Abstract: A composition and apparatus and method of using the composition for aqueous spray descaling or conditioning of scale or oxide on metal surfaces, especially stainless steel strip or the like, in one embodiment, although it can be used to descale or condition oxide or scale on other work pieces such as metal bar, or even discrete objects. An aqueous solution having a base composition of an alkali metal hydroxide, such as sodium hydroxide, potassium hydroxide, or a mixture of alkali metal hydroxides such as sodium hydroxide and potassium hydroxide is used. The aqueous solution may contain certain additives to improve the descaling performance of the salt. In one embodiment, the solution is used to condition the scale or surface oxide on a strip of stainless steel. The strip of steel is at a temperature between the melting point of the alkali metal hydroxide in anhydrous form and a temperature at which the Leidenfrost effect appears.

Abstract: A method forming a composite laminate structure includes providing first and second circuit board element each having circuitry on at least one face thereof and plated through holes. A voltage plane element is provided having at least one voltage plane having opposite faces with layers of partially cured photodielectric material on each face. At least one hole is photopatterned and etched through the voltage plane element but completely isolated from the voltage plane. Each through hole in the voltage plane element is aligned with a plated through hole in each of the circuit board elements to provide a surface on the voltage plane element communicating with the plated through holes. The voltage plane is laminated between the circuit board elements and the photoimageable material on the voltage plane is fully cured.

Abstract: A memory module comprising: a plurality of memory devices associated with the module; each of the memory devices being configured in M banks; and a logic circuit for configuring the memory module to operate in a programmable addressing mode; the logic circuit receiving a number of address inputs and a number of bank address signals from a memory controller with the address inputs and bank address input signals corresponding to N bank memory devices; the logic circuit re-mapping at least one of said address inputs as an additional bank address signal to the memory device or at least one of the bank address signals to a different device bank address.

Abstract: A memory card having a memory bus controller is provided which card has a signal processing element preferably a digital signal processor (DSP) thereon, which card is used in a computer system as add-on memory. Also, a method of using such a card in a computer system is provided. The memory bus controller and the signal processing element are programmed to pass all the addresses in the memory on the card and the associated data received from the CPU to the signal processing element where they are stored in memory. The signal processing element is programmed to perform selected operations on the addresses and/data irrespective of whether the signal processing element has control of the system bus. These operations can include keeping track of read/write operations and the locations of these operations. This information can be easily accessed by the computer system and used for memory optimization. The DSP can also “snoop” the memory bus when it is unavailable to the control of the DSP, i.e.

Abstract: A wiring board for mounting an electrical device, which has an array of connectors thereon arranged in a grid pattern, wherein the connectors have at least two levels of criticality of connection to the substrate. The substrate has a plurality of mounting structure or features arranged in the same grid pattern to connect with the array of connectors on the electrical device. The mounting structures or features are divided into a plurality of at least two groups, with each group corresponding to a level of criticality of the connectors on the device. Each group of mounting structures has a discernible feature differing from each other group, to thereby permit different levels of inspection criteria for each group.

Abstract: Forming an isotropic electrical connection and a mechanical bond between two articles having metal surfaces. The resulting bond is preferably between metal contact pads on a dielectric substrate and on an electronic device. The connection is provided by utilizing a conductive adhesive wherein the conduction is provided by metal particles which have exposed palladium thereon. The particles may be the metal palladium itself or it may be some other metal, such as silver, having palladium coated thereon. The particles typically are flakes with the palladium having an incipient dendritic form on the surface, i.e.; the palladium has a multi-pointed surface configuration that can grow into fully formed needle-like dendritic structures. The polymer preferably is conventional polyimide/siloxane which is a thermoplastic, i.e. upon heating softens and upon cooling sets, and upon reheating will soften and reflow.

Abstract: It is a feature of the present invention that a subminimum dimension wordline links approximately minimum dimensional individual gate segments with the bitline contact being borderless to the wordline. It is still a further object of the present invention to provide a transistor with an individual segment gate conductor and a subminimum dimension gate connector with the bitline contact being borderless to the wordline. A semiconductor structure and method of making same comprising a DRAM cell which has a transistor which includes a gate. The gate comprises an individual segment of gate conductor such as polysilicon on a thin dielectric material. The transistor further comprises a single crystal semiconductor substrate having a source/drain region. An active conductive wordline is deposited on top of and electrically contacting the segment gate conductor with the wordline being a conductive material.

Abstract: A method provides for additive plating on a subcomposite having filled plated through holes. Fine-line circuitry is achieved via electroless deposition onto a dielectric substrate after the through hole is plated and filled. Fine-line circuitry may be routed over landless, plated through holes thereby increasing the aspect ratio and the available surface area for additional components and wiring.

Abstract: A method and structure is provided for preventing wetting or bleed of an adhesive, such as an epoxy, onto noble metal wire bond pads on the surface of a dielectric substrate when attaching an I/C chip to the substrate. The method includes treating the wire bond pads with a chemical composition which prevents bleeding onto the surfaces of the wire bond pads by a component of the epoxy. The chemical composition is a chemical which will provide “Self-Assembled Monolayers” (SAMs) on the surface of the gold. These compositions are characterized by a molecule having at least one group, such as a mercaptan or disulfide, connected to a hydrocarbon moiety, such as a (CH2)x chain. The affinity of the thiol or sulfur-containing portion of the molecule chemically bonding with the noble metal provides a relatively strong attachment of the molecule to the metal surface.

Abstract: A method for reactive ion etching of SiO2 and an etch stop barrier for use in such an etching is provided. A silicon nitride (SixNy) barrier having a Six to Ny ratio (x:y) of less than about 0.8 and preferably the stoichiometric amount of 0.75 provides excellent resilience to positive mobile ion contamination, but poor etch selectivity. However, a silicon nitride barrier having a ratio of Six to Nx (x:y) of 1.0 or greater has excellent etch selectivity with respect to SiO2 but a poor barrier to positive mobile ion contamination. A barrier of silicon nitride is formed on a doped silicon substrate which barrier has two sections. One section has a greater etch selectivity with respect to silicon dioxide than the second section and the second section has a greater resistance to transmission of positive mobile ions than the first section. One section adjacent the silicon substrate has a silicon to nitrogen ratio of less than about 0.8.

Abstract: A method of making a flip chip package that maintains flatness over a wide temperature range and provides good heat dissipation is described. A laminate substrate is electrically connected to electrical contacts disposed on a chip and underfill material is applied between the soldered connections. A body, for example an uncured dielectric material, is applied to the chip, the laminate substrate, a thermally conductive member or combinations thereof, and thermally conductive member is disposed adjacent to the surface of the chip that is opposite the surface connected to the laminate substrate. The body is extruded between the chip and the thermally conductive member. The thickness of the thermally conductive member is determined by balancing the stiffness and the CTE of both the thermally conductive member and the laminate substrate, and the length and width of the thermally conductive member may vary but are at least the size of the corresponding length and width of the chip.

Abstract: A chip mounting assembly includes a dielectric substrate having at least one integrated circuit (I/C) chip mounted thereon. An electrically conductive cover plate is in contact with all the chips with an electrically non-conducting thermally conducting adhesive. A stiffener member is provided which is mounted on the substrate and laterally spaced from the integrated circuit chip. At least one electrically conductive ground pad is formed on the substrate. The stiffener has at least one through opening therein and electrically conductive adhesive extending through each opening and contacting the cover plate and each ground pad.

Abstract: The electrical interconnections between an integrated circuit chip assembly are encapsulated and reinforced with a high viscosity encapsulant material in a single step molding process wherein a mold is placed over an integrated circuit chip assembly and encapsulant material is dispensed through an opening in the mold and forced around and under the integrated circuit chip by external pressure encapsulating the integrated circuit chip assembly. An integrated circuit chip assembly having a reinforced electrical connection which is more resistant to weakening as a result is stress created by differences in coefficient of thermal expansion between the integrated circuit chip and the substrate to which the integrated circuit chip is attached is produced.

Abstract: According to the present invention, a computer system and method of operation of the system is provided wherein the computer system has a memory controller which generates first and second RAS signals and Y rows of addresses in memory, and wherein the memory of the system, either as a planar or add-on memory, is configured with Y+1 rows of addresses operable by a single RAS. The system includes logic, preferably which is on an ASIC chip, to convert one of the RAS signals from the memory controller in conjunction with at least one address list to the high order address bit for the memory rows, thus constituting Y+1 rows of addressable space. The logic also generates a master RAS signal when either RAS generated by the memory controller goes active. The logic also provides for a refresh operation of all of the memory locations during a RAS only refresh operation.

Abstract: The present invention provides a method and device for reduced-pin integrated circuit I/O testing. In this regard, the present invention provides for the testing of an integrated circuit or chip in a manner which is independent of the number of test pins present on the testing device. The method and device of the present invention are realized through an integrated circuit having two test ports: a scannable I/O test port and a Forcing-Measuring test port, and a plurality of switches. The scannable I/O test port is employed for the input and output of, among other things, scannable shift-register latch data which affects the states of the plurality of switches in the integrated circuit. The Forcing-Measuring test port is employed for, among other things, forcing or measuring voltages and currents associated with the I/O circuits under test through the switches to the circuits under test.

Abstract: A method for coating cloth especially fiberglass sheets with a thermosetting resin and resulting structure is provided. The coating is performed in two steps. In the first step, essentially all of the strands of the fiberglass are coated with the resin/solvent mixture while maintaining at least some of the interstices or openings essentially free of the solvent mixture. This first coating is then partially cured to between about 70% and 90% of full cure. The coated fiberglass with partially cured resin thereon is then given a second coating of either the same or different thermosetting resin mixture which coats the first coating and fills in the interstices between the fibers. This second coating is then partially cured, which advances the cure of the first coating past 80% full cure and results in an impregnated fiberglass cloth structure for use as sticker sheets.

Abstract: A serial bus and connection to a device on a computer system through a system memory controller is provided on a memory card having a DSP and a memory bus controller to allow the DSP on the memory card to gain access to the system device without using the system memory bus. The serial bus is a two wire serial bus connecting the device to the DSP through the system memory controller. If more than one memory card is present with DSPs or more than one device is contending for access, the system memory controller or arbitrate the access of each memory card or contending device. In such case the serial bus will signal the system memory controller when it wants access to the particular device, and the system memory controller will act as arbitrator to grant or not grant access to the particular memory card or device requesting access. If access is granted the bus memory controller outputs the required control or command word on the serial bus followed by the address and the required data.

Abstract: A memory module includes a plurality of memory chips on the module; first logic for configuring the memory module to operate in a selectable mode; second logic for storing initial presence detect (PD) data; and third logic for storing modified PD data that corresponds to a requested mode of operation of the memory module received from a system controller. The system checks the first logic to see if the mode is compatible with the system mode. If not, different PD data is written to and read from the third logic successively until a compatible mode is found or the available PD data is exhausted.

Abstract: A novel method of filling apertures in substrates, such as through holes, is provided. The method utilizes a phtoimageable film, and comprises the following steps: applying a photoimagable, hole fill film over the apertures, preferably having a solvent content of 7-18%; reflowing the hole fill film to flow into the apertures; exposing the hole fill film to actinic radiation, preferably ultraviolet light, through a phototool, which preferably has openings slightly larger than the diameter of the apertures; then at least partially curing the hole fill film; and developing the hole fill film to remove the unexposed hole fill film. Thus, the apertures may be selectively filled. After the apertures are filled, the hole fill film is cured. Thereafter, the substrate may be subjected to further processing steps, for example, nubs of cured hole fill film can be removed. If desired, the substrate is circuitized and overplated with gold.

Abstract: The electrical connections of an integrated circuit chip assembly comprised of an integrated circuit chip attached to a substrate are encapsulated and reinforced with a high viscosity encapsulant material by dispensing the encapsulant material through an opening in the substrate into the space between the integrated circuit chip and the substrate. An integrated circuit chip assembly having a reinforced electrical interconnection which is more resistant to weakening as a result of stress created by differences in coefficient of thermal expansion between the integrated circuit chip and the substrate to which the integrated circuit chip is attached is produced.