Abstract: Provided is a relay that includes first and second contacts that are selectively connectable for closing an electric circuit. A coil wound around the contacts along a longitudinal axis can generate a magnetic field that connects the contacts in one of an energized or de-energized state and disconnects the contacts in the other of the energized or de-energized state. A first electrically conductive shield is provided adjacent to a first end of the relay and electrically connected to the first contact, and a second electrically conductive shield, the second electrically conductive shield being electrically connected to the second contact. The first electrically conductive shield extends at least partially around the first contact and the second electrically conductive shield extends at least partially around the second contact.

Abstract: A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device; a buffer communicating with a common point between the sense impedance and the device; a current output stage; and a voltage output stage. When the circuit is controlling the current through the device, the voltage output stage forces the common point to a virtual ground and the current output stage forces a desired current through the device in response to a signal from the buffer. When the circuit is controlling the voltage across the device, the current output stage forces the common point to a virtual ground and the voltage output stage forces a desired voltage across the device in response to the signal from the buffer.

Abstract: A measurement system with selectable feedback paths includes a DUT interface including a first and a second DUT sensor, the first sensor being connected to a first feedback path for providing a measure of a first DUT characteristic, the second sensor being connected to a second feedback path for providing a measure of a second DUT characteristic, the sensors having a shared reference path and each feedback path including a set point adjustment; a differential amplifier system including differential inputs and differential outputs, the differential outputs being applied to the DUT interface; and a multi-pole switcher for connecting the differential inputs to either the first feedback path and the reference path or to the reference path and the second feedback path, respectfully. The first feedback path is selected to produce a desired first DUT characteristic or the second feedback path is selected to produce a second desired DUT characteristic.

Abstract: A power supply includes: a switching amplifier including an input and an output, the amplifier input being adapted to be powered by an electrical power source; a transformer including a primary and a secondary winding on a magnetic core, the number of winding turns being chosen to limit magnetization levels to avoid magnetic saturation while maximizing winding spacing, the transformer primary winding being in communication with the amplifier output; a rectification system in communication with the transformer secondary winding, the rectification system providing a DC power output; and a controller. The controller monitors the DC power output and adjusts the switching amplifier in response to the monitoring to provide a desired power output characteristic.

Abstract: A probe system for connecting a measurement apparatus to a DUT includes an AC probe having an AC shield conductor and an AC probe conductor shielded by the AC shield; a first DC probe having a first DC probe conductor and a first guard conductor for guarding the first DC probe conductor when a virtual version of a voltage on the first DC probe conductor is applied to the first guard conductor; a second DC probe having a second DC probe conductor and a second guard conductor for guarding the second DC probe conductor when a virtual version of a voltage on the second DC probe conductor is applied to the second guard conductor; a first capacitive connection between the AC shield conductor and the first guard conductor; a second capacitive connection between the AC shield conductor and the second guard conductor; a third capacitive connection between the first guard conductor and the first DC probe conductor; and a fourth capacitive connection between the second guard conductor and the second DC probe conductor,

Abstract: Provided is a method and system for testing a DUT. The system includes a plurality of testing devices for interacting with the DUT and conducting a plurality of different tests on the DUT, and a computer-readable memory for storing computer-executable instructions defining the plurality of tests to be conducted by the testing device on the DUT. A scheduler component designates at least a first test and a second test from the plurality of tests to be conducted on the DUT in parallel, wherein said designating is based at least in part on content of the computer-executable instructions defining the first test and the second test. And a controller initiates the first test and the second test to be conducted in parallel and initiating at least a third test sequentially relative to at least one of the first and second tests.

Abstract: A method for calibrating an impedance/admittance meter for measurements of a DUT includes measuring a pure capacitance at a desired frequency; using the capacitance measurement to establish the phase response of the meter; measuring the admittance value of a resistor with the meter at the desired frequency, the resistor having a known DC conductance and being known to primarily exhibit parallel capacitive frequency dependency; and adjusting the gain of the meter to provide the known DC conductance as the real component of the admittance value.

Abstract: A circuit for controlling a voltage across a device and permitting measurement of a current through the device includes a sense impedance in series combination with, the device, a sensed voltage measured across the sense impedance being representative of the current through the device; a capacitive stability element in parallel combination with the sense resistance, the capacitive stability element being virtually absent by connection to a virtual version of the sensed voltage when the device has a first capacitance and being present when the device has a second capacitance, the second capacitance being larger than the first capacitance.

Abstract: A method for testing a plurality of DUTs using a plurality of DC instruments and a pulsed instrument includes contemporaneously applying DC signals to the DUTs with respective DC instruments and sequentially performing pulsed measurements on the DUTs with the pulsed instrument.

Abstract: An instrument for measuring electrical parameters includes a measurement section having a measurement aperture; and a support section providing at least one of power and digital control for the measurement section. The support section has an interference signal frequency, wherein the interference frequency is an integer multiple of the reciprocal of the measurement aperture and the measurement aperture and the interference signal are phase-locked. As a result, the effect of the interference signal on electrical parameters measured is minimized.

Abstract: A test head for testing a DUT includes a probe card having a plurality of DUT probes, the probes being in contact with the DUT during the testing; an instrument carrier, the instrument carrier being located above the DUT during the testing; and a SMU mounted on the carrier for each of the probes, each SMU being operably connectable to a respective probe, wherein the carrier is moved with respect to the probe card to permit replacement of the probe card.

Abstract: A measurement system for testing a DUT includes a plurality of procedures for performing test functions, each procedure having a phase variable; a task queue where the procedures are entered in the task queue with a sign-up value of the phase variable; and a multiphase task executor that arranges the procedures in the queue in response to the sign-up value. The executor changes the phase variable to an execution value and executes the procedures in the task queue after the phase variable has the execution value.

Abstract: A test instrument network for testing a plurality of DUTs includes a plurality of communicating script processors, the script processors being adapted to execute computer code; and a plurality of measurement resources controllable by the script processors in response to executed computer code, the measurement resources being adapted to test the DUTs. Each script processor and measurement resource may be arbitrarily assigned by the controller to one of at least two groups, only one script processor being assigned to be a master script processor, any other script processor being a slave script processor and any group not including the master script processor being a remote group. The master script processor is exclusively authorized to initiate code execution on any script processor in a remote group. Any slave script processor is only able to initiate operation of measurement resources in it own group.

Abstract: A system for making HF and DC measurements on a DUT includes a HF unit having a HF connection terminal that is switchable to a connected or disconnected state; a DC unit having a DC connection terminal that is switchable to a connected or disconnected state; and a common connection between the connection terminals adapted to be connected to the DUT. The DC connection terminal has a transmission line characteristic that is impedance-matched to minimize reflections when the HF connection terminal is in the connected state and the DC connection terminal is in the disconnected state.

Abstract: A method for verifying the adjustment of a plurality of measurement instruments includes measuring a first value of an un-verified test value of a parameter with a first measurement instrument; measuring a second value of the same un-verified test value of a parameter with a second measurement instrument; comparing the first value with the second value; and determining an adjustment verification state based on the comparison.

Abstract: A method and apparatus for measuring a pulsed I-V characteristic of a DUT that has a signal terminal and a return terminal includes connecting a pulse unit between the signal and return terminals, the pulse unit having a pulse source and a pulsed current measuring device; pulsing the signal terminal with the pulse unit; measuring a pulsed current through the signal terminal with the current measuring device in response to the pulsing; and outputting, storing, displaying, or otherwise using the current measurement.

Abstract: An AC impedance measurement system is used for measuring the impedance of a DUT. A measured voltage is applied to a first DUT terminal by a first digital to analog converter, the voltage appearing at the second terminal of the DUT is monitored through an analog to digital converter and forced by a second digital to analog converter to a desired negligible value, and a digital controller determines the impedance of the DUT from the measured voltage and the current necessary to force the voltage appearing at the second terminal to the desired negligible value.

Abstract: A toroidal step-up or step-down transformer includes a toroidal magnetic core, a primary formed from a plurality of primary windings, and a secondary formed from a plurality of secondary windings. Parallel connected windings are added to at least one of the primary and secondary to make the number of primary windings equal to the number of secondary windings, the primary and secondary windings being arranged symmetrically around the core.

Abstract: A range-changing circuit for a measurement device having a desirable range includes an array of graduated impedances. And amplifier supplies an electrical voltage to at least one of the impedances of the array. A voltage sensing and limiting switch is provided in a feedback path of the amplifier. The switch limits said electrical voltage supplied to said at least one of the impedances in response to a sensed voltage that is sensed by the switch. An electrical voltage in the desirable range is developed across a different one of the impedances of the array based on an operation of the switch.

Abstract: A method for measuring electrical parameters of a DUT having at least three terminals includes applying a first AC voltage to a first terminal; separately driving a second and a third terminal each to a virtual second AC voltage, each virtual voltage requiring a respective current; and measuring an electrical parameter of the DUT based on the first AC voltage and the second and third terminals each being at the virtual second AC voltage.