Search Patents
  • Patent number: 6117182
    Abstract: A method for optimal insertion of buffers into an integrated circuit design. A model representative of a plurality of circuits is created where each circuit has a receiving node coupled to a conductor and a source. A receiving node is selected from the modeled plurality of circuits and circuit noise is calculated for the selected receiving node utilizing the circuit model. If the calculated circuit noise exceeds an acceptable value an optimum distance is computed from the receiving node on the conductor for buffer insertion. In a multi-sink circuit merging of the noise calculation for the two receiving circuits must be accomplished. If an intersection of conductors exists between the receiving node and the optimum distance a set of candidate buffer locations is generated. The method then prunes inferior solutions to provide an optimal insertion of buffers.
    Type: Grant
    Filed: June 12, 1998
    Date of Patent: September 12, 2000
    Assignee: International Business Machines Corporation
    Inventors: Charles Jay Alpert, Stephen Thomas Quay, Anirudh Devgan
  • Patent number: 6968306
    Abstract: A method for determining an interconnect delay at a node in an interconnect having a plurality of nodes. The method includes performing a bottom-up tree traversal to compute the first three admittance moments for each of the nodes in the interconnect. The computed admittance moments are utilized, in an advantageous embodiment, to compute a pi-model of the downstream load. Next, the equivalent effective capacitance value Ceff is computed utilizing the components of the computed pi-model and the Elmore delay at the node under evaluation. In an advantageous embodiment, Ceff is characterized by: Ceff=Cfj(1?e?T/?dj) where Cfj is the far-end capacitance of the pi-model at the node, T is the Elmore delay at the node and ?dj is the resistance of the pi-model (Rdj) multiplied by Cfj. The interconnect delay at the node is then determined utilizing an effective capacitance metric (ECM) delay model.
    Type: Grant
    Filed: September 22, 2000
    Date of Patent: November 22, 2005
    Assignee: International Business Machines Corporation
    Inventors: Charles Jay Alpert, Anirudh Devgan, Chandramouli V. Kashyap