Abstract: Time-interleaved analog-to-digital (AD) conversion circuit, which includes first and second AD converters that generate first and second digital signal sequences by converting an analog input signal into first and second digital signals with a first frequency at first and second timings mutually different with each other is disclosed. The AD conversion circuit further includes a FIFO that receives the first and second digital signal sequences, and a correction filter including first and second portions that are supplied with a common clock signal. The correction filter generates a first corrected digital signal sequence by adding the first synchronized digital signal sequence and the second synchronized digital signal sequence passed through the first portion of the correction filter, and a second corrected digital signal sequence by passing the second synchronized digital signal sequence through the second portion of the correction filter.

Abstract: Numerically controlled oscillators and oscillation methods for generating function values in respective clock cycles by using a recurrence equation are provided. The oscillation circuit generates, in each of the clock cycles, a current one of the function values by multiplying, using a multiplier having a latency of k clock cycles, a first one of the function values generated in a first one of the clock cycles that is j cycles before a current one of the clock cycles by a coefficient and adding an output of the multiplier and at least one of the function values generated in previous ones of the clock cycles that are 1 to i?1 cycles before the current one of the clock cycles excluding the first one of the clock cycles, where 2<i, 1<j<i, and 0<k<j.

Abstract: Various exemplary embodiments provide methods and apparatuses for generating test conditions that efficiently detect delay faults while preventing overkill. According to an exemplary embodiment, i) test timing correcting block sets test timing faster than the actual operation timing of a logical circuit to be tested, ii) logical simulation block performs simulation by using delay times of signal paths corrected by adding minimum slack margin, and iii) when the simulation indicates that an end-side flip-flop cannot acquire data after an expected transition of logical value, masking block generates mask data that masks data held in the end-side flip-flop.

Abstract: An exemplary semiconductor integrated circuit is formed on a surface of a semiconductor chip includes a circuit region and a dummy region on the surface of the semiconductor chip. The circuit region includes a plurality of circuit patterns, which form circuit elements of the semiconductor integrated circuit, in a plurality of pattern layers. The dummy region includes a plurality of character dummies, which do not contribute to an operation of the semiconductor integrated circuit. The character dummies have a fixed shape and dimension, and arranged in a character pattern layer selected from the plurality of pattern layers with a fixed pitch. The dummy region further includes an identification sign formed by connecting selected ones of the character dummies chosen from the plurality of the character dummies.

Abstract: Standard cell libraries and methods of designing semiconductor integrated circuits are provided. At least one of delay-adjusting cell data and load-capacitor cell data is stored in the cell library for a specified type standard cell in addition to the standard cell data. The specified type standard cell may be utilized as a delay-adjusting cell or a load-capacitor cell. Accordingly, precise adjustment of delay times during designing a semiconductor integrated circuit is enabled without requiring registering a new standard cell in the cell library. Semiconductor integrated circuits are also provided that are configured to allow precise adjustment of delay times in the semiconductor integrated circuits.

Abstract: In an output driver circuit, a replica circuit includes seventh and eighth transistors corresponding to first and second transistors, respectively, ninth and tenth transistors corresponding to third or fifth, and fourth or sixth transistors in a driver circuit, respectively, and a resistor corresponding to a termination resistor. A reference voltage and a voltage of a node between the ninth transistor and the resistor are input to an operational amplifier, and an output signal of the operational amplifier is input to gates of the first and seventh transistors.

Abstract: An exemplary apparatus for controlling display devices writes pixel data in a buffer in synchronous with an input clock signal. A differential value that represents a change of timing difference between input and output sides is calculated in each of a plurality of frames, and a timing correction based on the differential value calculated during the previous frame is performed within the vertical blanking period. Thereafter, the pixel data is read and output from the buffer to the display device in synchronous with an output clock signal.

Abstract: Apparatus and method for receiving burst data signal without using external detection signal are disclosed. The apparatus can include a clock data recovery (CDR) circuit to generate a clock signal, and a detection circuit to detect an initial portion in the data recovered from the input signal. The CDR circuit can have a first mode that attempts to synchronize the clock signal with a reference data signal, and a second mode that attempts to synchronize the clock signal with the burst data signal and to recover data based on the clock signal. The apparatus can include a controller to conduct a process including, in sequence, setting the CDR circuit in the first mode, setting the CDR circuit in the second mode, and keeping the CDR circuit in the second mode when the detection circuit detects the initial portion in the recovered data.

Abstract: Apparatus and method for receiving burst data signal without using external detection signal are disclosed. The apparatus can include a clock data recovery (CDR) circuit to generate a clock signal, and a detection circuit to detect an initial portion in the data recovered from the input signal. The CDR circuit can have a first mode that attempts to synchronize the clock signal with a reference data signal, and a second mode that attempts to synchronize the clock signal with the burst data signal and to recover data based on the clock signal. The apparatus can include a controller to conduct a process including, in sequence, setting the CDR circuit in the first mode, setting the CDR circuit in the second mode, and keeping the CDR circuit in the second mode when the detection circuit detects the initial portion in the recovered data.

Abstract: Data conversion circuits and methods of data conversion that enable to keep the continuity in the converted data while reducing a required memory capacity are disclosed. An exemplary conversion circuit includes a LUT that stores representative correction values and an interpolation circuit that generates conversion data by interpolating from representative correction values stored in cells of the LUT that surround an address corresponding to the combination of input signal levels. When the cells that surround the address include a pair of adjacent cells arranged along both sides of a diagonal line of the LUT, the interpolation circuit substitutes one of the representative correction values with a substituted representative correction value that indicates an opposite direction and a same amount of correction as indicated by the other one of the representative correction values stored in the adjacent cells, and then generates the conversion data.

Abstract: A semiconductor integrated circuit has an internal circuit having an input terminal connected to a connection terminal, a protection circuit that discharges an over-voltage supplied to the connection terminal to a power line. The protection circuit includes a first discharge circuit connected to the connection terminal, a second discharge circuit connected to the connection terminal and discharges the over-voltage to the power line, and an over-voltage detect circuit that detects a discharge current flowing through the second discharge circuit and generates an over-voltage detect signal when the discharge current is detected. The first discharge circuit is disabled to discharge the over-voltage when the over-voltage detect signal is supplied.

Abstract: A transmitter cyclic pattern having a pattern length of N bits is generated and converted into an M-bit transmitter parallel data stream, where N?M. A bit-sequence altered transmitter parallel data stream is generated by performing a transmitter altering process, converted into a serial data and transmitted together with a clock signal. The serial data is received and converted into an M-bit receiver parallel data stream, and a bit-sequence restored parallel data stream is generated by performing a process opposite to the transmitter altering process. A receiver cyclic pattern is generated by using bits in the bit-sequence restored parallel dada stream and converted into an M-bit reference parallel data stream, and a bit-sequence altered reference parallel data stream is generated by performing a process same as the transmitter altering process and compared with the received parallel data to test if the data is correctly received.

Abstract: The main surface of a quartz component is divided by an offset into a first region having a larger height around an inner perimeter and a second region adjacent to the outer perimeter of the first region. Repeated restoration of a damaged component by forming a bulge on the first region and machining the bulge to make a flat surface while maintaining the offset enables long term use of the component.

Abstract: A timing detection circuit including a first timing detection circuit, a second detection circuit, and an output circuit is disclosed. The first detection circuit detects, among multiphase clocks having n mutually different phases and a frequency of k times the frequency of a reference clock, a closest clock having a clock edge closest to a valid edge of the synchronizing signal and generates first detect signal DET_A indicating the detected clock. The second timing detection circuit detects within which of k successive cycles of the representative clock selected from the multiphase clocks the valid edge of the synchronizing signal is positioned and generates second detect signal DET_B indicating the detected cycle. The output circuit receives the first detect signal and the second detect signal and outputs first output signal OUT_A and second output signal OUT_B.

Abstract: A semiconductor integrated circuit having a multilayer wiring structure is provided which includes: a top metal wiring layer (MTOP) including a plurality of top layer power supply wirings and a next-to-top metal wiring layer (MTOP-1) directly below the top metal wiring layer MTOP including a plurality of next-to-top layer power supply wirings. Each of the top layer and the next-to-top layer power supply wirings also includes first potential wirings for supplying a first potential to the circuit elements and second potential wirings for supplying a second potential to the circuit elements. The top layer power supply wirings and the next-to-top layer power supply wirings cross each other and have a top layer insulating film disposed between them. First and second contacts are provided in the insulating film for connecting the first potential wirings and second potential wirings in the top and the next-to-top metal wiring layers with each other.

Abstract: A semiconductor integrated circuit has an active mode and a sleep mode. The semiconductor integrated circuit is constructed by alternately connecting a plurality of combinational logic circuits and a plurality of flip-flops. The flip-flops include a retention flip-flop that is supplied with electric power and retains the data in the sleep mode, and a non-retention flip-flop that is not supplied with electric power during the sleep mode. The non-retention flip-flop includes an initializing circuit that initializes the non-retention flip-flop when the semiconductor integrated circuit is switched from the sleep mode to the active mode.

Abstract: A semiconductor integrated circuit having connection pads arranged over active elements is disclosed. The connection pad is divided into a probing area and a bonding area, and reinforcing structures are formed separately under the respective areas. The reinforcing structure under the probing area is formed using a number of wiring layers less than the number of wiring layers used for forming the reinforcing structure under the bonding area. As a result, the wiring layers under the probing area are efficiently utilized to forms wires for realizing the logical function of the integrated circuit.

Abstract: Various exemplary embodiments provide methods and apparatuses for generating test conditions that efficiently detect delay faults while preventing overkill. According to an exemplary embodiment, i) test timing correcting block sets test timing faster than the actual operation timing of a logical circuit to be tested, ii) logical simulation block performs simulation by using delay times of signal paths corrected by adding minimum slack margin, and iii) when the simulation indicates that an end-side flip-flop cannot acquire data after an expected transition of logical value, masking block generates mask data that masks data held in the end-side flip-flop.

Abstract: A phase detector that compares the phases of data and four-phase first to fourth clocks having a half rate of the data and being 90° out of phase with one another. Exemplary embodiments of the phase detector include first to fourth sampling circuits that sample the data by the four-phase first to fourth clocks; a first comparator that compares sampling data obtained by sampling according to the adjacent two-phase first and second clocks using the first and second sampling circuits, respectively, and when the sampling data is different, outputs a first up signal; and a second comparator that compares sampling data obtained by sampling according to the adjacent two-phase fourth and first clocks using the fourth and first sampling circuits, respectively, and when the sampling data is different, outputs a first down signal.

Abstract: Bias circuits to stabilize oscillation in ring oscillators, oscillators, and methods to stabilize oscillation in ring oscillators are provided. The ring oscillator includes a plurality of differential delay cells, each including a pair of input transistors, a pair of voltage-controlled resistors, and a common current source. The bias circuit includes a replica arm that includes a replica of one of the voltage-controlled resistors, and a resistor arm that includes a fixed resistor. The bias circuit supplies bias voltages to the differential delay cells such that ratio of voltage swing to bias current of the delay cell is kept constant by referring the ratio to the fixed resistor.