Abstract: A light beam shaping arrangement for a light microscope has a first and a second liquid crystal region or lifting micromirror region, each of which has a plurality of independently switchable liquid crystal elements or mirrors with which a phase of incident light is changeable in a settable manner, an input-/output-coupling polarization beam splitter, a polarization beam splitter arranged between the input-/output-coupling polarization beam splitter and the liquid crystal regions or lifting micromirror regions such that the polarization beam splitter separates the light coming from the input-/output-coupling polarization beam splitter in a polarization-dependent manner into a first partial beam.

Abstract: The invention relates to a method for fastening an object to a manipulator in a particle beam apparatus and for moving the object in the particle beam apparatus. The invention further relates to a computer program product and a particle beam apparatus, which are provided to carry out the method according to the invention. The method according to the invention includes the following steps: generating a first surface on the manipulator using a particle beam of the particle beam apparatus; generating a second surface on the object using the particle beam, in such a way that the second surface corresponds to the first surface; arranging the first surface at the second surface such that the manipulator is arranged at the object; fastening the object to the manipulator in a boundary region between the first surface and the second surface using the particle beam; and moving the object fastened to the manipulator using the manipulator and/or a mobile object stage, on which the object is arranged.

Abstract: Imaging, processing and/or analyzing an object using a particle beam device includes guiding a first particle beam over the object, processing the object using the first particle beam or detecting first interaction particles and/or a first interaction radiation, where the first interaction particles and/or the first interaction radiation results/result from an interaction of the first particle beam with the object, controlling a second deflection device for guiding the second particle beam over the object even while the first particle beam is being guided over the object, and deflecting the first particle beam from the object. Only when the first particle beam has been deflected, the object is processed using the second particle beam or detecting second interaction particles and/or a second interaction radiation that results/result from an interaction of the second particle beam with the object.

Abstract: Fastening an object to a movable manipulator and/or an object holder in a particle beam apparatus and moving the object in the particle beam apparatus includes fastening a material unit, configured to hold an object, to the manipulator using a particle beam, fastening the object to the material unit using the particle beam, and, using the manipulator and/or an object stage, moving the object fastened to the material unit. A computer program product has program code which can be loaded into a processor and which, when executed, controls a particle beam apparatus to fasten a material unit, configured to hold an object, to the manipulator using a particle beam, fasten the object to the material unit using the particle beam, and, using the manipulator and/or an object stage, move the object fastened to the material unit.

Abstract: A microscope, which includes a color splitter that is reflective to excitation radiation, can switch between a first and a second operating mode. A first apparatus can introduce a first cylindrical optical element into the excitation beam path between a light source and the color splitter, when the microscope is in the first operating mode, and a second apparatus can introduce a second cylindrical optical element into the excitation beam path between the color splitter and a scanning apparatus.

Abstract: Disclosed is a changing device for optical components in a microscope. The changing device includes an optical component having a flat surface. The changing device further includes a carrier for inserting and/or holding the optical component. The changing device further includes a receptacle for holding the carrier in an optical path of the microscope. The carrier has bearing surfaces for the flat surface of the optical component and positioning surfaces located in the same plane, which are not covered by the optical component, when inserting the latter. The receptacle has bearing surfaces for contact with the positioning surfaces and first attachment means for attaching the carrier positioned on the receptacle in order for the positioning surfaces to act upon the bearing surfaces.

Abstract: Processing an object using a material processing device with a particle beam apparatus includes determining a region of interest of the object on or in a first material region of the object, ablating material from a second material region adjoining the first material region using an ablation device, and recognizing a geometric shape of the first material region. The geometric shape has a center. Processing the object also includes ablating material from a second portion of the first material region adjoining a first portion using a particle beam, the first portion having a first subregion and a second subregion, the region of interest being arranged in the first subregion, recognizing a further geometric shape of the first material region, positioning the object such that the first position corresponds to a center of the further geometric shape, and ablating material from the second subregion using the particle beam.

Abstract: Operating a gas feed device for a particle beam apparatus includes predetermining a flow rate of a precursor through an outlet of a precursor reservoir containing the precursor to be fed onto an object, loading a temperature of the precursor reservoir, the temperature being associated with the predetermined flow rate, from a database into a control unit, setting a temperature of the precursor reservoir to the temperature loaded from the database using a temperature setting unit, and determining at least one functional parameter of the precursor reservoir depending on the flow rate and the temperature, loaded from the database, using the control unit and informing a user of the gas feed device about the determined functional parameter. Informing the user of the gas feed device about the functional parameter may include displaying the functional parameter on a display unit, outputting an optical signal, or outputting an acoustic signal.

Abstract: System for state monitoring of a microscope the system having at least one measuring sensor in each case for capturing at least one time-variable chemical and/or physical quantity, a camera for recording an image in a field of view and a processing unit. The at least one measuring sensor has a display area and displays thereon a measured value for the captured time-variable chemical and/or physical quantity. The camera is arranged so that the display areas of at least one measuring sensor are located in the field of view and the processing unit is configured to evaluate the image and to extract the display areas contained in the image therefrom. Also, a method for state monitoring of a microscope is disclosed, wherein at least one measuring sensor with a display area is provided in order to capture in each case at least one time-variable chemical and/or physical quantity, and an image is recorded. The image is recorded so that it contains the display areas of at least one measuring sensor.

Abstract: An arrangement for light sheet microscopy contains an illumination objective for illuminating a sample located on a slide in a medium with a light sheet, a detection objective, a separation layer system, a first adaptive optical detection correction element, and a further adaptive optical detection correction element and/or a first adaptive optical illumination correction element, and optionally, a further adaptive optical illumination correction element. The arrangement contains an adjustment device for the controlled movement of the first detection correction element and of the further detection correction element and/or of the first illumination correction element and of the further illumination correction element; and a control unit, to generate control commands and to actuate the adjustment devices by means of the control commands such that aberrations are reduced. Corresponding objectives and a corresponding method for reducing aberrations can be used.

Abstract: A method for setting position of a component of a particle beam apparatus may be performed, for example, by the particle beam apparatus. The component may be embodied as a gas feed device, as a particle detector and/or as a beam detector. The method may include: aligning the component with a coincidence point of a particle beam of the particle beam apparatus, determining a rotation angle of a rotation of an object carrier about a rotation axis, loading a position of the component associated with the rotation angle from a database into a control unit, transmitting a control signal from the control unit to a drive unit for moving the component, and moving the component into the position loaded from the database by means of the drive unit, wherein the component arranged in the loaded position is at a pre-definable distance from the object.

Abstract: A distance measuring device in microscopy contains a sample stage for arranging a sample carrier in a sample plane, and at least one, preferably at least two illumination sources for providing measurement radiation, which is reflected at least proportionally at a surface of the sample carrier. The device also contains a detection optical unit for capturing an overview image and occurring reflections at the sample carrier present in the sample plane; a detector disposed downstream of the detection optical unit and serving for the spatially resolved capture of image data of the sample carrier and of occurring reflections; and an evaluation device for ascertaining at least a distance of the surface at at least one location of the sample carrier. The illumination sources emit the measurement radiation in each case at a divergent emission angle. A corresponding method can be used for ascertaining a spatial orientation of a sample carrier.

Abstract: A microscopy system comprises a microscope which can record at least one microscope image and a computing device which comprises a trained image processing model set up to calculate an image processing result based on the at least one microscope image. A method for verifying a trained image processing model, which can be performed by the computing device, can include receiving a validation image and an associated target image; entering the validation image into the trained image processing model, which calculates an output image therefrom; entering image data based on at least the output image and the associated target image into a trained verification model which is trained to calculate an evaluation that indicates a quality that depends on the image data for entered image data; and calculating an evaluation by the trained verification model based on the entered image data.

Abstract: Images are captured with a sample object in various arrangements relative to lighting and a detector. The images are then combined image point by image point on the basis of a comparison of image point values of image points of said images. This achieves a reduction in interference, i.e. reflections and/or shadows can be reduced.

Abstract: An overview image of a sample carrier is obtained in a method for ascertaining a measurement location of a microscope. A mapping or homography is determined, by means of which the overview image is perspectively convertible into a plan view image on the basis of a height of the sample carrier. The measurement location is identified, with the aid of the determined mapping/homography, in the overview image or in an output image derived therefrom.

Abstract: An optics arrangement for flexible multi-color illumination for a light microscope includes an acousto-optical tunable filter (“AOTF”). The AOTF is set up to diffract two light components from incident illumination light into different order-of-diffraction directions. The two light components differ in their wavelengths and polarizations. Alternatively, an electro-optical modulator (“EOM”) can be used, with which two temporally successive light components of different wavelengths are set to different polarization directions. A polarization beam splitter separates the two light components of different wavelengths and polarizations into reflection light, which is reflected at the polarization beam splitter, and transmission light, which is transmitted at the polarization beam splitter. A light structuring apparatus imprints different structures onto the transmission light and the reflection light.

Abstract: An object receiving container may receive an object which is examinable, analyzable and/or processable at cryo-temperatures. An object holding system may comprise an object receiving container. A beam apparatus or an apparatus for processing an object may comprise an object receiving container or an object holding system. An object may be examined, analyzed and/or processed using an object receiving container or an object holding system. The object receiving container may comprise a first container unit, a cavity for receiving the object, a second container unit, which is able to be brought into a first position and/or into a second position relative to the first container unit, and at least one fastening device which is arranged at the first container unit or at the second container unit for arranging the object receiving container at a holding device.

Abstract: A method for regulating a light source of a microscope that illuminates an object, said method including specifying an intended value of an energy parameter of illumination radiation on the object; producing illumination radiation; providing an objective for focusing illumination radiation onto the object; ascertaining a transmission property of the objective for the illumination radiation; output coupling a component of the illumination radiation upstream of the objective as measurement radiation and measuring an actual value of the energy parameter of the measurement radiation; providing a relationship between energy parameters of the measurement radiation and energy parameters of the illumination radiation on the object, and setting the light source in such a way that the actual value of the energy parameter measured for the measurement radiation corresponds to the intended value of the energy parameter according to the relationship.

Abstract: The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens, in particular on a displacement path of an optical zoom lens of a microscope. The optical zoom lens is arranged in a beam path between an object to be recorded and an electronic image sensor. In a first method step, an optical marker is introduced into the beam path at a position of the beam path located between the object to be recorded and the optical zoom lens, such that the optical marker passes the optical zoom lens and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens. The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor and to an electronic image recording device.

Abstract: A microscopy system for generating an HDR image comprises a microscope for capturing a plurality of raw images that show a scene with different image brightnesses and a computing device configured to generate the HDR image by combining at least two of the raw images. The computing device is also configured to set coefficients for different regions in the raw images depending on objects depicted in those regions, wherein it is defined via the coefficients whether and to what extent pixels of the raw images are incorporated in the HDR image. The computing device is further configured to generate the HDR image by combining the raw images based on the set coefficients. A method generates an HDR image by combining raw images based on coefficients that are set depending on objects depicted in the raw images.