Abstract: A chip tester for testing at least two devices under test connected to the chip tester has a timing calculator for generating a timing information for the channels of the chip tester. The timing calculator is adapted to obtain a propagation delay difference information describing a difference between, on the one hand, a propagation delay from the first channel port of the chip tester to the first terminal of the first device under test and, on the other hand, a propagation delay from the first channel port of the chip tester to the second terminal of the second device under test. The timing calculator is adapted to provide a timing information for a second channel of the chip tester connected to the first device under test or to the second device under test on the basis of the propagation delay difference information. The channel module configurator is adapted to configure the second channel of the chip tester on the basis of the timing information.

Abstract: A self-repair system provides resource failure tolerance using an interconnection network that provides interconnection information identifying connections between system resources, redundant resources and ports that are connectable to consumers of the system resources. A controller identifies both defective system resources and the affected sinks connected to the defective system resources from the interconnection network. The controller further identifies compatible resources from the system resources and redundant resources that are capable of replacing the defective system resources for each of the affected sinks from the interconnection network. The controller determines a respective cost associated with each of the compatible resources, and in response to the determined costs, selects at least one of the compatible resources as a replacement resource for each of the defective system resources.

Abstract: A probe card assembly used to test electronic devices in an automated test equipment system. The probe card assembly includes a substrate having a plurality of through-holes contained therein and a plurality of electrical contact elements. Each of the plurality of electrical contact elements has characteristics of both a torsional beam and a cantilever beam design and is configured to scrub a test pad associated with the electronic device in two directions concurrently. The plurality of electrical contacts is configured to be magnetically aligned to the substrate. Each of the plurality of electrical contact elements is further configured to be removably adhered to the substrate thus allowing easy field replacement of individual electrical contact elements.

Abstract: An electronic device for use with a probe head in automated test equipment includes first and second pluralities of semiconductor devices. The first plurality of semiconductor devices is arranged to form at least one driver arranged to couple to a device under test. The at least one driver is configured to transmit a signal to the at least one device under test. The second plurality of semiconductor devices is arranged to form at least one receiver arranged to couple to the device under test. The at least one receiver is configured to receive a signal from the at least one device under test. Each of the second plurality of semiconductor devices has a thickness less than about 300 ?m exclusive of any electrical interconnects. The at least one receiver is adapted to mount directly to the probe head.

Abstract: A method for testing electronic devices involves receiving a stimulus signal for testing a device; changing an operating temperature of at least a component of an electrical filter while maintaining settings of the electrical filter, thereby altering the stimulus signal as the stimulus signal passes through the electrical filter, to create an altered stimulus signal; and outputting the altered stimulus signal.

Abstract: A device for processing data adapted for being converted between an analog format and a digital format, the device having a scrambling unit adapted for scrambling the data based on at least a part of the data to thereby decorrelate the data in the analog format with respect to the data in the digital format.

Abstract: In one embodiment, apparatus for transmitting and receiving data includes a transmission line network having at least three input/output terminals; at least three transmit/receive units, respectively coupled to the at least three input/output terminals; and a control system. The control system is configured to, depending on a desired direction of data flow over the transmission line network, i) dynamically place each of the transmit/receive units in a transmit mode or a receive mode, and ii) dynamically enable and disable an active termination of each transmit/receive unit. Methods for using this and other related apparatus to transmit and receive data over a transmission line network are also disclosed.

Abstract: A multi-channel architecture comprising a central facility that is under clock control of a central facility's clock signal, and a central transfer clock generator adapted for deriving a central transfer clock signal from the central facility's clock signal. The multi-channel architecture further comprises a set of n channels, with n being a natural number, wherein each channel is under clock control of one out of a plurality of clock signals. Each of the channels comprises a channel transfer clock generator adapted for deriving a channel transfer clock signal from a clock signal of the respective channel, wherein the central facility's clock signal and the clock signals of the channels comprise at least two different clock signals. The transfer clock period of the central transfer clock signal is substantially equal to each of the transfer clock periods of the channel transfer clock signals.

Abstract: A signal processing device having an adjustment unit for adjusting a time duration of each of a plurality of signals individually in accordance with an amplitude of the respective signal to thereby generate calibrated signals, and a combining unit for combining the calibrated signals.