Abstract: A bag for storing and dispensing cord includes a sidewall formed from a pliable sheet of material. The sidewall defines an interior compartment having a central portion defined between two ends. In one embodiment, a resilient ring having sufficient stiffness to maintain the interior compartment in an at least partially uncollapsed shape when the bag lies on its side supports the central portion of the interior compartment. A cord is stored within the interior compartment with one end of the cord protruding through an aperture in the closed end and the other end of the cord protruding from the open end of the compartment. In one embodiment, an end cover attached to the sidewall forms the closed end of the bag.

Abstract: A high-power modulation system includes drive circuitry that receives input signals from the signal source via a series of transformers. The drive circuitry amplifies the input signals and provides the resulting amplified signals to the high-power switch. A storage capacitor within the drive circuitry stores energy derived from the input signals, and the stored energy is used to power the drive circuitry. One embodiment takes advantage of inductive ringing to more rapidly turn off the high-power switch. A diode connected in series between two drive transistors rectifies the ringing signals, pulling a control signal to the high-power switch negative.

Abstract: Described are a system and method for quickly and accurately testing sequential storage elements on programmable logic devices for zero-hold-time compliance. A programmable logic device is configured such that both the data and clock terminals of a selected sequential logic element connect to an input pin of the programmable logic device and the output terminal of the sequential logic element connects to an output pin of the programmable logic device. A circuit tester connected to the input pin then generates a signal transition on the input pin so that the signal transition traverses both the data and clock paths in a race to the sequential storage element. The circuit tester also includes an input terminal that monitors the PLD output pin to determine whether the storage element contains the correct data after the storage element is clocked.

Abstract: A circuit measures a signal propagation delay through a series of memory elements. In one embodiment the memory elements are configured in series so that together they form a delay circuit. In another embodiment the memory elements are configured in a loop to form a ring oscillator. Each memory element propagates a signal to a subsequent memory element so that the time the signal takes to traverse all of the memory elements is proportional to the average delay induced by the individual elements. This proportionality provides an effective means for measuring the delays of those components. Various embodiments of the invention measure the speeds at which memory elements can be preset, cleared, written to, read from, or clock enabled.

Abstract: A circuit measures the signal propagation delay through a selected test circuit. The test circuit is provided with a feedback path so that the test circuit and feedback path together form a free-running oscillator. The oscillator then automatically provides its own test signal that includes alternating rising and falling signal transitions on the test-circuit input node. These signal transitions are counted over a predetermined time period to establish the period of the oscillator. The period of the oscillator is then related to the average signal propagation delay through the test circuit. The invention can be applied to synchronous components that might fail to oscillate by connecting the asynchronous set or clear terminal to the output terminal so that the oscillator oscillates at a frequency determined by the clock-to-out delay of those components.

Abstract: A circuit measures the signal propagation delay through a selected test circuit. The test circuit is provided with an inverting feedback path so that the test circuit and feedback path together form a free-running oscillator. The oscillator then automatically provides its own test signal that includes alternating rising and falling signal transitions on the test-circuit input node. These signal transitions are counted over a predetermined time period to establish the average period of the oscillator. Finally, the average period of the oscillator is related to the average signal propagation delay through the test circuit. One embodiment of the invention includes a phase discriminator that samples the output of the oscillator and accumulates data representing the duty cycle of that signal. The duty cycle can then be combined with the average period of the test signal to determine, separately, the delays associated with falling and rising edges propagating through the test circuit.

Abstract: A programmable logic device (PLD), such as a field-programmable gate array (FPGA), includes an integrated delay-locked loop that produces a lock signal internal to the FPGA. The FPGA also includes a sequencer and related global signals adapted to configure the FPGA using external configuration data. The sequencer disables the FPGA during the configuration process. The sequencer then continues to disable the fully configured FPGA until receipt of the lock signal. The configuration process, including the establishment of a valid internal clock, is controlled entirely within the FPGA. In one embodiment, an FPGA can be fully or partially reconfigured without powering down the device. The delay-locked loop maintains a lock on the clock signal so that the sequencer need not wait for the lock signal after reconfiguration.

Abstract: An input block is provided that includes a user-controlled, variable-delay input circuit. The input circuit is adapted to receive an input signal and to output a delayed version of the input signal on an output node. A number of control signals dictate the amount of delay imposed on the input signal. The control signals, and therefore the amount of delay, are established using a control-signal generator. The generator can be used to actively alter the delay. In one embodiment, the control signal generator is implemented as a feedback circuit that automatically matches the delay period of the delay circuit with the delay period of a distributed clock signal.

Abstract: A circuit measures a signal propagation delay through a series of memory elements on a programmable logic device. In one embodiment, a number of latches are configured in series. Each latch is initialized to store a logic zero. The first latch is then clock-enabled so that the output of the latch rises to a logic one. The logic one from the first latch clock-enables the second latch in the series so that the output of the second latch rises to a logic one, which in turn enables the next latch in the series. The time required for a rising edge to traverse the entire sequence of latches is the cumulative time required for the output of each latch to change in response to a clock-enable signal. Consequently, the delay through the series of latches provides a measure of the time required for one of the latches to respond to a clock-enable signal.

Abstract: A circuit separately measures one or both of the rising-edge and falling-edge signal propagation delays through a signal path of interest. The greater of these delays can then be used to establish a worst-case delay for the signal path. The worst-case delay can be used, in turn, to create accurate timing specifications for logic circuits that include similar or identical signal paths. To determine the delay through the signal path, the signal path is used with a second, typically identical, signal path to create alternating feedback paths of an oscillator. The oscillator is configured to output a test-clock signal having a period proportional to either the rising- or falling-edge delays through the two signal paths. The test-signal transitions are counted over a predetermined time period to establish the average period of the oscillator. Finally, the average period of the oscillator is related to the average signal propagation delay through the signal path of interest.

Abstract: A radiation-tolerant logic circuit includes three similarly configured SRAM-based PLDs. These PLDs work in parallel to provide identical logic functions. To guard against data corruption that can result from radiation-induced upsets, the logic circuit includes a state-comparison circuit that periodically performs a bitwise comparison of the configuration and user data from each of the PLDs; if a bit from one PLD differs from the corresponding bit from the others, the state-comparison circuit sets a flag that indicates that the differing PLD is in error. The erroneous PLD is then reprogrammed using error-free state data. In one embodiment, the error-free state data is read from an error-free PLD.

Abstract: A circuit separately measures a selected one of the rising-edge and falling-edge signal propagation delays through one or more circuits of interest. A number of synchronous components are configured in a loop so that they together form a free-running ring oscillator. Each synchronous component clocks a subsequent synchronous component in the ring; the subsequent synchronous component responds by clocking a later component in the ring and by clearing a previous component to prepare it for a subsequent clock. The oscillator thus produces an oscillating test signal in which the period is proportional to the clock-to-out delays of synchronous components. This proportionality provides an effective means for measuring the clock-to-out delays of those components. Other embodiments include additional asynchronous test circuit paths for which the associated signal propagation delays are of interest.

Abstract: A circuit measures the signal propagation delay through a selected test circuit. The test circuit is provided with a feedback path so that the test circuit and feedback path together form a free-running oscillator. The oscillator then automatically provides its own test signal that includes alternating rising and falling signal transitions on the test-circuit input node. These signal transitions are counted over a predetermined time period to establish the average period of the oscillator. Finally, the average period of the oscillator is related to the average signal propagation delay through the test circuit. A phase discriminator samples the output of the oscillator and accumulates data representing the duty cycle of that signal. The duty cycle can then be combined with the average period of the test signal to determine, separately, the delays associated with falling and rising edges propagating through the test circuit.

Abstract: A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.

Abstract: Described are delay circuits that are relatively insensitive to changes in temperature and supply voltage. A delay circuit includes at least one inverter circuit made up of a pair of transistors. The inverter responds to voltage changes on the input terminal by providing corresponding inverse changes on the output terminal. The speed at which the inverter responds to voltage changes on the input terminal depends upon the ability of one or both transistors to conduct current to or from the output terminal. The ability of one or both transistors in the inverter to move charge to or from the output terminal is restricted to reduce the switching speed of the inverter, thus imposing a delay on the input signal. Further, the restricted current is provided at a reference level that is relatively insensitive to temperature changes and supply-voltage fluctuations.

Abstract: A bag for storing and dispensing electrical cord includes a sidewall formed from a pliable sheet of material. The sidewall defines an interior compartment having an open end, a closed end, and a central portion defined between the two ends. The central portion of the interior compartment is supported by a resilient ring having sufficient stiffness to maintain the interior compartment in an at least partially uncollapsed shape when the bag lies on its side. An electrical cord is stored within the interior compartment with one end of the cord protruding through an aperture in the closed end and the other end of the cord protruding from the open end of the compartment.

Abstract: Described is a programmable logic device with on-chip configuration memory for controlling the state of various programming points. Each programming point includes two or more sequential memory elements, each of which may be programmed to include a data bit associated with a different circuit configuration. The state of an accessed one of the sequential memory elements (i.e., the bit of configuration data currently stored in that memory element) dictates the current FPGA configuration. Alternate configuration bits are stored in the remaining memory elements. The configuration of the FPGA may then be changed by sequentially shifting a data bit from one of the inactive memory cells into the active memory cell. In one embodiment the sequential memory cells are configured in a ring to support alternating between two or more configurations.

Abstract: Described is a user-controlled, variable-delay interconnect structure for a programmable logic device (PLD), and a method for using this structure. In accordance with the invention, the signal propagation delays for selected signal paths can be precisely adjusted either while the PLD is being programmed or while the PLD is operating as a logic device. The delays are adjusted by selectively connecting otherwise unused interconnect lines to the signal path to increase the capacitive load on the interconnect lines that define the signal path. The ability to control the load on selected signal paths advantageously enables a user to precisely match the signal propagation delays of two or more signal paths. In one embodiment, the loads of selected signal paths can be modified while the FPGA is operational.

Abstract: A reference ring oscillator circuit (RROC) is used to determine timing characteristics of a test interconnect structure in an integrated circuit. The RROC includes an odd number of inverters coupled together in a ring manner and has defined test segments at which a test interconnect can be loaded. Reference timing characteristics of the unloaded RROC are determined according to a calibration method including the steps of: (a) directly measuring signal propagation delay through each segment of the RROC; (b) modeling each test segment using an RC tree type reference circuit model having reference elements; (c) simulating the reference circuit model to provide a functional relationship between two reference capacitors; (d) defining upper and lower bounds for propagation delay through the test segment in terms of the reference elements; (e) determining values for the reference capacitor elements; and (f) measuring a reference frequency of oscillation of the unloaded RROC.

Abstract: A method establishes page links between pages on the Internet. Individual sites (collections of pages) include dedicated links pages that consolidate links to other sites. The links page associated with a given site (the first site) includes an "add link" button that, when selected, allows an owner of a second site to add a link to the links page. The new link can be used to establish a link from the links page to the second site. To ensure reciprocity, the method also includes prompting the owner of the second site for a link back to a page of the first site and later checking the second site for the link back.