And Horizontal Louver Detail Patents (Class D14/311)
  • Patent number: 12316800
    Abstract: Disclosed are systems, methods, and computer-readable media for inspecting mobile devices. In one embodiment, a method is disclosed comprising executing a de-trash operation on a mobile device, the de-trash operation resulting in the removal of extraneous material attached to the mobile device; categorizing an operating system of the mobile device; connecting the mobile device to a reading device and installing one or more software applications on the mobile device, the one or more software application operable to read one or more identifiers from the mobile device; visually inspecting the mobile device and classifying the physical condition of the mobile device; performing a functional test on the mobile device upon determining that the physical condition of the mobile device is free of defects; and removing all test data from the mobile device after performing the functional test and flashing the mobile device with a new operating system image.
    Type: Grant
    Filed: May 23, 2022
    Date of Patent: May 27, 2025
    Assignee: Future Dial, Inc.
    Inventor: George Huang
  • Patent number: D439578
    Type: Grant
    Filed: January 25, 2000
    Date of Patent: March 27, 2001
    Assignee: International Business Machines Corporation
    Inventors: Tim K. Murphy, Roland Zapfe
  • Patent number: D453931
    Type: Grant
    Filed: March 30, 2001
    Date of Patent: February 26, 2002
    Assignee: International Business Machines Corporation
    Inventors: Tim Kerry Murphy, Roland Zapfe
  • Patent number: D456019
    Type: Grant
    Filed: March 21, 2001
    Date of Patent: April 23, 2002
    Assignee: Sun Microsystems, Inc.
    Inventors: Christopher H. Frank, Milton C. Lee
  • Patent number: D484501
    Type: Grant
    Filed: December 24, 2002
    Date of Patent: December 30, 2003
    Assignee: NEC Corporation
    Inventors: Kazuhiko Umezawa, Jun Kubokawa, Youichi Higuchi, Yoshin Segawa
  • Patent number: D484502
    Type: Grant
    Filed: December 24, 2002
    Date of Patent: December 30, 2003
    Assignee: NEC Corporation
    Inventors: Kazuhiko Umezawa, Jun Kubokawa, Youichi Higuchi, Yoshinao Segawa
  • Patent number: D484877
    Type: Grant
    Filed: December 24, 2002
    Date of Patent: January 6, 2004
    Assignee: NEC Corporation
    Inventors: Kazuhiko Umezawa, Jun Kubokawa, Youichi Higuchi, Yoshinao Segawa
  • Patent number: D430867
    Type: Grant
    Filed: November 12, 1999
    Date of Patent: September 12, 2000
    Assignees: Ryerson Polytechnic University, The University of Toronto, Telbotics Inc.
    Inventors: Graham Thomas Smith, Deborah Ingrid Fels, Jutta Treviranus, Simranjit V. S. Singh
  • Patent number: D1077792
    Type: Grant
    Filed: December 5, 2023
    Date of Patent: June 3, 2025
    Assignees: Futaijing Precision Electronics (Yantai) Co., Ltd., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventor: Yu-Hsien Lin