Abstract: The present invention relates to a MEMS deformation sensor for measuring a relative movement between two regions of a structure, the sensor comprising: —a first portion (2) and a second portion (3) that are movable with respect to one another along a direction of measurement (X); —a thrust element (4) mounted fixed with respect to the first portion; —a first electrode (A) and a second electrode (B) that are capable of being raised to different electrical potentials, each mounted fixed with respect to the second portion; —a connecting portion (I) forming an electrical link between the first electrode and the second electrode, the thrust element applying a load to the connecting portion when the first portion moves with respect to the second portion along the direction of measurement beyond a predetermined distance, the electrical link being broken under the effect of the load.

Abstract: The disclosure relates to a measuring device (1) for automated welding devices, in particular for robot welding tongs with a housing (18); with a holding piece (19); that is affixed inside the housing (18) and insulated against the housing (18) by means of a first insulating ring (2); that has a reception space (22) with a base wall (23) and an affixing appliance (24); and with a load cell (17) that is affixed inside the housing (18) opposite the base wall (23) and that is insulated against the housing (18) by means of a circumferential second insulating ring (5) and an insulating washer appliance (7, 21) located at the front-face side and adjacent to the base wall (23).

Abstract: A sample for electron microscopy includes a base member and a sensor. The sensor is configured to measure data on the sample. The sensor includes an insulating member and a measuring element. The insulating member is deposited in or near an area of observation that is defined on a surface of the base member. The measuring element is deposited on a surface of the insulating member or over the surface of the base member and the surface of the insulating member.

Abstract: This invention provides an extremely accurate way to characterize the Young's modulus of thin film materials with thicknesses in the nanometer range. It takes advantage of a recently developed high Q silicon Young's modulus resonator (YMR), which has a record high quality factor of about fifty million in operation at temperatures below 10 degrees Kelvin (10K). Because of the high Q of the YMR, the temperature stability of the YMR's resonance frequency below 1K, and the extremely high degree of vibration isolation inherent in the inventive design, the relative resolution of the resonant frequency is typically in 2×10?7. This is enough to resolve a resonant frequency shift after a deposition of a thin film onto the sensitive part of the resonator, and to compute the Young's modulus of thin film materials of even a few monolayers thickness.

Abstract: A load cell in accordance with the present invention comprises an insert defining a hub having a central opening dimensioned to receive a shaft. The insert is removably fixed to the shaft, and a cylindrical sleeve is configured and dimensioned to surround the insert. The sleeve is machined with interior notches. The insert is suspended and rotatably fixed within the sleeve by flanges which are integral with and project from the insert's hub into the sleeve's interior notches. The flanges are configured to respond with deformation to forces applied to the shaft, and strain gauges bonded to the flanges exhibit changes in resistance according to the degree of flange deformation.

Abstract: A scale includes a stationary bracket, a movable bracket, a linear displacement sensor and a plurality of the resilient mechanisms. The movable bracket is disposed opposite to the stationary bracket. The linear displacement sensor is disposed between the stationary bracket and the movable bracket. The resilient mechanisms are disposed between the stationary bracket and the movable bracket. Each resilient mechanism includes a limiting shaft, a sleeve movably sleeved on the limiting shaft and a resilient member received in the sleeve. The limiting shaft is fixed to one of the stationary bracket or the movable bracket, and the sleeve is fixed to the other. The resilient member is elastically deformed by resisting a free end of the limiting shaft. The linear displacement sensor registers a displacement of the movable bracket.

Abstract: In a parallel-guiding mechanism, a stationary parallel leg surrounds a movable parallel leg. The movable parallel leg is connected to the stationary parallel leg and guided in vertical movement by first and second parallel-guiding elements, fastened respectively to the upper and lower end portions. The movable parallel leg can be connected to a load receiver and to a force-measuring cell through a force-transmitting connection in order to transmit the weighing load. Intermediate to, and connecting, the respective end portions is a tilt-adjustment feature, by which the end portions are tilt-adjusted relative to each other about at least one tilt axis to correct a corner load error. The tilt-adjustment feature is provided by at least one of: a pair of bending zones, a spherical joint and a ring-shaped constriction.

Abstract: A foreign matter or abnormal unsmoothness inspection apparatus is constituted by a detecting member for detecting a foreign matter or abnormal unsmoothness by measuring smoothness of a surface of a substrate-like measuring object, a marking device for providing an dent on the surface of the measuring object with a predetermined horizontal distance from the foreign matter or abnormal unsmoothness, and a mass spectrum measuring device for measuring a mass spectrum of secondary ion emitted from a position with a predetermined distance from the dent by detecting the dent through impact and scanning of the surface of the measuring object with a primary ion beam.

Abstract: A dual rate force transducer is disclosed. A spring is machined to have a first spring portion with a first spring rate, a second spring portion with a second spring rate, and a platen between the spring portions. A pair of flanges are affixed to the distal ends of the spring portions. At least one sensor is affixed to one of the flanges, and at least one other sensor is affixed to another one of the flanges. Mounting hardware is used to couple the springs, flanges and platen together, including at least one mechanical stop to limit displacement of the spring.

Abstract: A beam load cell transducer is positioned between a stationary member and moveable member. The stationary member, as well as the moveable member are surrounded by a collar, which collar has an inner surface means to limit the movement of the moveable member of the transducer. By limiting the movement and restraining further movement after a predetermined excessive force is applied, one stops the beam and therefore prevents the beam from fracturing or rupturing. In the unlikely event that the beam does fracture or rupture, then the sleeve acts to hold the entire unit together, thereby maintaining integrity to the transducer.

Abstract: A dual rate force transducer is disclosed. A spring is machined to have a first spring portion with a first spring rate, a second spring portion with a second spring rate, and a platen between the spring portions. A pair of flanges are affixed to the distal ends of the spring portions. At least one sensor is affixed to one of the flanges, and at least one other sensor is affixed to another one of the flanges. Mounting hardware is used to couple the springs, flanges and platen together, including at least one mechanical stop to limit displacement of the spring.

Abstract: A multi-load beam transducer includes a fixed member, a movable member, and a plurality of load beams positioned between the members, each beam separated by a given distance normal from each other and positioned about a longitudinal axis between the members. The plurality of load beams are responsive to forces exerted on the members. The transducer further includes a plurality of resistors positioned on selected ones of the plurality of load beams. The resistors have a resistance value which varies with an applied force with the plurality of resistors electrically connected and operable to determine the value of the applied forces.

Abstract: Apparatus and method for testing a thin film material. A chip is fabricated that includes the specimen to be tested, held by a force sensor beam at a first longitudinal end and by a support structure at a second longitudinal end. The chip is configured to be placed into a testing environment for quantitative and qualitative material property testing of the specimen. Methods are also provided for fabricating a testing chip.

Abstract: A torsional sensing load cell, particularly for mounting at support locations of an automotive seat in order to determine weight and sitting position of an occupant of a motor vehicle. The load cell has the shape of a tuning fork, with one arm fixed to a foot attached to a chassis and a second parallel arm, not contacting the first arm, arranged to support a quadrant of a seat by means of a flange on the side of the second arm, causing torsion in the arm. The two arms are connected at one end by means of a bridge section through which torsion is transmitted arising from twisting in the second arm. Torsion is measured by transducers on the bridge section with torsion signals converted to weight signals. The weight signals are used to control deployment of an air bag or other safety apparatus.

Abstract: A torsional sensing load cell, suitable for mounting at support locations of an automotive seat in order to determine weight and sitting position of an occupant of a motor vehicle. The load cell has the shape of a tuning fork, with one arm fixed to a foot attached to a chassis and a second parallel arm, not contacting the first arm, arranged to support a quadrant of a seat by means of a flange on the side of the second arm, causing torsion in the arm. A stop pin arrangement is provided in the load cell to prevent overloading the cell in a high force situation such as a collision.

Abstract: Disclosed is a beam strain gauge to measure strain in a material which incorporates the theory of beam mechanics and the use of a full Wheatstone bridge circuit. In all cases the beam or beams used are not attached directly to the material to be measured, thereby making the beam or beams insensitive to transverse strain. The use of beam mechanics allows the use of the full Wheatstone bridge circuit, which has many desirable properties for strain measurement. Some of these properties are self compensation for temperature and a higher gauge output signal. The beam strain gauge can be employed using silicon chip technology and provides many advantages over the current conventional strain gauges.