Abstract: An approach is described for a method, product, and apparatus for a machine learning process using dynamic rearrangement of sparse data and corresponding weights. This approach includes a method, product, and apparatus for dynamically rearranging input data to move sparse data to a location such that computations on the sparse data might be avoided when executing a machine learning processing job. For example, sparse data within each row of the input matrix can be moved to the end of each corresponding row. When the input data is folded to fit the array, that sparse data might be at least partially contained within a fold that comprises only sparse data and possibly filler data. In such an event, computations on the fold are unnecessary and are avoided. In some embodiments, the approach includes dynamically rearranging a weight matrix to maintain a correspondence between the input data and the weights.

Abstract: Aspects of the present disclosure address systems and methods for performing a machine-learning based clustering of clock sinks during clock tree synthesis. An integrated circuit (IC) design comprising a clock net that includes a plurality of clock sinks is accessed. An initial number of clusters to generate from the set of clock sinks is determined using a machine-learning model. A first set of clusters is generated from the set of clocks sinks and includes the initial number of clusters. A timing analysis is performed to determine whether each cluster in the first set of clusters satisfies design rule constraints. The initial number of clusters is adjusted based on the timing analysis and a clustering solution is generated based on the adjusted number of clusters.

Abstract: Various embodiments provide for failure mode analysis of a circuit design, which can be used as part of electronic design automation (EDA). In particular, some embodiments provide for failure mode analysis of a circuit design by determining a set of functional primitives of a circuit design component (e.g., cell at gate level) that contribute to a root cause logic for a specific failure mode.

Abstract: Aspects of the present disclosure address systems and methods for fixed-point quantization using a dynamic quantization level adjustment scheme. Consistent with some embodiments, a method comprises accessing a neural network comprising floating-point representations of filter weights corresponding to one or more convolution layers. The method further includes determining a peak value of interest from the filter weights and determining a quantization level for the filter weights based on a number of bits in a quantization scheme. The method further includes dynamically adjusting the quantization level based on one or more constraints. The method further includes determining a quantization scale of the filter weights based on the peak value of interest and the adjusted quantization level. The method further includes quantizing the floating-point representations of the filter weights using the quantization scale to generate fixed-point representations of the filter weights.

Abstract: Embodiments included herein are directed towards a fractional feedback divider circuit and associated method. The circuit may include a programmable feedback divider including a plurality of flip-flops arranged in series. The programmable feedback divider may be configured to receive an input clock signal and a reset signal comprising at least one pulse and to generate a divided clock. The circuit may include reset logic configured to receive an input from the programmable feedback divider and to generate a reset signal. The circuit may include a first D flip-flop configured to receive the reset signal and to generate an output and a second D flip-flop configured to receive the output from the first D flip-flop and to generate a second output. The circuit may further include a multiplexer configured to receive the second output and to generate an output clock signal.

Abstract: The present disclosure relates to a high speed, differential input, single phase clock circuit. The circuit may include a cross-coupled PMOS connected with a cross-coupled NMOS via a pass gate. The circuit may further include a single-phase clock in communication with the cross-coupled PMOS and the cross-coupled NMOS. The circuit may also include a master and a slave each having an output node that charges and discharges to VDD or ground respectively, wherein there is no direct feedback from an output of the circuit to an input the circuit and there is no precharged state in the circuit.

Abstract: Various embodiments provide for clustering-based grouping of cells in a cell library, which can be used for pruning the cell library. In particular, various embodiments provide for a clustering-based grouping of cells in a cell library based on a criterion (or cell attribute), and for pruning of the cell library based on the grouping of cells, which can optimize the cell library for the criterion. For instance, some embodiments provide for a clustering-based grouping of cells based on leakage power and then applying cell library pruning to optimize for cell leakage power.

Abstract: The present disclosure relates to a computer-implemented method for electronic design is provided. Embodiments may include receiving, using at least one processor, an electronic design having an original schematic associated therewith and extracting one or more features for each net from the schematic. Embodiments may include storing one or more resistance or capacitance values for each net and applying the one or more resistance or capacitance values as labels for a machine learning model. Embodiments may also include training the machine learning model using one or more actual values to generate a trained model. Embodiments may further include receiving the trained model to predict parasitics for a stitching engine and generating a stitched schematic.

Abstract: Aspects of the present disclosure address systems, methods, and a user interface for providing interactive skew group visualizations for integrated circuit (IC) design. The method includes causing display of a user interface that includes a display of a grouped view of a clock-tree including a plurality of skew group indicators. The method further includes receiving a user selection of a skew group indicator and updating the user interface to display a detailed view of the skew group including a graphical representation of each clock sink in the skew group and corresponding timing information. The method further includes receiving a second user selection of a first clock sink and in response, the display is updated to display an indicator of a physical location of the first clock sink within the clock tree.

Abstract: Methods and systems are disclosed for an upstream facing port implementation for DisplayPort link-training tunable PHY repeaters (LTTPRs). The device includes an upstream facing port to interface with an external DisplayPort source device and a downstream facing port to interface with an external DisplayPort sink device and the upstream facing port. The upstream facing port is configured to perform operations including receiving a main link data stream from an external transmitting display device, generating an outbound main link data stream, and providing the outbound main link data stream for transmitting by the external device. The device is also configured for receiving an updated main link data stream corresponding to the outbound main link data stream and sending the updated main link data stream to the downstream facing port to be transmitted to a receiving display device.

Abstract: Various embodiments provide a system for performing operations that comprise accessing an integrated circuit design that includes a clock tree interconnecting a clock source to a plurality of clock sinks. The operations include receiving a request to adjust a present timing offset of the clock tree to a target timing offset. In response, a group of clock sinks to be adjusted are identified to satisfy the request. The clock tree is then modified by moving a terminal of the group from a first location in the clock tree to a second location in the clock tree to update the clock tree. An indication is provided that the updated clock tree has been modified and complies with the target timing offset.

Abstract: An approach includes identification of a machine learning model for processing and generating an ordered set of weights with varying precisions and metadata that specifies where those values can be found in order to allow the identification of weights needed during processing. In a first embodiment, the variable precision weights are separated into different memory segments where each segment has weights of only a single precision. In a second embodiment, the variable precision weights are provided in a memory where weights of different precisions are intermingled, and those weights are identified using a sequence of pairs of data representing a number of weights with the same precision and the precision of those weights. In some embodiments, both the first and second embodiments are combined, where some segments contain weights with only a single precision and at least one segment stores weights with different precisions within a respective segment.

Abstract: An approach includes a new power and ground structure description language (PSDL) will allow the user to describe the desired routing pattern for each layer and on a user defined region by region basis, including how the pattern will be laid out in the design with respect to other patterns from a different layer. The new PSDL also gives the complete picture of the entire power and ground structure, instead of just a layer-by-layer view from a single command. It also allowed flexibility in alignment especially when dealing with track misalignments, thus avoiding the extensive trial-and-error steps needed to calculate offsets and distances to maintain pattern alignment using previous approaches. Additionally, because PSDL is not tightly dependent on the design size and/or floorplan, transferring the desired power and ground structure from one design to another will be very easy with only few adjustments.

Abstract: Embodiments disclosed herein describe switching logic in board-level interconnects and in the system-level interconnects that may provide bitwise dynamic routing and switching between corresponding board-level and system-level components. At board-level, a switching ASIC may receive input data through a backplane from an emulation ASIC in a first logic board and route any bit of the input data to any of the emulation ASIC in a second logic board. At system-level, a switching logic board containing a set of switching ASICs may be associated with a logic cluster and may dynamically route data bits from the emulation ASICs in the logic cluster to emulation ASICs to other logic clusters of the emulation system and/or target systems. Additionally, the switching logic board may dynamically route bits from the other logic clusters to the associated logic cluster.

Abstract: The present disclosure relates to systems and methods for floorplanning using machine learning techniques. Embodiments may include receiving an electronic design and analyzing the electronic design using a reinforcement learning agent. Embodiments may further include recommending a first action wherein the first action includes at least one of a place agent action, a via agent action, or a route agent action. Embodiments may also include updating the electronic design based upon, at least in part, the first action to generate an updated electronic design. Embodiments may further include analyzing the updated electronic design using the reinforcement learning agent and recommending a second action wherein the second action includes at least one of a place agent action, a via agent action, or a route agent action. Embodiments may also include updating the updated electronic design based upon the second action to generate a second updated electronic design.

Abstract: The present disclosure relates to a system and method for electronic design. Embodiments may include receiving, using at least one processor, a plurality of distinct electronic designs at an electronic design database and storing the plurality of distinct electronic designs at the electronic design database. Embodiments may further include receiving a request to reuse one of the plurality of distinct electronic designs from a client electronic device associated with a user, wherein the request includes design connectivity information, block connectivity information, and page connectivity information. Embodiments may also include analyzing the design connectivity information, block connectivity information, and page connectivity information to identify one or more closest matches with the plurality of distinct electronic designs and providing the one or more closest matches to the client electronic device to allow for subsequent displaying at a graphical user interface.

Abstract: Scan channel slicing methods and systems for testing of scan chains in an integrated circuit (IC) reduce the number of test cycles needed to effectively test all the scan chains in the IC, reducing the time and cost of testing. In scan channel slicing, rather than loading and unloading into scan chains high-power patterns having numerous switching transitions over the length of each scan chain, loading and unloading the entirety of the scan chain scan while observing it, chain load data is sliced, apportioning between the different scan chains independently observable sections (slices) of transition data in which all four bit-to-bit transitions (“0” to “0”, “0” to “1”, “1” to 0”, “1” to “1”) are ensured to exist. The remainder of the scan chain load data, which is not observed in the test procedure, can be low-transition data that consumes low dynamic power, such as mostly zeroes or mostly ones.

Abstract: An integrated circuit (IC) test engine can generate a plurality of single cycle test patterns that target a plurality of static single cycle defects of a fabricated IC chip based on an IC design. The IC test engine can also fault simulate the plurality of single cycle test patterns against a plurality of multicycle defects in the IC design, wherein a given single cycle test pattern of the plurality of single cycle test patterns is sim-shifted to enable detection of a given multicycle fault and/or defect of the plurality of multicycle faults and/or defects.

Abstract: The present disclosure relates to a method for electronic circuit design. Embodiments may include receiving, using a processor, an electronic circuit design and performing a deadlock check on the electronic circuit design using a using a linear temporal logic property and a proof engine. Embodiments may further include analyzing a counterexample associated with the electronic circuit design for a loop escape condition, wherein analyzing includes proving a cover trace of a liveness obligation. If the loop escape condition is reachable from the counterexample, embodiments may include extracting one or more events associated with the loop escape condition and adding a waiver constraint to the deadlock check to force a no deadlock outcome.

Abstract: A trace subsystem of an emulation system may generate differential frame data based upon successive frames. If one compression mode, the trace subsystem may set a flag bit and store differential frame data if there is at least one non-zero bit in the differential frame data. If the differential frame data includes only zero bits, the trace subsystem may set the flag bit without storing the frame data. In another compression mode, the computer may further compress the differential data if the frame data includes one (one-hot) or two (two-hot) non-zero bits. The controller may set flag bits to indicate one of all-zeroes, one-hot, two-hot, and random data conditions (more than two non-zero bits). For one-hot or two-hot conditions, the controller may store bits indicating the positions of the non-zero bits. For random data conditions, the controller may store the entire differential frame.