time interval, comprising the steps of: determining a criticality of the specific device, based on the criticality setting a reliability target for the device, wherein the reliability target denominates the probability of the device to be compliant according to a predefined criterion at the end of the calibration or maintenance time interval; defining compliancy ranges for a measurable degree of compliance of the device; selecting a reliability model for a reliability of the device as a function of a normalized time interval and a set of at least one parameter from a variety of predefined reliability models, determining a separate set of parameters for the selected reliability model for each of the compliancy ranges based on prescribed reliability expectation values for each of the error ranges, which a reliability function associated with this error range shall comply to at at least one predefined normalized time, determining the degree of compliance of th

Abstract: A method for synchronizing the measurements obtained, over a given period, from a number of measurement acquisition means for acquiring measurements of characteristics associated with the stresses withstood by a tire fitted on a running vehicle. The measurement acquisition means are brought into operation independently of one another and at least one indexing at a given instant of the measurements from each of said means is created relative to a time-measuring reference means.

Abstract: Apparatus includes at least two devices that communicate with each other, wherein a first one of the at least two devices having an IEEE 1588 precision time protocol interface, the interface including one or more components configured for communications in both a wired manner and a wireless manner with a second one of the at least two devices. The second one of the at least two devices having an IEEE 1588 precision time protocol interface, the interface including one or more components configured for communications in both a wired manner and a wireless manner with the first one of the at least two devices.

Abstract: The invention includes an image sensor, a shutter which opens/closes by making a front curtain and a rear curtain travel, a light source which illuminates the image sensor, a control unit which performs control to make the front and rear curtains travel with a predetermined time shift to form a slit-like opening, and to make the light source emit light a predetermined period of time after the start time of traveling of the front and rear curtains, a detection unit which detects the deviation between the position of an image of the recorded slit-like opening and a predetermined reference position, a computation unit which calculates the error between the traveling start timing of the front and rear curtains on the basis of the detected deviation, and a correction unit which corrects the calculated error between the traveling start timing of the front and rear curtains.

Abstract: A timing calibration system for an adjustable delay time of a delay module for an electronic circuit is provided. The system includes a control delay module including at least one calibration delay module, the control delay module having a second delay time. The system also includes a timing module associated with the control delay module, a comparison module associated with the timing module and an adjustment module for the delay module. The timing module measures the second delay time, the comparison module compares the second delay time with a desired delay time and produces a comparison result and the adjustment module calibrates the adjustable delay time utilizing the comparison result.

Abstract: There is provided a test apparatus including a PLL circuit for generating a strobe signal of which the timing is shifted according to a given delay control voltage, a variable delay circuit being provided divergently from a path connecting the PLL circuit and the timing comparator and delaying the strobe signal according to the predetermined phase difference of the strobe signal for the output signal, and a first phase comparing unit for comparing a phase of the strobe signal output from the variable delay circuit and a phase of the output signal output from the device under test and supplying the delay control voltage according to the phase difference to the PLL circuit.

Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.

Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.

Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.

Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.

Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.

Abstract: Systems and methods are presented that use light sensors and computing devices to compute the depth of an object using shuttered light pulses. In one embodiment, depth is determined as follows: A light emitter emits a pulse of light that is directed toward an object. The pulse is reflected off the object and travels toward a beam splitter. The beam splitter splits the reflected pulse into multiple pulses, with each pulse directed to a shuttered sensor with a different shutter location. The shuttered sensors measure the integrated intensity of the light, and these values are used to determine the depth of the object. A method is presented which calibrates a system that has an arbitrary number of shutters and enables the system to determine the depth of an object, even in the presence of ambient illumination and scattered light.

Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.

Abstract: A method and apparatus for controlling fraction collection in an eluent stream flowing from an LC column. A triggering detector recognizes the presence of a target substance according to characteristics of chromatographic peaks in the eluent stream and initiates a delay timer to trigger the fraction collector. A waste stream detector is disposed at any distance from the fraction collector to detect peaks in the waste stream flowing from a fraction collector. The signature of fraction collector actuation is seen by the waste stream detector, permitting the delay time to be adjusted for optimal collection of the target compound. The presence or absence of a peak or the characteristics of a remnant peak detected by the waste stream detector are used to confirm that the target component of the eluent stream was collected as intended by the fraction collector.

Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.

Abstract: A timing calibration system for an adjustable delay time of a delay module for an electronic circuit is provided. The system includes a control delay module including at least one calibration delay module, the control delay module having a second delay time. The system also includes a timing module associated with the control delay module, a comparison module associated with the timing module and an adjustment module for the delay module. The timing module measures the second delay time, the comparison module compares the second delay time with a desired delay time and produces a comparison result and the adjustment module calibrates the adjustable delay time utilizing the comparison result.

Abstract: A loop circuit including a variable delay element whose delay time amount can be set arbitrarily is formed, a loop control circuit controls so that the positive/negative logic of input pulse signal to the variable delay element is always constant, the number of output of output pulse signal of the variable delay element is counted, agreement of that count value and a predetermined set value is detected, an agreement detection signal is generated when the agreement is detected, and the transmission of output pulse signal of the variable delay element to the following circuits is controlled based on this agreement detection signal.

Abstract: A system and method are provided for detecting a stable region in a data signal to facilitate the alignment between a data signal and a corresponding clock signal. The system includes a processor coupled to a local interface and a memory coupled to the local interface. The system also includes a boundary detection circuit configured to perform a simultaneous sampling of a reference signal and a delayed reference signal to ascertain a degree of stability of a position in the reference signal. The reference signal is the signal received from the target system and the delayed reference signal is a delayed copy of the reference signal. The system also includes boundary detection logic stored on the memory and executed by the processor to control the operation of the boundary detection circuit. The boundary detection logic includes logic to detect a boundary of the stable region of the reference.