Abstract: In high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescence radiation in such a way that the illumination radiation is focused at a point in or on the sample to form a diffraction-limited illumination spot. The point is imaged in a diffraction-limited manner into a diffraction image on a spatially resolving surface detector, wherein the surface detector has a spatial resolution that resolves a structure of the diffraction image. The sample is scanned by means of different scanning positions with an increment of less than half the diameter of the illumination spot. An image of the sample is generated from the data of the surface detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging.

Abstract: A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths ?i, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths ?i a target phase function ??i(x, y, ?i) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function ??i(x, y, ?i) is effective only for the corresponding wavelength ?i. The target phase functions ??i are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions ??i(x, y, ?i). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths ?i such that the predefined structure of the illumination light is generated in the region of the sample.

Abstract: An optical arrangement for light beam shaping in a light microscope has a first and a second liquid crystal region, each of which has a plurality of independently switchable liquid crystal elements with which a phase of incident light is changeable in a settable manner. A first polarization beam splitter is arranged in such a way that incident light is split in a polarization-dependent manner into reflection light, which is reflected in the direction of the first liquid crystal region, and transmission light, which is transmitted in the direction of the second liquid crystal region. The first or a second polarization beam splitter is arranged such that the reflection light and transmission light are combined onto a common beam path after phase modulation by means of the liquid crystal regions.

Abstract: A microscope objective for imaging a specimen using a microscope, the microscope objective having a front lens enclosed by a surround and being designed for microscopy with an immersion liquid. In the microscope objective, the front lens and/or the surround thereof is provided with a coating which can be switched between a state which repels the immersion liquid and a state which does not repel the immersion liquid.

Abstract: The present invention initially relates to a method for generating an image of a sample, said image being pieced together from a plurality of individual microscope images. A microscope is provided, for which a measurement value of a twist angle (?) present between an image recording unit of the microscope and an object stage of the microscope and a measurement accuracy of this measurement value are known. There is a recording of a first individual microscope image of the sample using the microscope and a displacement of the image recording unit and the sample-supporting object stage relative to one another, whereupon a second individual microscope image (02) of the sample is recorded using the microscope. A search region is determined in the second or first individual microscope image, an overlap region between the individual microscope images being expected in said search region.

Abstract: The invention relates to an optical arrangement, particularly for the detection beam path of a multi-spot scanning microscope, comprising a detection plane, in which a detector is positionable, comprising a dispersive device for spectrally splitting detection light. According to the invention, the optical arrangement is characterized in that a distorting optical unit is present for guiding the detection light into the detection plane, said distorting optical unit being arranged downstream of the dispersive device and upstream of a detection plane, and in that a rotating device is present for the relative rotation of a luminous field of the spectrally separated detection light and the distorting optical unit. The invention additionally relates to a multi-spot scanning microscope and a method for operating a microscope.

Abstract: A method, device, and computer program product are designed for non-convolutional image processing in microscopy of an input image into an output image using an artificial neural network with at least one contracting path including layers, at least one expanding path including layers, and at least one filter kernel. The method includes determining, in one or multiple artificial neural network layers, a similarity metric between at least one filter kernel and one output of the previous layer. Additionally, in at least one layer of the contracting path, the resolution of the output of the previous layer is reduced, and, in at least one layer of the expanding path, the resolution of the output of the previous layer is increased. The first artificial neural network layer treats the input image as the output of the previous layer, and the output of the last artificial neural network layer is the output image.

Abstract: A method of enhancing a resolution of an EDS image of a sample includes generating an EDS image of the sample, generating a non-EDS image of the sample generating, using a machine learning algorithm, an enhanced resolution EDS image of the sample based on the generated feature map and based on the first EDS image, where a resolution of the enhanced resolution EDS image is higher than a resolution of the first EDS image.

Abstract: The invention relates to an optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope.

Abstract: An arrangement for increasing resolution of a laser scanning microscope has a simplified adjustment and lower susceptibility to errors. The pupil beam from the laser scanning microscope is coupled into a shortened common path interferometer, to make wavefronts of a pupil image mirrored at at least one axis and wavefronts of an unchanged pupil image interfere. The area of a pupil from the pupil beam is split into two complementary portions P and Q producing two partial beams separately supplied to at least one beam deflection means by total-internal reflection along the common path interferometer. The light of the interferometer branches from transmitted light of the one interferometer branch and reflected light of the other interferometer branch is made to interfere at a partly transmissive beam splitter layer to cause constructive interference C and destructive interference D of the wavefronts from the two different portions P and Q of the pupil.

Abstract: A microscope comprises a microscope stand, a camera for recording microscope images and a computing device, which is configured to carry out image processing of the recorded microscope images. The computing device is configured to: define relevant image structures; localize relevant image structures in the microscope images; derive stitching parameters from locations of the relevant image structures; and create a result image with the aid of the microscope images, with the stitching parameters being taken into account. Moreover, a corresponding method is described.

Abstract: An objective lens arrangement includes a first, second and third pole pieces, each being substantially rotationally symmetric. The first, second and third pole pieces are disposed on a same side of an object plane. An end of the first pole piece is separated from an end of the second pole piece to form a first gap, and an end of the third pole piece is separated from an end of the second pole piece to form a second gap. A first excitation coil generates a focusing magnetic field in the first gap, and a second excitation coil generates a compensating magnetic field in the second gap. First and second power supplies supply current to the first and second excitation coils, respectively. A magnetic flux generated in the second pole piece is oriented in a same direction as a magnetic flux generated in the second pole piece.

Abstract: A method, a device, and a computer program product captures microscopy objects in image data that includes first images recorded with a first contrast and second images recorded with a second contrast, wherein in each case, one of the first and one of the second images can be correspondingly assigned to each other. The method includes capturing information indicating microscopy objects in at least one of the second images, transferring the captured information to those of the first images which correspond to the at least one of the second images, and capturing information indicating microscopy objects in the first images, to which the captured information of the second images was transferred by using the transferred information.

Abstract: A prediction algorithm determines synthetic fluorescence images on the basis of measurement images. A validation of the synthetic fluorescence images can be effected on the basis of reference images which are captured after the measurement images or are captured for a separate sample. Alternatively or additionally, a training of the prediction algorithm can be effected on the basis of training images which are captured after the measurement images or are captured for a separate sample.

Abstract: An objective for a microscope includes a displaceable lens group for correcting a spherical aberration. The displaceable lens group is designed in so that an offset of same in the direction perpendicular to the optical axis leads to only a small coma.

Abstract: A particle beam apparatus is used for imaging, processing and/or analyzing an object. A computer program product may be used to facilitate imaging, processing and/or analyzing the object. A magnification may be chosen from a first magnification range of the particle beam apparatus by driving a first amplifier unit and a second amplifier unit. If it is established that there are prerequisites which would actually result in the particle beam apparatus being switched to a different magnification from a second magnification range, the switching is avoided by feeding an analog amplifier signal from an amplifier unit to a scanning unit of the particle beam apparatus, guiding the particle beam over the object using the scanning unit, and imaging, processing and/or analyzing the object with the particle beam.

Abstract: A method of raster scanning a surface of an object using a particle beam comprises determining a basic set of raster points within a surface; determining a surface portion of the surface of the object, wherein the surface portion is to be raster scanned; ordering a set of raster points of the basic set located within the surface portion; and scanning of the surface portion by directing the particle beam onto the raster points of the ordered set in an order corresponding to an order of the raster points in the ordered set from the outside to the inside, i.e. starting from the boundary of the surface portion towards its center, or in the reverse order, i.e. from the inside to the outside.

Abstract: An optical system includes an illumination module configured to illuminate a sample object with at least one angle-variable illumination geometry. The optical system includes an imaging optical unit configured to produce an imaged representation of the sample object that is illuminated with the at least one angle-variable illumination geometry on a detector. The optical system includes the detector, which is configured to capture at least one image of the sample object based on the imaged representation. The optical system includes a controller configured to determine a result image based on a transfer function and the at least one image. A method includes illuminating a sample object with at least one angle-variable illumination geometry, imaging the sample object on a detector, based on the imaged representation, capturing at least one image of the sample object, and, based on a transfer function and the at least one image, determining a result image.

Abstract: In a computer-implemented method for generating an image processing model that generates output data defining a stylized contrast image from a microscope image, model parameters of the image processing model are adjusted by optimizing at least one objective function using training data. The training data comprises microscope images as input data and contrast images, wherein the microscope images and the contrast images are generated by different microscopy techniques. In order for the output data to define a stylized contrast image, the objective function forces a detail reduction or the contrast images are detail-reduced contrast images with a level of detail that is lower than in the microscope images and higher than in binary images.

Abstract: The invention relates to a particle beam device (100) for imaging, analyzing and/or processing an object (114).